JPH0697631A - Electroless plating method and equipment - Google Patents

Electroless plating method and equipment

Info

Publication number
JPH0697631A
JPH0697631A JP27103992A JP27103992A JPH0697631A JP H0697631 A JPH0697631 A JP H0697631A JP 27103992 A JP27103992 A JP 27103992A JP 27103992 A JP27103992 A JP 27103992A JP H0697631 A JPH0697631 A JP H0697631A
Authority
JP
Japan
Prior art keywords
plating
plating solution
tank
flow
circulation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP27103992A
Other languages
Japanese (ja)
Other versions
JP3091582B2 (en
Inventor
Tetsuo Kikuchi
哲郎 菊地
Shoji Kawakubo
鐘治 川窪
Ritsuji Toba
律司 鳥羽
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Eneos Corp
Original Assignee
Japan Energy Corp
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Japan Energy Corp, Hitachi Ltd filed Critical Japan Energy Corp
Priority to JP04271039A priority Critical patent/JP3091582B2/en
Publication of JPH0697631A publication Critical patent/JPH0697631A/en
Application granted granted Critical
Publication of JP3091582B2 publication Critical patent/JP3091582B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Chemically Coating (AREA)
  • Manufacturing Of Printed Wiring (AREA)

Abstract

PURPOSE:To form an uniform plating layer in a through hole, and prevent copper and dust from adhering to a printed board, by keeping the ratio of the outer circulation flow rate of solution circulating in an electroless plating vessel to the inner circulation flow rate and the flow velocity to be in specified values, and using air bubble flow together with the plating solution flow. CONSTITUTION:An overflow dam 2 for outer circulation and a lower overflow dam 3 for inner circulation are installed in an electroless plating tank 1. By a circulating pump 4, the plating solution exceeding the overflow dam 2 is made to pass a filter 6, and to circulate from a plating solution supply port 8 of an outer circulation return channel 7 to the bottom part of the plating tank 1. In this case, the inner circulation amount is set as 5-10% of the outer circulation amount of the plating solution. A plurality of aeration pipes 10 for generating an air bubble flow composed of many fine air bubbles by using compressed air are installed at upper positions of the plating solution supply port 8. Thereby an uniform plating layer can be formed in a through hole.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明はプリント基板上にめっき
を施すための無電解めっき方法及び装置に係り、特に、
プリント基板の上面と下面の回路の間にあけられた小孔
(スルーホール)を銅めっきで導通させるスルーホール
めっきに最適な無電解めっき方法及び装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an electroless plating method and apparatus for plating a printed circuit board,
The present invention relates to an electroless plating method and apparatus most suitable for through-hole plating in which small holes (through holes) formed between circuits on the upper and lower surfaces of a printed circuit board are electrically connected by copper plating.

【0002】[0002]

【従来の技術】一般に、無電解めっき法(化学めっき方
法)は、金属塩、還元剤、pH調整剤、錯化剤及び安定
剤等の成分を含むめっき液中に被めっき物を浸潰し、前
記金属塩のイオンを還元剤の作用によって被めっき物上
に析出させるようにしたものである。
2. Description of the Related Art Generally, the electroless plating method (chemical plating method) involves immersing an object to be plated in a plating solution containing components such as a metal salt, a reducing agent, a pH adjusting agent, a complexing agent and a stabilizer. The metal salt ions are deposited on the object to be plated by the action of the reducing agent.

【0003】この無電解めっき法は、電気めっき法に比
較して析出が均一に行われるので欠陥が少なく、硬度、
耐食性、耐摩耗性、磁気特性、ハンダ付け性等に優れて
いると共に、整流器等が不要である等の利点を有してい
るために、近年多くの分野で用いられるようになってき
ている。例えば、電子デバイス製造分野においては、ガ
ラス基板やセラミック基板上に形成された透明導電膜
(ITO膜、酸化インジウム膜、酸化スズ膜等)上に金
めっきを施す場合の下地材等に利用されている。
Compared with the electroplating method, this electroless plating method has more uniform deposition, and therefore has fewer defects and has a higher hardness,
Since it is excellent in corrosion resistance, wear resistance, magnetic characteristics, solderability, and the like, and has the advantage that a rectifier or the like is unnecessary, it has come to be used in many fields in recent years. For example, in the field of electronic device manufacturing, it is used as a base material for gold plating on a transparent conductive film (ITO film, indium oxide film, tin oxide film, etc.) formed on a glass substrate or a ceramic substrate. There is.

【0004】ところで、無電解銅めっき法(化学銅めっ
き方法)は、プラスチックの下地めっきとしても使われ
るが、無電解銅めっき法では小孔の内面に所定のめっき
層を形成できるので、現在ではプリント基板の製造に不
可欠なものとなっている。今後プリント配線板に高密度
化が要求された場合、多層化、小径化のいずれの手段を
用いても、板厚/孔径比、すなわちアスペクト比は従来
のプリント基板のアスペクト比に比べ2倍以上となる。
By the way, the electroless copper plating method (chemical copper plating method) is also used as an undercoat for plastics, but the electroless copper plating method can form a predetermined plating layer on the inner surface of a small hole. It has become an integral part of printed circuit board manufacturing. If a printed wiring board is required to have a higher density in the future, the board thickness / hole diameter ratio, that is, the aspect ratio, is more than twice the aspect ratio of the conventional printed circuit board, regardless of whether it is used in multiple layers or a small diameter. Becomes

【0005】そのため従来の無電解銅めっき法を用いた
場合には、スルーホール内へのめっきつきまわり性が極
端に低下してしまい、スルーホール内に均一なめっき層
を形成することが困難となる。
Therefore, when the conventional electroless copper plating method is used, the throwing power of the plating in the through holes is extremely deteriorated, and it is difficult to form a uniform plating layer in the through holes. Become.

【0006】そこで、無電解銅めっき法を用いた場合に
おいて、スルーホール内に均一なめっき層を形成するこ
とを目的とした発明には、特開昭59−161895号
公報、特開昭63−83282号公報、特開昭63−3
12983号公報、特開平1−263278号公報など
に開示されたものがある。
Therefore, when the electroless copper plating method is used, an invention aimed at forming a uniform plating layer in the through hole is disclosed in JP-A-59-161895 and JP-A-63-163. 83282, JP-A-63-3
There are those disclosed in JP-A-12983, JP-A-1-263278 and the like.

【0007】[0007]

【発明が解決しようとする課題】しかしながら、前記特
開昭59−161895号公報に開示された発明は、温
度および濃度が一定の無電解銅めっき液をめっき槽中の
基板に対して平行に流すことにより基板全面におけるめ
っき液の流速を均等にし、これにより基板全面における
めっき液の温度および濃度分布を平均化して、スルーホ
ール内のめっき槽を均一の厚さに形成しようとするもの
である。
However, in the invention disclosed in the above-mentioned Japanese Patent Laid-Open No. 59-161895, the electroless copper plating solution having a constant temperature and concentration is flown in parallel to the substrate in the plating tank. As a result, the flow rate of the plating solution is made uniform over the entire surface of the substrate, whereby the temperature and concentration distribution of the plating solution is averaged over the entire surface of the substrate, and the plating bath in the through hole is formed to have a uniform thickness.

【0008】また、特開昭63−83282号公報に開
示された発明は、酸化銅添加により硫酸ナトリウムが化
学銅めっき液中に蓄積するのを防止し、めっき液の寿命
延長を可能ならしめる銅イオン補給方法を確立し、併せ
て槽壁への銅異常析出や液の分解を防止する円滑な銅イ
オン補給方法である。
The invention disclosed in Japanese Unexamined Patent Publication No. 63-83282 is a copper which prevents sodium sulfate from accumulating in a chemical copper plating solution by the addition of copper oxide and extends the life of the plating solution. This is a smooth copper ion replenishment method that establishes an ion replenishment method and also prevents abnormal copper deposition on the tank wall and decomposition of the liquid.

【0009】また、特開昭63−312983号公報に
開示された発明は、微細回路を有するアディティブ法プ
リント配線板の無電解銅めっき法として、めっき液中に
気泡径0.5mm以下の酸素含有ガスを分散して、無電解
銅めっき槽内の溶存酸素濃度を局所的に均一かつ一定に
保ち、微細かつ高密の配線パターンのめっきを行う際の
めっき反応の停止やめっきの異常な析出を抑制しようと
するものである。
Further, the invention disclosed in Japanese Patent Laid-Open No. 63-312983 is an electroless copper plating method for an additive method printed wiring board having a fine circuit, which contains oxygen having a bubble diameter of 0.5 mm or less in a plating solution. Disperses the gas to keep the dissolved oxygen concentration in the electroless copper plating tank locally uniform and constant, and suppresses the stop of plating reaction and abnormal deposition of plating when plating fine and dense wiring patterns. Is what you are trying to do.

【0010】また、特開平1−263278号公報に開
示された発明は、従来のめっき液にはめっき作業中、あ
るいは保存中に、わずかずつ分解反応が進行して1〜2
週間後にはめっき槽壁等への銅の析出が著しくなること
があるので、これらを防ぐために自己分解反応を抑制
し、安定性を向上せしめ、長期にわたって支障なく使用
することができ、しかもすぐれためっき皮膜を形成し得
る無電解銅めっき液を提供しようとするものである。
In the invention disclosed in Japanese Patent Laid-Open No. 1-263278, the decomposition reaction of the conventional plating solution progresses little by little during the plating operation or the storage, so that 1-2
Precipitation of copper on the plating tank wall, etc. may become remarkable after a week, so to prevent these, self-decomposition reaction is suppressed, stability is improved, and it can be used for a long time without trouble and is excellent. It is intended to provide an electroless copper plating solution capable of forming a plating film.

【0011】しかしながら、上記公報に開示された発明
は、いずれも循環するめっき液の外部循環流量と内部循
環流量との割合やその流速については全く配慮されてい
なかったために、従来の無電解銅めっき法を用いた場合
には、めっき液の攪拌が均一になされずに、5μm/h
r程度の析出速度の場合でも膜厚が一様にならないし、
プリント基板のスルーホール内の液の流れが悪くハイア
スペスト比の基板では表面に比べスルーホール内の膜厚
が薄くなる欠点があり、まためっき液の循環が完全でな
いためにめっき槽内で液が滞留する部分が発生し、その
液が滞留する部分でめっき液中に生じる銅粉やごみなど
がプリント基板に付着して、その表面にざらつきが発生
するという問題があった。
However, in the inventions disclosed in the above publications, no consideration has been given to the ratio of the external circulation flow rate to the internal circulation flow rate of the circulating plating solution and the flow velocity thereof. When the plating method is used, stirring of the plating solution is not uniform and 5 μm / h
Even if the deposition rate is about r, the film thickness is not uniform,
The flow of the liquid in the through-hole of the printed circuit board is poor, and there is a drawback that the thickness of the film in the through-hole is smaller than that on the surface of the substrate with a high aspect ratio, and the liquid is not completely circulated in the plating tank because the circulation of the plating liquid is not perfect. There is a problem in that a stagnant portion is generated, and copper powder, dust, and the like generated in the plating solution at the stagnant portion of the solution adheres to the printed circuit board, and the surface thereof becomes rough.

【0012】そこで、本発明者らが無電解めっき槽内の
循環するめっき液を均一になるように外部循環流と内部
循環流を形成させ、その割合やその流速に着目して研究
を重ねた結果、それらの流量の割合やその流速を特定の
値にし、かつ気泡流を併用することによって、スルーホ
ール内に均一なめっき層が形成でき、さらにめっき液中
に生じる銅粉やごみなどがプリント基板に付着するのを
防止でき、表層回路の高密度化が可能となることが判っ
た。
Therefore, the inventors of the present invention made an external circulation flow and an internal circulation flow so as to make the circulating plating solution in the electroless plating tank uniform, and conducted research by paying attention to the ratio and the flow rate. As a result, a uniform plating layer can be formed in the through holes by setting the flow rate ratio and its flow rate to specific values, and by using the bubble flow together, and further, copper powder and dust generated in the plating solution can be printed. It has been found that adhesion to the substrate can be prevented and the surface layer circuit can be made higher in density.

【0013】本発明は上記知見に基づくものであり、無
電解めっき槽内の循環するめっき液の外部循環流量と内
部循環流量との割合やその流速を特定の値に保ち、かつ
気泡流を併用することによって、スルーホール内に均一
なめっき層が形成でき、かつ必要以上の厚さの銅めっき
層が基板表層に析出せずに均一なめっき層が形成でき、
その上にめっき液中に生じる銅粉やごみなどがプリント
基板に付着するのを防止できて、表層回路の高密度化が
可能となる無電解めっき方法及び装置を提供することを
目的としている。
The present invention is based on the above knowledge, and maintains the ratio of the external circulation flow rate and the internal circulation flow rate of the circulating plating solution in the electroless plating tank and the flow rate thereof to a specific value, and uses the bubble flow together. By doing so, it is possible to form a uniform plating layer in the through holes, and to form a uniform plating layer without depositing a copper plating layer having a thickness larger than necessary on the substrate surface layer,
Further, it is an object of the present invention to provide an electroless plating method and apparatus capable of preventing copper powder, dust, etc. generated in a plating solution from adhering to a printed circuit board and enabling high density of surface layer circuits.

【0014】[0014]

【課題を解決するための手段】本発明は、上記の目的を
達成するために、循環するめっき液中の金属イオンを還
元剤の作用により還元してプリント基板上に析出させる
ことにより該プリント基板上にめっきを施す無電解めっ
き方法において、無電解めっき槽内に懸架されて多数並
べられた前記プリント基板に対して該めっき槽内下方か
ら多数の微細気泡からなる気泡流を供給すると共に、前
記めっき槽に設けたオーバーフロー堰により前記めっき
液の外部循環量に対し内部循環量を5〜10%に調整す
ることを特徴とした無電解めっき方法である。
In order to achieve the above-mentioned object, the present invention reduces the metal ions in the circulating plating solution by the action of a reducing agent and deposits them on the printed circuit board. In the electroless plating method of plating on the above, while supplying a bubble flow consisting of a large number of fine bubbles from below in the plating tank to the printed circuit boards suspended in an electroless plating tank and arranged in large numbers, The electroless plating method is characterized in that an internal circulation amount is adjusted to 5 to 10% with respect to an external circulation amount of the plating solution by an overflow weir provided in a plating tank.

【0015】また、本発明は循環するめっき液中の金属
イオンを還元剤の作用により還元してプリント基板上に
析出させることにより該プリント基板上にめっきを施す
無電解めっき装置において、無電解めっき槽内に前記プ
リント基板を多数並べて懸架し、該プリント基板に対し
て前記めっき槽内下方から多数の微細気泡からなる気泡
流を供給する複数のエアレーションパイプを外部循環流
路から該めっき槽へ戻るめっき液供給口より上の位置に
設け、かつ該めっき槽の外部循環用オーバーフロー堰よ
り低い内部循環用オーバーフロー堰を設けたことを特徴
とする無電解めっき装置である。
Further, the present invention provides an electroless plating apparatus for plating on a printed board by reducing metal ions in a circulating plating solution by the action of a reducing agent to deposit on the printed board. A plurality of the aforesaid printed circuit boards are arranged side by side in a tank and suspended, and a plurality of aeration pipes for supplying a bubble flow composed of a large number of fine bubbles to the printed circuit board from below in the plating tank are returned to the plating tank from an external circulation channel. The electroless plating apparatus is characterized in that an overflow weir for internal circulation, which is provided above the plating solution supply port and lower than an overflow weir for external circulation of the plating tank, is provided.

【0016】[0016]

【作用】次に、本発明の作用について説明すると、めっ
き液の入った無電解めっき槽に外部循環用オーバーフロ
ー堰よりも低い内部循環用オーバーフロー堰を設け、一
方多数の微細気泡からなる気泡流を供給する複数のエア
レーションパイプをめっき液が清浄化されて外部循環流
路からめっき槽へ戻るめっき液供給口より上の位置に設
けてエアレーションを行ない、同時に槽内のめっき液を
ポンプ装置により循環させながら前記めっき液中にプリ
ント基板を多数並べて懸架する。そして、めっき液の循
環用ポンプ装置を調節して、めっき槽に設けた外部循環
用オーバーフロー堰を越えて外部循環流路へ流れるめっ
き液の量に対して、内部循環用オーバーフロー堰を越え
て内部循環流路内からめっき槽内へ戻るめっき液の量が
5〜10%になるように調整する。この結果、めっき液
中に生じる銅粉やごみなどがプリント基板に付着せず、
またスルーホール内に均一なめっき層が形成さる。
Next, the operation of the present invention will be described. An electroless plating tank containing a plating solution is provided with an overflow weir for internal circulation, which is lower than the overflow weir for external circulation, while generating a bubble flow composed of a large number of fine bubbles. A plurality of aeration pipes to be supplied are installed above the plating solution supply port where the plating solution is cleaned and returned from the external circulation flow path to the plating tank to perform aeration, and at the same time the plating solution in the tank is circulated by a pump device. On the other hand, a large number of printed circuit boards are arranged and suspended in the plating solution. Then, the pump device for circulating the plating solution is adjusted so that the amount of the plating solution flowing to the external circulation flow passage beyond the overflow weir for external circulation provided in the plating tank is exceeded by the overflow weir for internal circulation. The amount of the plating solution returning from the circulation channel to the plating tank is adjusted to 5 to 10%. As a result, copper powder and dust generated in the plating solution will not adhere to the printed circuit board,
Further, a uniform plating layer is formed in the through hole.

【0017】[0017]

【実施例】次に、本発明の実施例について図面を参照し
て説明する。図1は本実施例の縦断面図であり、図2は
その上面図である。本実施例はめっき液を満たした無電
解めっき槽1内に外部循環用オーバーフロー堰2を設
け、この外部循環用オーバーフロー堰2よりも低い内部
循環用オーバーフロー堰3をその内側に設け、外部循環
用オーバーフロー堰2を越えためっき液は、循環ポンプ
4に連通した外部循環流路5に導かれ、循環ポンプ4に
よってフィルター6を通った後、前記めっき槽1へ戻る
外部循環戻り流路7のめっき液供給口8からめっき槽の
底部に循環される。また内部循環用オーバーフロー堰3
と外部循環用オーバーフロー堰2との間で形成される内
部循環流路9に内部循環用オーバーフロー堰3を越えた
めっき液が流れ込む。
Embodiments of the present invention will now be described with reference to the drawings. FIG. 1 is a vertical sectional view of this embodiment, and FIG. 2 is a top view thereof. In this embodiment, an overflow weir 2 for external circulation is provided in an electroless plating tank 1 filled with a plating solution, and an overflow weir 3 for internal circulation, which is lower than the overflow weir 2 for external circulation, is provided inside the overflow weir 3 for external circulation. The plating solution that has flowed over the overflow weir 2 is introduced into the external circulation flow path 5 that communicates with the circulation pump 4, passes through the filter 6 by the circulation pump 4, and then returns to the plating tank 1 in the external circulation return flow path 7. It is circulated from the liquid supply port 8 to the bottom of the plating tank. In addition, the overflow weir 3 for internal circulation
The plating solution having flowed over the internal circulation overflow weir 3 flows into the internal circulation flow path 9 formed between the internal circulation flow channel 9 and the external circulation overflow weir 2.

【0018】また一方、図示しない圧縮機によって造ら
れた圧搾空気により多数の微細気泡からなる気泡流を発
生させるための複数のエアレーションパイプ10を上記
めっき槽1の底部で、めっき液がめっき槽1へ戻る外部
循環戻り流路7のめっき液供給口8より上の位置に設け
る。なお、本実施例においては前記外部循環流路5と外
部循環戻り流路7とはそれぞれ3本ずつとしてある。
On the other hand, a plurality of aeration pipes 10 for generating a bubble flow composed of a large number of fine bubbles by compressed air produced by a compressor (not shown) are provided at the bottom of the plating tank 1, and the plating solution is filled with the plating solution 1. The external circulation return passage 7 is provided at a position above the plating solution supply port 8. In this embodiment, there are three external circulation flow paths 5 and three external circulation return flow paths 7, respectively.

【0019】次に、本実施例の効果を確かめるために行
った基礎実験について説明する。第1の実験は、内外循
環用オーバーフロー堰を設けた場合において、無電解め
っき槽1内のめっき液の流れを均一にするために無電解
めっき槽1内に設ける2つのオーバーフロー堰の高さに
関する相互関連性を調べた実験である。なお、この実験
には透明な実験槽を作成して観察した。図3は内外循環
用オーバーフロー堰2,3の高さを等しくした場合のめ
っき液の流れの状況を示しており、無電解めっき槽1内
のめっき液の流れは良いが、液面が2つのオーバーフロ
ー堰2,3の間で段ができ、無電解めっき中にめっき槽
内に生じる銅粉やごみなどの排出にはやや問題がある。
Next, a basic experiment carried out to confirm the effect of this embodiment will be described. The first experiment relates to the heights of two overflow weirs provided in the electroless plating tank 1 in order to make the flow of the plating solution in the electroless plating tank 1 uniform when an overflow weir for internal and external circulation is provided. This is an experiment investigating the mutual relationship. In this experiment, a transparent experimental tank was created and observed. FIG. 3 shows the state of the flow of the plating solution when the heights of the overflow weirs 2 and 3 for internal and external circulation are made equal, and the flow of the plating solution in the electroless plating tank 1 is good, but there are two liquid levels. A step is formed between the overflow weirs 2 and 3, and there is a slight problem in discharging copper powder, dust, etc. generated in the plating tank during electroless plating.

【0020】図4は内循環用オーバーフロー堰3を外循
環用オーバーフロー堰2より高くした場合のめっき液の
流れの状況を示しており、この場合には液面が2つのオ
ーバーフロー堰2,3の間で段ができ、しかも内部循環
流路9内に逆流が発生したために無電解めっき槽1内の
めっき液の流れに停滞や逆流が発生し、無電解めっきに
は適さないことが判った。
FIG. 4 shows the flow of the plating solution when the inner circulation overflow weir 3 is made higher than the outer circulation overflow weir 2, and in this case, the overflow weirs 2 and 3 having two liquid levels are provided. It has been found that there is a gap between them, and since a backflow is generated in the internal circulation flow path 9, the flow of the plating solution in the electroless plating tank 1 is stagnant or backflowed, which is not suitable for electroless plating.

【0021】図5は内循環用オーバーフロー堰3を外循
環用オーバーフロー堰2より低くした場合のめっき液の
流れの状況を示しており、この場合には液面が平らに形
成され、無電解めっき槽1内のめっき液の流れが良好
で、めっき液の流れに停滞や逆流が発生しにくいことが
判った。この場合には液面が平らで2つのオーバーフロ
ー堰2,3の間にも段ができないため、無電解めっき中
にめっき槽内に生じる銅粉やごみなどの排出も良好であ
った。
FIG. 5 shows the flow of the plating solution when the inner circulation overflow weir 3 is lower than the outer circulation overflow weir 2. In this case, the liquid surface is formed flat and electroless plating is performed. It was found that the flow of the plating solution in the tank 1 was good and that the flow of the plating solution did not stagnate or flow backward. In this case, since the liquid surface is flat and no step can be formed between the two overflow weirs 2 and 3, the discharge of copper powder, dust, etc. generated in the plating tank during electroless plating was also good.

【0022】第2の実験は、内外循環用オーバーフロー
堰を設けた場合に無電解めっき槽1内に設けるエアレー
ションパイプの位置についての実験であり、外部循環戻
り流路7のめっき液供給口8に対するエアレーションパ
イプ10の位置に関する相互関連性を調べた実験であ
る。図6は戻り流路7のめっき液供給口8に対してエア
レーションパイプ10を低く設けた場合のめっき液の流
れの状況を示しており、この場合にはめっき槽1に供給
されためっき液はエアレーションパイプ10からのエア
レーションの上昇力が強すぎてめっき槽1の奥まで届か
ないために、槽1内のめっき液の流れは均一にならない
ことが判った。
The second experiment is an experiment on the position of the aeration pipe provided in the electroless plating tank 1 when the overflow weir for internal / external circulation is provided, and is for the plating solution supply port 8 of the external circulation return passage 7. It is an experiment investigating the mutual relation regarding the position of the aeration pipe 10. FIG. 6 shows the flow of the plating solution when the aeration pipe 10 is provided lower than the plating solution supply port 8 of the return channel 7, and in this case, the plating solution supplied to the plating tank 1 is It was found that the flow of the plating solution in the tank 1 was not uniform because the rising force of the aeration from the aeration pipe 10 was too strong to reach the back of the plating tank 1.

【0023】図7は戻り流路7のめっき液供給口8とエ
アレーションパイプ10とを同じ高さに設けた場合のめ
っき液の流れの状況を示しており、この場合にもめっき
槽1に供給されためっき液はエアレーションパイプ10
からのエアレーションの上昇力が強すぎてめっき槽1の
奥まで届かないために、槽1内のめっき液の流れは均一
にならないことが判った。
FIG. 7 shows the situation of the flow of the plating solution when the plating solution supply port 8 of the return channel 7 and the aeration pipe 10 are provided at the same height, and in this case as well, the plating solution is supplied to the plating tank 1. The plating solution is aeration pipe 10
It was found that the flow of the plating solution in the tank 1 was not uniform because the rising force of the aeration from the above was too strong to reach the inside of the plating tank 1.

【0024】図8は戻り流路7のめっき液供給口8に対
してエアレーションパイプ10を高く設けた場合のめっ
き液の流れの状況を示しており、この場合にはめっき槽
1に供給されためっき液はエアレーションパイプ10の
下を通ってめっき槽1の奥まで届くために、槽1内のめ
っき液の流れは均一に上昇することが判った。
FIG. 8 shows the flow of the plating solution when the aeration pipe 10 is provided higher than the plating solution supply port 8 of the return channel 7, and in this case, the plating solution was supplied to the plating tank 1. It was found that the plating solution flows under the aeration pipe 10 and reaches the depth of the plating tank 1, so that the flow of the plating solution in the tank 1 rises uniformly.

【0025】次に、以上の第1および第2の基礎的実験
結果を基として本発明の効果を明らかにするための実験
について説明する。図9は本発明の実施例を示してお
り、図10は比較例を示している。本実験に使用しため
っき液はKC−500(日鉱)であり、その内容はCu
SO4・5H2O 10g/l,EDTA 28g/l,
ホルマリン 2ml/l,PH 12.5,添加剤 適量
であり、 めっき液温は72℃に設定した。
Next, an experiment for clarifying the effect of the present invention will be described based on the above first and second basic experimental results. FIG. 9 shows an example of the present invention, and FIG. 10 shows a comparative example. The plating solution used in this experiment is KC-500 (Nichiko), the content of which is Cu
SO 4 · 5H 2 O 10g / l, EDTA 28g / l,
Formalin 2 ml / l, PH 12.5, additive proper amount, and the plating solution temperature was set to 72 ° C.

【0026】図9に示した本実施例はめっき槽1内に多
数のプリント基板11を上から懸架して設置し、内循環
用オーバーフロー堰3を外循環用オーバーフロー堰2よ
り低くしてめっき槽1の外部循環用オーバーフロー堰2
を越えて外部循環流路5へ流れるめっき液の量に対し
て、内部循環用オーバーフロー堰3を越えて内部循環流
路9内からめっき槽内へ戻るめっき液の量が5〜10%
になるように外循環用オーバーフロー堰2の高さより内
循環用オーバーフロー堰3の高さを10cm低く調整し
た。また外部循環流路5から戻るめっき液の量を毎分7
50リッタとし、戻り流路7のめっき液供給口8の高さ
に対して、エアレーションパイプ10を高い位置に設置
し、図示しない圧縮機により圧搾空気を送り、エアレー
ションを行った。
In the present embodiment shown in FIG. 9, a large number of printed circuit boards 11 are suspended from above in a plating tank 1 and the overflow weir 3 for internal circulation is set lower than the overflow weir 2 for external circulation. 1 external overflow weir 2
5 to 10% of the amount of the plating solution that flows over the internal circulation flow path 9 beyond the internal circulation overflow weir 3 with respect to the amount of the plating solution that flows over the external circulation flow path 5
The height of the overflow weir 3 for inner circulation was adjusted to be 10 cm lower than the height of the overflow weir 2 for outer circulation. In addition, the amount of the plating solution returned from the external circulation channel 5 is set to 7
The aeration pipe 10 was set to a height of 50 liters with respect to the height of the plating solution supply port 8 of the return channel 7, and compressed air was sent by a compressor (not shown) to perform aeration.

【0027】一方、図10に示す比較例は従来のめっき
槽を使用し、本実施例と同様にめっき槽1内に多数のプ
リント基板11を上から懸架して設置し、図の右側から
めっき液を入れ、図の左側から排出させて循環させた。
また、エアレーションパイプ10はめっき槽の底部近く
に設置して図示しない圧縮機により圧搾空気を送り、エ
アレーションを行った。本実施例と比較例との上記実験
結果を表1に示す。
On the other hand, in the comparative example shown in FIG. 10, a conventional plating tank is used, and a large number of printed circuit boards 11 are suspended from above and installed in the plating tank 1 as in the case of the present embodiment. The liquid was put in, discharged from the left side of the figure, and circulated.
Further, the aeration pipe 10 was installed near the bottom of the plating tank, and compressed air was sent by a compressor (not shown) to perform aeration. Table 1 shows the experimental results of the present example and the comparative example.

【0028】[0028]

【表1】 [Table 1]

【0029】上記表1中のスローイングパワーとはプリ
ント基板の表面に形成されるめっき膜の厚さaとスルー
ホール内のめっき膜の厚さbとの比であり、すなわちス
ローイングパワー=b/a×100で示されるものであ
るから、この値は高い方がよい。また表面の膜厚差とは
プリント基板の表面に形成されるめっき膜の最大値と最
小値との差であるから、これは低い方がより均一なめっ
き層が形成されたことになる。また、比較例ではめっき
液の循環による液の上昇のほかにエアーによるめっき液
の巻き上げがかなり多く、この巻き上げられためっき液
は行き場所を失い、槽の底方向に移動し、液溜りとなる
ことが観察された。
The throwing power in Table 1 above is the ratio of the thickness a of the plating film formed on the surface of the printed circuit board to the thickness b of the plating film in the through hole, that is, throwing power = b / a. Since it is shown by x100, the higher the value, the better. Further, the difference in the film thickness on the surface is the difference between the maximum value and the minimum value of the plating film formed on the surface of the printed circuit board. Therefore, the lower the difference, the more uniform the plating layer is formed. In addition, in the comparative example, in addition to the rise of the liquid due to the circulation of the plating liquid, the amount of winding of the plating liquid by air is quite large. The rolled plating liquid loses its place of travel and moves toward the bottom of the tank, forming a liquid pool. It was observed.

【0030】[0030]

【発明の効果】以上説明したように本発明によれば、め
っき液の入った無電解めっき槽に外部循環用オーバーフ
ロー堰よりも低い内部循環用オーバーフロー堰を設け、
多数の微細気泡からなる気泡流を供給する複数のエアレ
ーションパイプをめっき液が清浄化されて外部循環流路
からめっき槽へ戻るめっき液供給口より上の位置に設
け、外部循環用オーバーフロー堰を越えて外部循環流路
へ流れるめっき液の量に対して、内部循環用オーバーフ
ロー堰を越えて内部循環流路内からめっき槽内へ流れる
めっき液の量が5〜10%になるように調整するから、
めっき槽内のめっき液の流れが槽内のどこでも一定流速
になるためスルーホール内に均一なめっき層が形成で
き、かつ必要以上の厚さの銅めっき層が基板表層に析出
せずに均一なめっき層が形成でき、しかもめっき液中に
生じる銅粉やごみなどがエアーとともに浮上し、外部循
環流路内に流れフィルターによって捕獲されてプリント
基板に付着するのを防止できる効果がある。
As described above, according to the present invention, an electroless plating tank containing a plating solution is provided with an internal circulation overflow weir lower than the external circulation overflow weir,
A plurality of aeration pipes that supply a bubble flow consisting of a large number of fine bubbles are installed above the plating solution supply port where the plating solution is cleaned and returns from the external circulation flow path to the plating tank, over the overflow weir for external circulation. The amount of the plating solution flowing from the internal circulation channel into the plating tank beyond the internal circulation overflow weir is adjusted to 5 to 10% of the amount of the plating solution flowing to the external circulation channel. ,
Since the flow of the plating solution in the plating tank is a constant flow rate anywhere in the tank, a uniform plating layer can be formed in the through holes, and a copper plating layer with an excessive thickness is not deposited on the substrate surface layer and is uniform. It is possible to form a plating layer and prevent copper powder, dust, etc. generated in the plating solution from floating with air and being caught by the flow filter in the external circulation channel and adhering to the printed circuit board.

【図面の簡単な説明】[Brief description of drawings]

【図1】本実施例の縦断面説明図である。FIG. 1 is a vertical cross-sectional explanatory view of the present embodiment.

【図2】本実施例の平面図である。FIG. 2 is a plan view of the present embodiment.

【図3】第1の実験状態を示す縦断面図である。FIG. 3 is a vertical sectional view showing a first experimental state.

【図4】第1の実験状態を示す縦断面図である。FIG. 4 is a vertical sectional view showing a first experimental state.

【図5】第1の実験状態を示す縦断面図である。FIG. 5 is a vertical sectional view showing a first experimental state.

【図6】第2の実験状態を示す縦断面図である。FIG. 6 is a vertical cross-sectional view showing a second experimental state.

【図7】第2の実験状態を示す縦断面図である。FIG. 7 is a vertical sectional view showing a second experimental state.

【図8】第2の実験状態を示す縦断面図である。FIG. 8 is a vertical sectional view showing a second experimental state.

【図9】本実施例の実験状態を示す縦断面図である。FIG. 9 is a vertical cross-sectional view showing an experimental state of this example.

【図10】比較例の実験状態を示す縦断面図である。FIG. 10 is a vertical sectional view showing an experimental state of a comparative example.

【符号の説明】[Explanation of symbols]

1 無電解めっき槽 2 外部循環用オーバーフロー堰 3 内部循環用オーバーフロー堰 4 循環ポンプ 5 外部循環流路 6 フィルター 7 外部循環戻り流路 8 めっき液供給口 9 内部循環流路 10 エアレーションパイプ 11 プリント基板 1 Electroless plating tank 2 Overflow weir for external circulation 3 Overflow weir for internal circulation 4 Circulation pump 5 External circulation flow path 6 Filter 7 External circulation return flow path 8 Plating solution supply port 9 Internal circulation flow path 10 Aeration pipe 11 Printed circuit board

───────────────────────────────────────────────────── フロントページの続き (72)発明者 鳥羽 律司 神奈川県秦野市掘山下1番地 株式会社日 立製作所神奈川工場内 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Ritsuji Toba No. 1 Horiyamashita, Hadano City, Kanagawa Prefecture Hiritsu Manufacturing Co., Ltd. Kanagawa Plant

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 循環するめっき液中の金属イオンを還元
剤の作用により還元してプリント基板上に析出させるこ
とにより該プリント基板上にめっきを施す無電解めっき
方法において、無電解めっき槽内に懸架されて多数並べ
られた前記プリント基板に対して該めっき槽内下方から
多数の微細気泡からなる気泡流を供給すると共に、前記
めっき槽に設けたオーバーフロー堰により前記めっき液
の外部循環量に対し内部循環量を5〜10%に調整する
ことを特徴とした無電解めっき方法。
1. An electroless plating method in which metal ions in a circulating plating solution are reduced by the action of a reducing agent to be deposited on a printed circuit board to thereby plate the printed circuit board in an electroless plating bath. While supplying a bubble flow composed of a large number of fine bubbles from below in the plating tank to the printed circuit board that is suspended and arranged side by side, the overflow weir provided in the plating tank allows the plating solution to circulate externally. An electroless plating method characterized by adjusting an internal circulation amount to 5 to 10%.
【請求項2】 循環するめっき液中の金属イオンを還元
剤の作用により還元してプリント基板上に析出させるこ
とにより該プリント基板上にめっきを施す無電解めっき
装置において、無電解めっき槽内に前記プリント基板を
多数並べて懸架し、該プリント基板に対して該めっき槽
内下方から多数の微細気泡からなる気泡流を供給する複
数のエアレーションパイプを外部循環流路から該めっき
槽へ戻るめっき液供給口より上の位置に設け、かつ該め
っき槽の外部循環用オーバーフロー堰より低い内部循環
用オーバーフロー堰を設けたことを特徴とする無電解め
っき装置。
2. An electroless plating apparatus for performing plating on a printed board by reducing metal ions in a circulating plating solution by the action of a reducing agent and depositing on the printed board, in an electroless plating tank. A plurality of aeration pipes are arranged side by side and suspended, and a plurality of aeration pipes that supply a bubble flow composed of a large number of fine bubbles to the printed circuit board from below in the plating tank are returned from the external circulation flow path to the plating tank. An electroless plating apparatus comprising an overflow weir for internal circulation, which is provided at a position above the mouth and is lower than an overflow weir for external circulation of the plating tank.
JP04271039A 1992-09-14 1992-09-14 Electroless plating method and apparatus Expired - Fee Related JP3091582B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP04271039A JP3091582B2 (en) 1992-09-14 1992-09-14 Electroless plating method and apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP04271039A JP3091582B2 (en) 1992-09-14 1992-09-14 Electroless plating method and apparatus

Publications (2)

Publication Number Publication Date
JPH0697631A true JPH0697631A (en) 1994-04-08
JP3091582B2 JP3091582B2 (en) 2000-09-25

Family

ID=17494555

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
JP (1) JP3091582B2 (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002111144A (en) * 2000-10-03 2002-04-12 Hitachi Ltd Wiring board and its manufacturing method and electroless copper plating liquid used for the manufacturing method
JP2007177257A (en) * 2005-12-26 2007-07-12 Seiko Epson Corp Plating method, plating apparatus, and method for manufacturing silicon device
JP2010084168A (en) * 2008-09-30 2010-04-15 Hitachi Ltd Wet process method, electroless copper plating method, and printed circuit board
JP2018165393A (en) * 2017-03-28 2018-10-25 上村工業株式会社 Surface treatment apparatus
CN110445042A (en) * 2019-08-29 2019-11-12 永升建设集团有限公司 Box-type substation

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002111144A (en) * 2000-10-03 2002-04-12 Hitachi Ltd Wiring board and its manufacturing method and electroless copper plating liquid used for the manufacturing method
JP2007177257A (en) * 2005-12-26 2007-07-12 Seiko Epson Corp Plating method, plating apparatus, and method for manufacturing silicon device
JP2010084168A (en) * 2008-09-30 2010-04-15 Hitachi Ltd Wet process method, electroless copper plating method, and printed circuit board
JP2018165393A (en) * 2017-03-28 2018-10-25 上村工業株式会社 Surface treatment apparatus
CN110445042A (en) * 2019-08-29 2019-11-12 永升建设集团有限公司 Box-type substation
CN110445042B (en) * 2019-08-29 2020-06-16 永升建设集团有限公司 Box-type substation

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