JPH0764110A - Active matrix substrate - Google Patents

Active matrix substrate

Info

Publication number
JPH0764110A
JPH0764110A JP21376193A JP21376193A JPH0764110A JP H0764110 A JPH0764110 A JP H0764110A JP 21376193 A JP21376193 A JP 21376193A JP 21376193 A JP21376193 A JP 21376193A JP H0764110 A JPH0764110 A JP H0764110A
Authority
JP
Japan
Prior art keywords
electrodes
black
resin
electrode
active matrix
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP21376193A
Other languages
Japanese (ja)
Inventor
Kenji Tomita
賢時 冨田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kyocera Corp
Original Assignee
Kyocera Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kyocera Corp filed Critical Kyocera Corp
Priority to JP21376193A priority Critical patent/JPH0764110A/en
Publication of JPH0764110A publication Critical patent/JPH0764110A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333Constructional arrangements; Manufacturing methods
    • G02F1/1335Structural association of cells with optical devices, e.g. polarisers or reflectors
    • G02F1/133509Filters, e.g. light shielding masks
    • G02F1/133512Light shielding layers, e.g. black matrix
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362Active matrix addressed cells
    • G02F1/136227Through-hole connection of the pixel electrode to the active element through an insulation layer

Landscapes

  • Liquid Crystal (AREA)

Abstract

PURPOSE:To embody a reflection type liquid crystal display device which prevents reflection at parts exclusive of pixel electrodes without subjecting the device to intricate processes and has bright and high image quality by forming black insulating layers which do not allow the transmission of light on thin-film transistors(TFTs) and signal wirings. CONSTITUTION:The insulating layers 11 consisting of a black resin, etc., are formed on the TFTs and electrodes 8 for storage capacitances. Namely, the entire surface of the substrate 1 is uniformly coated the black resin which covers the TFTs, the electrodes 8 for storage capacitances and wirings for signals and permits photolithography. The black resin consits of the photosensitive resin incorporated the pigment, such as carbon black. The black resin is prebaked at 80 deg.C after the coating and is then formed with holes communicating with drain electrodes 7 by using an exposure device and is further post baked at 130 deg.C, by which the resin is stabilized. As a result, the source electrodes 6 and drain electrodes 7 existing in the lower part of the pixel electrodes 2 and the signal insulation connected thereto are shielded by the insulating layers.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明はアクティブマトリックス
基板に関し、特に反射型液晶表示装置などに好適に用い
ることができるアクティブマトリックス基板に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an active matrix substrate, and more particularly to an active matrix substrate which can be preferably used in a reflection type liquid crystal display device or the like.

【0002】[0002]

【従来の技術および発明が解決しようとする課題】従来
のアクティブマトリクス基板を図2および図3に示す。
図2はアクティブマトリックス基板の画素電極部分の平
面図であり、図3は図2中のX−X線断面図である。2
1はガラスなどから成る基板であり、この基板21上に
薄膜トランジスタのゲート電極22、ゲート絶縁膜とな
る絶縁膜23、アモルファスシリコン層24、ソース電
極25、ドレイン電極26、及び保護膜27を順次積層
して構成されていた。また、ドレイン電極26には、透
明導電膜などから成る画素電極28が接続されており、
この画素電極28のほぼ中央部には、蓄積容量用電極2
9と蓄積容量用配線30が形成されている。なお、図2
中、31は画像信号配線、32は走査信号配線である。
2. Description of the Related Art A conventional active matrix substrate is shown in FIGS.
2 is a plan view of the pixel electrode portion of the active matrix substrate, and FIG. 3 is a sectional view taken along line XX in FIG. Two
Reference numeral 1 is a substrate made of glass or the like, on which a gate electrode 22 of a thin film transistor, an insulating film 23 to be a gate insulating film, an amorphous silicon layer 24, a source electrode 25, a drain electrode 26, and a protective film 27 are sequentially laminated. Was configured. A pixel electrode 28 made of a transparent conductive film or the like is connected to the drain electrode 26,
The storage capacitor electrode 2 is provided at the substantially central portion of the pixel electrode 28.
9 and the storage capacitor wiring 30 are formed. Note that FIG.
Inside, 31 is an image signal wiring, and 32 is a scanning signal wiring.

【0003】このアクティブマトリックス基板は、ツイ
ストネマティック液晶を用いた透過型表示モードの液晶
装置に用いられるが、光はゲート電極22、ソース電極
25、ドレイン電極26などから成る薄膜トランジスタ
部、蓄積容量用電極29、画像信号配線31、および走
査信号配線32部分で遮光され、表示装置としての開口
率は40%程度で光の有効効率が極めて低いという欠点
があった。
This active matrix substrate is used in a liquid crystal device of a transmissive display mode using a twisted nematic liquid crystal, and light is a thin film transistor portion including a gate electrode 22, a source electrode 25, a drain electrode 26 and the like, a storage capacitor electrode. 29, the image signal wiring 31, and the scanning signal wiring 32 are shielded from light, and there is a drawback that the effective efficiency of light is extremely low at an aperture ratio of about 40% as a display device.

【0004】このようなアクティブマトリックス基板の
裏面側に反射板(不図示)を配置した反射型液晶装置も
実用化されているが、上述のように開口率が小さい上
に、さらに偏光板(不図示)が必要なことから、著しく
暗い表示画面になる。
Although a reflection type liquid crystal device in which a reflection plate (not shown) is arranged on the back surface side of such an active matrix substrate has been put into practical use, it has a small aperture ratio as described above and further has a polarizing plate (not shown). (Shown) is required, resulting in a significantly dark display screen.

【0005】このような問題を回避するために、偏光板
が不要な相転移型ゲストホスト液晶などが提案され、画
素電極で光を反射させるアクティブマトリックス基板が
提案されている。この反射型のアクティブマトリックス
基板を図4に示す。図4中、41はガラスなどから成る
基板であり、この基板41上に薄膜トランジスタのゲー
ト電極42、ゲート絶縁膜となる絶縁膜43、アモルフ
ァスシリコン層44、ソース電極49、ドレイン電極4
6を順次積層して薄膜トランジスタを形成している。こ
のソース電極45およびドレイン電極46上に、アクリ
ル系樹脂などの透光性樹脂から成る絶縁層47を形成
し、この絶縁層47上に、ドレイン電極46に接続され
た画素電極48を形成したものである。この画素電極4
8は、入射した光を反射するために、例えばアルミニウ
ムなどの金属薄膜で形成される。このような構造では、
画素電極48を反射電極としてそのまま用いることがで
きるため、開口率を大きく取ることが可能である。
In order to avoid such a problem, a phase transition type guest-host liquid crystal that does not require a polarizing plate has been proposed, and an active matrix substrate that reflects light at a pixel electrode has been proposed. This reflection type active matrix substrate is shown in FIG. In FIG. 4, reference numeral 41 denotes a substrate made of glass or the like, on which a gate electrode 42 of a thin film transistor, an insulating film 43 to be a gate insulating film, an amorphous silicon layer 44, a source electrode 49, a drain electrode 4 are formed.
6 are sequentially stacked to form a thin film transistor. An insulating layer 47 made of a translucent resin such as an acrylic resin is formed on the source electrode 45 and the drain electrode 46, and a pixel electrode 48 connected to the drain electrode 46 is formed on the insulating layer 47. Is. This pixel electrode 4
8 is formed of a metal thin film such as aluminum for reflecting incident light. In such a structure,
Since the pixel electrode 48 can be used as it is as a reflective electrode, a large aperture ratio can be obtained.

【0006】ところが、上記方法では画素電極48に電
圧が印加され、液晶が透過状態になった場合に、この画
素電極48に隣接するソース電極45やこのソース電極
45に連続して形成される画像信号配線(不図示)でも
光が反射されるため、視覚上の画素電極48の輪郭が不
明瞭になり、画質が低下するという問題があった。この
ような画質低下を防止するために、対向電極50が形成
された基板49上にブラックマトリックス51を形成す
ることも可能ではあるが、折角の広い開口率を大きく減
少させてしまう。
However, in the above method, when a voltage is applied to the pixel electrode 48 and the liquid crystal becomes in a transmissive state, the source electrode 45 adjacent to the pixel electrode 48 or an image formed continuously with the source electrode 45. Since light is also reflected by the signal wiring (not shown), there is a problem in that the outline of the pixel electrode 48 is visually unclear and the image quality is deteriorated. Although it is possible to form the black matrix 51 on the substrate 49 on which the counter electrode 50 is formed in order to prevent such image quality deterioration, the aperture ratio with a wide bending angle is greatly reduced.

【0007】[0007]

【問題点を解決するための手段】本発明に係るアクティ
ブマトリックス基板は、このような問題点に鑑みてみな
されたものであり、その特徴とするところは、走査信号
配線に接続されるゲート電極、画像信号配線に接続され
るソース電極、およびドレイン電極を有する薄膜トラン
ジスタを基板上に複数設け、この複数の薄膜トランジス
タ上に絶縁層を形成し、この絶縁層上に前記ドレイン電
極に接続された画素電極を設けたアクティブマトリック
ス基板において、前記絶縁層を光を透過しない黒色の絶
縁層で形成した点にある。
The active matrix substrate according to the present invention has been considered in view of the above problems, and is characterized in that a gate electrode connected to a scanning signal wiring is provided. A plurality of thin film transistors each having a source electrode and a drain electrode connected to the image signal wiring are provided over a substrate, an insulating layer is formed over the plurality of thin film transistors, and a pixel electrode connected to the drain electrode is formed over the insulating layer. In the active matrix substrate provided with, the insulating layer is formed of a black insulating layer that does not transmit light.

【0008】[0008]

【作用】上記のように構成すると、画素電極の下部に位
置するソース電極、ドレイン電極およびこれらに接続さ
れる信号配線は、絶縁層で遮蔽される。もって、開口率
を大きく犠牲にすること無く、また従来方法よりも複雑
なプロセスを経ること無く画素電極以外での反射を防止
することが可能となり、明るい高画質な反射型液晶表示
装置が実現できる。
With the above structure, the source electrode and the drain electrode located under the pixel electrode and the signal wiring connected to these are shielded by the insulating layer. Therefore, it is possible to prevent reflection from other than the pixel electrode without significantly sacrificing the aperture ratio and through a more complicated process than the conventional method, and it is possible to realize a bright and high-quality reflective liquid crystal display device. .

【0009】[0009]

【実施例】以下、本発明を添付図面に基づき詳細に説明
する。図1は、本発明に係るアクティブマトリックス基
板の一実施例を示す断面図であり、1、2はガラスなど
から成る基板である。
The present invention will be described in detail below with reference to the accompanying drawings. FIG. 1 is a sectional view showing an embodiment of an active matrix substrate according to the present invention, and 1 and 2 are substrates made of glass or the like.

【0010】基板1上に薄膜トランジスタのゲート電極
3、ゲート絶縁膜となる絶縁膜4、アモルファスシリコ
ン層5、ソース電極6、ドレイン電極7を順次積層して
薄膜トランジスタを形成している。なお、薄膜トランジ
スタを形成する基板1は、必ずしも透光性のものでなく
てもよい。また、図示していないが、ソース電極6に連
続して形成される画像信号配線とゲート電極2に連続し
て形成される走査信号配線とがマトリックス状に形成さ
れる。さらにドレイン電極7およびその延在部分は、透
明導電膜である必要はなく、また、形状も後述する画素
電極と同等な広さにする必要もない。したがって、製造
上有利である。
A thin film transistor is formed by sequentially laminating a gate electrode 3 of a thin film transistor, an insulating film 4 serving as a gate insulating film, an amorphous silicon layer 5, a source electrode 6 and a drain electrode 7 on a substrate 1. The substrate 1 on which the thin film transistor is formed does not necessarily have to be translucent. Although not shown, image signal wirings formed continuously on the source electrode 6 and scanning signal wirings formed continuously on the gate electrode 2 are formed in a matrix. Further, the drain electrode 7 and the extended portion thereof do not need to be a transparent conductive film, and the shape thereof does not need to have the same width as a pixel electrode described later. Therefore, it is advantageous in manufacturing.

【0011】ドレイン電極7に隣接して、蓄積容量用電
極8と蓄積容量用配線9を形成する。上記ゲート電極
3、ソース電極6、ドレイン電極7、蓄積容量用電極
8、および蓄積容量用配線9は、それぞれアルミニウム
(Al)、クロム(Cr)、チタン(Ti)、ニッケル
(Ni)などで形成され、真空蒸着法やスパッタリング
法などで形成される。
A storage capacitor electrode 8 and a storage capacitor wiring 9 are formed adjacent to the drain electrode 7. The gate electrode 3, the source electrode 6, the drain electrode 7, the storage capacitor electrode 8, and the storage capacitor wiring 9 are each formed of aluminum (Al), chromium (Cr), titanium (Ti), nickel (Ni), or the like. And is formed by a vacuum vapor deposition method, a sputtering method, or the like.

【0012】基板1に対向して配置される基板2上に
は、透明導電膜などから成る対向電極10が形成され
る。
A counter electrode 10 made of a transparent conductive film or the like is formed on the substrate 2 arranged to face the substrate 1.

【0013】上記薄膜トランジスタおよび蓄積容量用電
極8上に、黒色樹脂などから成る絶縁層11を形成す
る。すなわち、薄膜トランジスタ、蓄積容量用電極8、
および信号用配線(不図示)を被覆するフォトリソ可能
な黒色樹脂を、基板1上に全面かつ均一にコーティング
する。この黒色樹脂は、例えばカーボンブラックなどの
顔料を入れた感光性樹脂などから成る。この感光性樹脂
としては、例えば溶媒にエチルソルブアセテートの入っ
たアクリル系樹脂などがある。コーティングは、スピン
コート法やロールコーター法を用いることができる。黒
色樹脂をコーティングして、80℃でプレベークした後、
露光装置を用いてドレイン電極7に連通する孔を形成
し、さらに130 ℃でポストベークして樹脂を安定化させ
る。
An insulating layer 11 made of black resin or the like is formed on the thin film transistor and the storage capacitor electrode 8. That is, the thin film transistor, the storage capacitor electrode 8,
A photolithographic black resin that covers the signal wiring (not shown) is uniformly coated on the entire surface of the substrate 1. This black resin is made of, for example, a photosensitive resin containing a pigment such as carbon black. Examples of the photosensitive resin include an acrylic resin in which ethylsolve acetate is contained in a solvent. For coating, a spin coat method or a roll coater method can be used. After coating with black resin and prebaking at 80 ℃,
A hole communicating with the drain electrode 7 is formed using an exposure device, and post-baked at 130 ° C. to stabilize the resin.

【0014】次にアルミニウムなどを1μm堆積して、
フォトリソでパターニングすることにより、画素電極1
2を形成する。アルミニウムなどの金属薄膜を堆積する
際に、基板温度を例えば100℃以下のように低く設定
すると、金属薄膜の表面がナシ状の凹凸となり、散乱特
性のある電極となって好適である。また、画素電極12
は、ドレイン電極7および蓄積容量用電極8以外の配線
部に大きく重ならないようにパタニングすることが望ま
しい。すなわち、画素電極12がドレイン電極7および
蓄積容量用電極8以外の配線上に形成されると、この画
素電極12と他の配線間に容量が形成され、駆動時に負
担が増えるためである。
Next, aluminum or the like is deposited to a thickness of 1 μm,
By patterning with photolithography, the pixel electrode 1
Form 2. When depositing a metal thin film of aluminum or the like, if the substrate temperature is set low, for example, 100 ° C. or lower, the surface of the metal thin film becomes pear-shaped irregularities, which is suitable as an electrode having scattering characteristics. In addition, the pixel electrode 12
Is preferably patterned so as not to largely overlap the wiring portion other than the drain electrode 7 and the storage capacitor electrode 8. That is, when the pixel electrode 12 is formed on a wiring other than the drain electrode 7 and the storage capacitance electrode 8, a capacitance is formed between the pixel electrode 12 and the other wiring, which increases the load during driving.

【0015】上記のような構成で画素電極12を160
μmピッチで形成すると、開口率80%以上のものを得
ることができる。
The pixel electrode 12 having the above structure
Forming with a μm pitch makes it possible to obtain an aperture ratio of 80% or more.

【0016】[0016]

【発明の効果】以上のように、本発明に係るアクティブ
マトリックス基板によれば、薄膜トランジスタや信号配
線上に、光を透過しない黒色の絶縁層を形成して、この
黒色の絶縁層上に画素電極を形成したことから、信号用
配線などで光が反射することはなく、黒がしまりコント
ラストを高く保つことができ、良好な画質が得られる。
また、薄膜トランジスタも黒色樹脂で被覆されるため迷
光等が薄膜トランジスタに入射することによって誘起さ
れる画質低下も同時に防ぐことができる。さらに、透明
樹脂の場合は、配線ぎりぎりの設計にすると製造時の工
程能力により画素配線間の隙間が露出し、基板の下部が
見えるようになるため何らかの手を施す必要も出てくる
が、本発明の場合それも回避することができる。
As described above, according to the active matrix substrate of the present invention, a black insulating layer that does not transmit light is formed on the thin film transistor and the signal wiring, and the pixel electrode is formed on the black insulating layer. Since the light emitting element is formed, light is not reflected by the signal wiring and the like, so that blackening can be maintained and the contrast can be kept high, and good image quality can be obtained.
In addition, since the thin film transistor is also covered with the black resin, it is possible to prevent the deterioration of the image quality caused by the stray light or the like entering the thin film transistor. Furthermore, in the case of transparent resin, if the design is made at the very end of the wiring, the gap between the pixel wirings will be exposed due to the process capability during manufacturing, and the lower part of the substrate will be visible. In the case of the invention, that too can be avoided.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明に係るアクティブマトリックス基板の一
実施例を示す図である。
FIG. 1 is a diagram showing an embodiment of an active matrix substrate according to the present invention.

【図2】従来のアクティブマトリックス基板を示す図で
ある。
FIG. 2 is a diagram showing a conventional active matrix substrate.

【図3】図2のX−X線断面図である。3 is a cross-sectional view taken along line XX of FIG.

【図4】従来の他のアクティブマトリックス基板を示す
図である。
FIG. 4 is a diagram showing another conventional active matrix substrate.

【符号の説明】[Explanation of symbols]

1、2・・・基板、3・・・ゲート電極、6・・・ソー
ス電極、7・・・ドレイン電極、11・・・絶縁層、1
2・・・画素電極
1, 2 ... Substrate, 3 ... Gate electrode, 6 ... Source electrode, 7 ... Drain electrode, 11 ... Insulating layer, 1
2 ... Pixel electrode

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 走査信号配線に接続されるゲート電極、
画像信号配線に接続されるソース電極、およびドレイン
電極を有する薄膜トランジスタを基板上に複数設け、こ
の複数の薄膜トランジスタ上に絶縁層を形成し、この絶
縁層上に前記ドレイン電極に接続された画素電極を設け
たアクティブマトリックス基板において、前記絶縁層を
光を透過しない黒色の絶縁層で形成したことを特徴とす
るアクティブマトリックス基板。
1. A gate electrode connected to a scanning signal line,
A plurality of thin film transistors each having a source electrode and a drain electrode connected to an image signal wiring are provided over a substrate, an insulating layer is formed over the plurality of thin film transistors, and a pixel electrode connected to the drain electrode is formed over the insulating layer. In the provided active matrix substrate, the insulating layer is formed of a black insulating layer that does not transmit light.
JP21376193A 1993-08-30 1993-08-30 Active matrix substrate Pending JPH0764110A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP21376193A JPH0764110A (en) 1993-08-30 1993-08-30 Active matrix substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP21376193A JPH0764110A (en) 1993-08-30 1993-08-30 Active matrix substrate

Publications (1)

Publication Number Publication Date
JPH0764110A true JPH0764110A (en) 1995-03-10

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Family Applications (1)

Application Number Title Priority Date Filing Date
JP21376193A Pending JPH0764110A (en) 1993-08-30 1993-08-30 Active matrix substrate

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Country Link
JP (1) JPH0764110A (en)

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US7362398B2 (en) 1998-06-16 2008-04-22 Semiconductor Energy Laboratory Co., Ltd. Camera and personal computer having a reflection type liquid crystal device with particular dielectric multi-layer film and interlayer insulating films
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