JPH07167445A - Microwave oven - Google Patents

Abstract

PURPOSE:To determine accurately a cause of trouble of a micro-wave oven, and make the number of component parts to be minimum in number for their replacement or exchanging by a method an input information at an inputting part or a history of a heating operation is stored by a non-volatile memory device. CONSTITUTION:A main body of a range is provided with a magnetron for heating with a micro-wave a heated item in a heating chamber. There is provided a micro-processor 4 for controlling an electrical energization for the magnetron. There is provided an inputting part 3 for inputting a heating time or a heating output for the heated item. There is provided a sensor 5 for sensing a heated state or a temperature of the heated item. There is provided a non- volatile memory device 6 for use in storing input information at the input part or a history of the heating operation so as to judge causes of trouble in a micro-wave range. An accurate judgement of troubles can be carried out in reference to information stored in the non-volatile memory device 6 and then the number of replacing component parts can be made minimum.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a magnetron for heating an object to be heated in a heating chamber provided in a range main body by microwaves, a control unit for controlling energization of the magnetron, a heating time of the object to be heated, and the like. The present invention relates to a microwave oven including an input unit for inputting a heating output and the like and a sensor for detecting a heating state and a temperature of an object to be heated.

[0002]

2. Description of the Related Art Conventionally, when a microwave oven fails at home, and the failure is a door damage, the cause can be objectively determined. However, if the failure is a failure inside the control unit of the microwave oven, for example, a microcomputer (hereinafter, abbreviated as a microcomputer) or various sensors for detecting the heating state and temperature of the object to be heated, the cause is I could not know it objectively and asked the user to explain the usage situation when the failure occurred in detail, then
It was necessary to estimate the usage situation and reproduce it.

In such a case, in order to supplement the user's explanation, when an error display indicating that the part is in failure or the type of failure is found, this information is coded to the non-volatile storage device. The number or the like or the accumulated operation time of the magnetron or the like is stored, and the cause of the failure is determined based on this information.

[0004]

However, in the case of the above, when the user's explanation is unclear, misunderstanding or misrecognition causes confusion in the determination of the cause of the failure. Therefore, there is a possibility that the cause of the failure may not be accurately determined. If the error display or the type of failure cannot be determined, the information cannot be stored in the nonvolatile storage device, and the cause of the failure cannot be determined based on the information in the nonvolatile storage device. Then, if only the accumulated operating time of the magnetron is stored, only the failure due to the life of the magnetron can be judged.

Therefore, if the above is the case, the judgment of the cause of the failure is often made by guessing, and when the failure is dealt with by replacing the parts, all the parts related to the part which seems to have failed are replaced. Therefore, there is a problem that unnecessary parts are replaced and the burden on the user is increased.

The microwave oven of the present invention has been made in view of the above problems, and determines the cause of the failure of the microwave oven by storing the input information in the input section and the history of the heating operation in the nonvolatile storage device. The purpose is to accurately perform and minimize the number of parts to be replaced.

[0007]

In order to achieve the above object, a microwave oven of the present invention comprises a magnetron for microwave-heating an object to be heated in a heating chamber provided in the range main body,
A control unit for controlling energization to the magnetron, an input unit for inputting a heating time, a heating output, etc. of the object to be heated, a sensor for detecting a heating state and a temperature of the object to be heated, and a failure of the microwave oven. A non-volatile storage device for storing the input information in the input section and the history of the heating operation for determining the cause is provided.

[0008]

In the microwave oven having the above-described structure, the cause of the failure can be accurately determined by the information stored in the non-volatile storage device, and the number of replacement parts can be minimized.

[0009]

DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the microwave oven of the present invention will be described with reference to FIGS. In the microwave oven of the present invention, 1 is a relay for energizing a magnetron for microwave heating an object to be heated in a heating chamber provided in the range main body, and 2 is a heating state or temperature of the object to be heated in the heating chamber. Sensor to detect, 3
Is an input section for inputting the heating time and heating output of the object to be heated,
4 is a microprocessor which is a control unit for controlling the magnetron with the heating time and heating output set by the input unit 3, 5 is a power supply for supplying voltage to the magnetron, microprocessor 4 etc., 6 is a cause of failure of the microwave oven A nonvolatile storage device, which is a non-volatile storage device that stores the input information in the input unit and the history of the heating operation for the determination, and the display unit 7 that displays information such as the heating time and the heating output.

The microwave oven having the above structure will be described with reference to the first and second flowcharts. When the power is turned on in S1, first, 1 is set in a variable X used to indicate the address of the nonvolatile memory device 6 in S2. Next, in S3, whether the key is pressed by the input unit 3 having the cancel key 8, the warm key 9, the start key 10, the menu selection key 11, the information read key 12, and the address increment key 13 as shown in FIG. If it is determined and pressed, the information indicating that the data is a key type is displayed in S4 according to FIG. 4, for example, if the menu selection key 11 is pressed here, the data type code 01 and the key Number 03
Will enter the X address, that is, the 1st address.

At S5, X is incremented by 1 to indicate the address of the next data. Next, in S6, the output state of the microwave oven is monitored, and if it is recognized that the state has changed, S6
7, data type code 02, for example, code 0 indicating range
1 enters address X. In S8, X is incremented by 1 to indicate the penalty for the next data. Next, in S9, although it is set to 1 minute here, the detection value 76 of the sensor A in the sensor 2 is stored in the X address at a certain fixed time interval.

At S10, X is incremented by 1 to indicate the address of the next data. Next, in S11, although it is assumed to be 1 minute here, the detected value 38 of the sensor B of the sensor 2 is stored in the X address at a certain fixed time interval. In S12, X is incremented by 1 to indicate the address of the next data. Then S
In 13, the detection value BC of the sensor C in the sensor 2 is stored in the X address at a certain fixed time interval, although it is set to 1 minute here.

At S14, X is incremented by 1 to indicate the address of the next data. In S15, it is confirmed whether or not a series of cooking operations have been completed, and if not, in S16, in order to indicate the address of the nonvolatile storage device 6 currently used, X at address 0
The value of is stored and the process returns to S3.

FIG. 3 is an explanatory diagram of stored contents showing an example of stored contents of the nonvolatile storage device 6 at this time. If a series of cooking operations is completed in S15, the process returns to S2 and data storage is restarted from the beginning. The data thus stored may be read out as shown in the second flowchart below, and a flow chart or the like may be created and analyzed.

When the power is turned on in S17, first, in S18, the variable X used to indicate the address of the nonvolatile memory device 6 is set to 1
Put in. Next, when it is determined that the information read key 12 is pressed in S19, the data of X and the X address are displayed on the display unit 7 in S20. Here, 02BC 05BC
An example of the display when the data is stored is shown in FIG.

When the information read key 12 is not pressed in S19 and the address increase key 13 is pressed in S21, X indicating the address is incremented by 1 in S22. X at S23
Is larger than the data at address 0 of the non-volatile storage device 6 indicating the end of the data, a warning sound is emitted in S24. If it is determined in S21 that the address increase key 13 is not pressed, the process proceeds to other key processing in S25. The series of operations can be performed any number of times by turning the power on again.

In this way, the read address and data of the non-volatile memory device 6 indicate the key operation of the user, the output operation of the device, the input value of the sensor, etc. with time after the power is turned on. Therefore, it is effective for failure analysis.

The key operation, the output operation of the device, the input value of the sensor or the like should be stored in the non-volatile storage device 6 at all times after the power is turned on. Since the amount of information that can be stored differs depending on the type, it is necessary to store all the information for at least one cooking operation.

[0019]

In the microwave oven of the present invention, the input information in the input section and the history of the heating operation are stored in the non-volatile storage device, so that the cause of the failure of the microwave oven can be accurately determined and replaced. It is possible to minimize the number of parts, prevent wasteful replacement of parts, and reduce the burden on the user.

[Brief description of drawings]

FIG. 1 is a block diagram showing an embodiment of a microwave oven of the present invention.

FIG. 2 is a front view showing an input unit and a display unit of the microwave oven of the present invention.

FIG. 3 is a memory content explanatory diagram showing an example of memory content of the nonvolatile memory device of the microwave oven of the present invention.

FIG. 4 is an explanatory diagram showing a data format of the nonvolatile memory device of the microwave oven of the present invention.

FIG. 5 is a first flowchart of the microwave oven of the present invention.

FIG. 6 is a second flowchart of the microwave oven of the present invention.

[Explanation of symbols]

 1 relay 2 sensor 3 input unit 4 microprocessor 6 non-volatile storage device 7 display unit 12 information read key 13 address increment key

Claims (1)

[Claims] 1. A magnetron for microwave-heating an object to be heated in a heating chamber provided in a range main body, a control unit for controlling energization of the magnetron, and a heating time and a heating output of the object to be heated are input. In a microwave oven consisting of an input unit and a sensor for detecting the heating state and temperature of the object to be heated, the input information and heating operation history at the input unit are stored to determine the cause of the microwave oven failure. A microwave oven provided with a non-volatile storage device.