JPH06827Y2 - Small stud type insulated heat sink for semiconductors - Google Patents

Small stud type insulated heat sink for semiconductors

Info

Publication number
JPH06827Y2
JPH06827Y2 JP13925288U JP13925288U JPH06827Y2 JP H06827 Y2 JPH06827 Y2 JP H06827Y2 JP 13925288 U JP13925288 U JP 13925288U JP 13925288 U JP13925288 U JP 13925288U JP H06827 Y2 JPH06827 Y2 JP H06827Y2
Authority
JP
Japan
Prior art keywords
heat sink
ceramic thin
copper
thin plate
back surface
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP13925288U
Other languages
Japanese (ja)
Other versions
JPH0260254U (en
Inventor
眞一 高瀬
芳男 上野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Neturen Co Ltd
Original Assignee
Neturen Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Neturen Co Ltd filed Critical Neturen Co Ltd
Priority to JP13925288U priority Critical patent/JPH06827Y2/en
Publication of JPH0260254U publication Critical patent/JPH0260254U/ja
Application granted granted Critical
Publication of JPH06827Y2 publication Critical patent/JPH06827Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Description

【考案の詳細な説明】 (産業上の利用分野) 本考案はサイリスタ,ダイオード等の小型スタツド形半
導体の発熱を吸収し、冷却して機能の確保および劣化を
防止するヒートシンクに関する。
DETAILED DESCRIPTION OF THE INVENTION (Industrial field of application) The present invention relates to a heat sink that absorbs heat of a small stud type semiconductor such as a thyristor and a diode and cools it to secure its function and prevent its deterioration.

(従来の技術および問題点) この種小型スタツド形半導体用ヒートシンクの従来例と
しては、例えば第4図(a)および(b)に示す如く,
基台100上に絶縁プレート101を挟んで一対の銅板
材102a,102bを直立させ、当該銅板材102
a,102bそれぞれの端面に冷却水管103をそれぞ
れろー付け等で固定配置し、銅板材102a,102b
それぞれの表面に孔設したねじ孔104に半導体Sのね
じ部を螺着する。この場合、装着される半導体は例えば
銅板材102a側が−極性,102b側が+極性として
使用される。従つて、上記銅板材102a,102bそ
れぞれは電極・ヒートシンク兼用部材であり、それぞれ
半導体Sのケースと同電位となつているので、前述の如
く両者間は絶縁プレート101での確実な絶縁が必須で
ある。
(Prior Art and Problems) As a conventional example of this kind of small-sized semiconductor heat sink for semiconductors, for example, as shown in FIGS. 4 (a) and 4 (b),
A pair of copper plate members 102a and 102b are erected on the base 100 with the insulating plate 101 interposed therebetween,
The cooling water pipes 103 are fixedly arranged on the respective end faces of a and 102b by, for example, filtering, and copper plate materials 102a and 102b are provided.
The screw portion of the semiconductor S is screwed into the screw hole 104 formed on each surface. In this case, the semiconductor to be mounted is used, for example, with the − polarity on the copper plate 102a side and the + polarity on the 102b side. Therefore, since each of the copper plate members 102a and 102b is a member that also serves as an electrode and a heat sink and has the same potential as that of the case of the semiconductor S, it is essential to ensure reliable insulation between them by the insulating plate 101 as described above. is there.

上記従来例構成では、極性ないし位相を異にする半導体
Sを装着する電極・ヒートシンク兼用部材102がそれ
ぞれ必要であり、電極・ヒートシンク兼用部材102の
数が多くなるばかりか、冷却水管103への配管も煩雑
となり、かつ全体構成が立体的となつて大きなスペース
が必要である。
In the above-mentioned conventional configuration, the electrodes / heat sink combined members 102 for mounting the semiconductors S having different polarities or phases are required, and not only the number of the electrode / heat sink combined members 102 increases, but also piping to the cooling water pipe 103 is required. However, the whole structure is three-dimensional and requires a large space.

特に問題とされる点は、半導体Sのケースと同電位とな
つている電極・ヒートシンク兼用部材102にろー付け
された冷却水管103に電位がかかるため、当該冷却水
管103に電食が発生し、例えば実公昭55−2876
3号に開示される如き電食防止器具等を冷却水管103
に装着する等,その対策が必要とされることである。
A particularly problematic point is that an electric potential is applied to the cooling water pipe 103 attached to the electrode / heat sink / combined member 102 that has the same electric potential as the case of the semiconductor S, so that electrolytic corrosion occurs in the cooling water pipe 103. , For example, Jitsuko Sho 55-2876
The electrolytic water corrosion prevention device as disclosed in No. 3 is installed in the cooling water pipe 103.
It is necessary to take countermeasures such as mounting it on the.

また、上記の如くヒートシンクが半導体Sのケ−スと同
電位になるのを回避すべく、両者を絶縁する他の従来構
成もある。即ち、第5図に示す如く,ヒートシンク10
5に半導体Sのねじ部を挿入可能なバカ孔106を孔設
しておき、半導体Sのケースとヒートシンク105との
間にマイカあるいは特殊絶縁等107を介して上記バカ
孔106に挿入,固定する構成としてある。
There is also another conventional structure in which the heat sink and the case of the semiconductor S are insulated from each other in order to avoid the same potential as the case of the semiconductor S as described above. That is, as shown in FIG.
5 is provided with a fool hole 106 into which the threaded portion of the semiconductor S can be inserted, and is inserted and fixed in the fool hole 106 via mica or special insulation 107 between the case of the semiconductor S and the heat sink 105. It is as a configuration.

当該構成では、絶縁材107の熱伝導性が悪く、半導体
Sの充分な冷却を達成し得ないという欠点があるととも
に、絶縁材107の絶縁強度が低いという問題点があつ
た。
In this structure, there is a problem that the thermal conductivity of the insulating material 107 is poor and the semiconductor S cannot be cooled sufficiently, and the insulating strength of the insulating material 107 is low.

(考案の目的) 本考案は、従来技術に存する上述の問題点を解消するた
めになされたもので、半導体を充分に冷却可能な如く熱
伝達が良好であり、ヒートシンク自体に電位をかけない
よう,電極・ヒートシンク間の電気絶縁性が充分であ
り、さらには小型化,単純化を達成するとともに強度の
高い小型スタツド形半導体用絶縁ヒートシンクを提供す
ることを目的とする。
(Object of the Invention) The present invention has been made in order to solve the above-mentioned problems existing in the prior art. The heat transfer is good so that the semiconductor can be cooled sufficiently, and the potential of the heat sink itself is not applied. , It is an object of the present invention to provide a small stud type insulated heat sink for a semiconductor, which has sufficient electric insulation between the electrode and the heat sink, achieves further miniaturization and simplification, and has high strength.

(考案の構成) 本考案の要旨は、 (1)高電気絶縁性と高熱伝導性を備え,表面中央部所定
範囲と裏面全体とに薄い銅メタライズ加工されているセ
ラミツクス薄板、 (2)表面に小型スタツド形半導体のねじ部を螺着可能な
ねじ孔が孔設され,裏面をセラミツクス薄板表面の所定
範囲に当接する銅材製電極、 (3)表面にセラミツクス薄板の裏面が当接する銅プレー
ト、 (4)および内部に冷却水通路が設けられているヒートシ
ンク本体を構成要素とし、 (5)上記電極・セラミツクス薄板間およびセラミツクス
薄板・銅プレート間の接触面は半田付けされるととも
に、 (6)セラミツクス薄板の接触面外にある裸出部を含む接
合部周を電気絶縁性モールド剤で被覆,固化して一体化
し、 (7)上記銅プレートの裏面を前記ヒートシンク本体に当
接,固定してなる 小型スタツド形半導体用絶縁ヒートシンクにある。
(Structure of the Invention) The gist of the present invention is (1) a ceramic thin plate that has high electrical insulation and high thermal conductivity, and has a thin copper metallized finish in a predetermined area in the center of the surface and the entire back surface, (2) on the surface A copper electrode is provided with a screw hole into which a screw part of a small stud type semiconductor can be screwed, and the back surface is in contact with a predetermined area of the ceramic thin plate surface. (3) The copper plate is in contact with the back surface of the ceramic thin plate on the surface. (4) and a heat sink body provided with a cooling water passage inside as a constituent element, (5) the contact surface between the electrode and the ceramic thin plate and between the ceramic thin plate and the copper plate is soldered, and (6) The periphery of the joint portion including the bare portion outside the contact surface of the ceramic thin plate is covered with an electrically insulating molding agent and solidified to be integrated, and (7) the back surface of the copper plate is brought into contact with and fixed to the heat sink body. Naru small In stud-type semiconductor insulating heat sink.

(考案の作用) 本考案にかかる絶縁ヒートシンクはセラミツクス薄板の
高電気絶縁性がヒートシンクに電位をかけない作用、従
つてヒートシンク本体に極性ないし位相が異なる半導体
を混載して装着可能とする作用ならびに冷却水管に電食
を生じさせない作用、セラミツクス薄板の高熱伝導性,
銅メタライズ加工が齎す高い接合性ならびに冷却水通路
が設けられているヒートシンク本体の高冷却能との綜合
により半導体の発熱を高効率で吸収する作用、さらには
各要素を一体化して複合絶縁電極体に形成するので,装
置を高強度化する作用がある。
(Effect of the Invention) The insulating heat sink according to the present invention has an effect that the high electrical insulation of the ceramic thin plate does not apply a potential to the heat sink, and accordingly, an effect that the semiconductors having different polarities or phases can be mixedly mounted on the heat sink body and cooling The action that does not cause electrolytic corrosion in the water pipe, the high thermal conductivity of the ceramic thin plate,
Highly efficient bonding of copper metallization and the high cooling capacity of the heat sink body with cooling water passages help to absorb the heat of the semiconductor with high efficiency. Since it is formed on the surface, it has the effect of increasing the strength of the device.

(実施例) 本考案を第1図〜第3図に示す実施例に従つて以下に詳
述する。
(Embodiment) The present invention will be described in detail below with reference to an embodiment shown in FIGS.

第1図において、1は電極、2はセラミツクス薄板、3
は銅プレートである。
In FIG. 1, 1 is an electrode, 2 is a ceramic thin plate, 3
Is a copper plate.

上記電極1は銅ブロツク材であり、表面には小型スタツ
ド形半導体のねじ部を螺入可能な所定数のねじ孔11が
孔設されるとともに、給電端子取付け用のねじ孔12が
孔設されている。
The electrode 1 is a copper block material, and the surface thereof is provided with a predetermined number of screw holes 11 into which screw parts of a small stud type semiconductor can be screwed, and screw holes 12 for mounting a power supply terminal. ing.

上記セラミツクス薄板2は、例えば窒化アルミニウム.
セラミツクスの如き高電気絶縁性かつ高熱伝導性を具え
た材質のものが使用され、上記電極1の裏面よりも縦・
横方向がやや長尺で広い面積を有する。当該セラミツク
ス薄板2の表面中央のAとして示す所定範囲と裏面全面
A′とに銅メタライズ加工が施されている。上記所定範
囲Aとは上記電極1の裏面と同一である。
The ceramic thin plate 2 is, for example, aluminum nitride.
A material such as ceramics having high electrical insulation and high thermal conductivity is used.
The horizontal direction is rather long and has a large area. Copper metallization is applied to a predetermined area indicated by A at the center of the front surface of the ceramic thin plate 2 and the entire back surface A ′. The predetermined range A is the same as the back surface of the electrode 1.

上記銅プレート3は図示されるように,巾は上記セラミ
ツクス薄板2の巾よりも些少広巾であり、長さはビス孔
31を孔設する余地がある如く,セラミツクス薄板2の
長さより長い。当該銅プレート3の中央部はセラミツク
ス薄板2の長さと合致する範囲が極めて浅い凹部Bに形
成されている。当該凹部Bはセラミツクス薄板2の厚さ
より充分浅い。
As shown, the copper plate 3 has a width slightly larger than the width of the ceramic thin plate 2, and the length thereof is longer than the length of the ceramic thin plate 2 so that there is room to form the screw holes 31. The central portion of the copper plate 3 is formed as a recess B having an extremely shallow range that matches the length of the ceramic thin plate 2. The recess B is sufficiently shallower than the thickness of the ceramic thin plate 2.

上記電極1,セラミツクス薄板2,および銅プレート3
の三者は、銅プレート3の凹部Bとセラミツクス薄板2
の銅メタライズされた裏面A′とを、また電極1の裏面
とセラミツクス薄板2の銅メタライズ部Aとを、それぞ
れ半田付けされて一体化される。当該半田付けでは、銅
メタライズによつて濡れ性がよいので、強固な接合とな
る。ただし、半田をそれぞれの接合面からはみ出さない
ことが絶縁性を損なわない上での必須条件である。
The electrode 1, the ceramic thin plate 2, and the copper plate 3
The three parts are the recess B of the copper plate 3 and the ceramic thin plate 2.
The copper metallized back surface A'of the above, and the back surface of the electrode 1 and the copper metallized portion A of the ceramic thin plate 2 are soldered and integrated. In the soldering, the copper metallization has a good wettability, so that a strong bond is obtained. However, it is an essential condition that the solder does not stick out from the respective joint surfaces in order not to impair the insulating property.

上記の如く電極1,セラミツクス薄板2および銅プレー
ト3を一体化した状態において、セラミツクス薄板2の
表面側四囲は電極1との接合面から裸出しており、当該
裸出部分を含む三者の接合部周囲は電気絶縁性のモール
ド剤で被覆して固化させ、複合絶縁電極部材とする。
As described above, in the state where the electrode 1, the ceramic thin plate 2 and the copper plate 3 are integrated, the four sides on the front surface side of the ceramic thin plate 2 are barely exposed from the joint surface with the electrode 1, and the three members including the bare portion are joined together. The periphery of the part is covered with an electrically insulating molding agent and solidified to form a composite insulated electrode member.

第2図(a)〜(c)は上記工程を経て一体化した複合
絶縁電極部材10に半導体Sを装着した状態を示す。同
図における4は前記モールド剤を示す。
2A to 2C show a state in which the semiconductor S is mounted on the composite insulated electrode member 10 integrated through the above steps. Reference numeral 4 in the figure indicates the molding agent.

第3図は本実施例完成状態の一部分を平面視した図であ
り、図における5は冷却水が内部を導通しているヒート
シンク本体、10a,10bは前記銅プレート3に設け
られているビス孔31を用いてビス32でヒートシンク
本体5上に固定配置された複合電極部材、7aおよび7
bそれぞれは前記電極1に孔設されているねじ孔12に
取り付けた給電端子である。
FIG. 3 is a plan view of a part of the completed state of the present embodiment. In FIG. 3, 5 is a heat sink main body through which cooling water is conducted, and 10a and 10b are screw holes provided in the copper plate 3. A composite electrode member 7a and 7 fixedly arranged on the heat sink body 5 with a screw 32 using 31.
Each of b is a power supply terminal attached to a screw hole 12 formed in the electrode 1.

本考案実施例では複合絶縁電極部材10a,10bそれ
ぞれが高電気絶縁性を備えたセラミツクス薄板2により
ヒートシンク本体5・電極1間を確実に絶縁しているの
で、例えば図示しない直流電源の+極性を給電端子7a
に接続,−極性を給電端子7bに接続しても何等の支障
を生ずることはない。
In the embodiment of the present invention, since the composite insulated electrode members 10a and 10b each securely insulate the heat sink body 5 and the electrode 1 by the ceramic thin plate 2 having high electric insulation, for example, the + polarity of the DC power supply (not shown) is used. Power supply terminal 7a
There is no problem even if the negative polarity is connected to the power supply terminal 7b.

また、複合絶縁電極部材10におけるセラミツクス薄板
2は高熱伝導性をも備えているので、半導体Sの発熱は
当該セラミツクス薄板2と良好な接合状態にある電極1
および銅プレート3介しヒートシンク本体5に効果的に
伝導し、かつヒートシンク本体5は冷却水が内部を流通
していて高冷却能を備えているので、半導体Sは高効率
で冷却される。
Further, since the ceramic thin plate 2 in the composite insulated electrode member 10 also has high thermal conductivity, the heat generated by the semiconductor S is in good contact with the ceramic thin plate 2.
Since the heat sink body 5 is effectively conducted to the heat sink body 5 through the copper plate 3 and the cooling water flows through the heat sink body 5 and has a high cooling ability, the semiconductor S is cooled with high efficiency.

(他の実施例) 上記実施例では、銅プレート3の表面に浅い凹部Bが形
成されていて、当該凹部Bにセラミツクス薄板2を当
接,半田付けする場合を挙げて説明したが、凹部Bを形
成せずにセラミツクス薄板2を当接,半田付けしてもよ
い。然し乍ら、固着の堅牢性,半田付け時の作業性等の
見地から実施例に従うほうが好ましいい結果が得られ
る。
(Other Embodiments) In the above embodiments, the shallow recess B is formed on the surface of the copper plate 3, and the ceramic thin plate 2 is brought into contact with and soldered to the recess B. The ceramic thin plate 2 may be contacted and soldered without forming the. However, from the viewpoints of robustness of fixation, workability at the time of soldering, and the like, it is preferable to follow the example, which is preferable.

また、実施例完成状態を示す第3図には、極性の異なる
複合絶縁電極部材10a,10bを併設して示している
が、位相ないし極性が異なる2個以上の複合絶縁電極部
材10a〜10nを1個のヒートシンク本体5上に配置
可能なことは勿論である。
Further, in FIG. 3 showing the completed state of the embodiment, the composite insulated electrode members 10a and 10b having different polarities are shown together, but two or more composite insulated electrode members 10a to 10n having different phases or polarities are shown. Of course, it can be arranged on one heat sink body 5.

(考案の効果) 本考案にかかる絶縁ヒートシンクは半導体の発熱を高効
率で冷却し得るとともに、ヒートシンク本体には全く電
位をかけない。従つて、極性ないし位相が異なる複数の
電極を1個のヒートシンク上に近接配置することが可能
となり、小型化,単純化が達成される。さらには、冷却
水管の電食の虞が皆無となり、電食防止機具等の設置を
不要とする。そのうえ、構造が堅牢であり、上記電食の
虞が皆無あることと相俟つて長期間の使用に耐えるな
ど、本考案が齎す効果は極めて大きい。
(Effect of the Invention) The insulating heat sink according to the present invention can cool the heat generation of the semiconductor with high efficiency and does not apply any electric potential to the heat sink body. Therefore, it is possible to dispose a plurality of electrodes having different polarities or phases close to each other on a single heat sink, thereby achieving miniaturization and simplification. Further, there is no fear of electrolytic corrosion of the cooling water pipe, and it is unnecessary to install an electrolytic corrosion preventing device or the like. In addition, the present invention is extremely effective in that it has a strong structure and bears no fear of the above-mentioned electrolytic corrosion, and withstands long-term use.

【図面の簡単な説明】[Brief description of drawings]

第1図は本考案実施例における構成要素の一部を示す斜
視図、第2図(a)〜(c)それぞれは第1図に示す構
成要素の組立状態を示す平面図,正面図および側面図、
第3図は本考案実施例完成状態の平面図、第4図(a)
および(b)は従来例の正面図および側面断面図、第5
図は他の従来例の正面断面図である。 1…………………電極 11………………ねじ孔 2…………………セラミツクス薄板 3…………………銅プレート 4…………………電気絶縁性モールド剤 5…………………ヒートシンク本体 A,A′…………銅メタライズ加工範囲 B…………………凹部 S…………………小型スタツド形半導体
FIG. 1 is a perspective view showing a part of the constituent elements in an embodiment of the present invention, and FIGS. 2 (a) to (c) are plan views, front views and side views showing the assembled state of the constituent elements shown in FIG. Figure,
FIG. 3 is a plan view of the completed embodiment of the present invention, and FIG. 4 (a).
And (b) are a front view and a side sectional view of a conventional example,
The figure is a front sectional view of another conventional example. 1 …………………… Electrode 11 ……………… Screw hole 2 …………………… Ceramics thin plate 3 …………………… Copper plate 4 ………………… Electrically insulating mold Agent 5 …………………… Heatsink body A, A ′ ………… Copper metallization processing range B …………………… Recess S ………………… Small stud type semiconductor

Claims (2)

【実用新案登録請求の範囲】[Scope of utility model registration request] 【請求項1】高電気絶縁性と高熱伝導性を備え,表面中
央部所定範囲と裏面全体とに薄い銅メタライズ加工され
ているセラミツクス薄板、表面に小型スタツド形半導体
のねじ部を螺着可能なねじ孔が孔設され,裏面をセラミ
ツクス薄板表面の上記所定範囲に当接する銅材製電極、
表面にセラミツクス薄板の裏面が当接する銅プレート、
および内部に冷却水通路が設けられているヒートシンク
本体を構成要素とし、上記電極・セラミツクス薄板間お
よびセラミツクス薄板・銅プレート間の接触面は半田付
けされるとともに、セラミツクス薄板の接触面外にある
裸出部を含む接合部周を電気絶縁性モールド剤で被覆,
固化して一体化し、上記銅プレートの裏面を前記ヒート
シンク本体に当接,固定してなる小型スタツド形半導体
用絶縁ヒートシンク。
1. A ceramic thin plate having a high electrical insulation property and a high thermal conductivity, and a thin copper metallized metal in a predetermined area of the front surface and the entire back surface, and a threaded portion of a small stud type semiconductor can be screwed on the surface. An electrode made of a copper material having a screw hole, the back surface of which is in contact with the above-mentioned predetermined range on the surface of the ceramic thin plate,
A copper plate whose front surface is in contact with the back surface of the ceramic thin plate,
And a heat sink body with a cooling water passage inside is a component, and the contact surfaces between the electrodes and the ceramic thin plates and between the ceramic thin plates and the copper plates are soldered and bare outside the contact surfaces of the ceramic thin plates. The periphery of the joint part including the projecting part is covered with an electrically insulating molding agent,
A small stud type insulated heat sink for semiconductors, which is solidified and integrated, and the back surface of the copper plate is brought into contact with and fixed to the heat sink body.
【請求項2】セラミツクス薄板の裏面が当接する銅プレ
ートの表面所定範囲が極めて浅い凹部とされている請求
項1記載の小型スタツド形半導体用絶縁ヒートシンク。
2. A small stud type insulated heat sink for semiconductors according to claim 1, wherein a predetermined area on the surface of the copper plate with which the back surface of the ceramic thin plate contacts is a very shallow recess.
JP13925288U 1988-10-27 1988-10-27 Small stud type insulated heat sink for semiconductors Expired - Lifetime JPH06827Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13925288U JPH06827Y2 (en) 1988-10-27 1988-10-27 Small stud type insulated heat sink for semiconductors

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13925288U JPH06827Y2 (en) 1988-10-27 1988-10-27 Small stud type insulated heat sink for semiconductors

Publications (2)

Publication Number Publication Date
JPH0260254U JPH0260254U (en) 1990-05-02
JPH06827Y2 true JPH06827Y2 (en) 1994-01-05

Family

ID=31402338

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13925288U Expired - Lifetime JPH06827Y2 (en) 1988-10-27 1988-10-27 Small stud type insulated heat sink for semiconductors

Country Status (1)

Country Link
JP (1) JPH06827Y2 (en)

Also Published As

Publication number Publication date
JPH0260254U (en) 1990-05-02

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