JPH07202583A - Cmos protection circuit - Google Patents
Cmos protection circuitInfo
- Publication number
- JPH07202583A JPH07202583A JP5334268A JP33426893A JPH07202583A JP H07202583 A JPH07202583 A JP H07202583A JP 5334268 A JP5334268 A JP 5334268A JP 33426893 A JP33426893 A JP 33426893A JP H07202583 A JPH07202583 A JP H07202583A
- Authority
- JP
- Japan
- Prior art keywords
- power supply
- cmos
- protection circuit
- input terminal
- mos transistor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は半導体集積回路に関し、
特にCMOS保護回路に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor integrated circuit,
In particular, it relates to a CMOS protection circuit.
【0002】[0002]
【従来の技術】従来のCMOS保護回路は、図2のよう
に電源側の保護回路としてPch MOSトランジスタ
3のゲートとソースを接続し、ソースを電源に接続かつ
ドレインを入力端子に接続したものである。ところが近
年のように複数の電源電圧を混在させた状態でCMOS
LSIが使用される環境では、入力端子に電源電圧よ
りも高い電位の入力波形が入力された場合、Pch M
OSトランジスタ3に定常的に電流が流れてしまい消費
電力が大きくなるので、CMOS回路の特徴を損なって
しまう。2. Description of the Related Art As shown in FIG. 2, a conventional CMOS protection circuit is a power supply side protection circuit in which a gate and a source of a Pch MOS transistor 3 are connected, a source is connected to a power supply and a drain is connected to an input terminal. is there. However, as in recent years, CMOS is used with a plurality of power supply voltages mixed.
In the environment where LSI is used, when an input waveform with a potential higher than the power supply voltage is input to the input terminal, Pch M
Since a current constantly flows through the OS transistor 3 and power consumption increases, the characteristics of the CMOS circuit are impaired.
【0003】また、図3の回路ではPch MOSトラ
ンジスタ3を保護回路から削除したために、定常的な電
流が流れないような構造になっているが、そのため、電
源側に保護回路がなくなり静電破壊に対して弱くなって
いる。Further, in the circuit of FIG. 3, since the Pch MOS transistor 3 is removed from the protection circuit, the structure is such that a steady current does not flow. Therefore, there is no protection circuit on the power supply side and electrostatic breakdown occurs. Is weak against.
【0004】[0004]
【発明が解決しようとする課題】図2の回路では複数の
電源電圧が混在した環境でCMOS LSIを使用する
場合、入力電圧が電源電圧よりも高い場合、Pch M
OSトランジスタ3に定常的な電流が流れてしまうので
低消費電力というCMOS回路の特徴を損なってしまう
という問題があった。また、図3の回路では対電源側の
保護回路が存在しないために、静電破壊に弱いという問
題点がある。In the circuit of FIG. 2, when a CMOS LSI is used in an environment in which a plurality of power supply voltages are mixed, when the input voltage is higher than the power supply voltage, Pch M
Since a constant current flows through the OS transistor 3, there is a problem that the characteristic of the CMOS circuit, which is low power consumption, is lost. Further, the circuit of FIG. 3 has a problem that it is vulnerable to electrostatic breakdown because there is no protection circuit on the power supply side.
【0005】[0005]
【課題を解決するための手段】上述の問題を解決するた
めゲートとドレインを接続し、かつソースを電源に接続
したNch MOSトランジスタのドレインを入力端子
に接続してCMOS保護回路とする。In order to solve the above problems, a gate and a drain are connected, and a drain of an Nch MOS transistor whose source is connected to a power supply is connected to an input terminal to form a CMOS protection circuit.
【0006】[0006]
【実施例】図1は本発明の実施例である。保護回路用の
トランジスタとして、ゲート、ドレインが入力端にソー
スが電源に接続したNch MOSトランジスタ5を設
けている。図2と比較すると、例えば電源電圧3VのC
MOS LSIに対して5Vの入力波形が入力された場
合でも、入力端子側から電源側へ定常的な電流が流れな
い構造になっている。また図3と比較した場合、Nch
MOSトランジスタ5の効果により入力容量成分が増
加するので静電破壊電圧の波高値が減少し、かつ入力端
子から電源側への電流パスも存在するので静電破壊に対
する耐圧が向上する。FIG. 1 shows an embodiment of the present invention. As a transistor for the protection circuit, an Nch MOS transistor 5 having a gate and a drain at input ends and a source connected to a power supply is provided. Compared with FIG. 2, for example, C with a power supply voltage of 3V
Even if a 5V input waveform is input to the MOS LSI, a steady current does not flow from the input terminal side to the power supply side. When compared with FIG. 3, Nch
Since the input capacitance component increases due to the effect of the MOS transistor 5, the peak value of the electrostatic breakdown voltage decreases, and the current path from the input terminal to the power supply side also exists, so that the breakdown voltage against electrostatic breakdown improves.
【0007】[0007]
【発明の効果】以上説明したように、本発明は複数電圧
電源混在の環境に対応したCMOS保護回路であり、C
MOS回路の特徴を損なわずに静電破壊の耐圧向上に効
果がある。As described above, the present invention is a CMOS protection circuit compatible with an environment in which a plurality of voltage power supplies coexist.
This is effective in improving the breakdown voltage against electrostatic breakdown without impairing the characteristics of the MOS circuit.
【図1】本発明の実施例を示す図。FIG. 1 is a diagram showing an embodiment of the present invention.
【図2】従来の単一電源環境でのCMOS保護回路を示
す図。FIG. 2 is a diagram showing a conventional CMOS protection circuit in a single power supply environment.
【図3】複数電源混在環境に対応した従来のCMOS保
護回路を示す図。FIG. 3 is a diagram showing a conventional CMOS protection circuit compatible with a mixed power supply environment.
1 Pch MOSトランジスタ 2 Nch MOSトランジスタ 3 Pch MOSトランジスタ 4 Nch MOSトランジスタ 5 Nch MOSトランジスタ 1 Pch MOS transistor 2 Nch MOS transistor 3 Pch MOS transistor 4 Nch MOS transistor 5 Nch MOS transistor
Claims (2)
端子に接続し、ソースを電源に接続するNch MOS
トランジスタがCMOS回路の入力バッファとして設け
られたことを特徴とするCMOS保護回路。1. An Nch MOS having a gate and a drain connected to an input terminal of a CMOS circuit and a source connected to a power supply.
A CMOS protection circuit in which a transistor is provided as an input buffer of a CMOS circuit.
設けたことを特徴とする請求項1記載のCMOS保護回
路。2. The CMOS protection circuit according to claim 1, wherein the input terminal is provided with a protection circuit on the ground power supply side.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5334268A JPH07202583A (en) | 1993-12-28 | 1993-12-28 | Cmos protection circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5334268A JPH07202583A (en) | 1993-12-28 | 1993-12-28 | Cmos protection circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH07202583A true JPH07202583A (en) | 1995-08-04 |
Family
ID=18275445
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5334268A Pending JPH07202583A (en) | 1993-12-28 | 1993-12-28 | Cmos protection circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH07202583A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6665159B2 (en) | 2000-02-21 | 2003-12-16 | Hitachi, Ltd. | Semiconductor integrated circuit device |
US6999290B1 (en) | 1999-04-28 | 2006-02-14 | Hitachi, Ltd. | Integrated circuit with protection against electrostatic damage |
JP2015002497A (en) * | 2013-06-18 | 2015-01-05 | セイコーエプソン株式会社 | Electrostatic protection circuit, electro-optical device and electronic apparatus |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS52127149A (en) * | 1976-04-19 | 1977-10-25 | Toshiba Corp | Semiconductor circuit |
JPH02244817A (en) * | 1989-03-17 | 1990-09-28 | Hitachi Ltd | Semiconductor integrated circuit |
JPH03102912A (en) * | 1989-09-18 | 1991-04-30 | Fujitsu Ltd | Static electricity protecting circuit |
-
1993
- 1993-12-28 JP JP5334268A patent/JPH07202583A/en active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS52127149A (en) * | 1976-04-19 | 1977-10-25 | Toshiba Corp | Semiconductor circuit |
JPH02244817A (en) * | 1989-03-17 | 1990-09-28 | Hitachi Ltd | Semiconductor integrated circuit |
JPH03102912A (en) * | 1989-09-18 | 1991-04-30 | Fujitsu Ltd | Static electricity protecting circuit |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6999290B1 (en) | 1999-04-28 | 2006-02-14 | Hitachi, Ltd. | Integrated circuit with protection against electrostatic damage |
US7420790B2 (en) | 1999-04-28 | 2008-09-02 | Renesas Technology Corporation | Integrated circuit with protection against electrostatic damage |
US6665159B2 (en) | 2000-02-21 | 2003-12-16 | Hitachi, Ltd. | Semiconductor integrated circuit device |
US7035069B2 (en) | 2000-02-21 | 2006-04-25 | Renesas Technology Corp. | Semiconductor integrated circuit device |
US7298600B2 (en) | 2000-02-21 | 2007-11-20 | Renesas Technology Corp. | Semiconductor integrated circuit device |
US7414821B2 (en) | 2000-02-21 | 2008-08-19 | Renesas Technology Corp. | Semiconductor integrated circuit device |
JP2015002497A (en) * | 2013-06-18 | 2015-01-05 | セイコーエプソン株式会社 | Electrostatic protection circuit, electro-optical device and electronic apparatus |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 19971209 |