JPH0755504Y2 - Ｉｃデバイスのプリヒート装置 - Google Patents

Ｉｃデバイスのプリヒート装置

Info

Publication number
JPH0755504Y2
JPH0755504Y2 JP1989104878U JP10487889U JPH0755504Y2 JP H0755504 Y2 JPH0755504 Y2 JP H0755504Y2 JP 1989104878 U JP1989104878 U JP 1989104878U JP 10487889 U JP10487889 U JP 10487889U JP H0755504 Y2 JPH0755504 Y2 JP H0755504Y2
Authority
JP
Japan
Prior art keywords
chute
air
temperature
air supply
heated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1989104878U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0344680U (enrdf_load_stackoverflow
Inventor
邦彦 村上
光 興津
里志 原田
光 村松
Original Assignee
日立電子エンジニアリング株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日立電子エンジニアリング株式会社 filed Critical 日立電子エンジニアリング株式会社
Priority to JP1989104878U priority Critical patent/JPH0755504Y2/ja
Publication of JPH0344680U publication Critical patent/JPH0344680U/ja
Application granted granted Critical
Publication of JPH0755504Y2 publication Critical patent/JPH0755504Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
JP1989104878U 1989-09-08 1989-09-08 Ｉｃデバイスのプリヒート装置 Expired - Lifetime JPH0755504Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1989104878U JPH0755504Y2 (ja) 1989-09-08 1989-09-08 Ｉｃデバイスのプリヒート装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1989104878U JPH0755504Y2 (ja) 1989-09-08 1989-09-08 Ｉｃデバイスのプリヒート装置

Publications (2)

Publication Number Publication Date
JPH0344680U JPH0344680U (enrdf_load_stackoverflow) 1991-04-25
JPH0755504Y2 true JPH0755504Y2 (ja) 1995-12-20

Family

ID=31653657

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1989104878U Expired - Lifetime JPH0755504Y2 (ja) 1989-09-08 1989-09-08 Ｉｃデバイスのプリヒート装置

Country Status (1)

Country Link
JP (1) JPH0755504Y2 (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101537325B1 (ko) * 2014-12-05 2015-07-16 엘아이지넥스원 주식회사 렌치 소켓

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6052031A (ja) * 1983-08-31 1985-03-23 Sharp Corp 半導体装置の高温テスト装置
JPH065649Y2 (ja) * 1985-09-04 1994-02-09 富士通株式会社 Ｉｃハンドラ−のバツフアレ−ル機構

Also Published As

Publication number Publication date
JPH0344680U (enrdf_load_stackoverflow) 1991-04-25

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