JPH0633297A - Electroforming method - Google Patents

Electroforming method

Info

Publication number
JPH0633297A
JPH0633297A JP18697692A JP18697692A JPH0633297A JP H0633297 A JPH0633297 A JP H0633297A JP 18697692 A JP18697692 A JP 18697692A JP 18697692 A JP18697692 A JP 18697692A JP H0633297 A JPH0633297 A JP H0633297A
Authority
JP
Japan
Prior art keywords
metal layer
ceramic body
metallized
plating
recess
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP18697692A
Other languages
Japanese (ja)
Other versions
JP2948988B2 (en
Inventor
Junichi Niitome
順一 新留
Harumi Takeoka
治己 竹岡
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kyocera Corp
Original Assignee
Kyocera Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kyocera Corp filed Critical Kyocera Corp
Priority to JP18697692A priority Critical patent/JP2948988B2/en
Publication of JPH0633297A publication Critical patent/JPH0633297A/en
Application granted granted Critical
Publication of JP2948988B2 publication Critical patent/JP2948988B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

PURPOSE:To effectively prevent the discoloration and elution of a plating metal layer by depositing a plating metal layer on a metallizing metal layer deposited on the inner surface of the recess of a ceramic body to completely cover the surface of the metallizing metal layer and eliminating the battery action and crevice corrosion of the plating metal layer. CONSTITUTION:The ceramic body 1' with the diameter of the opening increased outward, having a recess 2' and with the inner surface coated with a metallizing metal layer 4' is prepared, the ceramic body 1' is dipped in a plating soln. 8, then an electric field is impressed on the metallizing metal layer 4', and plating metal layers 6 and 7 are deposited on the outer surface of the metallizing metal layer 4'.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は電解メッキ方法に関し、
より詳細にはセラミック体の凹部内表面に被着させたメ
タライズ金属層の外表面にメッキ金属層を電解メッキに
より層着させる方法の改良に関するものである。
The present invention relates to an electrolytic plating method,
More specifically, the present invention relates to an improvement in a method for depositing a plated metal layer on the outer surface of a metallized metal layer deposited on the inner surface of a recess of a ceramic body by electrolytic plating.

【0002】[0002]

【従来の技術】従来、半導体素子、特に半導体集積回路
素子を収容するための半導体素子収納用パッケージは図
3に示すようにアルミナセラミックス等の電気絶縁材料
から成り、その上面略中央部に半導体素子を収容するた
めのキャビティA及び該キャビティA周辺より側面を介
し底面にかけて導出されたタングステン、モリブデン、
マンガン等の高融点金属粉末から成る複数個のメタライ
ズ金属層12を有するセラミック製絶縁基体11と蓋体13と
から構成されており、絶縁基体11のキャビティA底面に
半導体素子14をガラス、樹脂、ロウ材等の接着剤を介し
て固定するとともに該半導体素子14の各電極をメタライ
ズ金属層12にボンディングワイヤ15を介して電気的に接
続し、しかる後、絶縁基体11の上面に蓋体13をガラス、
樹脂、ロウ材等の封止材を介して接合させ、絶縁基体11
と蓋体13とから成る容器内部に半導体素子14を気密に収
容することによって製品としての半導体装置となる。
2. Description of the Related Art Conventionally, a semiconductor element housing package for housing a semiconductor element, particularly a semiconductor integrated circuit element, is made of an electrically insulating material such as alumina ceramics, as shown in FIG. A cavity A for accommodating the above, and tungsten, molybdenum led out from the periphery of the cavity A through the side surface to the bottom surface
It is composed of a ceramic insulating base 11 having a plurality of metallized metal layers 12 made of high melting point metal powder such as manganese, and a lid 13. A semiconductor element 14 is provided on the bottom surface of the cavity A of the insulating base 11 with a glass, resin, It is fixed via an adhesive such as a brazing material, and each electrode of the semiconductor element 14 is electrically connected to the metallized metal layer 12 via a bonding wire 15, and then a lid 13 is placed on the upper surface of the insulating base 11. Glass,
Insulating substrate 11 is bonded through a sealing material such as resin or brazing material.
A semiconductor device as a product is obtained by hermetically housing the semiconductor element 14 in a container composed of a lid 13 and a lid 13.

【0003】尚、前記半導体素子収納用パッケージはメ
タライズ金属層12を外部電気回路基板にロウ付けする
際、そのロウ付け強度を上げるために、またメタライズ
金属層12が酸化腐食するのを有効に防止するために、通
常、前記メタライズ金属層12の露出表面にはニッケル及
び金から成るメッキ金属層16、17が電解メッキ方法によ
り順次層着されている。
In the package for housing a semiconductor element, when the metallized metal layer 12 is brazed to an external electric circuit board, the brazed strength is increased and the metallized metal layer 12 is effectively prevented from being oxidized and corroded. In order to do so, usually, the exposed metal surface of the metallized metal layer 12 is sequentially plated with plated metal layers 16 and 17 made of nickel and gold by an electrolytic plating method.

【0004】かかる従来の半導体素子収納用パッケージ
はその絶縁基体11が一般に、以下に述べる方法によって
製作される。
In the conventional package for accommodating semiconductor elements, the insulating substrate 11 is generally manufactured by the method described below.

【0005】即ち、図4 に示すように、まず3 枚の広面
積の未焼成セラミックシート( セラミックグリーンシー
ト)21 、22、23を準備し、シート22、23の表面及びシー
ト22、23に設けた貫通孔24の内表面全面に金属ペースト
25を印刷塗布する。
That is, as shown in FIG. 4, first, three large-area unfired ceramic sheets (ceramic green sheets) 21, 22, and 23 are prepared, and provided on the surfaces of the sheets 22 and 23 and the sheets 22 and 23. Metal paste on the entire inner surface of the through hole 24
Apply 25 by printing.

【0006】次にこれらシート21、22、23を積層し、生
セラミック体26を得るとともに高温で焼成し、焼成セラ
ミック体26' 及びメタライズ金属層12を形成する。
Next, these sheets 21, 22 and 23 are laminated to obtain a raw ceramic body 26 and fired at a high temperature to form a fired ceramic body 26 'and a metallized metal layer 12.

【0007】そして次に、前記焼成セラミック体26' を
メッキ液中に浸漬するとともにメタライズ金属層12に電
界を印加し、メタライズ金属層12の露出表面に電解メッ
キによりニッケル及び金のメッキ金属層を順次層着さ
せ、最後に貫通孔24の配列による区分線Bに沿って焼成
セラミック体26' を切断分離し、これによって多数個の
絶縁基体11が一度に製作される。
Then, the fired ceramic body 26 'is dipped in a plating solution and an electric field is applied to the metallized metal layer 12 to form a nickel and gold plated metal layer on the exposed surface of the metallized metal layer 12 by electrolytic plating. The layers are sequentially layered, and finally the fired ceramic body 26 'is cut and separated along the dividing line B formed by the arrangement of the through holes 24, whereby a large number of insulating substrates 11 are manufactured at one time.

【0008】[0008]

【発明が解決しようとする課題】しかしながら、この従
来の方法によれば焼成セラミック体26' に設けたメタラ
イズ金属層12の外表面に電解メッキ方法によりニッケル
メッキ金属層16及び金メッキ金属層17を層着させる場
合、貫通孔24の内表面にあるメタライズ金属層12には該
貫通孔24の一方が塞がれ凹部状となっており、貫通孔24
内におけるメッキ液の循環が極めて悪いことから、メッ
キ金属層16、17を完全に層着させることができず、メタ
ライズ金属層16、17の各々が露出した状態となってしま
う。そのためこの露出部に大気中に含まれる水分が付着
すると該水分がニッケルメッキ金属層16及び金メッキ金
属層17に接触して電解質として働き、ニッケルメッキ金
属層16と金メッキ金属層17との間に両金属のエネルギー
準位の相違から電流が流れる電池作用を生じてエネルギ
ー準位が低いニッケルメッキ金属層16を徐々に溶出さ
せ、隣接するメタライズ金属層12間を短絡させてしまう
という欠点を有していた。
However, according to this conventional method, the nickel-plated metal layer 16 and the gold-plated metal layer 17 are formed on the outer surface of the metallized metal layer 12 provided on the fired ceramic body 26 'by the electrolytic plating method. In the case of attachment, one of the through holes 24 is closed in the metallized metal layer 12 on the inner surface of the through hole 24 to form a concave shape.
Since the circulation of the plating solution in the inside is extremely poor, the plating metal layers 16 and 17 cannot be completely deposited, and the metallized metal layers 16 and 17 are exposed. Therefore, when the water contained in the atmosphere adheres to this exposed portion, the water comes into contact with the nickel-plated metal layer 16 and the gold-plated metal layer 17 and acts as an electrolyte. Due to the difference in the energy levels of the metals, a battery action in which an electric current flows is caused to gradually elute the nickel-plated metal layer 16 having a low energy level, which causes a short circuit between the adjacent metalized metal layers 12. It was

【0009】また同時に、ニッケルメッキ金属層16の一
部に水分が付着するとニッケルメッキ金属層16に酸素濃
度の相違によるすきま腐食作用を発生し、ニッケルメッ
キ金属層16に酸化物( 錆) を形成して変色させることが
ある。またこの酸化物は導電性で、且つ拡散し易いとい
う性質を有していることから、該酸化物の拡散により隣
接するメタライズ金属層12間が短絡し、その結果、半導
体装置としての機能に支障を来すという重大な欠点を誘
発する。
At the same time, when water adheres to a part of the nickel-plated metal layer 16, a crevice corrosion action occurs in the nickel-plated metal layer 16 due to the difference in oxygen concentration, and an oxide (rust) is formed on the nickel-plated metal layer 16. May cause discoloration. Further, since this oxide is conductive and has a property of being easily diffused, the metallized metal layers 12 adjacent to each other are short-circuited by the diffusion of the oxide, and as a result, the function as a semiconductor device is hindered. Induces the serious drawback of coming.

【0010】[0010]

【発明の目的】本発明は上記欠点に鑑み案出されたもの
で、その目的はセラミック体の凹部内表面に被着させた
メタライズ金属層に、該メタライズ金属層の表面を完全
に覆う如くメッキ金属層を層着させ、メッキ金属層に電
池作用やすきま腐食作用が発生するのを皆無としてメッ
キ金属層に変色や溶出が生じるのを有効に防止すること
ができる電解メッキ方法を提供することにある。
SUMMARY OF THE INVENTION The present invention has been devised in view of the above-mentioned drawbacks, and its object is to plate a metallized metal layer deposited on the inner surface of a recess of a ceramic body so as to completely cover the surface of the metallized metal layer. To provide an electrolytic plating method in which a metal layer is layered, and the plated metal layer is prevented from causing a battery action or a crevice corrosion effect, and can effectively prevent discoloration or elution from occurring in the plated metal layer. is there.

【0011】[0011]

【課題を解決するための手段】本発明の電解メッキ方法
は外側に向かって開口径が大きくなり、内表面にメタラ
イズ金属層が被着された凹部を有するセラミック体を準
備し、次に前記セラミック体をメッキ液中に浸漬させ、
しかる後、前記メタライズ金属層に電界を印加し、メタ
ライズ金属層の外表面にメッキ金属層を層着させること
を特徴とするものである。
According to the electrolytic plating method of the present invention, a ceramic body having a recess having an opening diameter increasing toward the outside and having a metallized metal layer deposited on the inner surface is prepared. Immerse your body in the plating solution,
After that, an electric field is applied to the metallized metal layer to deposit a plated metal layer on the outer surface of the metallized metal layer.

【0012】[0012]

【実施例】次に本発明の電解メッキ方法を図1 及び図2
に示す半導体素子収納用パッケージの製造法に適用した
場合を例に採って説明する。
EXAMPLE Next, the electrolytic plating method of the present invention will be described with reference to FIGS.
A case where the method is applied to the manufacturing method of the package for accommodating a semiconductor element shown in FIG.

【0013】まず図1(a)(b) に示す如く、第1 、第2 及
び第3 の3 枚の未焼成セラミックシート( セラミックグ
リーンシート)1a 、1b、1cから構成される生セラミック
体1を準備する。
First, as shown in FIGS. 1 (a) and 1 (b), a green ceramic body 1 composed of three unfired ceramic sheets (ceramic green sheets) 1a, 1b and 1c, which are a first, a second and a third. To prepare.

【0014】前記各未焼成セラミックシート1a、1b、1c
はアルミナ(Al 2 O 3 ) 、シリカ(SiO2 ) 、マグネシア
(MgO) 、カルシア(CaO) 等のセラミック原料粉末に適当
な有機溶剤、溶媒を添加混合して泥漿物を作り、これを
従来周知のドクターブレード法等によりシート状と成す
ことによって形成される。
Each of the unfired ceramic sheets 1a, 1b, 1c
Is alumina (Al 2 O 3 ), silica (SiO 2 ), magnesia
It is formed by adding a suitable organic solvent and a solvent to a ceramic raw material powder such as (MgO) 2 or calcia (CaO 2) and mixing them to form a slurry, which is formed into a sheet by a conventionally known doctor blade method or the like.

【0015】また前記未焼成セラミックシート1b、1cに
は該各シート1b、1cを複数の区画に区分する如く多数の
貫通孔2b、2cが配列形成されており、該貫通孔2b、2cは
広面積の未焼成セラミックシート1b、1cを所望するセラ
ミック絶縁基体に対応した形状の複数の区画に区分する
とともに後述するメタライズリード用の金属層を引き回
す通路として使用される。
Further, a large number of through holes 2b, 2c are formed in the unfired ceramic sheets 1b, 1c so as to divide the respective sheets 1b, 1c into a plurality of sections, and the through holes 2b, 2c are wide. The unfired ceramic sheets 1b, 1c having the area are divided into a plurality of sections having a shape corresponding to a desired ceramic insulating substrate, and are used as a passage for routing a metal layer for a metallized lead described later.

【0016】尚、前記貫通孔2b、2cは従来周知の打ち抜
き加工法によって未焼成セラミックシート1b、1cに形成
され、未焼成セラミックシート1cに形成される貫通孔2c
は未焼成セラミックシート1bに形成される貫通孔2bより
も開口径が若干大きなものとなっている。
The through holes 2b and 2c are formed in the unfired ceramic sheets 1b and 1c by a conventionally known punching method, and the through holes 2c formed in the unfired ceramic sheet 1c.
Has an opening diameter slightly larger than that of the through hole 2b formed in the unfired ceramic sheet 1b.

【0017】また前記第1 及び第2 の未焼成セラミック
シート1a、1bには貫通孔2b、2cの配列による区分線Cに
よって囲まれた各領域の略中央部に半導体素子を収容す
るためのキャビティを形成する空所を有しており、該空
所も従来周知の打ち抜き加工法によって形成される。
Further, in the first and second unfired ceramic sheets 1a and 1b, a cavity for accommodating a semiconductor element is formed in a substantially central portion of each region surrounded by a section line C formed by an array of through holes 2b and 2c. Is formed by a punching method which is well known in the art.

【0018】前記第2の未焼成セラミックシート1bには
その上面から貫通孔2bの内表面にかけてメタライズリー
ド用金属層4aが印刷塗布されており、また第3 の未焼成
セラミックシート1cにはその上面の略中央部に半導体素
子を取着するためのダイアタッチ用金属層5 が、貫通孔
2cの内表面から下面にかけてメタライズリード用金属層
4bがそれぞれ印刷塗布されている。
A metallized lead metal layer 4a is printed and applied on the second unfired ceramic sheet 1b from the upper surface to the inner surface of the through hole 2b, and the upper surface of the third unfired ceramic sheet 1c is coated. The metal layer 5 for die attachment for attaching the semiconductor element to the through hole
Metal layer for metallized leads from the inner surface to the lower surface of 2c
4b is printed and applied.

【0019】前記メタライズリード用金属層4a、4b及び
ダイアタッチ用金属層5 はタングステン(W) 、モリブデ
ン(Mo)、マンガン(Mn)等の高融点金属粉末に適当な有機
溶剤、溶媒を添加混合し、ペースト状となした金属ペー
ストを従来周知のスクリーン印刷法を採用することによ
って未焼成セラミックシート1b、1cのそれぞれに印刷塗
布される。
The metallized lead metal layers 4a and 4b and the die attach metal layer 5 are formed by adding a suitable organic solvent or solvent to a refractory metal powder such as tungsten (W), molybdenum (Mo), or manganese (Mn). Then, the paste-like metal paste is printed and applied to each of the unfired ceramic sheets 1b and 1c by adopting a conventionally known screen printing method.

【0020】前記3 枚の未焼成セラミックシート1a、1
b、1cは各貫通孔2b、2cの中心位置を正確に合わせて順
次積層され、約150 ℃に加熱したホットプレス機によっ
て熱圧着させて生セラミック体1 が作成される。
The above three unfired ceramic sheets 1a, 1
The b and 1c are sequentially laminated by precisely aligning the center positions of the through holes 2b and 2c, and thermocompression-bonded by a hot press machine heated to about 150 ° C. to produce the raw ceramic body 1.

【0021】次に前記生セラミック体1 を還元雰囲気中
(H2 -N2 ガス中) 、約1400〜1600℃の温度で焼成し、生
セラミック体1 とメタライズリード用金属層4a、4b及び
ダイアタッチ用金属層5 とを焼結一体化させ、図1(c)に
示す如く、一方が塞がれている貫通孔( 凹部)2' の内表
面を介して外部に導出されるメタライズ金属層4'とダイ
アタッチ金属層5'とを有する焼成セラミック体1'を得
る。
Next, the green ceramic body 1 is placed in a reducing atmosphere.
(In H 2 -N 2 gas) at a temperature of approximately 1400 to 1600 ° C. to sinter the raw ceramic body 1, the metallized lead metal layers 4 a and 4 b, and the die attach metal layer 5 into a single body, As shown in 1 (c), a fired ceramic having a metallized metal layer 4 ′ and a die attach metal layer 5 ′ that are led to the outside through the inner surface of a through hole (recess) 2 ′ that is closed on one side. Get body 1 '.

【0022】尚、前記焼成セラミック体1'は未焼成セラ
ミックシート1cに設けた貫通孔2cの開口径が未焼成セラ
ミックシート1bに設けた貫通孔2bの開口径より若干大き
なものとなっているため凹部2'の開口径は外側( 下面)
に向かって大きなものとなっている。
In the fired ceramic body 1 ', the opening diameter of the through hole 2c provided in the unfired ceramic sheet 1c is slightly larger than the opening diameter of the through hole 2b provided in the unfired ceramic sheet 1b. Opening diameter of recess 2'is outside (bottom surface)
Is getting bigger towards.

【0023】そして次に、図1(c)に示す如く、メタライ
ズ金属層4'及びダイアタッチ金属層5'の外表面にニッケ
ル(Ni)及び金(Au)から成るメッキ金属層6 、7 を順次層
着させる。このメッキ金属層6 、7 はメタライズ金属層
4'及びダイアタッチ金属層5'が酸化腐食するのを防止す
る作用を為すとともにメタライズ金属層4'と外部電気回
路基板とをロウ付けする際、あるいはダイアタッチ金属
層5'と半導体素子をロウ付けする際、メタライズ金属層
4'及びダイアタッチ金属層5'とロウ材との濡れ性を改善
して接合強度を上げる作用を為す。
Then, as shown in FIG. 1 (c), plated metal layers 6 and 7 made of nickel (Ni) and gold (Au) are formed on the outer surfaces of the metallized metal layer 4'and the die attach metal layer 5 '. Layer in order. This plated metal layer 6, 7 is a metallized metal layer
4'and the die attach metal layer 5'have the function of preventing oxidative corrosion, and when the metallized metal layer 4'and the external electric circuit board are brazed, or the die attach metal layer 5'and the semiconductor element are brazed. When applying, metallized metal layer
4 ′ and the die attach metal layer 5 ′ and the brazing material are improved in wettability to increase the bonding strength.

【0024】前記焼成セラミック体1'に設けたメタライ
ズ金属層4'及びダイアタッチ金属層5'へのメッキ金属層
6 、7 の層着は図2 に示すようにメッキ液( ニッケルメ
ッキ液あるいは金メッキ液)8中に焼成セラミック体1'を
浸漬するとともにメタライズ金属層4'及びダイアタッチ
金属層5'に電界を印加することによって行われる。尚、
この場合、焼成セラミック体1'に形成された凹部2'の開
口径は外側( 下面) に向かって大きくなっていることか
ら凹部2'におけるメッキ液8 の循環が良くなり、その結
果、セラミック体1'の凹部2'内表面に被着されているメ
タライズ金属層4'の表面にメッキ金属層6 、7 を均一厚
みで、且つメタライズ金属層4'を完全に覆う如く層着す
ることが可能となる。
Metallized metal layer 4'provided on the fired ceramic body 1'and plated metal layer on the die attach metal layer 5 '
As shown in Fig. 2, the layers 6 and 7 were deposited by immersing the fired ceramic body 1'in a plating solution (nickel plating solution or gold plating solution) 8 and applying an electric field to the metallized metal layer 4'and the die attach metal layer 5 '. It is performed by applying. still,
In this case, since the opening diameter of the recess 2'formed in the fired ceramic body 1'becomes larger toward the outside (lower surface), circulation of the plating liquid 8 in the recess 2'is improved, and as a result, the ceramic body is It is possible to deposit the plated metal layers 6 and 7 on the surface of the metallized metal layer 4'applied to the inner surface of the recess 2'of 1'with a uniform thickness and so as to completely cover the metallized metal layer 4 '. Becomes

【0025】また前記メッキ液8 は、例えばニッケルメ
ッキ液の場合、液8 の組成が硫酸ニッケル180 〜300 グ
ラム/ リットル、塩化ニッケル30〜60グラム/ リット
ル、ホウ素20〜60グラム/ リットルから成り、液中に焼
成セラミック体1'を浸漬し、メタライズ金属層4'及びダ
イアタッチ金属層5'に電流密度が2 〜4A/dm 2 となるよ
うな電界を約3 分間印加することによってメタライズ金
属層4'及びダイアタッチ金属層5'の表面にニッケルメッ
キ層6 が層着される。
The plating solution 8 is, for example, in the case of a nickel plating solution, the composition of the solution 8 is nickel sulfate 180 to 300 g / liter, nickel chloride 30 to 60 g / liter, and boron 20 to 60 g / liter, The calcined ceramic body 1'is dipped in the liquid and an electric field is applied to the metallized metal layer 4'and the die attach metal layer 5'for a current density of 2 to 4 A / dm 2 for about 3 minutes. A nickel plating layer 6 is deposited on the surfaces of 4'and the die attach metal layer 5 '.

【0026】そして最後に、前記焼成セラミック体1'を
図1(c)に示す貫通孔の配列による区分線Cに沿って切断
し、個々のセラミック絶縁基体に分離することによって
製品としての半導体素子収納用パッケージが完成する。
Finally, the fired ceramic body 1'is cut along the division line C by the arrangement of the through holes shown in FIG. 1 (c) to separate it into individual ceramic insulating substrates, thereby producing a semiconductor device as a product. The storage package is completed.

【0027】尚、本発明は上述の実施例に限定されるも
のではなく、本発明の要旨を逸脱しない範囲であれば種
々の変更は可能である。
The present invention is not limited to the above-mentioned embodiments, and various modifications can be made without departing from the gist of the present invention.

【0028】[0028]

【発明の効果】本発明の電解メッキ方法によればセラミ
ック体に設けた凹部の開口径を外側に向かって大きくし
たことから凹部内表面に被着させたメタライズ金属層に
電解メッキ方法によりメッキ金属層を層着させる際、凹
部内へのメッキ液の循環が良好となってメタライズ金属
層の表面にメッキ金属層を該メタライズ金属層を完全に
覆う如く層着させることが可能となり、その結果、メッ
キ金属層に電池作用や隙間腐食作用に起因する変色や溶
出の発生を皆無となすことができる。
According to the electrolytic plating method of the present invention, since the opening diameter of the recess provided in the ceramic body is increased toward the outside, the metallized metal layer deposited on the inner surface of the recess is plated by the electrolytic plating method. When the layer is deposited, the circulation of the plating solution into the recess is improved, and the plating metal layer can be deposited on the surface of the metallized metal layer so as to completely cover the metallized metal layer. It is possible to prevent discoloration and elution from occurring in the plated metal layer due to the battery action and the crevice corrosion action.

【図面の簡単な説明】[Brief description of drawings]

【図1】(a)(b)(c)は本発明の電解メッキ方法
を用いて半導体素子収納用パッケージを製造する方法の
一実施例を示し、(a)は半導体素子収納用パッケージ
の焼成前の状態を示す部分分解斜視図、(b)は(a)
の積層した状態を示す部分断面図、(c)は(b)を焼
成した後の状態を示す部分断面図である。
1 (a), (b) and (c) show an embodiment of a method for manufacturing a semiconductor device housing package using the electrolytic plating method of the present invention, and (a) shows firing of a semiconductor device housing package. Partial exploded perspective view showing the previous state, (b) is (a)
Is a partial cross-sectional view showing a laminated state, and (c) is a partial cross-sectional view showing a state after firing (b).

【図2】図1(c)に示すセラミック体に設けたメタラ
イズ金属層及びダイアタッチ金属層の表面にメッキ金属
層を層着させるためのメッキ装置の概略図である。
FIG. 2 is a schematic view of a plating apparatus for depositing a plating metal layer on the surfaces of the metallized metal layer and the die attach metal layer provided on the ceramic body shown in FIG. 1 (c).

【図3】従来の半導体素子収納用パッケージの断面図で
ある。
FIG. 3 is a cross-sectional view of a conventional semiconductor element housing package.

【図4】図3に示す半導体素子収納用パッケージの製造
方法を説明するための部分断面図である。
FIG. 4 is a partial cross-sectional view for explaining the method of manufacturing the semiconductor element housing package shown in FIG.

【符号の説明】[Explanation of symbols]

1’・・・セラミック体 2’・・・凹部 4’・・・メタライズ金属層 5’・・・ダイアタッチ金属層 6・・・・ニッケルメッキ金属層 7・・・・金メッキ金属層 8・・・・メッキ液 1 '... Ceramic body 2' ... Recessed portion 4 '... Metallized metal layer 5' ... Die attach metal layer 6 ... Nickel plated metal layer 7 ... Gold plated metal layer 8 ... ..Plating liquid

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】外側に向かって開口径が大きくなり、内表
面にメタライズ金属層が被着された凹部を有するセラミ
ック体を準備し、 次に前記セラミック体をメッキ液中に浸漬させ、 しかる後、前記メタライズ金属層に電界を印加し、メタ
ライズ金属層の外表面にメッキ金属層を層着させること
を特徴とする電解メッキ方法。
1. A ceramic body having a recess having an opening diameter increasing toward the outside and having a metallized metal layer deposited on the inner surface is prepared, and then the ceramic body is immersed in a plating solution, and thereafter, An electroplating method comprising applying an electric field to the metallized metal layer to deposit a plated metal layer on the outer surface of the metallized metal layer.
JP18697692A 1992-07-14 1992-07-14 Electroplating method Expired - Fee Related JP2948988B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18697692A JP2948988B2 (en) 1992-07-14 1992-07-14 Electroplating method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18697692A JP2948988B2 (en) 1992-07-14 1992-07-14 Electroplating method

Publications (2)

Publication Number Publication Date
JPH0633297A true JPH0633297A (en) 1994-02-08
JP2948988B2 JP2948988B2 (en) 1999-09-13

Family

ID=16198022

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18697692A Expired - Fee Related JP2948988B2 (en) 1992-07-14 1992-07-14 Electroplating method

Country Status (1)

Country Link
JP (1) JP2948988B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4847052A (en) * 1986-04-30 1989-07-11 Toshiba Ceramics Co., Ltd. Device for growing single crystals
US4849188A (en) * 1986-04-30 1989-07-18 Toshiba Ceramics Co., Ltd. Method of and device for growing single crystals

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4847052A (en) * 1986-04-30 1989-07-11 Toshiba Ceramics Co., Ltd. Device for growing single crystals
US4849188A (en) * 1986-04-30 1989-07-18 Toshiba Ceramics Co., Ltd. Method of and device for growing single crystals

Also Published As

Publication number Publication date
JP2948988B2 (en) 1999-09-13

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