JPH0635976U - Test signal generator - Google Patents
Test signal generatorInfo
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- JPH0635976U JPH0635976U JP7845592U JP7845592U JPH0635976U JP H0635976 U JPH0635976 U JP H0635976U JP 7845592 U JP7845592 U JP 7845592U JP 7845592 U JP7845592 U JP 7845592U JP H0635976 U JPH0635976 U JP H0635976U
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Abstract
(57)【要約】
【目的】 1台の装置の簡単な操作で必要な数,大きさ
の直流の電流,電圧の試験信号を発生する。
【構成】 正,負の電源端子1,1’,2,2’又は
3,3’間に並列接続した複数の試験信号発生ユニット
14を収容し、各ユニット14に、使用時にピンが挿入
されて電源端子1,1’,2,2’又は3,3’に受電
端子Pi,Niを接続する1対の使用ユニット選択端子
15,15’と、受電端子Pi,Niの一方に限流兼分
圧用の固定抵抗17を介して一方の固定端子を接続した
信号調整用の可変抵抗16と、電流の試験信号発生時に
固定抵抗17,可変抵抗16,被試験装置を直列接続
し,電圧の試験信号発生時に短絡される1対の電流信号
端子18,18’と、電流の試験信号発生時にのみピン
が挿入されて可変抵抗16の摺動片と他方の固定端子と
の間を短絡する接続切換端子19と、電圧の試験信号発
生時に可変抵抗16の摺動片と受電端子Pi,Niの他
方との間に被試験装置を接続する1対の電圧信号端子2
0,20’とを設ける。
(57) [Summary] [Purpose] To generate test signals of DC current and voltage of the required number and magnitude with simple operation of one device. [Structure] A plurality of test signal generating units 14 connected in parallel between positive and negative power supply terminals 1, 1 ′, 2, 2 ′ or 3, 3 ′ are accommodated, and pins are inserted into each unit 14 at the time of use. Power supply terminals 1, 1 ', 2, 2'or 3, 3'to a pair of used unit selection terminals 15, 15' for connecting the power receiving terminals Pi, Ni and one of the power receiving terminals Pi, Ni A variable resistor 16 for signal adjustment, one fixed terminal of which is connected via a fixed resistor 17 for voltage division, and a fixed resistor 17, a variable resistor 16, and a device under test are connected in series when a test signal of current is generated, and a voltage test is performed. Connection switching for short-circuiting between the pair of current signal terminals 18 and 18 'that are short-circuited when a signal is generated and the sliding piece of the variable resistor 16 and the other fixed terminal by inserting a pin only when a current test signal is generated. Terminal 19 and sliding piece of variable resistor 16 when receiving test signal of voltage and receiving power Child Pi, the voltage signal of the pair of connecting a device under test between the other Ni terminal 2
0, 20 'are provided.
Description
【0001】[0001]
本考案は、産業用,民生用の種々の装置の性能検査等に必要な直流の種々の電 流,電圧の試験信号を発生する試験信号発生装置に関する。 The present invention relates to a test signal generator that generates test signals of various DC currents and voltages necessary for performance inspection of various industrial and consumer devices.
【0002】[0002]
従来、産業用装置の1例である水処理装置の性能検査においては、一度に多数 の回路検査を行うため、通常、4〜20mA,1〜5Vの直流の種々の電流,電 圧の試験信号を必要とする。 そして、これらの試験信号は、従来、信号毎に直流電源装置を用意し、各直流 電源装置の出力を調整して形成される。 Conventionally, in a performance test of a water treatment device, which is an example of an industrial device, a large number of circuit tests are performed at one time. Therefore, a test signal of various currents and voltages of direct current of 4 to 20 mA and 1 to 5 V is usually used. Need. Conventionally, these test signals are formed by preparing a DC power supply device for each signal and adjusting the output of each DC power supply device.
【0003】[0003]
前記従来のように試験信号毎に直流電源装置を用意し、それぞれの出力を調整 して用いる場合、多数の装置を要してその設置,調整等の作業が極めて煩雑化し 、しかも、被試験装置に応じて用意する直流電源装置の個数等が異なるため、効 率のよい検査が行えない問題点がある。 本考案は、1台の装置の簡単な操作で直流の種々の電流,電圧の試験信号を同 時に得ることができる試験信号発生装置を提供することを目的とする。 When a DC power supply device is prepared for each test signal and each output is adjusted and used as in the prior art, a large number of devices are required, and the installation and adjustment work is extremely complicated, and the device under test is Since the number of DC power supply devices to be prepared differs depending on the situation, there is a problem that efficient inspection cannot be performed. An object of the present invention is to provide a test signal generator capable of simultaneously obtaining various DC current and voltage test signals by a simple operation of one device.
【0004】[0004]
前記の目的を達成するために、本考案の試験信号発生装置においては、正,負 の電源端子間に並列接続された複数の試験信号発生ユニットを収容し、 In order to achieve the above-mentioned object, the test signal generating device of the present invention accommodates a plurality of test signal generating units connected in parallel between positive and negative power supply terminals,
【0005】 該ユニットに、 両電源端子と各ユニットの正,負の受電端子との間それぞれに設けられ,各ユ ニットそれぞれの使用時に短絡用のピンが挿入されて両電源端子に両受電端子を 接続する1対の使用ユニット選択端子と、 両受電端子のいずれか一方に限流兼分圧用の固定抵抗を介して一方の固定端子 が接続された信号調整用の可変抵抗と、The unit is provided between both power supply terminals and the positive and negative power receiving terminals of each unit, and a pin for short circuit is inserted when each unit is used, so that both power receiving terminals have both power receiving terminals. , A pair of used unit selection terminals for connecting, and a variable resistor for signal adjustment in which one fixed terminal is connected to one of both power receiving terminals via a fixed resistor for current limiting and voltage division,
【0006】 両受電端子の他方,可変抵抗の他方の固定端子それぞれに接続され,電流の試 験信号発生時に被試験装置が接続され,電圧の試験信号発生時に短絡される1対 の電流信号端子と、 可変抵抗の摺動片と他方の固定端子との間に設けられ,電流の試験信号発生時 にのみ短絡用のピンが挿入されて可変抵抗の摺動片と他方の固定端子との間を短 絡する接続切換端子と、 可変抵抗の摺動片,両受電端子の他方それぞれに接続され,電圧の試験信号発 生時に被試験装置が接続される1対の電圧信号端子とを設ける。A pair of current signal terminals connected to the other of the power receiving terminals and to the other fixed terminal of the variable resistor, respectively, to which the device under test is connected when a current test signal is generated, and short-circuited when a voltage test signal is generated. Between the variable resistance sliding piece and the other fixed terminal by inserting the short-circuit pin only when the current test signal is generated. Provide a connection switching terminal that is short-circuited, and a pair of voltage signal terminals that are connected to the sliding piece of the variable resistance and the other of both power receiving terminals, and to which the device under test is connected when a voltage test signal is generated.
【0007】[0007]
前記のように構成された本考案の試験信号発生装置の場合、各試験信号発生ユ ニットはそれぞれの1対の使用ユニット選択端子にピンを挿入する簡単な操作で 選択されて直流電源が給電され、使用可能な状態になる。 さらに、選択されたユニットにおいては、電流の試験信号を発生する場合、1 対の電流信号端子間に被試験装置を接続するとともに接続切換端子に短絡用のピ ンが挿入されて可変抵抗の摺動片と他方の固定端子との間が短絡される。 In the case of the test signal generator of the present invention configured as described above, each test signal generating unit is selected by a simple operation of inserting a pin into each pair of used unit selection terminals, and is supplied with the DC power. , Ready to use. Further, in the selected unit, when the test signal of the current is generated, the device under test is connected between the pair of current signal terminals and the shorting pin is inserted into the connection switching terminal to slide the variable resistor. The moving piece and the other fixed terminal are short-circuited.
【0008】 このとき、正,負の電源端子間に固定抵抗,可変抵抗の一方の固定端子,摺動 片,被試験装置が直列接続され、可変抵抗の摺動片の位置を変えることにより、 被試験装置に供給される電流の試験信号の大きさ(電流値)が調整される。 また、電圧の試験信号を発生する場合、1対の電流信号端子間を短絡して1対 の電圧信号端子間に被試験装置が接続される。At this time, the fixed resistance, one fixed terminal of the variable resistance, the sliding piece, and the device under test are connected in series between the positive and negative power supply terminals, and by changing the position of the sliding piece of the variable resistance, The magnitude (current value) of the test signal of the current supplied to the device under test is adjusted. When a voltage test signal is generated, the pair of current signal terminals is short-circuited and the device under test is connected between the pair of voltage signal terminals.
【0009】 このとき、正,負の電源端子間に固定抵抗,可変抵抗の両固定端子が直列接続 されるとともに、可変抵抗の摺動片と他方の固定端子との間に被試験装置が接続 され、可変抵抗の摺動片の位置を変えることにより、被試験装置に供給される電 圧の試験信号の大きさ(電圧値)が調整される。 したがって、1台の発生装置を用意して各ユニットのピンの挿入及び可変抵抗 の調整の簡単な作業を行うことにより、必要な数,大きさの直流の電流,電圧の 試験信号を同時に得て被試験装置の性能検査等が行える。At this time, both fixed resistance and variable resistance fixed terminals are connected in series between the positive and negative power supply terminals, and the device under test is connected between the sliding piece of the variable resistance and the other fixed terminal. The magnitude (voltage value) of the voltage test signal supplied to the device under test is adjusted by changing the position of the sliding piece of the variable resistance. Therefore, by preparing one generator and performing the simple work of inserting the pins of each unit and adjusting the variable resistance, it is possible to simultaneously obtain the required number and magnitude of DC current and voltage test signals. Performs performance inspection of the device under test.
【0010】[0010]
1実施例について、図1ないし図4を参照して説明する。 この実施例においては、例えば水処理装置の性能検査に用いるため、装置筐体 に3(列)×N(個)の試験信号発生ユニットを収容して図1に示すように回路 接続する。 One embodiment will be described with reference to FIGS. 1 to 4. In this embodiment, 3 (rows) × N (pieces) of test signal generating units are housed in the housing of the apparatus and connected in a circuit as shown in FIG.
【0011】 図1において、1,1’,2,2’,3,3’は第1〜3列の正,負の電源端 子であり、図2に示すように装置の正面側の操作パネル4に設けられ、装置の背 面側の端子台(以下背面端子台という)に給電された例えば24Vの共通の直流 電源を各列の電源端子1,1’,〜,3,3’間に与える。 5,5’,6,6’,7,7’は各列の電源端子1,1’,〜,3,3’に接 続された列毎の正,負の検電兼電源取出端子であり、いずれも背面端子台に設け られている。In FIG. 1, reference numerals 1, 1 ′, 2, 2 ′, 3, 3 ′ represent positive and negative power supply terminals in the first to third columns, and as shown in FIG. A common DC power supply of, for example, 24V provided on the panel 4 and supplied to the terminal block on the back side of the device (hereinafter referred to as the rear terminal block) is connected between the power supply terminals 1, 1 ', ..., 3, 3'of each row. Give to. 5,5 ', 6,6', 7,7 'are positive and negative voltage detection and power supply extraction terminals for each column connected to the power supply terminals 1,1', ..., 3,3 'of each column. Yes, both are provided on the rear terminal block.
【0012】 11,12,13は列毎の正側,負側の1対のヒューズ8,8’,9,9’, 10,10’を介して各列の電源端子1,1’,〜,3,3’に接続された各列 のユニットブロックであり、同一構成のN個の試験信号発生ユニット14を並列 接続して形成されている。Reference numerals 11, 12 and 13 denote power supply terminals 1, 1 ′, ... Of each column through a pair of positive and negative fuses 8, 8 ′, 9, 9 ′, 10, 10 ′ for each column. , 3, 3 ', which are unit blocks of each column and are formed by connecting N test signal generating units 14 of the same configuration in parallel.
【0013】 15,15’は操作パネル4に設けられた各ユニット14の正側,負側の1対 の使用ユニット選択端子であり、ピンの挿入部分が電気的に絶縁された断面半円 弧状の電源側接片P又はNと,回路側接片P’又はN’とにより形成され、電源 側接片P,Nはヒューズ8,8’,〜,10,10’を介して各列の電源端子1 ,1’,〜,3,3’それぞれに接続され、回路側接片P’,N’は各ユニット 14の正,負の受電端子Pi,Niそれぞれに接続され、短絡用のピンの挿入に より2接片P,P’又はN,N’がピンを介して短絡される。Reference numerals 15 and 15 ′ are a pair of positive unit and negative unit unit selection terminals on the positive and negative sides of each unit 14 provided on the operation panel 4, and have a semicircular arc-shaped cross section in which a pin insertion portion is electrically insulated Of the power supply side contact piece P or N and the circuit side contact piece P'or N ', and the power supply side contact piece P or N is connected to each row through the fuses 8, 8', ..., 10, 10 '. The power supply terminals 1, 1 ', ..., 3, 3'are respectively connected, and the circuit side contact pieces P', N'are respectively connected to the positive and negative power receiving terminals Pi, Ni of each unit 14 and are short-circuiting pins. The two contact pieces P, P'or N, N'are short-circuited via the pin by inserting the.
【0014】 16は一方の固定端子が限流兼分圧用の固定抵抗17を介して受電端子Piに 接続された各ユニット14の信号調整用の可変抵抗であり、そのつまみ16’が 操作パネル4に設けられている。 18,18’は操作パネル4に設けられた各ユニット14の1対の電流信号端 子であり、可変抵抗16の他方の固定端子,受電端子Niそれぞれに接続されて いる。19は操作パネル4に設けられた各ユニット14の接続切換端子であり、 ピンの挿入部分が選択端子15,15’と同様、電気的に絶縁された断面半円弧 状の2接片A,Bにより形成され、両接片A,Bは可変抵抗16の摺動片,他方 の固定端子それぞれに接続され、短絡用のピンの挿入により両接片A,Bがピン を介して短絡される。Reference numeral 16 denotes a variable resistor for signal adjustment of each unit 14, one fixed terminal of which is connected to the power receiving terminal Pi via a fixed resistor 17 for current limiting and voltage dividing, and a knob 16 ′ of which is a knob 16 ′. It is provided in. Reference numerals 18 and 18 'denote a pair of current signal terminals of each unit 14 provided on the operation panel 4, which are connected to the other fixed terminal of the variable resistor 16 and the power receiving terminal Ni, respectively. Reference numeral 19 is a connection switching terminal of each unit 14 provided on the operation panel 4, and the pin insertion portion is electrically insulated like the selection terminals 15 and 15 '. The two contact pieces A and B are connected to the sliding piece of the variable resistor 16 and the other fixed terminal, respectively, and the two contact pieces A and B are short-circuited via the pin by inserting a shorting pin.
【0015】 20,20’は操作パネル4に設けられた各ユニット14の1対の電圧信号端 子であり、可変抵抗16の摺動片,受電端子Niそれぞれに接続されている。Reference numerals 20 and 20 ′ are a pair of voltage signal terminals of each unit 14 provided on the operation panel 4, and are connected to the sliding piece of the variable resistor 16 and the power receiving terminal Ni, respectively.
【0016】 21,22は受電端子Pi,可変抵抗16の一方の固定端子それぞれに接続さ れた各ユニット14の2個の固定電圧出力端子であり、背面端子台に設けられて いる。23,23’は電圧信号端子18,18’に接続された各ユニット14の 1対の補助電圧信号端子であり、背面端子台に設けられている。Reference numerals 21 and 22 denote two fixed voltage output terminals of each unit 14 connected to the power receiving terminal Pi and one fixed terminal of the variable resistor 16, respectively, and are provided on the rear terminal block. 23 and 23 'are a pair of auxiliary voltage signal terminals of each unit 14 connected to the voltage signal terminals 18 and 18', and are provided on the rear terminal block.
【0017】 そして、通常は操作パネル4の各ユニット14の選択端子15,15’及び接 続切換端子19のピンの挿入,電流信号端子18,18’又は電圧信号端子20 ,20’の被試験装置の接続とつまみ16’の操作との組合せにより、必要な大 きさの直流の電流,電圧の各試験信号が水処理装置等の被試験装置の各部に供給 される。Then, normally, the pins of the selection terminals 15 and 15 ′ and the connection switching terminal 19 of each unit 14 of the operation panel 4 are inserted, and the current signal terminals 18 and 18 ′ or the voltage signal terminals 20 and 20 ′ are tested. A combination of the connection of the equipment and the operation of the knob 16 'supplies the required test signals of direct current and voltage of large magnitude to the respective parts of the equipment under test such as the water treatment equipment.
【0018】 すなわち、各ユニット14は使用時にのみ選択端子15,15’にピンが挿入 されて各列の電源端子1,1’〜3,3’に接続され、共通の直流電源が給電さ れて使用可能な状態になる。 そして、電流の試験信号を発生する場合は、接続切換端子19にピンを挿入し 、被試験装置24を電流信号端子18,18’間に接続し、つまみ16’を操作 して電流値を調整する。That is, each unit 14 is connected to the power supply terminals 1, 1 ′ to 3, 3 ′ of each row by inserting pins into the selection terminals 15 and 15 ′ only when used, and is supplied with a common DC power supply. Ready to use. When generating a current test signal, insert a pin into the connection switching terminal 19, connect the device under test 24 between the current signal terminals 18 and 18 ', and operate the knob 16' to adjust the current value. To do.
【0019】 このとき、第1列のユニット14であれば図3の等価回路に示すように、電源 端子1,1’間に固定抵抗17,可変抵抗16,被試験装置24が直列接続され 、被試験装置24に電流の試験信号が供給される。 また、共通の直流電源が24Vの場合、可変抵抗16が0〜5KΩ,固定抵抗 が1KΩに設定され、電流の試験信号はつまみ16’の操作に基づく可変抵抗1 6の摺動片の位置調整により、約4〜20mAの範囲の任意の大きさになる。At this time, in the case of the unit 14 in the first row, as shown in the equivalent circuit of FIG. 3, the fixed resistor 17, the variable resistor 16, and the device under test 24 are connected in series between the power supply terminals 1 and 1 ′. A current test signal is supplied to the device under test 24. When the common DC power supply is 24V, the variable resistance 16 is set to 0 to 5KΩ and the fixed resistance is set to 1KΩ, and the current test signal is adjusted by adjusting the position of the sliding piece of the variable resistance 16 based on the operation of the knob 16 '. To give any size in the range of about 4-20 mA.
【0020】 つぎに、電圧の試験信号を発生する場合は、電流信号端子18,18’間をリ ード線等で短絡し、被検査装置を電圧信号端子20,20’間に接続し、つまみ 16’を操作して電圧値を調整する。 なお、接続切換端子19はピンが挿入されず、可変抵抗16の摺動片と他方の 固定端子との間は短絡されない。Next, when generating a voltage test signal, the current signal terminals 18 and 18 ′ are short-circuited with a lead wire or the like, and the device under test is connected between the voltage signal terminals 20 and 20 ′. Operate knob 16 'to adjust the voltage value. No pin is inserted into the connection switching terminal 19, and the sliding piece of the variable resistor 16 and the other fixed terminal are not short-circuited.
【0021】 このとき、第1列のユニット14であれば図4の等価回路に示すように、電源 端子1,1’間には固定抵抗17,可変抵抗16が直列接続され、被試験装置2 4が可変抵抗16の摺動片と電原端子1’との間の可変抵抗16のインピーダン スに並列接続され、被試験装置24に電圧の試験信号が供給される。 なお、図4の25は電流信号端子18,18’間のリード線等の短絡線を示す 。At this time, in the case of the unit 14 in the first row, as shown in the equivalent circuit of FIG. 4, the fixed resistor 17 and the variable resistor 16 are connected in series between the power supply terminals 1 and 1 ′, and the device under test 2 4 is connected in parallel to the impedance of the variable resistor 16 between the sliding piece of the variable resistor 16 and the power source terminal 1 ', and a voltage test signal is supplied to the device under test 24. Reference numeral 25 in FIG. 4 indicates a short-circuit wire such as a lead wire between the current signal terminals 18 and 18 '.
【0022】 また、共通の直流電原が24Vの場合、電圧の試験信号はつまみ16’の操作 により、約0〜20Vの範囲の任意の大きさになる。 そして、各ユニット14が電流,電圧の試験信号発生機能を備え、装置正面の 操作パネル4でのピン挿入、端子接続及びつまみ操作の簡単な作業により、必要 数のユニット14を選択して種々の大きさの必要数の直流の電流及び電圧の試験 信号を発生するため、1台の発生装置により被試験装置に応じた適当な数,大き さの試験信号が簡単に得られ、作業性等の向上が図れる。Further, when the common DC power source is 24V, the test signal of the voltage has an arbitrary magnitude in the range of about 0 to 20V by the operation of the knob 16 '. Each unit 14 has a function of generating a test signal of current and voltage, and by a simple operation such as pin insertion, terminal connection and knob operation on the operation panel 4 on the front of the device, a required number of units 14 can be selected and various units can be selected. Since a required number of DC current and voltage test signals are generated, a single generator can easily obtain an appropriate number and size of test signals according to the device under test. Can be improved.
【0023】 また、各ユニット14の選択端子15,15’のピンの挿入の有,無により、 必要数のユニット14のみ選択して電源を与えるため、誤接続等に基づく事故の 発生が防止され、安全性の高い装置を提供できる。 なお、端子15,15’,19のピンの挿入,信号端子18,18’,20, 20’の被試験装置の接続及びつまみ16’による電流,電圧の調整の順序等は 試験の条件,内容等によって異なる。In addition, since the required number of units 14 are selected and power is supplied depending on whether or not the pins of the selection terminals 15 and 15 ′ of each unit 14 are inserted, the occurrence of an accident due to an incorrect connection or the like is prevented. Therefore, a highly safe device can be provided. Note that the insertion of pins for terminals 15, 15 ', 19 and the connection of the device under test for signal terminals 18, 18', 20, 20 ', and the order of adjusting the current and voltage by the knob 16', etc. Etc.
【0024】 また、背面端子台の端子5,5’,〜,7,7’により各列の検電又は電源の 取出しが行え固定電圧端子21,22により2種の固定電圧の取出しが行え、し かも、補助電圧信号端子23,23’が信号端子20,20’と同じ機能を果た すため、機能の一層の向上が図れる。 そして、前記実施例では受電端子Piを一方,受電端子Niを他方としたが、 受電端子Niを一方,受電端子Piを他方とし、受電端子Ni,Pi間に固定抵 抗17,可変抵抗16,信号出力端子18,18’を直列に設けても同様の効果 が得られるのは勿論である。Further, the terminals 5, 5 ', ~, 7, 7'of the rear terminal block can be used to detect electricity in each column or to extract the power source, and the fixed voltage terminals 21 and 22 to extract two types of fixed voltages. However, since the auxiliary voltage signal terminals 23 and 23 'perform the same function as the signal terminals 20 and 20', the function can be further improved. In the above embodiment, the power receiving terminal Pi is one and the power receiving terminal Ni is the other. However, the power receiving terminal Ni is one and the power receiving terminal Pi is the other, and the fixed resistor 17, the variable resistor 16, and the variable resistor 16 are provided between the power receiving terminals Ni and Pi. Of course, the same effect can be obtained by providing the signal output terminals 18 and 18 'in series.
【0025】[0025]
本考案は、以上説明したように構成されているため、以下に記載する効果を奏 する。 各試験信号発生ユニット14が使用ユニット選択端子15,15’にピンを挿 入する簡単な操作で選択されて使用可能な状態になる。 さらに、選択されたユニット14は、電流の試験信号を発生する場合、1対の 電流信号端子間18,18’に被試験装置を接続するとともに接続切換端子19 にピンを挿入し、正,負の電源端子1,1’,2,2’又は3,3’間に固定抵 抗17,可変抵抗16,被試験装置を直列接続して用いられ、このとき、可変抵 抗16により被試験装置に供給される電流の試験信号の大きさ(電流値)が調整 される。 Since the present invention is configured as described above, it has the following effects. Each test signal generating unit 14 is selected and put in a usable state by a simple operation of inserting a pin into the used unit selection terminals 15 and 15 '. Further, when the selected unit 14 generates a current test signal, the device under test is connected between the pair of current signal terminals 18 and 18 ', and a pin is inserted into the connection switching terminal 19 so that the positive and negative A fixed resistor 17, a variable resistor 16, and a device under test are connected in series between the power supply terminals 1, 1 ', 2, 2'or 3, 3'of the device under test. The magnitude (current value) of the test signal of the current supplied to is adjusted.
【0026】 また、電圧の試験信号を発生する場合、電流信号端子18,18’間を短絡し 、1対の電圧信号端子20,20’間に被試験装置を接続し、電源端子1,1’ ,2,2’又は3,3’間に固定抵抗17,可変抵抗16を直列接続するととも に、可変抵抗16の摺動片と他方の固定端子との間に被試験装置を接続して用い られ、このとき、可変抵抗により被試験装置に供給される電圧の試験信号の大き さ(電圧値)が調整される。 したがって、1台の発生装置を用意してピンの挿入及び可変抵抗16の調整の 簡単な作業を行うことにより、必要な数,大きさの種々の直流の電流,電圧の試 験信号を同時に得て被試験装置の性能検査等が行え、作業性等の大幅な向上が図 れる。When generating a voltage test signal, the current signal terminals 18, 18 ′ are short-circuited, the device under test is connected between the pair of voltage signal terminals 20, 20 ′, and the power supply terminals 1, 1 ′ are connected. Connect the fixed resistor 17 and the variable resistor 16 in series between ', 2, 2'or 3, 3', and connect the device under test between the sliding piece of the variable resistor 16 and the other fixed terminal. At this time, the magnitude (voltage value) of the test signal of the voltage supplied to the device under test is adjusted by the variable resistance. Therefore, by preparing a single generator and performing the simple work of inserting pins and adjusting the variable resistor 16, various DC current and voltage test signals of the required number and magnitude can be obtained simultaneously. The performance of the device under test can be inspected and the workability can be greatly improved.
【図1】本考案の試験信号発生装置の1実施例の結線図
である。FIG. 1 is a connection diagram of an embodiment of a test signal generator of the present invention.
【図2】図1の装置の操作パネルの正面図である。FIG. 2 is a front view of an operation panel of the apparatus shown in FIG.
【図3】図1の装置の電流の試験信号を出力するユニッ
トの等価回路図である。3 is an equivalent circuit diagram of a unit for outputting a current test signal of the device of FIG.
【図4】図1の装置の電圧の試験信号を発生するユニッ
トの等価回路図である。4 is an equivalent circuit diagram of a unit for generating a voltage test signal of the apparatus of FIG.
1,1’,2,2’,3,3’ 正,負の電源端子 14 試験信号発生ユニット 15,15’ 使用ユニット選択端子 16 信号調整用の可変抵抗 17 限流兼分圧用の固定抵抗 18,18’ 電流信号端子 19 接続切換端子 20,20’ 電圧信号端子 Pi,Ni 正,負の受電端子 1,1 ', 2,2', 3,3 'Positive and negative power supply terminals 14 Test signal generation unit 15,15' Used unit selection terminal 16 Variable resistor for signal adjustment 17 Fixed resistor for current limiting and voltage dividing 18 , 18 'Current signal terminal 19 Connection switching terminal 20, 20' Voltage signal terminal Pi, Ni Positive and negative power receiving terminals
Claims (1)
生する試験信号発生装置において、 正,負の電源端子間に並列接続された複数の試験信号発
生ユニットを収容し、 該各ユニットに、 前記両電源端子と前記各ユニットの正,負の受電端子と
の間それぞれに設けられ,前記各ユニットそれぞれの使
用時に短絡用のピンが挿入されて前記両電源端子に前記
両受電端子を接続する1対の使用ユニット選択端子と、 前記両受電端子のいずれか一方に限流兼分圧用の固定抵
抗を介して一方の固定端子が接続された信号調整用の可
変抵抗と、 前記両受電端子の他方,前記可変抵抗の他方の固定端子
それぞれに接続され,電流の試験信号発生時に被試験装
置が接続され,電圧の試験信号発生時に短絡される1対
の電流信号端子と、 前記可変抵抗の摺動片と前記他方の固定端子との間に設
けられ,電流の試験信号発生時にのみ短絡用のピンが挿
入されて前記摺動片と前記他方の固定端子との間を短絡
する接続切換端子と、 前記摺動片,前記両受電端子の他方それぞれに接続さ
れ,電圧の試験信号発生時に被試験装置が接続される1
対の電圧信号端子とを設けた試験信号発生装置。1. A test signal generator for generating a plurality of DC current and voltage test signals, which accommodates a plurality of test signal generating units connected in parallel between positive and negative power supply terminals, and each of the units has a test signal generating unit. , Provided between the both power supply terminals and the positive and negative power receiving terminals of each unit, and a pin for short circuit is inserted when each of the units is used to connect the both power receiving terminals to the both power supply terminals. A pair of used unit selection terminals, a variable resistor for signal adjustment in which one of the two power receiving terminals is connected to one of the two power receiving terminals via a fixed resistor for current limiting and voltage dividing, and both power receiving terminals On the other hand, a pair of current signal terminals connected to each of the other fixed terminals of the variable resistor, connected to the device under test when a current test signal is generated, and short-circuited when a voltage test signal is generated; Sliding A connection switching terminal which is provided between the one piece and the other fixed terminal, and in which a short-circuit pin is inserted only when a test signal of current is generated to short-circuit the sliding piece and the other fixed terminal; Connected to the other of the sliding piece and the other of the both power receiving terminals, and connected to a device under test when a voltage test signal is generated 1
A test signal generator having a pair of voltage signal terminals.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7845592U JP2567850Y2 (en) | 1992-10-16 | 1992-10-16 | Test signal generator |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7845592U JP2567850Y2 (en) | 1992-10-16 | 1992-10-16 | Test signal generator |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0635976U true JPH0635976U (en) | 1994-05-13 |
JP2567850Y2 JP2567850Y2 (en) | 1998-04-08 |
Family
ID=13662518
Family Applications (1)
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JP7845592U Expired - Fee Related JP2567850Y2 (en) | 1992-10-16 | 1992-10-16 | Test signal generator |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2567850Y2 (en) |
-
1992
- 1992-10-16 JP JP7845592U patent/JP2567850Y2/en not_active Expired - Fee Related
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Publication number | Publication date |
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JP2567850Y2 (en) | 1998-04-08 |
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