JPH0675808A - Microcomputer testing device - Google Patents

Abstract

PURPOSE:To provide the microcomputer testing device which can test a date time function of a microcomputer of a personal computer and a work processor, etc., being a body to be tested, in an unmanned state, can prevent an erroneous test caused by a worker's simple error, and can improve the efficiency of a test process. CONSTITUTION:Plural microcomputers are provided along a conveyor 9, and in each of these computers, an adaptor for connecting a body to be tested and the microcomputer is provided, and in a first microcomputer M1, a first clock mechanism 1 and a time input means 3 for inputting the time of this first clock mechanism 1 to the body to be tested are provided, and in a second microcomputer M2, a second clock mechanism, a time reading-out means 4 for reading out the time inputted to the body to be tested, and a time comparing means 5 for comparing the read-out time and the time of a second clock mechanism 2, and inputting a result of comparison to the body to be tested are provided.

Description

Detailed Description of the Invention

[0001]

FIELD OF THE INVENTION This invention relates to improvements in microcomputer test equipment. In particular, it is possible to test the date / time function of a computer under test, such as a personal computer or a word processor, unattended, prevent erroneous tests due to simple mistakes by workers, and improve the efficiency of the test process. An improvement aimed at providing a computer test device.

[0002]

2. Description of the Related Art A microcomputer test apparatus according to the prior art will be described with reference to the drawings.

FIG. 4 is an explanatory view of the configuration of a microcomputer test apparatus according to the prior art.

Referring to FIG. 4, reference numeral 9 denotes a conveyor on which a device under test (a microcomputer such as a personal computer or a word processor) 20 is mounted and conveyed. M11 is a first microcomputer for testing provided along the conveyor 9, and M12 is a second microcomputer for testing provided along the conveyor 9. A11 and A12 are connected to the test microcomputers M11 and M12, respectively, and when the device under test 20 is transported to a position corresponding to the test microcomputer, the connecting device C11 is connected.
An adapter connected to the device under test 20 by C12. Reference numerals 13 and 14 are keyboards provided in the first microcomputer M11 and the second microcomputer M12, and reference numerals 15 and 16 are the first microcomputer M11 and the second microcomputer M12, respectively.
It is a CRT provided in 12. Reference numeral 17 is a pallet on which the device under test 20 is installed. The arrow indicates the traveling direction of the conveyor 9.

Next, the operation of the microcomputer test apparatus according to the prior art will be described. First, when the DUT 20 is conveyed by the conveyor 9 and reaches a position corresponding to the first microcomputer M11 for testing,
The adapter A11 is automatically connected to the device under test 20. In this state, the operator of the first microcomputer M11 selects the date / time setting program from the menu displayed on the CRT 15, activates the diagnostic program of the device under test 20, and sets the date / time by the operator's own wristwatch. When it is recognized, the keyboard 13 is pressed to input the time. The device under test 2 is operated by the program for setting the date and time.
Date time is written to zero. After this, the adapter A11 is disconnected, and the device under test 20 is transported to a position corresponding to the next second microcomputer M12. At this position, the adapter A12 of the second microcomputer M12 is automatically connected to the device under test 20. Worker is C
Select the menu displayed on the RT 16 and start the date / time confirmation program. The current date and time of the DUT 20 is displayed on the CRT 16, and the operator compares the displayed time with the time of the operator's own wristwatch, and both times are not within the allowable time difference, or other When the displayed result is abnormal, the device under test 20 is judged to be defective.

[0006]

As described above, in the microcomputer testing apparatus according to the prior art, since the operator intervenes in the test, when the operator makes a mistake in reading the wristwatch or making a wrong keystroke. However, there is a drawback that erroneous tests occur as a result.

An object of the present invention is to eliminate this drawback. It is possible to test the date and time function of a computer under test, such as a personal computer or a word processor, unattended, and an error caused by a simple mistake made by an operator. An object of the present invention is to provide a microcomputer test device capable of preventing a test and improving the efficiency of the test process.

[0008]

The above object is to provide a plurality of microcomputers (Mi) along a conveyor (9), and connect each of the microcomputers (Mi) with a microcomputer to be tested. There is an adapter (Ai) for
) Connected to the above-mentioned conveyor (9) and connected to the corresponding microcomputer (Mi) successively, in the microcomputer testing apparatus, among the plurality of microcomputers (Mi), 1
Of the microcomputer (M1), and a time input means (1) for inputting the time of the first clock mechanism (1) to the DUT via the adapter (A1). 3) is provided, and the second microcomputer (M2) of the plurality of microcomputers (Mi) is input to the second clock mechanism (2) and the device under test. The time read out means (4) for reading out the time read out via the adapter (A2), the time read out by the time read out means (4) and the time of the second clock mechanism (2). This is achieved by a microcomputer test device provided with a time comparison means (5) for comparing and inputting the result of comparison to the device under test.

In the above structure, the time of the second clock mechanism (2) of the second microcomputer (M2) is set to the first time of the first microcomputer (M1).
Has a time calibrating means (6) for calibrating with reference to the time of the clock mechanism (1), or an absolute clock (8) and the first microcomputer based on the time of this absolute clock (8). (M1) and the second microcomputer (M2) each have a time calibrating means (7) for calibrating the time of the clock mechanism, so that there is no need to adjust the time between the clock mechanisms, and the efficiency of the test can be improved. Is improved.

[0010]

In the microcomputer test apparatus according to the present invention, a clock mechanism is provided on the first microcomputer for testing and the second microcomputer provided along the conveyor, and these are connected via an adapter. The test microcomputer is automatically connected to the microcomputer of the device under test, the time of the clock mechanism of the first microcomputer is automatically written in the device under test, and after the transfer time has elapsed, the second microcomputer is used. The written time is read out and compared with the time of the clock mechanism of the second microcomputer to judge the quality of the DUT.
It is possible to achieve unmanned operation without the intervention of an operator and prevent an erroneous test due to a simple mistake made by the operator.

Further, in the present invention, a reference timepiece mechanism is set, or an absolute timepiece is provided, and another timepiece is automatically set by the calibration means at the time of the reference timepiece mechanism or the absolute timepiece. Since the time of the mechanism is adjusted, it is not necessary for the operator to adjust the time between the clock mechanisms, and the efficiency of the test process can be improved.

[0012]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS A microcomputer test apparatus according to a third embodiment of the present invention will be described below with reference to the drawings.

FIG. 1 is a diagram showing the construction of a microcomputer test apparatus according to the first embodiment (corresponding to claim 1).

In FIG. 1, M1 is a first microcomputer for testing provided along the conveyor 9, and M2 is a second microcomputer for testing provided along the conveyor 9. is there. A1 is connected to the above-mentioned first microcomputer M1, and when the device under test 20 is transported to a position corresponding to the first microcomputer M1, it is automatically detected by the connecting device C1 or the like. It is an adapter connected to the test body 20. A2 is connected to the second microcomputer M2, and like the above A1, the device under test 20 is automatically operated by, for example, the connecting device C2.
Is an adapter that is connected to. Reference numeral 1 is a first clock mechanism provided in the first microcomputer M1,
Reference numeral 2 is a second timepiece mechanism provided in the second microcomputer M2. 3 is the above-mentioned first timepiece mechanism 1
Is a time input means for inputting the time to the DUT 20 via the adapter A1, and 4 is a time reading means for reading the time input to the DUT 20 via the adapter A2. Reference numeral 5 is a time comparing means for comparing the time read by the time reading means 4 with the time of the second clock mechanism 2 and inputting the result to the device under test 20. 17
Is a pallet on which the device under test 20 is installed. The arrow indicates the traveling direction of the conveyor 9.

Next, the operation of this embodiment will be described. In advance, the clock mechanism 1 of the first microcomputer M1
And the time of the clock mechanism 2 of the second microcomputer M2 are set to be the same. When the device under test 20 installed on the pallet 17 is conveyed to a position corresponding to the first microcomputer M1, the adapter A1 is automatically connected to the device under test 20 by the connector C1 to form a test circuit. To be done. The first microcomputer M1 activates a date / time setting diagnostic program stored in a storage device (for example, a floppy or a hard disk) of the device under test 20, and uses the time input means 3 to detect the time of the clock mechanism 1. It is sent to the test body 20. The time input to the device under test 20 is written in the timer of the device under test 20 based on the diagnostic program. After that, the connection state by the adapter A1 is released, and the pallet 17 on which the device under test 20 is installed is transported to the next position corresponding to the second microcomputer M2. When the pallet 17 reaches this position, the connector A2 automatically connects the adapter A2 to the device under test 20 to form a test circuit. Second
The microcomputer M2 starts up the date / time confirmation program stored in the storage device of the device under test 20,
The present time is read from the device under test 20 using the time reading means 4. The time comparing means 5 compares the read time with the time of the second clock mechanism 2 and judges whether the difference between these two times is within the allowable time difference,
The result is sent to the device under test 20, and the test result is stored in the storage device of the device under test 20. After this, adapter A
The connection state by 2 is released, and the device under test 20 is sent to the next test process.

As described above, the microcomputer test apparatus according to this embodiment enables unattended testing of the date / time function of the device under test 20.

FIG. 2 is a diagram showing the construction of a microcomputer test apparatus according to the second embodiment (corresponding to claim 2).

Referring to FIG. 2, the present embodiment is different from the first embodiment in that the clock mechanisms of the respective test microcomputers are independent from each other in the first embodiment, whereas in the present embodiment, Is only to calibrate the time of the clock mechanism of the second test microcomputer by using the time calibrating means with the time of the clock mechanism of the first microcomputer test as a reference.

In the figure, 6 is the time calibration means. The description of the other reference numerals is the same as that of the first embodiment and will not be repeated.

In the operation of this embodiment, the time calibration means 6
The second microcomputer M2 has the first time
The procedure is the same as that of the first embodiment except that the time is adjusted with reference to the time of the clock mechanism 1 of the microcomputer M1.

By the way, since the clock mechanism of the test microcomputer may cause an error of several tens of seconds in one month, the time of the clock mechanism of the first microcomputer and the time of the clock mechanism of the second microcomputer are different from each other. May cause inconsistency, and in order to avoid this, it is necessary to reset the date and time in the first embodiment. However, in this embodiment, the above inconsistency in time is not caused, and the resetting of date and time, etc. It has the advantage that it is not complicated.

The timepiece mechanism 1 is based on the timepiece mechanism 2.
Of course, even if you calibrate, you can get the same benefits.

FIG. 3 is a structural explanatory view of a microcomputer test apparatus according to a third embodiment (corresponding to claim 3).

See FIG. 3. The difference of this embodiment from the first embodiment is that, in the first embodiment, the clock mechanisms of the respective test microcomputers are independent of each other, whereas this embodiment is different from the first embodiment. In the above, only an absolute clock is provided, and the time calibration means is used to calibrate the time of each clock mechanism of the first and second microcomputers for testing with reference to the time of the absolute clock.

In the figure, 7 is a time calibrating means for calibrating this time, and 8 is an absolute clock for counting an accurate time. The description of the symbols other than the above is the same as in the case of the first embodiment.

In the operation of the present embodiment, the time calibration means 7 is used with the time of the absolute clock 8 as a reference to calibrate the time of each clock mechanism of the first and second microcomputers for testing. This is the same as in the first embodiment.

In the present embodiment, the time of the clock mechanism of each test microcomputer is automatically calibrated with reference to the time of the absolute clock, so that the time of each clock mechanism is always the same, and There is no need for mutual time adjustment. Further, in comparison with the possibility that the time of the reference clock mechanism of the test microcomputer in the second embodiment has a time error of several tens of seconds per month, the microcomputer test apparatus according to the present embodiment has It enables the test of the date / time function to be performed more accurately.

[0028]

As described above, in the microcomputer test apparatus according to the present invention, a plurality of microcomputers are provided along the conveyor that conveys the microcomputer as the device under test, and each of the microcomputers is provided. An adapter for connecting the microcomputer and the device under test is provided, and the first microcomputer inputs the first clock mechanism and the time of this clock mechanism to the device under test via the adapter. Means is provided, the second microcomputer has a second clock mechanism, time reading means for reading the time input and written in the DUT, and the read time for the second time. Since the time comparison means for inputting the result of comparison with the time of the clock mechanism to the device under test is provided, the date of the device under test is Test between functions can be performed unattended. Further, in the present invention, one of the above-mentioned timepiece mechanisms that serves as a reference is set, or an absolute clock is provided, and the time of other timepiece mechanisms is automatically set by the time calibration means based on these times. Since it is calibrated, it is not necessary to adjust the time between the clock mechanisms and the efficiency of the test process can be improved.

Therefore, according to the present invention, the date and time function of a microcomputer such as a personal computer or a word processor to be tested can be tested unattended, an erroneous test due to a simple mistake by an operator can be prevented, and the efficiency of the test process can be improved. A microcomputer test device that can be improved can be provided.

[Brief description of drawings]

FIG. 1 is a configuration explanatory diagram of a microcomputer test apparatus according to a first embodiment of the present invention.

FIG. 2 is an explanatory diagram of a configuration of a microcomputer test apparatus according to a second embodiment of the present invention.

FIG. 3 is a configuration explanatory diagram of a microcomputer test apparatus according to a third embodiment of the present invention.

FIG. 4 is an explanatory diagram of a configuration of a microcomputer test apparatus according to a conventional technique.

[Explanation of symbols]

 1 1st clock mechanism 2 2nd clock mechanism 3 Time input means 4 Time reading means 5 Time comparison means 6/7 Time calibration means 8 Absolute clock 9 Conveyor 13/14 Keyboard 15/16 CRT 17 Pallet 20 Test object M1 first microcomputer (present invention) M2 second microcomputer (present invention) M11 first microcomputer (prior art) M12 second microcomputer (prior art) A1 ・ A2 ・ A11 ・ A12 adapter C1 ・C2 / C11 / C12 splicer

Claims (3)

[Claims] 1. A plurality of microcomputers (Mi) are provided along a conveyor (9), and each of the microcomputers (Mi) is provided with an adapter (Ai) for connecting a microcomputer to be tested. , A device under test connected to the adapter (Ai) is mounted on the conveyor (9) and sequentially connected to a corresponding microcomputer (Mi), wherein the plurality of microcomputers (Mi) Of which the first
Of the microcomputer (M1), and a time input means (3) for inputting the time of the first clock mechanism (1) and the time of the first clock mechanism (1) to the device under test via the adapter (A1). ) Are provided, the second microcomputer (M2) of the plurality of microcomputers (Mi) is provided with a second clock mechanism (2) and a time input to the device under test. The time reading means (4) for reading through the adapter (A2), the time read by the time reading means (4) and the time of the second clock mechanism (2) are compared and compared. A microcomputer test apparatus, characterized in that it is provided with a time comparison means (5) for inputting the result to the DUT. 2. The second microcomputer (M2
) The second timepiece mechanism (2) of (1) has a time calibrating means (6) for calibrating the time of the second timepiece mechanism (2) with reference to the time of the first timepiece mechanism (1) of the first microcomputer (M1). The microcomputer test apparatus according to claim 1. 3. An absolute clock (8) and the first microcomputer (M) based on the time of the absolute clock (8).
2. The microcomputer test apparatus according to claim 1, further comprising a time calibration means (7) for calibrating the time of a clock mechanism provided in each of 1) and the second microcomputer (M2).