JPH0769254B2 - Thermal shock test equipment - Google Patents

Description

TECHNICAL FIELD The present invention relates to a thermal shock test apparatus for performing a thermal shock test on electronic components and the like.

(Prior Art) Conventionally, as this type of thermal shock testing device, for example, Japanese Patent Laid-Open No.
No. 274035 is known, and as shown in FIG. 3, the one described in this publication has a heater (H) and a heating fan at the upper and lower parts adjacent to the test chamber (T). A high temperature chamber (A) containing (HF) and a low temperature chamber (B) containing a cooler (C), a cooling fan (CF) and a regenerator (R) are formed, and the test chamber (T) is formed. A high temperature outlet (E1) and a high temperature inlet (E2) are provided in the partition wall that defines the high temperature chamber (A) and the high temperature damper (D1) at the outlet (E1) and the inlet (E2), respectively. ) (D1) is mounted so that it can be opened and closed, while the low temperature outlet (E3) and the low temperature inlet (E) are attached to the partition wall that defines the test chamber (T) and the low temperature chamber (B).
4) is formed, and these outlet (E3) and inlet (E4)
The low temperature dampers (D2) and (D2) are attached to each of them so that they can be opened and closed.

When performing a thermal shock test of electronic components in the test chamber (T), for example, first, each high temperature damper (D
1) is opened and the heated air in the high temperature chamber (A) is introduced into the test chamber (T) to expose the electronic component to a high temperature state for a predetermined time, and then the high temperature dampers (D1) ) Is closed, the low-temperature dampers (D2) are opened, and the cooling air in the low-temperature chamber (B) is introduced into the test chamber (T) to bring the electronic components into a low-temperature state for a predetermined time. Expose. When exposed to the high temperature as described above, the cooler (C) is placed in the low temperature chamber (B).
Cooling air by the regenerator (R) is stored in the test chamber (T) when the cooling heat stored in the regenerator (R) and the cooling heat by the cooler (C) are exposed to the above low temperature.
Is supplied to the test chamber (T) to quickly cool the inside of the test chamber (T).

In the cold room (B) as described above, the internal temperature becomes low during low temperature exposure and cold storage operation, and the cooler (C) and the cool regenerator (R) crystallize in the air. Since the snow-like crystal body (frost) adheres, it is necessary to remove this frost. In view of this, in the above publication, intake and exhaust ducts (K1) and (K2) for communicating the high and low temperature chambers (A) and (B) are provided on the outside of the apparatus, and the ducts (K1) are provided. The defrosting of the cooler (C) and the regenerator (R) is performed by introducing the heated air in the high temperature chamber (A) to the low temperature chamber (B) side via (K2).

(Problems to be solved by the invention) As described above, when performing the defrosting of the cooler (C), etc., the duct (K1) (for sucking and discharging between the high and low temperature chambers (A) and (B) is used. When arranging K2), the entire device becomes large, and each of these ducts (K1) (K2) needs to have a heat insulating structure. In addition, each duct (K1) (K2)
There was a problem that the opening and closing dampers (D3) (D4) for switching between the defrosting and the other time had to be separately provided inside, and the configuration was complicated and the cost was high.

The present invention has been made in view of the above problems, and an object thereof is to quickly defrost the low temperature chamber side with a simple configuration without increasing the size of the entire apparatus. It is to provide a thermal shock test device.

(Means for Solving the Problems) In order to achieve the above object, the present invention provides a low temperature chamber (3).
And the high temperature chamber (2) and these low temperature chamber (3) and high temperature chamber (2)
A test chamber (1) disposed between the low temperature air outlet (1) and the low temperature chamber (2).
3) and the low temperature inlet (14) are provided, and these outlets (1
3) and a suction port (14) are provided with a low temperature damper (42), and a high temperature outlet (11) and a high temperature suction port (12) are provided between the test chamber (1) and the high temperature chamber (2). In the thermal shock testing apparatus, which is provided with the high temperature damper (41) at the blowout port (11) and the suction port (12), the low temperature blowout port (13), the high temperature suction port (12), and the low temperature The inlet (14) and the high temperature outlet (11) are arranged so as to face each other across the test chamber (1), and inside the test chamber (1), the portion where the outlet and the inlet face each other. On the other hand, there is provided a passage forming body (5) (6) in which a plurality of blades (51) (61) whose angle can be changed are juxtaposed in the facing direction of each of the air outlet and the air inlet. It is characterized by.

(Operation) When frost is generated on the low temperature chamber (3) side, the high and low temperature dampers (41) and (42) are opened, and the blades (5) and (6) of the passage forming bodies (5) and (6) are opened. 51) (6
By changing the angle of 1), the high temperature outlet (11) and the low temperature inlet (14), and the low temperature outlet (13) and the high temperature inlet (12) by these blades (51) (61). The heating air in the high temperature chamber (2) is sequentially supplied to the low temperature chamber (3) side by communicating with each other, and defrosting is performed in the low temperature chamber (3).

(Example) The thermal shock tester shown in FIG. 1 has a housing (HG).
A test chamber (1) for partitioning the inside of the container into three parts with a heat insulating partition (W) and performing a thermal shock test of electronic components etc. in the central part is provided with a high temperature in the upper and lower parts adjacent to the test chamber (1). A high temperature chamber (2) is formed by forming a chamber (2) and a low temperature chamber (3) respectively.
A heater (21) and a heating fan (22) are arranged inside, and a cooler (31) and a cooling fan (32) are arranged inside the low temperature chamber (3).

Further, a partition wall (W) that defines the test chamber (1) and the high temperature chamber (2) is provided with a high temperature outlet (11) and a high temperature inlet (12), and these outlets (11) are provided. A high temperature damper (41) (41) is openably and closably attached to the suction port (12), and a low temperature outlet is provided in a partition wall (W) that defines the test chamber (1) and the low temperature chamber (3). (13) and a low temperature suction port (14) are provided, and low temperature dampers (42) (42) are openably and closably attached to the blowout port (13) and the suction port (14), respectively.

When performing a thermal shock test on a device under test (S) such as an electronic component, first, a plurality of devices under test (S) are arranged in a stepped manner in the test chamber (1), and the low temperature dampers are arranged. (42)
In the closed state, each of the high temperature dampers (41) is opened as shown by the phantom line in the figure, and the heated air in the high temperature chamber (2) is introduced into the test chamber (1), and each test object is tested. Goods (S)
After exposing each of the high temperature dampers (41) to each other at high temperature, the low temperature dampers (42) are opened as shown by the solid line in the figure to cool the cooling air in the low temperature chamber (3). It is introduced into the test chamber (1), and each test object (S) is exposed to low temperature.

Thus, in the above impact test apparatus, the high temperature outlet (11) and the low temperature inlet (14), and the low temperature outlet (1
3) and the high temperature suction port (12) are arranged vertically opposite to each other with the test chamber (1) sandwiched therebetween, and inside the test chamber (1), the blowout ports (11, 13) and suction ports A plurality of blades (51) (6) whose angles can be changed are provided at the portion facing the mouths (14, 12).
1), and the first and second passages are formed by arranging these blades (51) (61) in parallel with each other in the opposing direction of the outlets (11, 13) and the inlets (14, 12). The bodies (5) and (6) are provided.

Each blade (5) of the first and second passage forming bodies (5) and (6)
1) (61) is provided with a thin and long plate material (a) and is formed by inserting a shaft rod (b) at the center portion in the width direction of the plate material (a) as shown in FIG. It

The shaft rod (b) of each blade (51) that constitutes the first passage forming body (5) is connected to the high temperature outlet (11).
Are arranged at equal intervals in the test chamber (1) on a line connecting the inner edge of the low temperature suction port (14) and the shaft rods (b) are extended outward from the wall of the housing (HG). A link mechanism or a manual handle which is interlocked with a motor is interlockingly connected to the projecting end portion, and the respective blades (51) are driven by the motor or the like by a horizontal position and an imaginary line indicated by a solid line in FIG. When selectively swinging to the vertical position shown, when swinging to this vertical position, the openings (11) (1) of the blades (51) (1)
On the side opposite to 4), the high temperature chamber (2) to the low temperature chamber (3)
To secure the flow path (52) for the heated air to the.

In addition, each blade (6) forming the second passage forming body (6)
The shaft rods (b) of 1) are arranged at equal intervals in the test chamber (1) on the line connecting the inner edges of the high temperature inlet (12) and the low temperature outlet (13), respectively. Axle (b)
In the same manner as in the above case, the blades (61) are indicated by the solid lines in the figure by projecting them outward from the wall of the housing (HG) and interlockingly connecting them to a motor or a manual handle. By selectively swinging to a horizontal position and a vertical position indicated by an imaginary line, at the time of swinging to this vertical position, on the side of the blades (61) facing the ports (12) (13), A flow passage (6) for cooling air from the low temperature chamber (3) to the high temperature chamber (2)
2) to ensure.

Then, when performing low temperature exposure of each DUT in the test chamber (1), as shown by the solid line in the figure,
The high temperature damper (41) is closed and the low temperature damper (42) is opened, and the blades (51) and (61) of the first and second passage forming bodies (5) and (6) are solid line in the figure. The cooling air from the low temperature chamber (3) is moved by the blades (51) and (61) as shown by solid line arrows in FIG. The sample to be tested (S) in the chamber (1) is uniformly guided and supplied, and the sample to be tested (S) is exposed to low temperature. Also, when exposing each of the DUTs (S) to a high temperature, as in the case described above, the blades (51) (61) are horizontally swung to move the high temperature chamber (3). The cooling air from (4) is uniformly guided and supplied to each of the DUTs (S) in the test chamber (1), and each of the DUTs (S) is exposed to high temperature.

Further, when frost is generated in the cooler (31) of the low temperature chamber (3), the high temperature damper (41) is opened as shown by the phantom line in the figure, and the low temperature damper (42) is opened. While opening as shown by the solid line in the drawing, each passage forming body (5)
The blades (51) and (61) of (6) are each swung to the vertical position as indicated by the chain double-dashed line in the figure. Then, each flow formed by these blades (51) and (61) Road (52)
A circulation path of heated air as shown by a two-dot chain line arrow in the figure is formed between the high temperature chamber (2) and the low temperature chamber (3) via the (62), and the low temperature chamber (3) The prompt defrosting is performed. At the time of defrosting as described above, it is desirable to open the high and low temperature dampers (41) and (42) obliquely as shown in FIG. Further, in the embodiment shown in the figure, at the time of defrosting, the heating air circulated between the high temperature chamber (2) and the low temperature chamber (3) is fed to the first
The circulation passage (52) is circulated to the second circulation passage (62), but this circulation passage can be reversed, and during the above-mentioned defrosting, the high and low temperature chambers (2 ) It is not always necessary to drive both the fans (22) (32) arranged in (3) together.

(Effects of the Invention) As described above, in the thermal shock testing apparatus according to the present invention, the low temperature outlet (13) and the high temperature inlet (12), and
The low-temperature inlet (14) and the high-temperature outlet (11) are arranged so as to face each other with the test chamber (1) sandwiched therebetween, and in the test chamber (1), the portions where the outlets and the inlets face each other. And a plurality of blades (51) (61) whose angles can be changed are arranged side by side in the direction in which the air outlets and the air inlets face each other.
Since (6) is provided, the entire structure is simplified and the defrosting on the low temperature chamber (3) side can be performed quickly at a low cost.

[Brief description of drawings]

FIG. 1 is a vertical cross-sectional view showing an embodiment of a thermal shock test apparatus according to the present invention, FIG. 2 is an enlarged cross-sectional view with a part of a vane forming a passage forming body omitted, and FIG. 3 is a cross-sectional view showing a conventional example. It is a figure. (1) …… Test room (2) …… High temperature room (3) …… Low temperature room (11) …… High temperature outlet (12) …… High temperature inlet (13) …… Low temperature outlet (14) …… Low temperature inlet (41) …… High temperature damper (42) …… Low temperature damper (5,6) …… Passage forming body (51,61) …… Vane

Claims (1)

[Claims] 1. A low temperature chamber (3), a high temperature chamber (2), and a test chamber (1) arranged between the low temperature chamber (3) and the high temperature chamber (2). 1) and the cold room (2)
A low temperature air outlet (13) and a low temperature air inlet (14) between them, and a low temperature damper (42) at the air outlet (13) and the air inlet (14), and the test chamber (1). ) And the high temperature chamber (2), a high temperature outlet (11) and a high temperature inlet (12)
In the thermal shock testing apparatus, in which the high temperature damper (41) is provided at the air outlet (11) and the air inlet (12), the low temperature air outlet (13), the high temperature inlet (12), and The low temperature inlet (14) and the high temperature outlet (11) are arranged so as to face each other with the test chamber (1) interposed therebetween, and the low temperature inlet (14) and the high temperature outlet (11) are connected to each other in the test chamber (1). Provided inside the facing portion are a plurality of blades (51) (61) whose angle can be changed in parallel with each other in the facing direction of the air outlets and the air inlets to form a passage forming body (5) (6). A thermal shock test device characterized in that