JP2560846Y2 - Molten metal sampling probe - Google Patents
Molten metal sampling probeInfo
- Publication number
- JP2560846Y2 JP2560846Y2 JP4287093U JP4287093U JP2560846Y2 JP 2560846 Y2 JP2560846 Y2 JP 2560846Y2 JP 4287093 U JP4287093 U JP 4287093U JP 4287093 U JP4287093 U JP 4287093U JP 2560846 Y2 JP2560846 Y2 JP 2560846Y2
- Authority
- JP
- Japan
- Prior art keywords
- sample
- molten metal
- chamber
- metal
- sampling
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
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- Sampling And Sample Adjustment (AREA)
- Investigating And Analyzing Materials By Characteristic Methods (AREA)
Description
【0001】[0001]
【産業上の利用分野】本考案は、溶融金属の成分分析に
使用される、溶融金属採取プローブに関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a molten metal sampling probe used for analyzing components of molten metal.
【0002】[0002]
【従来の技術】金属精錬工程においては適宜、溶融金属
資料を採取して、その成分を分析機器を用いてその操業
を制御する事が必要である。溶融金属試料採取プローブ
を用いて採取された金属試料は、紙又は金属筒状の気送
子に挿入され、分析室まで気送後、分析表面を研磨し蛍
光X線分析、或いは発光分光分析装置にて迅速に分析さ
れる。2. Description of the Related Art In a metal refining process, it is necessary to appropriately collect molten metal materials and control the operation of the components using an analytical instrument. The metal sample collected by using the molten metal sample collection probe is inserted into a paper or metal tube-shaped air-sending device, aired to the analysis room, the analysis surface is polished, and the fluorescent X-ray analysis or emission spectroscopy is performed. Is analyzed quickly.
【0003】[0003]
【考案が解決しようとする課題】気送された金属試料を
気送子より取り出す際に、気送子上部よりポンチにて試
料を打ち抜く方法がとられる。従来の溶融金属試料採取
プローブにて採取した金属試料形状図5は底部分析面よ
り上部までストレート(a=b)或いはテーパー(a<
b)形状であり、試料の上部形状は試料流入部Aが試料
肩部Bより高い位置にある。When a pneumatic metal sample is taken out from a pneumatic element, a method of punching the sample from above the pneumatic element with a punch is used. FIG. 5 shows a metal sample shape sampled by a conventional molten metal sampling probe. The metal sample shape is straight (a = b) or tapered (a <b>) from the bottom analysis surface to the top.
b) The shape of the sample is such that the sample inflow portion A is higher than the sample shoulder B in the upper shape of the sample.
【0004】従来の金属試料の形状では試料を気送子に
入れる際、或いはポンチで試料を取り出す際、試料上面
又は、下面のエッジ部が気送子内面に食い込み、試料の
取り出しが出来なかったり、気送子内紙が破れる為に気
送子の多数回使用が出来なかった。[0004] In the conventional shape of a metal sample, when the sample is put into the pneumatic element or when the sample is taken out with the punch, the edge of the upper surface or the lower surface of the sample bites into the inner surface of the air element, and the sample cannot be taken out. However, the paper inside the respirator was torn, so that the reproducer could not be used many times.
【0005】また、気送子より取りだした試料を分析の
為に、自動研磨機にて表面研磨する時、従来の試料形状
では採取した溶湯が凝固する際、流入口部が突出して試
料上部に残る為に試料肩部にて押さえる自動研磨機では
サンプルが安定して押さえる事が出来ず、自動研磨機に
かからない。本考案は気送子からの取り出しを容易に
し、気送子の多数回使用を可能とし、自動研磨機での確
実なチャッキングを可能とした金属試料採取プローブを
提供する。[0005] In addition, when the surface of the sample taken out from the pneumatic element is polished by an automatic polishing machine for analysis, when the molten metal solidified in the conventional sample shape is solidified, the inflow portion protrudes above the sample. The sample cannot be stably pressed by the automatic polishing machine that presses on the sample shoulder because it remains, and the automatic polishing machine does not work. The present invention provides a metal sampling probe that facilitates removal from the pneumatic element, enables multiple uses of the pneumatic element, and enables secure chucking with an automatic polishing machine.
【0006】[0006]
【課題を解決するための手段】本考案は上記課題を解決
するために (1)紙管内部に試料採取容器を組み込んでなる溶融金
属採取プローブにおいて、流入口に筒状の側面に開口す
る上室と内部に湯道を形成された縦方向半割れの肉厚の
冷し金と、凹面状のディスク状試料採取室を有する試料
プローグであって、採取されるディスク状試料の厚さ形
状が底部より概略中間部まで中心部の径でテーパ状に大
きくなりかつ該中間部から該中間部の径と同径で上部ま
でストレートとなる形状の試料採取室を備える事を特徴
とする。SUMMARY OF THE INVENTION The present invention solves the above-mentioned problems. (1) In a molten metal sampling probe in which a sample collection container is incorporated in a paper tube, an opening is formed on a cylindrical side surface at an inflow port. A sample prog having a chamber and a vertically half-walled chill having a runner formed therein, and a concave disk-shaped sample collection chamber, wherein the thickness of the disk-shaped sample to be collected is The present invention is characterized in that a sampling chamber is provided which is tapered from the bottom to a substantially middle portion with a diameter at a central portion and has a diameter equal to the diameter of the middle portion and straight from the middle portion to an upper portion.
【0007】(2)ディスク状試料採取室の試料流入口
部(A)が試料肩部(B)より低い事を特徴とする。(2) The sample inlet (A) of the disk-shaped sample collection chamber is lower than the sample shoulder (B).
【0008】(3)ディスク状試料採取室の底部の角部
が凹曲面である事を特徴とする。(3) The corner of the bottom of the disk-shaped sample collection chamber has a concave curved surface.
【0009】[0009]
【作用】本考案の溶融金属採取プローブにて採取される
金属試料(図1)は、試料形状が底部分析面より中間部
までテーパー(a<c)状に大きくなり、中間部からは
同径で上部までストレート(c=b)の試料形状である
と共に分析面の角部を曲面とし、かつ試料形状が外周か
ら内側に向かって厚みが薄くなる様に角度を持たせ、試
料流入口部Aが試料肩部Bより低く位置するのでサンプ
リングから気送、研磨、分析まで何ら問題なく、迅速に
自動分析することが可能となった。The metal sample (FIG. 1) sampled by the molten metal sampling probe of the present invention has a tapered shape (a <c) from the bottom analysis surface to the middle, and the same diameter from the middle. The sample shape is straight (c = b) up to the top, the corners of the analysis surface are curved, and the sample shape is angled so that the thickness decreases from the outer periphery toward the inner side. Is located lower than the shoulder B of the sample, so that there is no problem from sampling to pneumatic feeding, polishing, and analysis, and the automatic analysis can be quickly performed.
【0010】[0010]
【実施例】本考案の実施例を図面を参照しながら作用と
ともに説明する。図2に本考案の溶融金属試料採取プロ
ーブの側面断面図を示す。この溶融金属採取プローブは
全体が紙管にて包囲され、ホルダーとなる紙管1の先端
部に更に大きい径の紙管2が取り付けられ、この紙管2
内に紙管3と紙管4に挟まれた試料採取ユニットが内蔵
された紙管5が取り付けられ、紙管2の湯口部6には紙
又は金属製のアナブタ7が取り付けられている。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described together with its operation with reference to the drawings. FIG. 2 is a side sectional view of the molten metal sampling probe of the present invention. The molten metal sampling probe is entirely surrounded by a paper tube, and a paper tube 2 having a larger diameter is attached to the tip of a paper tube 1 serving as a holder.
A paper tube 5 having a built-in sampling unit sandwiched between a paper tube 3 and a paper tube 4 is mounted therein, and a paper or metal hole 7 is mounted on a sprue 6 of the paper tube 2.
【0011】試料採取ユニットは筒状の金属、シェル又
はセラミックス製の側面が開口する上室8と金属製の内
部に湯道9bが形成された半割り構造の冷し金9と金属
製の凹面状の試料採取容器10より構成されている。The sampling unit comprises a cylindrical metal, shell or ceramic upper chamber 8 having an open side, a metal chiller 9 having a half-split structure having a runner 9b formed inside, and a metal concave surface. It is composed of a sample collecting container 10 in a shape of a circle.
【0012】試料採取空間10bは、冷し金9と試料採
取容器10により構成される。試料採取容器10により
試料底部の角部を曲面とし、試料底部の径aに対し試料
中間部の径cをaより大とし、試料上部の径bをcとし
同径とした試料が得られる。又、冷し金9の底部形状を
外周より約2/3R(R:半径)までストレートとし
て、2/3Rから中心付近まで下方へテーパー形状とし
ている。そして、底部中心付近には湯道9bより小径と
なる様なくびれ部9cを設け、このくびれ部9cはスト
レート部より下方へ位置している。これによって採取さ
れた金属はくびれ部9cで折れるため、ストレートの外
周部が試料の最上面となる。The sampling space 10b is constituted by a chill 9 and a sampling container 10. The sample collection container 10 obtains a sample in which the corner at the bottom of the sample is a curved surface, the diameter c at the middle of the sample is larger than a with respect to the diameter a at the bottom of the sample, and the diameter b at the top of the sample is c. The bottom of the chill 9 is straight from the outer circumference to about 2 / 3R (R: radius) and is tapered downward from 2 / 3R to near the center. A constricted portion 9c is provided near the center of the bottom so as to be smaller in diameter than the runner 9b, and the constricted portion 9c is located below the straight portion. Since the metal thus collected is broken at the constricted portion 9c, the outer peripheral portion of the straight becomes the uppermost surface of the sample.
【0013】本考案の溶融金属試料採取プローブを溶融
金属中に浸漬すると、アナブタ7が溶損して溶湯が湯口
部6から上室空間8b、湯道9bを通って試料採取空間
10bに金属試料が採取される。この金属試料は気送子
内部に挿入され、気送管にて分析室まで気送される。図
3に気送子の内部に挿入された金属試料の状態を示す。When the molten metal sampling probe of the present invention is immersed in the molten metal, the ana pig 7 is eroded and the molten metal flows from the spout 6 through the upper chamber space 8b and the runner 9b to the metal sampling space 10b. Collected. This metal sample is inserted inside the pneumatic element, and is pneumatically fed to the analysis chamber by a pneumatic tube. FIG. 3 shows a state of the metal sample inserted into the pneumatic element.
【0014】本考案の試料採取室は、図3に示す様に試
料底部(図3では金属試料11の上面)の角部は、曲率
半径2〜5mmの曲面としているので金属試料によって
紙製の気送子が破れる等の問題は起こらない。曲率半径
が2mm未満だと気送子の破れに対して効果的ではな
く、5mm超だと金属試料の分析面積の確保が困難とな
る。In the sampling chamber of the present invention, as shown in FIG. 3, the corner of the bottom of the sample (the upper surface of the metal sample 11 in FIG. 3) has a curved surface with a radius of curvature of 2 to 5 mm. There is no problem such as breakage of the plow. If the radius of curvature is less than 2 mm, it is not effective against breakage of the pneumatic element, and if it is more than 5 mm, it becomes difficult to secure an analysis area for the metal sample.
【0015】また、本考案の試料採取室は、試料流入口
部(A)が試料肩部(B)より0.5〜2mm低く構成
している。図3に示す様にテーパー状の気送子に対し前
述したようなテーパー部とストレート部を有する試料で
ある為、試料上面(図3では下方)の端部は気送子に接
触しない為、同様の問題はおこらない。分析室まで気送
された気送子は上部よりポンチにて試料を打ち抜き、取
り出し後自動研磨装置により金属試料表面が研磨され
る。In the sampling chamber of the present invention, the sample inlet (A) is configured to be 0.5 to 2 mm lower than the sample shoulder (B). As shown in FIG. 3, since the sample has the tapered portion and the straight portion as described above with respect to the tapered pneumatic element, the end of the upper surface of the sample (the lower part in FIG. 3) does not contact the pneumatic element. Similar problems do not occur. The pneumatic element sent to the analysis chamber is punched out of the sample from above by a punch, and after removal, the surface of the metal sample is polished by an automatic polishing device.
【0016】図4に自動研磨装置の概略図を示す。グラ
インダー15の研磨ベルト14の上に分析面である試料
底面を置き試料上面をチャッキング装置13で押さえ研
磨するが、試料上面の形状がフラットであるため、確実
にチャッキング装置13で押さえる事ができるので研磨
不良による分析不良はない。また、再研磨する事もな
い。表面研磨された金属試料は蛍光X線分析装置にて成
分分析が行われ精錬工程にフィードバックされる。前記
実施例は試料採取ユニットのみを備えた例について説明
したが、熱電対等を用いた側温ユニットを紙管3の下端
に取り付けたタイプの温度測定と試料採取を同時に行う
装置にも、当然適用できる。FIG. 4 is a schematic view of an automatic polishing apparatus. The sample bottom surface, which is the analysis surface, is placed on the polishing belt 14 of the grinder 15 and the sample upper surface is pressed and polished by the chucking device 13. However, since the sample upper surface is flat, the chucking device 13 can surely hold the sample upper surface. There is no analysis failure due to poor polishing. Also, there is no need for repolishing. The surface-polished metal sample is subjected to component analysis by a fluorescent X-ray analyzer and fed back to the refining process. Although the above-described embodiment has been described with respect to an example in which only the sample collecting unit is provided, the present invention is naturally applied to a type in which a side temperature unit using a thermocouple or the like is attached to the lower end of the paper tube 3 for simultaneously performing temperature measurement and sample collecting. it can.
【0017】[0017]
【考案の効果】本考案の溶融金属採取用プローブの金属
試料を使用することで気送子よりの試料の取り出しが容
易となり、試料の取り出しができなかったり、気送子内
紙が破れることがなくなり気送子の多数回使用が可能と
なった。気送子より取り出した試料を分析のために自動
研磨機にて表面研磨するとき、試料肩部にて平坦な試料
押さえが可能となり、自動研磨機での使用ができ、自動
分析に寄与することが可能となった。[Effect of the Invention] By using the metal sample of the molten metal sampling probe of the present invention, it is easy to take out the sample from the pneumatic element, the sample cannot be taken out, or the paper inside the pneumatic element is broken. It became possible to use the pneumatic element many times. When the sample removed from the pneumatic element is polished for surface analysis by an automatic polishing machine, the flat sample can be held down at the sample shoulder, and it can be used with an automatic polishing machine, contributing to automatic analysis. Became possible.
【図1】本考案の試料採取用プローブにより採取した金
属試料の側面図。FIG. 1 is a side view of a metal sample collected by the sampling probe of the present invention.
【図2】本考案の一実施例を示す側面断面図。FIG. 2 is a side sectional view showing one embodiment of the present invention.
【図3】本考案にかかる気送子内金属試料状態図。FIG. 3 is a diagram showing a state of a metal sample in a pneumatic element according to the present invention.
【図4】自動研磨機装置の概略図。FIG. 4 is a schematic diagram of an automatic polishing machine device.
【図5】従来の試料採取用プローブにより採取した金属
試料の側面図。FIG. 5 is a side view of a metal sample collected by a conventional sampling probe.
【図6】従来の試料採取用プローブの側面断面図。FIG. 6 is a side sectional view of a conventional sampling probe.
1〜5 紙管 6 湯口部 7 アナブタ 8 上室 8b 上室空間 9 冷し金 9b 湯道 9c くびれ部 10 試料採取室 10b 試料採取空間 11 金属試料 12 気送子 13 チャッキング装置 14 研磨ベルト 15 グラインダー 1-5 paper tube 6 gate section 7 piglet 8 upper chamber 8b upper chamber space 9 chiller 9b runner 9c constricted section 10 sample collection chamber 10b sample collection space 11 metal sample 12 pneumatic element 13 chucking device 14 polishing belt 15 grinder
───────────────────────────────────────────────────── フロントページの続き (72)考案者 芳澤 毅 神奈川県横浜市南区永田みなみ台1−3 −920 ──────────────────────────────────────────────────の Continued on the front page (72) Inventor Takeshi Yoshizawa 1-3-920 Minamidai, Nagata, Minami-ku, Yokohama-shi, Kanagawa
Claims (3)
溶融金属採取プローブにおいて、流入口に筒状の側面に
開口する上室と内部に湯道を形成された縦方向半割れの
肉厚の冷し金と凹面状のディスク状試料採取室を有する
試料採取プローブであって、採取されるディスク状試料
の厚さ形状が底部より概略中間部まで中心部の径でテー
パ状に大きくなり且つ該中間部から該中間部の径と同径
で上部までストレートとなる形状の試料採取室を備える
事を特徴とする溶融金属試料採取プローブ。1. A molten metal sampling probe in which a sample collection container is incorporated in a paper tube, wherein an upper chamber opening to a cylindrical side surface at an inflow port and a vertical half-split wall having a runner formed therein. A chiller and a sampling probe having a concave disk-shaped sample collection chamber, wherein the thickness of the disk-shaped sample to be collected increases in a tapered shape with a diameter at a central portion from a bottom portion to a substantially middle portion, and A probe for collecting a molten metal sample, comprising: a sample collection chamber having the same diameter as the diameter of the intermediate portion and being straight from the middle portion to the upper portion.
試料肩部(B)より低い事を特徴とする請求項1記載の
溶融金属試料採取プローブ。2. The molten metal sampling probe according to claim 1, wherein the sample inlet portion (A) of the disk-shaped sampling chamber is lower than the sample shoulder portion (B).
ある事を特徴とする請求項1記載の溶融金属試料採取プ
ローブ。3. The probe according to claim 1, wherein the bottom corner of the disk-shaped sampling chamber has a concave curved surface.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4287093U JP2560846Y2 (en) | 1993-07-12 | 1993-07-12 | Molten metal sampling probe |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4287093U JP2560846Y2 (en) | 1993-07-12 | 1993-07-12 | Molten metal sampling probe |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH078767U JPH078767U (en) | 1995-02-07 |
JP2560846Y2 true JP2560846Y2 (en) | 1998-01-26 |
Family
ID=12648077
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4287093U Expired - Lifetime JP2560846Y2 (en) | 1993-07-12 | 1993-07-12 | Molten metal sampling probe |
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Country | Link |
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JP (1) | JP2560846Y2 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
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KR100687620B1 (en) * | 2005-07-29 | 2007-03-02 | 주식회사 우진 | Probe for molten sample adhesion prevention of stainless steel |
-
1993
- 1993-07-12 JP JP4287093U patent/JP2560846Y2/en not_active Expired - Lifetime
Also Published As
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JPH078767U (en) | 1995-02-07 |
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