JPH0722360A - Storing method of semiconductor wafer in cassette - Google Patents

Storing method of semiconductor wafer in cassette

Info

Publication number
JPH0722360A
JPH0722360A JP18356793A JP18356793A JPH0722360A JP H0722360 A JPH0722360 A JP H0722360A JP 18356793 A JP18356793 A JP 18356793A JP 18356793 A JP18356793 A JP 18356793A JP H0722360 A JPH0722360 A JP H0722360A
Authority
JP
Japan
Prior art keywords
semiconductor wafer
cassette
semiconductor wafers
water layer
water
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP18356793A
Other languages
Japanese (ja)
Other versions
JP3238536B2 (en
Inventor
Saburo Sekida
三郎 関田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shibayama Kikai Co Ltd
Original Assignee
Shibayama Kikai Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shibayama Kikai Co Ltd filed Critical Shibayama Kikai Co Ltd
Priority to JP18356793A priority Critical patent/JP3238536B2/en
Publication of JPH0722360A publication Critical patent/JPH0722360A/en
Application granted granted Critical
Publication of JP3238536B2 publication Critical patent/JP3238536B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Mechanical Treatment Of Semiconductor (AREA)
  • Feeding Of Workpieces (AREA)
  • Warehouses Or Storage Devices (AREA)

Abstract

PURPOSE:To enhance end products in yield by a method wherein the upsides of all semiconductor wafers stored as stacked in a cassette provided to a grind ing machine which works the semiconductor wafers are prevented from being dried up so as to be protected against clouding or stain. CONSTITUTION:Water so specified in amount is poured as to keep a water layer 1 formed by surface tension on all the surface of a semiconductor wafer W placed uppermost in a cassette and to drip in drops on the upside of a semiconductor wafer W located next below the uppermost wafer W, whereby a water layer 1 is successively formed by surface tension on each surface of all semiconductor wafers W stored in a cassette.

Description

【発明の詳細な説明】Detailed Description of the Invention

【産業上の利用分野】本発明は、半導体ウエハをチャッ
クの上面へバキューム吸着して研削及び研磨する平面研
削盤等の研削研磨加工後にカセットに収納された半導体
ウエハの加工面へ染み或いは曇り等の水滴跡を残留させ
ることなく保管する方法に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a surface of a semiconductor wafer housed in a cassette after a grinding / polishing process such as a surface grinder that vacuum-sucks a semiconductor wafer onto the upper surface of a chuck to grind and polish the surface of the semiconductor wafer. The present invention relates to a method of storing without leaving traces of water drops.

【0002】[0002]

【発明の背景】この種の半導体ウエハを研削及び研磨す
る自動平面研削盤は、多数枚の半導体ウエハを単品毎に
送出側カセットへ集積格納しており、該送出側カセット
は昇降自在なエレベータ台へ載置されて、該エレベータ
台の前方へ配設された送出側移送機構によって移送さ
れ、該送出側移送機構の垂直方向の回動によって反転さ
れプリポジション装置の面上へ載置され、プリポジショ
ン装置で正確な位置決めと洗浄とを液体の噴流によって
行ない、先端にバキューム吸着パットを備えた水平方向
に回動可能な送出側移送アームの正確な軌道によって、
自動平面研削盤の研削テーブルへ形設したチャックへ正
確に案内され確りとバキューム吸着されて、研削テーブ
ルによって次の加工位置へ移動し、下端にカップホイー
ル型ダイヤモンド砥石を固定しモーターによって自回転
するスピンドル軸が自動降下して最初の研削が開始され
るものである。
BACKGROUND OF THE INVENTION An automatic surface grinder for grinding and polishing semiconductor wafers of this type stores a large number of semiconductor wafers individually in a cassette on a delivery side, and the cassette on the delivery side can be raised and lowered. Is placed on the surface of the pre-position device by being inverted by the vertical rotation of the delivery side transfer mechanism, and is transferred by the delivery side transfer mechanism disposed in front of the elevator base. Accurate positioning and cleaning with a position device is performed by a jet of liquid, and an accurate trajectory of a horizontally-rotatable delivery-side transfer arm equipped with a vacuum suction pad at the tip,
It is accurately guided to the chuck formed on the grinding table of the automatic surface grinder, and is accurately vacuum-adsorbed, moved to the next processing position by the grinding table, fixed on the lower end with a cup wheel type diamond grindstone and rotated by a motor. The spindle shaft is automatically lowered and the first grinding is started.

【0003】次いで、研削テーブルによってチャックと
共に、半導体ウエハは次の加工位置へ移送され、次のチ
ャックで所定の加工を施され後、先端に吸着パットを備
えた水平方向に回動可能な収納側移送アームで吸着され
洗浄及び乾燥装置へ移送されて、洗浄及び乾燥された後
にバキューム吸着パットを備える格納側移送機構のよっ
て、格納側カセットが載置されている格納側エレベータ
台の昇降によって、該格納側カセットの桟体へ開口面よ
り単品毎に順次収納されるものである。
Next, the semiconductor wafer is transferred to the next processing position together with the chuck by the grinding table, subjected to a predetermined processing by the next chuck, and is then provided with a suction pad at its tip and can be rotated in the horizontal direction. The storage side transfer mechanism equipped with a vacuum suction pad after being sucked by the transfer arm and transferred to the cleaning and drying device and then cleaned and dried is moved up and down by the storage-side elevator table on which the storage-side cassette is placed. The individual pieces are sequentially stored in the crosspiece of the storage-side cassette from the opening surface.

【0004】前述の説明は半導体ウエハが一枚での加工
工程の説明であるが、半導体ウエハが送出側カセットよ
り送出側移送機構を経て、プリポジション装置へ移送さ
れた時には、次の半導体ウエハは送出側カセットより送
出側移送機構で保持され、前の半導体ウエハが研削テー
ブルのチャック位置へ移送されるのを待機する等、これ
らの動作を繰返し連続して行なえる自動送り出し機構を
有するものであり、研削テーブルに設けたチャックの各
々のチャック位置では夫々作業を同時に連続して行なう
ものである。
The above description is for the process of processing one semiconductor wafer, but when the semiconductor wafer is transferred from the cassette on the sending side to the preposition device via the sending mechanism on the sending side, the next semiconductor wafer is It has an automatic delivery mechanism that is held by the delivery-side transfer mechanism from the delivery-side cassette and waits for the previous semiconductor wafer to be transferred to the chuck position on the grinding table. At each chuck position of the chucks provided on the grinding table, the work is simultaneously and continuously performed.

【0005】[0005]

【従来技術】これらの自動平面研削盤等は前述の工程に
よって半導体ウエハを研削研磨加工しており、その工程
の殆どは大気中で行っているのが通常であるが、プリポ
ジションでの洗浄及び位置合わせ、又は、研削加工中の
研削液、研削加工後の洗浄等には液体を使用しており、
格納する直前で液体は遠心分離装置等の乾燥装置で取り
除くが、水滴等が付着していることが屡々あった。
2. Description of the Related Art These automatic surface grinders grind and polish semiconductor wafers by the above-mentioned steps, and most of the steps are usually carried out in the atmosphere. Liquid is used for positioning, grinding liquid during grinding, cleaning after grinding, etc.
Immediately before storing, the liquid is removed with a drying device such as a centrifuge, but water drops are often attached.

【0006】[0006]

【発明が解決しようとする課題】従って、昨今要求され
ている半導体ウエハは高精度の平坦精度の上に高品質の
鏡面仕上げであって、自動平面研削盤等で高精度の平坦
精度に加工しても、付着していた水滴が蒸発した後に水
滴の跡に人間の眼では確認できない程度の染み或いは曇
りが発生し、最終製品の歩留まりを向上させる障害と成
っていた。
Therefore, the semiconductor wafers required these days have high-precision flatness and high-quality mirror finish, and can be processed to high-precision flatness with an automatic surface grinder or the like. However, after the water droplets that had adhered have evaporated, stains or cloudiness that cannot be seen by the human eye occur in the traces of the water droplets, which is an obstacle to improving the yield of the final product.

【0007】それ故に、本出願人は特願平4−7581
4号において、自動平面研削盤等へ少なくともカセット
を囲繞するように水槽部を設け、該水槽部に液体を貯溜
させてカセットを略水没状態として挿脱し、研削研磨加
工後、カセットへ半導体ウエハを液体と共に密封させる
機構とその方法を供し、前述の問題点を解消させようと
した。
Therefore, the present applicant has filed Japanese Patent Application No. 4-7581.
In No. 4, a water tank portion is provided so as to surround at least the cassette on an automatic surface grinding machine, etc., the liquid is stored in the water tank portion, the cassette is put in and out in a substantially submerged state, and after grinding and polishing, the semiconductor wafer is placed in the cassette. An attempt was made to solve the above-mentioned problems by providing a mechanism for sealing with a liquid and its method.

【0008】然し、前記機構は、水槽部に常に液体を充
満させておくものであり、通常、水槽部に充満させる液
体は純水である為コスト高となり、コストの低減が望ま
れているのが実情である。
However, the above-mentioned mechanism always fills the water tank portion with the liquid, and normally the liquid filling the water tank portion is pure water, resulting in high cost, and it is desired to reduce the cost. Is the reality.

【0009】[0009]

【課題を解決する手段】本発明の半導体ウエハのカセッ
ト内保管方法は、前述の問題点に鑑みて、鋭意研鑽の結
果、半導体ウエハに加工を施す研削盤等のカセット内に
集積格納される全ての半導体ウエハの上面の全面に表面
張力で維持できる水層を形成したものである。
In view of the above-mentioned problems, the method of storing a semiconductor wafer in a cassette according to the present invention is, as a result of diligent research, integrated and stored in a cassette such as a grinding machine for processing a semiconductor wafer. The water layer that can be maintained by surface tension is formed on the entire upper surface of the semiconductor wafer.

【0010】[0010]

【発明の作用】本発明の作用は、カセット内の最上層に
載置された半導体ウエハの上面の全面に形成される水層
を表面張力で維持できる程度で且つ直下に位置する半導
体ウエハの上面に点滴状態で落下する程度の液体を注水
させることによって、最上層の上面の全面に形成された
水層から直下に位置する半導体ウエハの上面へ点滴状態
で落下して水層を形成するものであり、経時により、カ
セット内に格納される全ての半導体ウエハの上面に表面
張力で維持できる水層を順次形成させるものである。
The operation of the present invention is such that the water layer formed on the entire upper surface of the semiconductor wafer placed on the uppermost layer in the cassette can be maintained by the surface tension and the upper surface of the semiconductor wafer located immediately below. By injecting a liquid to the extent that it drops in a drip state, a water layer is formed by dropping a drip state from the water layer formed on the entire upper surface of the uppermost layer to the upper surface of the semiconductor wafer located immediately below. With the lapse of time, a water layer that can be maintained by surface tension is sequentially formed on the upper surfaces of all the semiconductor wafers stored in the cassette.

【0011】[0011]

【発明の実施例】斯る目的を達成した本発明の半導体ウ
エハの保管方法を以下の実施例の図面によって説明す
る。
DESCRIPTION OF THE PREFERRED EMBODIMENTS A method for storing a semiconductor wafer according to the present invention which achieves the above object will be described with reference to the drawings of the following embodiments.

【0012】図1は本発明の概念を説明するための側面
説明図である。
FIG. 1 is a side view for explaining the concept of the present invention.

【0013】本発明は、半導体ウエハをチャックの上面
へバキューム吸着して研削及び研磨する平面研削盤等の
研削研磨加工後にカセットに収納された半導体ウエハの
加工面へ染み或いは曇り等の水滴跡を残留させることな
く保管する方法に関するものであり、平面研削盤等によ
って加工された半導体ウエハを集積格納する一側面へ開
口面を有し且つ内部を複数の桟体で水平棚状に仕切った
カセットにおいて、前記カセット内の最上層に載置され
た半導体ウエハの上面の全面に形成される水層を表面張
力で維持できる程度で且つ直下に位置する半導体ウエハ
の上面に点滴状態で落下する程度の液体を注水させ、カ
セット内に格納される全ての半導体ウエハの上面に表面
張力で維持できる水層を順次形成させるものである。
According to the present invention, a trace of water droplets such as stains or fog is formed on the processed surface of a semiconductor wafer housed in a cassette after grinding and polishing such as a surface grinder that vacuum-sucks a semiconductor wafer onto the upper surface of a chuck to grind and polish it. The present invention relates to a method of storing without leaving a semiconductor wafer processed by a surface grinder or the like, which has an opening surface on one side for accommodating and storing the semiconductor wafer and has a plurality of crosspieces partitioning the inside into a horizontal shelf shape. A liquid that is capable of maintaining a water layer formed on the entire upper surface of the semiconductor wafer placed on the uppermost layer in the cassette by surface tension and that drops in a drip state on the upper surface of the semiconductor wafer located immediately below Water is poured, and a water layer that can be maintained by surface tension is sequentially formed on the upper surfaces of all the semiconductor wafers stored in the cassette.

【0014】即ち、本発明のカセットは半導体ウエハを
集積格納して研削盤等で研削及び研磨加工する前後で用
い、更に、加工後には次の工程へカセット毎移送される
ものである。
That is, the cassette of the present invention is used before and after semiconductor wafers are stored in an integrated manner and ground and polished by a grinder or the like, and further, after processing, the cassette is transferred to the next step.

【0015】一般的なカセットは一側面へ開口面を形成
され、該開口面より半導体ウエハを挿脱するものであ
り、該カセットの内部は複数の桟体を等間隔で且つ水平
棚状に配設したものであり、オリフラ部を除き略円板形
状の半導体ウエハの相対する少なくとも二個所の外周縁
を下方より支持するものである。
In a general cassette, an opening surface is formed on one side surface and a semiconductor wafer is inserted and removed from the opening surface. Inside the cassette, a plurality of crosspieces are arranged at equal intervals and in a horizontal shelf shape. The outer peripheral edges of at least two facing portions of the substantially disk-shaped semiconductor wafer except the orientation flat portion are supported from below.

【0016】前記カセット内の夫々の桟体へ水平状態で
載置された最上層の半導体ウエハの上面に図1に図示の
如く、水滴を滴下するものであり、暫時滴下すると半導
体ウエハの上面の全面へ水層が形成されるものである。
As shown in FIG. 1, water drops are dropped on the upper surface of the uppermost semiconductor wafer placed horizontally on each of the crosspieces in the cassette, and once dropped, the upper surface of the semiconductor wafer is removed. A water layer is formed on the entire surface.

【0017】更に滴下を続行すると水層は液体の性質で
ある表面張力が作用し、半導体ウエハの上面に中程の表
面は平坦状と成り、外周縁辺にはアール状態と成るもの
であり、やがて、水層の水量が増して表面張力の限界を
超えると、断面矩形の半導体ウエハの外周縁の角部から
水滴となって下方に落下するものであるが、該水滴には
表面張力と界面張力が作用し、半導体ウエハの外周縁の
側面に付着しながら下面の外周縁まで流れ、そして、下
端の外周縁部の角部を付着したまま超えて、半導体ウエ
ハの下面に移動して表面張力が界面張力より勝った状態
となると水滴となって落下するものである。
When the dropping is further continued, the water layer is subjected to surface tension, which is a property of a liquid, the middle surface of the upper surface of the semiconductor wafer becomes flat, and the outer peripheral edge is in a rounded state. When the amount of water in the water layer increases and exceeds the limit of the surface tension, water drops drop downward from the corners of the outer peripheral edge of the semiconductor wafer having a rectangular cross section. Acts to flow to the outer peripheral edge of the lower surface while adhering to the side surface of the outer peripheral edge of the semiconductor wafer, and beyond the corners of the outer peripheral edge of the lower end to be adhered to move to the lower surface of the semiconductor wafer to cause surface tension. When the surface tension exceeds the interfacial tension, it drops as water drops.

【0018】従って、同じ外径を有する半導体ウエハを
複数枚間隔を有して積層されていても、半導体ウエハの
外周より内側に滴下するために確実に直下の半導体ウエ
ハの上面に落下して、下層に位置する半導体ウエハにも
確実に水層ができるものである。
Therefore, even if a plurality of semiconductor wafers having the same outer diameter are stacked at intervals, the semiconductor wafers are surely dropped onto the upper surface of the semiconductor wafer immediately below in order to drop inside from the outer periphery of the semiconductor wafer. A water layer can be surely formed on the semiconductor wafer located in the lower layer.

【0019】[0019]

【発明の効果】本発明は、前述のように、半導体ウエハ
の上面の全面に表面張力で維持できる程度で且つ且つ直
下に位置する半導体ウエハの上面に滴下状態で落下する
程度の液体を注水させることによって、半導体ウエハが
乾くこと無く、半導体ウエハを保管でき安定した状態で
品質を維持でき、最終製品の歩留まりを飛躍的に向上さ
せたものであり、画期的でその貢献度は計りしれないも
のがある極めて有意義な効果を奏するものである。
As described above, according to the present invention, the liquid is poured over the entire upper surface of the semiconductor wafer to the extent that it can be maintained by surface tension and drops onto the upper surface of the semiconductor wafer located immediately below it in a dripping state. As a result, the semiconductor wafer can be stored without being dried and the quality can be maintained in a stable state, and the yield of the final product is dramatically improved, which is epoch-making and its contribution is immeasurable. There is a very significant effect.

【0026】[0026]

【図面の簡単な説明】[Brief description of drawings]

【図1】図1は本発明の概念を説明するための側面説明
図である。
FIG. 1 is a side view for explaining the concept of the present invention.

【符号の説明】[Explanation of symbols]

W 半導体ウエハ 1 水層 W Semiconductor wafer 1 Water layer

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】平面研削盤等によって加工された半導体ウ
エハを集積格納する一側面へ開口面を有し且つ内部を複
数の桟体で水平棚状に仕切ったカセットにおいて、前記
カセット内の最上層に載置された半導体ウエハの上面の
全面に形成される水層を表面張力で維持できる程度で且
つ直下に位置する半導体ウエハの上面に点滴状態で落下
する程度の液体を注水させ、カセット内に格納される全
ての半導体ウエハの上面に表面張力で維持できる水層を
順次形成させることを特徴とする半導体ウエハのカセッ
ト内保管方法。 【0001】
1. A cassette having an opening on one side for accommodating and storing semiconductor wafers processed by a surface grinder and partitioning the interior into a horizontal shelf shape by a plurality of crosspieces, the uppermost layer in the cassette. The water layer that is formed on the entire upper surface of the semiconductor wafer placed on the surface of the semiconductor wafer can be maintained by surface tension, and a liquid that falls in a drip state onto the upper surface of the semiconductor wafer immediately below is poured into the cassette. A method for storing semiconductor wafers in a cassette, wherein a water layer that can be maintained by surface tension is sequentially formed on the upper surfaces of all semiconductor wafers to be stored. [0001]
JP18356793A 1993-06-30 1993-06-30 Method of storing semiconductor wafers in cassette Expired - Fee Related JP3238536B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18356793A JP3238536B2 (en) 1993-06-30 1993-06-30 Method of storing semiconductor wafers in cassette

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18356793A JP3238536B2 (en) 1993-06-30 1993-06-30 Method of storing semiconductor wafers in cassette

Publications (2)

Publication Number Publication Date
JPH0722360A true JPH0722360A (en) 1995-01-24
JP3238536B2 JP3238536B2 (en) 2001-12-17

Family

ID=16138069

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18356793A Expired - Fee Related JP3238536B2 (en) 1993-06-30 1993-06-30 Method of storing semiconductor wafers in cassette

Country Status (1)

Country Link
JP (1) JP3238536B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100576630B1 (en) * 1998-07-24 2006-05-04 가부시키가이샤 히타치세이사쿠쇼 Process for manufacturing semiconductor integrated circuit device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100576630B1 (en) * 1998-07-24 2006-05-04 가부시키가이샤 히타치세이사쿠쇼 Process for manufacturing semiconductor integrated circuit device

Also Published As

Publication number Publication date
JP3238536B2 (en) 2001-12-17

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