JPH0756621A - Test method/device for integrated controller - Google Patents

Abstract

PURPOSE:To improve the test job efficiency by decreasing the manual input jobs of data and shortening the test time. CONSTITUTION:An integrated controller has a function equivalent to a device 12 to be tested and has a normal operation as a standard device 16. A test device 5 is connected to the device 16 via the connection part of a serial I/O port 15, and the device 16 is tested. The acquired standard are stored in a memory 9b. Meanwhile the device 5 is connected to the device 12 by changeover of the connection part, and the device 12 is tested. The acquired tested data are stored in a memory 9c. The standard data are compared with the tested data at a comparing part 8, and the device 12 is tested. If it is decided based on the comparison result that the difference between both data is due to the change of software, the standard data are updated by the tested data.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a test method and a test apparatus for testing an integrated controller for collectively controlling a plurality of radios and the like provided in a cockpit of an aircraft, and more particularly to a data tester. The present invention relates to an integrated controller test method and a test apparatus capable of reducing a manual input work, shortening a test time, and improving a test work efficiency.

[0002]

2. Description of the Related Art An integrated controller collectively controls a plurality of communication devices and navigation devices provided in the cockpit of an aircraft,
It is a monitoring device. As shown in the system schematic diagram of the integrated control system of FIG. 4, the integrated controller 1 includes a data bus 2
It is connected to each controlled radio device 3 such as a communication device and a navigation device via the, and the state of the controlled radio device 3 is monitored and controlled.

The items controlled by the integrated controller 1 include channel setting, frequency setting, mode setting, squelch setting, etc. in each controlled radio device 3, and the number of items to be controlled is
A maximum of 8 items per screen controls 70 or more screen items. Here, an example of the screen of the integrated controller is shown in FIG. FIG. 5 is an explanatory diagram showing a display screen of the integrated controller. On this display screen, channel setting, frequency setting, and mode setting are performed in order from the top.

Conventionally, as a test method and a test apparatus for inspecting whether such an integrated controller operates normally, there is a test apparatus shown in FIG. FIG. 6 is a configuration block diagram of a conventional integrated controller test apparatus.

The conventional test apparatus 5 includes an input section 6 for inputting test item data (key data) and standard screen data (standard data), and a display section 7 for displaying test results and the like.
A transmitter 14 for transmitting key data to the device under test 12 which is an integrated controller to be tested, a receiver 13 for receiving screen data (data under test) from the device under test 12, standard data and the device under test. A comparing section 8 for comparing the data under test from 12; a memory 9a for storing the key data; a memory 9b for storing the standard data; and a memory 9 for storing the data under test.
c and a control unit 10 including a CPU that controls each unit of the test apparatus 5. The transmission unit 8 and the reception unit 7 are connected to the device under test 12 via the cable 11 and the device under test 12 is connected. Are to be tested.

Next, a conventional integrated controller test method using the conventional test apparatus 5 will be described with reference to FIGS. 6 and 7. FIG. 7 is a flowchart of a conventional integrated controller testing method. First, the device under test 12 is connected to the test apparatus 5, the test item data (key data) is manually input from the input unit 6 of the test apparatus 5 (301), and the input key data is stored in the memory 9a. Next, when the integrated controller is tested based on the key data, the data (standard data) of the screen that the normal integrated controller should display is input section 6
It is manually input (302) and the standard data is stored in the memory 9b.

When a test start command is input from the input section 6, the key data is read from the memory 9a and transmitted from the transmission section 14 to the device under test 12 (303). The device under test 12 operates based on the key data transmitted from the test device 5 and transmits screen data (data under test) to the test device 5. Then, in the test apparatus 5, the receiving unit 13 receives the data under test (304) and stores it in the memory 9c.

Then, the comparison unit 8 reads the standard data stored in the memory 9b and the data under test stored in the memory 9c, and the standard data and the data under test are read for each item in the comparison unit 8. By comparison, it is determined whether the standard data and the data under test are equal (305). If the data under test is equal to the standard data, it is judged to be normal and "item" OK "" is displayed for that item (30
6) If it is different from the standard data, "item" NG "" is displayed (307). Then, it is judged whether or not the comparison is completed for all the items (308), and if the comparison is not completed, the process returns to the process 305 and the comparison process is repeated until the comparison of the standard data and the test data is completed for all the items. . In this way, the integrated controller was tested.

[0009]

However, according to the above-described conventional test method and test apparatus, both key data and standard data must be manually input, which requires a great deal of labor and time. was there.

Further, when the device under test is improved and upgraded, that is, when the software is changed, if the standard data used until then is used as it is, it is detected as an abnormality. In order to
The old standard data cannot be used as it is, and it is necessary to search for the data of the software change part and manually rewrite it to the new standard data, which makes the work complicated and very inconvenient. was there.

The present invention has been made in view of the above circumstances, and the manual input of standard data at the start of a test and the manual input of new standard data for a changed portion at the time of changing software are unnecessary, and input It is an object of the present invention to provide an integrated controller test method and a test apparatus capable of saving labor and time and improving the efficiency of test work.

[0012]

According to a first aspect of the present invention for solving the problems of the above-mentioned conventional example, in a test method of an integrated controller, a standard machine of the integrated controller is tested by key data, Stores the standard data of the test result, tests the device under test of the integrated controller by the key data,
It is characterized in that the test data of the test result is stored, and the standard data and the test data are compared to determine whether the test machine of the integrated controller is normal or abnormal.

According to a second aspect of the present invention for solving the problems of the conventional example, in the test method for the integrated controller according to the first aspect, as a result of comparing the standard data and the data under test, there is a difference. When there is a point, the difference is displayed, and if the difference is a software change of the device under test, the standard data is updated to the data under test.

According to a third aspect of the present invention for solving the problems of the conventional example, in a test apparatus, an input unit for inputting key data as a test item, and a first unit for storing the input key data. Memory, a transmitter for transmitting key data in the first memory, a receiver for receiving standard data and data under test, a second memory for storing the standard data, and the data under test. A test apparatus having a third memory for storing, a comparing section for comparing standard data in the second memory with data under test in the third memory, and a display section for displaying the comparison result. , One port is connected to the transmitter and the receiver respectively, the other port is connected to the standard machine and the device under test, switching the test device of the standard machine and the device under test by switching operation. Either Connection portion for connection is characterized in that it is provided.

[0015]

According to the first aspect of the invention, the data under test as a result of testing the machine under test of the integrated controller and the standard data as a result of the test of the standard machine for the integrated controller are compared with each other. Since the test method of the integrated controller is used to judge normality / abnormality, standard data can be obtained from a standard machine instead of manual input, which simplifies the test work, shortens the test time, and improves the efficiency of the test work. it can.

According to the second aspect of the present invention, in the integrated controller test method according to the first aspect, if the result of the comparison between the standard data and the data under test indicates that the difference is due to the software change, Since the integrated controller test method is to update the standard data with the test data, the standard data can be rewritten and updated with the data under test when the software is changed due to a version upgrade, etc., so it is easy to respond to the software change. Yes, the efficiency of the test work can be improved.

According to the third aspect of the present invention, the test device is connected to the standard device to perform the test to obtain the standard data by the switching operation of the connecting portion, and the test device is connected to the device under test. Since it is a test device that performs a test and acquires the data under test and compares the standard data with the data under test, the standard data can be acquired from the standard machine instead of manually inputting it.
It is possible to simplify the test work, shorten the test time, and improve the efficiency of the test work.

[0018]

DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described with reference to the drawings. FIG. 1 is a configuration block diagram of a test apparatus for an integrated controller according to an embodiment of the present invention. It should be noted that parts having the same configuration as the test apparatus of FIG. The test apparatus 5 of the present embodiment has substantially the same basic configuration as the conventional test apparatus shown in FIG. 6, and displays an input unit 6 for inputting test item data (key data), a test result and the like. The display unit 7, the transmitting unit 14 for transmitting the key data to the device under test 12 of the integrated controller to be tested, the receiving unit 13 for receiving the screen data (data under test) from the device under test 12, and the standard Comparing section 8 for comparing screen data (standard data) with the data under test, and memories 9a, 9
b and 9c, and a control unit 10 including a CPU that controls the entire test apparatus 5.

Here, the memory 9a stores key data as a test item, and the memory 9b stores normal data during a test.
Stores standard data as a criterion for abnormality, and stores it in the memory 9c.
Stores the data under test sent from the device under test 12. The memory 9a includes a controller 10 and a transmitter 14.
The memory 9b and the memory 9c are connected to the controller 10
Is connected to the receiving unit 13 and the comparing unit 8.

As a characteristic part of this embodiment, a serial I / O port 15 as a connecting portion to the test apparatus 5 is provided, and the serial I / O port 15 is used when the integrated controller is tested. The device under test 12 is connected via the. Serial I / O port 15 is RS-232C
The transmitting section 14 and the receiving section 13 of the test apparatus 5 are connected to one port by an interface (RS-232C cable).

Further, the serial I / O port 15 can connect at least two or more integrated controllers to the other port.
By switching the switch on port 15,
An arbitrary integrated controller connected to the serial I / O port 15 is selected and connected to the test apparatus 5, and the integrated controller is tested as a device under test.

The data sent from the transmitter 14 of the test apparatus 5 is relayed by the serial I / O port 15 and sent to the integrated controller selected by the changeover switch.
In addition, the data from the selected integrated controller is serial I
The data is relayed at the / O port 15 and sent to the receiving unit 13 of the test apparatus 5.

Next, the test method of this embodiment is shown in FIG.
Then, a specific description will be given with reference to the flowcharts of FIGS. 2 and 3. The test method of this embodiment is divided into two stages, a first step of writing standard data in the memory 9b of the test apparatus 5 and a second step of testing the device under test to update the standard data. FIG. 2 is a flowchart of the first step of the test method of this embodiment, and FIG. 3 is a flowchart of the second step of the test method of this embodiment.

First, as shown in FIG. 1, an integrated controller having a function equivalent to that of the device under test 12 and confirmed to operate normally is prepared as a standard machine 16, The standard machine 16 is connected to the serial I / O port 15. In the test method of the present embodiment, when the normal integrated controller operates according to the determined test item data (key data), the screen data (standard data) displayed on the screen is not actually input manually but actually. The feature is that the standard machine 16 is operated according to the key data, and the obtained screen data is stored as it is as standard data in the memory 9b of the test apparatus 5.

That is, as shown in FIG. 1, the standard machine 16 and the device under test 12 are connected to the serial I / O port 15 connected to the test apparatus 5, and the standard I / O port 15 is switched by switching the switch. Machine 16 or machine under test 12
Any of the above and the test apparatus 5 are connected.

In the first step, as shown in FIG. 2, the switch of the serial I / O port 15 is connected to the test apparatus 5 and the standard machine 16, and the key data is input from the input unit 6 of the test apparatus 5. Is manually input (101) and the memory 9a
The key data is stored in. Then, this key data is transmitted from the transmission unit 14 to the standard machine 16 via the serial I / O port 15 (102).

The standard machine 16 performs a normal operation according to the received key data, and the obtained screen data is serial I
The data is transmitted to the test apparatus 5 via the / O port 15. The screen data transmitted from the standard machine 16 is received by the receiving unit 13 of the test apparatus 5 (103) and stored in the memory 9b as standard data (104). This standard data serves as a criterion for normality / abnormality when the integrated controller is actually tested.

Thus, conventionally, both the key data and the standard data are manually input, but only the key data need be manually input, which simplifies the work and improves the efficiency of the test work. Can be improved.

Next, the operation of the second step will be described with reference to the flowchart of FIG. The test method of the device under test in the second step is the same as the conventional test method, but is characterized in that the standard data can be updated when the software of the device under test is changed. .

First, as shown in FIG. 3, serial I / O
The switch of the port 15 is switched to the device under test 12 side, the key data is read from the memory 9a of the test apparatus 5 and transmitted from the transmitting unit 14 to the device under test 12 via the serial I / O port 15 (201). ). The device under test 12
It operates according to the key data, and transmits the obtained screen data (data under test) to the test apparatus 5 via the serial I / O port 15. In the test apparatus 5, the receiving section 13 receives the data under test (202) and stores it in the memory 9c.

Then, the comparison unit 8 compares, for each item, the standard data of the standard machine 16 read from the memory 9b with the test data of the machine under test 12 read from the memory 9c, and the standard data and the machine under test are compared. It is determined whether the data is the same (203). If the standard data and the data under test are equal, it is determined that the item is normal, and the display unit 7
"Item" OK "" is displayed on the screen (204). In addition, if the standard data and the data under test are not equal, "Item"
NG "" is displayed (205).

Then, it is judged whether or not the comparison between the data under test and the standard data is completed for all the test items (2
06), if not completed, the process returns to the process 203 and the comparison process is continued until the comparison of all items is completed.

When the comparison of all the test items is completed, it is judged whether or not there is an item (abnormal item) which becomes "item" NG "" (207), and if there is an abnormal item, it is judged as each abnormal item. Display the test data and standard data (2
08), for each abnormal item, the operator compares the data under test with the standard data and determines whether the difference is due to only the software change (209).

If only the software is changed, the tested data portion of the item stored in the memory 9c is read and written in the corresponding standard data portion of the memory 9b, and the update processing is performed as new standard data ( 210). This update process can be performed by a simple operation from the input unit 6. Further, if it is not only due to the software change, it is judged as a true abnormality, the standard data is not updated, and the processing is ended. In this way, the test method for the integrated controller of this embodiment is performed.

Conventionally, if there is a software change due to the version upgrade of the integrated controller, simply "item" N
Although only "G" (abnormal) is displayed, according to the test method of this embodiment, by performing the test once,
Well-known differences such as software changes due to version upgrades can be checked, standard data can be updated, and abnormalities can be prevented from being detected in the next test.

Further, when the software of the integrated controller is changed, it is not necessary to search for the changed item and manually rewrite the standard data each time to make the standard data according to the new software. Since standard data can be easily rewritten, the test work efficiency can be greatly improved.

Further, in the present embodiment, the device under test 1 connected to the serial I / O port 15 is simplified for simplification of description.
Although only one unit is connected to the test device 5, a plurality of integrated controllers are connected to the serial I / O port 15 and the switches of the serial I / O port 15 are switched to connect the test devices 5 one by one. It is also possible to carry out a test. In this case, if the plurality of devices under test 12 have the same function and the same standard data, the first step can be omitted and only the second step can be continuously performed.

In this embodiment, serial I / O is performed in advance.
The standard device 16 and the device under test 12 are connected to the port 15 and either the standard device 16 or the device under test 12 is connected to the test apparatus 5 by switching the switch. First,
The standard machine 16 is connected to the serial I / O port 15 to store the standard data, and then the cable of the standard machine 16 is disconnected from the serial I / O port 15 and the device under test 12 is replaced.
May be connected.

According to the integrated controller testing method and the testing apparatus of this embodiment, the integrated controller having the same function as the device under test 12 and operating normally is used as the standard machine 16, and the serial I / O port is used. The test apparatus 5 is connected to the test apparatus 5 via 15 to send the key data to the standard apparatus 16 so that the standard apparatus 16 operates normally according to the key data, and the obtained screen data is tested by the standard apparatus 16. Send to device 5 and test device 5
Since the screen data received in is stored as standard data, there is no need to manually enter standard data,
There is an effect that the test work efficiency can be improved.

Further, according to the test method of the present embodiment, even if the integrated controller of the device under test 12 has a software change, the standard data that has already been input is used as a reference for the test, and the test is performed. For items where the data under test of the tester 12 differs from the standard data, it is possible to determine whether or not the difference is due to software change only. If the difference is due to software change, the standard data Since it is an update method that rewrites with the data under test, it is not necessary to search the changed part of the standard data every time the software of the integrated controller is changed and manually input the standard data according to the new software. There is an effect that the test work efficiency can be easily improved.

[0041]

According to the first aspect of the present invention, the test data obtained by testing the device under test of the integrated controller is compared with the standard data obtained by testing the standard device of the integrated controller. Since the test method of the integrated controller is used to judge whether the machine is normal or abnormal, standard data can be obtained from the standard machine instead of manual input, which simplifies the test work, shortens the test time, and improves the efficiency of the test work. There is an effect that can be.

According to the second aspect of the present invention, in the integrated controller testing method according to the first aspect, if the result of the comparison between the standard data and the data under test indicates that the difference is due to software modification, Since the integrated controller test method is to update the standard data with the test data, the standard data can be rewritten and updated with the data under test when the software is changed due to a version upgrade, etc., so it is easy to respond to the software change. There is an effect that the efficiency of the test work can be improved.

According to the third aspect of the present invention, the test device is connected to the standard device to perform the test to obtain the standard data by the switching operation of the connecting portion, and the test device is connected to the device under test. Since it is a test device that performs a test and acquires the data under test and compares the standard data with the data under test, the standard data can be acquired from the standard machine instead of manually inputting it.
The test work can be simplified, the test time can be shortened, and the efficiency of the test work can be improved.

[Brief description of drawings]

FIG. 1 is a configuration block diagram of a test apparatus for an integrated controller according to an embodiment of the present invention.

FIG. 2 is a flow chart showing the first step of the test method of this example.

FIG. 3 is a flowchart showing a second step of the test method of this example.

FIG. 4 is a system schematic diagram of an integrated control system.

FIG. 5 is an explanatory diagram showing a display screen of the integrated controller.

FIG. 6 is a configuration block diagram of a conventional integrated controller test apparatus.

FIG. 7 is a flowchart showing a conventional integrated controller test method.

[Explanation of symbols]

DESCRIPTION OF SYMBOLS 1 ... Integrated controller, 2 ... Data bus, 3 ... Controlled radio device, 5 ... Test device, 6 ... Input part, 7 ... Display part, 8
... Comparison section, 9 ... Memory, 10 ... Control section, 11 ... Cable, 12 ... Device under test, 13 ... Reception section, 14 ... Transmission section, 15 ... Serial I / O port, 16 ... Standard machine

Claims (3)

[Claims] 1. A standard machine of an integrated controller is tested by key data, standard data of the test result is stored, a test machine of the integrated controller is tested by the key data,
A method for testing an integrated controller, which stores data under test of the test result, and compares the standard data and the data under test to determine whether the device under test of the integrated controller is normal or abnormal. . 2. The integrated controller test method according to claim 1, wherein when there is a difference as a result of comparing the standard data and the data under test, the difference is displayed, and the difference is displayed. If the software of the device under test is changed,
A test method for an integrated controller, characterized in that the standard data is updated to the data under test. 3. An input unit for inputting key data as a test item, a first memory for storing the input key data, a transmitting unit for transmitting the key data in the first memory, and a standard. A receiver for receiving data and data under test, a second memory for storing the standard data, a third memory for storing the data under test, a standard data in the second memory, and the third memory. A test device having a comparing part for comparing the data under test in the memory of, and a display part for displaying the comparison result, wherein one port is connected to the transmitting part and the receiving part respectively, and the other port Is connected to the standard machine and the machine under test, and a connecting portion for connecting the test machine to either the standard machine or the machine under test by a switching operation is provided.