JPH07109413B2 - 化学感応性変換器 - Google Patents

化学感応性変換器

Info

Publication number
JPH07109413B2
JPH07109413B2 JP1508448A JP50844889A JPH07109413B2 JP H07109413 B2 JPH07109413 B2 JP H07109413B2 JP 1508448 A JP1508448 A JP 1508448A JP 50844889 A JP50844889 A JP 50844889A JP H07109413 B2 JPH07109413 B2 JP H07109413B2
Authority
JP
Japan
Prior art keywords
support plate
diaphragm
measuring electrode
transducer
converter according
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1508448A
Other languages
English (en)
Japanese (ja)
Other versions
JPH03502135A (ja
Inventor
ノルベルト ハンプ
クリストフ ブロイヒル
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of JPH03502135A publication Critical patent/JPH03502135A/ja
Publication of JPH07109413B2 publication Critical patent/JPH07109413B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/26—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
    • G01N27/403—Cells and electrode assemblies
    • G01N27/414—Ion-sensitive or chemical field-effect transistors, i.e. ISFETS or CHEMFETS
    • G01N27/4148—Integrated circuits therefor, e.g. fabricated by CMOS processing
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805—Shape
    • H01L2224/4809—Loop shape
    • H01L2224/48091—Arched
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732—Location after the connecting process
    • H01L2224/73251—Location after the connecting process on different surfaces
    • H01L2224/73265—Layer and wire connectors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/30—Technical effects
    • H01L2924/301—Electrical effects
    • H01L2924/3011—Impedance
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/30—Technical effects
    • H01L2924/301—Electrical effects
    • H01L2924/3025—Electromagnetic shielding

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Electrochemistry (AREA)
  • Molecular Biology (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Fluid Adsorption Or Reactions (AREA)
JP1508448A 1988-08-11 1989-08-09 化学感応性変換器 Expired - Lifetime JPH07109413B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE3827314A DE3827314C1 (enExample) 1988-08-11 1988-08-11
DE3827314.4 1988-08-11
PCT/DE1989/000525 WO1990001694A1 (de) 1988-08-11 1989-08-09 Chemosensitiver wandler

Publications (2)

Publication Number Publication Date
JPH03502135A JPH03502135A (ja) 1991-05-16
JPH07109413B2 true JPH07109413B2 (ja) 1995-11-22

Family

ID=6360663

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1508448A Expired - Lifetime JPH07109413B2 (ja) 1988-08-11 1989-08-09 化学感応性変換器

Country Status (5)

Country Link
US (1) US5039390A (enExample)
EP (1) EP0382831B1 (enExample)
JP (1) JPH07109413B2 (enExample)
DE (2) DE3827314C1 (enExample)
WO (1) WO1990001694A1 (enExample)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5648416A (en) * 1992-01-21 1997-07-15 Monsanto Company Corrosion resistant paint
DE4228609C1 (de) * 1992-08-28 1994-01-20 Fraunhofer Ges Forschung Vorrichtung zur Messung von Ionenkonzentrationen in Lösungen
SE510733C2 (sv) 1995-01-03 1999-06-21 Chemel Ab Kemisk sensor baserad på utbytbar igenkänningskomponent samt användning därav
US5944970A (en) * 1997-04-29 1999-08-31 Honeywell Inc. Solid state electrochemical sensors
DE19857953C2 (de) * 1998-12-16 2001-02-15 Conducta Endress & Hauser Vorrichtung zum Messen der Konzentration von Ionen in einer Meßflüssigkeit
US6387724B1 (en) 1999-02-26 2002-05-14 Dynamics Research Corporation Method of fabricating silicon-on-insulator sensor having silicon oxide sensing surface
US6653653B2 (en) 2001-07-13 2003-11-25 Quantum Logic Devices, Inc. Single-electron transistors and fabrication methods in which a projecting feature defines spacing between electrodes
US6483125B1 (en) 2001-07-13 2002-11-19 North Carolina State University Single electron transistors in which the thickness of an insulating layer defines spacing between electrodes
US8506550B2 (en) * 2001-09-07 2013-08-13 Medtronic Minimed, Inc. Method and system for non-vascular sensor implantation
US8465466B2 (en) * 2001-10-23 2013-06-18 Medtronic Minimed, Inc Method and system for non-vascular sensor implantation
US6673717B1 (en) 2002-06-26 2004-01-06 Quantum Logic Devices, Inc. Methods for fabricating nanopores for single-electron devices
US7736309B2 (en) * 2002-09-27 2010-06-15 Medtronic Minimed, Inc. Implantable sensor method and system
JP2005077210A (ja) * 2003-08-29 2005-03-24 National Institute For Materials Science 生体分子検出素子及びそれを用いた核酸解析方法
JP4669213B2 (ja) 2003-08-29 2011-04-13 独立行政法人科学技術振興機構 電界効果トランジスタ及び単一電子トランジスタ並びにそれを用いたセンサ
US8415177B2 (en) * 2010-06-30 2013-04-09 Life Technologies Corporation Two-transistor pixel array
WO2015071774A1 (en) 2013-11-18 2015-05-21 Indian Oil Corporation Limited A process and a system for enhancing liquid yield of heavy hydrocarbon feed stock
US10960382B2 (en) 2013-11-18 2021-03-30 Indian Oil Corporation Limited Catalyst for enhancing liquid yield in thermal coking process

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4020830A (en) * 1975-03-12 1977-05-03 The University Of Utah Selective chemical sensitive FET transducers
US4133735A (en) * 1977-09-27 1979-01-09 The Board Of Regents Of The University Of Washington Ion-sensitive electrode and processes for making the same
US4180771A (en) * 1977-12-02 1979-12-25 Airco, Inc. Chemical-sensitive field-effect transistor
US4225410A (en) * 1978-12-04 1980-09-30 Technicon Instruments Corporation Integrated array of electrochemical sensors
GB2077439B (en) * 1980-04-28 1984-03-28 Kuraray Co Compensating temperature-dependent characteristic changes in ion-sensitive fet transducers
GB2096824A (en) * 1981-04-09 1982-10-20 Sibbald Alastair Chemically sensitive field effect transistor
GB2096825A (en) * 1981-04-09 1982-10-20 Sibbald Alastair Chemical sensitive semiconductor field effect transducer
GB2111215A (en) * 1981-10-31 1983-06-29 Alastair Sibbald Electrochemical sensor assembly
US4449011A (en) * 1982-01-08 1984-05-15 Critikon, Inc. Method and apparatus for encapsulation of chemically sensitive field effect device
DE3330975A1 (de) * 1983-08-27 1985-03-21 Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt Verfahren und anordnung zur kapselung eines halbleiterbauelementes
DE3430941C2 (de) * 1983-08-29 1987-04-09 Hitachi, Ltd., Tokio/Tokyo Chemisch empfindlicher Feldeffekttransistor-Sensor
US4505799A (en) * 1983-12-08 1985-03-19 General Signal Corporation ISFET sensor and method of manufacture
US4508613A (en) * 1983-12-19 1985-04-02 Gould Inc. Miniaturized potassium ion sensor
GB8414036D0 (en) * 1984-06-01 1984-07-04 Emi Ltd Field effect devices
GB8428138D0 (en) * 1984-11-07 1984-12-12 Sibbald A Semiconductor devices
US4921591A (en) * 1987-10-13 1990-05-01 Taiyo Yuden Co., Ltd. Ion sensors and their divided parts

Also Published As

Publication number Publication date
WO1990001694A1 (de) 1990-02-22
DE58903464D1 (en) 1993-03-18
DE3827314C1 (enExample) 1989-10-19
JPH03502135A (ja) 1991-05-16
US5039390A (en) 1991-08-13
EP0382831B1 (de) 1993-02-03
EP0382831A1 (de) 1990-08-22

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