JPH07319237A - Surface potential measuring instrument - Google Patents

Surface potential measuring instrument

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Publication number
JPH07319237A
JPH07319237A JP6116345A JP11634594A JPH07319237A JP H07319237 A JPH07319237 A JP H07319237A JP 6116345 A JP6116345 A JP 6116345A JP 11634594 A JP11634594 A JP 11634594A JP H07319237 A JPH07319237 A JP H07319237A
Authority
JP
Japan
Prior art keywords
potential
photoconductor
surface potential
measuring means
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6116345A
Other languages
Japanese (ja)
Inventor
Hitoshi Tsuchida
仁 土田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ricoh Co Ltd
Original Assignee
Ricoh Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ricoh Co Ltd filed Critical Ricoh Co Ltd
Priority to JP6116345A priority Critical patent/JPH07319237A/en
Publication of JPH07319237A publication Critical patent/JPH07319237A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To exactly calculate the output linear expression of a potential measuring means in spite of residual potential on a photoreceptor. CONSTITUTION:This instrument is provided with the potential measuring means 13 measuring the surface potential of the photoreceptor 11 by applying known voltage on the photoreceptor 11 from a high voltage power source 19, and a correction means 22 correcting the measured value of the measuring means 13 by detecting the secular offset value of the measuring means 13; and the surface potential of the photoreceptor 11 destaticized just before the known voltage is applied is used as an input factor when the correction means 22 calculates the corrected value of the measuring means 13.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は複写機,レーザプリンタ
等の電子写真プロセスを行う画像形成装置に用いられる
表面電位測定装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a surface potential measuring device used in an image forming apparatus for electrophotographic processes such as copying machines and laser printers.

【0002】[0002]

【従来の技術】感光体の帯電及び画像露光により静電潜
像を形成し、この静電潜像を現像して可視像とし、この
可視像を記録紙に転写して定着し、感光体上の可視像転
写後の残留トナーや転写紙による紙粉等をクリーニング
して光照射等により除電するという電子写真プロセスを
行う複写機,レーザプリンタ等の画像形成装置において
は、感光体の表面電位を測定してその結果により帯電
量、露光量及び現像量を制御することにより感光体の表
面電位や画像濃度を制御して良好な画像を得ようとする
ことは既に行われている。
2. Description of the Related Art An electrostatic latent image is formed by charging a photoreceptor and exposing it to an image, and the electrostatic latent image is developed into a visible image. In an image forming apparatus such as a copying machine or a laser printer, which performs an electrophotographic process of removing residual toner after transfer of a visible image on the body, paper dust by transfer paper, etc., and removing electricity by light irradiation, etc. It has already been attempted to obtain a good image by measuring the surface potential and controlling the amount of charge, the amount of exposure and the amount of development based on the results to control the surface potential and image density of the photoreceptor.

【0003】電子写真プロセスを行う画像形成装置にお
いて、感光体の表面電位を測定するための表面電位計は
プローブと感光体との距離や湿度等の環境変動及びトナ
ー付着等によって零点及びゲイン変動が生じ易く、感光
体の表面電位を正確に検出できないことがある。そこ
で、電子写真プロセスを行う画像形成装置において、感
光体の表面電位を測定する前に表面電位計の出力を補正
する補正手段を設け、この補正手段にて画像形成装置と
して既知の電圧を感光体に印加して感光体の表面電位を
表面電位計で測定し、その出力値を用いて演算して表面
電位計の補正値を求め、この補正値により表面電位計の
表面電位測定時にその測定値から正確な感光体表面電位
を求める表面電位測定装置が用いられている。
In an image forming apparatus which performs an electrophotographic process, a surface electrometer for measuring the surface potential of a photoconductor has a zero point and a gain variation due to environmental changes such as distance between a probe and the photoconductor and humidity and toner adhesion. It is likely to occur, and the surface potential of the photoconductor may not be accurately detected. Therefore, in an image forming apparatus that performs an electrophotographic process, a correction unit that corrects the output of the surface electrometer before measuring the surface potential of the photoconductor is provided, and a voltage known as the image forming apparatus is applied to the photoconductor by the correction unit. The surface potential of the photoconductor is measured with a surface electrometer, and the output value is used to calculate the correction value of the surface electrometer, which is used to measure the surface potential of the surface electrometer. There is used a surface potential measuring device for accurately determining the surface potential of the photoreceptor.

【0004】この表面電位測定装置は、2種類の異なる
既知の電圧(y1,y2)を感光体に異なるタイミングで
印加し、その時の感光体表面電位に対する表面電位計の
出力値(x1,x2)を用いて表面電位計の出力直線式を
算出し、この出力直線式により表面電位計の表面電位測
定時にその測定値(x)から正確な感光体表面電位
(y)を求める実施例がある。この実施例では、表面電
位計の出力直線式は、 y=(y1−y2)/(x1−x2)・x+(x12−x2
1)/(x1−x2) となる。
This surface potential measuring device applies two different kinds of known voltages (y 1 , y 2 ) to the photoconductor at different timings, and the output value of the surface electrometer (x 1 , X 2 ) is used to calculate an output linear equation of the surface electrometer, and when the surface potential of the surface electrometer is measured by this output linear equation, an accurate photoconductor surface potential (y) is obtained from the measured value (x). There is an example. In this embodiment, the linear output equation of the surface electrometer is y = (y 1 −y 2 ) / (x 1 −x 2 ) · x + (x 1 y 2 −x 2
y 1) / become (x 1 -x 2).

【0005】また、感光体の表面電位を測定してその較
正を行う他のものとしては、種々のものが特開平1ー1
07179号公報、特開昭56ー95255号公報、特
開昭58ー211669号公報、特開昭60ー1033
65号公報、特開昭60ー103365号公報、特開昭
61ー56372号公報、特開昭62ー44755号公
報、特開昭63ー133164号公報、特開平4ー17
4871号公報、実開平4ー31153号公報等により
知られている。
Various other methods for measuring the surface potential of the photosensitive member and calibrating it are disclosed in Japanese Patent Laid-Open No. 1-1.
07179, JP-A-56-95255, JP-A-58-21169, and JP-A-60-1033.
65, JP-A-60-103365, JP-A-61-56372, JP-A-62-44755, JP-A-63-133164, JP-A-4-17.
It is known from Japanese Patent No. 4871, Japanese Utility Model Laid-Open No. 4-31153, and the like.

【0006】[0006]

【発明が解決しようとする課題】電子写真プロセスを行
う画像形成装置では、感光体の帯電及び画像露光により
静電潜像を形成し、この静電潜像を現像して可視像と
し、この可視像を記録紙に転写して定着し、感光体上の
可視像転写後の残留トナーや転写紙による紙粉等をクリ
ーニングして光照射等により除電する。しかしながら、
感光体は経時的な疲労及び電荷輸送層の膜ケズレ等によ
って除電後も電位が残った状態となる。この電位を残留
電位といい、経時的に残留電位は上昇していく。
In an image forming apparatus for carrying out an electrophotographic process, an electrostatic latent image is formed by charging and imagewise exposing a photoconductor, and the electrostatic latent image is developed into a visible image. The visible image is transferred onto a recording paper and fixed, and the residual toner after transfer of the visible image on the photoconductor, paper dust by the transfer paper, etc. are cleaned and light is erased by light irradiation or the like. However,
Due to fatigue over time and film scratches on the charge transport layer, the photoconductor remains in a potential even after static elimination. This potential is called the residual potential, and the residual potential rises with time.

【0007】上記表面電位測定装置では、残留電位が感
光体に残った状態で表面電位計の出力直線式を求めよう
とすると、感光体に印加する既知の電圧(y1,y2)に
それぞれ感光体の残留電位VRが上乗せされた状態とな
り、実際の感光体の電位が(y1+VR,y2+VR)とな
ってしまい、表面電位計の出力値が残留電位VR分ずれ
て出力される。
In the above-mentioned surface potential measuring device, when an output linear equation of the surface potential meter is to be obtained with the residual potential remaining on the photoconductor, the known voltages (y 1 , y 2 ) applied to the photoconductor are respectively calculated. The residual potential V R of the photoconductor is added, and the actual potential of the photoconductor becomes (y 1 + V R , y 2 + V R ), and the output value of the surface electrometer shifts by the residual potential V R. Is output.

【0008】ところが、出力直線式を求める時の感光体
印加電圧演算値は固定値(y1,y2)のままであるの
で、出力直線式は真の出力直線式からずれてしまい、間
違った表面電位測定値を出力してしまう。これにより、
正確な帯電量、露光量及び現像量の制御ができなくな
り、良好な画像が得られなくなることがあった。この点
について以下に詳細に説明する。
However, since the photoconductor applied voltage calculation value when obtaining the output linear equation remains the fixed value (y 1 , y 2 ), the output linear equation is deviated from the true output linear equation, which is incorrect. The surface potential measurement value is output. This allows
Accurate control of the amount of charge, the amount of exposure and the amount of development may not be possible, and a good image may not be obtained. This point will be described in detail below.

【0009】今、表面電位計の出力値xと感光体の表面
電位yとの間に y=ax+b・・・・・(1) a,b:定数 の関係があるとする。
Now, it is assumed that the output value x of the surface electrometer and the surface potential y of the photosensitive member have a relation of y = ax + b (1) a, b: constants.

【0010】2種類の異なる既知の電圧(y1,y2)を
感光体に異なるタイミングで印加した時に表面電位計の
出力電圧(x1,x2)は(1)式から x1=(y1+VR−b)/a・・・(2) x2=(y2+VR−b)/a・・・(3) で表わされる。
When two different known voltages (y 1 , y 2 ) are applied to the photoconductor at different timings, the output voltage (x 1 , x 2 ) of the surface electrometer is expressed by the equation (1) as x 1 = ( y 1 + V R -b) / a ··· (2) is expressed by x 2 = (y 2 + V R -b) / a ··· (3).

【0011】今、求めようとする出力直線式の傾きα及
び切片βは以下の連立方程式を解くことによって求ま
る。 y1=αx1+β・・・(4) y2=αx2+β・・・(5) この式(4)(5)に(2)(3)式を代入してα,β
についてそれぞれ解くと、 α=a β=b−VR となり、残留電位VRによって出力直線式の傾きαは真
値からずれないが、切片βが残留電位VR分だけずれ
る。これにより、正確な帯電量、露光量及び現像量の制
御ができなくなり、良好な画像が得られなくなることが
あった。
The slope α and the intercept β of the output linear equation to be obtained now can be obtained by solving the following simultaneous equations. y 1 = αx 1 + β (4) y 2 = αx 2 + β (5) Substituting equations (2) and (3) into equations (4) and (5), α and β
Solving each for, α = a β = b- V R becomes, but the slope alpha of the output linear equation by the residual potential V R is not deviated from the true value, intercept beta deviates only residual potential V R min. As a result, the charge amount, the exposure amount, and the development amount cannot be accurately controlled, and a good image may not be obtained.

【0012】本発明は、感光体上に残留電位があっても
感光体の表面電位を測定する電位測定手段の出力直線式
を正確に算出することができて画像形成時の感光体表面
電位を正確に検知でき、良好な画像品質を安定して得る
ことが可能となる表面電位測定装置を提供することを目
的とする。
According to the present invention, the output linear equation of the potential measuring means for measuring the surface potential of the photoconductor can be accurately calculated even if there is a residual potential on the photoconductor, and the surface potential of the photoconductor at the time of image formation can be calculated. It is an object of the present invention to provide a surface potential measuring device that can be accurately detected and can stably obtain good image quality.

【0013】[0013]

【課題を解決するための手段】上記目的を達成するた
め、請求項1記載の発明は、感光体の表面電位を測定し
てその結果に基づいて該感光体の表面電位等を制御する
画像形成装置で、高圧電源から前記感光体に既知の電圧
を印加して前記感光体の表面電位を測定する電位測定手
段と、この電位測定手段の経時的なオフセット量を検知
して該電位測定手段の測定値を補正する補正手段とを有
する表面電位測定装置において、前記補正手段が前記電
位測定手段の補正値を演算する時の入力因子として、既
知の電圧を印加する直前の除電された前記感光体の表面
電位を用いるものである。
In order to achieve the above object, the invention according to claim 1 forms an image by measuring the surface potential of a photoreceptor and controlling the surface potential of the photoreceptor based on the result. In the apparatus, a potential measuring means for measuring a surface potential of the photoconductor by applying a known voltage to the photoconductor from a high voltage power supply, and a potential offset of the potential measuring means by detecting an offset amount of the potential measuring means over time. In a surface potential measuring device having a correction means for correcting a measured value, the charge-removed photoreceptor immediately before applying a known voltage as an input factor when the correction means calculates a correction value of the potential measuring means. The surface potential of is used.

【0014】請求項2記載の発明は、感光体の表面電位
を測定してその結果に基づいて該感光体の表面電位等を
制御する画像形成装置で、高圧電源から前記感光体に既
知の電圧を印加して前記感光体の表面電位を測定する電
位測定手段と、この電位測定手段の経時的なオフセット
量を検知して該電位測定手段の測定値を補正する補正手
段とを有する表面電位測定装置において、前記補正手段
が、除電された前記感光体の表面電位測定値を用いて前
記感光体に印加する既知の電圧を可変するものである。
According to a second aspect of the present invention, there is provided an image forming apparatus for measuring the surface potential of a photoconductor and controlling the surface potential of the photoconductor based on the result, which is a voltage known to the photoconductor from a high voltage power source. Surface potential measurement having potential measuring means for applying a voltage to measure the surface potential of the photoconductor and correcting means for detecting a time-dependent offset amount of the potential measuring means and correcting the measured value of the potential measuring means. In the apparatus, the correction means varies the known voltage applied to the photoconductor by using the surface potential measurement value of the photoconductor that has been neutralized.

【0015】[0015]

【作用】請求項1記載の発明では、電位測定手段は高圧
電源から感光体に既知の電圧を印加して感光体の表面電
位を測定する。補正手段は、電位測定手段の経時的なオ
フセット量を検知し、既知の電圧を印加する直前の除電
された感光体の表面電位を用いて電位測定手段の測定値
を補正する。
According to the present invention, the potential measuring means measures the surface potential of the photoconductor by applying a known voltage to the photoconductor from the high voltage power source. The correcting means detects the time-dependent offset amount of the potential measuring means, and corrects the measured value of the potential measuring means using the surface potential of the photoconductor that has been neutralized immediately before applying a known voltage.

【0016】請求項2記載の発明では、電位測定手段は
高圧電源から感光体に既知の電圧を印加して感光体の表
面電位を測定する。補正手段は、除電された感光体の表
面電位測定値を用いて感光体に印加する既知の電圧を可
変し、電位測定手段の経時的なオフセット量を検知して
電位測定手段の測定値を補正する。
According to the second aspect of the invention, the potential measuring means applies a known voltage from the high voltage power source to the photoconductor to measure the surface potential of the photoconductor. The correcting unit varies the known voltage applied to the photoconductor by using the surface potential measurement value of the photoconductor that has been neutralized, corrects the measured value of the potential measurement unit by detecting the offset amount of the potential measurement unit over time. To do.

【0017】[0017]

【実施例】図1は本発明を適用した画像形成装置の第1
の例を示す。この第1の例は、請求項1記載の発明を適
用した例であり、感光体11は例えば感光体ドラムが用
いられる。この感光体ドラム11の周囲には、帯電装置
12、露光装置、表面電位計からなる電位測定手段1
3、現像装置14、転写装置15、分離装置16、クリ
ーニング装置17、除電器18が配置される。感光体ド
ラム11の裏面側に電圧を印加するための高圧電源19
とアース21とがスイッチ20により感光体ドラム11
の裏面側に切り換え接続される。高圧電源19は現像装
置14に現像バイアスを印加する現像バイアス印加用電
源や、帯電装置12を駆動する帯電装置用電源等と共用
してもよい。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS FIG. 1 is a first image forming apparatus to which the present invention is applied.
For example: The first example is an example in which the invention described in claim 1 is applied, and the photoconductor 11 is, for example, a photoconductor drum. Around the photosensitive drum 11, a potential measuring unit 1 including a charging device 12, an exposure device, and a surface electrometer.
3, a developing device 14, a transfer device 15, a separating device 16, a cleaning device 17, and a static eliminator 18 are arranged. High-voltage power supply 19 for applying a voltage to the back side of the photoconductor drum 11.
And the ground 21 by the switch 20 to the photosensitive drum 11
Is switched and connected to the back side of. The high-voltage power source 19 may be shared with a developing bias applying power source that applies a developing bias to the developing device 14, a charging device power source that drives the charging device 12, and the like.

【0018】画像形成時には、感光体ドラム11は、ス
イッチ20によりアース21に接続されて駆動部により
回転駆動され、帯電装置12により均一に帯電された後
に露光装置による画像露光で静電潜像が形成される。こ
の感光体ドラム11上の静電潜像は、現像装置14によ
り現像されて可視像となり、給紙装置から給送されてき
た記録紙へ転写装置15により転写されて記録紙が分離
装置16により感光体ドラム11から分離される。この
記録紙は定着装置により可視像が定着されて外部へ排出
される。
At the time of image formation, the photosensitive drum 11 is connected to the ground 21 by the switch 20 and is rotationally driven by the driving unit, and is uniformly charged by the charging device 12, and then an electrostatic latent image is formed by image exposure by the exposure device. It is formed. The electrostatic latent image on the photosensitive drum 11 is developed by the developing device 14 into a visible image, which is transferred by the transfer device 15 to the recording paper fed from the paper feeding device to separate the recording paper by the separating device 16. Is separated from the photoconductor drum 11. A visible image is fixed on the recording paper by a fixing device, and the recording paper is discharged to the outside.

【0019】また、感光体ドラム11は、記録紙分離後
にクリーニング装置17によりクリーニングされて残留
トナーや転写紙による紙粉等が除去され、除電器18に
より除電されて画像形成動作が終了する。制御部22は
この例の各部を制御して図2に示すように上述のような
画像形成動作を操作表示装置からのスタート指令により
開始させて設定枚数分だけ連続的に繰り返して行わせ
る。
After the recording paper is separated, the photosensitive drum 11 is cleaned by the cleaning device 17 to remove residual toner, paper dust and the like due to the transfer paper, and the static eliminator 18 removes the charge to complete the image forming operation. The control unit 22 controls each unit of this example to start the above-mentioned image forming operation by a start command from the operation display device as shown in FIG. 2 and to continuously repeat the set number of sheets.

【0020】表面電位計13は感光体ドラム11の表面
電位を帯電装置12と現像装置14との間で測定し、制
御部22は画像形成動作中に表面電位計13の表面電位
測定値を表面電位計13の出力直線式y=αx+βで補
正し、この補正後の表面電位測定値に応じて帯電装置用
電源、露光量制御部、現像バイアス印加用電源のうちの
少なくとも1つを制御して帯電装置12による感光体ド
ラム11の帯電量、露光装置による感光体ドラム11の
露光量及び現像装置14による感光体ドラム11の現像
量(トナー付着量)のうちの少なくとも1つを補正後の
表面電位測定値に応じて制御する。この場合、α,βは
表面電位計補正モードで求めた値とし、制御部22は表
面電位計13の表面電位測定値を補正する補正手段を構
成する。
The surface potential meter 13 measures the surface potential of the photosensitive drum 11 between the charging device 12 and the developing device 14, and the control section 22 determines the surface potential value of the surface potential meter 13 during the image forming operation. It is corrected by the output linear formula y = αx + β of the electrometer 13, and at least one of the charging device power source, the exposure amount control unit, and the developing bias application power source is controlled according to the corrected surface potential measurement value. Surface after correcting at least one of the amount of charge of the photoconductor drum 11 by the charging device 12, the amount of exposure of the photoconductor drum 11 by the exposure device, and the amount of development (toner adhesion amount) of the photoconductor drum 11 by the developing device 14 Control according to the measured potential. In this case, α and β are values obtained in the surface electrometer correction mode, and the control unit 22 constitutes a correction means for correcting the surface potential measurement value of the surface electrometer 13.

【0021】制御部22は、画像形成動作終了後には表
面電位計13の出力直線式を算出する表面電位計補正モ
ードを開始させ、まず、除電器18をオンさせて感光体
ドラム11を駆動部に回転駆動させることにより感光体
ドラム11を除電器18に除電させ、感光体ドラム11
が1回転する間に感光体ドラム11の表面電位(残留電
位)を表面電位計13の経時的なオフセット量として表
面電位計13に測定させて表面電位計13の測定値VR
を読み込む。
After the image forming operation is completed, the control unit 22 starts a surface electrometer correction mode for calculating the output linear expression of the surface electrometer 13, and first turns on the static eliminator 18 to drive the photoconductor drum 11. When the photoconductor drum 11 is rotated, the photoconductor drum 11 is discharged by the static eliminator 18.
Measurement V R of the surface potential (residual potential) was allowed to measure the surface potential meter 13 as temporal offset of the electrometer 13 surface electrometer 13 of the photosensitive drum 11 while but one rotation
Read.

【0022】次に、制御部22は、スイッチ20を高圧
電源19側に切り換え、高圧電源19を制御して高圧電
源19から感光体ドラム11へ2種類の異なる既知の電
圧(y1,y2)のうちの一方の電圧y1を感光体ドラム
11に印加させる。表面電位計13は既知の電圧y1
印加された感光体ドラム11の表面電位を測定し、制御
部22は既知の電圧y1が印加された感光体ドラム11
の表面電位に対する表面電位計13の測定値v1を読み
込む。
Next, the control unit 22 switches the switch 20 to the high voltage power source 19 side and controls the high voltage power source 19 to transfer two different known voltages (y 1 , y 2 ) from the high voltage power source 19 to the photosensitive drum 11. One of the above voltages y 1 is applied to the photosensitive drum 11. The surface potential meter 13 measures the surface potential of the photosensitive drum 11 to which the known voltage y 1 is applied, and the control unit 22 controls the photosensitive drum 11 to which the known voltage y 1 is applied.
The measured value v 1 of the surface electrometer 13 for the surface potential of 1 is read.

【0023】次に、制御部22は、高圧電源19を制御
して高圧電源19から感光体ドラム11へ2種類の異な
る既知の電圧(y1,y2)のうちの他方の電圧y2を感
光体ドラム11に印加させる。表面電位計13は既知の
電圧y2が印加された感光体ドラム11の表面電位を測
定し、制御部22は既知の電圧y2が印加された感光体
ドラム11の表面電位に対する表面電位計13の測定値
2を読み込む。
Next, the control unit 22 controls the high voltage power source 19 to supply the other voltage y 2 of the two different known voltages (y 1 , y 2 ) from the high voltage power source 19 to the photosensitive drum 11. It is applied to the photoconductor drum 11. The surface potential meter 13 measures the surface potential of the photosensitive drum 11 to which the known voltage y 2 is applied, and the control unit 22 measures the surface potential of the surface potential of the photosensitive drum 11 to which the known voltage y 2 is applied. The measured value v 2 of is read.

【0024】次いで、制御部22は、感光体ドラム11
に対する印加電圧演算値(y1,y2)、表面電位計13
の表面電位測定値(x1,x2)及び残留電位測定値VR
を演算子として表面電位計13の出力直線式の傾きα及
び切片βを、 y1−VR=αx1+β y2−VR=αx2+β の連立方程式を解くことによって求める。次に、制御部
22は、感光体ドラム11を停止させて除電器18をオ
フさせ、表面電位計補正モードを終了する。
Next, the controller 22 controls the photoconductor drum 11
Applied voltage calculation value (y 1 , y 2 ) to the surface electrometer 13
Surface potential measurement values (x 1 , x 2 ) and residual potential measurement value V R
Determined by solving the simultaneous equations of the slope α and intercept of the output linear equation of the surface electrometer 13 β, y 1 -V R = αx 1 + β y 2 -V R = αx 2 + β as operators. Next, the control unit 22 stops the photoconductor drum 11 to turn off the static eliminator 18, and ends the surface electrometer correction mode.

【0025】この第1の例では、制御部22が表面電位
計13の補正値(表面電位計13の出力直線式の傾きα
及び切片β)を演算する時の入力因子として、既知の電
圧(y1,y2)を印加する直前の除電された感光体ドラ
ム11の表面電位VRを用いるので、表面電位計13の
表面電位測定値を補正する際に感光体ドラム11に印加
する電圧と、表面電位計13の出力直線式を求める際の
印加電圧演算値(y1,y2)との差(感光体ドラム11
の残留電位による差)をなくすことができ、画像形成時
の感光体ドラム11の表面電位を正確に検知することが
できて良好な画像品質を得ることができる。
In this first example, the control unit 22 controls the correction value of the surface electrometer 13 (the inclination α of the output linear equation of the surface electrometer 13).
And the intercept β), the surface potential V R of the photoconductor drum 11 that has been neutralized immediately before the known voltage (y 1 , y 2 ) is applied is used as the input factor. The difference between the voltage applied to the photosensitive drum 11 when correcting the potential measurement value and the applied voltage calculation value (y 1 , y 2 ) when obtaining the output linear equation of the surface electrometer 13 (photosensitive drum 11
Difference due to residual potential) can be eliminated, the surface potential of the photosensitive drum 11 at the time of image formation can be accurately detected, and good image quality can be obtained.

【0026】図3は本発明を適用した画像形成装置の第
2の例の動作フローを示す。この第2の例は請求項2記
載の発明を適用した例である。この第2の例は、上記第
1の例において、制御部22が第2の例の各部を制御し
て図3に示すように動作させるようにしたものである。
すなわち、制御部22は、画像形成動作終了後に表面電
位計13の出力直線式を算出する表面電位計補正モード
を開始させ、まず、除電器18をオンさせて感光体ドラ
ム11を駆動部に回転駆動させることにより感光体ドラ
ム11を除電器18に除電させ、感光体ドラム11が1
回転する間に感光体ドラム11の表面電位(残留電位)
を表面電位計13の経時的なオフセット量として表面電
位計13に測定させて表面電位計13の測定値VRを読
み込む。
FIG. 3 shows an operation flow of the second example of the image forming apparatus to which the present invention is applied. The second example is an example to which the invention described in claim 2 is applied. In the second example, in the first example, the control unit 22 controls each unit of the second example to operate as shown in FIG.
That is, the control unit 22 starts the surface electrometer correction mode in which the output linear expression of the surface electrometer 13 is calculated after the image forming operation is completed, and first, the static eliminator 18 is turned on to rotate the photosensitive drum 11 to the drive unit. When the photosensitive drum 11 is driven, the static eliminator 18 eliminates the charge.
Surface potential (residual potential) of the photoconductor drum 11 during rotation
Is measured by the surface electrometer 13 as an offset amount of the surface electrometer 13, and the measured value V R of the surface electrometer 13 is read.

【0027】次に、制御部22は、スイッチ20を高圧
電源19側に切り換え、高圧電源19を制御して高圧電
源19から感光体ドラム11へ2種類の異なる既知の電
圧(y1,y2)のうちの一方の電圧y1と上記測定値VR
との差(y1−VR)を感光体ドラム11に印加させる。
表面電位計13は電圧(y1−VR)が印加された感光体
ドラム11の表面電位を測定し、制御部22は電圧(y
1−VR)が印加された感光体ドラム11の表面電位に対
する表面電位計13の測定値v1’を読み込む。
Next, the control unit 22 switches the switch 20 to the high voltage power source 19 side and controls the high voltage power source 19 so that the high voltage power source 19 transfers two different known voltages (y 1 , y 2 ) to the photosensitive drum 11. ) One of the voltages y 1 and the measured value V R
And the difference (y 1 −V R ) from that is applied to the photosensitive drum 11.
The surface potential meter 13 measures the surface potential of the photosensitive drum 11 to which the voltage (y 1 −V R ) is applied, and the control unit 22 controls the voltage (y
1 -V R) reads the surface electrometer 13 readings v 1 'of relative surface potential of the photosensitive drum 11 applied.

【0028】次に、制御部22は、高圧電源19を制御
して高圧電源19から感光体ドラム11へ2種類の異な
る既知の電圧(y1,y2)のうちの他方の電圧y2と上
記測定値VRとの差(y2−VR)を感光体ドラム11に
印加させる。表面電位計13は電圧(y2−VR)が印加
された感光体ドラム11の表面電位を測定し、制御部2
2は電圧(y2−VR)が印加された感光体ドラム11の
表面電位に対する表面電位計13の測定値v2’を読み
込む。
Next, the control unit 22 controls the high-voltage power supply 19 so that the other voltage y 2 of the two different known voltages (y 1 , y 2 ) is supplied from the high-voltage power supply 19 to the photosensitive drum 11. The difference (y 2 −V R ) from the measured value V R is applied to the photoconductor drum 11. The surface potential meter 13 measures the surface potential of the photosensitive drum 11 to which the voltage (y 2 −V R ) is applied, and the control unit 2
2 reads the measured value v 2 ′ of the surface electrometer 13 with respect to the surface potential of the photosensitive drum 11 to which the voltage (y 2 −V R ) is applied.

【0029】次に、制御部22は、感光体ドラム11に
対する印加電圧演算値(y1,y2)、表面電位計13の
表面電位測定値(x1’,x2’)及び残留電位測定値V
Rを演算子として表面電位計13の出力直線式の傾きα
及び切片βを、 y1=αx1’+β y2=αx2’+β の連立方程式を解くことによって求める。次に、制御部
22は、感光体ドラム11を停止させて除電器18をオ
フさせ、表面電位計補正モードを終了する。
Next, the control unit 22 measures the applied voltage to the photosensitive drum 11 (y 1 , y 2 ), the surface potential measurement value (x 1 ', x 2 ') of the surface potential meter 13, and the residual potential measurement. Value V
Output R of surface electrometer 13 with R as operator
And the intercept β are obtained by solving a simultaneous equation of y 1 = αx 1 ′ + β y 2 = αx 2 ′ + β. Next, the control unit 22 stops the photoconductor drum 11 to turn off the static eliminator 18, and ends the surface electrometer correction mode.

【0030】この第2の例では、制御部22が表面電位
計13の出力直線式を求める際に除電された感光体ドラ
ム11の表面電位測定値VRを用いて感光体ドラム11
に印加する既知の電圧(y1,y2)を可変して(y1
R),(y2−VR)とするので、表面電位計13の表
面電位測定値を補正する際に感光体ドラム11に印加す
る電圧と、表面電位計13の出力直線式を求める際の印
加電圧演算値(y1,y2)との差(感光体ドラム11の
残留電位による差)をなくすことができ、画像形成時の
感光体ドラム11の表面電位を正確に検知することがで
きて良好な画像品質を得ることができる。なお、本発明
は、上述の例に限定されるものではなく、レーザプリン
タ等の電子写真プロセスを行う画像形成装置に用いられ
る表面電位測定装置に同様に適用することができる。
In this second example, the control unit 22 uses the surface potential measurement value V R of the photosensitive drum 11 that has been neutralized when the output linear expression of the surface electrometer 13 is obtained, and
Known voltage (y 1 , y 2 ) to be applied to (y 1
V R ), (y 2 −V R ), so when calculating the voltage applied to the photosensitive drum 11 when correcting the surface potential measurement value of the surface electrometer 13 and the output linear expression of the surface electrometer 13 Can be eliminated (difference due to the residual potential of the photoconductor drum 11) and the applied voltage calculation value (y 1 , y 2 ) of the photoconductor drum 11, and the surface potential of the photoconductor drum 11 at the time of image formation can be accurately detected. As a result, good image quality can be obtained. The present invention is not limited to the above-described example, and can be similarly applied to a surface potential measuring device used in an image forming apparatus that performs an electrophotographic process such as a laser printer.

【0031】[0031]

【発明の効果】以上のように請求項1記載の発明によれ
ば、感光体の表面電位を測定してその結果に基づいて該
感光体の表面電位等を制御する画像形成装置で、高圧電
源から前記感光体に既知の電圧を印加して前記感光体の
表面電位を測定する電位測定手段と、この電位測定手段
の経時的なオフセット量を検知して該電位測定手段の測
定値を補正する補正手段とを有する表面電位測定装置に
おいて、前記補正手段が前記電位測定手段の補正値を演
算する時の入力因子として、既知の電圧を印加する直前
の除電された前記感光体の表面電位を用いるので、電位
測定手段の表面電位測定値を補正する際に感光体に印加
する電圧と、電位測定手段の出力直線式を求める際の印
加電圧演算値との差(感光体の残留電位による差)をな
くすことができ、画像形成時の感光体の表面電位を正確
に検知することができて良好な画像品質を得ることがで
きる。
As described above, according to the first aspect of the invention, an image forming apparatus for measuring the surface potential of a photoconductor and controlling the surface potential of the photoconductor based on the result is used as a high voltage power source. Potential measuring means for applying a known voltage to the photoconductor to measure the surface potential of the photoconductor, and detecting the offset amount with time of the potential measuring means to correct the measured value of the potential measuring means. In a surface potential measuring device having a correcting means, the surface potential of the discharged photoreceptor immediately before applying a known voltage is used as an input factor when the correcting means calculates a correction value of the potential measuring means. Therefore, the difference between the voltage applied to the photoconductor when correcting the surface potential measurement value of the potential measurement means and the applied voltage calculation value when obtaining the output linear expression of the potential measurement means (difference due to the residual potential of the photoconductor) Can be eliminated The surface potential of the photosensitive member during image formation to be able to accurately detect it is possible to obtain an excellent image quality.

【0032】請求項2記載の発明によれば、感光体の表
面電位を測定してその結果に基づいて該感光体の表面電
位等を制御する画像形成装置で、高圧電源から前記感光
体に既知の電圧を印加して前記感光体の表面電位を測定
する電位測定手段と、この電位測定手段の経時的なオフ
セット量を検知して該電位測定手段の測定値を補正する
補正手段とを有する表面電位測定装置において、前記補
正手段が、除電された前記感光体の表面電位測定値を用
いて前記感光体に印加する既知の電圧を可変するので、
電位測定手段の表面電位測定値を補正する際に感光体に
印加する電圧と、電位測定手段の出力直線式を求める際
の印加電圧演算値との差(感光体の残留電位による差)
をなくすことができ、画像形成時の感光体の表面電位を
正確に検知することができて良好な画像品質を得ること
ができる。
According to a second aspect of the invention, an image forming apparatus for measuring the surface potential of a photoconductor and controlling the surface potential of the photoconductor based on the result is known from the high voltage power source to the photoconductor. A surface having potential measuring means for applying the voltage of 1 to measure the surface potential of the photoconductor and correcting means for detecting the time-dependent offset amount of the potential measuring means and correcting the measured value of the potential measuring means. In the potential measuring device, since the correcting means varies the known voltage applied to the photoconductor by using the surface potential measurement value of the photoconductor that has been neutralized,
Difference between the voltage applied to the photoconductor when correcting the surface potential measurement value of the potential measurement means and the applied voltage calculation value when obtaining the output linear expression of the potential measurement means (difference due to the residual potential of the photoconductor)
Can be eliminated, the surface potential of the photoconductor at the time of image formation can be accurately detected, and good image quality can be obtained.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明を適用した画像形成装置の第1の例を示
す概略図である。
FIG. 1 is a schematic diagram showing a first example of an image forming apparatus to which the present invention has been applied.

【図2】同第1の例の動作フローを示すフローチャート
である。
FIG. 2 is a flowchart showing an operation flow of the first example.

【図3】本発明を適用した画像形成装置の第2の例の動
作フローを示すフローチャートである。
FIG. 3 is a flowchart showing an operation flow of a second example of the image forming apparatus to which the invention is applied.

【符号の説明】[Explanation of symbols]

11 感光体 13 表面電位計 18 除電器 19 高圧電源 20 スイッチ 21 アース 22 制御部 11 Photoreceptor 13 Surface Potential Meter 18 Static Eliminator 19 High Voltage Power Supply 20 Switch 21 Earth 22 Control Section

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】感光体の表面電位を測定してその結果に基
づいて該感光体の表面電位等を制御する画像形成装置
で、高圧電源から前記感光体に既知の電圧を印加して前
記感光体の表面電位を測定する電位測定手段と、この電
位測定手段の経時的なオフセット量を検知して該電位測
定手段の測定値を補正する補正手段とを有する表面電位
測定装置において、前記補正手段が前記電位測定手段の
補正値を演算する時の入力因子として、既知の電圧を印
加する直前の除電された前記感光体の表面電位を用いる
ことを特徴とする表面電位測定装置。
1. An image forming apparatus for measuring the surface potential of a photoconductor and controlling the surface potential of the photoconductor based on the result, wherein a known voltage is applied to the photoconductor from a high-voltage power source. A surface potential measuring device having potential measuring means for measuring a surface potential of a body and correcting means for detecting a time-dependent offset amount of the potential measuring means to correct a measured value of the potential measuring means, Is used as an input factor when calculating a correction value of the potential measuring means, the surface potential of the photoconductor that has been neutralized immediately before applying a known voltage is used.
【請求項2】感光体の表面電位を測定してその結果に基
づいて該感光体の表面電位等を制御する画像形成装置
で、高圧電源から前記感光体に既知の電圧を印加して前
記感光体の表面電位を測定する電位測定手段と、この電
位測定手段の経時的なオフセット量を検知して該電位測
定手段の測定値を補正する補正手段とを有する表面電位
測定装置において、前記補正手段が、除電された前記感
光体の表面電位測定値を用いて前記感光体に印加する既
知の電圧を可変することを特徴とする表面電位測定装
置。
2. An image forming apparatus for measuring the surface potential of a photoconductor and controlling the surface potential of the photoconductor based on the result, wherein a known voltage is applied to the photoconductor from a high-voltage power source. A surface potential measuring device having potential measuring means for measuring a surface potential of a body and correcting means for detecting a time-dependent offset amount of the potential measuring means to correct a measured value of the potential measuring means, However, the known voltage applied to the photoconductor is changed by using the measured value of the surface potential of the photoconductor that has been neutralized.
JP6116345A 1994-05-30 1994-05-30 Surface potential measuring instrument Pending JPH07319237A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6116345A JPH07319237A (en) 1994-05-30 1994-05-30 Surface potential measuring instrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6116345A JPH07319237A (en) 1994-05-30 1994-05-30 Surface potential measuring instrument

Publications (1)

Publication Number Publication Date
JPH07319237A true JPH07319237A (en) 1995-12-08

Family

ID=14684655

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6116345A Pending JPH07319237A (en) 1994-05-30 1994-05-30 Surface potential measuring instrument

Country Status (1)

Country Link
JP (1) JPH07319237A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006138931A (en) * 2004-11-10 2006-06-01 Ricoh Co Ltd Surface potential reading method for photoreceptor and photoreceptor characteristic evaluation equipment
JP2006344436A (en) * 2005-06-08 2006-12-21 Ricoh Co Ltd Surface potential distribution measuring method and surface potential distribution measuring device

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006138931A (en) * 2004-11-10 2006-06-01 Ricoh Co Ltd Surface potential reading method for photoreceptor and photoreceptor characteristic evaluation equipment
JP4620429B2 (en) * 2004-11-10 2011-01-26 株式会社リコー Photoreceptor characteristic evaluation device
JP2006344436A (en) * 2005-06-08 2006-12-21 Ricoh Co Ltd Surface potential distribution measuring method and surface potential distribution measuring device
JP4702880B2 (en) * 2005-06-08 2011-06-15 株式会社リコー Surface potential distribution measuring method and surface potential distribution measuring apparatus

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