JPH07270321A - Irradiator for detecting defect of chip part - Google Patents

Abstract

PURPOSE:To provide an irradiator for detecting defect of chip parts which can illuminate the chip parts with a proper brightness to detect a defect on the top surface of the chip parts and near the corner thereof. CONSTITUTION:This apparatus is provided with a first lighting device 30 which has four light sources 30a, 30b, 30c and 30d arranged above each of four corners 22a, 22b, 22c and 22d of a chip part 22 so that the angle theta1 to the normal 24 reaches 12 deg. and a second lighting device 40 which has four light sources 40a, 40b, 40c and 40d arranged obliquely above each of four corners 22a, 22b, 22c and 22d so that the angle theta2 to the normal 24 reaches 70 deg.. Light emitting surfaces of the light sources 30a, 30b, 30c, 30d, 40a, 40b, 40c and 40d are formed into slit-shape.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a chip component defect detecting illuminating device for illuminating a chip component for visual inspection of the chip component.

[0002]

2. Description of the Related Art A conventional illuminating device for detecting chip component defects will be described with reference to FIGS. FIG. 3 is an explanatory view showing a state where the ring-shaped illuminator illuminates the chip component from above, and FIG. 4 is an explanatory diagram showing a state where the chip component is illuminated from obliquely above. As shown in FIG. 3, conventionally, the upper surface 10a of the chip component 10 fixed to the positioning jig 8 is used.
In order to detect such defects, the upper surface 10a is illuminated by using the ring-shaped illuminating device 12 arranged above the chip component 10 and the chip component 10 is imaged by the CCD camera 14. Further, as shown in FIG. 4, in order to detect a defect in the vicinity 10b of a portion (hereinafter, referred to as a corner) where each side of the upper surface of the chip component 10 fixed to the positioning jig 8 intersects, and unevenness of the upper surface 10a. The upper surface 10 a is illuminated by using the illuminator 16 arranged obliquely above the chip component 10 and the CCD camera 14 captures an image of the chip component 10.

[0003]

In the illumination method shown in FIG. 3, since the chip component 10 is illuminated from above, defects on the upper surface 10a can be detected, but the vicinity of the corner 10b is detected.
Can not detect defects. In addition, in the illumination method shown in FIG. 4, although the defect in the vicinity 10b of the corner can be detected, the upper surface 10
The defect a cannot be detected. Further, in any of the above illumination methods, if the corner is rounded, the light is reflected by the rounded portion, so it is difficult to detect a defect near the corner.

In view of the above circumstances, the present invention provides a chip component defect detecting illuminating device capable of illuminating a chip component with appropriate brightness for detecting defects on the upper surface of the chip component and in the vicinity of the corners of the upper surface. The purpose is to

[0005]

SUMMARY OF THE INVENTION A chip part defect detection illuminating device of the present invention for achieving the above object is for chip part defect detection for illuminating a chip part for visual inspection of a chip part having a corner on the upper surface. In a lighting device, a first illuminator having a slit-shaped light emitting surface that illuminates the upper surface obliquely from the corner direction, and a slit that illuminates the upper surface more obliquely than the first illuminator from the corner direction. And a second illuminator having a light emitting surface.

Here, the first illuminator illuminates the upper surface at an incident angle within the range of 10 ± 5 °, and the second illuminator 65 ± 5 °.
It is preferable to illuminate the top surface with an angle of incidence within the range.

[0007]

According to the illuminating device for detecting a chip component of the present invention, in visual inspection of a chip component, the first illuminator is used to illuminate the upper surface obliquely from the direction of the corner and the second illuminator is provided. Since the upper surface is illuminated more obliquely from the direction of the corner than the first illuminator, the upper surface of the chip component and the vicinity of the corner can be recognized at the same time. Moreover, since the light emitting surface of each illuminator is formed in a rit shape, the defective portion can be recognized without increasing the brightness near the corner more than necessary.

Here, the first illuminator illuminates the upper surface at an incident angle within the range of 10 ± 5 °, and the second illuminator 65 ± 5 °.
When the upper surface is illuminated at an angle of incidence within the range, the upper surface and the surface near the corner can be recognized more clearly.

[0009]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of a lighting device for detecting chip component defects according to the present invention will be described below with reference to the drawings. FIG. 1 is a schematic view showing a lighting device for detecting chip component defects, and FIG. 2 is a plan view showing a light source surface of the lighting device for detecting chip component defects shown in FIG. The illuminating device 20 for chip component defect detection is a device for illuminating a rectangular parallelepiped chip component 22, and an angle θ ₁ with respect to a normal line 24 is 12 ° above each of the four corners 22a, 22b, 22c, 22d. A first illuminator 30 having four light sources 30a, 30b, 30c, 30d arranged at four corners 22a, 22b, 22
Four light sources 40 arranged obliquely above c and 22d such that the angle θ ₂ with respect to the normal line 24 is 70 °.
Second illuminator 40 having a, 40b, 40c, 40d
And is configured. In addition, the light sources 30a, 30
Light emitting surfaces 32a, 3 for emitting light of b, 30c, 30d
Slits 34 are formed in 2b, 32c, and 32d, as shown in FIG. Light sources 40a, 40b, 4
Similar slits are formed on the light emitting surfaces of 0c and 40d. The width of the light beam emitted from each light source is limited by this slit, which allows the chip component to be illuminated with the appropriate brightness for detecting defects.

When the chip component 22 is illuminated using the illuminating device 20 for detecting chip component defects, the first illuminator 30 illuminates the upper surface 22e of the chip component 22 with an appropriate brightness, and the second illuminator 40 illuminates. The vicinity of each of the corners 22a, 22b, 22c, 22d is illuminated with appropriate brightness. Therefore, reflection from the vicinity of the corners 22a, 22b, 22c, 22d is suppressed. As a result, the surface of the chip component 22 can be clearly imaged by using a CCD camera or the like, and highly accurate defect detection can be performed.

[0011]

As described above, according to the illuminating device for detecting chip component defects of the present invention, the first illuminator is used to illuminate the upper surface obliquely from the corner direction and the second illuminator is used. Since the upper surface is illuminated more obliquely than the first illuminator from the direction of the corner, the upper surface of the chip component and the vicinity of the corner can be recognized at the same time without increasing the brightness of the surface near the corner.
Moreover, since the light emitting surface of each illuminator is formed in a rit shape, the defective portion can be recognized without increasing the brightness near the corner more than necessary.

[Brief description of drawings]

FIG. 1 is a schematic view showing an embodiment of a lighting device for detecting chip component defects of the present invention.

FIG. 2 is a plan view showing a light source surface of the illuminating device for detecting chip component defects shown in FIG.

FIG. 3 is an explanatory diagram showing a state in which a conventional ring-shaped illuminator illuminates a chip component from above.

FIG. 4 is an explanatory diagram showing a state where a conventional illuminator illuminates a chip component from diagonally above.

[Explanation of symbols]

20 Chip Component Defect Detection Illumination Device 22 Chip Components 22a, 22b, 22c, 22d Corner 30 First Illuminator 30a, 30b, 30c, 30d, 40a, 40b, 4
0c, 40d light source 34 slit 40 second illuminator

Claims (1)

[Claims] 1. A chip component defect detecting illuminating device for illuminating a chip component having a corner on the upper surface thereof, the slit illuminating device illuminating the upper surface obliquely from the direction of the corner. A first illuminator having a light emitting surface, and a second illuminator having a slit-shaped light emitting surface for illuminating the upper surface more obliquely from the direction of the corner than the first illuminating tool. An illuminating device for detecting a chip component defect.