JP2567850Y2 - Test signal generator - Google Patents

Test signal generator

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Publication number
JP2567850Y2
JP2567850Y2 JP7845592U JP7845592U JP2567850Y2 JP 2567850 Y2 JP2567850 Y2 JP 2567850Y2 JP 7845592 U JP7845592 U JP 7845592U JP 7845592 U JP7845592 U JP 7845592U JP 2567850 Y2 JP2567850 Y2 JP 2567850Y2
Authority
JP
Japan
Prior art keywords
terminals
test signal
voltage
current
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP7845592U
Other languages
Japanese (ja)
Other versions
JPH0635976U (en
Inventor
富夫 岡崎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nissin Electric Co Ltd
Original Assignee
Nissin Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nissin Electric Co Ltd filed Critical Nissin Electric Co Ltd
Priority to JP7845592U priority Critical patent/JP2567850Y2/en
Publication of JPH0635976U publication Critical patent/JPH0635976U/en
Application granted granted Critical
Publication of JP2567850Y2 publication Critical patent/JP2567850Y2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Tests Of Electronic Circuits (AREA)

Description

【考案の詳細な説明】[Detailed description of the invention]

【0001】[0001]

【産業上の利用分野】本考案は、産業用,民生用の種々
の装置の性能検査等に必要な直流の種々の電流,電圧の
試験信号を発生する試験信号発生装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a test signal generator for generating various direct current and voltage test signals necessary for performance inspection of various industrial and consumer devices.

【0002】[0002]

【従来の技術】従来、産業用装置の1例である水処理装
置の性能検査においては、一度に多数の回路検査を行う
ため、通常、4〜20mA,1〜5Vの直流の種々の電
流,電圧の試験信号を必要とする。そして、これらの試
験信号は、従来、信号毎に直流電源装置を用意し、各直
流電源装置の出力を調整して形成される。
2. Description of the Related Art Conventionally, in the performance inspection of a water treatment apparatus, which is an example of an industrial apparatus, a large number of circuit inspections are performed at one time. Requires a voltage test signal. Conventionally, these test signals are formed by preparing a DC power supply for each signal and adjusting the output of each DC power supply.

【0003】[0003]

【考案が解決しようとする課題】前記従来のように試験
信号毎に直流電源装置を用意し、それぞれの出力を調整
して用いる場合、多数の装置を要してその設置,調整等
の作業が極めて煩雑化し、しかも、被試験装置に応じて
用意する直流電源装置の個数等が異なるため、効率のよ
い検査が行えない問題点がある。本考案は、1台の装置
の簡単な操作で直流の種々の電流,電圧の試験信号を同
時に得ることができる試験信号発生装置を提供すること
を目的とする。
When a DC power supply is prepared for each test signal and the output of each is adjusted and used as in the prior art, a large number of devices are required, and work such as installation and adjustment is required. Since the number of DC power supply units to be prepared differs depending on the device under test, there is a problem that efficient inspection cannot be performed. SUMMARY OF THE INVENTION It is an object of the present invention to provide a test signal generator capable of simultaneously obtaining various direct current and voltage test signals by a simple operation of one device.

【0004】[0004]

【課題を解決するための手段】前記の目的を達成するた
めに、本考案の試験信号発生装置においては、正,負の
電源端子間に並列接続された複数の試験信号発生ユニッ
トを収容し、
In order to achieve the above object, a test signal generator according to the present invention includes a plurality of test signal generator units connected in parallel between positive and negative power supply terminals.

【0005】該ユニットに、両電源端子と各ユニットの
正,負の受電端子との間それぞれに設けられ,各ユニッ
トそれぞれの使用時に短絡用のピンが挿入されて両電源
端子に両受電端子を接続する1対の使用ユニット選択端
子と、両受電端子のいずれか一方に限流兼分圧用の固定
抵抗を介して一方の固定端子が接続された信号調整用の
可変抵抗と、
The power supply terminals are provided between the power supply terminals and the positive and negative power receiving terminals of each unit. When each unit is used, a short-circuit pin is inserted to connect the power reception terminals to the power supply terminals. A pair of use unit selection terminals to be connected; a variable resistor for signal adjustment in which one of the fixed terminals is connected to one of the power receiving terminals via a fixed resistor for current limiting and voltage division;

【0006】両受電端子の他方,可変抵抗の他方の固定
端子それぞれに接続され,電流の試験信号発生時に被試
験装置が接続され,電圧の試験信号発生時に短絡される
1対の電流信号端子と、可変抵抗の摺動片と他方の固定
端子との間に設けられ,電流の試験信号発生時にのみ短
絡用のピンが挿入されて可変抵抗の摺動片と他方の固定
端子との間を短絡する接続切換端子と、可変抵抗の摺動
片,両受電端子の他方それぞれに接続され,電圧の試験
信号発生時に被試験装置が接続される1対の電圧信号端
子とを設ける。
A pair of current signal terminals, which are connected to the other of the two power receiving terminals and the other fixed terminal of the variable resistor, to which a device under test is connected when a current test signal is generated, and short-circuited when a voltage test signal is generated, Is provided between the variable resistance sliding piece and the other fixed terminal, and a short-circuit pin is inserted only when a current test signal is generated to short-circuit the variable resistance sliding piece and the other fixed terminal. And a pair of voltage signal terminals connected to the sliding piece of the variable resistor and the other of the power receiving terminals and connected to the device under test when a voltage test signal is generated.

【0007】[0007]

【作用】前記のように構成された本考案の試験信号発生
装置の場合、各試験信号発生ユニットはそれぞれの1対
の使用ユニット選択端子にピンを挿入する簡単な操作で
選択されて直流電源が給電され、使用可能な状態にな
る。さらに、選択されたユニットにおいては、電流の試
験信号を発生する場合、1対の電流信号端子間に被試験
装置を接続するとともに接続切換端子に短絡用のピンが
挿入されて可変抵抗の摺動片と他方の固定端子との間が
短絡される。
In the test signal generator of the present invention configured as described above, each test signal generating unit is selected by a simple operation of inserting a pin into each pair of used unit selection terminals, and the DC power supply is turned off. Power is supplied and it is ready for use. Further, in the selected unit, when a current test signal is generated, the device under test is connected between a pair of current signal terminals, and a short-circuit pin is inserted into the connection switching terminal, so that the variable resistance slides. A short circuit occurs between one piece and the other fixed terminal.

【0008】このとき、正,負の電源端子間に固定抵
抗,可変抵抗の一方の固定端子,摺動片,被試験装置が
直列接続され、可変抵抗の摺動片の位置を変えることに
より、被試験装置に供給される電流の試験信号の大きさ
(電流値)が調整される。また、電圧の試験信号を発生
する場合、1対の電流信号端子間を短絡して1対の電圧
信号端子間に被試験装置が接続される。
At this time, one fixed terminal of the fixed resistor and the variable resistor, the sliding piece, and the device under test are connected in series between the positive and negative power supply terminals, and by changing the position of the sliding piece of the variable resistor, The magnitude (current value) of the test signal of the current supplied to the device under test is adjusted. When a voltage test signal is generated, a device under test is connected between a pair of voltage signal terminals by short-circuiting a pair of current signal terminals.

【0009】このとき、正,負の電源端子間に固定抵
抗,可変抵抗の両固定端子が直列接続されるとともに、
可変抵抗の摺動片と他方の固定端子との間に被試験装置
が接続され、可変抵抗の摺動片の位置を変えることによ
り、被試験装置に供給される電圧の試験信号の大きさ
(電圧値)が調整される。したがって、1台の発生装置
を用意して各ユニットのピンの挿入及び可変抵抗の調整
の簡単な作業を行うことにより、必要な数,大きさの直
流の電流,電圧の試験信号を同時に得て被試験装置の性
能検査等が行える。
At this time, both fixed and variable fixed terminals are connected in series between the positive and negative power supply terminals.
The device under test is connected between the sliding piece of the variable resistor and the other fixed terminal, and by changing the position of the sliding piece of the variable resistor, the magnitude of the test signal of the voltage supplied to the device under test ( Voltage value) is adjusted. Therefore, by preparing a single generator and performing simple operations of inserting the pins of each unit and adjusting the variable resistance, the required number and magnitude of DC current and voltage test signals can be obtained simultaneously. Performs performance inspection of the device under test.

【0010】[0010]

【実施例】1実施例について、図1ないし図4を参照し
て説明する。この実施例においては、例えば水処理装置
の性能検査に用いるため、装置筐体に3(列)×N
(個)の試験信号発生ユニットを収容して図1に示すよ
うに回路接続する。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment will be described with reference to FIGS. In this embodiment, 3 (rows) .times.N
The (test) test signal generation units are accommodated and connected in a circuit as shown in FIG.

【0011】図1において、1,1’,2,2’,3,
3’は第1〜3列の正,負の電源端子であり、図2に示
すように装置の正面側の操作パネル4に設けられ、装置
の背面側の端子台(以下背面端子台という)に給電され
た例えば24Vの共通の直流電源を各列の電源端子1,
1’,〜,3,3’間に与える。5,5’,6,6’,
7,7’は各列の電源端子1,1’,〜,3,3’に接
続された列毎の正,負の検電兼電源取出端子であり、い
ずれも背面端子台に設けられている。
In FIG. 1, 1, 1 ', 2, 2', 3,
Reference numeral 3 'denotes first to third columns of positive and negative power supply terminals, which are provided on the operation panel 4 on the front side of the apparatus as shown in FIG. The common DC power supply of, for example, 24 V supplied to the
Give between 1 ', ~, 3, 3'. 5,5 ', 6,6',
Reference numerals 7, 7 'denote positive and negative power detection and power supply terminals for each row connected to the power supply terminals 1, 1', ..., 3, 3 'of each row, all of which are provided on the rear terminal block. I have.

【0012】11,12,13は列毎の正側,負側の1
対のヒューズ8,8’,9,9’,10,10’を介し
て各列の電源端子1,1’,〜,3,3’に接続された
各列のユニットブロックであり、同一構成のN個の試験
信号発生ユニット14を並列接続して形成されている。
Numerals 11, 12, and 13 denote the positive and negative sides of each column.
Unit blocks in each column connected to power supply terminals 1, 1 ',..., 3, 3' in each column via a pair of fuses 8, 8 ', 9, 9', 10, 10 '. Of the N test signal generating units 14 are connected in parallel.

【0013】15,15’は操作パネル4に設けられた
各ユニット14の正側,負側の1対の使用ユニット選択
端子であり、ピンの挿入部分が電気的に絶縁された断面
半円弧状の電源側接片P又はNと,回路側接片P’又は
N’とにより形成され、電源側接片P,Nはヒューズ
8,8’,〜,10,10’を介して各列の電源端子
1,1’,〜,3,3’それぞれに接続され、回路側接
片P’,N’は各ユニット14の正,負の受電端子P
i,Niそれぞれに接続され、短絡用のピンの挿入によ
り2接片P,P’又はN,N’がピンを介して短絡され
る。
Reference numerals 15 and 15 'denote a pair of use unit selection terminals on the positive side and the negative side of each unit 14 provided on the operation panel 4, and the pin insertion portions are electrically insulated and have a semicircular cross section. Are formed by the power supply side contact piece P or N and the circuit side contact piece P ′ or N ′, and the power supply side contact pieces P and N are connected to the respective columns through the fuses 8, 8 ′,. The power supply terminals 1, 1 ′,..., 3, 3 ′ are connected to each other.
i, Ni, and two connecting pieces P, P 'or N, N' are short-circuited through the pins by inserting a short-circuit pin.

【0014】16は一方の固定端子が限流兼分圧用の固
定抵抗17を介して受電端子Piに接続された各ユニッ
ト14の信号調整用の可変抵抗であり、そのつまみ1
6’が操作パネル4に設けられている。18,18’は
操作パネル4に設けられた各ユニット14の1対の電流
信号端子であり、可変抵抗16の他方の固定端子,受電
端子Niそれぞれに接続されている。19は操作パネル
4に設けられた各ユニット14の接続切換端子であり、
ピンの挿入部分が選択端子15,15’と同様、電気的
に絶縁された断面半円弧状の2接片A,Bにより形成さ
れ、両接片A,Bは可変抵抗16の摺動片,他方の固定
端子それぞれに接続され、短絡用のピンの挿入により両
接片A,Bがピンを介して短絡される。
Reference numeral 16 denotes a variable resistor for signal adjustment of each unit 14 having one fixed terminal connected to the power receiving terminal Pi via a fixed resistor 17 for current limiting and voltage division.
Reference numeral 6 ′ is provided on the operation panel 4. Reference numerals 18 and 18 'denote a pair of current signal terminals of each unit 14 provided on the operation panel 4, which are connected to the other fixed terminal and the power receiving terminal Ni of the variable resistor 16, respectively. 19 is a connection switching terminal of each unit 14 provided on the operation panel 4,
Like the selection terminals 15 and 15 ', the pin insertion portion is formed by two electrically-insulated semi-arc-shaped two contact pieces A and B, and both contact pieces A and B are sliding pieces of the variable resistor 16, Both connecting pieces A and B are connected to the other fixed terminals, respectively, and are short-circuited through the pins by inserting a shorting pin.

【0015】20,20’は操作パネル4に設けられた
各ユニット14の1対の電圧信号端子であり、可変抵抗
16の摺動片,受電端子Niそれぞれに接続されてい
る。
Reference numerals 20, 20 'denote a pair of voltage signal terminals of each unit 14 provided on the operation panel 4, which are connected to the sliding piece of the variable resistor 16 and the power receiving terminal Ni, respectively.

【0016】21,22は受電端子Pi,可変抵抗16
の一方の固定端子それぞれに接続された各ユニット14
の2個の固定電圧出力端子であり、背面端子台に設けら
れている。23,23’は電圧信号端子18,18’に
接続された各ユニット14の1対の補助電圧信号端子で
あり、背面端子台に設けられている。
Reference numerals 21 and 22 denote a power receiving terminal Pi and a variable resistor 16.
Each unit 14 connected to one of the fixed terminals
These two fixed voltage output terminals are provided on the rear terminal block. 23 and 23 'are a pair of auxiliary voltage signal terminals of each unit 14 connected to the voltage signal terminals 18 and 18', and are provided on the rear terminal block.

【0017】そして、通常は操作パネル4の各ユニット
14の選択端子15,15’及び接続切換端子19のピ
ンの挿入,電流信号端子18,18’又は電圧信号端子
20,20’の被試験装置の接続とつまみ16’の操作
との組合せにより、必要な大きさの直流の電流,電圧の
各試験信号が水処理装置等の被試験装置の各部に供給さ
れる。
Normally, pins of the selection terminals 15, 15 'and connection switching terminals 19 of each unit 14 of the operation panel 4 are inserted, and the device under test of the current signal terminals 18, 18' or the voltage signal terminals 20, 20 '. And the operation of the knob 16 ', the required DC current and voltage test signals are supplied to each unit of the device under test such as a water treatment device.

【0018】すなわち、各ユニット14は使用時にのみ
選択端子15,15’にピンが挿入されて各列の電源端
子1,1’〜3,3’に接続され、共通の直流電源が給
電されて使用可能な状態になる。そして、電流の試験信
号を発生する場合は、接続切換端子19にピンを挿入
し、被試験装置24を電流信号端子18,18’間に接
続し、つまみ16’を操作して電流値を調整する。
That is, each unit 14 is connected to the power supply terminals 1, 1 'to 3, 3' of each column by inserting pins into the selection terminals 15, 15 'only when used, and supplied with a common DC power supply. It can be used. To generate a current test signal, a pin is inserted into the connection switching terminal 19, the device under test 24 is connected between the current signal terminals 18, 18 ', and the knob 16' is operated to adjust the current value. I do.

【0019】このとき、第1列のユニット14であれば
図3の等価回路に示すように、電源端子1,1’間に固
定抵抗17,可変抵抗16,被試験装置24が直列接続
され、被試験装置24に電流の試験信号が供給される。
また、共通の直流電源が24Vの場合、可変抵抗16が
0〜5KΩ,固定抵抗が1KΩに設定され、電流の試験
信号はつまみ16’の操作に基づく可変抵抗16の摺動
片の位置調整により、約4〜20mAの範囲の任意の大
きさになる。
At this time, in the case of the units 14 in the first row, as shown in the equivalent circuit of FIG. 3, a fixed resistor 17, a variable resistor 16, and a device under test 24 are connected in series between the power supply terminals 1 and 1 '. A current test signal is supplied to the device under test 24.
When the common DC power supply is 24 V, the variable resistor 16 is set to 0 to 5 KΩ, the fixed resistor is set to 1 KΩ, and the current test signal is adjusted by adjusting the position of the sliding piece of the variable resistor 16 based on the operation of the knob 16 ′. , About 4 to 20 mA.

【0020】つぎに、電圧の試験信号を発生する場合
は、電流信号端子18,18’間をリード線等で短絡
し、被検査装置を電圧信号端子20,20’間に接続
し、つまみ16’を操作して電圧値を調整する。なお、
接続切換端子19はピンが挿入されず、可変抵抗16の
摺動片と他方の固定端子との間は短絡されない。
Next, when a voltage test signal is to be generated, the current signal terminals 18 and 18 'are short-circuited with a lead wire or the like, and the device to be inspected is connected between the voltage signal terminals 20 and 20'. 'To adjust the voltage value. In addition,
No pin is inserted into the connection switching terminal 19, and no short circuit occurs between the sliding piece of the variable resistor 16 and the other fixed terminal.

【0021】このとき、第1列のユニット14であれば
図4の等価回路に示すように、電源端子1,1’間には
固定抵抗17,可変抵抗16が直列接続され、被試験装
置24が可変抵抗16の摺動片と電原端子1’との間の
可変抵抗16のインピーダンスに並列接続され、被試験
装置24に電圧の試験信号が供給される。なお、図4の
25は電流信号端子18,18’間のリード線等の短絡
線を示す。
At this time, in the case of the units 14 in the first row, as shown in the equivalent circuit of FIG. 4, a fixed resistor 17 and a variable resistor 16 are connected in series between the power supply terminals 1 and 1 '. Is connected in parallel to the impedance of the variable resistor 16 between the sliding piece of the variable resistor 16 and the electric terminal 1 ′, and a voltage test signal is supplied to the device under test 24. In FIG. 4, reference numeral 25 denotes a short-circuit line such as a lead wire between the current signal terminals 18 and 18 '.

【0022】また、共通の直流電原が24Vの場合、電
圧の試験信号はつまみ16’の操作により、約0〜20
Vの範囲の任意の大きさになる。そして、各ユニット1
4が電流,電圧の試験信号発生機能を備え、装置正面の
操作パネル4でのピン挿入、端子接続及びつまみ操作の
簡単な作業により、必要数のユニット14を選択して種
々の大きさの必要数の直流の電流及び電圧の試験信号を
発生するため、1台の発生装置により被試験装置に応じ
た適当な数,大きさの試験信号が簡単に得られ、作業性
等の向上が図れる。
When the common DC power source is 24 V, the voltage test signal is adjusted to about 0 to 20 by operating the knob 16 '.
Any size in the range of V. And each unit 1
4 has a function of generating test signals for current and voltage, and a required number of units 14 can be selected by selecting the required number of units 14 by a simple operation of pin insertion, terminal connection and knob operation on the operation panel 4 in front of the apparatus. Since a number of DC current and voltage test signals are generated, a single generator can easily obtain an appropriate number and magnitude of test signals corresponding to the device under test, thereby improving workability and the like.

【0023】また、各ユニット14の選択端子15,1
5’のピンの挿入の有,無により、必要数のユニット1
4のみ選択して電源を与えるため、誤接続等に基づく事
故の発生が防止され、安全性の高い装置を提供できる。
なお、端子15,15’,19のピンの挿入,信号端子
18,18’,20,20’の被試験装置の接続及びつ
まみ16’による電流,電圧の調整の順序等は試験の条
件,内容等によって異なる。
The selection terminals 15, 1 of each unit 14
The required number of units 1 depending on the presence or absence of 5 'pin insertion
Since only 4 is selected and the power is supplied, occurrence of an accident due to erroneous connection or the like is prevented, and a highly safe device can be provided.
The order of the insertion of the pins of the terminals 15, 15 ', 19, the connection of the device under test to the signal terminals 18, 18', 20, 20 'and the adjustment of the current and voltage by the knob 16' are the conditions and contents of the test. Depends on etc.

【0024】また、背面端子台の端子5,5’,〜,
7,7’により各列の検電又は電源の取出しが行え固定
電圧端子21,22により2種の固定電圧の取出しが行
え、しかも、補助電圧信号端子23,23’が信号端子
20,20’と同じ機能を果たすため、機能の一層の向
上が図れる。そして、前記実施例では受電端子Piを一
方,受電端子Niを他方としたが、受電端子Niを一
方,受電端子Piを他方とし、受電端子Ni,Pi間に
固定抵抗17,可変抵抗16,信号出力端子18,1
8’を直列に設けても同様の効果が得られるのは勿論で
ある。
Also, the terminals 5, 5 ',.
7, 7 ', the power detection or power supply of each column can be taken out, and two kinds of fixed voltages can be taken out by the fixed voltage terminals 21, 22, and the auxiliary voltage signal terminals 23, 23' are connected to the signal terminals 20, 20 '. Since the same function is performed, the function can be further improved. In the above embodiment, the power receiving terminal Pi is one and the power receiving terminal Ni is the other. However, the power receiving terminal Ni is one and the power receiving terminal Pi is the other, and the fixed resistor 17, the variable resistor 16, the signal Output terminal 18, 1
Needless to say, the same effect can be obtained by providing 8 'in series.

【0025】[0025]

【考案の効果】本考案は、以上説明したように構成され
ているため、以下に記載する効果を奏する。各試験信号
発生ユニット14が使用ユニット選択端子15,15’
にピンを挿入する簡単な操作で選択されて使用可能な状
態になる。さらに、選択されたユニット14は、電流の
試験信号を発生する場合、1対の電流信号端子間18,
18’に被試験装置を接続するとともに接続切換端子1
9にピンを挿入し、正,負の電源端子1,1’,2,
2’又は3,3’間に固定抵抗17,可変抵抗16,被
試験装置を直列接続して用いられ、このとき、可変抵抗
16により被試験装置に供給される電流の試験信号の大
きさ(電流値)が調整される。
The present invention is configured as described above and has the following effects. Each test signal generating unit 14 is used unit selection terminals 15, 15 '.
The pin is inserted and used by a simple operation to be used. Further, when the selected unit 14 generates a current test signal, the selected unit 14 is connected between a pair of current signal terminals 18, 18.
18 'is connected to the device under test and connection switching terminal 1
9 and the positive and negative power supply terminals 1, 1 ', 2,
A fixed resistor 17, a variable resistor 16, and a device under test are connected in series between 2 'or 3, 3'. At this time, the magnitude of a test signal of a current supplied to the device under test by the variable resistor 16 ( Current value) is adjusted.

【0026】また、電圧の試験信号を発生する場合、電
流信号端子18,18’間を短絡し、1対の電圧信号端
子20,20’間に被試験装置を接続し、電源端子1,
1’,2,2’又は3,3’間に固定抵抗17,可変抵
抗16を直列接続するとともに、可変抵抗16の摺動片
と他方の固定端子との間に被試験装置を接続して用いら
れ、このとき、可変抵抗により被試験装置に供給される
電圧の試験信号の大きさ(電圧値)が調整される。した
がって、1台の発生装置を用意してピンの挿入及び可変
抵抗16の調整の簡単な作業を行うことにより、必要な
数,大きさの種々の直流の電流,電圧の試験信号を同時
に得て被試験装置の性能検査等が行え、作業性等の大幅
な向上が図れる。
When a voltage test signal is generated, the current signal terminals 18 and 18 'are short-circuited, the device under test is connected between the pair of voltage signal terminals 20 and 20', and the power supply terminals 1 and 20 'are connected.
A fixed resistor 17 and a variable resistor 16 are connected in series between 1 ', 2, 2' or 3, 3 ', and a device under test is connected between a sliding piece of the variable resistor 16 and the other fixed terminal. At this time, the magnitude (voltage value) of the test signal of the voltage supplied to the device under test is adjusted by the variable resistor. Therefore, by preparing a single generator and performing simple operations of inserting pins and adjusting the variable resistor 16, it is possible to simultaneously obtain the required number and size of various DC current and voltage test signals. A performance test of the device under test can be performed, and workability and the like can be greatly improved.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本考案の試験信号発生装置の1実施例の結線図
である。
FIG. 1 is a connection diagram of an embodiment of a test signal generator according to the present invention.

【図2】図1の装置の操作パネルの正面図である。FIG. 2 is a front view of an operation panel of the apparatus shown in FIG.

【図3】図1の装置の電流の試験信号を出力するユニッ
トの等価回路図である。
FIG. 3 is an equivalent circuit diagram of a unit for outputting a test signal of a current of the device of FIG. 1;

【図4】図1の装置の電圧の試験信号を発生するユニッ
トの等価回路図である。
FIG. 4 is an equivalent circuit diagram of a unit for generating a voltage test signal of the apparatus of FIG. 1;

【符号の説明】[Explanation of symbols]

1,1’,2,2’,3,3’ 正,負の電源端子 14 試験信号発生ユニット 15,15’ 使用ユニット選択端子 16 信号調整用の可変抵抗 17 限流兼分圧用の固定抵抗 18,18’ 電流信号端子 19 接続切換端子 20,20’ 電圧信号端子 Pi,Ni 正,負の受電端子 1, 1 ', 2, 2', 3, 3 'Positive and negative power supply terminals 14 Test signal generation unit 15, 15' Unit selection terminal 16 Variable resistor for signal adjustment 17 Fixed resistor for current limiting and voltage dividing 18 , 18 'Current signal terminal 19 Connection switching terminal 20, 20' Voltage signal terminal Pi, Ni Positive and negative power receiving terminals

Claims (1)

(57)【実用新案登録請求の範囲】(57) [Scope of request for utility model registration] 【請求項1】 直流の電流,電圧の複数の試験信号を発
生する試験信号発生装置において、 正,負の電源端子間に並列接続された複数の試験信号発
生ユニットを収容し、 該各ユニットに、 前記両電源端子と前記各ユニットの正,負の受電端子と
の間それぞれに設けられ,前記各ユニットそれぞれの使
用時に短絡用のピンが挿入されて前記両電源端子に前記
両受電端子を接続する1対の使用ユニット選択端子と、 前記両受電端子のいずれか一方に限流兼分圧用の固定抵
抗を介して一方の固定端子が接続された信号調整用の可
変抵抗と、 前記両受電端子の他方,前記可変抵抗の他方の固定端子
それぞれに接続され,電流の試験信号発生時に被試験装
置が接続され,電圧の試験信号発生時に短絡される1対
の電流信号端子と、 前記可変抵抗の摺動片と前記他方の固定端子との間に設
けられ,電流の試験信号発生時にのみ短絡用のピンが挿
入されて前記摺動片と前記他方の固定端子との間を短絡
する接続切換端子と、 前記摺動片,前記両受電端子の他方それぞれに接続さ
れ,電圧の試験信号発生時に被試験装置が接続される1
対の電圧信号端子とを設けた試験信号発生装置。
1. A test signal generator for generating a plurality of DC current and voltage test signals, comprising a plurality of test signal generation units connected in parallel between positive and negative power supply terminals, A power supply terminal is provided between each of the power supply terminals and the positive and negative power receiving terminals of each unit. When each of the units is used, a short-circuit pin is inserted to connect the power receiving terminals to the power supply terminals. A pair of use unit selection terminals to be connected; a variable resistor for signal adjustment in which one fixed terminal is connected to one of the two power receiving terminals via a fixed resistor for current limiting and voltage division; A pair of current signal terminals connected to the other fixed terminal of the variable resistor, connected to a device under test when a current test signal is generated, and short-circuited when a voltage test signal is generated; Sliding A connection switching terminal that is provided between the sliding piece and the other fixed terminal, wherein a short-circuit pin is inserted only when a current test signal is generated to short-circuit the sliding piece and the other fixed terminal; The device under test is connected to the other of the sliding piece and the other of the power receiving terminals, and is connected to a device under test when a voltage test signal is generated.
A test signal generator provided with a pair of voltage signal terminals.
JP7845592U 1992-10-16 1992-10-16 Test signal generator Expired - Fee Related JP2567850Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7845592U JP2567850Y2 (en) 1992-10-16 1992-10-16 Test signal generator

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7845592U JP2567850Y2 (en) 1992-10-16 1992-10-16 Test signal generator

Publications (2)

Publication Number Publication Date
JPH0635976U JPH0635976U (en) 1994-05-13
JP2567850Y2 true JP2567850Y2 (en) 1998-04-08

Family

ID=13662518

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7845592U Expired - Fee Related JP2567850Y2 (en) 1992-10-16 1992-10-16 Test signal generator

Country Status (1)

Country Link
JP (1) JP2567850Y2 (en)

Also Published As

Publication number Publication date
JPH0635976U (en) 1994-05-13

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