JPH07174518A - Apparatus for detecting position of part - Google Patents

Apparatus for detecting position of part

Info

Publication number
JPH07174518A
JPH07174518A JP5320768A JP32076893A JPH07174518A JP H07174518 A JPH07174518 A JP H07174518A JP 5320768 A JP5320768 A JP 5320768A JP 32076893 A JP32076893 A JP 32076893A JP H07174518 A JPH07174518 A JP H07174518A
Authority
JP
Japan
Prior art keywords
light
chip
pin
illuminance
component
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5320768A
Other languages
Japanese (ja)
Other versions
JP3411354B2 (en
Inventor
Masato Ozawa
正人 小沢
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Juki Corp
Original Assignee
Juki Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Juki Corp filed Critical Juki Corp
Priority to JP32076893A priority Critical patent/JP3411354B2/en
Publication of JPH07174518A publication Critical patent/JPH07174518A/en
Application granted granted Critical
Publication of JP3411354B2 publication Critical patent/JP3411354B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Abstract

PURPOSE:To detect accurately the position of a part, wherein many pins are arranged, even if the size and the shape of the part, the width of the pin and the interval between the pins are different. CONSTITUTION:The transmitted light or the reflected light at the pin part of a semiconductor chip 10 when light from a lamp 12 is cast on the semiconductor chip 10 wherein many pins are arranged, is received by a CCD camera 14. The position of the semiconductor chip 10 is detected based on the received signal. In this part-position detecting apparatus, an illuminance switching device 24, which adjusts the illuminance of the illuminated light in correspondence with the size and the shape of the semiconductor ship, the width of the pin and the interval of the pins, is provided.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、部品位置検出装置、特
に半導体チップの実装に用いるチップマウンタ等に適用
して好適な、部品位置検出装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a component position detecting device, and more particularly to a component position detecting device suitable for application to a chip mounter used for mounting semiconductor chips.

【0002】[0002]

【従来の技術】一般に、半導体チップを基板等に実装す
るためのチップマウンタでは、該チップを所定位置に正
確に取付けなければならないため、その取付前に該チッ
プの位置(中心及び基準方向からの傾き)を検出する必
要がある。
2. Description of the Related Art Generally, in a chip mounter for mounting a semiconductor chip on a substrate or the like, it is necessary to mount the chip accurately at a predetermined position. Therefore, before mounting the chip mounter (from the center and the reference direction). Tilt) must be detected.

【0003】図6は、チップマウンタで、透過形の部品
位置検出装置により、4方向周囲にピンが配設されてい
るQFP(Quad Flat Package)形の半導体チップ
(部品)10の位置を検出している様子を示す要部正面
図であり、ここでは、チップ10の上方から、多数の発
光ダイオードLDが付設されたランプ12により光を照
射すると共に、該チップ10の下方に配された、CCD
カメラ14によりピン間を透過した光を受光し、そのと
きの受光信号に基づいてチップ10の位置を検出してい
る。なお、図中符号15は、チップ10を支持するため
のガラス板である。
FIG. 6 shows a chip mounter which detects the position of a QFP (Quad Flat Package) type semiconductor chip (component) 10 in which pins are arranged around four directions by a transmission type component position detecting device. FIG. 3 is a front view of an essential part showing a state in which a light is emitted from above the chip 10 by a lamp 12 provided with a large number of light emitting diodes LD, and a CCD arranged below the chip 10.
The light transmitted through the pins is received by the camera 14, and the position of the chip 10 is detected based on the received light signal at that time. Reference numeral 15 in the figure is a glass plate for supporting the chip 10.

【0004】又、上記チップ10の位置を検出する装置
には、図7に要部構成を示すような反射形もある。この
装置では、図7(A)に示すように、バキュームノズル
16で背面を保持したチップ10の下方に、同図(B)
の平面図で示すような中心に孔があるランプ12を配
し、該ランプ12の孔の下の方からカメラ14でチップ
10からの反射光を捕らえるようにしたものである。な
お、図7(A)に示したランプ12は、同図(B)のA
−A断面に相当する。
Further, as a device for detecting the position of the chip 10, there is also a reflection type device whose essential structure is shown in FIG. In this device, as shown in FIG. 7 (A), below the chip 10 whose back surface is held by the vacuum nozzle 16, FIG.
A lamp 12 having a hole at the center thereof is arranged as shown in the plan view, and the reflected light from the chip 10 is captured by a camera 14 from below the hole of the lamp 12. In addition, the lamp 12 shown in FIG.
Corresponds to the -A cross section.

【0005】上述した透過形と反射形の検出装置による
検出原理は基本的に同一であるので、透過形の検出装置
についてチップ10の位置検出方法を説明する。
Since the principle of detection by the above-mentioned transmission type and reflection type detection devices is basically the same, a method for detecting the position of the chip 10 will be described for the transmission type detection device.

【0006】図8は、上記カメラ14で寸法が大きいチ
ップ10をとらえた場合の視野18と、該チップ10と
の関係を示したものであり、図中A線の位置を透過した
光の受光信号を、図9に概念的に示した。この図9にお
いて、上段には、図8の破線円Bの部分を拡大して示
し、下段にはカメラ14の受光レベルの最大値(MA
X)及び最小値(MIN)と、実際に検出された波形状
の受光信号とを示し、又、受光レベルの最大値を示す線
には太線でピンPに対応する幅とピン間隔とを示してあ
る。
FIG. 8 shows the relationship between the field of view 18 and the chip 10 when the camera 10 captures the chip 10 having a large size. The light received through the position of line A in the drawing is received. The signal is shown conceptually in FIG. In FIG. 9, the broken line circle B of FIG. 8 is enlarged and shown in the upper part, and the maximum value (MA of the light receiving level of the camera 14 is shown in the lower part).
X) and the minimum value (MIN), and the actually detected wave-shaped light-receiving signal, and the line showing the maximum value of the light-receiving level is shown by a bold line indicating the width and the pin interval corresponding to the pin P. There is.

【0007】従来は、上記図9の受光信号からピン位置
を検知する際、図中破線で示す一定の閾値Th )を設定
し、該閾値Th 以上の受光信号の強度からピンの位置を
検出している。
Conventionally, when the pin position is detected from the received light signal of FIG. 9, a constant threshold value Th) shown by a broken line in the figure is set, and the position of the pin is detected from the intensity of the received light signal equal to or higher than the threshold value Th. ing.

【0008】[0008]

【発明が解決しようとする課題】しかしながら、前記従
来の部品位置検出装置では、光源(ランプ)による照度
を一定とし、且つ閾値Th を一定に設定していたので、
以下の問題があった。
However, in the above-mentioned conventional component position detecting device, the illuminance by the light source (lamp) is set to be constant, and the threshold value Th is set to be constant.
There were the following problems.

【0009】即ち、図10に視野18とチップ10との
関係示したように、図8の場合のチップ10とほぼピン
幅、ピン間隔が同じで小型のチップ10の場合は、図1
1に示すように受光信号の最小値が上がってしまい、信
号の最大値と最小値のレベル差が小さくなる。これは、
チップ10が小さいために照射光が、カメラ14に入射
する光量が全体的に増大していることが原因と考えられ
る。
That is, as shown in the relationship between the field of view 18 and the chip 10 in FIG. 10, in the case of a small chip 10 having substantially the same pin width and pin spacing as in the case of FIG.
As shown in 1, the minimum value of the received light signal rises, and the level difference between the maximum value and the minimum value of the signal becomes small. this is,
It is considered that this is because the chip 10 is small and the amount of light incident on the camera 14 is generally increased.

【0010】従来は、閾値Th が一定であるので、前記
図8に示した大きなチップ10に合せて前記図9のよう
に受光信号の振幅の中間値付近に設定しておくと、同一
条件の下で小型のチップ10を検出すると、図11のよ
うに受光信号のレベル差のマージンが小さくなり、しか
も閾値Th が受光信号の振幅の下方に位置することにな
るため、検出精度が低下することになる。
Conventionally, since the threshold value Th is constant, if it is set near the intermediate value of the amplitude of the received light signal as shown in FIG. 9 according to the large chip 10 shown in FIG. If the small chip 10 is detected below, the margin of the level difference of the received light signal becomes small as shown in FIG. 11, and the threshold Th is located below the amplitude of the received light signal, so that the detection accuracy is deteriorated. become.

【0011】逆にチップの大きさが図8の場合と同じ
で、ピン幅、ピン間隔が小さい場合には、図12に示す
ように、受光信号レベルが全体的に下がるため、閾値T
h が振幅の上方に位置することになる。これは図13に
示した、ピンピッチ(ピン幅+ピン間隔)に相当する受
光信号の空間周波数と、カメラ14に実際に入力された
信号の入力レベルとの関係から分かるように、ピンピッ
チ0.65mm(幅0.32mm、間隔0.33mm)とピン
ピッチ0.50mm(幅0.20mm、間隔0.30mm)に
相当する周波数域で比較すると、周波数が高いピンピッ
チ0.50mmの方が入力レベルが低くなり、透過光量が
減少することに起因していると考えられる。
On the contrary, when the chip size is the same as that in FIG. 8 and the pin width and the pin interval are small, the light receiving signal level is lowered as a whole as shown in FIG.
h is located above the amplitude. As can be seen from the relationship between the spatial frequency of the received light signal corresponding to the pin pitch (pin width + pin interval) and the input level of the signal actually input to the camera 14, the pin pitch is 0.65 mm. (Width 0.32mm, spacing 0.33mm) and pin pitch 0.50mm (width 0.20mm, spacing 0.30mm), the input level is lower when the pin pitch is 0.50mm. It is considered that this is because the amount of transmitted light decreases.

【0012】従って、透過形の検出装置でチップ10を
検出する場合には、従来のように照度と閾値Th とを一
定値に固定して検出する場合には、閾値Th が受光信号
の振幅に対して適切な範囲から外れる場合が生じるた
め、寸法形状やピン幅、ピン間隔が異なるチップの場合
には正確にその位置検出ができない場合が生じるという
問題がある。
Therefore, when the chip 10 is detected by the transmission type detection device, when the illuminance and the threshold value Th are fixed and fixed as in the conventional case, the threshold value Th is the amplitude of the received light signal. On the other hand, there is a case where the chip is out of the appropriate range, so that there is a problem that the position cannot be accurately detected in the case of chips having different dimensions, pin widths, and pin intervals.

【0013】一方、反射形検出装置の場合には、チップ
の大小による受光レベルの変化は小さいものの、図14
にピン幅、ピン間隔が大きい場合、図15にこの両者共
小さい場合の受光信号を示すように、ピン幅、ピン間隔
の大小によって受光レベルが変化するため、同様の問題
がある。
On the other hand, in the case of the reflection type detector, although the change in the received light level due to the size of the chip is small, FIG.
When the pin width and the pin interval are large, the light receiving level changes depending on the pin width and the pin interval, as shown in FIG.

【0014】本発明は、前記従来の問題点を解決するべ
くなされたもので、半導体チップ等の多数のピンが配設
されたチップが、その寸法形状や、ピン幅及びピン間隔
が異なっている場合でも、該チップの位置を正確に検出
することができる部品位置検出装置を提供することを課
題とする。
The present invention has been made to solve the above-mentioned conventional problems, and chips such as semiconductor chips in which a large number of pins are arranged have different dimensional shapes, pin widths, and pin intervals. Even in such a case, it is an object to provide a component position detection device that can accurately detect the position of the chip.

【0015】[0015]

【課題を解決するための手段】本発明は、光源から多数
のピンが配設されたチップに光を照射したときの、該チ
ップのピン部分における透過光を受光手段で受光し、そ
の受光信号に基づいて部品の位置を検出する部品位置検
出装置において、チップの寸法形状が基準よりも小さい
場合には、照射光の照度を下げる照度調整手段を設けた
ことにより、前記課題を解決したものである。
SUMMARY OF THE INVENTION According to the present invention, when light is emitted from a light source to a chip having a large number of pins, transmitted light at the pin portion of the chip is received by a light receiving means, and a light receiving signal thereof is received. In the component position detecting device for detecting the position of the component based on the, when the size and shape of the chip is smaller than the reference, by providing an illuminance adjusting means for reducing the illuminance of the irradiation light, it is possible to solve the above problems. is there.

【0016】本発明は、又、光源から多数のピンが配設
されたチップに光を照射したときの、該チップのピン部
分における透過光又は反射光を受光手段で受光し、その
受光信号に基づいて部品の位置を検出する部品位置検出
装置において、透過光を受光する場合のピン間隔又は反
射光を受光する場合のピン幅が基準よりも小さい場合に
は、照射光の照度を上げる照度調整手段を設けたことに
より、同様に前記課題を解決したものである。
According to the present invention, when light is emitted from a light source to a chip on which a large number of pins are arranged, transmitted light or reflected light at the pin portion of the chip is received by a light receiving means, and the light receiving signal is received. In a component position detection device that detects the position of a component based on the above, if the pin spacing when receiving transmitted light or the pin width when receiving reflected light is smaller than the reference, illuminance adjustment that raises the illuminance of irradiation light By providing the means, the above problems are similarly solved.

【0017】[0017]

【作用】本発明においては、チップ(部品)の寸法形状
が基準より下さい場合には、照射光の照度を下げる照度
調整手段を設けたので、多数のピンが配設された部品に
光を照射し、そのときの透過光を受光手段で受光し、そ
の受光信号に基づいて部品の位置を検出する際に、チッ
プの寸法形状等が基準以下であるために検出誤差が生じ
る受光信号を、検出に適したレベルに調整することが可
能となるため、該チップの位置検出精度を向上すること
が可能となる。
In the present invention, when the size of the chip (component) is not the standard, the illuminance adjusting means for lowering the illuminance of the irradiation light is provided, so that the component having a large number of pins is irradiated with light. Then, when the transmitted light at that time is received by the light receiving means and the position of the component is detected based on the received light signal, a light receiving signal that causes a detection error due to the size and shape of the chip being below the reference is detected. Since it is possible to adjust to a level suitable for the above, it becomes possible to improve the position detection accuracy of the chip.

【0018】又、本発明においては、透過光を受光する
場合のピン間隔又は反射光を受光する場合のピン幅が基
準よりも小さい場合には、照射光の照度を上げる照度調
整手段を設けたので、透過光を検出する場合はピン間隔
が、又、反射光を検出する場合はピン幅が、基準以下で
あるために検出誤差が生じる検出信号を、適切な受光レ
ベルにすることができるため同様に高精度の位置検出が
可能となる。
Further, in the present invention, the illuminance adjusting means for increasing the illuminance of the irradiation light is provided when the pin interval when receiving the transmitted light or the pin width when receiving the reflected light is smaller than the reference. Since the pin spacing is less than the reference when detecting transmitted light and the pin width is less than when detecting reflected light, a detection signal that causes a detection error can be set to an appropriate light receiving level. Similarly, highly accurate position detection becomes possible.

【0019】なお、本発明において、チップの寸法形状
の基準やピン幅又はピン間隔の基準は、予め種々のチッ
プ毎に検出し、得られた実測データに基づいて決定して
おく。
In the present invention, the standard of the dimension and shape of the chip and the standard of the pin width or the pin interval are detected in advance for each of various chips and are determined based on the actually measured data obtained.

【0020】[0020]

【実施例】以下、図面を参照して本発明の実施例を詳細
に説明する。
Embodiments of the present invention will now be described in detail with reference to the drawings.

【0021】図1は、本発明に係る第1実施例の位置検
出装置が適用されたチップマウンタの概略構成を示すブ
ロック図である。
FIG. 1 is a block diagram showing a schematic structure of a chip mounter to which the position detecting device of the first embodiment according to the present invention is applied.

【0022】本実施例の検出装置は、前記図6に示した
透過形と同一であり、該検出装置は、CCDカメラ14
に接続された制御装置20と、該制御装置20にデータ
の送受信が可能に接続されたホストコンピュータ22
と、制御装置20から入力される情報に基づいてランプ
12による照度を調整するための照度切換装置24とを
備えている。上記ホストコンピュータ22には、所定の
閾値と、その閾値について基準のチップサイズ、ピン
幅、ピン間隔と、基準以下のチップに対して設定する照
度等の情報が格納されている。
The detection apparatus of this embodiment is the same as the transmission type shown in FIG. 6, and the detection apparatus is the CCD camera 14
And a host computer 22 connected to the control device 20 so that data can be transmitted and received.
And an illuminance switching device 24 for adjusting the illuminance by the lamp 12 based on the information input from the control device 20. The host computer 22 stores a predetermined threshold value, a reference chip size, a pin width, a pin interval for the threshold value, and information such as illuminance to be set for chips below the reference value.

【0023】上記制御装置20では、内蔵されているC
PU(中央演算処理装置)により、カメラ14から入力
される受光信号に基づいてチップ10の位置を演算する
と共に、検出された位置情報を元にチップ10を所定位
置に搬送し、実装する動作や、ホストコンピュータ22
から入力されるチップ10の種類に応じた情報に基づい
て、ランプ12による照射光の照度が適切に設定される
ように、照度切換装置24に対する切換信号を出力する
動作等を制御できるようになっている。
The control device 20 has a built-in C
A PU (Central Processing Unit) calculates the position of the chip 10 based on the light reception signal input from the camera 14, and also conveys and mounts the chip 10 at a predetermined position based on the detected position information. , Host computer 22
It is possible to control the operation of outputting a switching signal to the illuminance switching device 24 and the like so that the illuminance of the irradiation light from the lamp 12 is appropriately set based on the information according to the type of the chip 10 input from the. ing.

【0024】図2は、前記照度切換装置24に内蔵され
ている回路構成と、ランプ12に取付けられているn 個
の発光ダイオードLD1〜LDn の関係を示した回路図
である。
FIG. 2 is a circuit diagram showing the relationship between the circuit configuration built in the illuminance switching device 24 and the n light emitting diodes LD1 to LDn mounted on the lamp 12. As shown in FIG.

【0025】ここでは、トランジスタTに、R、2R及
び4Rの3種類の抵抗がそれぞれリレーにより並列に接
続可能になっており、リレー開閉用の電磁コイルRY
1、RY2、RY3を制御装置20からの入力信号に基
づいて起動させ、上記抵抗を所望の組合せにすることに
より、発光ダイオードLD1〜LDn に印加される電圧
を調整し、所望の照度に切換えられるようになってい
る。
Here, three types of resistors R, 2R, and 4R can be connected in parallel to the transistor T by a relay, and the electromagnetic coil RY for opening and closing the relay is connected.
1, RY2, RY3 are activated based on the input signal from the control device 20, and the resistors are set to a desired combination, whereby the voltage applied to the light emitting diodes LD1 to LDn is adjusted to switch to a desired illuminance. It is like this.

【0026】本実施例においては、チップ10の位置を
検出する場合、ホストコンピュータ22から入力される
チップの寸法形状やピン幅及びピン間隔等の情報に基づ
いて、該チップ10に適した照度に調整できるので、そ
の位置(中心及び傾き等)を正確に検出することができ
る。
In the present embodiment, when the position of the chip 10 is detected, the illuminance suitable for the chip 10 is determined based on the information such as the dimensions and shape of the chip and the pin width and the pin interval which are input from the host computer 22. Since it can be adjusted, its position (center, inclination, etc.) can be accurately detected.

【0027】即ち、前記図9に示した受光信号の振幅の
ほぼ中間値に合せて閾値Th が設定されている場合を基
準として説明すると、前記図10に示した小型のチップ
の場合は、ランプ12による照度を下げることにより、
図3に示すように、図11に示した受光レベルに比較し
て、低レベル値を一層下げることができるので、信号振
幅の下限を閾値Th より十分低いレベルに合わせること
ができるため、検出精度を上げることが可能となる。
That is, the case where the threshold value Th is set in accordance with the almost intermediate value of the amplitude of the received light signal shown in FIG. 9 will be described as a reference. In the case of the small chip shown in FIG. By reducing the illuminance by 12,
As shown in FIG. 3, since the low level value can be further reduced as compared with the light receiving level shown in FIG. 11, the lower limit of the signal amplitude can be adjusted to a level sufficiently lower than the threshold Th, so that the detection accuracy can be improved. It is possible to raise.

【0028】又、図12に示したピン幅、ピン間隔が小
さい同じ大きさのチップの場合は、逆に図9の場合より
照度を上げることにより、受光レベルを図4に示すよう
に全体に上げることができるため、同様に検出精度を向
上できる。
In the case of the chips of the same size with small pin width and pin spacing shown in FIG. 12, conversely, by raising the illuminance as compared with the case of FIG. 9, the light receiving level is entirely changed as shown in FIG. Since it can be increased, the detection accuracy can be similarly improved.

【0029】以上詳述した如く、本実施例によれば、半
導体チップ10の寸法形状、ピン幅及びピン間隔に応じ
て適切に照度を切換えることができるので、チップ10
の位置検出を正確に行うことが可能となり、該チップ1
0の実装精度を向上することが可能となる。
As described above in detail, according to this embodiment, the illuminance can be appropriately switched according to the size and shape of the semiconductor chip 10, the pin width, and the pin interval.
It becomes possible to accurately detect the position of
It is possible to improve the mounting accuracy of 0.

【0030】次に、本発明に係る第2実施例について説
明する。
Next, a second embodiment according to the present invention will be described.

【0031】本実施例は、前記図1に示したチップマウ
ンタに対して、透過形検出装置に代えて、前記図7に示
した反射形検出装置を適用した以外は前記第1実施例と
実質的に同一である。
The present embodiment is substantially the same as the first embodiment except that the reflection type detection device shown in FIG. 7 is applied to the chip mounter shown in FIG. 1 instead of the transmission type detection device. Are the same.

【0032】本実施例によれば、閾値Th が前記図14
に示した値に設定してあるとすると、照度を適切に上げ
てやることにより、図5に示すように、前記図15に示
した受光信号の高レベル値を上げることはできるので、
前記第1実施例の場合と同様に検出精度を向上できる。
According to this embodiment, the threshold Th is set to the value shown in FIG.
If it is set to the value shown in FIG. 5, it is possible to raise the high level value of the received light signal shown in FIG. 15 by appropriately raising the illuminance, as shown in FIG.
The detection accuracy can be improved as in the case of the first embodiment.

【0033】以上、本発明について具体的に説明した
が、本発明は、前記実施例に示したものに限られるもの
でなく、その要旨を逸脱しない範囲で種々変更可能であ
る。
The present invention has been specifically described above, but the present invention is not limited to the above-mentioned embodiments, and various modifications can be made without departing from the scope of the invention.

【0034】例えば、照度調整手段は、前記図2に示し
た回路構成からなるものに限られるものでなく、発光ダ
イオードに印加する電圧を調整できるものであれば制限
されず、又、発光体は発光ダイオードに限定されない。
For example, the illuminance adjusting means is not limited to the one having the circuit configuration shown in FIG. 2, but is not limited as long as it can adjust the voltage applied to the light emitting diode, and the light emitting body is not limited. It is not limited to light emitting diodes.

【0035】又、前記実施例では部品がQFP形チップ
である場合を示したが、2方向にピンが配設された、い
わゆるSOP(Small Outline Package)形チップ
であっても、又、多数のピンが配設されているものであ
れば任意の部品であってもよい。
In the above-mentioned embodiment, the case where the component is a QFP type chip has been shown, but a so-called SOP (Small Outline Package) type chip in which pins are arranged in two directions is also used. Any component may be used as long as the pins are arranged.

【0036】更に、前記実施例では、半導体チップの各
種類毎に予め決められている照度に設定する場合を示し
たが、これに限られず、固定されている閾値が受光信号
の振幅のほぼ中間値に一致するように照度が自動的に制
御されるようにしてもよい。
Further, in the above-mentioned embodiment, the case where the illuminance set in advance for each type of semiconductor chip is shown, but the present invention is not limited to this, and the fixed threshold value is approximately the middle of the amplitude of the light receiving signal. The illuminance may be automatically controlled so as to match the value.

【0037】[0037]

【発明の効果】以上説明したとおり、本発明によれば、
半導体チップ等の多数のピンが配設された部品が、その
寸法形状、ピン幅及びピン間隔が異なっている場合で
も、該部品の位置を正確に検出することが可能となる。
As described above, according to the present invention,
It is possible to accurately detect the position of a component such as a semiconductor chip in which a large number of pins are arranged, even if the size, shape, pin width, and pin interval are different.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明に係る第1実施例の部品位置検出装置が
適用されたチップマウンタの概略構成を示すブロック図
FIG. 1 is a block diagram showing a schematic configuration of a chip mounter to which a component position detecting device according to a first embodiment of the present invention is applied.

【図2】照度切換装置に内蔵されている回路の構成を示
す回路図
FIG. 2 is a circuit diagram showing a configuration of a circuit incorporated in the illuminance switching device.

【図3】透過形検出装置により小型チップを照度を下げ
て検出した受光信号を示す線図
FIG. 3 is a diagram showing a light reception signal detected by a transmission type detection device with a small chip at a reduced illuminance.

【図4】透過形検出装置によりピンピッチが小さい大型
チップを照度を上げて検出したの受光信号を示す線図
FIG. 4 is a diagram showing a light reception signal obtained by detecting a large chip having a small pin pitch by increasing the illuminance by a transmission type detection device.

【図5】反射形検出装置によりピン幅が狭いチップを照
度を上げて検出した受光信号を示す線図
FIG. 5 is a diagram showing a light reception signal detected by increasing the illuminance of a chip with a narrow pin width by a reflection type detection device.

【図6】透過形部品位置検出装置の要部構成を示す概略
正面図
FIG. 6 is a schematic front view showing the configuration of the main parts of a transmission type component position detection device.

【図7】反射形部品位置検出装置の要部構成を示す正面
図及びランプの平面図
7A and 7B are a front view and a plan view of a lamp, showing a main configuration of a reflective component position detecting device.

【図8】カメラの視野と大型チップの関係を示す説明図FIG. 8 is an explanatory diagram showing the relationship between the field of view of the camera and the large chip.

【図9】ピンピッチが小さい大型チップを従来法で検出
した受光信号を示す線図
FIG. 9 is a diagram showing a light reception signal obtained by detecting a large chip having a small pin pitch by a conventional method.

【図10】カメラの視野と小型チップの関係を示す説明
FIG. 10 is an explanatory diagram showing the relationship between the field of view of the camera and the small chip.

【図11】ピンピッチが小さい小型部品を従来法で検出
した受光信号を示す線図
FIG. 11 is a diagram showing a light reception signal obtained by detecting a small component having a small pin pitch by a conventional method.

【図12】ピンピッチが更に小さい大型チップを従来法
で検出した受光信号を示す線図
FIG. 12 is a diagram showing a light reception signal obtained by detecting a large chip having a smaller pin pitch by a conventional method.

【図13】受光信号の空間周波数とカメラ入力信号レベ
ルの関係を示す線図
FIG. 13 is a diagram showing the relationship between the spatial frequency of the received light signal and the camera input signal level.

【図14】ピンピッチが大きい大型チップを従来の反射
形装置で検出した受光信号を示す線図
FIG. 14 is a diagram showing a light reception signal obtained by detecting a large chip having a large pin pitch with a conventional reflection type device.

【図15】ピンピッチが小さい大型チップを従来の反射
形装置で検出した受光信号を示す線図
FIG. 15 is a diagram showing a light receiving signal obtained by detecting a large chip having a small pin pitch with a conventional reflection type device.

【符号の説明】[Explanation of symbols]

10…半導体チップ 12…ランプ 14…CCDカメラ 16…バキュームノズル 18…視野 20…制御装置 22…ホストコンピュータ 24…照度切換装置 10 ... Semiconductor chip 12 ... Lamp 14 ... CCD camera 16 ... Vacuum nozzle 18 ... Field of view 20 ... Control device 22 ... Host computer 24 ... Illuminance switching device

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】光源から多数のピンが配設されたチップに
光を照射したときの、該チップのピン部分における透過
光を受光手段で受光し、その受光信号に基づいて部品の
位置を検出する部品位置検出装置において、 チップの寸法形状が基準よりも小さい場合には、照射光
の照度を下げる照度調整手段を設けたことを特徴とする
部品位置検出装置。
1. A light receiving means receives the light transmitted through a pin portion of the chip when the light source irradiates the chip on which a large number of pins are arranged, and detects the position of the component based on the received light signal. In the component position detecting device, the component position detecting device is provided with an illuminance adjusting means for reducing the illuminance of the irradiation light when the size and shape of the chip are smaller than the reference.
【請求項2】光源から多数のピンが配設されたチップに
光を照射したときの、該チップのピン部分における透過
光又は反射光を受光手段で受光し、その受光信号に基づ
いて部品の位置を検出する部品位置検出装置において、 透過光を受光する場合のピン間隔又は反射光を受光する
場合のピン幅が基準よりも小さい場合には、照射光の照
度を上げる照度調整手段を設けたことを特徴とする部品
位置検出装置。
2. A light receiving unit receives transmitted light or reflected light at a pin portion of the chip when light is emitted from a light source to a chip provided with a large number of pins, and a component of the component is detected based on the received light signal. In the component position detection device that detects the position, if the pin spacing when receiving transmitted light or the pin width when receiving reflected light is smaller than the reference, illuminance adjusting means for raising the illuminance of the irradiation light is provided. A component position detection device characterized by the above.
JP32076893A 1993-12-21 1993-12-21 Component position detection device for surface mounters Expired - Lifetime JP3411354B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP32076893A JP3411354B2 (en) 1993-12-21 1993-12-21 Component position detection device for surface mounters

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP32076893A JP3411354B2 (en) 1993-12-21 1993-12-21 Component position detection device for surface mounters

Publications (2)

Publication Number Publication Date
JPH07174518A true JPH07174518A (en) 1995-07-14
JP3411354B2 JP3411354B2 (en) 2003-05-26

Family

ID=18125045

Family Applications (1)

Application Number Title Priority Date Filing Date
JP32076893A Expired - Lifetime JP3411354B2 (en) 1993-12-21 1993-12-21 Component position detection device for surface mounters

Country Status (1)

Country Link
JP (1) JP3411354B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005166850A (en) * 2003-12-02 2005-06-23 Juki Corp Part recognition method and apparatus thereof

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005166850A (en) * 2003-12-02 2005-06-23 Juki Corp Part recognition method and apparatus thereof
JP4551651B2 (en) * 2003-12-02 2010-09-29 Juki株式会社 Component recognition method and apparatus

Also Published As

Publication number Publication date
JP3411354B2 (en) 2003-05-26

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