JPH07202390A - Construction of bump - Google Patents
Construction of bumpInfo
- Publication number
- JPH07202390A JPH07202390A JP33499693A JP33499693A JPH07202390A JP H07202390 A JPH07202390 A JP H07202390A JP 33499693 A JP33499693 A JP 33499693A JP 33499693 A JP33499693 A JP 33499693A JP H07202390 A JPH07202390 A JP H07202390A
- Authority
- JP
- Japan
- Prior art keywords
- electrode
- electrodes
- spherical
- spherical contact
- counterpart
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/325—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by abutting or pinching, i.e. without alloying process; mechanical auxiliary parts therefor
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/40—Forming printed elements for providing electric connections to or between printed circuits
- H05K3/4007—Surface contacts, e.g. bumps
Landscapes
- Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
- Wire Bonding (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】この発明は電極に球状接点が形成
されてなるバンプ構造に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a bump structure in which spherical contacts are formed on electrodes.
【0002】[0002]
【従来の技術】例えばプリント基板などの基板上に形成
された複数の電極を、それと対応して他のプリント基板
や端子板あるいはコネクタなどに形成されている複数の
電極と対接させて接続する場合、各電極間の良好な接触
状態を得るべく、基板上の各電極にそれぞれ球状接点を
形成することが従来行われている。2. Description of the Related Art For example, a plurality of electrodes formed on a substrate such as a printed circuit board are contacted with a plurality of electrodes formed on another printed circuit board, a terminal board, a connector or the like so as to be connected thereto. In this case, in order to obtain a good contact state between the electrodes, it has been conventionally practiced to form a spherical contact on each electrode on the substrate.
【0003】図3はこの種の球状接点が電極に形成され
た従来のバンプ構造の一例を示したものである。基板1
1の一面上には複数の電極12が配列形成されており、
それら電極12の相手方電極と接続される部分(この例
では基板11の一端に近接する部分)にそれぞれ球状接
点13が突出形成されている。球状接点13は例えば電
極12と同一材料を用いてそれと一体に形成される。FIG. 3 shows an example of a conventional bump structure in which this type of spherical contact is formed on an electrode. Board 1
A plurality of electrodes 12 are arrayed on one surface of 1.
Spherical contacts 13 are formed so as to project at the portions of these electrodes 12 that are connected to the counterpart electrodes (in this example, the portions that are close to one end of the substrate 11). The spherical contact 13 is made of the same material as the electrode 12, for example, and is formed integrally therewith.
【0004】このように球状接点13が各電極12に形
成されていると、これら電極12に相手方電極を対接さ
せて加圧した際に、その加圧力が球状接点13に集中
し、大きな接触圧が得られると共に、例えば球状接点1
3の頂部が加圧力によってつぶれることにより、電極形
成面のそりやうねりあるいは各球状接点13の高さのば
らつきを球状接点13の変形によって吸収することがで
き、多数の電極12の一括接続を良好に行うことができ
る。When the spherical contacts 13 are formed on each electrode 12 as described above, when the opposing electrodes are pressed against the electrodes 12 and the pressure is applied, the applied pressure is concentrated on the spherical contacts 13 and a large contact is made. When pressure is obtained, for example spherical contact 1
When the top of 3 is crushed by the pressing force, it is possible to absorb the warp or waviness of the electrode forming surface or the variation in the height of each spherical contact 13 by the deformation of the spherical contact 13, and the collective connection of a large number of electrodes 12 is good. Can be done.
【0005】[0005]
【発明が解決しようとする課題】以上述べたように、従
来のバンプ構造はその球状接点を加圧によって変形させ
ることにより、複数の電極の良好な一括接続を可能とす
るものであり、例えば高さの高い球状接点は大きく変形
する恐れがあるものとなっていた。球状接点を有する複
数の電極と相手方の複数の電極とを接続した後、脱着さ
せることなく、その状態を維持し、つまり永久接続する
場合には球状接点に変形が発生していても何ら問題は生
じないが、例えば相手方電極が形成されているプリント
基板等を他のものと交換する場合のように、脱着後、球
状接点が形成されている複数の電極を前と異なる複数の
電極と互いに接続させる必要がある場合には、既に変形
をきたした球状接点では良好な接続状態を得ることがで
きず、即ち従来のバンプ構造は基本的に再使用できない
ものとなっていた。As described above, the conventional bump structure enables good collective connection of a plurality of electrodes by deforming the spherical contacts by applying pressure. The spherical contact having a high height is likely to be greatly deformed. After connecting multiple electrodes with spherical contacts and multiple electrodes of the other party, maintain that state without desorption, that is, in the case of permanent connection, there is no problem even if the spherical contacts are deformed. Although it does not occur, connect multiple electrodes with spherical contacts to each other after detachment, such as when replacing a printed circuit board or the like on which the other electrode is formed with another one. If it is necessary, a good contact state cannot be obtained with the already deformed spherical contact, that is, the conventional bump structure is basically not reusable.
【0006】この発明の目的は従来の欠点を除去し、脱
着後の再使用が可能なバンプ構造を提供することにあ
る。An object of the present invention is to eliminate the drawbacks of the prior art and to provide a bump structure which can be reused after attachment / detachment.
【0007】[0007]
【課題を解決するための手段】この発明はほぼ同一面上
に複数の電極が設けられ、その各電極にそれぞれ球状接
点が形成されたバンプ構造において、各電極に凹部を形
成し、その各凹部内に、一端が電極と連結された金属材
の支持片を電極面とほぼ平行に設け、その支持片上にそ
れぞれ上記球状接点を突出形成したものである。According to the present invention, in a bump structure in which a plurality of electrodes are provided on substantially the same surface and a spherical contact is formed on each electrode, a recess is formed in each electrode and each recess is formed. A support piece made of a metal material, one end of which is connected to the electrode, is provided substantially parallel to the electrode surface, and the spherical contacts are formed on the support piece in a protruding manner.
【0008】[0008]
【作用】上記のように構成されたこの発明では、支持片
がたわむことによって球状接点は可動自在とされ、よっ
て球状接点に変形は発生しない。In the present invention constructed as described above, the spherical contact is made movable by the bending of the support piece, so that the spherical contact is not deformed.
【0009】[0009]
【実施例】この発明の一実施例を図1を参照して説明す
る。基板11の一面上に配列形成された複数の電極12
の、相手方電極と接続される部分にそれぞれ円形状の凹
部21が形成される。この例では各凹部21は基板11
の一端面11aの近くに、一端面11aに沿って配列形
成されている。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT An embodiment of the present invention will be described with reference to FIG. A plurality of electrodes 12 arrayed on one surface of the substrate 11
A circular concave portion 21 is formed in each of the portions connected to the counter electrode. In this example, each recess 21 is formed on the substrate 11
Are arranged near the one end surface 11a along the one end surface 11a.
【0010】各凹部21内に、その凹部21の周囲の電
極12に一端が連結された支持片22が、その板面22
aが電極面12aとほぼ平行とされて設けられる。支持
片22は例えばCuなどの金属材料よりなり、この例で
は凹部21の、基板11の一端面11aと反対側におい
て電極12に連結されている。各支持片22の他端側は
例えば円形状とされて拡大されており、支持片22のこ
の円形部23上にそれぞれ球状接点24が突出形成され
る。従って、各球状接点24はそれぞれ凹部21上に、
支持片22に支持された状態で配置される。Within each recess 21, a support piece 22 having one end connected to the electrode 12 around the recess 21 is provided with a plate surface 22.
a is provided substantially parallel to the electrode surface 12a. The support piece 22 is made of a metal material such as Cu, and in this example, is connected to the electrode 12 on the side of the recess 21 opposite to the one end surface 11a of the substrate 11. The other end of each support piece 22 is enlarged, for example, in a circular shape, and spherical contacts 24 are formed on the circular portion 23 of the support piece 22 so as to project therefrom. Therefore, each spherical contact point 24 is formed on the concave portion 21,
It is arranged in a state of being supported by the support piece 22.
【0011】次に、上記のような構成を有するバンプ構
造の形成方法の一例を図2を参照して工程順に説明す
る。なお、図2は複数の電極のうちの1箇所について示
したものである。基板11上に電極12−1を形成し
(A)、その電極12−1を例えばエッチングして凹部
21を形成する(B)。凹部21内に電極12−1と異
なる金属あるいは樹脂よりなる充填材25を充填し
(C)、電極12−1及び充填材25上に電極12−2
を形成する(D)。電極12−2の、後に支持片22の
輪郭線と凹部21の輪郭線とによって囲まれるC字状領
域26(図1A参照)をエッチング除去し(E)、その
C字状領域26に囲まれた電極12−2上に球状接点2
4を形成する(F)。そして、空孔となっているC字状
領域26を通して充填材25をエッチング除去する
(G)。このようにして、球状接点24が支持片22に
支持されたバンプ構造が完成する。Next, an example of a method of forming a bump structure having the above-mentioned structure will be described in the order of steps with reference to FIG. Note that FIG. 2 shows one of the plurality of electrodes. The electrode 12-1 is formed on the substrate 11 (A), and the electrode 12-1 is etched, for example, to form the recess 21 (B). A filling material 25 made of a metal or a resin different from that of the electrode 12-1 is filled in the recess 21 (C), and the electrode 12-2 is placed on the electrode 12-1 and the filling material 25.
Are formed (D). The C-shaped region 26 (see FIG. 1A) of the electrode 12-2, which is surrounded by the contour line of the support piece 22 and the contour line of the recess 21 later, is removed by etching (E), and is surrounded by the C-shaped region 26. Spherical contact 2 on the electrode 12-2
4 is formed (F). Then, the filler 25 is removed by etching through the C-shaped region 26 which is a hole (G). Thus, the bump structure in which the spherical contact 24 is supported by the support piece 22 is completed.
【0012】この例では、電極12は電極12−1と1
2−2との積層によって構成され、また電極12−2の
一部が支持片22を構成するものとなっている。なお、
電極12−1,12−2及び球状接点24は例えばCu
などを用い、同一材で形成してもよいし、あるいは異な
る材料を用いてもよい。この発明によるバンプ構造にお
いては、球状接点24が相手方電極と対接されて加圧さ
れると、その加圧力によって、その球状接点24を支持
する支持片22がたわみ、球状接点24は変形すること
なく、凹部21側に変位する。各球状接点24はこのよ
うに各別に可動自在とされているため、これら球状接点
24に相手方の電極を一括して対接させた場合、例えば
各球状接点24の高さにばらつきがあっても、各球状接
点24がそれぞれその高さに応じて変位することによっ
て、全ての球状接点24が相手方電極と接触する状態と
なる。そして、支持片22の弾性復元力によって各球状
接点24は相手方電極に弾接され、良好に接続される。In this example, electrode 12 comprises electrodes 12-1 and 1
2-2, and a part of the electrode 12-2 constitutes the support piece 22. In addition,
The electrodes 12-1, 12-2 and the spherical contact 24 are made of Cu, for example.
Etc., the same material may be used, or different materials may be used. In the bump structure according to the present invention, when the spherical contact 24 is brought into contact with the opposite electrode and is pressed, the supporting piece 22 supporting the spherical contact 24 is bent by the applied pressure, and the spherical contact 24 is deformed. Instead, it is displaced toward the recess 21 side. Since each spherical contact point 24 is individually movable in this way, when the opposing electrodes are collectively brought into contact with these spherical contact points 24, for example, even if the height of each spherical contact point 24 varies. By displacing each spherical contact point 24 in accordance with its height, all the spherical contact points 24 are brought into contact with the counterpart electrodes. Then, due to the elastic restoring force of the support piece 22, each spherical contact point 24 is elastically contacted with the counter electrode and is well connected.
【0013】[0013]
【発明の効果】以上説明したように、この発明は各球状
接点をそれぞれ支持片により支持し、その支持片のたわ
みを利用してそれら球状接点が形成されている複数の電
極と相手方電極との一括接続を良好に行えるようにした
ものであって、球状接点自体に変形は発生せず、また支
持片は相手方電極による加圧が解除されれば弾性復帰す
るものとなっている。As described above, according to the present invention, each spherical contact point is supported by a supporting piece, and the deflection of the supporting piece is used to form a plurality of electrodes having the spherical contact point and a counter electrode. This is for making a good batch connection, and the spherical contact itself is not deformed, and the supporting piece is elastically restored when the pressure applied by the counter electrode is released.
【0014】従って、一旦接続後、相手方電極を脱着し
て他の電極と再接続する場合においても、接続品質は何
ら低下しないため、再使用することができ、極めて有益
なバンプ構造を提供することができる。Therefore, even if the opposite electrode is detached and then re-connected to another electrode after the connection, the connection quality is not deteriorated at all, so that the bump structure can be reused and an extremely useful bump structure is provided. You can
【図1】Aはこの発明によるバンプ構造の一実施例を示
す平面図、BはそのCC断面拡大図。1A is a plan view showing an embodiment of a bump structure according to the present invention, and B is an enlarged view of a CC cross section thereof.
【図2】この発明によるバンプ構造の形成方法の一例を
説明するための図。FIG. 2 is a diagram for explaining an example of a bump structure forming method according to the present invention.
【図3】Aは従来のバンプ構造を示す平面図、Bはその
CC断面拡大図。FIG. 3A is a plan view showing a conventional bump structure, and B is an enlarged view of a CC cross section thereof.
11 基板 12 電極 21 凹部 22 支持片 24 球状接点 11 substrate 12 electrode 21 concave portion 22 supporting piece 24 spherical contact
Claims (1)
その各電極にそれぞれ球状接点が形成されたバンプ構造
において、 上記各電極に凹部が形成され、 その各凹部内に、一端が上記電極と連結された金属材の
支持片が上記電極面とほぼ平行とされて設けられ、 その支持片上にそれぞれ上記球状接点が突出形成されて
いるバンプ構造。1. A plurality of electrodes are provided on substantially the same plane,
In a bump structure in which a spherical contact is formed on each of the electrodes, a recess is formed in each of the electrodes, and in each of the recesses, a metal support piece whose one end is connected to the electrode is substantially parallel to the electrode surface. A bump structure in which the above-mentioned spherical contacts are formed to project on the supporting pieces.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5334996A JP2835376B2 (en) | 1993-12-28 | 1993-12-28 | Bump structure |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5334996A JP2835376B2 (en) | 1993-12-28 | 1993-12-28 | Bump structure |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH07202390A true JPH07202390A (en) | 1995-08-04 |
JP2835376B2 JP2835376B2 (en) | 1998-12-14 |
Family
ID=18283571
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5334996A Expired - Fee Related JP2835376B2 (en) | 1993-12-28 | 1993-12-28 | Bump structure |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2835376B2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH09237948A (en) * | 1996-03-01 | 1997-09-09 | Japan Aviation Electron Ind Ltd | Contact part structure of wiring member |
-
1993
- 1993-12-28 JP JP5334996A patent/JP2835376B2/en not_active Expired - Fee Related
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH09237948A (en) * | 1996-03-01 | 1997-09-09 | Japan Aviation Electron Ind Ltd | Contact part structure of wiring member |
Also Published As
Publication number | Publication date |
---|---|
JP2835376B2 (en) | 1998-12-14 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 19980818 |
|
LAPS | Cancellation because of no payment of annual fees |