JPH06333991A - Manufacture of film carrier - Google Patents

Manufacture of film carrier

Info

Publication number
JPH06333991A
JPH06333991A JP5139999A JP13999993A JPH06333991A JP H06333991 A JPH06333991 A JP H06333991A JP 5139999 A JP5139999 A JP 5139999A JP 13999993 A JP13999993 A JP 13999993A JP H06333991 A JPH06333991 A JP H06333991A
Authority
JP
Japan
Prior art keywords
cutting tool
film carrier
burrs
cutting
layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5139999A
Other languages
Japanese (ja)
Inventor
Shigenori Tokunaga
重則 徳永
Hidenori Furukawa
秀範 古川
Haruo Kato
春雄 加藤
Akio Takahashi
昭雄 高橋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JNC Corp
Original Assignee
Chisso Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Chisso Corp filed Critical Chisso Corp
Priority to JP5139999A priority Critical patent/JPH06333991A/en
Publication of JPH06333991A publication Critical patent/JPH06333991A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To remove such burrs as to become a hindrance in the lithography process at patterning or in positioning at I.L.B by diminishing burrs occurring at an opening or at the edge of a groove, using a cutting tool with a tapered peripheral edge. CONSTITUTION:The plastic deformation onto the surface of the tape of an organic insulator a, which occurs at the edge d of an aperture in cutting, is suppressed by making a taper e at the peripheral edge of the cutting tool. The manufacture of a film carrier substantially free of burrs become possible by suppressing the occurrence of large burrs by this action. For the taper angle thetaof the cutting tool, good result can be obtained at 30-80 deg.. Hereby, large burrs, which occur when using a conventional cutting tool, vanish, and a film carrier without a hindrance in lithography process at patterning or in positioning at I.L.B can be manufactured.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、半導体組立用フィルム
キャリアの製造方法に関する。
FIELD OF THE INVENTION The present invention relates to a method for manufacturing a film carrier for semiconductor assembly.

【0002】[0002]

【従来の技術】近年、電子機器は高機能化・軽薄短小化
が進められ、それに登載される半導体も高集積化・高機
能化が求められ、そのパッケージにも小型化・薄型化が
要求されている。この様な要求に対応すべく、フィルム
キャリアを用いたTAB(TapeAutomated Bonding )方
式による実装方法が広く用いられている。TAB方式に
用いられるフィルムキャリアには、金属導体層と有機絶
縁層のみからなる2層構造のフィルムキャリア、及び金
属導体層と有機絶縁層とを接着剤層を介して貼着した3
層構造のフィルムキャリアがある。
2. Description of the Related Art In recent years, electronic devices have been made highly functional, light, thin, short and small, and the semiconductors mounted on them have been required to be highly integrated and highly functional, and their packages are also required to be small and thin. ing. In order to meet such demands, a mounting method by a TAB (Tape Automated Bonding) method using a film carrier is widely used. On the film carrier used in the TAB method, a film carrier having a two-layer structure consisting of only a metal conductor layer and an organic insulating layer, and a metal conductor layer and an organic insulating layer were attached via an adhesive layer.
There are layered film carriers.

【0003】3層構造のフィルムキャリアは、有機絶縁
層における半導体素子の装着孔や、接続用リードの取り
出しの為のリードホール、及びまたは、組立実装時に用
いる位置決めホールその他の開孔部を、有機絶縁層に接
着剤を塗布した段階でプレス加工により形成し、しかる
後に金属導体層を貼付けるため、生産性に優れている
が、プレス用金型の製造に日数を要し、また、介在する
接着剤のために耐熱性が低くなる事や、含まれる不純物
塩素イオンのために実装された半導体装置の信頼性に欠
ける問題点を有している。2層構造のフィルムキャリア
は、アディティブ法やキャスティング法により、金属導
体層と有機絶縁層とが密着した状態で製造されており、
接着剤層がないために耐熱性や電気特性に優れ、3層品
と比べ高い信頼性を持っている。しかし、前記の開孔部
を形成する際は、金属導体層を残した状態で当該開孔部
分の有機絶縁層を除去する必要があるため、プレス加工
を用いる事が出来ない。
In a film carrier having a three-layer structure, a mounting hole for a semiconductor element in an organic insulating layer, a lead hole for taking out a connection lead, and / or a positioning hole used for assembling and mounting an opening portion are formed in an organic layer. It has excellent productivity because it is formed by pressing at the stage where the adhesive is applied to the insulating layer and then the metal conductor layer is attached, but it takes days to manufacture the pressing die, and it also intervenes. There is a problem in that the heat resistance is lowered due to the adhesive agent and the reliability of the mounted semiconductor device is lacked due to the contained impurity chlorine ions. The film carrier having a two-layer structure is manufactured by an additive method or a casting method in a state where the metal conductor layer and the organic insulating layer are in close contact with each other,
Since there is no adhesive layer, it has excellent heat resistance and electrical characteristics and has higher reliability than the three-layer product. However, when forming the above-mentioned opening portion, it is necessary to remove the organic insulating layer in the opening portion while leaving the metal conductor layer, and therefore press working cannot be used.

【0004】開孔部の形成方法としてはウエットエッチ
ング法やドライエッチング法、及びまたはレーザエッチ
ング法が挙げられる。ウエットエッチング法は、リソグ
ラフィ工程を必要とし、工程が長く、経済性に劣るほ
か、有機絶縁層の材質が限定される問題点を有してい
る。ドライエッチング法としては、スパッタ法やイオン
ミリング法が知られているが、いづれも高価で大がかり
な装置を必要とし、しかも、連続生産が困難で、経済性
や生産性、作業性に問題がある。近年、注目されている
レーザエッチング法は、熱による導体金属層の溶融破損
や、除去困難なカーボンの発生、付着の問題がある。
Examples of the method of forming the openings include a wet etching method, a dry etching method, and / or a laser etching method. The wet etching method requires a lithography process, requires a long process, is inferior in economic efficiency, and has a problem that the material of the organic insulating layer is limited. As a dry etching method, a sputtering method and an ion milling method are known, but each requires an expensive and large-scale device, and further, continuous production is difficult, and there is a problem in economical efficiency, productivity, and workability. . In recent years, the laser etching method, which has been attracting attention, has problems that the conductor metal layer is melted and damaged by heat, and carbon that is difficult to remove is generated and adhered.

【0005】以上のような問題点を有さない2層構造の
フィルムキャリアの製造方法としては本発明者等が発明
し、特開平2−161740号に開示している切削加工
による開孔部の形成方法がある。切削加工による開孔部
の形成はスピンドルに小径のザグリ用切削工具を取付け
た数値制御方式による加工機によって行われ、2層構造
のフィルムキャリアの製造が可能である他、様々な形状
の開孔部の形成が制御装置のプログラミングにより可能
であり、プレス用金型を必要としないことから、3層構
造のフィルムキャリアの製造においても少量の試作や短
期間での生産に利点を有している。
As a method for producing a film carrier having a two-layer structure which does not have the above problems, the inventors of the present invention invented the method for producing a hole portion formed by cutting as disclosed in JP-A-2-161740. There is a forming method. The formation of the opening by cutting is performed by a numerical control type processing machine with a small-diameter counterboring cutting tool attached to the spindle, and it is possible to manufacture a film carrier with a two-layer structure and various shapes of opening. Since the parts can be formed by programming the control device and a die for press is not required, it has an advantage in a small amount of trial manufacture and a short-term production even in the production of a film carrier having a three-layer structure. .

【0006】[0006]

【発明が解決しようとする課題】加工機の切削工具とし
て、プリント基板などのザグリや外周加工等に一般に用
いられている刃形状のものを使用すると、加工条件に関
係なく開孔部との境界をなす有機絶縁層上部に大きなバ
リが形成される。このバリはパターニング時にリソグラ
フィ工程での障害となるほか、半導体チップを実装する
I.L.B.(Inner Lead Bonding )時において位置合
わせの障害となる問題を有している。上記問題を解決す
るため、用いる切削工具を検討した結果、開孔部形成の
際、有機絶縁層表面に接する部分の外周刃にテーパを付
けたものを使用する事により、バリを抑制できることを
見いだし本発明に到達した。本発明はかかる背景下にな
されたものであり、2層構造のフィルムキャリア、及び
3層構造のフィルムキャリアを切削加工法によって製造
する際、パターニング時のリソグラフィ工程や、I.
L.B.時の位置合わせ時に障害となるようなバリのな
いフィルムキャリア製造方法を提供することをその目的
とする。
When a cutting tool having a blade shape which is generally used for counterboring a printed circuit board or peripheral cutting is used as a cutting tool for a processing machine, the boundary between the opening and the opening is irrelevant regardless of the processing conditions. A large burr is formed on the upper part of the organic insulating layer forming the. This burr not only interferes with the lithography process at the time of patterning but also I.V. for mounting a semiconductor chip. L. B. (Inner Lead Bonding) has a problem of hindering alignment. In order to solve the above problems, as a result of examining the cutting tool to be used, it was found that burr can be suppressed by using a tapered outer peripheral blade in contact with the surface of the organic insulating layer when forming the opening. The present invention has been reached. The present invention has been made in view of such a background, and when manufacturing a film carrier having a two-layer structure and a film carrier having a three-layer structure by a cutting method, a lithographic step at the time of patterning, an I.D.
L. B. It is an object of the present invention to provide a method for manufacturing a film carrier that does not have burrs that may interfere with time alignment.

【0007】[0007]

【課題を解決するための手段】本発明は、下記(1)お
よび(2)の構成を有する。 (1)金属導体層と有機絶縁層からなる、2層構造のフ
ィルムキャリアの製造方法において、半導体素子の装着
孔、接続用リードの取り出しの為のリードホール、及び
または、組立実装時に用いる位置決めホールその他の開
孔部若しくは溝を切削加工により形成する際、外周刃に
テーパを付けた切削工具を使用することにより、開孔部
や溝のエッジに発生するバリを減少させる事を特徴とす
るフィルムキャリアの製造方法。 (2)金属導体層と有機絶縁層を接着剤を用いて貼り合
わせた、3層構造のフィルムキャリアの製造方法におい
て、半導体素子の装着孔、接続用リードの取り出しの為
のリードホール、及びまたは、組立実装時に用いる位置
決めホールその他の開孔部若しくは溝を切削加工により
形成する際、外周刃にテーパを付けた切削工具を使用す
ることにより、開孔部や溝のエッジに発生するバリを減
少させる事を特徴とするフィルムキャリアの製造方法。
The present invention has the following configurations (1) and (2). (1) In a method of manufacturing a film carrier having a two-layer structure including a metal conductor layer and an organic insulating layer, a mounting hole for a semiconductor element, a lead hole for taking out a connection lead, and / or a positioning hole used during assembly and mounting. A film characterized by reducing burrs generated at the edges of openings or grooves by using a cutting tool with a tapered outer peripheral edge when forming other openings or grooves by cutting. Carrier manufacturing method. (2) In a method for producing a film carrier having a three-layer structure in which a metal conductor layer and an organic insulating layer are bonded together with an adhesive, a mounting hole for a semiconductor element, a lead hole for taking out a connection lead, and / or By using a cutting tool with a tapered outer peripheral edge when forming holes or grooves such as positioning holes used during assembly and mounting by cutting, burrs that occur at the edges of holes and grooves are reduced. A method for manufacturing a film carrier, which comprises:

【0008】本発明の構成と効果につき以下に詳述す
る。本発明において使用する切削工具の種類としてはテ
ーパ部分の位置により、次の2種類に分けられる。 (1)刃先から有機絶縁層上部までの切削すべき範囲以
上をテーパにしたもの。 (2)刃先から層の途中まではテーパを付けず、途中か
ら有機絶縁層上部までの切削すべき範囲以上をテーパに
したもの。 バリを抑制する効果は両方とも同じであるが、切削工具
の製作については(1)の方が容易にできる。上記
(1)と(2)に対応する構造の切削工具の例を図1と
図2に示す。図は切削工具の刃形状と2層テープをザグ
リ加工した際の断面形状を示しており、この刃の形状は
切削工具の刃数に影響されず、同様のバリ抑制効果を示
す。また、開孔部側面の断面形状は前記テーパの位置と
角度によって異なるため、製品の規格に合った形状の切
削工具を使用するが、テーパ角度は30゜〜80゜の物
が良い結果を得られる。
The structure and effect of the present invention will be described in detail below. The types of cutting tools used in the present invention are classified into the following two types depending on the position of the tapered portion. (1) A taper over the range to be cut from the cutting edge to the upper part of the organic insulating layer. (2) A taper is not applied from the cutting edge to the middle of the layer, but is tapered from the middle to the upper part of the organic insulating layer to be cut. The effects of suppressing burrs are the same, but the manufacturing of the cutting tool can be performed more easily in (1). An example of a cutting tool having a structure corresponding to the above (1) and (2) is shown in FIGS. 1 and 2. The figure shows the blade shape of the cutting tool and the cross-sectional shape when the two-layer tape is counterbored. The shape of this blade is not affected by the number of blades of the cutting tool and exhibits the same burr suppression effect. Also, since the cross-sectional shape of the side surface of the opening differs depending on the position and angle of the taper, use a cutting tool with a shape that conforms to the product standard, but a taper angle of 30 ° to 80 ° gives good results. To be

【0009】本発明で用いられる切削工具の使用方法は
今まで用いていた切削工具と変わりなく、保持方法や加
工条件等を変更する必要はない。上記の金属導体層の構
成材料としては、銅、アルミニウム、金、銀、鉄、錫、
鉛ないしはこれらの合金またはこれらをメッキしてなる
ものが挙げられる。有機絶縁層構成材料としては、ポリ
イミド樹脂、ポリエチレンテレフタレート樹脂、ガラス
強化エポキシ樹脂等が代表的であるがこの他にポリブチ
レンテレフタレート樹脂、ポリパラバン酸樹脂、ポリフ
ェニルスルフォン樹脂、ポリエーテルイミド樹脂、ポリ
エーテルケトン樹脂等が挙げられる。また、3層構造に
おける接着剤層構成材料としては、エポキシ系接着剤、
ポリイミド系接着剤、ウレタン系接着剤、アクリル系及
びメタクリル系接着剤、イソシアネート系接着剤等があ
げられる。切削工具の刃の構成材料としては、ハイス、
超硬合金、サーメット、セラミック及びこれらにチタン
化合物やダイヤモンド等を被覆したものや、単結晶ダイ
ヤモンド、焼結ダイヤモンド等が挙げられ、切削工具に
用いられている全ての材料のものが使用可能である。
The method of using the cutting tool used in the present invention is the same as that of the cutting tool used up to now, and it is not necessary to change the holding method, the processing conditions and the like. The constituent material of the metal conductor layer is copper, aluminum, gold, silver, iron, tin,
Examples thereof include lead, alloys thereof, and those obtained by plating these. Polyimide resin, polyethylene terephthalate resin, glass reinforced epoxy resin and the like are typical examples of the organic insulating layer constituent material, but in addition to these, polybutylene terephthalate resin, polyparabanic acid resin, polyphenylsulfone resin, polyetherimide resin, polyether. Examples include ketone resins. Further, as an adhesive layer constituent material in the three-layer structure, an epoxy adhesive,
Examples thereof include polyimide adhesives, urethane adhesives, acrylic and methacrylic adhesives, isocyanate adhesives, and the like. As the constituent material of the blade of the cutting tool, HSS,
Cemented carbides, cermets, ceramics and those coated with titanium compounds, diamonds, etc., single crystal diamonds, sintered diamonds, etc. can be used, and all materials used for cutting tools can be used. .

【0010】[0010]

【作用】切削工具の外周刃にテーパを付ける事により、
切削中に開孔部エッジで生じる有機絶縁物のテープ表面
上への塑性変形を抑え、この作用により大きなバリの発
生を抑制して、バリのほとんど無いフィルムキャリヤの
製造を可能とする。
[Operation] By tapering the outer peripheral edge of the cutting tool,
Plastic deformation of the organic insulating material on the tape surface, which occurs at the edge of the hole during cutting, is suppressed, and the generation of large burrs is suppressed by this action, enabling the production of a film carrier having almost no burrs.

【0011】[0011]

【実施例】2層構造のフィルムキャリヤの製造に際し、
本発明による切削工具を用いて加工した例を紹介する。
図3に45゜のテーパ角を有する切削工具による開孔部
の断面形状を示し、図4に従来用いていた切削工具によ
る開孔部の断面形状を示す。従来用いていた切削工具で
は開孔部エッジに根元厚さが10μmから50μm、高
さが10μm以上から1mmぐらいまである大きなバリ
が発生していたが、本発明におけるテーパ付きの切削工
具を用いる事で、発生するバリの大きさを5μm以下に
抑制する事ができた。
EXAMPLE When manufacturing a film carrier having a two-layer structure,
An example of machining using the cutting tool according to the present invention will be introduced.
FIG. 3 shows a cross-sectional shape of an opening portion formed by a cutting tool having a taper angle of 45 °, and FIG. 4 shows a cross-sectional shape of an opening portion formed by a conventionally used cutting tool. In the cutting tool used conventionally, a large burr having a root thickness of 10 μm to 50 μm and a height of 10 μm or more to about 1 mm was generated at the edge of the hole, but using the tapered cutting tool of the present invention Thus, the size of the burr generated could be suppressed to 5 μm or less.

【0012】[0012]

【発明の効果】本発明は、以上説明したように構成され
ているので、以下に記載されるような効果を奏する。切
削加工機にて有機絶縁層を切削除去してデバイスホール
等を開孔形成するフィルムキャリアの製造方法におい
て、従来知られている切削工具を使用した際に生じる大
きなバリの発生がなく、パターニングの際のリソグラフ
ィ工程やI.L.B.時の位置合わせに障害のないフィ
ルムキャリアを製造することができる。
Since the present invention is constructed as described above, it has the following effects. In the method of manufacturing a film carrier in which the organic insulating layer is cut and removed by a cutting machine to form device holes and the like, there is no large burr generated when a conventionally known cutting tool is used, and patterning can be performed. Lithography process and I.V. L. B. It is possible to manufacture a film carrier that does not hinder time alignment.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明に係る切削工具の構造の例示。FIG. 1 is an illustration of a structure of a cutting tool according to the present invention.

【図2】本発明に係る切削工具の構造の他の例示。FIG. 2 is another example of the structure of the cutting tool according to the present invention.

【図3】本発明に係る切削工具による開孔部の断面形
状。
FIG. 3 is a cross-sectional shape of an opening portion formed by the cutting tool according to the present invention.

【図4】公知の切削工具で加工した際に発生するバリの
断面形状の例示。
FIG. 4 is a view showing an example of a cross-sectional shape of a burr that occurs when processed with a known cutting tool.

【符号の説明】[Explanation of symbols]

a 有機絶縁層 b 金属導体層 c 開孔部 d 開孔部エッジ e テーパ部 f バリ g バリの根元厚さ h バリの高さ θ テーパ角 a organic insulating layer b metal conductor layer c opening part d opening part edge e taper part f burr g burr root thickness h burr height θ taper angle

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 金属導体層と有機絶縁層からなる、2層
構造のフィルムキャリアの製造方法において、半導体素
子の装着孔、接続用リードの取り出しの為のリードホー
ル、及びまたは、組立実装時に用いる位置決めホールそ
の他の開孔部若しくは溝を切削加工により形成する際、
外周刃にテーパを付けた切削工具を使用することによ
り、開孔部や溝のエッジに発生するバリを減少させる事
を特徴とするフィルムキャリアの製造方法。
1. A method for producing a film carrier having a two-layer structure comprising a metal conductor layer and an organic insulating layer, which is used for mounting holes for semiconductor elements, lead holes for taking out leads for connection, and / or for assembly and mounting. When forming positioning holes and other openings or grooves by cutting,
A method for manufacturing a film carrier, characterized in that by using a cutting tool having a tapered outer peripheral edge, burrs generated at the edges of holes and grooves are reduced.
【請求項2】 金属導体層と有機絶縁層を接着剤を用い
て貼り合わせた、3層構造のフィルムキャリアの製造方
法において、半導体素子の装着孔、接続用リードの取り
出しの為のリードホール、及びまたは、組立実装時に用
いる位置決めホールその他の開孔部若しくは溝を切削加
工により形成する際、外周刃にテーパを付けた切削工具
を使用することにより、開孔部や溝のエッジに発生する
バリを減少させる事を特徴とするフィルムキャリアの製
造方法。
2. A method of manufacturing a film carrier having a three-layer structure in which a metal conductor layer and an organic insulating layer are bonded together by using an adhesive, a mounting hole for a semiconductor element, a lead hole for taking out a connection lead, And / or, when forming a positioning hole or other openings or grooves used during assembly and mounting by cutting, use a cutting tool with a tapered outer peripheral edge to allow burrs to occur at the edges of the openings or grooves. A method for producing a film carrier, which comprises reducing
JP5139999A 1993-05-19 1993-05-19 Manufacture of film carrier Pending JPH06333991A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5139999A JPH06333991A (en) 1993-05-19 1993-05-19 Manufacture of film carrier

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5139999A JPH06333991A (en) 1993-05-19 1993-05-19 Manufacture of film carrier

Publications (1)

Publication Number Publication Date
JPH06333991A true JPH06333991A (en) 1994-12-02

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
JP5139999A Pending JPH06333991A (en) 1993-05-19 1993-05-19 Manufacture of film carrier

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Country Link
JP (1) JPH06333991A (en)

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