JPH07218541A - Circuit board inspection device - Google Patents

Abstract

PURPOSE:To provide a circuit board inspection device in which the reliance upon electric connections of a probe for signals and probe for shields is enhanced. CONSTITUTION:A circuit board inspection device is composed of a base board 3, probes 4, 5 for signals and shields, respectively, to be installed on the board 3, a conductive plate 6, and a conductive coil spring, wherein the probe 4 for signals has the first cylindrical portion 4a of conductive material and the first core part 4c installed thereon through an insulation part while the probe 5 for shields has the second cylindrical portion 5a of conductive material and the second core part 5c installed thereon in such a condition as energized in the axial direction. The conductive plate 6 generates electric continuity between the first cylindrical portion 4a and the second cylindrical portion 5a, while the coil spring generates electric continuity between the second cylindrical portion 5a and the second core part 5b.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a circuit board inspection device.

[0002]

2. Description of the Related Art Conventionally, as a circuit board inspection apparatus, for example, ones shown in FIGS. 5 and 6 have been provided. That is, this is the substrate 3, the signal probe 4 having the first tubular portion 4a and the first core portion 4c, the second tubular portion 5a and the second tubular portion 5a which operates in the axial direction in response to the stress. And a shield probe 5 having a core portion 5b. Here, the shield probe 5 sets the potential to 0V.

The signal probe 4 has a first core portion 4c connected to the inspection equipment body such as an oscilloscope via a signal copper wire 12, and the shield probe 5 has a second core portion 4b. Is connected to the first cylindrical portion 4a of the signal probe 4 via the first shielding copper electric wire 11a, and is further connected to the inspection device body via the second shielding copper electric wire 11b.

[0004]

However, in the above-described conventional circuit board inspecting apparatus, when the circuit board 1 is inspected, the second core portion 5b of the shield probe 5 moves in the axial direction according to the stress. Therefore, the connecting portion of the first cylindrical portion 4a and the first shielding copper electric wire 11a, the second core portion 5b and the first
Stress was applied to the connection part of the shielding copper electric wire 11a, and these connection parts were easily damaged.

The present invention has been made in view of the above circumstances, and an object of the present invention is to provide a circuit board inspection apparatus in which the reliability of electrical connection between a signal probe and a shield probe is improved. To do.

[0006]

In order to achieve the above object, a rechargeable electric device of the present invention comprises a substrate having a predetermined thickness, and a conductive first tubular portion provided on the substrate. And a signal probe having a first core portion provided on the first tubular portion via an insulating portion, and a conductive second tubular portion and a second tubular portion provided on the substrate. A shield probe having a second core portion that is provided in a state of being axially biased, and a first cylinder portion of the signal probe and a second cylinder portion of the shield probe are electrically connected to each other. A first conducting portion to
The shield probe has a second tube portion and a second conducting portion that electrically connects the second core portion.

[0007]

According to this structure, since the second conducting portion is interposed between the second tubular portion and the second core portion, even if the second core portion moves in the axial direction, The second tubular portion and the first tubular portion without affecting the connecting portion between the tubular portion and the first conducting portion and the connecting portion between the first tubular portion and the first conducting portion. The conduction state of can be guaranteed.

[0008]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT An embodiment of the present invention will be described with reference to FIGS.

This circuit board inspecting device is for inspecting the circuit board 1, and includes an inspecting device body (not shown) such as an oscilloscope, a cover 2, a board 3, and a signal probe.
4 and a shield probe 5.

The inspection equipment main body inputs signals from the signal probe 4 and the shield probe 5 to calculate a target inspection value and displays it on the display unit. Cover 2
Has a substantially rectangular shape and has an opening in the center of its upper surface, and the substrate 3 is attached to the opening.

The substrate 3 is made of an insulating material and has a predetermined thickness, and a conductive plate 6 such as a copper plate having conductivity on its upper surface.
(Corresponding to the first conducting portion of the first aspect) is provided. The substrate 3 and the conductive plate 6 have two through holes 7 and 8 penetrating in the thickness direction. The signal probe 4 is attached to one of the through holes 7 by solder 9 so that the outer peripheral surface thereof comes into contact. Further, the shield probe 5 is attached to the other through hole 8 with solder 10 so that the outer peripheral surface thereof comes into contact.

The signal probe 4 is for inputting a signal from the circuit board 1, and has a first cylindrical portion 4a having conductivity,
A first core portion provided on the first tubular portion 4a via an insulating portion 4b.
4c and. The end of the shielding copper electric wire 11 connected to the inspection device main body is connected to a predetermined position of the first tubular portion 4a, and the predetermined core core 4c is connected to the inspection device main body. The end of the signal copper wire 12 is connected.

The shield probe 5 is for setting the electric potential to 0 V, and has a second cylindrical portion 5a having conductivity and an axial direction so that the second cylindrical portion 5a operates within a predetermined range. A second core portion 5b provided in a biased state and a second core portion
Conductive coil spring 5c for urging 5b toward the second tubular portion 5a
(Corresponding to the second conducting portion of the first aspect). Therefore, the second core 5b is a coil spring.
The second cylinder portion 5a is electrically connected to the first cylinder portion 4a via the conductive plate 6, and the second cylinder portion 5a is electrically connected to the first cylinder portion 4a via the conductive plate 6.

Next, the operation of the circuit board inspection device will be described. The circuit board 1 sent mechanically has its contact points.
The first core portion 4c of the signal probe 4 comes into contact with 1a, and the second core portion 5b of the shield probe 5 comes into contact with another contact 1b. At this time, the second core portion 5b operates in the axial direction by the pressing force of the contact point 1b, and stops at a position where the pressing force of the contact point 1b and the biasing force of the coil spring 5c are balanced.

By the way, in this embodiment, since the coil spring 5c is interposed between the second tubular portion 5a and the second core portion 5b, even if the second core portion 5b moves in the axial direction, It does not affect the portion where the second tubular portion 5a and the conductive plate 6 are soldered 10 and the portion where the first tubular portion 4a and the conductive plate 6 are soldered 9. Therefore, in the present embodiment, since the conduction state of the second tubular portion 5a and the first tubular portion 4a can be guaranteed, the signal probe 4
Also, the electrical connection of the shield probe 5 is high.

In the present embodiment, the first conductive portion is used as the conductive plate 6 and is provided on the substrate 3. However, the present invention is not limited to this, and for example, the first conductive portion may be used. Part is applied as a conductive paint to the board 3, or the first conductive part is provided as a solder on the board 3, or the conductive board 3 is used to make the board 3 function as the first conductive part. You may make it double.

Further, in the present embodiment, the second conducting portion is the coil spring 5c, but the present invention is not limited to this. For example, the second tubular portion 5a and the second You may make it provide the contact part which can contact each other in the core part 5b.

[0018]

According to the circuit board inspection apparatus of the present invention, since the second conducting portion is interposed between the second tubular portion and the second core portion,
Even if the second core portion moves in the axial direction, the second tubular portion and the first
It is possible to guarantee the conduction state of the second tubular portion and the first tubular portion without affecting the connecting portion of the second tubular portion and the connecting portion of the first tubular portion and the connecting portion of the first tubular portion and the first tubular portion. As a result, the reliability of the electrical connection between the signal probe and the shield probe can be improved.

[Brief description of drawings]

FIG. 1 is a partial side view of an embodiment of the present invention.

FIG. 2 is a sectional view thereof.

FIG. 3 is an exploded perspective view of a main part thereof.

FIG. 4 is a perspective view thereof.

FIG. 5 is a partial side view of a conventional example.

FIG. 6 is a perspective view showing an electrical connection state of the signal probe and the shield probe.

[Explanation of symbols]

 3 substrate 4 signal probe 4a first tubular portion 4b insulating portion 4c first core portion 5 shield probe 5a second tubular portion 5b second core portion 5c coil spring 6 conductive plate

Claims (1)

[Claims] 1. A substrate having a predetermined thickness, a conductive first tubular portion provided on the substrate, and a first core portion provided in the first tubular portion via an insulating portion. And a second conductive probe that is provided on the substrate and has a signal
Of a shield probe having a second core portion provided in a state of being urged to the second cylinder portion in the axial direction, and a first cylinder portion of the signal probe and the shield probe. Second
A circuit board inspection device comprising: a first conducting portion that conducts with the tubular portion of the second conducting portion; and a second conducting portion that conducts between the second tubular portion of the shield probe and the second core portion.