JPH07182022A - Fa operation control method for automatic sheet metal machine test - Google Patents

Abstract

PURPOSE:To minimize an influence to be exerted upon an entire system even when there is any fault by adopting a bypass route and a correspondent operation pattern corresponding to the fault of a factory automation(FA) device. CONSTITUTION:The plural operation patterns at the time of FA device fault are prepared and can be selected corresponding to the position of the fault. In this case, the mark of a circle in the figure shows the normally operating FA device and its working contents and the mark of X shows the FA device disabled to use after the fault device and its working contents. In the case of an operation pattern 'FA-1', for example, the state of generating any fault after a punching press device 4 is shown, at such a time, respective devices up to the punching press device are operated, and the derivery destination of the punching press device is changed from a normal facility to the side of a derivery truck installed as the bypass route. In this case, the specification of a joint part is changed into a corner joint system which is manually and easily separated from the device, and the route change is performed by a process computer.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an automatic thin plate mechanical test system for collecting test pieces from a thin plate product, and to an operation control method for a plurality of FA devices constituting the system.

[0002]

2. Description of the Related Art For example, in an iron mill, a test piece is collected in order to test whether or not a manufactured product (such as a thin plate) meets specifications. The simplest method that has been used in the past when collecting this test piece is to manually cut it out using scissors or shears while moving the sample (thin plate) vertically and horizontally while the worker measures it with a measure. Was to do.

Cutting out (or punching) of this test piece
A system for automating is also put to practical use, and a plurality of FA (factory automation) devices (for example, punching press device, pallet stacker, various conveyors, testers) using a process computer (hereinafter referred to as "procon") as a host computer. Etc.) to automatically cut out the test piece.

Regarding this type of technology, for example,
There is Japanese Patent Application No. 5-83961, and a zone is set based on the rules for the test piece to be sampled from the test material, and the coordinates of the sampling pattern are determined based on the coordinates from the base point set in this zone, The test pieces that can be collected in the zone are automatically and arbitrarily combined, so that the test pieces can be collected efficiently.

[0005]

However, in the above-mentioned prior art, when one of the FA devices fails,
There is a problem that the processing from that device is stopped and the operation cannot be performed until the repair is completed.

Therefore, an object of the present invention is to control FA operation in a thin sheet automatic mechanical test so as to minimize the influence on the entire system even if any one of the FA devices has a failure and prevent the delay of the test construction period. To provide a method.

[0007]

In order to achieve the above object, the present invention provides an automatic thin plate mechanical test system for controlling a plurality of FA devices under the control of a host computer to perform an automatic thin plate mechanical test. By presetting a bypass route for each FA device failure and an operation pattern for each route, the bypass route and the corresponding operation pattern are adopted according to the FA device failure, and a predetermined processing and test are performed. I am trying to do it.

[0008]

According to the above means, a bypass route is set in advance assuming a failure of a main FA device, an operation pattern and a control method associated therewith are set, and a test piece is selected in accordance with the failed device. Transport and test. As a result, FA
Even if there is a failure in any of the devices, the influence on the entire system can be minimized and the delay of the test period can be prevented.

[0009]

1 is a layout diagram showing an outline of an automatic thin plate mechanical testing system according to the present invention. Further, FIG. 2 is an explanatory view showing an operation pattern of the FA operation control method in the thin plate automatic mechanical test of the present invention.

As shown in FIG. 1, the thin plate automatic mechanical test system is roughly divided into four blocks A to D (process sections). Here, the A zone is “a zone that is operated in units of test specimens”, the B zone is a “zone that is used in units of operation specimens” + “a zone that is operated in units of specimens”, and the C zone. Is a zone in which operational samples are operated in units of pallets (a container for storing unprocessed samples or processed samples), and D zone is "operational samples are operated in units of pallets, The actual pallet is a zone in the empty pallet collection status.

In FIG. 1, black-painted portions are filled in at various places. The respective marks indicate the branch points of the bypass route, which is one of the features of the present invention. Here, the function of the FA device and the flow of the product (test piece) in FIG. 1 will be described.

In the A zone, the test material (thin plate) is carried in by the vehicle 1, and the test material is a plurality of trucks 2 in the B zone.
Placed on. The test material on the carriage 2 is carried into the punching press device 4 by the loader device 3 and punched into a test piece (test piece) having a predetermined shape. The test piece carried out from the punching press device 4 is carried into the micro joint separating device 5 and can be carried there in a plurality of directions. A traverser 6 and a bar code labeler 7 are provided as one of the destinations, and a sorting robot 8 and a palletizing robot 9 are provided to transfer the test pieces to these.

In the C zone, an automatic guided vehicle (AGV) 1
0 can run in a loop, and the carry-out conveyor 11, carry-in conveyor 12, and a plurality of tester stations 1 are arranged along the traveling path of the self-propelled carrier 10.
3 are provided. Fully automatic tester 14, manual tester 1 against each of the tester stations 13
5. Each of the single unit automatic testing machines 16 is sequentially arranged.

Bar code labeler 7 and carry-out conveyor 11
An interrupt conveyor 17 and a pallet stacker 18 are arranged between them, and a processing robot 19 and an aligning device 20 are installed near the interrupt conveyor 17.

In the thin plate automatic mechanical testing system as described above, when all FA devices are normal, the sample is conveyed from the micro joint separating device 5 to the bar code labeler 7 and a bar code label is attached. Then, it is transferred to the pallet stacker 18 by the palletizing robot 9, further transferred to the interrupt conveyor 17, processed into a predetermined sample shape by the aligning device 20, and then transferred to the carry-out conveyor 11. From the carry-out conveyor 11 to the self-propelled transport vehicle 10, the self-propelled transport vehicle 10 sends it to the fully-automatic testing machine 14 via the testing machine station 13 to perform an automatic test on the test piece.

In such a system, the system cannot operate even if one of the FA devices fails as described above. Therefore, in the present invention, a plurality of types of operation patterns at the time of FA device failure as shown in FIG. 2 are prepared,
It can be selected according to the failure location. Figure 2
For convenience of explanation, only 5 patterns are shown, but actually about 15 patterns are used. In the figure, the circle marks show the FA device which is operating normally and the processing contents thereof, and the X portion shows the FA device which becomes unusable after the failed device and the processing contents thereof. In the present invention, the portion marked with X cannot be used. The specimens are transported from the points marked with to another route.

For example, in the case of the operation pattern "FA-1", a state in which there is a failure after the punching press device 4 is shown. In this case, each device up to the punching press device 4 is operated, and the delivery destination of the punching press device 4 is changed from the normal equipment to the delivery cart side provided as a bypass route. At this time, the specification of the joint part for finely connecting the large plate and the punched test piece is changed to the corner joint method that can be easily separated manually to prevent the variation. The route change in this case is performed by the process computer.

Here, the micro joint method is a method in which when a test piece is cut out from a thin steel plate, the thin steel plate (base material) and the test piece (product) are not completely separated but cut out (or punched). , In particular, it is called a micro joint method from the viewpoint of making the joint portion that connects the base material and the product small (micro). There are two types of this micro-joint method, in which the shape of the connecting portion that connects the base material and the product is triangular is called the corner joint method, and the thin wire shape is called the wire joint method.

As the instruction data from the process computer to the punching press device 4, "logical line N
o. , “Marking / cutting data”, “test piece punching classification”, “payout destination”, and the like. "Test piece punching classification"
There are "1" and "2", "1" is the micro joint method (automatically separates the sample when the downstream equipment is normal), "2" is the corner joint method (manually the sample when the downstream equipment fails) Separate). Similarly, the "delivery destination" also has a division of "1" and "2", "1" is an unloader (automatically separates the specimens when the downstream equipment is normal), and "2" is a delivery cart (when the downstream equipment fails). In this case, the test piece is manually separated). Further, the present invention will be specifically described by taking the operation pattern "FA-3" as an example.

FIG. 3 is an explanatory view showing a control method for the operation pattern "FA-3" in FIG. 2, and FIG. 4 is an explanation showing an operation procedure at that time. Operation pattern "FA-3"
Shows a situation in which the traverser 6 is normal, the labeler conveyor has failed, and each device thereafter cannot be used. In this case, in each process, there are a test piece that has arrived just before the barcode labeler 7 and a test piece that is staying in the punching press device 4. Therefore, the sorting robot 8 processes the cut finish test piece and the work finish test piece separately. The cut-finished test piece is one in which the shape of the test piece is generated by punching (cutting) with a punching press such as roughness, hardness, and Erichsen test. After punching with a punching press, the shape of the test piece is generated by processing in a machining center. For a cut finish test piece, use a traverser 6
To the self-propelled carrier 10
Run counterclockwise (or clockwise), carry in the desired test equipment, and perform the test.

Further, the processed and finished test piece is not attached with the bar code label, but the box is collected by changing the transfer destination, and then sent to the processing center for machining. After that, it is manually carried into the test center, palletized manually, and then manually carried into the testing machine (without dummy material) to carry out the test. This manual processing of the portion is the shaded portion in FIG.

[0022]

As described above, according to the present invention, in a thin plate automatic mechanical test system for controlling a plurality of FA devices under the control of a host computer to perform a thin plate automatic mechanical test, the FA device fails. Set the bypass route for time and the operation pattern for each route in advance,
By adopting the bypass route and the corresponding operation pattern according to the failure of the FA device and performing the predetermined processing and testing, even if one of the FA devices fails, the influence on the entire system is minimized. It is possible to prevent the delay of the test construction period.

[Brief description of drawings]

FIG. 1 is a layout diagram showing an outline of an automatic thin plate mechanical testing system of the present invention.

FIG. 2 is an explanatory diagram showing an operation pattern of the FA operation control method in the thin plate automatic mechanical test of the present invention.

FIG. 3 is an explanatory diagram showing a control method for the operation pattern “FA-3” in FIG. 2.

FIG. 4 is an explanatory diagram showing an operation procedure in FIG.

[Explanation of symbols]

 1 Vehicle 2 Bogie 3 Loader Device 4 Punching Press Device 5 Micro Joint Separation Device 6 Traverser 7 Barcode Labeler 8 Sorting Robot 9 Palletizing Robot 10 Self-propelled Transport Vehicle (AGV) 11 Carry-out Conveyor 12 Carry-in Conveyor 13 Testing Machine Station 14 Fully Automatic Test Machine 15 Manual tester 16 Stand-alone automatic tester 17 Interrupt conveyor 18 Pallet stacker 19 Processing robot 20 Aligning device

─────────────────────────────────────────────────── ─── Continuation of the front page (51) Int.Cl. ⁶ Identification number Reference number within the agency FI Technical display location // B23Q 41/08 B (72) Inventor Osamu Fujii 1 Kimitsu, Kimitsu-shi, Chiba New Nippon Steel Stock company Kimitsu Works (72) Inventor Yuya Kikuta 2 1-2 Okura, Hachimanto-ku, Kitakyushu, Fukuoka Prefecture Yoshikawa Industry Co., Ltd. Kimitsu Branch

Claims (1)

[Claims] 1. In a thin plate automatic mechanical testing system for controlling a plurality of FA devices under the control of a host computer to perform a thin plate automatic mechanical test, a bypass route for a failure of the FA device and an operation pattern for each route. Is set in advance, and the bypass route and the corresponding operation pattern are adopted according to the failure of the FA device, and predetermined processing and testing are performed, and a FA operation control method in an automatic thin plate mechanical test.