JPH07243988A - Surface inspecting device - Google Patents

Surface inspecting device

Info

Publication number
JPH07243988A
JPH07243988A JP3439094A JP3439094A JPH07243988A JP H07243988 A JPH07243988 A JP H07243988A JP 3439094 A JP3439094 A JP 3439094A JP 3439094 A JP3439094 A JP 3439094A JP H07243988 A JPH07243988 A JP H07243988A
Authority
JP
Japan
Prior art keywords
light
inspected
spot
light source
illumination
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3439094A
Other languages
Japanese (ja)
Inventor
Chiaki Fukazawa
千秋 深沢
Masahito Nozawa
雅人 野沢
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP3439094A priority Critical patent/JPH07243988A/en
Publication of JPH07243988A publication Critical patent/JPH07243988A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To provide a surface inspecting device having a relatively simple structure and no illumination irregularity and capable of generating the illumination light with a strong intensity and correctly making the surface inspection of an object to be inspected. CONSTITUTION:Spot beams generated from multiple laser beam sources 1 and having strong directivity are projected on the surface 3a of an object 3 to be inspected in a line shape at the prescribed angle against the surface 3a, and adjacent spot beams are partially overlapped to have no illumination irregularity. The reflected light from the surface 3a of the projected spot beams is received by a light reception section 11.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、例えば鋼板等の被検査
物の表面に光を照射し、該表面からの反射光を受光し
て、表面の状態を検査する表面検査装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a surface inspection apparatus for inspecting the condition of a surface of an object to be inspected, such as a steel plate, by irradiating the surface with light and receiving reflected light from the surface.

【0002】[0002]

【従来の技術】この種の表面検査装置は、製造ライン等
において移動しつつある鋼板等の被検査物の表面に対し
て前記移動方向に直交する幅方向にライン照明を行い、
被検査物の移動につれて該被検査物の表面を検査してい
る。
2. Description of the Related Art This type of surface inspection apparatus performs line illumination in a width direction orthogonal to the moving direction on a surface of an object to be inspected such as a steel plate which is moving in a manufacturing line,
As the inspection object moves, the surface of the inspection object is inspected.

【0003】このライン照明を作り出す方法としては、
従来、蛍光灯の光をシリンドリカルレンズまたは凹面鏡
等で集光して、ライン照明にしたり、またはハロゲン電
球等の点光源の光を集光し、多数の細かい光ファイバで
導き、該光ファイバの光出射先端をライン状に並べて、
ライン照明にする等の方法がある。
As a method of producing this line illumination,
Conventionally, the light of a fluorescent lamp is condensed by a cylindrical lens or a concave mirror to be line illumination, or the light of a point light source such as a halogen bulb is condensed and guided by a large number of fine optical fibers. Line up the emission tips,
There are methods such as line lighting.

【0004】[0004]

【発明が解決しようとする課題】上述したように、蛍光
灯を用いてライン照明を作り出す方法においては、蛍光
灯自体が各点から発散する光束の集合体であるため、コ
リメータやレンズ等で集光するには効率が悪いととも
に、また輝度を強くしようとしても、蛍光灯のパワーに
は限度があり、輝度をあまり強くすることができない
し、更にラインの長さに制限があるという問題がある。
As described above, in the method of producing line illumination by using a fluorescent lamp, the fluorescent lamp itself is an aggregate of luminous fluxes diverging from each point, so that it is collected by a collimator or a lens. There is a problem that the efficiency is low for lighting, and even if an attempt is made to increase the brightness, the power of the fluorescent lamp is limited, the brightness cannot be increased so much, and the line length is limited. .

【0005】また、光ファイバを用いてライン照明を作
り出す方法では、光源の光がファイバ内を通過する際に
減衰するため、光源のパワーを有効に活用することがで
きず、特にファイバ長が長くなると問題であるととも
に、ラインの長さに制限がある。
Further, in the method of producing line illumination using an optical fiber, the light of the light source is attenuated when passing through the fiber, so that the power of the light source cannot be effectively utilized, and especially the fiber length is long. This is a problem and there is a limit to the length of the line.

【0006】本発明は、上記に鑑みてなされたもので、
その目的とするところは、比較的簡単な構造で照明むら
がなく、輝度の強い照明光を発生することができ、被検
査物の表面検査を適確に行うことができる表面検査装置
を提供することにある。
The present invention has been made in view of the above,
An object of the invention is to provide a surface inspection device which can generate an illumination light having a high brightness with a relatively simple structure and no illumination unevenness and which can appropriately perform a surface inspection of an object to be inspected. Especially.

【0007】[0007]

【課題を解決するための手段】上記目的を達成するた
め、本発明の表面検査装置は、被検査物の表面に光を照
射して表面検査を行う表面検査装置であって、前記被検
査物の表面においてライン状に照明むらがないように各
隣接するもの同志が部分的に互いに重なり合う複数の指
向性の強いスポット光を被検査物の表面に対して所定の
角度で投光する光源手段と、該光源手段からの各スポッ
ト光の前記表面からの反射光を受光する受光手段とを有
することを要旨とする。
In order to achieve the above object, a surface inspection apparatus of the present invention is a surface inspection apparatus for irradiating a surface of an object to be inspected with light to perform the surface inspection. A light source means for projecting a plurality of highly directional spot lights, which are adjacent to each other so that there is no uneven illumination in a line on the surface of the object, at a predetermined angle with respect to the surface of the object to be inspected. And a light receiving means for receiving the reflected light from the surface of each spot light from the light source means.

【0008】また、本発明の表面検査装置は、被検査物
の幅方向に直交する方向においても所定の長さを有する
ように互いに重なり合う照明面積を持ったエリア照明を
行う複数のスポット光を投光する光源手段と、この光源
手段からの各スポット光の前記被検査物からの反射光を
受光する受光手段とを有することを要旨とする。
Further, the surface inspection apparatus of the present invention projects a plurality of spot lights for performing area illumination having overlapping illumination areas so as to have a predetermined length even in the direction orthogonal to the width direction of the inspection object. The gist is to have a light source means for emitting light and a light receiving means for receiving reflected light of each spot light from the light source means from the inspected object.

【0009】[0009]

【作用】本発明の表面検査装置では、光源手段からの複
数の指向性の強いスポット光は各隣接するもの同志部分
的に互いに重なり合いライン状に照明むらがないように
被検査物の表面に所定角度で投光されている。
In the surface inspection apparatus of the present invention, a plurality of spotlights having a strong directivity from the light source means are provided on the surface of the object to be inspected so that adjacent spots of the spotlights partially overlap each other and do not have illumination unevenness in a line shape. It is projected at an angle.

【0010】また、本発明の表面検査装置では、前記複
数のスポット光は被検査物のライン方向に直交する方向
においても所定の長さを有して互いに重なり合い、照明
むらのないエリア照明を行っている。
Further, in the surface inspection apparatus of the present invention, the plurality of spot lights overlap each other with a predetermined length even in the direction orthogonal to the line direction of the object to be inspected, thereby performing area illumination without illumination unevenness. ing.

【0011】[0011]

【実施例】以下、図面を用いて本発明の実施例を説明す
る。図1(a)は、本発明の一実施例に係わる表面検査
装置の構成を示す図である。同図において、例えば鋼板
等の被検査物3は矢印21で示す方向に移動しつつあ
り、この移動しつつある被検査物3の表面3aに対して
複数のレーザ光源1からの指向性の強いスポット光がそ
れぞれレンズ2を介して投光され、該表面3a上に複数
のスポット6が示されている。これらのスポット6は、
被検査物3の移動方向に直交する幅方向である矢印22
で示すライン方向にほぼ一列に並んで表面3aを照明
し、隣接する各スポット6は互いに部分的に一定量重な
り合い、オーバラップ部5が形成されている。
Embodiments of the present invention will be described below with reference to the drawings. FIG. 1A is a diagram showing the configuration of a surface inspection apparatus according to an embodiment of the present invention. In the figure, the inspection object 3 such as a steel plate is moving in the direction indicated by the arrow 21, and the directivity from the plurality of laser light sources 1 is strong with respect to the moving surface 3a of the inspection object 3. Spot light is projected through each lens 2, and a plurality of spots 6 are shown on the surface 3a. These spots 6
An arrow 22 which is the width direction orthogonal to the moving direction of the inspection object 3
The surface 3a is illuminated substantially in a line in the line direction indicated by, and adjacent spots 6 partially overlap with each other by a certain amount to form an overlap portion 5.

【0012】また、このようにスポット6を被検査物3
の幅方向であるライン方向22に一列に並んで形成する
ために、複数のレーザ光源1も同様にライン方向22に
一列に並んで構成されている。この場合、各レーザ光源
1からのスポット光がライン照明中心4上に一致するよ
うに各レーザ光源1からの各スポット光は光軸合わせが
行われている。
Further, in this way, the spot 6 is attached to the object 3 to be inspected.
In order to form the plurality of laser light sources 1 side by side in the line direction 22 which is the width direction, the plurality of laser light sources 1 are also arranged side by side in the line direction 22. In this case, the optical axes of the spot lights from the laser light sources 1 are aligned so that the spot lights from the laser light sources 1 coincide with the line illumination center 4.

【0013】上述したように、レーザ光源1からのスポ
ット光でライン状に照明された被検査物3の表面3aか
らの反射光は集光レンズ10を介して受光部11で受光
されるようになっている。そして、該受光部11は被検
査物3の表面3aからの反射光に基づいて被検査物3の
表面検査を行うようになっている。
As described above, the reflected light from the surface 3a of the object 3 to be inspected which is linearly illuminated by the spot light from the laser light source 1 is received by the light receiving section 11 via the condenser lens 10. Has become. Then, the light receiving unit 11 is configured to perform the surface inspection of the inspection object 3 based on the reflected light from the surface 3a of the inspection object 3.

【0014】各レーザ光源1からの単一のスポット光の
光強度は、図1(b)において8で示すようなガウス分
布曲線を描いているが、各スポット光を図1(b)のス
ポット群7で示すように互いに部分的に重なり合うこと
により、このスポット群7での光強度は各スポット光の
光強度が加算され、図1(b)において9で示すような
スポット強度分布が得られ、均一なむらのないライン照
明を行うことができる。このように被検査物3の表面に
対して、均一でむらのないライン照明を行うことによ
り、被検査物3の表面検査を適確に行うことができる。
The light intensity of a single spot light from each laser light source 1 draws a Gaussian distribution curve as shown by 8 in FIG. 1 (b), but each spot light is spotted in FIG. 1 (b). By partially overlapping each other as shown in group 7, the light intensity of each spot light is added to the light intensity in this spot group 7 to obtain a spot intensity distribution as shown by 9 in FIG. 1 (b). Therefore, it is possible to perform uniform and even line illumination. By performing uniform and even line illumination on the surface of the inspection object 3 in this manner, the surface inspection of the inspection object 3 can be performed accurately.

【0015】なお、図1(b)の8で示すようなガウス
分布曲線のスポット強度分布を有する各レーザ光源1か
らのスポット光によって図1(b)の9で示すような均
一なスポット強度分布を得るためには、各レーザ光源1
のライン方向の位置を調整し、オーバラップ部5の大き
さを調整すればよいことになる。
It is to be noted that the spot light from each laser light source 1 having the spot intensity distribution of the Gaussian distribution curve as shown by 8 in FIG. 1 (b) gives a uniform spot intensity distribution as shown by 9 in FIG. 1 (b). To obtain each laser light source 1
It is only necessary to adjust the position in the line direction and adjust the size of the overlapping portion 5.

【0016】図2は、本発明の他の実施例を示す図であ
る。図2に示す実施例は、図1(a)に示した複数のレ
ーザ光源1からのスポット6をライン方向22に配列す
ることに加えて、被検査物3の流れ方向21にも互いに
部分的に重なり合うように構成したものであり、このよ
うに構成することにより、12でスポット強度を示すよ
うにエリア状の均一な照明を行うことを可能としている
ものである。なお、この場合の複数のレーザ光源1は図
1(a)に示したようなライン状に配列されたレーザ光
源1が2列以上複数列配列されて構成されることになる
が、これに限定されるものでなく、例えば複数のレーザ
光源1の配列は特に規定しなくても、そのスポット光の
照射方向のみを調整して、被検査物3の表面において図
2に示すようにエリア状になればよいものである。
FIG. 2 is a diagram showing another embodiment of the present invention. In addition to arranging the spots 6 from the plurality of laser light sources 1 shown in FIG. 1A in the line direction 22, the embodiment shown in FIG. Are arranged so as to overlap with each other, and by such a structure, it is possible to perform uniform illumination in an area shape so as to show the spot intensity at 12. The plurality of laser light sources 1 in this case are configured by arranging two or more rows of the laser light sources 1 arranged in a line as shown in FIG. 1A, but the present invention is not limited to this. For example, even if the arrangement of the plurality of laser light sources 1 is not particularly specified, only the irradiation direction of the spot light is adjusted to form an area on the surface of the inspection object 3 as shown in FIG. It is good if it becomes.

【0017】図3は、本発明の更に他の実施例を示す図
である。図3に示す実施例は、図1に示す実施例におい
て複数のレーザ光源1からのスポット光の方向を被検査
物3の表面3aに対して投光角θをもって傾斜させ、こ
れにより該スポット光の表面3aによる反射光の正反射
成分が受光部11に導かれるように構成したものであ
る。このようにスポット光の正反射成分が受光部11に
導かれることにより、受光部11は被検査物3の表面検
査を更に適確に行うことができる。
FIG. 3 is a diagram showing still another embodiment of the present invention. In the embodiment shown in FIG. 3, the direction of the spot light from the plurality of laser light sources 1 in the embodiment shown in FIG. 1 is inclined with respect to the surface 3a of the inspection object 3 with a projection angle θ, whereby the spot light is The specular reflection component of the light reflected by the surface 3a is guided to the light receiving unit 11. In this way, the specular reflection component of the spot light is guided to the light receiving unit 11, so that the light receiving unit 11 can more accurately perform the surface inspection of the inspection object 3.

【0018】[0018]

【発明の効果】以上説明したように、本発明によれば、
光源手段からの複数の指向性の強いスポット光は各隣接
するもの同志部分的に互いに重なり合うように被検査物
の表面に所定角度で投光されているので、比較的簡単な
構造で照明むらなく、輝度の強い照明光を発生し、被検
査物の表面検査を適確に行うことができる。
As described above, according to the present invention,
A plurality of highly directional spot lights from the light source means are projected onto the surface of the object to be inspected at a predetermined angle so that adjacent spots of the adjacent light beams partially overlap each other. Therefore, it is possible to generate the illumination light with high brightness and to accurately perform the surface inspection of the inspection object.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例に係わる表面検査装置の構成
および輝度分布を示す図である。
FIG. 1 is a diagram showing a configuration and a brightness distribution of a surface inspection apparatus according to an embodiment of the present invention.

【図2】本発明の他の実施例を示す図である。FIG. 2 is a diagram showing another embodiment of the present invention.

【図3】本発明の更に他の実施例を示す図である。FIG. 3 is a diagram showing still another embodiment of the present invention.

【符号の説明】[Explanation of symbols]

1 レーザ光源 2 レンズ 3 被検査物 3a 被検査物の表面 5 オーバラップ部 6 スポット 1 Laser Light Source 2 Lens 3 Inspected Object 3a Surface of Inspected Object 5 Overlap 6 Spot

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 被検査物の表面に光を照射して表面検査
を行う表面検査装置において、前記被検査物の表面にお
いて各隣接するもの同志が部分的に互いに重なり合う複
数の指向性の強いスポット光を被検査物の表面に対して
所定の角度で投光する光源手段と、該光源手段からの各
スポット光の前記表面からの反射光を受光する受光手段
とを有することを特徴とする表面検査装置。
1. A surface inspection apparatus for irradiating a surface of an object to be inspected with light to inspect the surface of the object to be inspected. A surface comprising light source means for projecting light at a predetermined angle with respect to the surface of the object to be inspected, and light receiving means for receiving reflected light of each spot light from the light source means from the surface. Inspection device.
【請求項2】 被検査物の表面に光を照射して表面検査
を行う表面検査装置において、前記被検査物の幅方向に
直交する方向においても所定の長さを有するように互い
に重なり合う照明面積を持ったエリア照明を行う複数の
スポット光を投光する光源手段と、該光源手段からの各
スポット光の前記被検査物からの反射光を受光する受光
手段とを有することを特徴とする表面検査装置。
2. A surface inspection apparatus for irradiating a surface of an object to be inspected with light to inspect the surface of the object to be inspected, the illumination areas overlapping each other so as to have a predetermined length even in a direction orthogonal to a width direction of the object to be inspected. And a light receiving means for receiving a plurality of spot lights for illuminating the area, and a light receiving means for receiving reflected light of each spot light from the light source means from the object to be inspected. Inspection device.
【請求項3】 前記光源手段は、指向性の強いスポット
光をそれぞれ発生する複数の光源から構成されることを
特徴とする請求項1または2記載の表面検査装置。
3. The surface inspection apparatus according to claim 1, wherein the light source means is composed of a plurality of light sources that respectively generate spot lights having strong directivity.
【請求項4】 前記光源手段は、レーザ光源であること
を特徴とする請求項1,2または3記載の表面検査装
置。
4. The surface inspection apparatus according to claim 1, wherein the light source means is a laser light source.
JP3439094A 1994-03-04 1994-03-04 Surface inspecting device Pending JPH07243988A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3439094A JPH07243988A (en) 1994-03-04 1994-03-04 Surface inspecting device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3439094A JPH07243988A (en) 1994-03-04 1994-03-04 Surface inspecting device

Publications (1)

Publication Number Publication Date
JPH07243988A true JPH07243988A (en) 1995-09-19

Family

ID=12412847

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3439094A Pending JPH07243988A (en) 1994-03-04 1994-03-04 Surface inspecting device

Country Status (1)

Country Link
JP (1) JPH07243988A (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003166946A (en) * 2001-12-04 2003-06-13 Topcon Corp Surface inspection apparatus
JP2003166947A (en) * 2001-12-04 2003-06-13 Topcon Corp Surface inspection apparatus
JP2003166948A (en) * 2001-12-04 2003-06-13 Topcon Corp Surface inspection apparatus
US7046353B2 (en) 2001-12-04 2006-05-16 Kabushiki Kaisha Topcon Surface inspection system
WO2011052448A1 (en) * 2009-10-29 2011-05-05 エイチエスティ・ビジョン株式会社 Illuminating device, and illuminating system
JP2012137348A (en) * 2010-12-27 2012-07-19 Hitachi High-Technologies Corp Inspection device
JP2015506470A (en) * 2011-12-31 2015-03-02 サン−ゴバン グラス フランス Irradiation system for detecting defects on transparent substrate and detection system having the same
KR101504044B1 (en) * 2013-12-10 2015-03-24 동양하이테크산업주식회사 Remote monitoring system of red and green tide occurrence with high power lazer assembly and cooling system thereof

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003166946A (en) * 2001-12-04 2003-06-13 Topcon Corp Surface inspection apparatus
JP2003166947A (en) * 2001-12-04 2003-06-13 Topcon Corp Surface inspection apparatus
JP2003166948A (en) * 2001-12-04 2003-06-13 Topcon Corp Surface inspection apparatus
US7046353B2 (en) 2001-12-04 2006-05-16 Kabushiki Kaisha Topcon Surface inspection system
WO2011052448A1 (en) * 2009-10-29 2011-05-05 エイチエスティ・ビジョン株式会社 Illuminating device, and illuminating system
JP2012137348A (en) * 2010-12-27 2012-07-19 Hitachi High-Technologies Corp Inspection device
JP2015506470A (en) * 2011-12-31 2015-03-02 サン−ゴバン グラス フランス Irradiation system for detecting defects on transparent substrate and detection system having the same
KR101504044B1 (en) * 2013-12-10 2015-03-24 동양하이테크산업주식회사 Remote monitoring system of red and green tide occurrence with high power lazer assembly and cooling system thereof

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