JPH074605Y2 - 発光素子の試験装置 - Google Patents
発光素子の試験装置Info
- Publication number
- JPH074605Y2 JPH074605Y2 JP1987196361U JP19636187U JPH074605Y2 JP H074605 Y2 JPH074605 Y2 JP H074605Y2 JP 1987196361 U JP1987196361 U JP 1987196361U JP 19636187 U JP19636187 U JP 19636187U JP H074605 Y2 JPH074605 Y2 JP H074605Y2
- Authority
- JP
- Japan
- Prior art keywords
- light
- light emitting
- emitting element
- constant temperature
- trays
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000012360 testing method Methods 0.000 title claims description 12
- 238000011056 performance test Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 2
- 238000007689 inspection Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 1
- 239000000725 suspension Substances 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1987196361U JPH074605Y2 (ja) | 1987-12-23 | 1987-12-23 | 発光素子の試験装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1987196361U JPH074605Y2 (ja) | 1987-12-23 | 1987-12-23 | 発光素子の試験装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0199071U JPH0199071U (esLanguage) | 1989-07-03 |
| JPH074605Y2 true JPH074605Y2 (ja) | 1995-02-01 |
Family
ID=31486983
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1987196361U Expired - Lifetime JPH074605Y2 (ja) | 1987-12-23 | 1987-12-23 | 発光素子の試験装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH074605Y2 (esLanguage) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2628267B2 (ja) * | 1993-03-19 | 1997-07-09 | プロサイド株式会社 | マイクロコンピュータの耐久試験装置 |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59222774A (ja) * | 1983-06-02 | 1984-12-14 | Shin Nippon Denko Kk | 発光素子用試験装置 |
| JPH0629827B2 (ja) * | 1986-04-16 | 1994-04-20 | アンリツ株式会社 | レ−ザダイオ−ドの特性測定装置 |
-
1987
- 1987-12-23 JP JP1987196361U patent/JPH074605Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0199071U (esLanguage) | 1989-07-03 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US12188874B2 (en) | Chemiluminescence detector and detection method thereof | |
| US8759080B2 (en) | Back side plate illumination for biological growth plate scanner | |
| US9991146B2 (en) | Detection device | |
| EP3274704B1 (en) | Method and system for examining eggs | |
| US5290134A (en) | Pick and place for automatic test handler | |
| CN212459975U (zh) | 电池测试系统 | |
| US20110102582A1 (en) | Biological growth plate scanner | |
| WO2015052626A1 (en) | System and method for monitoring eggs during incubation | |
| CN105917352B (zh) | 高密度原位条形码读取系统 | |
| WO2017157045A1 (zh) | 一种补光可调且可自动上下料的视觉成像测量系统 | |
| KR100446443B1 (ko) | 핸들러의 반도체 소자 이송장치 | |
| WO2017157046A1 (zh) | 一种适用于测量复杂结构的测量系统 | |
| CN109580932B (zh) | 一种全自动磁珠多项目联检检测分析仪及其使用方法 | |
| JPH03505916A (ja) | 測定機械における部品制御装置 | |
| JPH074605Y2 (ja) | 発光素子の試験装置 | |
| CN110058035A (zh) | 一种样本加载、检测和分析一体化设备及其检测方法 | |
| CN210690982U (zh) | Uled屏幕基板检测/测量设备的预对位装置 | |
| CN105116354B (zh) | Led封装用在线测试设备及其在线测试方法 | |
| CN207556489U (zh) | 一种防尘罩骨架偏正自动检测仪 | |
| CN114487459B (zh) | 一种试管架循环装置 | |
| JPS58107406A (ja) | エ−ジング設備 | |
| CN112213508B (zh) | 一种高通量全自动免疫发光分析系统 | |
| KR100287556B1 (ko) | 수평식핸들러의 테스트 소켓과 소자의 콘택트장치 | |
| KR102244950B1 (ko) | 3차원 배열 검사 지그 구조의 광소자 내구성 검사 장치 및 그에 의한 광소자 내구성 검사 방법 | |
| JPS648150A (en) | Conveying device |