JPH06508890A - Use of organometallic compounds to deposit metals on substrates - Google Patents
Use of organometallic compounds to deposit metals on substratesInfo
- Publication number
- JPH06508890A JPH06508890A JP5518874A JP51887493A JPH06508890A JP H06508890 A JPH06508890 A JP H06508890A JP 5518874 A JP5518874 A JP 5518874A JP 51887493 A JP51887493 A JP 51887493A JP H06508890 A JPH06508890 A JP H06508890A
- Authority
- JP
- Japan
- Prior art keywords
- formula
- compound
- tables
- formulas
- compounds
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 229910052751 metal Inorganic materials 0.000 title claims description 42
- 239000002184 metal Substances 0.000 title claims description 42
- 150000002902 organometallic compounds Chemical class 0.000 title claims description 27
- 150000002739 metals Chemical class 0.000 title claims description 20
- 239000000758 substrate Substances 0.000 title claims description 12
- 150000001875 compounds Chemical class 0.000 claims description 42
- 238000000034 method Methods 0.000 claims description 26
- 125000004432 carbon atom Chemical group C* 0.000 claims description 13
- 238000000151 deposition Methods 0.000 claims description 13
- 125000000217 alkyl group Chemical group 0.000 claims description 11
- 238000006243 chemical reaction Methods 0.000 claims description 11
- 239000000126 substance Substances 0.000 claims description 11
- 238000001556 precipitation Methods 0.000 claims description 10
- 239000001257 hydrogen Substances 0.000 claims description 8
- 229910052739 hydrogen Inorganic materials 0.000 claims description 8
- 125000004435 hydrogen atom Chemical group [H]* 0.000 claims description 8
- 125000000753 cycloalkyl group Chemical group 0.000 claims description 7
- 230000008021 deposition Effects 0.000 claims description 7
- 238000004519 manufacturing process Methods 0.000 claims description 7
- 238000001947 vapour-phase growth Methods 0.000 claims description 7
- 125000003118 aryl group Chemical group 0.000 claims description 6
- 229910052727 yttrium Inorganic materials 0.000 claims description 6
- 229910052797 bismuth Inorganic materials 0.000 claims description 5
- 239000002019 doping agent Substances 0.000 claims description 5
- 239000003446 ligand Substances 0.000 claims description 5
- RGSFGYAAUTVSQA-UHFFFAOYSA-N pentamethylene Natural products C1CCCC1 RGSFGYAAUTVSQA-UHFFFAOYSA-N 0.000 claims description 5
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 claims description 5
- 239000010409 thin film Substances 0.000 claims description 5
- 229910052785 arsenic Inorganic materials 0.000 claims description 4
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 claims description 4
- MGNZXYYWBUKAII-UHFFFAOYSA-N cyclohexa-1,3-diene Chemical compound C1CC=CC=C1 MGNZXYYWBUKAII-UHFFFAOYSA-N 0.000 claims description 4
- HGCIXCUEYOPUTN-UHFFFAOYSA-N cyclohexene Chemical compound C1CCC=CC1 HGCIXCUEYOPUTN-UHFFFAOYSA-N 0.000 claims description 4
- LPIQUOYDBNQMRZ-UHFFFAOYSA-N cyclopentene Chemical group C1CC=CC1 LPIQUOYDBNQMRZ-UHFFFAOYSA-N 0.000 claims description 4
- 125000001511 cyclopentyl group Chemical group [H]C1([H])C([H])([H])C([H])([H])C([H])(*)C1([H])[H] 0.000 claims description 4
- 229910052731 fluorine Inorganic materials 0.000 claims description 4
- 239000011737 fluorine Chemical group 0.000 claims description 4
- 230000007935 neutral effect Effects 0.000 claims description 4
- 230000003287 optical effect Effects 0.000 claims description 4
- XDTMQSROBMDMFD-UHFFFAOYSA-N Cyclohexane Chemical compound C1CCCCC1 XDTMQSROBMDMFD-UHFFFAOYSA-N 0.000 claims description 3
- PXGOKWXKJXAPGV-UHFFFAOYSA-N Fluorine Chemical group FF PXGOKWXKJXAPGV-UHFFFAOYSA-N 0.000 claims description 3
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 claims description 3
- DMEGYFMYUHOHGS-UHFFFAOYSA-N heptamethylene Natural products C1CCCCCC1 DMEGYFMYUHOHGS-UHFFFAOYSA-N 0.000 claims description 3
- 230000005693 optoelectronics Effects 0.000 claims description 3
- 230000003647 oxidation Effects 0.000 claims description 3
- 238000007254 oxidation reaction Methods 0.000 claims description 3
- 150000002910 rare earth metals Chemical group 0.000 claims description 3
- 229910052787 antimony Inorganic materials 0.000 claims description 2
- WATWJIUSRGPENY-UHFFFAOYSA-N antimony atom Chemical compound [Sb] WATWJIUSRGPENY-UHFFFAOYSA-N 0.000 claims description 2
- ZSWFCLXCOIISFI-UHFFFAOYSA-N cyclopentadiene Chemical group C1C=CC=C1 ZSWFCLXCOIISFI-UHFFFAOYSA-N 0.000 claims description 2
- LMBFAGIMSUYTBN-MPZNNTNKSA-N teixobactin Chemical compound C([C@H](C(=O)N[C@@H]([C@@H](C)CC)C(=O)N[C@@H](CO)C(=O)N[C@H](CCC(N)=O)C(=O)N[C@H]([C@@H](C)CC)C(=O)N[C@@H]([C@@H](C)CC)C(=O)N[C@@H](CO)C(=O)N[C@H]1C(N[C@@H](C)C(=O)N[C@@H](C[C@@H]2NC(=N)NC2)C(=O)N[C@H](C(=O)O[C@H]1C)[C@@H](C)CC)=O)NC)C1=CC=CC=C1 LMBFAGIMSUYTBN-MPZNNTNKSA-N 0.000 claims 2
- 150000003018 phosphorus compounds Chemical class 0.000 claims 1
- -1 bismuth organometallic compounds Chemical class 0.000 description 11
- 239000000203 mixture Substances 0.000 description 9
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 8
- 239000011777 magnesium Substances 0.000 description 8
- 238000000354 decomposition reaction Methods 0.000 description 7
- 239000007788 liquid Substances 0.000 description 7
- 239000000243 solution Substances 0.000 description 7
- 239000011701 zinc Substances 0.000 description 7
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 6
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 description 6
- OFBQJSOFQDEBGM-UHFFFAOYSA-N Pentane Chemical compound CCCCC OFBQJSOFQDEBGM-UHFFFAOYSA-N 0.000 description 6
- 239000011575 calcium Substances 0.000 description 6
- 239000007789 gas Substances 0.000 description 6
- 229910052749 magnesium Inorganic materials 0.000 description 6
- 239000012071 phase Substances 0.000 description 6
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 5
- 125000000484 butyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 5
- 230000001419 dependent effect Effects 0.000 description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- TWRXJAOTZQYOKJ-UHFFFAOYSA-L Magnesium chloride Chemical compound [Mg+2].[Cl-].[Cl-] TWRXJAOTZQYOKJ-UHFFFAOYSA-L 0.000 description 4
- 229910052788 barium Inorganic materials 0.000 description 4
- 238000009835 boiling Methods 0.000 description 4
- 239000011651 chromium Substances 0.000 description 4
- 125000000392 cycloalkenyl group Chemical group 0.000 description 4
- 239000010408 film Substances 0.000 description 4
- 239000007791 liquid phase Substances 0.000 description 4
- 229910052698 phosphorus Inorganic materials 0.000 description 4
- 239000002904 solvent Substances 0.000 description 4
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 3
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 3
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 3
- 125000004429 atom Chemical group 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 3
- 229910052793 cadmium Inorganic materials 0.000 description 3
- 229910052791 calcium Inorganic materials 0.000 description 3
- 229910052799 carbon Inorganic materials 0.000 description 3
- 239000012159 carrier gas Substances 0.000 description 3
- 229910052804 chromium Inorganic materials 0.000 description 3
- 239000011248 coating agent Substances 0.000 description 3
- 238000000576 coating method Methods 0.000 description 3
- 239000010949 copper Substances 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 238000009472 formulation Methods 0.000 description 3
- 239000010931 gold Substances 0.000 description 3
- 229910052742 iron Inorganic materials 0.000 description 3
- 239000011133 lead Substances 0.000 description 3
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 3
- 125000002524 organometallic group Chemical group 0.000 description 3
- 229910052763 palladium Inorganic materials 0.000 description 3
- 230000000737 periodic effect Effects 0.000 description 3
- 239000011574 phosphorus Substances 0.000 description 3
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 3
- 150000003254 radicals Chemical class 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 229910052712 strontium Inorganic materials 0.000 description 3
- 229910052718 tin Inorganic materials 0.000 description 3
- 239000010936 titanium Substances 0.000 description 3
- 229910052725 zinc Inorganic materials 0.000 description 3
- ZZFZTGTYZKTQHK-UHFFFAOYSA-N CN(C)CCC[Zr](CCCN(C)C)(CCCN(C)C)CCCN(C)C Chemical compound CN(C)CCC[Zr](CCCN(C)C)(CCCN(C)C)CCCN(C)C ZZFZTGTYZKTQHK-UHFFFAOYSA-N 0.000 description 2
- OYPRJOBELJOOCE-UHFFFAOYSA-N Calcium Chemical compound [Ca] OYPRJOBELJOOCE-UHFFFAOYSA-N 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 2
- 229910052684 Cerium Inorganic materials 0.000 description 2
- XPDWGBQVDMORPB-UHFFFAOYSA-N Fluoroform Chemical group FC(F)F XPDWGBQVDMORPB-UHFFFAOYSA-N 0.000 description 2
- 229910052688 Gadolinium Inorganic materials 0.000 description 2
- 239000002879 Lewis base Substances 0.000 description 2
- 239000005922 Phosphane Substances 0.000 description 2
- XYFCBTPGUUZFHI-UHFFFAOYSA-N Phosphine Chemical compound P XYFCBTPGUUZFHI-UHFFFAOYSA-N 0.000 description 2
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 2
- 229910007926 ZrCl Inorganic materials 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 2
- DSAJWYNOEDNPEQ-UHFFFAOYSA-N barium atom Chemical compound [Ba] DSAJWYNOEDNPEQ-UHFFFAOYSA-N 0.000 description 2
- WDIHJSXYQDMJHN-UHFFFAOYSA-L barium chloride Chemical compound [Cl-].[Cl-].[Ba+2] WDIHJSXYQDMJHN-UHFFFAOYSA-L 0.000 description 2
- 229910001626 barium chloride Inorganic materials 0.000 description 2
- DNHQOFMDZDOSSZ-UHFFFAOYSA-N bis[3-(dimethylamino)propyl]mercury Chemical compound CN(CCC[Hg]CCCN(C)C)C DNHQOFMDZDOSSZ-UHFFFAOYSA-N 0.000 description 2
- BDOSMKKIYDKNTQ-UHFFFAOYSA-N cadmium atom Chemical compound [Cd] BDOSMKKIYDKNTQ-UHFFFAOYSA-N 0.000 description 2
- YKYOUMDCQGMQQO-UHFFFAOYSA-L cadmium dichloride Chemical compound Cl[Cd]Cl YKYOUMDCQGMQQO-UHFFFAOYSA-L 0.000 description 2
- 239000003153 chemical reaction reagent Substances 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
- 125000000113 cyclohexyl group Chemical group [H]C1([H])C([H])([H])C([H])([H])C([H])(*)C([H])([H])C1([H])[H] 0.000 description 2
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 2
- 239000000284 extract Substances 0.000 description 2
- 229910052737 gold Inorganic materials 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 125000003187 heptyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 2
- 125000004051 hexyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 2
- 239000012442 inert solvent Substances 0.000 description 2
- 229910001629 magnesium chloride Inorganic materials 0.000 description 2
- 229910052748 manganese Inorganic materials 0.000 description 2
- 239000011572 manganese Substances 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 230000008018 melting Effects 0.000 description 2
- 238000002844 melting Methods 0.000 description 2
- 150000002736 metal compounds Chemical class 0.000 description 2
- 229910052759 nickel Inorganic materials 0.000 description 2
- 239000010955 niobium Substances 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- 125000002347 octyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 2
- 239000003960 organic solvent Substances 0.000 description 2
- 239000001301 oxygen Substances 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- 125000006340 pentafluoro ethyl group Chemical group FC(F)(F)C(F)(F)* 0.000 description 2
- 125000001147 pentyl group Chemical group C(CCCC)* 0.000 description 2
- 229910000064 phosphane Inorganic materials 0.000 description 2
- 230000001376 precipitating effect Effects 0.000 description 2
- 125000001436 propyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])[H] 0.000 description 2
- 239000010948 rhodium Substances 0.000 description 2
- 229910052709 silver Inorganic materials 0.000 description 2
- 239000007790 solid phase Substances 0.000 description 2
- 238000003860 storage Methods 0.000 description 2
- CIOAGBVUUVVLOB-UHFFFAOYSA-N strontium atom Chemical compound [Sr] CIOAGBVUUVVLOB-UHFFFAOYSA-N 0.000 description 2
- 125000001424 substituent group Chemical group 0.000 description 2
- 238000003786 synthesis reaction Methods 0.000 description 2
- 229910052715 tantalum Inorganic materials 0.000 description 2
- 229910052719 titanium Inorganic materials 0.000 description 2
- 125000002023 trifluoromethyl group Chemical group FC(F)(F)* 0.000 description 2
- GETQZCLCWQTVFV-UHFFFAOYSA-N trimethylamine Chemical compound CN(C)C GETQZCLCWQTVFV-UHFFFAOYSA-N 0.000 description 2
- RIOQSEWOXXDEQQ-UHFFFAOYSA-N triphenylphosphine Chemical compound C1=CC=CC=C1P(C=1C=CC=CC=1)C1=CC=CC=C1 RIOQSEWOXXDEQQ-UHFFFAOYSA-N 0.000 description 2
- 238000007740 vapor deposition Methods 0.000 description 2
- HJOOGTROABIIIU-UHFFFAOYSA-N 1-[2-[4-(6-methoxy-2-phenyl-3,4-dihydronaphthalen-1-yl)phenoxy]ethyl]pyrrolidine;hydrochloride Chemical compound Cl.C1CC2=CC(OC)=CC=C2C(C=2C=CC(OCCN3CCCC3)=CC=2)=C1C1=CC=CC=C1 HJOOGTROABIIIU-UHFFFAOYSA-N 0.000 description 1
- 125000005916 2-methylpentyl group Chemical group 0.000 description 1
- ZSLUVFAKFWKJRC-IGMARMGPSA-N 232Th Chemical compound [232Th] ZSLUVFAKFWKJRC-IGMARMGPSA-N 0.000 description 1
- 125000005917 3-methylpentyl group Chemical group 0.000 description 1
- QZYNLEQHEADQEW-UHFFFAOYSA-N C(C)N(CCC[Sr]CCCN(CC)CC)CC Chemical compound C(C)N(CCC[Sr]CCCN(CC)CC)CC QZYNLEQHEADQEW-UHFFFAOYSA-N 0.000 description 1
- YAUZTWKVXNEPOX-UHFFFAOYSA-N CN(C)CCC[Mg]CCCN(C)C Chemical compound CN(C)CCC[Mg]CCCN(C)C YAUZTWKVXNEPOX-UHFFFAOYSA-N 0.000 description 1
- AOTSPIMXIBODNA-UHFFFAOYSA-N CN(CCC[Ca]CCCN(C)C)C Chemical compound CN(CCC[Ca]CCCN(C)C)C AOTSPIMXIBODNA-UHFFFAOYSA-N 0.000 description 1
- VZWOXHOCWZZRLL-UHFFFAOYSA-N CN(CCC[Cd]CCCN(C)C)C Chemical compound CN(CCC[Cd]CCCN(C)C)C VZWOXHOCWZZRLL-UHFFFAOYSA-N 0.000 description 1
- VEXZGXHMUGYJMC-UHFFFAOYSA-M Chloride anion Chemical compound [Cl-] VEXZGXHMUGYJMC-UHFFFAOYSA-M 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 229910052692 Dysprosium Inorganic materials 0.000 description 1
- 229910052691 Erbium Inorganic materials 0.000 description 1
- 229910052693 Europium Inorganic materials 0.000 description 1
- 239000007818 Grignard reagent Substances 0.000 description 1
- 229910052765 Lutetium Inorganic materials 0.000 description 1
- PWHULOQIROXLJO-UHFFFAOYSA-N Manganese Chemical compound [Mn] PWHULOQIROXLJO-UHFFFAOYSA-N 0.000 description 1
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- 229910052779 Neodymium Inorganic materials 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- 229910052771 Terbium Inorganic materials 0.000 description 1
- 229910052776 Thorium Inorganic materials 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 239000007983 Tris buffer Substances 0.000 description 1
- 229910052769 Ytterbium Inorganic materials 0.000 description 1
- 150000001338 aliphatic hydrocarbons Chemical class 0.000 description 1
- 229910052783 alkali metal Inorganic materials 0.000 description 1
- 150000004945 aromatic hydrocarbons Chemical class 0.000 description 1
- RBFQJDQYXXHULB-UHFFFAOYSA-N arsane Chemical compound [AsH3] RBFQJDQYXXHULB-UHFFFAOYSA-N 0.000 description 1
- 229910000066 arsane Inorganic materials 0.000 description 1
- 229940065285 cadmium compound Drugs 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- GWXLDORMOJMVQZ-UHFFFAOYSA-N cerium Chemical compound [Ce] GWXLDORMOJMVQZ-UHFFFAOYSA-N 0.000 description 1
- 150000001805 chlorine compounds Chemical class 0.000 description 1
- 229910017052 cobalt Inorganic materials 0.000 description 1
- 239000010941 cobalt Substances 0.000 description 1
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 125000000522 cyclooctenyl group Chemical group C1(=CCCCCCC1)* 0.000 description 1
- 125000000640 cyclooctyl group Chemical group [H]C1([H])C([H])([H])C([H])([H])C([H])([H])C([H])(*)C([H])([H])C([H])([H])C1([H])[H] 0.000 description 1
- 125000002433 cyclopentenyl group Chemical group C1(=CCCC1)* 0.000 description 1
- 125000001559 cyclopropyl group Chemical group [H]C1([H])C([H])([H])C1([H])* 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 150000004985 diamines Chemical class 0.000 description 1
- 125000006001 difluoroethyl group Chemical group 0.000 description 1
- 125000001028 difluoromethyl group Chemical group [H]C(F)(F)* 0.000 description 1
- KBQHZAAAGSGFKK-UHFFFAOYSA-N dysprosium atom Chemical compound [Dy] KBQHZAAAGSGFKK-UHFFFAOYSA-N 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- UYAHIZSMUZPPFV-UHFFFAOYSA-N erbium Chemical compound [Er] UYAHIZSMUZPPFV-UHFFFAOYSA-N 0.000 description 1
- 150000002170 ethers Chemical class 0.000 description 1
- OGPBJKLSAFTDLK-UHFFFAOYSA-N europium atom Chemical compound [Eu] OGPBJKLSAFTDLK-UHFFFAOYSA-N 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 239000012467 final product Substances 0.000 description 1
- 125000001153 fluoro group Chemical group F* 0.000 description 1
- 125000003784 fluoroethyl group Chemical group [H]C([H])(F)C([H])([H])* 0.000 description 1
- UIWYJDYFSGRHKR-UHFFFAOYSA-N gadolinium atom Chemical compound [Gd] UIWYJDYFSGRHKR-UHFFFAOYSA-N 0.000 description 1
- 230000014509 gene expression Effects 0.000 description 1
- 229910052732 germanium Inorganic materials 0.000 description 1
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 150000004795 grignard reagents Chemical class 0.000 description 1
- 125000006343 heptafluoro propyl group Chemical group 0.000 description 1
- 125000001449 isopropyl group Chemical group [H]C([H])([H])C([H])(*)C([H])([H])[H] 0.000 description 1
- 210000003127 knee Anatomy 0.000 description 1
- 229910052746 lanthanum Inorganic materials 0.000 description 1
- FZLIPJUXYLNCLC-UHFFFAOYSA-N lanthanum atom Chemical compound [La] FZLIPJUXYLNCLC-UHFFFAOYSA-N 0.000 description 1
- 238000001182 laser chemical vapour deposition Methods 0.000 description 1
- 229910052745 lead Inorganic materials 0.000 description 1
- JQJCSZOEVBFDKO-UHFFFAOYSA-N lead zinc Chemical compound [Zn].[Pb] JQJCSZOEVBFDKO-UHFFFAOYSA-N 0.000 description 1
- 150000007527 lewis bases Chemical class 0.000 description 1
- 239000006193 liquid solution Substances 0.000 description 1
- RRFBKRFYFCJYFK-UHFFFAOYSA-N lithium;n,n-dimethylpropan-1-amine Chemical compound [Li+].CN(C)CC[CH2-] RRFBKRFYFCJYFK-UHFFFAOYSA-N 0.000 description 1
- XBEREOHJDYAKDA-UHFFFAOYSA-N lithium;propane Chemical compound [Li+].CC[CH2-] XBEREOHJDYAKDA-UHFFFAOYSA-N 0.000 description 1
- OHSVLFRHMCKCQY-UHFFFAOYSA-N lutetium atom Chemical compound [Lu] OHSVLFRHMCKCQY-UHFFFAOYSA-N 0.000 description 1
- 229960002523 mercuric chloride Drugs 0.000 description 1
- 229910052753 mercury Inorganic materials 0.000 description 1
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 1
- 150000002731 mercury compounds Chemical class 0.000 description 1
- LWJROJCJINYWOX-UHFFFAOYSA-L mercury dichloride Chemical compound Cl[Hg]Cl LWJROJCJINYWOX-UHFFFAOYSA-L 0.000 description 1
- 238000001465 metallisation Methods 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- JWAJUTZQGZBKFS-UHFFFAOYSA-N n,n-diethylprop-2-en-1-amine Chemical group CCN(CC)CC=C JWAJUTZQGZBKFS-UHFFFAOYSA-N 0.000 description 1
- QEFYFXOXNSNQGX-UHFFFAOYSA-N neodymium atom Chemical compound [Nd] QEFYFXOXNSNQGX-UHFFFAOYSA-N 0.000 description 1
- 229910052758 niobium Inorganic materials 0.000 description 1
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 description 1
- 125000005246 nonafluorobutyl group Chemical group FC(F)(F)C(F)(F)C(F)(F)C(F)(F)* 0.000 description 1
- 125000001190 organyl group Chemical group 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- 239000002244 precipitate Substances 0.000 description 1
- 150000003141 primary amines Chemical class 0.000 description 1
- 230000002035 prolonged effect Effects 0.000 description 1
- 229910052761 rare earth metal Inorganic materials 0.000 description 1
- 238000011084 recovery Methods 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 229910052702 rhenium Inorganic materials 0.000 description 1
- WUAPFZMCVAUBPE-UHFFFAOYSA-N rhenium atom Chemical compound [Re] WUAPFZMCVAUBPE-UHFFFAOYSA-N 0.000 description 1
- 229910052703 rhodium Inorganic materials 0.000 description 1
- MHOVAHRLVXNVSD-UHFFFAOYSA-N rhodium atom Chemical compound [Rh] MHOVAHRLVXNVSD-UHFFFAOYSA-N 0.000 description 1
- 229910052706 scandium Inorganic materials 0.000 description 1
- SIXSYDAISGFNSX-UHFFFAOYSA-N scandium atom Chemical compound [Sc] SIXSYDAISGFNSX-UHFFFAOYSA-N 0.000 description 1
- 150000003335 secondary amines Chemical class 0.000 description 1
- VSZWPYCFIRKVQL-UHFFFAOYSA-N selanylidenegallium;selenium Chemical compound [Se].[Se]=[Ga].[Se]=[Ga] VSZWPYCFIRKVQL-UHFFFAOYSA-N 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 239000010944 silver (metal) Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000004528 spin coating Methods 0.000 description 1
- 230000002269 spontaneous effect Effects 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 238000010025 steaming Methods 0.000 description 1
- 238000003756 stirring Methods 0.000 description 1
- 239000002887 superconductor Substances 0.000 description 1
- 239000000725 suspension Substances 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
- GZCRRIHWUXGPOV-UHFFFAOYSA-N terbium atom Chemical compound [Tb] GZCRRIHWUXGPOV-UHFFFAOYSA-N 0.000 description 1
- 150000003512 tertiary amines Chemical class 0.000 description 1
- 125000006337 tetrafluoro ethyl group Chemical group 0.000 description 1
- 125000000725 trifluoropropyl group Chemical group [H]C([H])(*)C([H])([H])C(F)(F)F 0.000 description 1
- XCZXGTMEAKBVPV-UHFFFAOYSA-N trimethylgallium Chemical compound C[Ga](C)C XCZXGTMEAKBVPV-UHFFFAOYSA-N 0.000 description 1
- IBEFSUTVZWZJEL-UHFFFAOYSA-N trimethylindium Chemical compound C[In](C)C IBEFSUTVZWZJEL-UHFFFAOYSA-N 0.000 description 1
- LENZDBCJOHFCAS-UHFFFAOYSA-N tris Chemical compound OCC(N)(CO)CO LENZDBCJOHFCAS-UHFFFAOYSA-N 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- LEONUFNNVUYDNQ-UHFFFAOYSA-N vanadium atom Chemical compound [V] LEONUFNNVUYDNQ-UHFFFAOYSA-N 0.000 description 1
- 239000012808 vapor phase Substances 0.000 description 1
- 229910052726 zirconium Inorganic materials 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F11/00—Compounds containing elements of Groups 6 or 16 of the Periodic Table
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F3/00—Compounds containing elements of Groups 2 or 12 of the Periodic Table
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F3/00—Compounds containing elements of Groups 2 or 12 of the Periodic Table
- C07F3/02—Magnesium compounds
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F3/00—Compounds containing elements of Groups 2 or 12 of the Periodic Table
- C07F3/10—Mercury compounds
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F5/00—Compounds containing elements of Groups 3 or 13 of the Periodic Table
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F7/00—Compounds containing elements of Groups 4 or 14 of the Periodic Table
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/06—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material
- C23C16/18—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material from metallo-organic compounds
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/305—Sulfides, selenides, or tellurides
- C23C16/306—AII BVI compounds, where A is Zn, Cd or Hg and B is S, Se or Te
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Crystallography & Structural Chemistry (AREA)
- Mechanical Engineering (AREA)
- Inorganic Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるため要約のデータは記録されません。 (57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
【発明の詳細な説明】 基体上に金属を析出するための有機金属化合物の使用本発明は金属として第2族 ないし第4族の元素、第1ないし第8亜族の元素、希土類元素あるいはビスマス を含有する有機金属化合物を薄いフィルムの製造のためにあるいは金属の析出に よるエピタキシャル層の製造のために、おもに液相あるいは気相から、その有機 金属化合物を分解しながら使用することに関する。[Detailed description of the invention] Use of organometallic compounds for depositing metals on substrates The present invention uses metals of Group 2 as metals. or elements of group 4, elements of subgroups 1 to 8, rare earth elements, or bismuth organometallic compounds containing for the production of thin films or for the deposition of metals. For the production of epitaxial layers, the organic It relates to the use of metal compounds while decomposing them.
純粋な元素から成るあるいは例えば窒素、砒素、燐と結合した形から成るそのよ うな層の析出は電気的、光学的、光学電子的、スイッチング素子、化合物半導体 、レーザーの製造に使用することができる。consisting of pure elements or their combined forms with, for example, nitrogen, arsenic, or phosphorus; The deposition of this layer can be applied to electrical, optical, optoelectronic, switching devices, and compound semiconductors. , can be used in the production of lasers.
これらのフィルムの特性は析出条件および析出したフィルムの化学組成によって 変動する。The properties of these films depend on the deposition conditions and the chemical composition of the deposited film. fluctuate.
これらの層の析出は固相、液相、気相から行うことが可能である。These layers can be deposited from the solid phase, liquid phase, or gas phase.
気相からの可能な析出方法は金属−有機化合物蒸気析出(MOCVD)法、UV 照射によって物質が分解するような光−金属有機蒸気相(光−MOVP)法、レ ーザー化合物蒸気析出(レーザーCVD)法、あるいは金属−有機マグネトロン スパッタリング(MOMS)法のような全ての既知の方法を包含している。信性 と比較したときの有利な点は制御可能な層成長、微細に制御したドーピングおよ び大気圧あるいは低圧条件によって、簡単な操作、単純な製造方法である。Possible deposition methods from the gas phase include metal-organic vapor deposition (MOCVD), UV Photo-metal organic vapor phase (photo-MOVP) method, in which materials are decomposed by irradiation, laser compound vapor deposition (laser CVD) method, or metal-organic magnetron All known methods are included, such as the sputtering (MOMS) method. credibility The advantages compared to It is easy to operate and manufacture under atmospheric or low pressure conditions.
MOCVD法は1100℃以下の温度で金属を析出しながら分解する有機金属化 合物を使用する。現在MOCVD法を使用している典型的な装置は有機金属化合 物用の供給装置付きの「バブラー」と称する吐き出し口、コーティングする基体 を含有する反応室および有機金属成分には不活性でなくてはならないキャリアガ スのための供給源から構成されている。「バブラー」は好ましくは有機金属化合 物の融点よりは高く、しかし分解温度より遥かに低い一定の、比較的低い温度に 維持されている。反応室あるいは分解室は好ましくは遥かに高い温度を有してお り、ただし1100℃以下の温度であり、その温度で有機金属化合物が完全に分 解し、金属が析出するのである。キャリアガスを使って、有機金属化合物を蒸気 状態に転換し、キャリアガスと一緒に分解室に導入する。蒸気の流れの量を容易 に制御することが可能であり、このことが薄い層のよく制御した成長を可能にし ている。The MOCVD method is an organic metallization process in which metals are decomposed while being precipitated at temperatures below 1100°C. Use a compound. The typical equipment currently using MOCVD is organometallic Outlet called "bubbler" with feeding device for material, substrate to be coated A carrier gas that must be inert for reaction chambers and organometallic components containing consists of sources for resources. The "bubbler" is preferably an organometallic compound to a constant, relatively low temperature above the melting point of a substance but far below the decomposition temperature Maintained. The reaction chamber or decomposition chamber preferably has a much higher temperature. However, the temperature is below 1100℃, at which the organometallic compound is completely separated. The metal is precipitated. Steaming organometallic compounds using a carrier gas and introduced into the decomposition chamber together with the carrier gas. Easy amount of steam flow This allows for well-controlled growth of thin layers. ing.
気相析出の他の方法では基本的には分解に必要なエネルギーを供給する方法だけ が他から異なっている。Other methods of vapor phase deposition basically only provide the energy necessary for decomposition. is different from others.
気相析出法は技術、装置において複雑であり、多くの製造パラメーターの複雑な 制御および監視を必要とする欠点を持っている。Vapor phase deposition methods are complex in terms of technology, equipment, and many manufacturing parameters. It has the disadvantage of requiring control and monitoring.
気相析出用のそのようなシステムを利用できないときには、液相あるいは固相か らの析出を含む方法が遥かに便利である。この場合には妥当な有機金属化合物を 含有する液体或は固体コーティング付きの基体を準備し、更にその後に有機金属 化合物を分解するために熱処理することだけが必要である。When such a system for vapor phase deposition is not available, either liquid or solid phase can be used. A method involving the precipitation of these methods is much more convenient. In this case, use a reasonable organometallic compound. Prepare a substrate with a liquid or solid coating containing the organometallic Only heat treatment is necessary to decompose the compound.
例えば、スピン−オン技術によって、液相からの金属の析出を実行する。このこ とは溶液あるいは処方のある量を基体の中心に適用することおよび、擾の後に後 者を事前に設定しておいた速度で回転させることを包含している。その結果とし て、基体表面上に一様な厚さの層のフィ°ルムが形成され、その厚さはスピン速 度および処方の粘性によって定まり、その金属含有量は有機金属化合物の濃度に よって事前に決めることができる。溶媒を蒸発後におよび有機金属化合物の分解 温度以上に加熱後に、金属層を基体上に得ることができる。Deposition of metals from the liquid phase is carried out, for example, by spin-on techniques. this child means applying an amount of a solution or formulation to the center of the substrate and, after stirring, This includes rotating the person at a preset speed. As a result As a result, a film of uniform thickness is formed on the substrate surface, and the thickness depends on the spin speed. The metal content is determined by the concentration of the organometallic compound and the viscosity of the formulation. Therefore, it can be decided in advance. After evaporation of solvent and decomposition of organometallic compounds After heating above the temperature, a metal layer can be obtained on the substrate.
エピタキシャル層の生成は今まで主に例えばトリメチルガリウム、トリメチルア ルミニウムあるいはトリメチルインジウムのような金属アルキルを使って行われ てきた。これらの化合物は空気、湿気に対して極めて敏感であって、自発的に発 火し易く、一部の化合物は室温よりそれほど高くない温度で分解する。しだがっ て、その合成、輸送、貯蔵およびこれらの化合物の使用は複雑な安全措置を必要 とする。その敏感性のために、廃棄は問題でありかつ、回収は実質的には不可能 である。Up until now, epitaxial layers have mainly been produced using trimethylgallium, trimethylalium, etc. carried out using metal alkyls such as aluminum or trimethylindium. It's here. These compounds are extremely sensitive to air and moisture and cannot be released spontaneously. Flammable, some compounds decompose at temperatures not much above room temperature. I'm sorry The synthesis, transportation, storage and use of these compounds require complex safety measures. shall be. Due to its sensitivity, disposal is problematic and recovery is virtually impossible. It is.
トリメチルアミンおよびトリフェニルフォスフインのようなルイス塩基による付 加化合物(例えばGB21 23 422、EP−A 108469あるいはE P−A 176537に記載済み)のような、あるいはこのタイプの分子内で安 定化した化合物(例えば、DE−A 36 31 469およびDE−A38 41 643に記載済み)のようにそのうちに公知なった安定化した金属アルキ ルの使用は限界があり、その理由はその安定性がなおまだ十分ではない、あるい は気相析出方法には余りにも揮発4性であるからである。Attachment with Lewis bases such as trimethylamine and triphenylphosphine Addition compounds (e.g. GB21 23 422, EP-A 108469 or E P-A 176537) or within molecules of this type. regulated compounds (e.g. DE-A 36 31 469 and DE-A38 41, 643) which became known over time. There are limits to the use of This is because it is too volatile for vapor phase deposition.
本発明の目的は敏感でなく、しかも操作が簡単であるおよび液相および気相両者 からの析出に適当な金属金属オルガニル(organyl)を見出すことである 。The object of the invention is to be insensitive and simple to operate and to provide both liquid and gas phase The objective is to find suitable metal organyls for precipitation from .
金属として元素の周期律の第2ないし第4族、第1ないし第8亜族の元素、希土 類のグループからの元素あるいはビスマスを含有する多重配位有機金属化合物が 上記の要求条件に極めて良く合致することを我々発明者は見出した。Elements of groups 2 to 4 and subgroups 1 to 8 of the periodic law as metals, rare earths A multiply coordinated organometallic compound containing an element from the group of We, the inventors, have found that the above requirements are met extremely well.
従って、本発明は式■の有機金属化合物のR−M+Z] z スピン−オンあるいは気相析出によって基体上に金属を析出するための使用に関 する。Therefore, the present invention provides an organometallic compound of the formula (RM+Z) For use in depositing metals on substrates by spin-on or vapor phase deposition. do.
ただし、この式においては R1は水素、1−8個の炭素原子を持つアルキル、しかもその一部分あるいは全 てが弗素化していても良く、3−8個の炭素原子を持つシクロアルキル、あるい はシクロアルケニルあるいはアリール基であり、 M は第2あるいは第4族、第1、第2、第3、第4、第5、第6、第7あるい は第8亜族の金属あるいは希土類グループからの金属あるいはビスマスでもあり 、 n は1,2.3あるいは4であり 0 は0,1.2あるいは3であり、 n+o は金属の酸化状態に関し 2 は−X−Y或は−Xo であり、 X は −(CHR勺、− −NR” − A はシクロヘキサン、シクロヘキセン、シクロへキサジエンあるいはフェニル リングであり、 B はシクロペンタン、シクロペンテンあるいはシクロペンタジェンリングであ り、Y及びYo は互いに独立であり、それぞれ(CHz )−NR’ R’、 −(CH2)、−PR’ R’、 (CH* ) @ −A s R’ R’あるいは−(CHz )−SbR’ R’であり、R2は水素、弗素あるいは1−8個の炭素原子を有するアルキル基 であって、そのなかで一部分あるいは完全に弗素化している可能性があり、 R3及びR4は互いに独立であり、それぞれ水素、1−8個の炭素原子を有する アルキル基であって、そのアルキル基が一部分あるいは完全に弗素化していても よく、3−8個の炭素原子を有するシクロアルキルあるいはシクロアルケニル基 あるいはアリール基であり、 m はl、2.3あるいは4であり、 s、r、pおよびqはお互いに独立であり、それぞれOll、2あるいは3であ り、 さらに式■の化合物は1種またはそれ以上の中性のリガンドに結合していること も可能であり、ただしM=Znの場合には、Xが−(CHR”)、−ではないと いう条件付きである。However, in this formula R1 is hydrogen, alkyl having 1-8 carbon atoms, partially or completely; cycloalkyl having 3-8 carbon atoms, which may be fluorinated; is a cycloalkenyl or aryl group, M is Group 2 or 4, 1st, 2nd, 3rd, 4th, 5th, 6th, 7th or is also a metal of subgroup 8 or a metal from the rare earth group or bismuth , n is 1, 2.3 or 4 0 is 0, 1.2 or 3, n+o is related to the oxidation state of the metal 2 is -X-Y or -Xo, X is - (CHR 勺, - -NR"- A is cyclohexane, cyclohexene, cyclohexadiene or phenyl is a ring, B is cyclopentane, cyclopentene or cyclopentadiene ring , Y and Yo are independent of each other, respectively (CHHz)-NR' R', -(CH2), -PR' R', (CH*) @-A s R' R' or -(CHz)-SbR' R', and R2 is hydrogen, fluorine, or an alkyl group having 1-8 carbon atoms. However, there is a possibility that it is partially or completely fluorinated. R3 and R4 are independent of each other, each hydrogen, having 1-8 carbon atoms An alkyl group, even if the alkyl group is partially or completely fluorinated. Often cycloalkyl or cycloalkenyl groups having 3-8 carbon atoms Or it is an aryl group, m is l, 2.3 or 4, s, r, p and q are independent of each other and are Oll, 2 or 3, respectively. the law of nature, Furthermore, the compound of formula ■ is bound to one or more neutral ligands. is also possible, but in the case of M=Zn, X must be -(CHR"), - There is a condition.
本発明は更に薄いフィルムあるいは層を有機金属化合物からの金属の析出によっ て基体上に作製するための方法に関し、しかしその使用される有機金属化合物が 式Iの金属オルガノリルである。The present invention further provides for the formation of thin films or layers by precipitation of metals from organometallic compounds. However, the organometallic compound used is Metal organolyl of formula I.
本発明は更に式IIに対応する式Iの新規な化合物に関している。The invention further relates to novel compounds of formula I corresponding to formula II.
ただしコノ式のなかでR’、o、M、X’ 、Y、Y’およびn式■に示した意 味を有する。However, in the Kono style, the meaning shown in R', o, M, X', Y, Y' and n formula ■ Has taste.
式Iの化合物の一部は既知である0例えば、亜鉛のジアルキル化合物あるいはそ れに対応するカドミウムおよび水銀化合物に関する配位化合物の研究はに、−H ,ティーμ(Thiele)等、無機および一般化学雑誌(Z、anorg、a l l g、Chem、)4旦(1980)152およびE、ランクグー1− (Langguth)等、同誌 530 (1985)69に記載されている。Some of the compounds of formula I are known, for example dialkyl compounds of zinc or The corresponding coordination compound studies for cadmium and mercury compounds are , Thiele, etc., inorganic and general chemistry journals (Z, anorg, a l l g, Chem, ) 4dan (1980) 152 and E, rank goo 1- (Languth) et al., 530 (1985) 69.
テトラキス(3−ジメチルアミノプロピル)ジルコニムの製造方法をE、ランク ゲートなどが同誌 505 (1983)127に記載している。金属の析出の ためにこれらの物質を使用することはしかしながらそこには記載されていない。Rank E for the production method of tetrakis(3-dimethylaminopropyl)zirconium Gate et al. describe this in the same magazine, 505 (1983) 127. of metal precipitation However, the use of these substances for this purpose is not described therein.
式■およびIIの化合物は多重に配位しており、第5族の窒素、燐、砒素あるい はアチモン原子から電子欠損金属に電子を移動させることによって分子内で安定 化している。従って、空気および酸素にだいしては特に安定である。室温で自発 的に発火することもなぐまた分解することもないので、極めて操作は簡単であ1 )表子6−508890 (5) る、しかしながら、約1100℃迄の温度の影響によって、金属を析出しながら 分解することができる0式■およびIIの化合物は液相および気相両者から金属 を析出させるためには妥当であることが見出された。Compounds of formulas ■ and II are multiply coordinated and contain Group 5 nitrogen, phosphorus, arsenic or is stabilized within the molecule by transferring electrons from the atimone atom to the electron-deficient metal. It has become Therefore, it is particularly stable towards air and oxygen. spontaneous at room temperature It is extremely easy to operate and does not ignite or decompose. ) Omotoko 6-508890 (5) However, due to the influence of temperatures up to about 1100°C, metals can be deposited while Compounds of formula 0 and II that can be decomposed remove metals from both liquid and gas phases. It was found that this method is suitable for precipitating.
式IおよびIIの化合物が安定なしかも容易に除去できる離脱基を含有している ので、炭素の極く少量のみがそのなかに含まれ、このことは最終製品の品質には 大きな利点になっている。Compounds of formulas I and II contain stable yet easily removable leaving groups. Therefore, only a very small amount of carbon is contained in it, which affects the quality of the final product. It's a big advantage.
今までの及び今後の式I、IIおよびIII及び全て従属式では、Mは第2或は 第4族の金属であり、好ましくはマグネシウム(Mg)、カルシウム(Ca)、 ストロンチウム(Sr)、バリウム(Ba)ゲルマニウム(Ge)、錫(Sn) あるいは鉛(Pb)あるいはビスマス(Bi)、第5族の金属である。 これら のなかで特に好ましいのはCa、Ba、Sr%Sn、Biおよびpbである。In formulas I, II and III heretofore and hereafter and in all dependent formulas, M is the second or Group 4 metal, preferably magnesium (Mg), calcium (Ca), Strontium (Sr), barium (Ba) germanium (Ge), tin (Sn) Or lead (Pb) or bismuth (Bi), a group 5 metal. These Particularly preferred among these are Ca, Ba, Sr%Sn, Bi, and pb.
Mはさらに元素の周期律表の第1、第2、第3、第4、第5、第6、第7或は第 8亜族の金属および従って好ましくは銅(Cu)、銀(Ag>、金(Au)、亜 鉛(Zn)、カドミウム(Cd)、水銀(Hg)、スカンジウム(Sc)、イツ トリウム(Y)、ランタン(La)、チタン(Ti)、ジルコニウム(Zr)、 八ツニウム(Hf)、バナジウム(V)、ニオビウム(Nb)、タンタル(Ta )、クロム(Cr)、モリブデン(Mo)、タングステン(W)、マンガン(M n) 、レニウム(Re)、鉄(I r) 、コバルト(co)、ニッケル(N i)、ロジウム(Rh)、パラジウム(Pd)或は白金(Pt)である、これら のうち、Cd、Zn、Pb、Cu%Mn、Sn、Zr、Hg、Y、Ta、Ti、 Ag、Au、Fe、Pd、NiあるいはPdが特に好ましい。M is also the first, second, third, fourth, fifth, sixth, seventh or seventh element of the periodic table of elements. Metals of subgroup 8 and therefore preferably copper (Cu), silver (Ag>, gold (Au), zinc Lead (Zn), cadmium (Cd), mercury (Hg), scandium (Sc), Thorium (Y), lanthanum (La), titanium (Ti), zirconium (Zr), Octunium (Hf), vanadium (V), niobium (Nb), tantalum (Ta ), chromium (Cr), molybdenum (Mo), tungsten (W), manganese (M n), rhenium (Re), iron (Ir), cobalt (co), nickel (N i) rhodium (Rh), palladium (Pd) or platinum (Pt); Among them, Cd, Zn, Pb, Cu%Mn, Sn, Zr, Hg, Y, Ta, Ti, Particularly preferred are Ag, Au, Fe, Pd, Ni or Pd.
Mは更に希土類グループからの金属でもあり、従ってセリウム(Ce)、プラセ オジウム(Pr)、ネオジム(Nd)、プロメジウム(Pm)、サーマリウム( Sm)、ユーロピウム(Eu)、ガドリニウム(Gd)、テルビウム(Tb)、 ジスプロシウム(Dy)、ホロニウム(Ho)、エルビウム(Er)、ツーリウ ム(Tm)、イテルビウム(Yb)、ルテシウム(Lu)である。これらのうち で、Ce、Gd、Yb、P「およびNdが特に好ましい。M is also a metal from the rare earth group, thus cerium (Ce), Ozium (Pr), Neodymium (Nd), Promedium (Pm), Thermarium ( Sm), europium (Eu), gadolinium (Gd), terbium (Tb), Dysprosium (Dy), Holonium (Ho), Erbium (Er), Thuriu These are aluminum (Tm), tterbium (Yb), and lutetium (Lu). Of these Particularly preferred are Ce, Gd, Yb, P' and Nd.
基R1,R3およびR4はそれぞれ好ましくは1−8個の炭素原子、好ましくは l−5個の炭素原子を有する直鎖或は枝別れしたアルキル基である。そのアルキ ル基は好ましくは直鎖であり、従って好ましくはメチル、エチル、プロピル、ブ チル、ペンチルであり、更にヘキシル、ヘプチル、オクチル、イソプロピル、第 二級ブチル、第三級ブチル、2−メチルペンチル、3−メチルペンチルあるいは 2−オクチルでもある。The radicals R1, R3 and R4 each preferably have 1-8 carbon atoms, preferably A straight-chain or branched alkyl group having 1-5 carbon atoms. that archi The group is preferably straight-chain and therefore preferably methyl, ethyl, propyl, butyl. tyl, pentyl, hexyl, heptyl, octyl, isopropyl, Secondary butyl, tertiary butyl, 2-methylpentyl, 3-methylpentyl or Also 2-octyl.
アルキル基は部分的にあるいは完全に弗素化していても良く、例えばモノフルオ ウロメチル、ジフルオロメチル、トリフルオロメチル、ジフルオロエチル、トリ フルオロエチル、ペンタフルオロエチルあるいはトリフルオロプロピルであるこ ともある。Alkyl groups may be partially or fully fluorinated, e.g. monofluorinated. Uromethyl, difluoromethyl, trifluoromethyl, difluoroethyl, trifluoromethyl Must be fluoroethyl, pentafluoroethyl or trifluoropropyl. There is also.
R’、R’および/またはR4が3−8個の炭素散性するシクロアルキルあるい はシクロアルケニル基であるならば、好ましくはこれらはシクロプロピル、シク ロブチル、シクロペンチル、シクロペンテニル、シクロヘキシル、シクロへキセ ニル、シクロへキサジェニル、シクロへブチル、シクロへブテニル、シクロへブ タジェニル、シクロオクチル、シクロオクテニル、シクロオクタジェニル、シク ロオクタジェニル、シクロオクタテトラエニルであり、あるいは特に好ましいの はシクロペンタジェニルである。R', R' and/or R4 are 3-8 carbon dissipated cycloalkyl or are cycloalkenyl groups, preferably they are cyclopropyl, cycloalkenyl, butyl, cyclopentyl, cyclopentenyl, cyclohexyl, cyclohexyl Nyl, cyclohexagenyl, cyclohebutyl, cyclohebutenyl, cycloheb tagenyl, cyclooctyl, cyclooctenyl, cyclooctagenyl, cyclo rooctagenyl, cyclooctatetraenyl, or particularly preferred is cyclopentagenyl.
更に式■あるいはIIの化合物はR’、R’および/またはR4がアリール基で あるような化合物が好ましい。アリール基は好ましくはフェニル基を意味してい る。このフェニル基は置換した形で存在していてもよい。これらの置換基が目的 とする利用に何等の重要な影響を持たないので、分解反応に好ましくない効果を 及ぼさない全ての置換基が許されるのである。Further, the compound of formula (II) or II is such that R', R' and/or R4 are aryl groups. Certain compounds are preferred. Aryl preferably means phenyl. Ru. This phenyl group may be present in substituted form. These substituents are intended for It does not have any significant effect on the intended use and does not have an unfavorable effect on the decomposition reaction. All substituents that do not have any effect are permitted.
基R’ならびにR3およびR4は繰返し表われることもあり、その時には同一の 意味こともあり、また異なった意味のこともある。The radicals R' and R3 and R4 may also appear repeatedly, then identical Sometimes it has one meaning, and sometimes it has a different meaning.
n+c)は使用した特定の金属の酸化状態に対応している0例えば、M=Znで あるならば、n+o=2であり、M=Zrならば、n+o=4であり、M=Ca ならば、n+o=2である。nは1,2.3あるいは4であり、0は好ましくは 0、lあるいは2である。n+c) corresponds to the oxidation state of the specific metal used.For example, if M=Zn If so, then n+o=2, and if M=Zr, then n+o=4, and M=Ca Then, n+o=2. n is 1, 2.3 or 4, preferably 0 0, l or 2.
2は構造単位−X−Yあるいは このことは従属式IIおよびIIIを作成すること従属式IIは新規化合物から なり、本発明が同様にその新規化合物に関するのである。YおよびYoが異なっ た意味を有していても良いので、式IIおよびIIIは従属式IIa−IIdお よびIIIa−IIIdの化合物から成っている。2 is the structural unit -X-Y or This creates dependent formulas II and III. Dependent formula II is derived from the new compound. Therefore, the present invention likewise relates to such novel compounds. Y and Yo are different Formulas II and III may have different meanings, so formulas II and III are and IIIa-IIId.
IIIa R1゜−M+(C)LR2八−Yln工Ilb R1゜−M+NR2 −Ylrlこれらのうちで、式11a、IIb、IIc、IId、IIIa、l lIbおよびl1lcが特に好ましい。特に好ましいのは式11a、IIIaお よびllIcである。IIIa R1゜-M+(C)LR28-Yln Engineering Ilb R1゜-M+NR2 -Ylrl Among these, formulas 11a, IIb, IIc, IId, IIIa, l Particularly preferred are llb and lllc. Particularly preferred are formulas 11a, IIIa and and llIc.
M = Z nの場合には可能な従属式はrra、IIb、Ire、IId、l lIb、llIcおよびIIIdである。これらの中では1式11a、IIb、 IIc、llIbおよびllIcの化合物が好ましい。In the case of M = Z n, the possible dependent expressions are rra, IIb, Ire, IId, l llb, llc and IIId. Among these, 1 formula 11a, IIb, Compounds IIc, llIb and llIc are preferred.
以上のおよび以降の式および従属式では、Aは好ましくはシクロヘキサンあるい はフェニルリングである。Bは好ましくはシクロペンタンあるいはシクロペンタ ジェンリングである。In the above and subsequent formulas and dependent formulas, A is preferably cyclohexane or is a phenyl ring. B is preferably cyclopentane or cyclopenta It's Jenling.
YおよびYoは互いに独立であり、それぞれ(CH2)−NR’ R’ (CHa )−−PR’ R’、 (CHz ) s A s R’ R’あるいは−(CH2)、−3bR3R’ である。Y and Yo are independent of each other, and each represents (CH2)-NR' R' (CHa)--PR' R', (CHz) s A s R' R' or -(CH2), -3bR3R' It is.
特!、ニー (CJ )、−NR” R’およU−(CHI)、−PR’ R’ 基が好ましい、好ましくはY=Y’である。Special! , Knee (CJ), -NR" R' and U- (CHI), -PR' R' The radicals are preferred, preferably Y=Y'.
R2は好ましくは水素あるいは1−8個の炭素原子、このましくは1−4個の炭 素原子を有する一部分あるいは完全に弗素化していてもよいアルキル基である。R2 is preferably hydrogen or 1-8 carbon atoms, preferably 1-4 carbon atoms. It is an alkyl group which may be partially or completely fluorinated and has an elementary atom.
従って、R2は好ましくはメチル、エチル、プロピル、ブチル、トリフルオロメ チル、テトラフルオロエチル、ペンタフルオロエチル、ヘプタフルオロプロピル 、さらにペンチル、ヘキシル、ヘプチル、オクチル、ノナフルオロブチル、トリ フルオロヘキシルあるいはジフルオロペンチルである。さらに、R2は弗素であ ってもよい。Therefore, R2 is preferably methyl, ethyl, propyl, butyl, trifluoromethane. Chyl, tetrafluoroethyl, pentafluoroethyl, heptafluoropropyl , as well as pentyl, hexyl, heptyl, octyl, nonafluorobutyl, and trifluorobutyl. Fluorohexyl or difluoropentyl. Furthermore, R2 is fluorine. You can.
R2が繰返し出現したときには、その意味は同一あるいは異なっていてもよい、 その場合には、好ましくは唯一のR寞は水素ではない。When R2 appears repeatedly, its meaning may be the same or different. In that case, preferably the only R is not hydrogen.
mは1.2.3あるいは4であり、好ましくは2或は3である。m is 1.2.3 or 4, preferably 2 or 3.
r、pおよびqは互いに独立であり、それぞれ。、l、2あるいは3であり、好 ましくは、0.1あるいは2である。Sは好ましくはlあるいは2であり、ある いは好ましくは0でもある。r, p and q are independent of each other, respectively. , l, 2 or 3, preferably Preferably, it is 0.1 or 2. S is preferably l or 2, and or preferably 0.
化合物(1) −(40)の以下の群は式1.IIあるいはIIIの特に好まし い代表例の説明に役立つ選択用の例を示している。The following group of compounds (1)-(40) has the formula 1. Particularly preferred of II or III A selection of examples is provided to help illustrate the most representative examples.
R3R4 NR1R2 NR3R4 R3R4N−CH2 R3R4 AsR3R’ Y′ R3R4 (13) R1゜−M+(CH2)2−FJR]R4]。R3R4 NR1R2 NR3R4 R3R4N-CH2 R3R4 AsR3R' Y′ R3R4 (13) R1°-M+(CH2)2-FJR]R4].
(14) R1,−M+(CH2)J−NR]R4]。(14) R1, -M+(CH2)J-NR]R4].
(151R10−M+(CH2)、、、−(CH,)、−NR3R4]。(151R10-M+(CH2), , -(CH,), -NR3R4].
(161R1゜−M+(CH,)〕−PR]R4]n(33) M(J[(CH 2)、−NR3R4]2(34) Ca[(CH2)3−a3R4]2(35) Sr [(CH2)3 NR3R’ 12(36) Bar(CJ(2)、− ?JR3R4]2(37) ”[(CHz) 3−NR’R’13(3B) C d[(CH2)3 NR3R’12(39) Hg[(CH2)3−NR3R’ 12(40) Zr [(CH2) 3−NR3R’ 14式■の化合物は更に 第一級アミン、第二級アミンあるいは第三級アミンあるいはその他のジアミンあ るいは対応するフォスフアン(phosphane)、シフオスファン(d i phosphane) 、アルサン(arsane)あるいはシアルサン(d iarsane)のタイプの1個あるいはそれ以上の中性のリガントに結合して いてもよい、配位数は中心原子の大きさとリガントの大きさによって変化し、4 および9の間を変化する。(161R1゜-M+(CH,)]-PR]R4]n(33) M(J[(CH 2), -NR3R4]2(34) Ca[(CH2)3-a3R4]2(35) Sr [(CH2)3 NR3R' 12 (36) Bar (CJ (2), - ? JR3R4] 2 (37)” [(CHz) 3-NR’R’13 (3B) C d[(CH2)3 NR3R'12(39) Hg[(CH2)3-NR3R' 12 (40) Zr [(CH2) 3-NR3R' 14 The compound of formula ■ is further Primary amines, secondary amines or tertiary amines or other diamines. Rui is the corresponding phosphane, siphosphane (d i Phosphane), arsane or siarsane (d iarsane) by binding to one or more neutral ligands of the type The coordination number varies depending on the size of the central atom and the size of the ligand. and 9.
式■の既知化合物および式IIの新規化合物は文献記載(例えばG、ベーア(B aehr)、P、ブールバー(Burbar)著、有機化学の方法 巻Xl11 /4、ゲオルク ティータ(Georg Thieme)出版社、シュツットガ ルト(1970))のそれ自身公知の方法によって合成することができ、特異的 には公知のしかも上記反応に妥当な条件下で合成することができる。それ自身公 知の変法、特にここでは特に詳細には言及しない変法もその方法のなかで使用し ても良い。Known compounds of formula ■ and new compounds of formula II are described in the literature (e.g. G, Behr (B aehr), P. Burbar, Methods of Organic Chemistry, Volume Xl11 /4, Georg Thieme Publisher, Stuttga Ruto (1970)) can be synthesized by the method known per se, and specific is known and can be synthesized under conditions suitable for the above reaction. itself public Variations of knowledge, especially those that are not mentioned in detail here, are also used in the method. It's okay.
このようにして式IあるいはIIの化合物、例えば金属(アルキル)塩化物を対 応するルイス塩基のアルカリ金属オルガニルとあるいはグリニアール化合物とを 不活性溶媒中で反応させることによって、合成することが可能である。In this way, compounds of formula I or II, such as metal (alkyl) chlorides, can be combined. corresponding Lewis base alkali metal organyl or Grignard compound. It can be synthesized by reacting in an inert solvent.
反応は好ましくは不活性溶媒中で行われる。反応に好ましくない影響を及ぼさな いおよび反応メカニズムに障害となることのないすべての溶媒をこの目的に使用 することができる0反応温度は実質的には類似化合物の合成用の文献公知の温度 に対応している。The reaction is preferably carried out in an inert solvent. Do not unfavorably affect the reaction. All solvents that are free and do not interfere with the reaction mechanism may be used for this purpose. The reaction temperature that can be used is substantially the temperature known in the literature for the synthesis of similar compounds. It corresponds to
本発明による有機金属化合物は空気、湿気及び酸素にたいして極めて安定である ことが見出されている。The organometallic compounds according to the invention are extremely stable towards air, moisture and oxygen. It has been found that
空気に長時間さらした後でも、これら化合物はなんらの変化も示さない、室温で 安定であって、ただし高温では金属を析出しながら分解するすることもある。さ らに室温では低い蒸気圧を持っているにすぎなく、すなわち、極く僅かに揮発性 である1例えば脂肪族あるいは芳香族炭化水素あるいはエーテルのような有機溶 媒中の溶解度は極めて高い。Even after prolonged exposure to air, these compounds do not show any change and are stable at room temperature. It is stable, but may decompose at high temperatures while precipitating metals. difference Furthermore, it has only a low vapor pressure at room temperature, i.e. it is only slightly volatile. 1 For example, aliphatic or aromatic hydrocarbons or organic solvents such as ethers Its solubility in media is extremely high.
これらの特性によって、式Iの有機金属化合物は原則として有機金属化合物の分 解によって金属を析出させる全ての方法に適している。Due to these properties, the organometallic compounds of formula I can, in principle, be classified as organometallic compounds. Suitable for all methods of depositing metals by solution.
式Iの有機金属化合物は特に適しており、液相あるいは気相からの金属の析出用 に好ましく使用することができる。Organometallic compounds of the formula I are particularly suitable for the deposition of metals from the liquid or gas phase. It can be preferably used for.
あらゆる基体上に薄いフィルムあるいはエピタキシャル層を作成するための本発 明による方法は液相あるいは気相からそれ自身公知の析出方法に基づいているこ とが可能であり、しかしこれらの方法中では式Iの有機金属化合物を利用してい る。This invention can be used to create thin films or epitaxial layers on any substrate. The method according to the present invention is based on a method of precipitation known per se from the liquid or gas phase. however, in these methods organometallic compounds of formula I are utilized. Ru.
液相析出は例えば基体、例えばシリコンウェファ−を式Iの有機金属化合物を含 有する液体処方で、最も簡単な場合には、これはこの化合物を有機溶媒に溶解し た溶液であり、コーティングすることによって実行することができる。上記コー ティングは好ましくは既に記載済の公知の「スピン−コーティング」の方法で行 うことも可能である。Liquid phase deposition is carried out, for example, by depositing a substrate, for example a silicon wafer, containing an organometallic compound of formula I. In the simplest case, this involves dissolving the compound in an organic solvent. It is a liquid solution and can be carried out by coating. The above code The coating is preferably carried out by the known "spin-coating" method already described. It is also possible.
気相析出方法のための反応条件はそれ自身公知であり、また本件中に既に記載し たが、文献公知の値に類似しておよび当業者に馴染のある値に類似して選択する ことも可能である。The reaction conditions for vapor phase deposition methods are known per se and have already been described herein. but chosen analogously to values known in the literature and familiar to those skilled in the art. It is also possible.
混合金属層、化合物半導体、電気部品、電子部品、光学部品および光学電子部品 あるいは半導体レーザーを製造するためには、その処方は異なった金属の化合物 並びに元素周期律表のその他の元素の化合物、好ましくは第■族の元素の化合物 を含有していても良い。Mixed metal layers, compound semiconductors, electrical components, electronic components, optical components and opto-electronic components Alternatively, to produce a semiconductor laser, the formulation must be a compound of different metals. and compounds of other elements of the periodic table of elements, preferably compounds of elements of group It may contain.
使用した反応条件に適した1種あるいはそれ以上の化合物を分解工程中に、特に 例えばAsHs 、As (CH3)5あるいはその他のドーピング剤のような 砒素、アンチモンあるいは燐の化合物を導入することも可能である。ここでも使 用したドーピング剤は主に鉄、マグネシウム、亜鉛、クロムの有機金属化合物で あることができる。一般に良く利用する化合物は、例えばZn (CH3)a 、Mg (CHs )t 、Fe (C@H5)2である。One or more compounds suitable for the reaction conditions used are added during the decomposition process, in particular such as AsHs, As(CH3)5 or other doping agents. It is also possible to introduce compounds of arsenic, antimony or phosphorus. Also used here The doping agents used were mainly organometallic compounds of iron, magnesium, zinc, and chromium. Something can happen. Commonly used compounds include, for example, Zn (CH3)a , Mg (CHs)t, Fe (C@H5)2.
他の有機金属化合物の析出工程のドーピング剤として式Iの化合物自身を添加す ることも可能である。Addition of the compound of formula I itself as a doping agent in the precipitation step of other organometallic compounds It is also possible to
本発明の方法によって製造した層は使用した金属化合物によって大幅に変動して 広範囲の部品に使用可能である。例えば、本発明によって製造した薄いフィルム システムはキャパシター、センサー、超伝導体、金属フィルム、ダイオード、高 速トランジスター、電気光学スイッチ、光学記憶さらにその他多くの目的に使用 可能である。以下の実施例は発明をもっと詳細に説明することを目的にしている 。全ての温度表示はセ氏m、p、は融点およびす、p、は沸点を示している。The layers produced by the method of the invention vary widely depending on the metal compound used. Can be used for a wide range of parts. For example, thin films produced according to the invention The system includes capacitors, sensors, superconductors, metal films, diodes, high Used in high speed transistors, electro-optical switches, optical storage and many other purposes It is possible. The following examples are intended to explain the invention in more detail. . All temperature indications are in degrees Celsius, m, p, melting point and s, p, boiling point.
及I旦ユ マグネシウム24.3g (1,0モル)と3−ジメチルアミノプロピルクロラ イド102.1g (0,84モル)からTHF500ml中で作成したグリニ アール試薬に室温でTHF I OOm 1に塩化バリウム0.28モルを溶解 した溶液を滴下し、その混合物を2時間70℃に加熱する。冷却後に、不溶物を 濾別し、溶媒を除去し、残留物を減圧下に蒸留する。この結果ビス(3−ジメチ ルアミノプロピル)バリウムが得られる。and I dan yu Magnesium 24.3g (1.0 mol) and 3-dimethylaminopropylchlora Grini prepared in 500 ml of THF from 102.1 g (0.84 mol) of Dissolve 0.28 mol of barium chloride in THF IOOm1 at room temperature in Earle's reagent. solution is added dropwise and the mixture is heated to 70° C. for 2 hours. After cooling, remove the insoluble matter Filter off, remove the solvent and distill the residue under reduced pressure. As a result, bis(3-dimethyl Barium (Ruaminopropyl) is obtained.
同様な方法でビス(3−ジエチルアミノプロビル)ストロンチウムおよびビス( 3−ジメチルアミノプロピル)カルシウムが得られる。Bis(3-diethylaminoprobyl)strontium and bis( 3-dimethylaminopropyl)calcium is obtained.
及史■ユ マグネシウム4.9g (0,2モル)と3−ジエチルアミノプロビルクロライ ド19.4g (0,16モル)からTHF100ml中で作成したグリニアー ル試薬に室温でTHF 100m lに塩化バリウム0.05モルを溶解した溶 液を混合する0反応終了後に、その混合物を24時間室温で攪拌し、濾過し、溶 媒を除去し、残留物を減圧下に蒸留する。この結果ビス(3−ジエチルアミノプ ロビル)バリウムが得られる。History ■Yu Magnesium 4.9g (0.2 mol) and 3-diethylaminoprobyl chloride Grignard prepared from 19.4 g (0.16 mol) of 100 ml of THF A solution of 0.05 mol of barium chloride in 100 ml of THF at room temperature was added to the reagent. After the reaction is complete, the mixture is stirred at room temperature for 24 hours, filtered, and dissolved. The medium is removed and the residue is distilled under reduced pressure. As a result, bis(3-diethylaminopropylene) lobil) barium is obtained.
同様な方法で、 ビス(3−ジエチルアミノプロビル)ストロンチウムビス(3−ジエチルアミノ プロビル)カルシウム、ビス(3−ジメチルアミノプロピル)カドミウム、ビス (3−ジメチルアミノプロピル)マーキュリ−が得られる。In a similar way, Bis(3-diethylaminopropyl)strontium bis(3-diethylaminopropyl) provil) calcium, bis(3-dimethylaminopropyl) cadmium, bis (3-dimethylaminopropyl)mercury is obtained.
及産■ユ 実施例1と同様にして、ビス(3−ジメチルアミノプロピル)カドミウムが(3 −ジメチルアミノプロピル)マグネシウムクロライドとカドミウムクロライドか ら無色の、沸点62℃70.3ミリバールの液体として得られる。Delivery ■Yu In the same manner as in Example 1, bis(3-dimethylaminopropyl)cadmium (3 -dimethylaminopropyl) magnesium chloride and cadmium chloride? It is obtained as a colorless liquid with a boiling point of 62° C. and 70.3 mbar.
及立五ユ 実施例1と同様にして、ビス(3−ジメチルアミノプロピル)マーキュリ−が( 3−ジメチルアミノプロピル)マグネシウムクロライドと塩化水銀から無色の、 沸点96℃10.05ミリバールの液体として得ら11五1 マグネシウム6.1g (0,25モル)と3−ジメチルアミノプロピルクロラ イド24.3g (0,2モル)からTHF 100m1中でグリニアール試薬 を作製した。その後にTHF約80m1を除去し、濃縮したその溶液にペンタン 50m1を混合した。沈殿した塩化マグネシウムを濾過によって除去し、残留物 を減圧下に蒸留する。この結果ビス(3−ジメチルアミノプロピル)マグネシウ ムが白色の結晶として得られ、その沸点は170℃10.05ミリバールである 。Achieving 5 Yuu In the same manner as in Example 1, bis(3-dimethylaminopropyl)mercury ( 3-dimethylaminopropyl) from magnesium chloride and mercuric chloride, colorless, 1151 obtained as a liquid with a boiling point of 96°C and 10.05 mbar Magnesium 6.1g (0.25 mol) and 3-dimethylaminopropylchlora Grignard reagent from 24.3 g (0.2 mol) of Id in 100 ml of THF was created. Approximately 80 ml of THF was then removed and the concentrated solution was added with pentane. 50 ml were mixed. The precipitated magnesium chloride was removed by filtration and the residue is distilled under reduced pressure. As a result, bis(3-dimethylaminopropyl)magnesium is obtained as white crystals with a boiling point of 10.05 mbar at 170°C. .
同様な方法で、ビス(3−ジエチルアミノプロビル)マグネシウムかえられる。Bis(3-diethylaminoprobyl)magnesium can be converted in a similar manner.
及I五1 3−ジメチルアミノプロピルリチウム8.71gをジエチルエーテル150m1 に溶解した溶液に一5℃の温度で光を遮りながら、ZrCl45.45gを混合 し、その混合物をその後に1時間攪拌し、減圧下に溶媒を除去した。残留物を数 回n−ペンタンで抽出した。合体した抽出液を濾過し、−78℃に冷却し、無色 の、針状のテトラキス(3−ジメチルアミノプロピル)ジルコニウムが沈殿した 。 ・ 11丘ユ Cr Cl 3 ・3 T HF l 6 gをジエチルエーテル200m1に 懸濁した懸濁液に一30℃で4時間3−ジメチルアミンプロピルリチウム12g のエーテル溶液を滴下混合する。混合物をさらに2時間攪拌する。その後にエー テルを除去し、残留物をn−ペンタンで抽出する。−78℃で、トリス(3−ジ メチルアミノプロピル)クロムの赤色結晶が抽出物から沈殿する。and I51 8.71 g of 3-dimethylaminopropyllithium and 150 ml of diethyl ether 45.45 g of ZrCl was mixed into a solution dissolved in ZrCl at a temperature of -5℃ while shielding from light. The mixture was then stirred for 1 hour and the solvent was removed under reduced pressure. number of residues Extracted twice with n-pentane. The combined extracts were filtered, cooled to -78°C, and colorless. , acicular tetrakis(3-dimethylaminopropyl)zirconium was precipitated. .・ 11 Hill Yu Cr Cl 3.3 T HF 1 6 g in 200 ml of diethyl ether Add 12 g of 3-dimethylamine propyl lithium to the suspended suspension at 30°C for 4 hours. dropwise mix the ether solution. The mixture is stirred for a further 2 hours. After that The residue is extracted with n-pentane. Tris (3-di Red crystals of chromium (methylaminopropyl) precipitate from the extract.
フロントページの続き (51) Int、 C1,5識別記号 庁内整理番号CO7F 3108 7 457−4H 3/10 7457−4H 7100A 8018−4H 11100A 9155−4H C23C16/30 8116−4に 18108 8414−4K (72)発明者 ヴアサーマン、ヴイルフリートドイツ連邦共和国 1000 ベルリン 12クルメ シュトラーセ 25 I (72)発明者 ゾイス、トーマス ドイツ連邦共和国 2900 オルデンブルクゾマーヴエーク 躬 (72)発明者 ユスト、オリパー ドイツ連邦共和国 1000 ベルリン 37アム ローアガルテン 45Continuation of front page (51) Int, C1,5 identification code Office serial number CO7F 3108 7 457-4H 3/10 7457-4H 7100A 8018-4H 11100A 9155-4H C23C16/30 8116-4 18108 8414-4K (72) Inventor: Wuertherman, Federal Republic of Wilfried Germany 1000 Berlin 12 Krume Strasse 25 I (72) Inventor Zois, Thomas Federal Republic of Germany 2900 Oldenburg Sommerwerke (72) Inventor: Justo, Oriper Federal Republic of Germany 1000 Berlin 37 am Loergarten 45
Claims (1)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE4213292A DE4213292A1 (en) | 1992-04-23 | 1992-04-23 | Use of organometallic compounds to deposit the metal on substrates |
DE4213292.4 | 1992-04-23 | ||
PCT/EP1993/000940 WO1993022472A1 (en) | 1992-04-23 | 1993-04-19 | Use of organo-metallic compounds for precipitating metals on substrates |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH06508890A true JPH06508890A (en) | 1994-10-06 |
Family
ID=6457277
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5518874A Pending JPH06508890A (en) | 1992-04-23 | 1993-04-19 | Use of organometallic compounds to deposit metals on substrates |
Country Status (5)
Country | Link |
---|---|
EP (1) | EP0591496A1 (en) |
JP (1) | JPH06508890A (en) |
KR (1) | KR940701462A (en) |
DE (1) | DE4213292A1 (en) |
WO (1) | WO1993022472A1 (en) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5924012A (en) | 1996-10-02 | 1999-07-13 | Micron Technology, Inc. | Methods, complexes, and system for forming metal-containing films |
US6130160A (en) | 1996-10-02 | 2000-10-10 | Micron Technology, Inc. | Methods, complexes and system for forming metal-containing films |
US6214729B1 (en) | 1998-09-01 | 2001-04-10 | Micron Technology, Inc. | Metal complexes with chelating C-, N-donor ligands for forming metal-containing films |
US6281124B1 (en) | 1998-09-02 | 2001-08-28 | Micron Technology, Inc. | Methods and systems for forming metal-containing films on substrates |
US20170018425A1 (en) * | 2014-03-12 | 2017-01-19 | L'Air Liquide, Société Anonyme pour I'Etude et I'Exploitation des Procédés Georges Claude | Heteroleptic diazadienyl group 4 transition metal-containing compounds for vapor deposition of group 4 transition metal-containing films |
KR20240011985A (en) * | 2022-07-20 | 2024-01-29 | 엠케미칼 주식회사 | Novel molybdenum compound, manufacturing method thereof, and manufacturing method of a molybdenum-containing thin film comprising the same |
WO2024107593A1 (en) | 2022-11-18 | 2024-05-23 | Merck Patent Gmbh | Intramolecular stabilized group 13 metal complexes with improved thermal stability for vapor phase thin-film deposition techniques |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB984363A (en) * | 1961-06-23 | 1965-02-24 | Wellcome Found | Organic chemical compounds and methods |
US4057565A (en) * | 1975-07-22 | 1977-11-08 | E. I. Du Pont De Nemours And Company | 2-Dialkylaminobenzyl and 2-dialkylaminomethylphenyl derivatives of selected transition metals |
GB8819761D0 (en) * | 1988-08-19 | 1988-09-21 | Secr Defence | Growth of znse & zns layers |
DE3841643C2 (en) * | 1988-12-10 | 1999-07-01 | Merck Patent Gmbh | Organometallic compounds and their use |
-
1992
- 1992-04-23 DE DE4213292A patent/DE4213292A1/en not_active Withdrawn
-
1993
- 1993-04-19 EP EP93908955A patent/EP0591496A1/en not_active Ceased
- 1993-04-19 WO PCT/EP1993/000940 patent/WO1993022472A1/en not_active Application Discontinuation
- 1993-04-19 KR KR1019930703987A patent/KR940701462A/en not_active Application Discontinuation
- 1993-04-19 JP JP5518874A patent/JPH06508890A/en active Pending
Also Published As
Publication number | Publication date |
---|---|
KR940701462A (en) | 1994-05-28 |
DE4213292A1 (en) | 1993-10-28 |
WO1993022472A1 (en) | 1993-11-11 |
EP0591496A1 (en) | 1994-04-13 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US6258157B1 (en) | Liquid precursors for formation of metal oxides | |
EP1849789B1 (en) | Metal complexes of polydentate beta-ketoiminates | |
JP5180040B2 (en) | Metal complexes of tridentate beta ketoiminates | |
KR100885095B1 (en) | Methods of Synthesizing Ruthenium and Osmium Compounds | |
KR19990022418A (en) | Chemical complexing metal complex source reagent | |
Pollard et al. | Chemical vapor deposition of cerium oxide using the precursors [Ce (hfac) 3 (glyme)] | |
TW200835694A (en) | Heteroleptic organometallic compounds | |
KR101288919B1 (en) | Novel metal complexes for metal-containing film deposition | |
WO2000058245A1 (en) | Organometallic compounds for vapor-phase epitaxy of organometal | |
DE69932560T2 (en) | Aluminum complex derivatives for chemical vapor evaporation and process for their preparation | |
JPH06508890A (en) | Use of organometallic compounds to deposit metals on substrates | |
US20110206863A1 (en) | Organometallic compounds having sterically hindered amides | |
JP2011080144A (en) | Liquid composition containing aminoether for developing metal-containing film | |
JP5480032B2 (en) | Metal compounds, raw materials for forming thin films, and cyclopentadiene compounds | |
JP5214191B2 (en) | Thin film forming raw material and thin film manufacturing method | |
US5492725A (en) | Process for chemical vapor deposition using precursor compounds containing hydropyridine ligands | |
US7033560B2 (en) | Single source mixtures of metal siloxides | |
EP0342444B1 (en) | Cyclical organic-metal compounds | |
Maudez et al. | New dimethyl (norbornadienyl) platinum (II) precursors for platinum MOCVD | |
JPH05125081A (en) | Organometallic compound | |
KR100508110B1 (en) | Organometallic complex and the preparation thereof | |
KR100600468B1 (en) | Process for producing cycloalkene copper precursors | |
Gordon et al. | Liquid Compounds for CVD of Alkaline Earth Metals | |
JP2006213631A (en) | Method for producing raw material solution for forming pzt film by chemical vapor deposition method and pzt film-forming method | |
JPH07188256A (en) | Organosilver compound for silver thin film formation by organometallic chemical vacuum deposition with high vapor pressure |