JPH064413A - Memory test control method - Google Patents

Abstract

PURPOSE:To improve the test efficiency, and to execute an optimal test conforming to a memory constitution with regard to a test control method of each memory device of a computer system provided with plural kinds of memory devices. CONSTITUTION:This method is constituted so that a memory management table 1 for instructing a correspondence of features of memory elements of, for instance, attributes (RAM, ROM, memory card), a function classification (showing a memory function) number, the head address of an address space, capacity, classifications (dynamic, static, electrically rewritable memories, etc.) of a high integrated circuit, a constitution (bank constitution) of the high integrated circuit, a check mechanism (ECC, parity, etc.), of the memory elements of various memory device existing in an address space of each computer system, and plural pieces of test modules 3 for testing the memory element is provided in advance so as to correspond to the computer system, machine kind information 2 of the computer system concerned is inputted, the memory management table 1 of this computer system is retrieved, the test module 3 to be executed is extracted, and the memory test is executed by the instructed number of times.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a test control method for each memory device of a computer system having a plurality of types of memory devices.

In computer systems such as personal computers and word processors in recent years, various random access memories (RAMs) and read-only memory (ROM) elements having different capacities, functions, LSI configurations, etc. have been constructed with document processing and multimedia. A memory device that is installed.

In these memory devices, the layout of the address space and the functional contents of the computer system are changed due to the adoption of a new processor and the change of the memory chip. In order to test these memory devices, It is necessary to create and prepare a test program individually each time, and an efficient test method is required. For this purpose, it is necessary to recognize the configuration contents of various memory devices and select an appropriate test control method.

[0004]

2. Description of the Related Art FIG. 6 is a diagram for explaining a conventional memory test control method, and a conventional memory device test method will be described based on a configuration example of a computer system having the various memory devices.

A computer system such as a recent personal computer or word processor has the configuration shown in FIG.
It is equipped with a memory device composed of various read-only memories (ROMs), random access memories (RAMs), etc. having different bank configurations, LSI configurations, capacities, etc., and is arranged in the address space of the computer system.

Therefore, in a computer system equipped with these various memory devices, each installed memory device
When testing 1a ~, select various menus displayed on the console 2 and select the type of memory device 1a ~ (RAM, ROM, etc.), address space, capacity, test type (address test, By instructing a refresh test, a march test, etc.), a test module to be used for testing the memory device to be tested is selected and alternately tested.

[0007]

Therefore, in the conventional memory test control method, a recent computer system is equipped with a RAM or ROM having various functions as described above, or a memory device. However, there is a problem that the operability is extremely poor because it is necessary to select different menus for each memory device to be tested due to the expansion of the memory.

Also, whenever the specifications of the installed memory device are changed or a new type of memory device is installed,
It was necessary to review the menu selection procedure for changing the specifications and testing the newly installed memory device, and individually handle them.

In view of the above-mentioned conventional drawbacks, the present invention improves the test efficiency when testing each memory device of a computer system having a plurality of types of memory devices, and optimizes the test according to the memory configuration. It is an object of the present invention to provide a memory test control method capable of performing.

[0010]

FIG. 1 is a diagram for explaining the principle of the present invention. The above problem is solved by the memory test control method configured as follows.

In a computer system provided with a plurality of types of memory devices 1a, the characteristics of the memory elements of the various memory devices 1a present in the address space of each computer system are, for example, RAM, ROM, Attribute for distinguishing whether it is a memory card, function type number indicating the function of the memory device, start address of address space, capacity, dynamic, static, electrically rewritable memory, mask memory, etc. Of the highly integrated circuit of the memory element that constitutes the device and the configuration of the highly integrated circuit
A memory showing the correspondence between the characteristics of the memory device such as (bank configuration) and the check mechanism (ECC, parity, etc.) of the memory device, and the test modules such as the address test, refresh test, and march test. A management table is provided for each model information of the computer system, and by entering the model information of the computer system, the memory management table of the corresponding computer system is searched, and the test module to be executed is extracted, Part of the extracted test module, or
Configure to perform a full memory test.

[0012]

According to the memory test control method of the present invention, the attributes of a plurality of memory devices installed in a computer system of a corresponding model are associated with model information (A device, B device, ...) of each computer system. RAM, ROM, memory card etc.), function type (e.g. standard, expansion, kanji ROM, dictionary ROM,
OS-ROM, etc.), capacity, type of highly integrated circuit (LSI)
(E.g., dynamic, static, mask), check mechanism (ECC, parity, etc.) and other items that characterize the memory device, and the correspondence between test module types (address test, refresh test, march test, etc.) A memory management table is provided for each computer system, and the operator inputs the model information of the computer system and indicates the model of the computer system to search the memory management table. The test module corresponding to the model of the memory device included in the computer system is extracted, and the memory test is performed as many times as the number of tests instructed by the operator.

Therefore, by simply preparing and updating the above-mentioned memory management table corresponding to the model of the computer system, it is possible to efficiently correspond to the latest state of the computer system.
Moreover, there is an effect that an appropriate test can be performed.

[0014]

Embodiments of the present invention will be described in detail below with reference to the drawings. The above-mentioned FIG. 1 is an explanatory view of the principle of the present invention.
FIG. 5 is a diagram showing an embodiment of the present invention.
FIG. 3 shows a configuration example of the memory management table, FIG. 4 (a) shows an example of the configuration column of the memory management table, and FIG. 4 (b) shows an example of the test type. Figure 5
3 is a flowchart showing a memory test control method according to the present invention.

In the present invention, corresponding to model information (A device, B device, ...) Of each computer system, for example,
Whether the memory elements that make up the multiple memory devices installed in the computer system of the applicable model are RAM or ROM
Whether it is a memory card or a memory card, a number indicating the type of memory device such as standard, extended, kanji ROM, dictionary ROM, OS-ROM, etc., and the memory capacity of the memory device,
A type of highly integrated circuit (LSI) of the memory device (for example, dynamic, static, mask), a check mechanism provided in the memory device, for example, ECC, parity type, and a test for testing the memory device. A memory management table showing the correspondence with the module types (for example, address test, refresh test, march test, etc.) is provided, and the operator inputs the model information of the computer system to Means for retrieving the memory management table by instructing the model and extracting the test module corresponding to the model of the memory device included in the computer system is a means necessary for implementing the present invention. . The same reference numerals indicate the same objects throughout the drawings.

The memory test control method of the present invention will be described below with reference to FIGS. 2 to 5 while referring to FIG. 2 and 3 show examples of the configuration of the memory management table, which is the main object of the present invention.

As is clear from FIGS. 2 and 3, the memory management table is provided for each computer system model (device A, device B, device C, ...), and is installed in each computer system. The attributes of the memory device (for example, information that distinguishes RAM, ROM, memory card, etc.) (1), the function type of the memory device (for example, standard, extended, kanji ROM, dictionary
ROM, OS-ROM, etc.) (3), the start address (4) of the address space where the memory device 1a ~ is arranged, the memory capacity (5) of the memory device, the memory device The type of highly integrated circuit (LSI) of the configured memory device (for example,
(Dynamic, static, mask) (6), the configuration of the highly integrated circuit (LSI) (for example, bank configuration) (7), and a check mechanism (for example, ECC, parity, etc.) included in the memory device, Correspondence with the types of test modules most suitable for testing the memory device (address test, refresh test, march test, etc.) (8) is shown.

Configuration check column of the memory management table
In (2), the presence / absence flag is added in correspondence with the function number (3) of the memory device included in the computer system. It is possible to recognize the function type of the existing memory device.

The "function number" (3) indicates what kind of function the memory device has in accordance with the attribute (1) of each memory device such as RAM, ROM and memory card. For example, for RAM, standard RAM, extended RAM, video RA
Functions such as M (VRAM) and learning RAM. Such a difference in function determines what kind of test should be performed, and the most appropriate test module type is indicated in the “Test type call number” (8) column described later.

The next "address" (4) indicates the start address of the address space assigned to each memory device and also serves as the start address of the memory test. “Capacity” (5) is the capacity of the memory device, for example, 2K, 6K, 12
8K, 256K, 512K, 1M, 2M, 6M, 16M, 64M, etc. are instructed, and from the test start address, up to what address should be tested, the test program of the present invention {test shown in the flow of FIG. 5 Calculated by a program) and stored in a predetermined area.

The "LSI" (6) is a type of highly integrated circuit mounted on the memory device, which is a dynamic LSI, a static LSI, a mask LSI, or an electrically rewritable LS.
I (EEPROM) and other types are instructed. For example, the above dynamic LSI, in particular, indicates that a refresh test is required.
The type of the relevant test module is indicated in the (8) column.

The "configuration" (7) is, as shown in detail in FIG. 4 (a), the physical configuration of the relevant memory device, such as bank system, number of banks, capacity per bank, By designating the type of chip, split designation of the same chip, etc., by the split designation of the same chip, for example, "OS-ROM" and "system ROM" specified in the "Function number" (3) column are the same chip. By instructing that you are using by dividing,
Indicates that the "OS-ROM" and "system ROM" should be tested in the same address range.

As a result, the "OS-ROM" and "system ROM"
The same test module is instructed in the “Test type call number” (8) column above, and when calculating the test address, the final address of the “OS-ROM” is
The test start address of the "system ROM" is instructed by, for example, parameter synthesis described later.

The "check mechanism" (9) indicates a check mechanism used in the memory device, for example, an error correction code (ECC) mechanism or a parity mechanism. Corresponding to the type of this check mechanism, for example, the error correction code (EC
C) Instruct the test module to test whether the mechanism and parity mechanism are functioning normally.

"Test type call number" (8) is shown in FIG.
As shown in (b), the calling addresses (A, B, C, ...) of multiple basic test modules corresponding to the calling numbers.
Is instructed by the creator of the test program when creating the test management table. As described above, the calling address (A, B, C, ...) is indicated by each column of the memory management table. , Memory characteristics, memory configuration, check mechanism, etc. are linked, and a prescribed test module is specified in advance corresponding to the memory characteristics, memory configuration, check mechanism, etc. indicated by each memory device. become.

FIG. 5 is a flowchart showing a memory test control method according to the present invention. First, the memory device 1a-
Enter the model information of the computer system to be tested using the keyboard (KB).

If a memory management table corresponding to the model information of the computer system exists, the memory management table is searched. First, look at the memory device presence / absence flag in the configuration check column (2) of the memory management table, and for the item in which the memory device exists, select the capacity column.
From (5), recognize the capacity of the memory device, calculate the final address of the test, set it in the area of the predetermined main memory recognized by the test module, and test the memory device. The most appropriate test module for the test type call number column corresponding to the memory device
(8) Extract with reference to {see FIG. 4 (b)}. (See processing steps 100 to 104 in FIG. 5) At this point, if you want to select a test module to be actually tested from the test modules displayed on the display screen of the operator console, the test target to be executed Select the test module of and specify the test count.

When all the test modules designated by the memory management table are executed, it is not necessary to select the test target. Next, combine the extracted test module parameters from the bank information and chip information specified by the memory configuration column (7) (for example,
(Calculation of test start address when each memory device divides and uses the same chip, etc.), sets the call address of the selected test module, and executes the test module. . (Refer to the processing steps 105, 106, 107 in FIG. 5) The execution of the test module is performed by the above processing step 105.
Then, the test is executed the number of times specified by the operator.

If a plurality of test modules are specified for each memory device in the test type call number column (8), the test modules are specified for the corresponding memory device 1a. Multiple test modules
It is sequentially selected and executed.

[0030]

As described above in detail, the memory test control method of the present invention is equipped with a plurality of memory devices, and it is only necessary to input the model information of the computer system to be tested. , A corresponding memory management table is selected, the selected memory management table is searched, and the test module designated by the memory management table is tested for the designated number of times. It is possible to recognize the configuration of the memory device installed in the computer system, extract the test module corresponding to the configuration, and execute it as many times as necessary by simply entering the model information. In addition, the test efficiency is improved, and the optimum memory test execution has a large effect on the test accuracy.

[Brief description of drawings]

FIG. 1 is an explanatory view of the principle of the present invention.

FIG. 2 is a diagram showing an embodiment of the present invention (No. 1).

FIG. 3 is a diagram showing an embodiment of the present invention (part 2).

FIG. 4 is a diagram showing an embodiment of the present invention (part 3).

FIG. 5 is a diagram showing an embodiment of the present invention (No. 4).

FIG. 6 is a diagram illustrating a conventional memory test control method.

[Explanation of symbols]

 1a, ~ Memory device 2 Operator's console 100 ~ 108 Processing step Memory management table Model information test module

Claims (1)

[Claims] 1. In a computer system comprising a plurality of types of memory devices (1a, ...), the memory elements of the various memory devices (1a, ...) Present in the address space of each computer system,
Memory management table showing correspondence between a plurality of features and a plurality of test modules () for testing the memory device
Providing () for the computer system model, input the computer system model information (), search the memory management table () of the corresponding computer system, and select the test module () to be executed. A memory test control method comprising extracting and performing a memory test.