JPH0722326A - Optical cvd device - Google Patents

Optical cvd device

Info

Publication number
JPH0722326A
JPH0722326A JP2922792A JP2922792A JPH0722326A JP H0722326 A JPH0722326 A JP H0722326A JP 2922792 A JP2922792 A JP 2922792A JP 2922792 A JP2922792 A JP 2922792A JP H0722326 A JPH0722326 A JP H0722326A
Authority
JP
Japan
Prior art keywords
light
reaction
reaction chamber
gas outlet
rectifying
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2922792A
Other languages
Japanese (ja)
Inventor
Hiroshi Yuasa
博司 湯浅
Kenji Shibata
健二 芝田
Yuuta Tezeni
雄太 手銭
Saburo Adaka
三郎 阿高
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Power Ltd
Original Assignee
Babcock Hitachi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Babcock Hitachi KK filed Critical Babcock Hitachi KK
Priority to JP2922792A priority Critical patent/JPH0722326A/en
Publication of JPH0722326A publication Critical patent/JPH0722326A/en
Pending legal-status Critical Current

Links

Landscapes

  • Chemical Vapour Deposition (AREA)

Abstract

PURPOSE:To provide the title optical CVD device capable of avoiding the choking of rectifying gas at blowing-out ports even during long term film forming step for making the step feasible. CONSTITUTION:In order to deposit a thin film on a substrate 5 arranged in a reaction chamber 1 by irradiating the gas fed in the reaction chamber 1 through a rectifying gas blowing-out port 6 with light beams from light sources 3 such as low pressure mercury lamps etc., through an incident light window 2 to accelerate the photochemical reaction, baffer plates 4 are arranged so that the rectifying gas blowing-out port 6 may not be irradiated with the beams fed from the light sources 3 to the reaction chamber 1 through the incident light window 2. Furthermore, the baffer plates 4 are longer toward the rectifying gas blowing port 6.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は光CVD装置に係り、特
に光化学反応を用いた薄膜を形成するための装置におい
て、ガス供給管の吹き出し口の詰まりを防止するのに好
適な光CVD装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a photo-CVD apparatus, and more particularly to a photo-CVD apparatus suitable for preventing clogging of an outlet of a gas supply pipe in an apparatus for forming a thin film using a photochemical reaction. .

【0002】[0002]

【従来の技術】光化学反応は反応性ガスにそのガスの波
長吸収に応じた波長を有する光を照射することにより化
学反応を促進するものである。照射する光と反応ガスと
の組み合わせによって反応を選択的に進行させることが
可能である。さらに光化学反応は熱化学反応のような高
温が要求されないので、プロセスの低温化に有効であ
り、プラズマ反応のような荷電粒子の影響がないため、
堆積した膜に電気的な損傷がないことから、シリコン酸
化膜等の形成に有効であるとされている。
2. Description of the Related Art A photochemical reaction promotes a chemical reaction by irradiating a reactive gas with light having a wavelength corresponding to the wavelength absorption of the gas. The reaction can be selectively proceeded by the combination of the irradiation light and the reaction gas. Furthermore, the photochemical reaction does not require a high temperature like a thermochemical reaction, so it is effective in lowering the temperature of the process and does not have the effect of charged particles like a plasma reaction.
Since the deposited film has no electrical damage, it is said to be effective for forming a silicon oxide film or the like.

【0003】しかしながら、光化学反応を用いた薄膜製
造装置では、反応容器内に反応ガスを供給し、基盤上に
薄膜を堆積させるものであるため、薄膜を堆積させる回
数が多くなったり、薄膜を堆積させる時間を長くなる
と、光入射窓の表面に反応生成物が付着し、反応容器内
に照射される光の強度が低下し、さらには反応が停止す
る問題がある。
However, in a thin film manufacturing apparatus using a photochemical reaction, a reaction gas is supplied into a reaction vessel to deposit a thin film on a substrate, so that the number of times of depositing the thin film increases or the thin film is deposited. If the time is increased, the reaction product adheres to the surface of the light incident window, the intensity of the light irradiated into the reaction vessel decreases, and the reaction is stopped.

【0004】光入射窓の表面に反応生成物が付着するこ
とを防止する薄膜製造装置として、本発明者らは、先に
図3に示す光化学反応装置を提案した。(特開平1−1
86613号公報)
The present inventors have previously proposed the photochemical reaction device shown in FIG. 3 as a thin film manufacturing device for preventing the reaction products from adhering to the surface of the light incident window. (JP-A 1-1
(86613 publication)

【0005】図3において、51は反応室、52は反応
室51の壁面の一部を構成している光入射窓、53は光
源、54は薄膜を堆積させるための基板、56は光化学
反応に関係しないガス、57は反応ガス、58は整流ガ
ス吹き出し口、59は排気口である。
In FIG. 3, 51 is a reaction chamber, 52 is a light incident window forming a part of the wall surface of the reaction chamber 51, 53 is a light source, 54 is a substrate for depositing a thin film, and 56 is a photochemical reaction. A non-related gas, 57 is a reaction gas, 58 is a rectifying gas outlet, and 59 is an exhaust port.

【0006】上記した光化学反応装置では、光入射窓5
2の表面に反応生成物が付着することを防止するため
に、ガス吹き出し口58を多数の微細な連通孔を有する
耐熱性の多孔質物質によって構成し、ガス流路形状がガ
スの流れに乱れを生じる凹凸を有しない構造となってい
る。
In the photochemical reaction device described above, the light entrance window 5
In order to prevent the reaction product from adhering to the surface of No. 2, the gas outlet 58 is made of a heat-resistant porous material having a large number of fine communication holes, and the gas flow channel shape is disturbed by the gas flow. The structure does not have unevenness that causes

【0007】しかしながら、光源53からの光は光入射
窓52を透過し、基板54付近を照射するが、整流ガス
吹き出し口58にも照射してしまう。そのために整流ガ
ス吹き出し口58近傍で光化学反応が進行すると、整流
ガス吹き出し口58でも膜が堆積され、整流ガス吹き出
し口58が詰まり易いという問題があった。
However, although the light from the light source 53 passes through the light incident window 52 and irradiates the vicinity of the substrate 54, it also irradiates the rectified gas outlet 58. Therefore, when the photochemical reaction proceeds in the vicinity of the rectified gas outlet 58, a film is deposited also on the rectified gas outlet 58, and the rectified gas outlet 58 is likely to be clogged.

【0008】[0008]

【発明が解決しようとする課題】上記のように、従来の
光化学反応装置においては、光源53からの光を基板5
4付近に照射するように構成されているが、特に整流ガ
ス吹き出し口58の照射しないように配慮されていな
い。このため、整流ガス吹き出し口58近傍で光化学反
応が進行すると、連通孔に膜が生成され、整流ガス吹き
出し口58が詰まり易いという問題があった。
As described above, in the conventional photochemical reaction device, the light from the light source 53 is transmitted to the substrate 5.
Although it is configured to irradiate in the vicinity of No. 4, there is no particular consideration so as not to irradiate the rectifying gas outlet 58. For this reason, when the photochemical reaction proceeds in the vicinity of the rectified gas outlet 58, a film is formed in the communication hole, and the rectified gas outlet 58 is likely to be clogged.

【0009】本発明の目的は、上記した従来の課題を解
決し、長期間成膜操作を行っても整流ガス吹き出し口の
詰まりを防止することができる光CVD装置を提供する
ことにある。
An object of the present invention is to solve the above-mentioned problems of the prior art and to provide an optical CVD apparatus capable of preventing clogging of a rectifying gas outlet even if a film forming operation is performed for a long period of time.

【0010】[0010]

【課題を解決するための手段】上記した目的を達成する
ため、本発明は整流ガス吹き出し口を介して反応室内に
供給されたガスに光入射窓を透過して光源からの光を照
射することにより光化学反応を促進し、反応室内に設置
された基板上に薄膜を堆積させる光CVD装置におい
て、光源から光入射窓を介して反応室内に供給される光
が整流ガス吹き出し口に照射されないように光源付近に
遮蔽板を設置したことを特徴とする。
In order to achieve the above-mentioned object, the present invention irradiates the gas supplied into the reaction chamber through the rectifying gas outlet with the light from the light source through the light entrance window. In a photo-CVD apparatus that promotes a photochemical reaction by means of and deposits a thin film on a substrate installed in the reaction chamber, the light supplied from the light source into the reaction chamber through the light incident window is prevented from being irradiated to the rectified gas outlet. The feature is that a shielding plate is installed near the light source.

【0011】[0011]

【作用】反応室内に供給された反応ガスは、反応ガスの
励起に必要な波長を有する光が照射されないと、光化学
反応が促進されず、反応生成物が生成されない。整流ガ
ス吹き出し口付近は遮蔽板によって光源からの光の照射
が遮蔽されるので、整流ガス吹き出し口付近では、光化
学反応が促進されず、反応生成物が生成されない。この
結果、整流ガス吹き出し口には膜が生成されないから、
整流ガス吹き出し口の詰まりが防止される。
When the reaction gas supplied into the reaction chamber is not irradiated with light having a wavelength necessary for exciting the reaction gas, the photochemical reaction is not promoted and the reaction product is not generated. Since the irradiation of the light from the light source is shielded by the shielding plate near the rectifying gas outlet, the photochemical reaction is not promoted near the rectifying gas outlet and the reaction product is not generated. As a result, no film is generated at the rectified gas outlet,
Clogging of the rectified gas outlet is prevented.

【0012】[0012]

【実施例】以下、本発明の実施例を図面に基づいて説明
する。図1は本発明の光CVD装置の一実施例を示す概
略的断面構成図である。断面矩形状の内部空間を有する
反応容器内を構成する反応室1の上部には光入射窓2が
設置されている。この光入射窓2は反応室1の壁面の一
部を構成し、反応室1の内壁面と光入射窓2の内面(反
応室側面)は同一面を構成し、凹凸を有しない構造とな
っている。
Embodiments of the present invention will be described below with reference to the drawings. FIG. 1 is a schematic sectional configuration diagram showing an embodiment of the photo-CVD apparatus of the present invention. A light incident window 2 is installed above a reaction chamber 1 that constitutes the inside of a reaction vessel having an internal space with a rectangular cross section. The light entrance window 2 constitutes a part of the wall surface of the reaction chamber 1, and the inner wall surface of the reaction chamber 1 and the inner surface of the light entrance window 2 (reaction chamber side surface) are flush with each other and have a structure having no unevenness. ing.

【0013】また、光入射窓2の上方には、光化学反応
の励起源となる低圧水銀ランプ3が複数個配設されてお
り、それぞれの低圧水銀ランプ3の間には遮蔽板4が光
入射窓2に対して垂直な方向に並設されている。
A plurality of low-pressure mercury lamps 3 serving as excitation sources for photochemical reactions are arranged above the light entrance window 2, and a shielding plate 4 is provided between the low-pressure mercury lamps 3. The windows 2 are arranged side by side in a direction perpendicular to the windows 2.

【0014】さらに反応室1の底面部には凹部が形成さ
れ、この凹部に薄膜を堆積させるための基板5が埋設可
能な形状を有するサセプタ9が配設されると共にこのサ
セプタ9及び基板5の上面は反応室1の底面と同一面を
構成し、凹凸を有しない構造となっている。
Further, a recess is formed in the bottom surface of the reaction chamber 1, and a susceptor 9 having a shape in which a substrate 5 for depositing a thin film can be embedded is provided in the recess, and the susceptor 9 and the substrate 5 are formed. The upper surface is flush with the bottom surface of the reaction chamber 1 and has a structure having no unevenness.

【0015】反応容器の側面に整流ガス吹き出し口6が
配設されており、この整流ガス吹き出し口6は上下方向
に2段に区画され、その下段側は単体で光入射窓2の曇
りの原因となる可能性となる反応ガスを供給するための
ガス供給管7が配設され、その上段側は単体では光入射
窓2の曇りの原因とならない反応ガスを供給するための
ガス供給管8が配設されている。また、整流ガス吹き出
し口6に対応する反応室1の側面下方には排気口10が
形成されている。
A rectifying gas outlet 6 is provided on the side surface of the reaction vessel, and the rectifying gas outlet 6 is divided into two stages in the vertical direction, and the lower side thereof alone is a cause of clouding of the light incident window 2. A gas supply pipe 7 for supplying a reaction gas that may possibly become a gas supply pipe is provided, and a gas supply pipe 8 for supplying a reaction gas that does not cause fog of the light incident window 2 by itself is provided on the upper side thereof. It is arranged. An exhaust port 10 is formed below the side surface of the reaction chamber 1 corresponding to the rectified gas outlet 6.

【0016】整流ガス吹き出し口6は、それぞれ多数の
微細な連通孔を有する耐熱性の多孔質物質によって構成
されており、多孔質物質としては、例えば、平均粒径が
0.1μm〜1mm、好ましくは2μm〜500μmの
金属又はセラミックスの焼結体からなるものが望まし
い。
The rectifying gas outlet 6 is made of a heat-resistant porous material having a large number of fine communication holes, and the porous material has, for example, an average particle diameter of 0.1 μm to 1 mm, preferably. Is preferably made of a sintered body of metal or ceramic having a thickness of 2 μm to 500 μm.

【0017】低圧水銀ランプ3から光入射窓2を介して
反応室1内に光を照射する際、図2に点線で示すように
整流ガス吹き出し口6に光が照射されないようにそれぞ
れの遮蔽板4の長さが異なっている。すなわち、低圧水
銀ランプ3は、光入射窓2に対して所定の間隔をおいて
平行に並設されており、光入射窓2に対して垂直方向に
配置された各々の遮蔽板4は、整流ガス吹き出し口6側
の遮蔽板4の長さが長く、排気口10側になるにつれて
遮蔽板4の長さに短くなっている。
When the low-pressure mercury lamp 3 irradiates light into the reaction chamber 1 through the light entrance window 2, the shielding plates are provided so that the rectifying gas outlet 6 is not irradiated with light as shown by the dotted line in FIG. The length of 4 is different. That is, the low-pressure mercury lamps 3 are arranged in parallel in parallel with the light incident window 2 at a predetermined interval, and the respective shielding plates 4 arranged in the direction perpendicular to the light incident window 2 are rectified. The length of the shielding plate 4 on the gas outlet 6 side is long, and the length of the shielding plate 4 decreases on the side of the exhaust port 10.

【0018】次の上記の構成からなる光CVD装置の作
用をモノシラン(SiH4 )と酸素ガス(O2 )を用い
て酸化シリコン膜(Si2 O)を堆積させる場合を例に
説明する。
The operation of the photo-CVD apparatus having the above-mentioned structure will be described below by taking as an example the case of depositing a silicon oxide film (Si2 O) using monosilane (SiH4) and oxygen gas (O2).

【0019】図1に示す装置において、モノシランガス
はガス供給管7から下段の整流ガス吹き出し口6を介し
て反応室1内に供給され、酸素ガスはガス供給管8から
上段の整流ガス吹き出し口6を介して反応室1内にされ
る。通常成膜は、減圧下で行うが、減圧下では、モノシ
ランガスと酸素ガスは同じ流速で反応室1内に供給され
た直後、相互拡散により広がり、互いに混合する。
In the apparatus shown in FIG. 1, monosilane gas is supplied from the gas supply pipe 7 into the reaction chamber 1 through the lower rectifying gas outlet 6, and oxygen gas is supplied from the gas supply pipe 8 to the upper rectifying gas outlet 6. Through the inside of the reaction chamber 1. Usually, the film formation is carried out under reduced pressure, but under the reduced pressure, immediately after the monosilane gas and the oxygen gas are supplied into the reaction chamber 1 at the same flow rate, they spread by mutual diffusion and mix with each other.

【0020】この時点で、低圧水銀ランプ3からの光が
照射されていれば光化学反応が進行するが、整流ガス吹
き出し口6付近では、光が照射されない領域を形成して
いるので、光化学反応が進行しない。したがって、整流
ガス吹き出し口6の付近領域では反応生成物が生成され
ないので、整流ガス吹き出し口6に反応生成物が付着す
ることがない。反応ガスが図2中、点線で示す領域に入
ると、光化学反応が進行し、その結果、基板5上に薄膜
が堆積するが、整流ガス吹き出し口6には反応生成物が
付着しない。
At this point, the photochemical reaction proceeds if the light from the low-pressure mercury lamp 3 is radiated, but in the vicinity of the rectifying gas outlet 6, there is formed a region where the light is not radiated. Does not progress. Therefore, since the reaction product is not generated in the region near the rectified gas outlet 6, the reaction product does not adhere to the rectified gas outlet 6. When the reaction gas enters the area shown by the dotted line in FIG. 2, the photochemical reaction proceeds, and as a result, a thin film is deposited on the substrate 5, but the reaction product does not adhere to the rectifying gas outlet 6.

【0021】[0021]

【発明の効果】以上のように本発明によれば、長時間又
は長期間にわたって成膜操作を続けても整流ガス吹き出
し口が詰まることがなく、安定して成膜操作を行うこと
ができる。
As described above, according to the present invention, even if the film forming operation is continued for a long time or for a long period of time, the rectifying gas outlet is not clogged and the film forming operation can be stably performed.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の光CVD装置の一実施例を示す概略的
断面構成図である。
FIG. 1 is a schematic cross-sectional configuration diagram showing an embodiment of a photo-CVD apparatus of the present invention.

【図2】図1の装置における光の照射領域を示すための
説明図である。
FIG. 2 is an explanatory diagram showing a light irradiation area in the apparatus of FIG.

【図3】従来の光化学反応装置を示す概略的断面図構成
図である。
FIG. 3 is a schematic cross-sectional configuration diagram showing a conventional photochemical reaction device.

【符号の説明】[Explanation of symbols]

1 反応室 2 光入射窓 3 低圧水銀ランプ 4 遮蔽板 5 基板 6 整流ガス吹き出し口 7,8 ガス供給管 9 サセプタ 10 排気口 1 Reaction chamber 2 Light entrance window 3 Low-pressure mercury lamp 4 Shielding plate 5 Substrate 6 Rectifying gas outlet 7, 8 Gas supply pipe 9 Susceptor 10 Exhaust outlet

───────────────────────────────────────────────────── フロントページの続き (72)発明者 阿高 三郎 神奈川県横浜市磯子区磯子一丁目2番10号 バブコック日立株式会社横浜研究所内 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Saburo Ataka 1-2-10 Isogo, Isogo-ku, Yokohama-shi, Kanagawa Babcock Hitachi Ltd. Yokohama Research Laboratory

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 整流ガス吹き出し口を介して反応室内に
供給されたガスに光入射窓を透過して光源からの光を照
射することにより光化学反応を促進し、反応室内に設置
された基板上に薄膜を堆積させる光CVD装置におい
て、前記光源から光入射窓を介して反応室内に供給され
る光が前記整流ガス吹き出し口に照射されないように光
源付近に遮蔽板を設置したことを特徴とする光CVD装
置。
1. A photochemical reaction is promoted by irradiating a gas supplied into a reaction chamber through a rectifying gas outlet through a light incident window with light from a light source, thereby promoting a photochemical reaction, and on a substrate installed in the reaction chamber. In the photo-CVD apparatus for depositing a thin film on the substrate, a shielding plate is installed near the light source so that the light supplied from the light source into the reaction chamber through the light incident window is not irradiated to the rectifying gas outlet. Photo CVD equipment.
【請求項2】 前記光源が反応室の一部を構成する光入
射窓に対して平行に複数個並設され、各光源の間に前記
遮蔽板が設置されると共に前記整流ガス吹き出し口側に
近接するにつれて前記遮蔽板の長さが長くなっているこ
とを特徴とする請求項1の光CVD装置。
2. A plurality of the light sources are arranged in parallel in parallel with a light entrance window forming a part of the reaction chamber, the shielding plate is installed between the light sources, and the rectifying gas blowout port side is provided. 2. The photo-CVD apparatus according to claim 1, wherein the shield plate has a length that becomes longer as the shield plate comes closer to the shield plate.
JP2922792A 1992-02-17 1992-02-17 Optical cvd device Pending JPH0722326A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2922792A JPH0722326A (en) 1992-02-17 1992-02-17 Optical cvd device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2922792A JPH0722326A (en) 1992-02-17 1992-02-17 Optical cvd device

Publications (1)

Publication Number Publication Date
JPH0722326A true JPH0722326A (en) 1995-01-24

Family

ID=12270338

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2922792A Pending JPH0722326A (en) 1992-02-17 1992-02-17 Optical cvd device

Country Status (1)

Country Link
JP (1) JPH0722326A (en)

Similar Documents

Publication Publication Date Title
EP0252667B1 (en) Chemical vapour deposition methods
US4509456A (en) Apparatus for guiding gas for LP CVD processes in a tube reactor
JPH07172985A (en) Process and apparatus for forming tungsten silicide on semiconductor wafer by using dichlorosilane gas
JPH0722326A (en) Optical cvd device
JPH01183809A (en) Photo assisted cvd system
JPH062146A (en) Photo-cvd apparatus
JP3224238B2 (en) Thin film forming equipment
JPS6227573A (en) Photochemical reaction device
JPH05198512A (en) Optical cvd device
JPH01312075A (en) Photochemical reactor
JPH06260424A (en) Optical cvd device
JPH0279420A (en) Photoexciting cvd device
JP2702697B2 (en) Processing device and processing method
JPH01247573A (en) Photochemical vapor deposition device
JPS61131428A (en) Semiconductor manufacturing equipment
JPH0437117A (en) Photochemical vapor growing device
JPH03268320A (en) Optical cvd system
JPH02299223A (en) Photo cvd device
JPH0336272A (en) Photo-cvd device
JPH01312078A (en) Light-excited treating device
JPH02159376A (en) Method and device for light-excited cvd
JPS6156281A (en) Film forming method
JPH01240665A (en) Photochemical vapor deposition device
JPS61131422A (en) Semiconductor manufacturing equipment
JPS6250467A (en) Light cvd device