JPH0722299A - Aging processing circuit for electrolytic capacitor - Google Patents

Aging processing circuit for electrolytic capacitor

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Publication number
JPH0722299A
JPH0722299A JP15889293A JP15889293A JPH0722299A JP H0722299 A JPH0722299 A JP H0722299A JP 15889293 A JP15889293 A JP 15889293A JP 15889293 A JP15889293 A JP 15889293A JP H0722299 A JPH0722299 A JP H0722299A
Authority
JP
Japan
Prior art keywords
aging
electrolytic capacitor
processing circuit
electrolytic
current
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15889293A
Other languages
Japanese (ja)
Other versions
JP2731699B2 (en
Inventor
Masahiko Miyake
正彦 三宅
Tadashi Otsuki
正 大槻
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
J C C ENG KK
CKD Corp
Original Assignee
J C C ENG KK
CKD Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by J C C ENG KK, CKD Corp filed Critical J C C ENG KK
Priority to JP5158892A priority Critical patent/JP2731699B2/en
Publication of JPH0722299A publication Critical patent/JPH0722299A/en
Application granted granted Critical
Publication of JP2731699B2 publication Critical patent/JP2731699B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Abstract

PURPOSE:To provide an aging processing circuit for electrolytic capacitor in which the exciting current can be controlled optimally. CONSTITUTION:The aging processing circuit 1 for electrolytic capacitor conducts aging by applying a voltage from an aging power supply 5 to a plurality of electrolytic capacitors Cx1, Cx2,..., Cxn connected with the connecting terminals of an aging jig 3. The aging processing circuit 1 comprises a series circuit of an electrolytic capacitor C, a switch means comprising a normal close contact crb and a common contact crc, and an exciting coil L (opening means) connected between the electrodes of the aging power supply 5. When a predetermined current flows through the electrolytic capacitor C, the exciting coil L is excited to open the switch means. Consequently, a holding means comprising a normal open contact cra, the common contact crc and a holding power supply 7 functions to sustain the open state of the switch means thus preventing subsequent current supply to the electrolytic capacitor C.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は電解コンデンサのエージ
ング処理回路に関し、特に電解コンデンサをエージング
処理する際に、当該コンデンサに流す励磁電流を最適な
状態に制御できる電解コンデンサのエージング処理回路
に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an aging process circuit for an electrolytic capacitor, and more particularly to an aging process circuit for an electrolytic capacitor which can control an exciting current flowing through the capacitor to an optimum state when the aging process is performed on the electrolytic capacitor.

【0002】[0002]

【従来の技術】薄形電解コンデンサは、周知のとおり、
例えばアルミニューム薄を陽極とし、その陽極箔と陰極
箔との間に電解物質を含浸させ、両電極箔に直流電圧を
印加し電解物質を電解酸化させて両電極箔の間に極めて
薄い酸化皮膜からなる誘電体を生成させることにより製
造される素子である。
2. Description of the Related Art As is well known, thin electrolytic capacitors are
For example, an aluminum thin film is used as an anode, an electrolytic substance is impregnated between the anode foil and the cathode foil, and a DC voltage is applied to both electrode foils to electrolytically oxidize the electrolytic substance to form an extremely thin oxide film between the electrode foils. It is an element manufactured by producing a dielectric material.

【0003】したがって、上記電解コンデンサを製造す
る工程においては、当該コンデンサの検査前に、当該コ
ンデンサに電圧を印加して前記コンデンサを化成化する
エージング処理を必要としている。このため、従前よ
り、エージング処理を行うエージング処理回路が提案さ
れている。
Therefore, in the process of manufacturing the electrolytic capacitor, an aging treatment is required before the inspection of the capacitor to apply a voltage to the capacitor to form the capacitor. Therefore, an aging processing circuit that performs an aging process has been proposed.

【0004】従来のエージング処理回路としては、大別
して、定電流回路を用いるもの、充電抵抗のみを用いる
ものがあった。
Conventional aging processing circuits are roughly classified into those using a constant current circuit and those using only a charging resistor.

【0005】この定電流回路を用いるエージング処理回
路は、当該コンデンサと定電流回路とを直列接続し、当
該コンデンサに一定電流を流すようにしたものであり、
充電電流を流すことにより当該コンデンサの化成化がで
きることになる。
In this aging processing circuit using a constant current circuit, the capacitor and the constant current circuit are connected in series so that a constant current flows through the capacitor.
By passing the charging current, the capacitor can be chemically formed.

【0006】また、充電抵抗のみを用いるエージング処
理回路は、当該コンデンサと充電抵抗とを直列接続し、
この直列回路に直流電圧を印加するようにしたものであ
り、充電電流を流すことにより当該コンデンサの化成化
ができることになる。
In the aging processing circuit using only the charging resistor, the capacitor and the charging resistor are connected in series,
A direct current voltage is applied to this series circuit, and the formation of the capacitor can be performed by supplying a charging current.

【0007】[0007]

【発明が解決しようとする課題】上記定電流、または、
充電抵抗を介したエージング方法では、多数個のコンデ
ンサの中でエージング工程中で、箔欠陥により熱破壊に
至るコンデンサがエージング中破壊し、付近の良品コン
デンサを機械的に破壊する欠点があつた。
The above constant current, or
The aging method using a charging resistor has a drawback in that, in the aging process among a large number of capacitors, a capacitor which causes thermal breakdown due to a foil defect is destroyed during aging, and a non-defective capacitor nearby is mechanically destroyed.

【0008】本発明はこのように、熱破壊に至るコンデ
ンサの破壊前にこれを検知し、周囲への影響を防止する
ことを目的とする。
An object of the present invention is thus to detect this before the destruction of the capacitor leading to thermal destruction and prevent the influence on the surroundings.

【0009】[0009]

【課題を解決するための手段】上記目的を達成するため
に、本発明の電解コンデンサのエージング処理回路は、
複数個の電解コンデンサを並列に接続してエージング電
圧を各々の電解コンデンサに与え、エージング処理を行
う電解コンデンサのエージング処理回路において、前記
各々の電解コンデンサの一端に接続されたスイッチ手段
と、前記スイッチ手段を前記電解コンデンサに所定の一
定の電流以上の電流が流れた状態で開放する手段と、前
記スイッチが一度開放状態になったときに、その開放状
態を保持させる保持手段とを備えたものである。
In order to achieve the above object, an aging processing circuit for an electrolytic capacitor of the present invention comprises:
In an aging processing circuit of an electrolytic capacitor for performing an aging treatment by connecting a plurality of electrolytic capacitors in parallel and applying an aging voltage to each electrolytic capacitor, a switch means connected to one end of each electrolytic capacitor, and the switch. A means for opening the means in a state where a current equal to or higher than a predetermined constant current flows through the electrolytic capacitor, and a holding means for holding the open state once the switch is in the open state. is there.

【0010】[0010]

【作用】上述したような構成とし本た発明では、エージ
ング電源に対して、電解コンデンサ、スイッチ手段、開
放する手段からなる直列回路を接続し、当該電解コンデ
ンサに所定の一定電流以上の電流が流れると、開放する
手段が動作してスイッチ手段を開放することにより当該
電解コンデンサに流れる電流を切り、かつスイッチ手段
が開放されると保持手段が働くことによりスイッチ手段
を開放したままにする。これにより、電解コンデンサに
は、以後、励磁電流が流れなくなる。
According to the present invention having the above-described structure, a series circuit including an electrolytic capacitor, a switch means, and an opening means is connected to an aging power source, and a current of a predetermined constant current or more flows through the electrolytic capacitor. Then, the opening means operates to open the switch means to cut off the current flowing through the electrolytic capacitor, and when the switch means is opened, the holding means operates to keep the switch means open. As a result, the exciting current no longer flows through the electrolytic capacitor.

【0011】[0011]

【実施例】以下、本発明の一実施例を図に基づいて説明
する。
An embodiment of the present invention will be described below with reference to the drawings.

【0012】図1は、本発明に係る電解コンデンサのエ
ージング処理回路の一実施例を示す要部回路構成図であ
る。
FIG. 1 is a circuit diagram of essential parts showing an embodiment of an aging processing circuit for an electrolytic capacitor according to the present invention.

【0013】図1において、エージング処理回路1は、
大別して、エージング用治具3と、エージング電源5
と、保持用電源7とを備えている。
In FIG. 1, the aging processing circuit 1 is
Broadly classified, aging jig 3 and aging power supply 5
And a holding power supply 7.

【0014】前記エージング用治具3は、複数の電解コ
ンデンサCx1,Cx2,…,Cxn(nは任意の整数)を着
脱できるようになっており、複数個の電解コンデンサC
x1,Cx2,…,Cxnを並列に装着接続し、エージング電
源5からエージング電圧を各々の電解コンデンサCx1
x2,…,Cxnに与え、エージング処理を行うことがで
きるようになっている。前記エージング用治具3におい
て、各充電抵抗R1,R2,…,Rnの一端は共通にされ
てエージング電源5の陽極に接続されている。
The aging jig 3 can attach and detach a plurality of electrolytic capacitors C x1 , C x2 , ..., C xn (n is an arbitrary integer), and a plurality of electrolytic capacitors C can be attached.
x1 , C x2 , ..., C xn are connected and connected in parallel, and an aging voltage is supplied from the aging power source 5 to each electrolytic capacitor C x1 ,
Axing processing can be performed by applying to C x2 , ..., C xn . In the aging jig 3, one ends of the charging resistors R 1 , R 2 , ..., R n are commonly connected to the anode of the aging power source 5.

【0015】また、各充電抵抗R1,R2,…,Rnの他
端は、それぞれ電解コンデンサCx1,Cx2,…,Cxn
一端に接続されている。各電解コンデンサCx1,Cx2
…,Cxnの他端は、プロテクタリレーCR1,CR2
…,CRnの各常時閉接点crb1,crb2,…,crbn
に接続されている。また、各プロテクタリレーCR1
CR2,…,CRnの共通接点crc1,crc2,…,cr
cnは、各プロテクタリレーCR1,CR2,…,CRn
励磁コイル(開放する手段)L1,L2,…,Lnの一端
にそれぞれ接続されている。各励磁コイル(開放する手
段)L1,L2,…,Lnの他端は共通接続されて、エー
ジング電源5及び保持用電源7の陰極にそれぞれ接続さ
れている。また、保持用電源7の陽極は、ダイオードD
のアノードに接続されている。ダイオードDのカソード
は、プロテクタリレーCR1,CR2,…,CRnの各常
時開接点cra1,cra2,…,cranにそれぞれ接続さ
れている。前記保持用電源7、ダイオードD、接点cr
a1,cra2,…,cran、及びそれらの接続により保持
手段が構成されている。
The other ends of the charging resistors R 1 , R 2 , ..., R n are connected to one ends of the electrolytic capacitors C x1 , C x2 , ..., C xn , respectively. Each electrolytic capacitor C x1 , C x2 ,
,, the other end of C xn has protector relays CR 1 , CR 2 ,
,, CR n normally closed contacts cr b1 , cr b2 , ..., cr bn
It is connected to the. In addition, each protector relay CR 1 ,
Common contacts of CR 2 , ..., CR n cr c1 , cr c2 , ..., cr
cn, each protector relay CR 1, CR 2, ..., CR excitation coil (open to means) n L 1, L 2, ... , are connected to one end of the L n. The other ends of the exciting coils (opening means) L 1 , L 2 , ..., L n are commonly connected and connected to the cathodes of the aging power source 5 and the holding power source 7, respectively. Further, the anode of the holding power source 7 is a diode D
Connected to the anode of. The cathode of the diode D, the protector relay CR 1, CR 2, ..., CR respective normally open contacts of the n cr a1, cr a2, ... , are connected to the cr an,. The holding power source 7, diode D, contact point cr
a1, cr a2, ..., cr an, and the holding means by their connection is constructed.

【0016】なお、エージング電源5は、例えば100
〔V〕〜550〔V〕までユーザが任意に設定できるよ
うに構成される。また、各プロテクタリレーCR1,C
2,…,CRnの励磁コイルL1,L2,…,Lnは、例
えば20〔mA〕の電流が流れると励磁されて、共通接
点crc1,crc2,…,crcnを接点cra1,cra2
…,cran側に接続する。
The aging power source 5 is, for example, 100
[V] to 550 [V] can be arbitrarily set by the user. In addition, each protector relay CR 1 , C
R 2, ..., exciting coil L 1 of the CR n, L 2, ..., L n , for example 20 current is excited and flows of [mA], the common contact cr c1, cr c2, ..., contact the cr cn cr a1 , cr a2 ,
..., connect to the cr an side.

【0017】このように構成された実施例の特徴ある動
作を説明する。
The characteristic operation of the embodiment thus configured will be described.

【0018】まず、エージング用治具3の所定の接続端
子に、複数個の電解コンデンサCx1,Cx2,…,Cxn
装着接続する。ついで、エージング電源5から所定のエ
ージング電圧(電圧値は、ユーザが選定する)を各々の
電解コンデンサCx1,Cx2,…,Cxnに与えて、エージ
ング処理を行う。
First, a plurality of electrolytic capacitors C x1 , C x2 , ..., C xn are mounted and connected to predetermined connection terminals of the aging jig 3. Then, a predetermined aging voltage (the voltage value is selected by the user) is applied from the aging power source 5 to each electrolytic capacitor C x1 , C x2 , ..., C xn to perform the aging process.

【0019】正常にエージング処理が終了しているとき
には、エージング処理を終了した電解コンデンサを接続
端子から外し、処理の終了していない電解コンデンサを
接続端子に装着してエージング処理を行い、この作業を
繰り返えす。
When the aging process is normally completed, the electrolytic capacitor which has been subjected to the aging process is removed from the connection terminal, and the electrolytic capacitor which has not been processed is attached to the connection terminal to perform the aging process. I repeat.

【0020】ところで、電解コンデンサの品質が劣悪で
ある場合には電圧・電流特性が悪くなる場合があり、例
えば電解コンデンサCx2の品質が悪く、その電圧・電流
特性が悪い場合には、電解コンデンサCx2で疑似ショー
トが発生する。すると、エージング電源5の正極→充電
抵抗R2→電解コンデンサCx2→プロテクタリレーCR2
の接点crb2→共通接点crc2→励磁コイルL2 →エー
ジング電源5の陰極という回路を通して例えば20〔m
A〕以上の電流が流れることになる。これによって、プ
ロテクタリレーCR2の励磁コイルL2が励磁されること
になり、共通接点crc2は、接点crb2から離れて接点
cra2に接続されることになる。この結果、保持用電源
7の陽極→ダイオードD→接点cra2→共通接点crc2
→励磁コイルL2 →保持用電源7の陰極という閉回路が
形成され、その閉回路に保持電流が流れることにより励
磁コイルL2 は励磁状態を保つ。したがって、接点cr
b2と共通接点crc2(スイッチ手段)が一度開放状態に
なると、その開放状態が保持されることになる。これに
より、電解コンデンサCx2には電流が流れない。
When the quality of the electrolytic capacitor is poor, the voltage / current characteristics may be deteriorated. For example, when the quality of the electrolytic capacitor C x2 is poor and the voltage / current characteristics are poor, the electrolytic capacitor may be deteriorated. A pseudo short circuit occurs at C x2 . Then, the positive electrode of the aging power source 5 → charging resistance R 2 → electrolytic capacitor C x2 → protector relay CR 2
Through contact point cr b2 → common contact cr c2 → excitation coil L 2 → cathode of aging power source 5 for example, 20 [m
A] or more current flows. This makes that the exciting coil L 2 of the protector relay CR 2 is energized, the common contact cr c2 will be connected to the contact cr a2 away from the contact cr b2. As a result, the anode of the power source 7 for holding → diode D → contact cr a2 → common contact cr c2
→ Excitation coil L 2 → A closed circuit called the cathode of the holding power supply 7 is formed, and the holding current flows in the closed circuit, whereby the excitation coil L 2 is kept in the excited state. Therefore, the contact point cr
Once b2 and the common contact cr c2 (switch means) are opened, the opened state is maintained. As a result, no current flows through the electrolytic capacitor C x2 .

【0021】上述したように本実施例によれば、電解コ
ンデンサC、接点crb と共通接点crc からなるスイ
ッチ手段、励磁コイルLからなる開放手段を直列接続し
てエージング電源5の陽極・陰極間に接続し、当該電解
コンデンサCに一定電流が流れると、励磁コイルLが励
磁されてスイッチ手段(常時閉接点crb と共通接点c
c )を開放する。これにより当該電解コンデンサCに
流れる電流が遮断される。また、スイッチ手段(接点c
b と共通接点crc )が開放されることにより、接点
cra(常時開接点) ・共通接点crc ・保持用電源7
からなる保持手段が作動し、これにより前記スイッチ手
段の開放状態が維持されて、電解コンデンサCには、以
後電流が流れなくなる。
As described above, according to this embodiment, the electrolytic capacitor C, the switch means including the contact point cr b and the common contact point cr c, and the opening means including the exciting coil L are connected in series, and the anode / cathode of the aging power source 5 is connected. When a constant current flows through the electrolytic capacitor C connected in between, the exciting coil L is excited and the switch means (normally closed contact cr b and common contact c
r c ) is opened. As a result, the current flowing through the electrolytic capacitor C is cut off. In addition, switch means (contact c
When r b and the common contact cr c ) are opened, the contact cr a (normally open contact), the common contact cr c, and the holding power supply 7
The holding means consisting of (3) is operated, whereby the open state of the switch means is maintained, and no more current flows through the electrolytic capacitor C.

【0022】この結果、本実施例によれば、一定の値の
電流が流れると以後電解コンデンサに電流が流れないた
め、過大電流が流れることによる熱破損を防止できると
共に、励磁電流を制限する充電抵抗を各電解コンデンサ
毎に選定する必要がなくなり一定抵抗値の充電抵抗を使
用することができる。
As a result, according to the present embodiment, since a current does not flow through the electrolytic capacitor after a constant value of current flows, it is possible to prevent thermal damage due to the flow of excessive current, and to suppress the charging current by charging. It is not necessary to select a resistor for each electrolytic capacitor, and a charging resistor having a constant resistance value can be used.

【0023】また、本実施例では、完全なショート状態
を未然に防止できるため、従来のようにショートによる
スパーク及び破裂を防げることにより、他の良品コンデ
ンサへの悪影響を防止することができる。
Further, in this embodiment, since a complete short circuit can be prevented in advance, it is possible to prevent the adverse effect on other non-defective capacitors by preventing the spark and the burst due to the short circuit as in the conventional case.

【0024】さらに、本実施例では、共通接点crc
接点cra に接続していることを表示できるようにすれ
ば、疑似ショート状態になった電解コンデンサを検出で
き、不良品等を容易に判別することができる。
Further, in the present embodiment, if it is possible to indicate that the common contact cr c is connected to the contact cr a , it is possible to detect the electrolytic capacitor in the pseudo short-circuited state and to easily detect a defective product or the like. Can be determined.

【0025】[0025]

【発明の効果】以上説明したように本発明によれば、所
定の一定電流以上の励磁電流が流れると以後電解コンデ
ンサに電流が流れないように構成した。
As described above, according to the present invention, when an exciting current of a predetermined constant current or more flows, no current flows in the electrolytic capacitor thereafter.

【0026】したがって、(1) 過大電流が流れることに
よる熱破損を防止でき、(2) 充電抵抗を各電解コンデン
サ毎に選定する必要がなくなり一定抵抗値の充電抵抗を
使用することができ、(3) 完全なショート状態を未然に
防止できる等の優れた効果を有する。
Therefore, (1) it is possible to prevent thermal damage due to the flow of an excessive current, and (2) it is not necessary to select a charging resistor for each electrolytic capacitor, and a charging resistor having a constant resistance value can be used. 3) It has an excellent effect that it can prevent a complete short circuit.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明に係る電解コンデンサのエージング処理
回路の一実施例を示す要部回路構成図である。
FIG. 1 is a circuit diagram of essential parts showing an embodiment of an aging processing circuit for an electrolytic capacitor according to the present invention.

【符号の説明】[Explanation of symbols]

1 エージング処理回路 3 エージング用治具 5 エージング電源 7 保持用電源 Cx1,Cx2,…,Cxn 電解コンデンサ R1,R2,…,Rn 充電抵抗 CR1,CR2,…,CRn プロテクタリレー cra1,cra2,…,cran 常時開接点 crb1,crb2,…,crbn 常時閉接点 crc1,crc2,…,crcn 共通接点 L1,L2,…,Ln 励磁コイル(開放する手段)1 Aging processing circuit 3 Aging jig 5 Aging power supply 7 Holding power supply C x1 , C x2 , ..., C xn Electrolytic capacitors R 1 , R 2 , ..., R n Charging resistance CR 1 , CR 2 , ..., CR n Protector relays cr a1 , cr a2 , ..., cr an normally open contacts cr b1 , cr b2 , ..., cr bn normally closed contacts cr c1 , cr c2 , ..., cr cn common contacts L 1 , L 2 , ..., L n Excitation coil (opening means)

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 複数個の電解コンデンサを並列に接続し
てエージング電圧を各々の電解コンデンサに与え、エー
ジング処理を行う電解コンデンサのエージング処理回路
において、 前記各々の電解コンデンサの一端に接続されたスイッチ
手段と、 前記スイッチ手段を前記電解コンデンサに所定の一定の
電流以上の励磁電流が流れた状態で開放する手段と、 前記スイッチが一度開放状態になったときに、該開放状
態を保持させる保持手段とを備えることを特徴とする電
解コンデンサのエージング処理回路。
1. An aging processing circuit for an electrolytic capacitor, wherein a plurality of electrolytic capacitors are connected in parallel to apply an aging voltage to each electrolytic capacitor to perform an aging process. A switch connected to one end of each electrolytic capacitor. Means, a means for opening the switch means in a state where an exciting current of a predetermined constant current or more flows in the electrolytic capacitor, and a holding means for holding the open state when the switch is once in the open state. An aging processing circuit for an electrolytic capacitor, comprising:
JP5158892A 1993-06-29 1993-06-29 Aging processing circuit for electrolytic capacitors Expired - Lifetime JP2731699B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5158892A JP2731699B2 (en) 1993-06-29 1993-06-29 Aging processing circuit for electrolytic capacitors

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5158892A JP2731699B2 (en) 1993-06-29 1993-06-29 Aging processing circuit for electrolytic capacitors

Publications (2)

Publication Number Publication Date
JPH0722299A true JPH0722299A (en) 1995-01-24
JP2731699B2 JP2731699B2 (en) 1998-03-25

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Family Applications (1)

Application Number Title Priority Date Filing Date
JP5158892A Expired - Lifetime JP2731699B2 (en) 1993-06-29 1993-06-29 Aging processing circuit for electrolytic capacitors

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Country Link
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Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56134738U (en) * 1980-03-12 1981-10-13
JPS58134420A (en) * 1982-02-05 1983-08-10 信英通信工業株式会社 Device for ageing electrolytic condenser
JPS6171616A (en) * 1984-09-14 1986-04-12 日立エーアイシー株式会社 Ageing device of condenser

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56134738U (en) * 1980-03-12 1981-10-13
JPS58134420A (en) * 1982-02-05 1983-08-10 信英通信工業株式会社 Device for ageing electrolytic condenser
JPS6171616A (en) * 1984-09-14 1986-04-12 日立エーアイシー株式会社 Ageing device of condenser

Also Published As

Publication number Publication date
JP2731699B2 (en) 1998-03-25

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