JPH0755898A - Method of synthetic shortcircuit test of circuit breaker - Google Patents
Method of synthetic shortcircuit test of circuit breakerInfo
- Publication number
- JPH0755898A JPH0755898A JP20351393A JP20351393A JPH0755898A JP H0755898 A JPH0755898 A JP H0755898A JP 20351393 A JP20351393 A JP 20351393A JP 20351393 A JP20351393 A JP 20351393A JP H0755898 A JPH0755898 A JP H0755898A
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- test
- synthetic
- voltage side
- double
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は、遮断器の合成短絡試験
法に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a synthetic short circuit test method for circuit breakers.
【0002】[0002]
【従来の技術】従来、遮断器の2重回路法(スキーツ
法)回路を図2に示す。この試験は、限流発電機AGか
ら保護遮断器S1,限流リアクトルL1,投入器S2,補
助遮断器Shを介して供試遮断器SPに短絡電流を供給
し、補助遮断器Sh及び供試遮断器SPを同時に開いて
昇圧トランスTF2の2次側高電圧を短絡電流抑制抵抗
RSを介して供試遮断器SPに印加する。過渡回復電圧
(TRV)はTRV調整コンデンサCで調整する。2. Description of the Related Art A conventional double circuit method (Skeet's method) of a circuit breaker is shown in FIG. In this test, a short circuit current is supplied from the current limiting generator AG to the test circuit breaker SP through the protective circuit breaker S 1 , the current limiting reactor L 1 , the closing device S 2 , and the auxiliary circuit breaker Sh, and the auxiliary circuit breaker Sh is supplied. Also, the test breaker SP is opened simultaneously and the secondary high voltage of the step-up transformer TF 2 is applied to the test breaker SP via the short circuit current suppressing resistor RS. The transient recovery voltage (TRV) is adjusted by the TRV adjustment capacitor C.
【0003】この2重回路法は、遮断器の特に真空遮断
器(VCB)の開発試験に多用されている(IEC42
7−P81〜P84)。また定格遮断試験だけでなく進
み電流遮断合成試験等にも応用され実際に使用されてい
る。この方法は既設の設備が利用できることや電圧源回
路の同期を特に必要とせずある程度アーク時間の長い遮
断にも適用できる長所がある。This double circuit method is widely used for development test of circuit breakers, especially vacuum circuit breaker (VCB) (IEC42).
7-P81 to P84). In addition to the rated breaking test, it has also been applied and actually used in advanced current breaking synthetic tests. This method has the advantage that existing equipment can be used and that the voltage source circuit does not need to be synchronized, and it can be applied to interruptions with a long arc time to some extent.
【0004】[0004]
【発明が解決しようとする課題】上記二重回路法は、単
一周波数(2パラメータ)の過渡回復電圧を対象として
おり、84kVまでの遮断器に適用できる。100kV
以上の遮断器については4パラメータTRVが規格値で
あるため他の試験法(直接試験,ワイル試験,シーメン
スI・II試験法)に頼らざるを得なかった。The above-mentioned double circuit method is intended for a transient recovery voltage of a single frequency (two parameters) and can be applied to a circuit breaker up to 84 kV. 100 kV
With regard to the above circuit breaker, the four-parameter TRV is a standard value, so that other test methods (direct test, Weil test, Siemens I / II test method) had to be resorted to.
【0005】本発明は、従来のこのような問題点に鑑み
てなされたものであり、その目的とするところは、二重
回路法を定格電圧100kV以上の全ての遮断器に適用
拡大可能とした遮断器の合成試験法を提供することにあ
る。The present invention has been made in view of the above problems of the prior art, and an object thereof is to make the double circuit method applicable to all circuit breakers having a rated voltage of 100 kV or more. It is to provide a synthetic test method for a circuit breaker.
【0006】[0006]
【課題を解決するための手段】上記目的を達成するため
に、本発明における遮断器の合成試験法は、二重回路法
における電圧源回路の昇圧トランスの高圧側巻線を変圧
比0.715:0.285(JEC−2300対象)又
は0.67:0.33(IEC−56対象)の2巻線と
してカスケード接続し、その高圧側端子に100kV以
上の合成試験規格の4パラメータTRV波形が発するよ
うに前記各巻線にそれぞれコンデンサを接続する。In order to achieve the above object, the synthetic test method of the circuit breaker according to the present invention is such that the high voltage side winding of the step-up transformer of the voltage source circuit in the double circuit method has a transformer ratio of 0.715. : 0.285 (target for JEC-2300) or 0.67: 0.33 (target for IEC-56) connected in cascade, and the high-voltage side terminal has a 4-parameter TRV waveform of 100 kV or more of synthetic test standard. A capacitor is connected to each of the windings so as to emit.
【0007】[0007]
【作用】二重回路法による試験において、供試遮断器に
流れる短絡電流を遮断すると、昇圧トランスの高圧側端
子には100kV以上の合成試験規格を満たす4パラメ
ータTRV波形が発生する。このため従来84kV定格
電圧以下の合成試験にしか適用できなかった二重回路法
を100kV以上の全ての定格電圧の遮断器に適用拡大
できる。In the test by the double circuit method, when the short circuit current flowing through the circuit breaker under test is cut off, a 4-parameter TRV waveform satisfying the synthetic test standard of 100 kV or more is generated at the high voltage side terminal of the step-up transformer. Therefore, the double circuit method, which was conventionally applicable only to the synthetic test of 84 kV or lower rated voltage, can be applied to the circuit breakers of all rated voltages of 100 kV or higher.
【0008】[0008]
【実施例】本発明の実施例を図面を参照して説明する。
図1において、AGは短絡発電機、S1は保護遮断器、
L2は限流リアクトル、S2は投入器、Sh及びSpは投
入器S2と接地間に直列に接続された補助遮断器及び供
試遮断器、TF1は投入器S2と接地間に接続された昇圧
トランス、RSは昇圧トランスの高圧側出力端子2と供
試遮断器との間に接続された短絡抑制抵抗(200Ω〜
10KΩ)である。Embodiments of the present invention will be described with reference to the drawings.
In FIG. 1, AG is a short-circuit generator, S 1 is a protective circuit breaker,
L 2 is a current limiting reactor, S 2 is a make-up device, Sh and Sp are auxiliary breakers and test breakers connected in series between make-up device S 2 and ground, and TF 1 is between make-up device S 2 and ground. The connected step-up transformer, R S, is a short-circuit suppressing resistor (200 Ω ~ 200 Ω connected between the high-voltage side output terminal 2 of the step-up transformer and the circuit breaker under test.
10 KΩ).
【0009】昇圧トランスTF1の高圧側巻線は巻線n1
とn2の直列巻線で構成され、巻線n1及びn2にはそれ
ぞれTRV調整コンデンサC1及びC2が接続されてい
る。The high voltage side winding of the step-up transformer TF 1 is winding n 1
And n 2 in series, and TRV adjusting capacitors C 1 and C 2 are connected to the windings n 1 and n 2 , respectively.
【0010】昇圧トランスTF1の高圧側変圧比(n2/
n1)は0.715:0.285(JEC2300対
象)又は0.67:0.33(IEC56対象)とす
る。(この定数はTRV振幅率がJEC2300では
1.4又はIEC56では1.5から求まる値であ
る。)TRV調整コンデンサC1及びC2には遮断器S
h,Spを開としたとき昇圧トランスTF1の高圧側端
子に発生する電圧が、100kV以上の合成試験規格の
4パラメータ過渡回復電圧波形の電圧u1,uc及び時
間t1,t2と合致するような適切な容量のコンデンサを
選択する。The high-voltage side transformer ratio of the step-up transformer TF 1 (n 2 /
n 1 ) is 0.715: 0.285 (JEC2300 target) or 0.67: 0.33 (IEC56 target). (This constant is a value obtained from the TRV amplitude ratio of 1.4 in JEC2300 or 1.5 in IEC56.) The circuit breaker S is used for the TRV adjusting capacitors C 1 and C 2.
The voltage generated at the high voltage side terminal of the step-up transformer TF 1 when h and Sp are opened matches the voltage u 1 , uc and the time t 1 , t 2 of the four-parameter transient recovery voltage waveform of the synthetic test standard of 100 kV or more. Select a capacitor with an appropriate capacitance.
【0011】168kV−40kA,100%定格遮断
条件のコンデンサC1,C2容量の計算例を以下に示す。An example of calculating the capacitances of the capacitors C 1 and C 2 under the condition of 168 kV-40 kA and 100% rated cutoff is shown below.
【0012】u1/t1=206kV/103μs,uc
/t2=288kV/309μs,t1/t2=1/3,
n1=13.2kV/196kV,n2=13.2kV/
80kV,198kV/80kV=0.71/0.29 発電機電圧6kV−40kA通電ではZL=0.4
8mH,これよりc1/c2を求める。U 1 / t 1 = 206 kV / 103 μs, uc
/ T 2 = 288 kV / 309 μs, t 1 / t 2 = 1/3,
n 1 = 13.2 kV / 196 kV, n 2 = 13.2 kV /
80kV, 198kV / 80kV = 0.71 / 0.29 Z L = 0.4 a generator voltage 6kV-40 kA current
8 mH , and c 1 / c 2 is calculated from this.
【0013】f=0.8/(2T)よりf=0.8/
(2×103×10-6)=3.88kHZ,C1=1/
((2πf2)L)よりC1≒15770PFとなる。同
様の方法でC2を求めると、C2=0.84μFとなる。
t1,t3は3倍高調波振動であり、規定の電圧u1,u
cは重畳される。From f = 0.8 / (2T), f = 0.8 /
(2 × 103 × 10 -6) = 3.88kH Z, C 1 = 1 /
From ((2πf 2 ) L), C 1 ≈15770PF. When C 2 is obtained by the same method, C 2 = 0.84 μF.
t 1 and t 3 are triple harmonic vibrations, and the specified voltages u 1 and u
c is superimposed.
【0014】上述のように昇圧トランスの高圧側変圧比
n2/n1を決め、TRV調整用コンデンサc1,c2の値
を選択したので、JEC2300又はIEC56に規定
するTRV振巾率の複数周波数(4パラメータ)TRV
波形を得ることができる。従って二重化回路法により1
00kV以上の定格電圧の遮断器の試験が可能となっ
た。As described above, since the high-voltage side transformation ratio n 2 / n 1 of the step-up transformer is determined and the values of the TRV adjusting capacitors c 1 and c 2 are selected, a plurality of TRV swing ratios specified in JEC2300 or IEC56 are selected. Frequency (4 parameters) TRV
Waveforms can be obtained. Therefore, by the duplicated circuit method, 1
It has become possible to test circuit breakers with a rated voltage of 00 kV or higher.
【0015】[0015]
【発明の効果】本発明は、上述のように構成されている
ので、次に記載する効果を奏する。Since the present invention is configured as described above, it has the following effects.
【0016】(1)2重回路法において従来84kV定
格電圧以下の合成試験にしか適用できなかったものが、
100kV以上の全ての定格電圧の遮断器に適用が拡大
する。(1) The double circuit method, which has been conventionally applicable only to the synthetic test of 84 kV or lower rated voltage,
The application will be expanded to circuit breakers of all rated voltages of 100 kV and above.
【0017】(2)従来2重回路法では単一周波数(2
パラメータ)しか得られなかったTRV波形を複数周波
数(4パラメータ)TRV波形とすることができる。(2) In the conventional double circuit method, a single frequency (2
The TRV waveform obtained only with the parameter) can be used as a multi-frequency (4 parameter) TRV waveform.
【0018】(3)既設の2重回路法設備に少し改良を
加えれば全ての遮断器に適用可能となるので、きわめて
経済的である。(3) It is very economical because it can be applied to all circuit breakers with a slight modification to the existing double circuit method equipment.
【図1】本発明の実施例を示す回路図。FIG. 1 is a circuit diagram showing an embodiment of the present invention.
【図2】従来例を示す回路図。FIG. 2 is a circuit diagram showing a conventional example.
AG…短絡発電機 L1…限流リアクトル RS…短絡電流抑制抵抗 S1…保護遮断器 S2…投入器 Sh…補助遮断器 Sp…供試遮断器 TF1,TF2…昇圧トランス C,C1,C2…TRV(過渡回復電圧)調整コンデンサAG ... shorting the generator L 1 ... limiting reactor R S ... short-circuit current suppressing resistor S 1 ... protection breaker S 2 ... insertion unit Sh ... auxiliary breaker Sp ... test breaker TF 1, TF 2 ... step-up transformer C, C 1, C 2 ... TRV (transient recovery voltage) adjustment capacitor
───────────────────────────────────────────────────── フロントページの続き (72)発明者 塩崎 光康 東京都品川区大崎2丁目1番17号 株式会 社明電舎内 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Mitsuyasu Shiozaki 2-17 Osaki, Shinagawa-ku, Tokyo Incorporated company Meidensha
Claims (1)
昇圧トランスを用いた電圧源回路を用いて遮断器の合成
試験をする二重回路法において、 前記昇圧トランスの高圧側巻線を変圧比0.715:
0.285又は0.67:0.33の2巻線としてカス
ケード接続し、その高圧側端子に100kV以上の合成
試験規格の4パラメータ過渡回復電圧波形が発生するよ
うに前記各巻線にそれぞれコンデンサを接続し、二重回
路法により100kV以上の遮断器の試験がなしうるよ
うにしたことを特徴とする遮断器の合成試験法。1. A dual circuit method for performing a synthetic test of a circuit breaker using a current source circuit connected to a short-circuit generator and a voltage source circuit using a step-up transformer, wherein a high-voltage side winding of the step-up transformer is transformed. Ratio 0.715:
Cascade connection is made as two windings of 0.285 or 0.67: 0.33, and a capacitor is provided in each winding so that a 4-parameter transient recovery voltage waveform of 100 kV or more of synthetic test standard is generated at the high voltage side terminal. A synthetic test method for circuit breakers, characterized in that the circuit breakers of 100 kV or more can be tested by a double circuit method by connecting them.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP20351393A JP3134608B2 (en) | 1993-08-18 | 1993-08-18 | Synthetic test method for circuit breakers |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP20351393A JP3134608B2 (en) | 1993-08-18 | 1993-08-18 | Synthetic test method for circuit breakers |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0755898A true JPH0755898A (en) | 1995-03-03 |
JP3134608B2 JP3134608B2 (en) | 2001-02-13 |
Family
ID=16475402
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP20351393A Expired - Fee Related JP3134608B2 (en) | 1993-08-18 | 1993-08-18 | Synthetic test method for circuit breakers |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP3134608B2 (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5665406A (en) * | 1992-03-23 | 1997-09-09 | Wm. Wrigley Jr. Company | Polyol coated chewing gum having improved shelf life and method of making |
US6303159B2 (en) | 1998-12-30 | 2001-10-16 | Wm Wrigley Jr. Company | Comestible coating process applying powder and suspension syrup |
US6444240B1 (en) | 1999-08-30 | 2002-09-03 | Wm. Wrigley Jr. Company | Coating process applying a suspension syrup with a combination of hydrogenated isomaltulose materials |
-
1993
- 1993-08-18 JP JP20351393A patent/JP3134608B2/en not_active Expired - Fee Related
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5665406A (en) * | 1992-03-23 | 1997-09-09 | Wm. Wrigley Jr. Company | Polyol coated chewing gum having improved shelf life and method of making |
US6303159B2 (en) | 1998-12-30 | 2001-10-16 | Wm Wrigley Jr. Company | Comestible coating process applying powder and suspension syrup |
US6444240B1 (en) | 1999-08-30 | 2002-09-03 | Wm. Wrigley Jr. Company | Coating process applying a suspension syrup with a combination of hydrogenated isomaltulose materials |
Also Published As
Publication number | Publication date |
---|---|
JP3134608B2 (en) | 2001-02-13 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
LAPS | Cancellation because of no payment of annual fees |