JPH07283155A - Semiconductor manufacturing device - Google Patents
Semiconductor manufacturing deviceInfo
- Publication number
- JPH07283155A JPH07283155A JP8763494A JP8763494A JPH07283155A JP H07283155 A JPH07283155 A JP H07283155A JP 8763494 A JP8763494 A JP 8763494A JP 8763494 A JP8763494 A JP 8763494A JP H07283155 A JPH07283155 A JP H07283155A
- Authority
- JP
- Japan
- Prior art keywords
- heat insulating
- heater
- reaction tube
- semiconductor manufacturing
- insulating pieces
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は半導体製造装置、特にガ
ラス、ウェーハ等の基板を1枚ずつ処理する枚葉式の拡
散、CVD装置に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor manufacturing apparatus, and more particularly to a single-wafer type diffusion / CVD apparatus for processing substrates such as glass and wafer one by one.
【0002】[0002]
【従来の技術】図3、図4に於いて、従来の半導体製造
装置を説明する。2. Description of the Related Art A conventional semiconductor manufacturing apparatus will be described with reference to FIGS.
【0003】偏平な空間を有する反応管1の中央には複
数の基板支持ピン2が設けられ、前記反応管1の両端に
は、ガスダクト3,4が設けられている。前記反応管1
の周囲には発熱体、断熱材を含むヒータ11が設けら
れ、反応管内部を加熱する様になっている。前記ガスダ
クト3,4にはガス導入管5,6が設けられていると共
に排気管7,8が接続されている。前記ガスダクト3に
は基板搬入搬出口9が設けられ、該基板搬入搬出口9は
ゲート弁10により開閉される。A plurality of substrate support pins 2 are provided at the center of a reaction tube 1 having a flat space, and gas ducts 3 and 4 are provided at both ends of the reaction tube 1. The reaction tube 1
A heater 11 including a heating element and a heat insulating material is provided around the heater so as to heat the inside of the reaction tube. The gas ducts 3 and 4 are provided with gas introduction pipes 5 and 6, and exhaust pipes 7 and 8 are connected. The gas duct 3 is provided with a substrate loading / unloading port 9, and the substrate loading / unloading port 9 is opened and closed by a gate valve 10.
【0004】基板12の処理は、前記ゲート弁10を開
き、基板12を図示しない基盤搬送機により前記基板搬
入搬出口9を介して反応管1内に挿入し、前記基板支持
ピン2に載置する。前記排気管7,8より反応管1内を
排気し、更に前記ガス導入管5,6より反応ガスを導入
し、前記ヒータ11で基板12を加熱する。反応ガスが
分解し、反応生成物が基板表面に堆積し、薄膜が生成さ
れる。反応後のガスは前記排気管7,8より排出され
る。To process the substrate 12, the gate valve 10 is opened, the substrate 12 is inserted into the reaction tube 1 through the substrate loading / unloading port 9 by a substrate carrier (not shown), and the substrate 12 is mounted on the substrate support pin 2. To do. The inside of the reaction tube 1 is exhausted through the exhaust pipes 7 and 8, and the reaction gas is introduced through the gas introduction pipes 5 and 6, and the substrate 12 is heated by the heater 11. The reaction gas is decomposed and reaction products are deposited on the surface of the substrate to form a thin film. The gas after the reaction is discharged from the exhaust pipes 7 and 8.
【0005】処理済みの基板12は前記基板搬入搬出口
9、ゲート弁10より搬送される。The processed substrate 12 is conveyed from the substrate loading / unloading port 9 and the gate valve 10.
【0006】[0006]
【発明が解決しようとする課題】前記基板12の処理に
於いて、前記ヒータ11はゾーンa,b,cに分割さ
れ、各ゾーン毎に温度制御が行われている。In the processing of the substrate 12, the heater 11 is divided into zones a, b and c, and temperature control is performed for each zone.
【0007】ところが、ヒータ11表面に存在するガス
が対流し、又下方ヒータからの上昇気流を生じ、ガスの
対流、特に上昇気流によるヒータ間での熱移動が発生す
る。更に、ゾーン間で温度差がある場合は、ゾーン間で
のガスの回込み等により、熱移動を生じる。この為、正
確なゾーン温度制御が困難になると共に、同一温度制御
をしている場合でも上方のヒータが下方のヒータより高
温となり、温度制御が難しくなっていた。However, the gas existing on the surface of the heater 11 convects and an ascending air current is generated from the lower heater, so that the convection of the gas, particularly the heat transfer between the heaters due to the ascending air current occurs. Furthermore, when there is a temperature difference between the zones, heat transfer occurs due to gas entrainment between the zones. For this reason, it is difficult to control the zone temperature accurately, and even when the same temperature control is performed, the temperature of the upper heater becomes higher than that of the lower heater, which makes the temperature control difficult.
【0008】本発明は斯かる実情に鑑み、ゾーン温度制
御を確実に行える様にした半導体製造装置を提供しよう
とするものである。In view of the above situation, the present invention aims to provide a semiconductor manufacturing apparatus capable of reliably performing zone temperature control.
【0009】[0009]
【課題を解決するための手段】本発明は、反応管の周囲
にヒータを設け、反応管に装入された基板を加熱処理す
る半導体製造装置に於いて、反応管とヒータとの間に複
数のゾーンに区画する断熱材を設け、或はヒータ内部を
複数のゾーンに区画する断熱材を設け、或はヒータ内部
及び反応管とヒータとの間を複数のゾーンに区画する断
熱材を設けたことを特徴とするものである。SUMMARY OF THE INVENTION The present invention is a semiconductor manufacturing apparatus in which a heater is provided around a reaction tube, and a substrate loaded in the reaction tube is heat-treated, and a plurality of heaters are provided between the reaction tube and the heater. Or a heat insulating material that partitions the inside of the heater into a plurality of zones, or a heat insulating material that partitions the inside of the heater and between the reaction tube and the heater into a plurality of zones. It is characterized by that.
【0010】[0010]
【作用】断熱材により複数のゾーンに区画されることか
ら、区画されたゾーン間での対流、熱移動が抑制され、
処理する基板の温度制御が容易になる。[Function] Since it is divided into a plurality of zones by the heat insulating material, convection and heat transfer between the divided zones are suppressed,
The temperature control of the substrate to be processed becomes easy.
【0011】[0011]
【実施例】以下、図面を参照しつつ本発明の一実施例を
説明する。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to the drawings.
【0012】図1、図2中、図3、図4中で示したもの
と同一のものには同符号を付し、その説明を省略する。In FIGS. 1 and 2, the same components as those shown in FIGS. 3 and 4 are designated by the same reference numerals, and the description thereof will be omitted.
【0013】反応管1とヒータ11との間に断熱材13
を設ける。該断熱材13は、反応管1の軸心と直角方向
に延び反応管1を一回りする断熱片13aと、反応管1
の軸心と平行に延びる断熱片13bとを有し、前記断熱
片13aと断熱片13bとは格子状に組合わされてい
る。又、少なくとも前記断熱片13aは前記ヒータ11
のゾーン境界と対応した位置に設けられている。A heat insulating material 13 is provided between the reaction tube 1 and the heater 11.
To provide. The heat insulating material 13 includes a heat insulating piece 13a which extends in a direction perpendicular to the axis of the reaction tube 1 and which goes around the reaction tube 1, and the reaction tube 1
A heat insulating piece 13b extending parallel to the axis of the heat insulating piece 13a, and the heat insulating piece 13a and the heat insulating piece 13b are combined in a grid pattern. Further, at least the heat insulating piece 13a is provided in the heater 11
It is provided at a position corresponding to the zone boundary of.
【0014】而して、反応管1とヒータ11間の空間は
前記断熱材13により複数の小空間に区分化され、ヒー
タ11表面のガスの対流を抑止し、或は各区分間での熱
移動が抑制される。従って、ゾーン毎の熱制御が確実に
行える。The space between the reaction tube 1 and the heater 11 is divided into a plurality of small spaces by the heat insulating material 13 to prevent gas convection on the surface of the heater 11 or to transfer heat between the sections. Is suppressed. Therefore, heat control for each zone can be reliably performed.
【0015】尚、ヒータ11内部のゾーン境界部に断熱
材を設け、ヒータ11自体を断熱材によりゾーン毎に分
割してもよい。又、断熱材13により反応管1とヒータ
11との間、更にヒータ11自体を複数のゾーンに区画
してもよい。A heat insulating material may be provided at the zone boundary inside the heater 11, and the heater 11 itself may be divided into zones by the heat insulating material. Further, the heat insulating material 13 may divide the space between the reaction tube 1 and the heater 11 and further the heater 11 itself into a plurality of zones.
【0016】[0016]
【発明の効果】以上述べた如く本発明によれば、ゾーン
制御したヒータの温度分布を反応管へ反映させることが
でき、ヒータの温度制御、即ち基板の加熱温度分布を制
御することができる。As described above, according to the present invention, the temperature distribution of the zone-controlled heater can be reflected in the reaction tube, and the temperature control of the heater, that is, the heating temperature distribution of the substrate can be controlled.
【図1】本発明の一実施例を示す側断面図である。FIG. 1 is a side sectional view showing an embodiment of the present invention.
【図2】同前本発明の一実施例を示す平断面図である。FIG. 2 is a plan sectional view showing an embodiment of the present invention.
【図3】従来例を示す側断面図である。FIG. 3 is a side sectional view showing a conventional example.
【図4】同前従来例を示す平断面図である。FIG. 4 is a plan sectional view showing a conventional example of the same.
1 反応管 11 ヒータ 12 基板 13 断熱材 13a 断熱片 13b 断熱片 DESCRIPTION OF SYMBOLS 1 Reaction tube 11 Heater 12 Substrate 13 Heat insulating material 13a Heat insulating piece 13b Heat insulating piece
───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.6 識別記号 庁内整理番号 FI 技術表示箇所 H01L 21/324 D ─────────────────────────────────────────────────── ─── Continuation of the front page (51) Int.Cl. 6 Identification code Office reference number FI technical display location H01L 21/324 D
Claims (3)
装入された基板を加熱処理する半導体製造装置に於い
て、反応管とヒータとの間に複数のゾーンに区画する断
熱材を設けたことを特徴とする半導体製造装置。1. In a semiconductor manufacturing apparatus in which a heater is provided around a reaction tube and a substrate loaded in the reaction tube is subjected to heat treatment, a heat insulating material which is divided into a plurality of zones between the reaction tube and the heater is provided. A semiconductor manufacturing device characterized by being provided.
装入された基板を加熱処理する半導体製造装置に於い
て、ヒータ内部を複数のゾーンに区画する断熱材を設け
たことを特徴とする半導体製造装置。2. In a semiconductor manufacturing apparatus for providing a heater around a reaction tube and heat-treating a substrate loaded in the reaction tube, a heat insulating material for partitioning the inside of the heater into a plurality of zones is provided. Semiconductor manufacturing equipment.
装入された基板を加熱処理する半導体製造装置に於い
て、ヒータ内部及び反応管とヒータとの間を複数のゾー
ンに区画する断熱材を設けたことを特徴とする半導体製
造装置。3. In a semiconductor manufacturing apparatus in which a heater is provided around a reaction tube and a substrate loaded in the reaction tube is heat-treated, the inside of the heater and the space between the reaction tube and the heater are divided into a plurality of zones. A semiconductor manufacturing apparatus having a heat insulating material.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8763494A JPH07283155A (en) | 1994-04-01 | 1994-04-01 | Semiconductor manufacturing device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8763494A JPH07283155A (en) | 1994-04-01 | 1994-04-01 | Semiconductor manufacturing device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH07283155A true JPH07283155A (en) | 1995-10-27 |
Family
ID=13920416
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8763494A Pending JPH07283155A (en) | 1994-04-01 | 1994-04-01 | Semiconductor manufacturing device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH07283155A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003531489A (en) * | 2000-04-17 | 2003-10-21 | エスアール ジェイムス ジェイ メズィー | Method and apparatus for heat treating a wafer |
-
1994
- 1994-04-01 JP JP8763494A patent/JPH07283155A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003531489A (en) * | 2000-04-17 | 2003-10-21 | エスアール ジェイムス ジェイ メズィー | Method and apparatus for heat treating a wafer |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A131 | Notification of reasons for refusal |
Effective date: 20041026 Free format text: JAPANESE INTERMEDIATE CODE: A131 |
|
A02 | Decision of refusal |
Effective date: 20050308 Free format text: JAPANESE INTERMEDIATE CODE: A02 |