JPH07120872B2 - Chip polarity alignment and alignment device - Google Patents
Chip polarity alignment and alignment deviceInfo
- Publication number
- JPH07120872B2 JPH07120872B2 JP607284A JP607284A JPH07120872B2 JP H07120872 B2 JPH07120872 B2 JP H07120872B2 JP 607284 A JP607284 A JP 607284A JP 607284 A JP607284 A JP 607284A JP H07120872 B2 JPH07120872 B2 JP H07120872B2
- Authority
- JP
- Japan
- Prior art keywords
- chip
- hole
- polarity
- rotating shaft
- coupling
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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- Supply And Installment Of Electrical Components (AREA)
Description
【発明の詳細な説明】 I…産業上の利用分野 近時、各種の自動チップマウント装置を使用して、抵抗
器、コンデンサー等の板形(角板形、円板形等)乃至筒
形(円筒形、円柱形等)の小型電子部品(以下単にチッ
プと略記する。)を自動的にプリント基板上に正確にマ
ウント(実装)し、該状態のままチップをプリンオ基板
上にハンダ付け等で適宜結着することが行われている。DETAILED DESCRIPTION OF THE INVENTION I ... Industrial Application Field Recently, various automatic chip mounting devices have been used to form plates (square plates, disks, etc.) or cylinders (square plates, disks, etc.) such as resistors and capacitors. A small electronic component (cylindrical, cylindrical, etc.) (hereinafter simply referred to as a chip) is automatically and accurately mounted (mounted) on the printed circuit board, and the chip can be soldered onto the printed circuit board in this state. Bonding is performed appropriately.
本発明は、各種の自動チップマウント装置において、そ
の一部分装置であるチップ自動分離供給装置、即ち、ホ
ッパー等に投入した多数のチップ送給路(例チューブ)
内に1列に分離整列して、下方の治具盤(テンプレー
ト)の所定装填孔またはピックアップマウント装置等へ
送給するチップ自動分離供給装置、のチップ送給路の途
中の任意位置に介在設置し、チップの分離送給の途中
で、該チップの+−極性、容量、抵抗値その他を検測し
得るようにした、チップの極性等検測整列装置を提供す
るものである。INDUSTRIAL APPLICABILITY The present invention is an automatic chip mounter of various types, which is a part of the automatic chip mounter, that is, a large number of chip feeding paths (example tubes) fed into a hopper or the like.
Automatically separates and feeds into one row in the inside, and inserts it at an arbitrary position in the middle of the chip feeding path of the chip automatic separating and feeding device that feeds to the predetermined loading hole of the jig board (template) below or the pickup mounting device etc. However, the present invention provides a chip polarity and other measurement alignment device that can measure + -polarity, capacitance, resistance value, etc. of the chip during the separation and feeding of the chip.
II…従来の課題と本発明の目的 (1)…上記チップには+、−の極性を有するものがあ
り(例、ダイオード、タンタルコンデンサ等)、このチ
ップを治具盤またはビックアップマウント装置等へ送給
するとき、その極性の方向を、極性の合った一定方向に
揃えなければならないが、上記ホッパーを投入された多
数のチップは全く未整理状態であり、よって、チップ送
給路中に分離送給されたチップも極性が上下まちまちで
あって、当然、そのまま治具盤その他へ送給すれば極性
が合わないことが生じるので、チップ送給路の途中に本
発明装置を備え、本装置によって、チップの極性を検測
すると共に、その極性に合わせてチップの方向整列を行
って、もって、チップの極性を一定方向へ揃えて送給す
るようにしたものであり、 (2)…抵抗、コンデンサ等のチップは、その抵抗値、
容量その他の性能をチェックする必要があるが、一旦、
不良品がプリント基板にマウントされてしまうと、その
交換は不可能であり、よって該プリント基板全部が不良
品とされてしまうのである。そこで、プリント基板へマ
ウントする以前に、本発明装置によって、チップの分離
送給の過程中に、チップ1個1個について上記各種性能
のチェックを行い、この段階で不良品の排除を可能とし
たものである。II ... Conventional problems and objects of the present invention (1) ... Some of the above chips have positive and negative polarities (eg, diodes, tantalum capacitors, etc.). When it is fed to, the direction of its polarity must be aligned with a certain direction with the same polarity, but the large number of chips loaded with the above hoppers are completely unorganized, and therefore, in the chip feeding path. The separated and fed chips also have different polarities, and naturally the polarities will not match if they are fed directly to the jig board or the like.Therefore, the device of the present invention is provided in the middle of the chip feeding path, The device measures the polarity of the chips and aligns the chips in the direction according to the polarities, so that the polarities of the chips are aligned and fed in a certain direction. (2) ... resistance, Chips such as capacitors have their resistance
It is necessary to check the capacity and other performance, but once
If a defective product is mounted on the printed circuit board, it cannot be replaced, and thus the entire printed circuit board is considered defective. Therefore, before mounting on a printed circuit board, the above-mentioned various performances of each chip are checked by the device of the present invention during the process of separating and feeding chips, and defective products can be eliminated at this stage. It is a thing.
(3)…また、本願発明者及び出願人は、上記二つの目
的を達成する他の装置として、先に特願昭57−167385号
(特公平2−44397号、特許第1623491号)、発明の名称
「チップの極性等検測装置」を出願し特許権を取得して
いるものであるが、該出願に係る発明においては、個々
のチップの寸法制度、特にその長さ寸法にバラつきがあ
ると、チップをその貫通孔内に一部停留し設定方向へ回
転してチップの検測及び排出を行う回転子の回転動作
に、ややもするとトラブルを生じる恐れがあるため、更
に研究を重ねて本発明を完成するに到ったものである。(3) Further, the inventor and the applicant of the present invention have previously proposed Japanese Patent Application No. 57-167385 (Japanese Patent Publication No. 2-44397, Japanese Patent No. 1623491), an invention as another device for achieving the above two objects. The patent application has been filed for the name "Chip polarity detection device", but in the invention according to the application, there are variations in the dimensional system of each chip, especially in its length dimension. And, there is a possibility that trouble may occur in the rotation operation of the rotor that partially retains the tip in its through hole and rotates in the set direction to inspect and eject the tip, so further research is conducted. The present invention has been completed.
III…課題を解決する手段 即ち、本発明は、チップ送給路の途中の任意位置を分断
して上部送給路と下部送給路とし、上部送給路の下端開
口部と下部送給路の上端開口部を設定寸法離隔設置し、 チップを一時停留する貫通孔を垂直に貫設し、時計方向
もしくは反時計方向へ設定角度回転自在及び設定寸法前
進後退自在に設けた回転軸を、前記下端開口部と上端開
口部間に設置し、 該回転軸の貫通孔を、当初は上部送給路の下端開口部と
連通し、回転軸の前進位置で下部送給路の上端開口部と
連通するように備え、 また、前進位置の回転軸の左右水平位置に検測用の端子
を設置して成り、 チップの、上部送給路から垂直連通した回転軸の貫通孔
内への落下供給、該回転軸の時計方向もしくは反時計方
向への設定角度回転による貫通孔内チップの水平位置停
留、回転軸の設定寸法前進、同位置におけるチップと端
子の接触による極性等の検測、同位置における回転軸の
時計方向もしくは反時計方向への設定角度回転による極
性を一定方向に揃えたチップの下部送給路への排出、回
転軸の時計方向もしくは反時計方向への設定角度回転と
設定寸法後退による原状復帰、を繰り返し行うことによ
り、チップの極性等を検測し極性を一定方向に揃えて送
給するようにしたことを特徴とする、チップの極性等検
測整列装置 によって、上記の課題を解決したものである。III. Means for Solving the Problem That is, according to the present invention, an arbitrary position in the middle of the chip feeding path is divided into an upper feeding path and a lower feeding path, and a lower end opening of the upper feeding path and a lower feeding path. The upper end opening of the above is installed with a set dimension, the through hole for temporarily retaining the chip is vertically penetrated, and the rotary shaft provided with the set angle rotatable and set dimension forward and backward freely in the clockwise or counterclockwise direction, Installed between the lower end opening and the upper end opening, the through hole of the rotary shaft is initially communicated with the lower end opening of the upper feed passage, and is communicated with the upper end opening of the lower feed passage at the forward position of the rotary shaft. In addition, the inspection terminal is installed at the left and right horizontal positions of the rotating shaft in the forward position, and the chip is dropped and supplied into the through hole of the rotating shaft vertically connected from the upper feed path. Insert in the through hole by rotating the rotating shaft clockwise or counterclockwise by a set angle Horizontal position stop, advance of set dimension of rotary shaft, inspection of polarity etc. by contact between tip and terminal at the same position, polarity of rotary shaft at the same position rotated by set angle clockwise or counterclockwise is aligned in a certain direction By discharging the tip to the lower feed path, rotating the rotating shaft clockwise or counterclockwise at a set angle and returning to the original state by retracting the set dimension, the polarity of the tip is measured and the polarity is kept constant. The above-mentioned problems are solved by a device for aligning and measuring the polarity of chips, which is characterized in that they are fed in the same direction.
IV…実施例−1 以下、本発明の実施例を図面(第1図乃至第3図)につ
き順次説明すると、 各種の自動チップマウント装置における、チップ自動分
離供給装置のチップ送給路(例、チューブ)の途中の任
意位置を分断して上部送給路A1と下部送給路A2とし、上
部送給路A1の下端開口部1と下部送給路A2の上端開口部
2を設定寸法l離隔設置し、 チップtを一時停留する貫通孔3を垂直に貫設し、時計
方向もしくは反時計方向へ設定角度回転自在、かつ設定
寸法l(上記1と2間の寸法と同寸法)前進後退自在に
設けた回転軸Bを前記下端開口部1と上端開口部2間に
設置し、 該回転軸Bの貫通孔3を、当初は上部送給路A1の下端開
口部1と連通し、回転軸Bの前進位置で下部送給路A2の
上端開口部2と連通するように備え、 また、前進位置の回転軸Bの左右水平位置に検測用の端
子4を設置して成り、 チップtの、上部送流路A1から回転軸Bの貫通孔3内へ
の落下供給、該回転軸Bの時計方向もしくは反時計方向
及び設定角度(例、時計方向へ90゜)回転による貫通孔
3内チップtの水平停留、回転軸Bの設定寸法l前進、
同前進位置におけるチップtと端子4の接触による+−
極性等の検測、同位置における回転軸Bの時計方向もし
くは反時計方向及び設定角度(例、時計方向または反時
計方向へ90゜)回転による極性を一定方向に揃えたチッ
プの下部送路A2への排出、回転軸Bの時計方向もしくは
反時計方向への設定角度(例、時計方向または反時計方
向へ180゜または360゜)回転と設定寸法l後退による原
状復帰、を繰り返し行うことにより、チップの極性等を
検測し極性を一定方向に揃えて送給するようにして、本
発明チップの極性等検測整列装置を構成したものであ
る。IV ... Example-1 Hereinafter, an example of the present invention will be sequentially described with reference to the drawings (FIGS. 1 to 3). In various automatic chip mounting apparatuses, a chip feeding path of an automatic chip separation / feeding apparatus (eg, The upper feed path A 1 and the lower feed path A 2 are divided by separating arbitrary positions in the middle of the tube), and the lower end opening 1 of the upper feed path A 1 and the upper end opening 2 of the lower feed path A 2 are separated. The set dimension l is installed at a distance, the through hole 3 for temporarily retaining the tip t is vertically penetrated, and the set angle can be rotated clockwise or counterclockwise by a set angle, and the set dimension l (same as the dimension between 1 and 2 above). ) A rotating shaft B provided so as to be able to move forward and backward is installed between the lower end opening 1 and the upper end opening 2, and the through hole 3 of the rotating shaft B is initially set to the lower end opening 1 of the upper feeding path A 1. It is provided so as to communicate with the upper end opening 2 of the lower feeding path A 2 at the forward position of the rotating shaft B. The terminal 4 for inspection is installed at the left and right horizontal positions of the rotary shaft B of the chip t, and the chip t is dropped and supplied from the upper flow passage A 1 into the through hole 3 of the rotary shaft B. The tip t in the through hole 3 is horizontally stopped by rotating clockwise or counterclockwise and a set angle (eg, 90 ° clockwise), and the set dimension l of the rotation axis B is advanced.
+-Due to contact between the tip t and the terminal 4 at the same forward position
The lower feed path A of the chip that aligns the polarity in a fixed direction by the inspection of the polarity, etc., and the rotation or rotation of the rotation axis B at the same position in the clockwise or counterclockwise direction and the set angle (eg, 90 ° clockwise or counterclockwise). By ejecting to 2 , rotating the rotation axis B clockwise or counterclockwise at a set angle (eg 180 ° or 360 ° clockwise or counterclockwise) and returning to the original state by retracting the set dimension l. The chip polarity / inspection alignment device of the present invention is configured so that the chip polarities and the like are measured and the polarities are aligned and fed in a fixed direction.
V…作用(実施例1) 上記実施例構成において、その作用につき説明すれば、
(第3図参照) (1)…ホッパー等(図示せず)から分離されて上部送
給路A1内に垂直方向1列に連続している多数のチップt
の最下位のチップtが回転軸Bの垂直な貫通孔3内に落
下装填され、該送給路A1は下方へ連通していないので、
同貫通孔3内に停留される。(第3図の(イ)) (2)…ついで、回転軸Bを、例えば、時計方向へ90゜
回転して、貫通孔3内のチップtを水平状態にする。V ... Operation (Embodiment 1) The operation of the above embodiment will be described below.
(Refer to FIG. 3) (1) ... A large number of chips t which are separated from a hopper or the like (not shown) and are continuous in one line in the vertical direction in the upper feed path A 1 .
Since the lowest chip t of is dropped into the through hole 3 perpendicular to the rotation axis B and the feed path A 1 does not communicate downward,
It is stopped in the through hole 3. ((A) in FIG. 3) (2) ... Then, the rotating shaft B is rotated, for example, by 90 ° in the clockwise direction to bring the tip t in the through hole 3 into a horizontal state.
(3)…次に、回転軸Bを設定寸法l、即ち、その貫通
孔3位置が下部送給路A2の上端開口部2の直上に到る位
置まで適宜前進させ、この位置に設置されている極性等
検測用の端子4にチップt両端を接触させて+−極性等
を検測する。(第3図の(ロ)) (4)…その検測結果によって発せられる指令によって
回転軸Bを、例えば、−極を下向きに整列して送給する
場合に、(ハ)aの場合は反時計方向へ90゜回転し、
(ハ)bの場合は時計方向へ90゜回転し、この回転によ
ってチップtは、貫通孔3と連通状態となる下部送給路
A2の上端開口部2へ、−極を下向きに揃えて排出され
る。(第3図の(ハ)、(ニ)) (5)…チップtの排出を終えた回転軸Bは、時計方向
または反時計方向へ復元回動して貫通孔3が垂直な状態
に戻り、また、前進寸法lと同寸法l後退して原位置に
復帰し、再び上部送給路A1の下端開口部1と貫通孔3が
連通状態となるので、該貫通孔3内に次位のチップが落
下装填される。(3) ... Next, the rotary shaft B is appropriately advanced to a set dimension l, that is, the position of the through hole 3 is directly above the upper end opening 2 of the lower feed path A 2 , and the rotary shaft B is installed at this position. Both ends of the chip t are brought into contact with the terminal 4 for detecting the polarity and the like, and the + -polarity and the like are measured. ((B) in FIG. 3) (4) ... In the case of (c) a, when the rotational axis B is fed by the command issued by the measurement result, for example, the negative pole is aligned downward. Rotate 90 degrees counterclockwise,
(C) In the case of (b), it rotates 90 ° clockwise, and this rotation causes the tip t to be in communication with the through hole 3.
It is discharged to the upper end opening 2 of A 2 with the negative pole aligned downward. ((C) and (d) in FIG. 3) (5) ... The rotating shaft B which has finished discharging the tip t is restored and rotated clockwise or counterclockwise to return the through hole 3 to the vertical state. Further, the same size l as the forward dimension l is retracted to return to the original position, and the lower end opening 1 of the upper feeding path A 1 and the through hole 3 are in communication with each other, so that the through hole 3 is next in position. Chips are dropped and loaded.
(6)…上記(1)〜(5)の作用の繰り返しによっ
て、チップ送給路内のチップは+−極性を一定方向に整
列されて、また必要に応じて種々の検測が行われて、下
方の治具盤等へ高速連続送給されることとなる。(6) By repeating the operations of the above (1) to (5), the chips in the chip feeding path are aligned in the positive and negative polarities in a certain direction, and various inspections are performed as necessary. It will be continuously fed at a high speed to the lower jig board.
(7)…また、整列する極性を上記は変える場合には
(例、+極を下向き)、それに合わせて回転軸の回転方
向及び角度を適宜設定すれば可である。(7) Further, when the polarity to be aligned is changed from the above (for example, the + pole is directed downward), the rotation direction and the angle of the rotary shaft can be appropriately set accordingly.
(8)…なお、チップの容量や抵抗値等の測定を目的と
するときは、端子4に接続するアンプを目的のものに交
換して行い、例えば、検測の結果、不良チップを検出し
たときには、それをオペレーターに指示し、不良チップ
を検出したチップ送給路の位置や番号等をオペレーター
のモニターテレビに表示する等の処置を行い、 (9)…また、例えば、不良チップ排出路Eを設け(第
2図)、不良チップだけを該路Eから排出するようにし
てもよい。この時は、例えば、純正チップは回転軸Bを
90゜時計方向または反時計方向へ回転して下部チップ送
給路A2へ落下送給し、不良チップは回転軸Bを45゜反時
計方向へ回転すると共に排出路Eを閉止していた片15を
開いて、不良チップ排出炉Eへ排出するように設ける。(8) When the chip capacitance or resistance value is to be measured, the amplifier connected to the terminal 4 is replaced with a target amplifier, and, for example, a defective chip is detected as a result of inspection. Occasionally, the operator is instructed to do so, and the position, number, etc. of the chip feed path where the defective chip is detected are displayed on the operator's monitor TV, and (9) ... Also, for example, the defective chip discharge path E May be provided (FIG. 2), and only the defective chip may be discharged from the path E. At this time, for example, the genuine tip has the rotation axis B
Rotate 90 ° clockwise or counterclockwise to drop chip feed path A 2 and feed the defective chip. Rotating shaft B rotates 45 ° counterclockwise and the discharge path E is closed. 15 is opened and provided so as to discharge to the defective chip discharge furnace E.
VI…実施例2 第4図乃至第7図に示すものは、本発明装置の回転軸3
を中心とした主要部分の具体的構成の実施例である。VI ... Embodiment 2 What is shown in FIGS. 4 to 7 is the rotary shaft 3 of the device of the present invention.
It is an example of a specific configuration of the main part centered on.
即ち、該実施例につき説明すれば、上記と同じく、各種
の自動チップマウント装置における、チップ自動分離供
給装置のチップ送給路の途中の任意位置を分断して上部
送給路A1と下部送給路A2とし、上部送給路A1の下端開口
部1と下部送給路A2の上端開口部2を設定寸法l離隔設
置し、先端部にチップtを一時停留する貫通孔3を垂直
に貫設した回転軸Bを前記下端開口部1と上端開口部2
間に設置し、 該回転軸Bの貫通孔3を、当初は上部送給路A1の下端開
口部1と連通し、回転軸Bの前進位置で下部送給路A2の
上端開口部2と連通するように備え、 また、前進位置の回転軸Bの左右水平位置に検測用の端
子4を設置し、 上記回転軸Bの後端部をカップリングCの中心軸孔5の
前端に挿入固着して、カップリングCと一体に設け、 該カップリングCは、先端部の外周面に平坦部6、こう
配部6′及び山頂部7を連続形成すると共に該山頂部7
の内方に凹欠部8を形成したカム部9を穿設し、該カム
部9後方に中心軸孔5に貫通したスリット10を切設し
て、該スリット10内に摺動自在に嵌挿したキー11に、中
心軸孔5の後端から緩挿したパルスモータDの回転軸12
を固着して、カップリング及びそれに固着した回転軸12
が、スリット10内のキー11を案内として設定寸法lだけ
前進後退自在に、及びパルスモータDの回転によって時
計方向もしくは反時計方向へ設定角度回転自在に設け、
また、定位置にカムローラ13を設置し、カップリングC
とパルスモータD間に設置したスプリング14の弾発力
で、カムローラ13をカム部9に常時圧接せしめて、チッ
プの極性等検測整列装置を構成したものである。That is, to explain the embodiment, similarly to the above, in various automatic chip mounting apparatuses, an arbitrary position in the middle of the chip feeding path of the automatic chip separating and feeding apparatus is divided to separate the upper feeding path A 1 and the lower feeding path. The feed path A 2 is provided, and the lower end opening 1 of the upper feed path A 1 and the upper end opening 2 of the lower feed path A 2 are installed at a set distance l, and a through hole 3 for temporarily retaining the tip t is provided at the tip end. The axis of rotation B that extends vertically extends through the lower end opening 1 and the upper end opening 2
Installed in between, the through hole 3 of the rotating shaft B is initially communicated with the lower end opening 1 of the upper feeding path A 1 , and the upper opening 2 of the lower feeding path A 2 is in the forward position of the rotating shaft B. The terminal 4 for inspection is installed at the left and right horizontal positions of the rotating shaft B at the forward position, and the rear end of the rotating shaft B is provided at the front end of the central shaft hole 5 of the coupling C. It is inserted and fixed and provided integrally with the coupling C. The coupling C has a flat portion 6, a gradient portion 6'and a mountain top portion 7 which are continuously formed on the outer peripheral surface of the tip portion thereof, and the mountain top portion 7 is formed.
A cam portion 9 having a recessed portion 8 formed therein is bored, and a slit 10 penetrating the central shaft hole 5 is cut behind the cam portion 9 so as to be slidably fitted in the slit 10. The key 11 is inserted into the rotary shaft 12 of the pulse motor D which is loosely inserted from the rear end of the central shaft hole 5.
To secure the coupling and the rotary shaft 12 secured to it.
However, the key 11 in the slit 10 is used as a guide so as to be able to move forward and backward by a set dimension 1 and to be rotated by a set angle in a clockwise or counterclockwise direction by rotation of the pulse motor D.
In addition, the cam roller 13 is installed at a fixed position and the coupling C
The cam roller 13 is constantly brought into pressure contact with the cam portion 9 by the elastic force of the spring 14 installed between the pulse motor D and the pulse motor D to form a tip polarity and other inspection and alignment device.
VII…作用(実施例2) 上記実施例装置の作用をチップtの−極を下向きに整列
して送給する場合につき説明すると、 (1)…上部送給路A1内に1列に連続している多数のチ
ップtの最下位のチップtが回転軸Bの垂直な貫通孔3
内に落下装填され、該孔内に停留される。(第4図の
(イ)) この時カムローラ13はカップリングCのカム部9の山頂
部7(90゜位置)上に圧接している。(第7図参照、同
図はカム部9形状の展開図で、説明の都合上,実際とは
反対に、不動定位置にあるカムローラ13の方が移動し、
カム部9が不動の如く示す。) (2)…ついで、パルスモータDを回転し、カップリン
グCを介して回転軸Bを時計方向へ90゜回転し、貫通孔
3即ちその内のチップtを水平状態にする。なお、パル
スモータDの回転は、その回転軸12→カップリングCの
スリット10内に嵌挿したキー11→該キー11とスリット10
内面との衝突同転→カップリングCの中心軸孔5に後端
部を固着した回転軸Bの回転、の順に伝達される。VII ... Operation (Embodiment 2) The operation of the apparatus of the above embodiment will be described in the case where the negative electrode of the tip t is aligned downward for feeding. (1) ... Continuously in one line in the upper feeding path A 1 . The lowest chip t of the many chips t that are running is the through hole 3 perpendicular to the rotation axis B.
It is dropped and loaded into the hole and is retained in the hole. ((A) in FIG. 4) At this time, the cam roller 13 is pressed against the crest portion 7 (90 ° position) of the cam portion 9 of the coupling C. (Refer to FIG. 7, which is a development view of the shape of the cam portion 9. For convenience of explanation, the cam roller 13 in the stationary fixed position moves, contrary to the actual situation,
The cam portion 9 is shown as immovable. (2) ... Then, the pulse motor D is rotated and the rotary shaft B is rotated 90 ° clockwise through the coupling C to bring the through hole 3, that is, the tip t therein into a horizontal state. The rotation of the pulse motor D is performed by rotating the rotary shaft 12 → the key 11 fitted in the slit 10 of the coupling C → the key 11 and the slit 10.
The rotation is transmitted in the order of collision with the inner surface and rotation of the rotary shaft B having its rear end fixed to the central shaft hole 5 of the coupling C.
この回転の過程でカムローラ13は山頂部7から落ちて平
坦部6の0゜(=360゜)位置に到る。In the course of this rotation, the cam roller 13 falls from the peak 7 and reaches the 0 ° (= 360 °) position of the flat portion 6.
よって、上記カムローラ13の山頂部7(90゜位置)から
0゜位置(平坦部6)への落下で、スプリング14に常時
押圧されているカップリングC即ち回転軸Bは落下寸法
lだけ前進して、その貫通孔3が下部送給路A2の上端開
口部2の直上に到る。Therefore, when the cam roller 13 drops from the crest 7 (90 ° position) to the 0 ° position (flat portion 6), the coupling C, that is, the rotating shaft B, which is constantly pressed by the spring 14, advances by the falling dimension l. Then, the through hole 3 reaches immediately above the upper end opening 2 of the lower feeding path A 2 .
(3)…而して上記位置において水平状態にあるチップ
tと同じ水平位置に設置されている検測用の端子4がチ
ップtの両端に接触して極性等の検測が行われ、 その検測結果をオペレーターに指示し、該指示によっ
て、パルスモータDが第3図(ハ)aの場合は、反時計
方向へ90゜回転し〔第7図、0゜(=360゜)位置から9
0゜位置即ち凹欠部8内に到る。〕、−極を下向きにし
て上端開口部2へ排出され、第3図(ハ)bの場合は、
時計方向へ90゜回転し〔第7図、360゜(=0゜)位置
から270゜位置に到る。〕、同じく−極を下向きにして
上端開口部2へ排出される。(第3図、(ニ)a、
(ニ)b) (4)…チップtを下部送給路A2へ排出した回転軸B
は、(ニ)aの場合は、時計方向へ360゜回転し(第7
図、90゜位置から0゜=360゜、270゜、180゜を経て90
゜位置の山頂部7に復帰する。)、(ニ)bの場合は、
時計方向へ180゜回転し(第7図、270゜位置から180゜
を経て90゜位置の山頂部7に復帰する。)、共にカムロ
ーラ13が平坦部6からこう配6′を登って山頂部7に到
るため、その上昇寸法l(前記落下寸法lと同寸法)だ
け回転軸bが後退し、よって回転復元した貫通孔3が原
位置で上部送給路A1の下端開口部1と連通し、次位のチ
ップtが同孔3内に落下装填される。(3) Then, the terminals 4 for inspection installed at the same horizontal position as the chip t in the horizontal state at the above-mentioned position come into contact with both ends of the chip t to perform the inspection of the polarity and the like. Instruct the operator of the inspection result, and in the case of the instruction, the pulse motor D rotates 90 ° counterclockwise in the case of Fig. 3 (c) a [Fig. 7, from 0 ° (= 360 °) position] 9
It reaches the 0 ° position, that is, the inside of the recessed portion 8. ], − With the pole facing downward, and discharged to the upper end opening 2. In the case of FIG.
It rotates 90 ° clockwise [from Fig. 7, 360 ° (= 0 °) position to 270 ° position. ] Similarly, it is discharged to the upper end opening 2 with the negative electrode facing downward. (Fig. 3, (d) a,
(D) b) (4) ... Rotating shaft B that ejects the tip t to the lower feeding path A 2 .
In the case of (d) a, rotate 360 ° clockwise (7th
From the 90 ° position in the figure, go through 0 ° = 360 °, 270 °, 180 °, 90
Return to the summit 7 at the ° position. ), (D) b,
It rotates 180 ° clockwise (in FIG. 7, it returns from the 270 ° position to 180 ° and then to the 90 ° mountain top 7), and the cam roller 13 climbs up the slope 6'from the flat part 6 and the mountain top 7 moves. Therefore, the rotation axis b retreats by the ascending dimension l (the same dimension as the falling dimension l), and thus the rotationally restored through hole 3 communicates with the lower end opening 1 of the upper feeding path A 1 at the original position. Then, the next chip t is dropped and loaded into the hole 3.
(5)…上記(1)〜(4)の作用の繰り返しによっ
て、チップ送給路内のチップtは+−極性を一定方向に
整列されて、また必要に応じて種々の検測が行われて、
下方の治具盤等へ高速連続供給されることとなる。(5) By repeating the operations of the above (1) to (4), the tips t in the tip feeding path are aligned in the positive and negative polarities in a certain direction, and various inspections are performed as necessary. hand,
It will be continuously supplied at a high speed to the jig board below.
(6)…また、整列する極性を上記と変える場合には、
回転軸Bの回転方向を上記(3)、(4)と逆方向にす
れば可である。(6) ... Also, when changing the polarity to be aligned from the above,
It is possible to set the rotation direction of the rotating shaft B to the opposite direction to the above (3) and (4).
VIII…効果 (1)…チップには+、−の極性を有するものがあり
(例、ダイオード、タンタルコンデンサ等)、このチッ
プを治具盤またはピックアップマウント装置等へ送給す
るとき、その極性の方向を、極性の合った一定方向に揃
えなければならないが、本発明装置は、チップ送給路中
を極性が上下まちまちの未整理の状態で送給されてくる
チップの極性を検測すると共に、その極性に合わせて方
向整列を行い、もって、チップを一定方向に揃えて高速
送給し得る秀れた特長がある。VIII ... Effect (1) ... Some chips have + and-polarity (eg, diodes, tantalum capacitors, etc.). When this chip is fed to a jig board or a pick-up mount device, etc. The direction must be aligned in a fixed direction with the same polarity, but the device of the present invention detects the polarity of the chips fed in an unsorted state in which the polarities are varied up and down in the chip feeding path. , It has an excellent feature that it can align the chips in a certain direction for high-speed feeding by aligning the direction according to the polarity.
(2)…また、抵抗、コンデンサ等のチップは、その抵
抗値、容量その他の性能をプリント基板にマウントする
前にチェックすることが必須とされており、万一、不良
チップがプリント基板に一旦マウントされてしまうと、
該プリント基板全体が不良品とされる恐れがあるが、本
発明装置はチップの分離供給の過程中にチップ1個1個
に上記各種のチェックを行い得て、この段階で不良チッ
プを排除し得る秀れた効果がある。(2) ... In addition, it is essential to check the resistance, capacitance, and other performance of chips such as resistors and capacitors before mounting them on the printed circuit board. Once mounted,
Although the entire printed circuit board may be defective, the device of the present invention can perform the above-mentioned various checks on each chip during the process of separating and supplying the chips, and reject the defective chips at this stage. It has an excellent effect.
第1図は本発明装置の実施例1の構成概略を示す正面断
面図、 第2図はそのA′−A″断面図、 第3図の(イ)、(ロ)、(ハ)、(ニ)は作用順序を
示す説明図、 第4図は具体的構成の実施例2の一部切断正面図で、
(イ)は回転軸が原位置にある図、(ロ)は回転軸が設
定寸法前進した図、 第5図はそのB′−B″断面図、 第6図は第4図の構成要部の斜視図、 第7図はカム部の展開図でカムローラとの作用関係を示
す図。 符号 A1……上部送給路 A2……下部送給路 B……回転軸 C……カップリング D……パルスモータ E……不良チップ排出孔 t……チップ l……設定前進後退寸法 1……下端開口部 2……上端開口部 3……貫通孔 4……端子 5……中心軸孔 6……平坦部 6′……こう配部 7……山頂部 8……凹欠部 9……カム部 10……スリット 11……キー 12……回転軸(パルスモータ) 13……カムローラ 14……スプリング 15……閉止片FIG. 1 is a front sectional view showing a schematic configuration of the first embodiment of the device of the present invention, FIG. 2 is a sectional view taken along the line A′-A ″, and FIG. 3 (a), (b), (c), ( D) is an explanatory view showing the order of action, and FIG. 4 is a partially cutaway front view of the second embodiment having a specific configuration.
(A) is a view in which the rotary shaft is in the original position, (b) is a view in which the rotary shaft is moved forward by the set dimension, FIG. 5 is its B'-B ″ cross-sectional view, and FIG. 6 is a main part of the configuration of FIG. Fig. 7 is a developed view of the cam section showing the working relationship with the cam roller Symbol A 1 ...... Upper feed path A 2 ...... Lower feed path B ...... Rotary axis C ...... Coupling D ... Pulse motor E ... Defective tip discharge hole t ... Chip l ... Set forward / backward dimension 1 ... Lower end opening 2 ... Upper end opening 3 ... Through hole 4 ... Terminal 5 ... Center axis hole 6 ... Flat part 6 '... Gradient part 7 ... Peak part 8 ... Recessed part 9 ... Cam part 10 ... Slit 11 ... Key 12 ... Rotating shaft (pulse motor) 13 ... Cam roller 14 ... … Spring 15… Closure piece
Claims (2)
上部送給路と下部送給路とし、上部送給路の下端開口部
と下部送給路の上端開口部を設定寸法離隔設置し、 チップを一時停留する貫通孔を垂直に貫設し、時計方向
もしくは反時計方向へ設定角度回転自在及び設定寸法前
進後退自在に設けた回転軸を、前記下端開口部と上端開
口部間に設置し、 該回転軸の貫通孔を、当初は上部送給路の下端開口部と
連通し、回転軸の前進位置で下部送給路の上端開口部と
連通するように備え、 また、前進位置の回転軸の左右水平位置に検測用の端子
を設置して成り、 チップの、上部送給路から垂直連通した回転軸の貫通孔
内への落下供給、該回転軸の時計方向もしくは反時計方
向への設定角度回転による貫通孔内チップの水平位置停
留、回転軸の設定寸法前進、同位置におけるチップと端
子の接触による極性等の検測、同位置における回転軸の
時計方向もしくは反時計方向への設定角度回転による極
性を一定方向に揃えたチップの下部送給路への排出、回
転軸の時計方向もしくは反時計方向への設定角度回転と
設定寸法後退による原状復帰、を繰り返し行うことによ
り、チップの極性等を検測し極性を一定方向に揃えて送
給するようにしたことを特徴とする、チップの極性等検
測整列装置。1. An upper feed path and a lower feed path are divided by dividing an arbitrary position in the middle of the chip feed path, and a lower end opening of the upper feed path and an upper opening of the lower feed path are separated by a set dimension. Installed, the through-hole for temporarily retaining the chip is vertically penetrated, and the rotary shaft is provided between the lower end opening and the upper end opening so that the rotating shaft can be rotated clockwise or counterclockwise by the set angle and the set dimension can be moved forward and backward. The through hole of the rotary shaft is initially connected to the lower end opening of the upper feed passage so as to communicate with the upper end opening of the lower feed passage at the forward position of the rotary shaft. It is made by installing the terminals for inspection at the left and right horizontal positions of the rotating shaft, and the chip is dropped into the through hole of the rotating shaft vertically connected from the upper feed path, and the chip is rotated clockwise or counterclockwise. The horizontal position of the insert in the through hole is stopped and the rotation axis is set by rotating the set angle in the clockwise direction. Dimensional advancement, inspection of polarity etc. by contact between tip and terminal at the same position, to lower feed path of chip where polarity is aligned in a certain direction by clockwise or counterclockwise rotation of the rotating shaft at the same position The chip polarity is measured and the polarity is aligned in a certain direction by repeatedly ejecting, rotating the rotating shaft clockwise or counterclockwise by a set angle, and returning to the original state by retracting the set dimensions. A device for detecting and arranging chip polarities, etc.
等検測整列装置において、 前記回転軸は、先端部にチップを一時停留する貫通孔を
垂直に貫設し、後端部をカップリングの中心軸孔の前端
に挿入固着して、該カップリングと一体に設けたもので
あり、 該カップリングは、先端部の外周面に平坦部、こう配部
及び山頂部を連続形成すると共に該山頂部の内方に凹欠
部を形成したカム部を突設し、該カム部後方に中心軸孔
に貫通したスリットを切設して、該スリット内に摺動自
在に嵌挿したキーに、中心軸孔の後端から緩挿したパル
スモータの回転軸を固着して、カップリング及びそれに
固着したパルスモータの回転軸が、スリット内のキーを
案内として設定寸法前進後退自在に、及びパルスモータ
の回転によって時計方向もしくは反時計方向へ設定角度
回転自在に設け、また、定位置にカムローラを設置し、
カップリングとパルスモータ間に設置したスプリングの
弾発力で、カムローラをカム部に常時圧接せしめたもの
である、チップの極性等検測整列装置。2. The chip polarity alignment measuring and aligning device according to claim 1, wherein the rotating shaft vertically penetrates a through hole for temporarily retaining the chip at a tip portion, and a rear end portion of the rotating shaft. The coupling is integrally fixed to the front end of the central axis hole of the coupling and provided integrally with the coupling. The coupling has a flat portion, a gradient portion and a peak portion continuously formed on the outer peripheral surface of the tip portion. A key in which a cam portion having a recessed portion is formed inwardly of the mountain top, and a slit penetrating the central shaft hole is cut behind the cam portion and slidably fitted in the slit. , The rotation shaft of the pulse motor loosely inserted from the rear end of the central shaft hole is fixed, and the rotation shaft of the coupling and the pulse motor fixed to the coupling can move forward and backward by the set dimension with the key in the slit as a guide, and Clockwise or counterclockwise depending on the rotation of the pulse motor Provided freely set angle rotation direction, also established the cam roller in place,
Chip polarity and other inspection alignment device, in which the cam roller is constantly pressed against the cam part by the elastic force of the spring installed between the coupling and the pulse motor.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP607284A JPH07120872B2 (en) | 1984-01-17 | 1984-01-17 | Chip polarity alignment and alignment device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP607284A JPH07120872B2 (en) | 1984-01-17 | 1984-01-17 | Chip polarity alignment and alignment device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS60149198A JPS60149198A (en) | 1985-08-06 |
JPH07120872B2 true JPH07120872B2 (en) | 1995-12-20 |
Family
ID=11628368
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP607284A Expired - Lifetime JPH07120872B2 (en) | 1984-01-17 | 1984-01-17 | Chip polarity alignment and alignment device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH07120872B2 (en) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4553617B2 (en) * | 2004-03-25 | 2010-09-29 | 有限会社ナカミチ | Directional alignment device for parts |
JP4591758B2 (en) * | 2004-10-05 | 2010-12-01 | 株式会社マシンエンジニアリング | Turning unit |
JP4822152B2 (en) * | 2005-04-26 | 2011-11-24 | 株式会社マシンエンジニアリング | Inversion unit |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS52108578A (en) * | 1976-03-08 | 1977-09-12 | Nitto Seiko Kk | Device for providing direction of part |
JPS594100A (en) * | 1982-06-30 | 1984-01-10 | 株式会社東京ウエルズ | Device for arranging polarity of semiconductor element |
JPS5970338U (en) * | 1982-10-29 | 1984-05-12 | 日本電気ホームエレクトロニクス株式会社 | Polar alignment device for leadless components |
-
1984
- 1984-01-17 JP JP607284A patent/JPH07120872B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPS60149198A (en) | 1985-08-06 |
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