JPH063408A - Ic test jig - Google Patents

Abstract

PURPOSE:To provide a jig which allows switching supplement of coolant as required. CONSTITUTION:An IC 6 is set in a specified test position, and an IC locking means 3 for fixing it is provided in a manner movable in the axial direction. When the IC locking means 3 is so set as to lack the IC 6, a coolant circulation channel A is released to allow coolant to flow into the IC 6 side, meanwhile, if the IC locking means 3 is set above, away from, the IC 6, a coolant bypass B is released to stop supplement of coolant to the IC 6 side.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an IC test jig used by electrically connecting an IC and a tester, and more particularly to an IC test jig.
The present invention relates to an IC test jig provided with a circulation path for a C coolant and a bypass.

[0002]

2. Description of the Related Art A conventional IC test jig is constructed as a connecting device for electrically connecting an IC and a tester, and a cooling device for circulating a cooling liquid from the outside is connected to the jig by a pipe. Therefore, after the IC is installed on the jig, the switch of the cooling device is operated to circulate the cooling liquid, thereby cooling the IC during the test.

[0003]

However, in the above-mentioned conventional IC testing jig, when the circulating operation of the cooling liquid is neglected, abnormal heat is generated in the IC and the IC is destroyed. There was an inconvenience that the jig itself was destroyed.

[0004]

It is an object of the present invention to improve the inconvenience of the conventional example, and in particular, when the IC is fixed at a predetermined test position, the cooling liquid is applied to the IC to effectively protect the IC and the jig. It is an object of the present invention to provide an IC test jig that can be used.

[0005]

According to the present invention, in an IC test jig for electrically connecting an IC and a tester to perform a predetermined test, the IC fixing means for fixing the IC is movable in the axial direction. And a cooling liquid circulation path and a cooling liquid bypass circuit which are switched by the movement of the IC fixing means.
The cooling liquid circulation path is opened with the fixing means fixing the IC, while the cooling fluid bypass is opened at a predetermined position where the fixing means is separated from the IC. This is intended to achieve the above-mentioned object.

Incidentally, a confirmation means for visually recognizing the circulating state of the cooling liquid is provided at a position near the IC as necessary, and the axial movement of the fixing means is restricted at a position where the fixing means is separated from the IC. A locking mechanism is provided.

[0007]

When the IC fixing means fixes the IC at the predetermined inspection position, the cooling liquid circulation path is opened to cool the IC, and when the IC fixing means is separated from the IC. The cooling liquid circulation passage is closed while the cooling liquid bypass is opened. Therefore, by setting the cooling device so that the cooling liquid is constantly supplied to the jig, the cooling liquid is always supplied to the IC side when the IC is fixed by the IC fixing means.

[0008]

Embodiments of the present invention will be described below with reference to the drawings.

FIG. 1 shows a first embodiment of the present invention. In this figure, the jig according to the present embodiment is configured to include a cooling liquid circulation path A for flowing the cooling liquid to the IC 6 side and a cooling liquid bypass circuit B for bypassing the IC 6 and discharging the cooling liquid. .

This will be described in more detail. Coolant circulation path A
Is an IC provided so as to be movable in the axial direction with respect to the IC 6.
A passage 1 formed in a fixing rod 3 as a fixing means, a passage 4 formed at a predetermined distance from the passage 1, and a passage 19 for connecting the passages 1 and 4 to each other. ing. The passage 1 is in communication with a cooling liquid inlet 21 formed at the upper end of the upper lid 5 that covers the IC 6. Therefore, when the fixing rod 3 is pushed down from the state of FIG. 1 and comes into contact with the IC 6 to fix the IC, the passage 1,
19 and 4 are connected to each other so that the cooling liquid from the cooling liquid inlet 21 can flow to the IC 6 side.

On one side of the fixing rod 3, there is provided a push-down lever 2 projecting through a hole 5A formed in the upper lid 5,
By operating the push-down lever 2, the fixed rod 3 is moved in the axial direction.

The cooling liquid bypass B includes a bypass passage pipe 20 whose one end is connected to a hole 5B formed in the side wall portion of the upper lid 5, and the other end of the bypass passage pipe 20 has an IC.
It is connected to a cooling liquid discharge passage 18 formed on the fixed installation base 8. Therefore, when the fixed rod 3 is at the position shown in FIG. 1, the passage 1, the bypass passage pipe 20 and the cooling liquid discharge passage 18 are provided.
Are communicated with each other, whereby the cooling liquid from the cooling liquid inlet 21 does not flow to the IC 6 side, and the cooling liquid discharge path 1
It is discharged from 8 and is made to flow to a cooling device (not shown).

The IC 6 is designed to be pressed by the fixing rod 3 so that the IC terminal 7 and the IC terminal connecting pin probe 9 are electrically connected, and the IC terminal connecting pin probe 9 is connected to the IC terminal connecting pin probe 9. It is adapted to be connected to the printed wiring 14 of the printed board 12 through the pin probe-printed wiring connecting portion 13. Further, the jig-tester connecting pin probe 16 protruding from the upper end of the tester 26 located below the jig is adapted to transmit the signal from the tester 26 to the pad 17, and the fixing screw 10 Is electrically connected to the pad 17 by being screwed into the screw fixing hole 15 through the screw passing hole 11.

In the above structure, when the push-down lever 2 is pushed down, the IC 6 is fixed at the inspection position, and at the same time, the cooling liquid circulation passage A is opened to perform a predetermined cooling, and the cooling liquid discharge passage 18 is used. On the other hand, when the push-down lever 2 is pushed upward while being discharged, the coolant circulation path A is closed and the coolant bypass B is opened at the same time.
The cooling liquid does not flow to the C6 side and is discharged from the cooling liquid discharge passage 18.

According to the above configuration of the present embodiment, even when the IC 6 is taken out, it can be performed without stopping the circulation of the cooling liquid, and the general factor that the operator forgets the predetermined work of flowing the cooling liquid is eliminated. Therefore, it is possible to prevent abnormal heat generation of the IC due to forgetting to flow the cooling liquid, and it is possible to effectively prevent the cause of breakage of the jig.

Next, a second embodiment of the present invention will be described with reference to FIG. The second embodiment is characterized in that the upper lid 5 is provided with a sensing device 24 for sensing the flow state of the cooling liquid, and is electrically connected to a lamp 22 as a confirmation means via a signal line 23. Is to have. That is,
When the cooling liquid is flowing to the IC 6 side, the sensing device 24
A predetermined signal is emitted from the lamp 22, which causes the lamp 22 to light up, so that the circulation state of the cooling liquid can be easily visually recognized from the outside.

Therefore, according to the second embodiment as described above, in addition to the effect obtained in the first embodiment, the flow state of the cooling liquid is always known from the outside. Can determine whether or not
It is possible to add an effect that is extremely advantageous in performing maintenance and inspection when an abnormality is recognized.

As the confirmation means, in addition to the configuration shown in FIG. 2, a window 25 as a confirmation means may be provided in a part of the upper lid 5 as shown in FIG. As described above, if the distribution state is directly confirmed through the window 25, it is possible to expect the same effect as that of the second embodiment.

4 and 5 show a third embodiment in which the IC fixing rod is provided with a lock mechanism. Figure 4
1 is a plan view of a main part when FIG. 1 is viewed from above, and FIG. 5 is a side view thereof. This locking mechanism acts to prevent the IC fixing rod 3 from being pushed down by the pressure when the cooling liquid bypass B is opened and the cooling liquid is flowing through the cooling liquid bypass B. There is. That is, the upper lid 5
Slit 5 extending along the circumferential direction at the upper end of hole 5A
When C is provided and the cooling liquid bypass B is opened, the push-down lever 2 is positioned in the slit 5C, whereby
The pressure of the cooling water prevents the IC fixing rod 3 from naturally descending.

According to such an embodiment, the effect that the malfunction of the IC fixing rod 3 due to the pressure of the cooling water can be effectively avoided can be further added.

[0021]

Since the present invention is constructed and operates as described above, according to this, the IC is fixed at a predetermined test position and at the same time the cooling liquid circulation path is opened, and the IC fixing means is provided from the IC. Since the coolant bypass circuit is opened at the separated position, if the cooling water is always supplied, it is not necessary to stop the cooling water supply when replacing the IC. It is possible to eliminate the cause of forgetting to flow cooling water like this.
There is an effect that abnormal heating of C can be prevented. Further, by providing the means for confirming the flow state of the cooling water, it becomes possible to check from the outside, and in addition to the effect that maintenance and inspection can be quickly performed when an abnormality occurs, the IC fixing rod 3 can also be naturally lowered by the lock mechanism. It is possible to provide a jig for IC inspection, which has an excellent effect that can be prevented.

[Brief description of drawings]

FIG. 1 is a sectional view showing a first embodiment of the present invention.

FIG. 2 is a sectional view showing a second embodiment of the present invention.

FIG. 3 is a cross-sectional view showing a modified example of FIG.

FIG. 4 is a plan view for explaining a lock mechanism according to a third embodiment of the present invention.

FIG. 5 is a side view of FIG.

[Explanation of symbols]

 A cooling water circulation path B cooling water detour 3 IC fixing rod as IC fixing means 5C Slit 6 constituting a locking mechanism 6 IC 22 Lamp constituting confirmation means 25 Window constituting confirmation means 26 Tester

Claims (3)

[Claims] 1. In an IC test jig for electrically connecting an IC and a tester to perform a predetermined test, an IC fixing means for fixing the IC is provided so as to be movable in the axial direction,
A cooling liquid circulation path and a cooling liquid bypass circuit which are switched by the movement of the IC fixing means are provided, and the cooling liquid circulation path is opened with the fixing means fixing the IC, while the fixing means is separated from the IC at a predetermined position. The jig for IC test, characterized in that the coolant bypass circuit is opened. 2. The checking device according to claim 1, further comprising a confirmation device provided at a position near the IC for visually confirming whether or not the cooling liquid is flowing in the cooling liquid circulation passage. IC test jig. 3. The lock mechanism according to claim 1, further comprising a lock mechanism for restricting axial movement of the fixing means at a predetermined position where the fixing means is separated from the IC.
C test jig.