JPH0691040B2 - Dry etching equipment - Google Patents

Dry etching equipment

Info

Publication number
JPH0691040B2
JPH0691040B2 JP60294840A JP29484085A JPH0691040B2 JP H0691040 B2 JPH0691040 B2 JP H0691040B2 JP 60294840 A JP60294840 A JP 60294840A JP 29484085 A JP29484085 A JP 29484085A JP H0691040 B2 JPH0691040 B2 JP H0691040B2
Authority
JP
Japan
Prior art keywords
electrode
dry etching
electrodes
cathode
lower electrode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP60294840A
Other languages
Japanese (ja)
Other versions
JPS62154733A (en
Inventor
徹 今村
Original Assignee
九州日本電気株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 九州日本電気株式会社 filed Critical 九州日本電気株式会社
Priority to JP60294840A priority Critical patent/JPH0691040B2/en
Publication of JPS62154733A publication Critical patent/JPS62154733A/en
Publication of JPH0691040B2 publication Critical patent/JPH0691040B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • ing And Chemical Polishing (AREA)
  • Drying Of Semiconductors (AREA)

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明はドライエッチング装置の電極に関するものであ
る。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to an electrode of a dry etching apparatus.

〔従来の技術〕[Conventional technology]

従来、半導体装置製造に用いるドライエッチング装置に
おいて、高周波電圧を印加する対向電極は双方とも平面
か又は円筒形であった。
Conventionally, in a dry etching apparatus used for manufacturing a semiconductor device, both counter electrodes to which a high frequency voltage is applied are flat or cylindrical.

〔発明が解決しようとする問題点〕[Problems to be solved by the invention]

上述した従来のドライエッチャーのうち、前者の平行平
板電極の場合に、同時に処理できる半導体基板の枚数を
増してスループットを向上させるためには、装置の平面
積を大きくする必要があり、設置スペース効率が悪くな
るという欠点があった。
Among the conventional dry etchers described above, in the case of the former parallel plate electrode, in order to increase the number of semiconductor substrates that can be processed at the same time and improve the throughput, it is necessary to increase the plane area of the device, and the installation space efficiency is increased. There was a drawback that it became worse.

又、後者の円筒形電極の場合には、エッチング室内で半
導体基板が配置された電極を回転したり平行移動するこ
とが困難であり、平行平板電極タイプのように一方の電
極を回転させて、エッチングの均一性を向上させること
ができないという欠点があった。
In the case of the latter cylindrical electrode, it is difficult to rotate or translate the electrode on which the semiconductor substrate is arranged in the etching chamber, and one electrode is rotated like the parallel plate electrode type, There is a drawback that the etching uniformity cannot be improved.

本発明の目的はスループット向上対策やウェリー大口径
化の際に設置スペース効率が低下せず、かつエッチング
の均一性を平行平板電極タイプのレベル以下に低下させ
ることのないドライエッチング装置を提供することにあ
る。
It is an object of the present invention to provide a dry etching apparatus which does not reduce the installation space efficiency when the throughput is improved or when the diameter of a welly is increased and the etching uniformity is not reduced to a level lower than that of a parallel plate electrode type. It is in.

〔問題点を解決するための手段〕[Means for solving problems]

前記目的を達成するため、本発明に係るドライエッチン
グ装置は、エッチング室内の対向電極の一方の電極上に
半導体基板を保持し、電極間に高周波電圧を印加すると
ともに真空の下で導入されたガスの励起又はイオン化に
よって電極上の基板をドライエッチングするドライエッ
チング装置であって、 対向電極は、上下に向き合わせに配設された上側電極と
下側電極とからなり、 上側電極は、反応ガスの導入口が開口された球面状弯曲
凹面を下面に有し、 下側電極は、上面に球面状弯曲凸面を有し、上側電極の
球面状弯曲凹面で覆われ、 下側電極の球面状弯曲凸面は、複数の半導体基板を搭載
する搭載面である。
To achieve the above object, a dry etching apparatus according to the present invention holds a semiconductor substrate on one electrode of a counter electrode in an etching chamber, applies a high frequency voltage between the electrodes, and introduces a gas under a vacuum. Is a dry etching apparatus for dry-etching a substrate on an electrode by excitation or ionization of the counter electrode, wherein the counter electrode is composed of an upper electrode and a lower electrode which are vertically opposed to each other, and the upper electrode is a reaction gas The lower surface has a spherically curved concave surface with an inlet, and the lower electrode has a spherically curved convex surface on the upper surface. Is a mounting surface on which a plurality of semiconductor substrates are mounted.

〔実施例〕〔Example〕

次に本発明の実施例につき、図面を用いて説明する。 Next, embodiments of the present invention will be described with reference to the drawings.

第1図において、本実施例のドライエッチング装置は、
真空ポンプ1により真空に保持されるエッチング室2の
内部に、球面状に弯曲したアノード3と球面に弯曲した
カソード4を対向配置し、かつカソード4は回転軸5を
介してモーター6に接続し、エッチング中に回転可能に
してある。すなわち、アノード3が上側電極、カソード
4が下側電極であり、アノード3の弯曲凹面と、カソー
ド4の弯曲凸面とが上下に向き合され、カソード4の弯
曲凸面には、半導体基板9を搭載する搭載面を有し、ア
ノード3の弯曲凹面の中央には、反応ガスの導入口7を
開口している。アノード3の弯曲凹面は、カソード4の
弯曲凸面の全域を覆っている。エッチング処理の際に
は、ガス導入口7よりガスが電極間に導入され、かつ高
周波電源8により、電極間に高周波電圧が印加され、カ
ソード表面に配置された半導体基板9表面をエッチング
する。
In FIG. 1, the dry etching apparatus of this embodiment is
A spherically curved anode 3 and a spherically curved cathode 4 are arranged opposite to each other inside an etching chamber 2 which is held in a vacuum by a vacuum pump 1, and the cathode 4 is connected to a motor 6 via a rotary shaft 5. , Can be rotated during etching. That is, the anode 3 is the upper electrode and the cathode 4 is the lower electrode, and the curved concave surface of the anode 3 and the curved convex surface of the cathode 4 are vertically opposed to each other, and the semiconductor substrate 9 is mounted on the curved convex surface of the cathode 4. The anode 3 has a mounting surface and a reaction gas inlet 7 is opened at the center of the curved concave surface of the anode 3. The curved concave surface of the anode 3 covers the entire curved convex surface of the cathode 4. During the etching process, a gas is introduced through the gas inlet 7 between the electrodes, and a high frequency power source 8 applies a high frequency voltage between the electrodes to etch the surface of the semiconductor substrate 9 disposed on the cathode surface.

本発明によれば、対向電極としてのアノード3及びカソ
ード4が球面状に弯曲しているため、カソード4の表面
に設置される半導体基板9の枚数が平面の場合に比して
多くなる。また両電極3,4が球面状に弯曲しているか
ら、カソード4を他のアノード3に干渉することなく回
転させられるため、エッチングの均一性を保つことが可
能になる。
According to the present invention, since the anodes 3 and the cathodes 4 serving as the counter electrodes are curved in a spherical shape, the number of semiconductor substrates 9 installed on the surface of the cathode 4 is larger than that in the case of a flat surface. Further, since both electrodes 3 and 4 are curved in a spherical shape, the cathode 4 can be rotated without interfering with the other anode 3, so that the etching uniformity can be maintained.

上述の実施例において、高周波電源の接続をカソードで
なく、アノードに変更することができるし、電極表面に
配置される半導体基板の枚数は自由に選択できる。
In the above embodiment, the connection of the high frequency power supply can be changed to the anode instead of the cathode, and the number of semiconductor substrates arranged on the electrode surface can be freely selected.

〔発明の効果〕〔The invention's effect〕

以上説明したように本発明によれば、電極面に球面を利
用したものであり、球面の性質からして、球面の頂点で
あろうと、下縁の部分であろうと、基板の搭載面として
の区別は全くなく、したがって、全面を満遍なく均等に
利用して基板の搭載面を増大させることができる効果を
有する。
As described above, according to the present invention, a spherical surface is used for the electrode surface, and due to the property of the spherical surface, whether it is the apex of the spherical surface or the lower edge portion, it can be used as a mounting surface of the substrate. There is no distinction, so that there is an effect that the mounting surface of the substrate can be increased by using the entire surface evenly.

【図面の簡単な説明】[Brief description of drawings]

第1図は本発明の一実施例を説明するための概略断面図
である。 1……真空ポンプ、2……エッチング室、3……アノー
ド、4……カソード、5……回転軸、6……モーター、
7……ガス導入口、8……高周波電源、9……半導体基
板。
FIG. 1 is a schematic sectional view for explaining an embodiment of the present invention. 1 ... vacuum pump, 2 ... etching chamber, 3 ... anode, 4 ... cathode, 5 ... rotating shaft, 6 ... motor,
7 ... Gas inlet, 8 ... High frequency power source, 9 ... Semiconductor substrate.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】エッチング室内の対向電極の一方の電極上
に半導体基板を保持し、電極間に高周波電圧を印加する
とともに真空の下で導入されたガスの励起又はイオン化
によって電極上の基板をドライエッチングするドライエ
ッチング装置であって、 対向電極は、上下に向き合わせに配設された上側電極と
下側電極とからなり、 上側電極は、反応ガスの導入口が開口された球面状弯曲
凹面を下面に有し、 下側電極は、上面に球面状弯曲凸面を有し、上側電極の
球面状弯曲凹面で覆われ、 下側電極の球面状弯曲凸面は、複数の半導体基板を搭載
する搭載面であることを特徴とするドライエッチング装
置。
1. A semiconductor substrate is held on one of opposing electrodes in an etching chamber, a high frequency voltage is applied between the electrodes, and the substrate on the electrodes is dried by exciting or ionizing a gas introduced under vacuum. In a dry etching apparatus for etching, a counter electrode is composed of an upper electrode and a lower electrode which are vertically opposed to each other, and the upper electrode has a spherically curved concave surface in which a reaction gas inlet is opened. It has on the bottom surface, the lower electrode has a spherical curved convex surface on the upper surface, and it is covered by the spherical curved concave surface of the upper electrode, and the spherical curved convex surface of the lower electrode is a mounting surface on which multiple semiconductor substrates are mounted. The dry etching apparatus is characterized in that
JP60294840A 1985-12-27 1985-12-27 Dry etching equipment Expired - Fee Related JPH0691040B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60294840A JPH0691040B2 (en) 1985-12-27 1985-12-27 Dry etching equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60294840A JPH0691040B2 (en) 1985-12-27 1985-12-27 Dry etching equipment

Publications (2)

Publication Number Publication Date
JPS62154733A JPS62154733A (en) 1987-07-09
JPH0691040B2 true JPH0691040B2 (en) 1994-11-14

Family

ID=17812931

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60294840A Expired - Fee Related JPH0691040B2 (en) 1985-12-27 1985-12-27 Dry etching equipment

Country Status (1)

Country Link
JP (1) JPH0691040B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6010636A (en) * 1995-12-29 2000-01-04 Lam Research Corporation Electrode with domes for plasma focusing

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6179762A (en) * 1984-09-26 1986-04-23 Hitachi Ltd Vapor deposition device

Also Published As

Publication number Publication date
JPS62154733A (en) 1987-07-09

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