JPH07202583A - Cmos protection circuit - Google Patents

Cmos protection circuit

Info

Publication number
JPH07202583A
JPH07202583A JP5334268A JP33426893A JPH07202583A JP H07202583 A JPH07202583 A JP H07202583A JP 5334268 A JP5334268 A JP 5334268A JP 33426893 A JP33426893 A JP 33426893A JP H07202583 A JPH07202583 A JP H07202583A
Authority
JP
Japan
Prior art keywords
power supply
cmos
protection circuit
input terminal
mos transistor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5334268A
Other languages
Japanese (ja)
Inventor
Kenji Hirose
憲司 廣瀬
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP5334268A priority Critical patent/JPH07202583A/en
Publication of JPH07202583A publication Critical patent/JPH07202583A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To provide the CMOS protection circuit corresponding to the CMOS circuit according to the mixing of plural power voltages. CONSTITUTION:A Nch MOS transistor 5 whose drain and gate are connected to the input terminal and whose source is connected to the power supply is provided as a transistor for protection circuit. For example, even when input waveform with 5V is inputted for the CMOS LSI of the power supply voltage 3V, no constant current flows from the input terminal to the power supply. The input capacity component is increased by the effect of the Nch MOS transistor 5, the wave height value of the static destruction voltage is reduced. There is a current path from the input terminal to the power supply, and the breakdown strength for the static destruction is improved.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は半導体集積回路に関し、
特にCMOS保護回路に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor integrated circuit,
In particular, it relates to a CMOS protection circuit.

【0002】[0002]

【従来の技術】従来のCMOS保護回路は、図2のよう
に電源側の保護回路としてPch MOSトランジスタ
3のゲートとソースを接続し、ソースを電源に接続かつ
ドレインを入力端子に接続したものである。ところが近
年のように複数の電源電圧を混在させた状態でCMOS
LSIが使用される環境では、入力端子に電源電圧よ
りも高い電位の入力波形が入力された場合、Pch M
OSトランジスタ3に定常的に電流が流れてしまい消費
電力が大きくなるので、CMOS回路の特徴を損なって
しまう。
2. Description of the Related Art As shown in FIG. 2, a conventional CMOS protection circuit is a power supply side protection circuit in which a gate and a source of a Pch MOS transistor 3 are connected, a source is connected to a power supply and a drain is connected to an input terminal. is there. However, as in recent years, CMOS is used with a plurality of power supply voltages mixed.
In the environment where LSI is used, when an input waveform with a potential higher than the power supply voltage is input to the input terminal, Pch M
Since a current constantly flows through the OS transistor 3 and power consumption increases, the characteristics of the CMOS circuit are impaired.

【0003】また、図3の回路ではPch MOSトラ
ンジスタ3を保護回路から削除したために、定常的な電
流が流れないような構造になっているが、そのため、電
源側に保護回路がなくなり静電破壊に対して弱くなって
いる。
Further, in the circuit of FIG. 3, since the Pch MOS transistor 3 is removed from the protection circuit, the structure is such that a steady current does not flow. Therefore, there is no protection circuit on the power supply side and electrostatic breakdown occurs. Is weak against.

【0004】[0004]

【発明が解決しようとする課題】図2の回路では複数の
電源電圧が混在した環境でCMOS LSIを使用する
場合、入力電圧が電源電圧よりも高い場合、Pch M
OSトランジスタ3に定常的な電流が流れてしまうので
低消費電力というCMOS回路の特徴を損なってしまう
という問題があった。また、図3の回路では対電源側の
保護回路が存在しないために、静電破壊に弱いという問
題点がある。
In the circuit of FIG. 2, when a CMOS LSI is used in an environment in which a plurality of power supply voltages are mixed, when the input voltage is higher than the power supply voltage, Pch M
Since a constant current flows through the OS transistor 3, there is a problem that the characteristic of the CMOS circuit, which is low power consumption, is lost. Further, the circuit of FIG. 3 has a problem that it is vulnerable to electrostatic breakdown because there is no protection circuit on the power supply side.

【0005】[0005]

【課題を解決するための手段】上述の問題を解決するた
めゲートとドレインを接続し、かつソースを電源に接続
したNch MOSトランジスタのドレインを入力端子
に接続してCMOS保護回路とする。
In order to solve the above problems, a gate and a drain are connected, and a drain of an Nch MOS transistor whose source is connected to a power supply is connected to an input terminal to form a CMOS protection circuit.

【0006】[0006]

【実施例】図1は本発明の実施例である。保護回路用の
トランジスタとして、ゲート、ドレインが入力端にソー
スが電源に接続したNch MOSトランジスタ5を設
けている。図2と比較すると、例えば電源電圧3VのC
MOS LSIに対して5Vの入力波形が入力された場
合でも、入力端子側から電源側へ定常的な電流が流れな
い構造になっている。また図3と比較した場合、Nch
MOSトランジスタ5の効果により入力容量成分が増
加するので静電破壊電圧の波高値が減少し、かつ入力端
子から電源側への電流パスも存在するので静電破壊に対
する耐圧が向上する。
FIG. 1 shows an embodiment of the present invention. As a transistor for the protection circuit, an Nch MOS transistor 5 having a gate and a drain at input ends and a source connected to a power supply is provided. Compared with FIG. 2, for example, C with a power supply voltage of 3V
Even if a 5V input waveform is input to the MOS LSI, a steady current does not flow from the input terminal side to the power supply side. When compared with FIG. 3, Nch
Since the input capacitance component increases due to the effect of the MOS transistor 5, the peak value of the electrostatic breakdown voltage decreases, and the current path from the input terminal to the power supply side also exists, so that the breakdown voltage against electrostatic breakdown improves.

【0007】[0007]

【発明の効果】以上説明したように、本発明は複数電圧
電源混在の環境に対応したCMOS保護回路であり、C
MOS回路の特徴を損なわずに静電破壊の耐圧向上に効
果がある。
As described above, the present invention is a CMOS protection circuit compatible with an environment in which a plurality of voltage power supplies coexist.
This is effective in improving the breakdown voltage against electrostatic breakdown without impairing the characteristics of the MOS circuit.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の実施例を示す図。FIG. 1 is a diagram showing an embodiment of the present invention.

【図2】従来の単一電源環境でのCMOS保護回路を示
す図。
FIG. 2 is a diagram showing a conventional CMOS protection circuit in a single power supply environment.

【図3】複数電源混在環境に対応した従来のCMOS保
護回路を示す図。
FIG. 3 is a diagram showing a conventional CMOS protection circuit compatible with a mixed power supply environment.

【符号の説明】[Explanation of symbols]

1 Pch MOSトランジスタ 2 Nch MOSトランジスタ 3 Pch MOSトランジスタ 4 Nch MOSトランジスタ 5 Nch MOSトランジスタ 1 Pch MOS transistor 2 Nch MOS transistor 3 Pch MOS transistor 4 Nch MOS transistor 5 Nch MOS transistor

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 ゲートとドレインがCMOS回路の入力
端子に接続し、ソースを電源に接続するNch MOS
トランジスタがCMOS回路の入力バッファとして設け
られたことを特徴とするCMOS保護回路。
1. An Nch MOS having a gate and a drain connected to an input terminal of a CMOS circuit and a source connected to a power supply.
A CMOS protection circuit in which a transistor is provided as an input buffer of a CMOS circuit.
【請求項2】 前記入力端子に接地電源側の保護回路を
設けたことを特徴とする請求項1記載のCMOS保護回
路。
2. The CMOS protection circuit according to claim 1, wherein the input terminal is provided with a protection circuit on the ground power supply side.
JP5334268A 1993-12-28 1993-12-28 Cmos protection circuit Pending JPH07202583A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5334268A JPH07202583A (en) 1993-12-28 1993-12-28 Cmos protection circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5334268A JPH07202583A (en) 1993-12-28 1993-12-28 Cmos protection circuit

Publications (1)

Publication Number Publication Date
JPH07202583A true JPH07202583A (en) 1995-08-04

Family

ID=18275445

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5334268A Pending JPH07202583A (en) 1993-12-28 1993-12-28 Cmos protection circuit

Country Status (1)

Country Link
JP (1) JPH07202583A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6665159B2 (en) 2000-02-21 2003-12-16 Hitachi, Ltd. Semiconductor integrated circuit device
US6999290B1 (en) 1999-04-28 2006-02-14 Hitachi, Ltd. Integrated circuit with protection against electrostatic damage
JP2015002497A (en) * 2013-06-18 2015-01-05 セイコーエプソン株式会社 Electrostatic protection circuit, electro-optical device and electronic apparatus

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52127149A (en) * 1976-04-19 1977-10-25 Toshiba Corp Semiconductor circuit
JPH02244817A (en) * 1989-03-17 1990-09-28 Hitachi Ltd Semiconductor integrated circuit
JPH03102912A (en) * 1989-09-18 1991-04-30 Fujitsu Ltd Static electricity protecting circuit

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52127149A (en) * 1976-04-19 1977-10-25 Toshiba Corp Semiconductor circuit
JPH02244817A (en) * 1989-03-17 1990-09-28 Hitachi Ltd Semiconductor integrated circuit
JPH03102912A (en) * 1989-09-18 1991-04-30 Fujitsu Ltd Static electricity protecting circuit

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6999290B1 (en) 1999-04-28 2006-02-14 Hitachi, Ltd. Integrated circuit with protection against electrostatic damage
US7420790B2 (en) 1999-04-28 2008-09-02 Renesas Technology Corporation Integrated circuit with protection against electrostatic damage
US6665159B2 (en) 2000-02-21 2003-12-16 Hitachi, Ltd. Semiconductor integrated circuit device
US7035069B2 (en) 2000-02-21 2006-04-25 Renesas Technology Corp. Semiconductor integrated circuit device
US7298600B2 (en) 2000-02-21 2007-11-20 Renesas Technology Corp. Semiconductor integrated circuit device
US7414821B2 (en) 2000-02-21 2008-08-19 Renesas Technology Corp. Semiconductor integrated circuit device
JP2015002497A (en) * 2013-06-18 2015-01-05 セイコーエプソン株式会社 Electrostatic protection circuit, electro-optical device and electronic apparatus

Similar Documents

Publication Publication Date Title
US9337651B2 (en) Electrostatic discharge protection circuit
US6400546B1 (en) I/O pad voltage protection circuit and method
US20050270074A1 (en) Power-gating system and method for integrated circuit devices
JPS6238617A (en) Output circuit device
US7554361B2 (en) Level shifter and method thereof
US20060268478A1 (en) Methods and Apparatus for Electrostatic Discharge Protection in a Semiconductor Circuit
US5495185A (en) CMOS level conversion circuit with input protection
US4990847A (en) Microcomputer
US6424510B1 (en) ESD structure for IC with over-voltage capability at pad in steady-state
JPH09186247A (en) Static discharge and latch-up preventive circuit
KR0166509B1 (en) Electrostatic protection circuit
US5905621A (en) Voltage scaling circuit for protecting an input node to a protected circuit
JPH07202583A (en) Cmos protection circuit
JP2806532B2 (en) Semiconductor integrated circuit device
KR102101537B1 (en) Tie-High/Tie-Low Circuit
JPH0228362A (en) Semiconductor integrated circuit device
JPH10215166A (en) Semiconductor circuit for high output voltage generation
JP2004222119A (en) Semiconductor integrated circuit
JP3499578B2 (en) Semiconductor integrated circuit
JPH01195719A (en) Semiconductor integrated circuit
JPH09121453A (en) Static discharge protective circuit that does not depend on electric power sequence
JP2970826B2 (en) Protection circuit built-in IC and display device driving IC
US20040075468A1 (en) Digital signal driver circuit
JP2752680B2 (en) Overvoltage absorption circuit of semiconductor integrated circuit device
KR100593070B1 (en) Level shift circuit of smart power ic

Legal Events

Date Code Title Description
A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 19971209