JPH06331564A - Inspection apparatus of solder bonded part - Google Patents

Inspection apparatus of solder bonded part

Info

Publication number
JPH06331564A
JPH06331564A JP12399293A JP12399293A JPH06331564A JP H06331564 A JPH06331564 A JP H06331564A JP 12399293 A JP12399293 A JP 12399293A JP 12399293 A JP12399293 A JP 12399293A JP H06331564 A JPH06331564 A JP H06331564A
Authority
JP
Japan
Prior art keywords
light
solder joint
reflected
ring
diffusing plate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12399293A
Other languages
Japanese (ja)
Other versions
JP3156442B2 (en
Inventor
Toru Ishigame
徹 石亀
Toshihiko Omachi
敏彦 大町
Yoshiyuki Hashizume
義之 橋爪
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokogawa Electric Corp
Original Assignee
Yokogawa Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Electric Corp filed Critical Yokogawa Electric Corp
Priority to JP12399293A priority Critical patent/JP3156442B2/en
Publication of JPH06331564A publication Critical patent/JPH06331564A/en
Application granted granted Critical
Publication of JP3156442B2 publication Critical patent/JP3156442B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)

Abstract

PURPOSE:To realize the inspection apparatus, of a solder bonded part, which can inspect the solder bonded part of every shape by installing an illumination means by which the brightness of reflected light is changed according to the inclination angle of a reflecting position. CONSTITUTION:A ring-shaped light source 41 and a diffusing plate 42 are combined, and an illumination means 4 is constituted. In the illumination means 4, irradiation light from the ring-shaped light source 41 is incident from the edge of the diffusing plate 42, the incident light is totally reflected and diffusion-reflected on the inner face of the diffusing plate 42, and the brightness of light radiated to the outside from the diffusing plate 42 is attenuated along the length direction of the diffusing plate. A solder bonded part is irradiated with light radiated from the inner circumferential face of the diffusing plate 42 out of light advancing in this manner. At this time, the brightness of reflected light which is reflected by the solder bonded part and which advances to the length direction of the diffusing plate is changed continuously according to the inclination angle of a reflecting position. When the image of the reflected light is picked up by an image sensing means 5, light and shade information on a picked-up image is used as information on the inclination angle. Consequently, the three-dimensional shape of the solder bonded part is detected on the basis of the light and shade information, and it is judged whether a defect exists or not in the solder bonded part.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、プリント基板上に形成
された半田接合部の外観形状を検出することにより、半
田接合部に欠陥があるかどうかを検査する半田接合部の
検査装置に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a solder joint inspection device for detecting whether or not a solder joint is defective by detecting the external shape of the solder joint formed on a printed circuit board. Is.

【0002】[0002]

【従来の技術】従来における半田接合部の検査装置に
は、照明装置を用いたものがあった。すなわち、照射角
度が異なる複数個の照明を設け、検査対象面である半田
接合部の形状に応じて、点灯する照明の組み合わせを変
え、または、各照明を時分割で点灯させ、各点灯状態に
おいて映し出される半田接合部の画像を撮影し、撮影画
像から半田接合部の立体形状を検出していた。そして、
検出した立体形状をもとに半田接合部に欠陥があるかど
うかを判別する。このような、検査装置は、例えば、特
開昭61−293657号公報、特開平1−21954
7号公報、特開平1−282410号公報、特開平2−
67949号公報、特開平3−103706号公報等に
開示されている。
2. Description of the Related Art Some conventional solder joint inspection devices use an illuminating device. That is, a plurality of illuminations with different irradiation angles are provided, the combination of the illuminations that are turned on is changed according to the shape of the solder joint that is the surface to be inspected, or each illumination is turned on in a time-sharing manner, and in each lighting state. An image of the solder joint portion displayed was photographed, and the three-dimensional shape of the solder joint portion was detected from the photographed image. And
Based on the detected three-dimensional shape, it is determined whether or not there is a defect in the solder joint. Such an inspection apparatus is disclosed in, for example, Japanese Patent Application Laid-Open No. 61-293657 and Japanese Patent Application Laid-Open No. 1-21954.
No. 7, Japanese Patent Laid-Open No. 1-282410, No. 2-
No. 67949, Japanese Patent Laid-Open No. 3-103706, and the like.

【0003】しかし、半田接合部等のように比較的不定
形な形状に対しては、点灯する照明の組み合わせが無数
に必要になるため、上述した従来例では限られた形状の
半田接合部にしか適用できなかった。
However, in the case of a relatively irregular shape such as a solder joint, an infinite number of combinations of lightings are required. Therefore, in the above-mentioned conventional example, the solder joint having a limited shape is used. Only applicable.

【0004】[0004]

【発明が解決しようとする課題】本発明はこのような問
題点を解決するためになされたものであり、反射位置の
傾斜角に応じて反射光の輝度が連続的に変化する照明手
段を設けることにより、あらゆる形状の半田接合部に対
しても検査を行うことができる半田接合部の検査装置を
実現することを目的とする。
SUMMARY OF THE INVENTION The present invention has been made to solve such a problem, and is provided with an illumination means in which the brightness of reflected light continuously changes according to the tilt angle of the reflection position. Accordingly, it is an object of the present invention to realize a solder joint inspection device capable of inspecting solder joints of any shape.

【0005】[0005]

【課題を解決するための手段】本発明は、プリント基板
上に形成された半田接合部の欠陥の有無を外観上から検
査する半田接合部の検査装置において、リング形光源と
拡散板を有し、前記拡散板は円筒形を成し前記リング形
光源の内側に配置されていて、リング形光源の照射光を
拡散板の端面より入光し、入光した光に拡散板の内面を
全反射及び拡散反射させ、拡散板から外界に出射する光
の輝度を拡散板の長さ方向に沿って減衰させていき、拡
散板の内周面から出射した光を前記半田接合部に照射
し、半田接合部で反射されて拡散板の長さ方向に進む反
射光の輝度を反射位置の傾斜角に応じて連続的に変化さ
せる照明手段と、拡散板の長さ方向に進む反射光を受け
て半田接合部の反射光像を撮像する撮像手段と、この撮
像手段の撮像画像から半田接合部の立体形状を検出し、
検出した形状から半田接合部の欠陥の有無を判定する判
定部と、を具備したことを特徴とする半田接合部の検査
装置である。
SUMMARY OF THE INVENTION The present invention is a solder joint inspection device for visually inspecting a solder joint formed on a printed circuit board for defects. The solder joint inspection device has a ring-shaped light source and a diffusion plate. The diffuser plate has a cylindrical shape and is arranged inside the ring-shaped light source. The light emitted from the ring-shaped light source is incident from the end surface of the diffuser plate, and the incident light is totally reflected on the inner surface of the diffuser plate. And diffusely reflect the light emitted from the diffuser plate to the outside to attenuate the brightness along the length direction of the diffuser plate, irradiate the light emitted from the inner peripheral surface of the diffuser plate to the solder joint portion, and solder. Lighting means for continuously changing the brightness of the reflected light reflected by the joint portion and traveling in the length direction of the diffuser plate according to the inclination angle of the reflection position, and solder receiving the reflected light traveling in the length direction of the diffuser plate An image pickup means for picking up a reflected light image of the joint part and an image picked up by this image pickup means Detecting a three-dimensional shape of the solder joint,
A solder joint inspection device, comprising: a determination unit that determines the presence or absence of a defect in the solder joint based on the detected shape.

【0006】[0006]

【作用】このような本発明では、リング形光源と拡散板
を組み合わせて照明手段を構成する。この照明手段で
は、リング形光源の照射光を拡散板の端面より入光し、
入光した光に拡散板の内面を全反射及び拡散反射させ、
拡散板から外界に出射する光の輝度を拡散板の長さ方向
に沿って減衰させていく。このように進む光の中で拡散
板の内周面から出射した光を半田接合部に照射する。こ
のとき、半田接合部で反射されて拡散板の長さ方向に進
む反射光の輝度は反射位置の傾斜角に応じて連続的に変
化する。この反射光像を撮像手段で撮像すると、撮像画
像の濃淡情報が傾斜角情報になる。従って、濃淡情報を
もとに半田接合部の立体形状を検出し、半田接合部の欠
陥の有無を判定する。
In the present invention as described above, the illumination means is constructed by combining the ring type light source and the diffusion plate. In this illumination means, the light emitted from the ring-shaped light source is incident from the end surface of the diffusion plate,
The incident light is totally and diffusely reflected on the inner surface of the diffusion plate,
The brightness of the light emitted from the diffusion plate to the outside is attenuated along the length direction of the diffusion plate. Of the light traveling in this way, the light emitted from the inner peripheral surface of the diffusion plate is applied to the solder joint. At this time, the brightness of the reflected light reflected by the solder joint portion and traveling in the length direction of the diffuser plate continuously changes according to the inclination angle of the reflection position. When this reflected light image is picked up by the image pickup means, the gradation information of the picked-up image becomes the tilt angle information. Therefore, the three-dimensional shape of the solder joint is detected based on the grayscale information, and the presence or absence of a defect in the solder joint is determined.

【0007】[0007]

【実施例】以下、図面を用いて本発明を説明する。図1
は本発明の一実施例の概略構成図である。図1におい
て、1はプリント基板、2はプリント基板1上に装着さ
れた実装部品である。実装部品2は半田によりプリント
基板1に接合されていて、半田接合部が検査対象とな
る。3はプリント基板1が載置されていて基板面に沿っ
た2次元方向にプリント基板1を移動して位置決めする
XY駆動テーブルである。4はプリント基板1の上方に
配置された照明手段で、リング形光源41と拡散板42
とからなる。拡散板42は、円筒形を成していて、リン
グ形光源41の内側に配置されている。リング形光源4
1と拡散板42の中心軸は一致している。リング形光源
41の光が拡散板42に入光され、拡散板42内で反射
した後に外界へ出射される。出射された光は半田接合部
に照射される。5は撮像手段としてのカメラであり、照
明手段4の上方に配置されていて、検査対象の反射光像
を撮像する。6は検査処理系コントロール部であり、カ
メラ5の撮像画像から半田接合部の立体形状を検出し、
検出した立体形状から半田接合部の欠陥の有無を判定す
る。検査処理コントロール部6は、A/D変換器61、
画像メモリ62、画像処理部63、画像判定部64を有
し、これらを用いて欠陥の有無を判定する。請求範囲で
いう判定部は検査処理コントロール部6に相当する。7
は駆動系コントロール部であり、照明手段4の駆動を制
御する照明コントロール部71、XY駆動テーブルのX
方向とY方向の移動をそれぞれ制御するX軸駆動部72
とY軸駆動部73を有する。
DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described below with reference to the drawings. Figure 1
FIG. 1 is a schematic configuration diagram of an embodiment of the present invention. In FIG. 1, 1 is a printed circuit board, and 2 is a mounted component mounted on the printed circuit board 1. The mounting component 2 is bonded to the printed circuit board 1 by soldering, and the solder bonding portion is an inspection target. Reference numeral 3 denotes an XY drive table on which the printed board 1 is placed and which moves and positions the printed board 1 in a two-dimensional direction along the board surface. Reference numeral 4 denotes an illuminating unit arranged above the printed circuit board 1, which includes a ring-shaped light source 41 and a diffusion plate 42.
Consists of. The diffusion plate 42 has a cylindrical shape and is arranged inside the ring-shaped light source 41. Ring light source 4
1 and the central axis of the diffuser plate 42 coincide with each other. The light from the ring-shaped light source 41 enters the diffusion plate 42, is reflected in the diffusion plate 42, and then is emitted to the outside. The emitted light is applied to the solder joint. Reference numeral 5 denotes a camera as an image pickup means, which is arranged above the illumination means 4 and picks up a reflected light image of the inspection target. An inspection processing system control unit 6 detects a three-dimensional shape of the solder joint from the image captured by the camera 5,
The presence or absence of a defect in the solder joint is determined from the detected three-dimensional shape. The inspection processing control unit 6 includes an A / D converter 61,
The image memory 62, the image processing unit 63, and the image determination unit 64 are provided, and the presence or absence of defects is determined using these. The determination unit referred to in the claims corresponds to the inspection processing control unit 6. 7
Is a drive system control section, which is an illumination control section 71 for controlling the drive of the illumination means 4 and X of the XY drive table.
X-axis drive unit 72 for controlling movement in the Y direction and the Y direction, respectively
And a Y-axis drive unit 73.

【0008】図2及び図3は図1の装置の具体的構成例
を示した図である。図3は図2の2点鎖線で囲んだX部
分の拡大図である。図2及び図3で図1と同一のものは
同一符号を付ける。以下、図において同様とする。図2
及び図3において、リングライトガイド411内には光
ファイバ412が引かれていて、ハロゲンランプ等の光
源(図示せず)の光は光ファイバ412によって導か
れ、リング形光源41のリング部分に伝えられる。リン
グ部分では、光ファイバ412の発光面を中心に向けて
配置している。発光面を中心に向けた光ファイバがリン
グの周方向に沿って配列されている。拡散板42は、例
えばアクリルパイプで構成されていて、端面内側のエッ
ジを面取りして1次拡散面421を成している。光ファ
イバ412の発光面から出射した光が1次拡散面421
に当たって拡散板42内に入るように、リング形光源4
1のリング部分はリングライトガイド411に内接して
いる。リング形光源41、拡散板42及びカメラ5の中
心軸は一致していてこれらの中心軸にプリント基板1の
基板面が直交している。
FIG. 2 and FIG. 3 are views showing a concrete configuration example of the apparatus of FIG. FIG. 3 is an enlarged view of an X portion surrounded by a chain double-dashed line in FIG. 2 and 3, the same parts as those in FIG. 1 are designated by the same reference numerals. Hereinafter, the same applies in the drawings. Figure 2
3, an optical fiber 412 is drawn in the ring light guide 411, and light from a light source (not shown) such as a halogen lamp is guided by the optical fiber 412 and transmitted to the ring portion of the ring-shaped light source 41. . In the ring portion, the light emitting surface of the optical fiber 412 is arranged so as to face the center. Optical fibers having the light emitting surface as the center are arranged along the circumferential direction of the ring. The diffusion plate 42 is made of, for example, an acrylic pipe, and chamfers the inner edge of the end face to form a primary diffusion surface 421. The light emitted from the light emitting surface of the optical fiber 412 is the primary diffusion surface 421.
The ring-shaped light source 4 so that it hits the inside of the diffusion plate 42.
The first ring portion is inscribed in the ring light guide 411. The central axes of the ring-shaped light source 41, the diffusion plate 42 and the camera 5 coincide with each other, and the substrate surface of the printed circuit board 1 is orthogonal to these central axes.

【0009】このように構成した装置の動作を説明す
る。まず、図1を用いて動作を説明する。照明手段4と
カメラ5の位置は固定されている。駆動系コントロール
部7の制御によってXY駆動テーブル3が移動すること
によって、検査対象となった半田接合部が照明手段4の
直下にくるようにプリント基板1が位置決めされる。位
置決め完了後、カメラ5が半田接合部を撮像し、検査処
理コントロール部6は撮像画像から半田接合部の立体形
状を認識し、所定の条件に基づいて半田接合部の欠陥の
有無を判定する。
The operation of the apparatus thus configured will be described. First, the operation will be described with reference to FIG. The positions of the illumination means 4 and the camera 5 are fixed. By moving the XY drive table 3 under the control of the drive system control unit 7, the printed circuit board 1 is positioned so that the solder joint to be inspected is directly below the lighting unit 4. After the positioning is completed, the camera 5 captures an image of the solder joint, the inspection processing control unit 6 recognizes the three-dimensional shape of the solder joint from the captured image, and determines whether there is a defect in the solder joint based on a predetermined condition.

【0010】ここで、本発明の特徴となる検出原理につ
いて説明する。図4〜図6は検出原理の説明図である。
図4において、8は円筒面状の照明で本発明の拡散板4
2に相当する。9は鏡面性の球面で本発明の半田接合面
11に相当する。円筒面の高さ方向に対して放射強度が
図5に示すように連続的に変化する光を、円筒面状の照
明8から鏡面性の球面9に対して照射する。このとき、
鏡面性の球面9で反射した光の中で円筒面の高さ方向に
進む光は、反射光のもとになる照射光の照射角に応じて
異なる光路をとる。これは、円筒面の高さ方向に進む反
射光は、そのもとになる照射光の照射角が異なれば、球
面9上の反射位置が異なるためである。図に示す傾斜角
Θは、反射位置における球面の接線と水平線とのなす角
である。円筒面の高さ方向に進む各反射光は、反射位置
の傾斜角Θがそれぞれ異なる。このことから、円筒面の
高さ方向に進む反射光を鏡面性の球面9の真上から観測
すると、その光束の輝度は傾斜角Θに対応した値をもつ
ことになる。光束の輝度Φと傾斜角Θの関係は、例えば
図6に示すようになる。
The detection principle that characterizes the present invention will now be described. 4 to 6 are explanatory diagrams of the detection principle.
In FIG. 4, reference numeral 8 denotes a cylindrical surface illumination, and the diffusion plate 4 of the present invention.
Equivalent to 2. Reference numeral 9 denotes a specular spherical surface, which corresponds to the solder joint surface 11 of the present invention. Light whose radiation intensity continuously changes in the height direction of the cylindrical surface as shown in FIG. 5 is emitted from the cylindrical illumination 8 to the specular spherical surface 9. At this time,
Of the light reflected by the specular spherical surface 9, the light traveling in the height direction of the cylindrical surface takes a different optical path depending on the irradiation angle of the irradiation light that is the source of the reflected light. This is because the reflected light traveling in the height direction of the cylindrical surface has a different reflection position on the spherical surface 9 if the irradiation angle of the irradiation light that is the basis of the reflection light is different. The inclination angle Θ shown in the figure is an angle formed by the tangent line of the spherical surface and the horizontal line at the reflection position. Each reflected light traveling in the height direction of the cylindrical surface has a different inclination angle Θ of the reflection position. Therefore, when the reflected light traveling in the height direction of the cylindrical surface is observed right above the specular spherical surface 9, the brightness of the light flux has a value corresponding to the inclination angle Θ. The relationship between the luminance Φ of the light flux and the inclination angle Θ is as shown in FIG. 6, for example.

【0011】このような検出原理を適用した本発明の動
作を図2と図3を用いて説明する。リングライトガイド
411内の光ファイバ412から発光された光は、内接
する拡散板42に入光し、さらに1次拡散面421に照
射される。この拡散面で反射した光は、拡散板42を媒
体として2次拡散面422で拡散反射し、拡散板42の
内面と外界の境界面から一部が外界に出射される。ここ
て、外界に出射されなかった光は、拡散板42の内部で
全反射し、再び2次拡散面422で拡散反射し、その一
部が外界に出射される。これを繰り返すことにより、拡
散板42の入光位置から離れるに従って外界に出射する
光の輝度が連続的に減衰していく。これによって、拡散
板42の内周面からは、拡散板42の長さ方向に沿って
照射角と強度が異なる光が照射される。図2で、半田接
合部11に対して、光路Aから照射された光は傾斜角α
の斜面で鉛直上方に反射し、光路Bから照射された光は
傾斜角βの斜面で鉛直上方に反射する。それぞれの光の
反射位置が異なるため、各反射光の光路は異なる。すな
わち、鉛直上方に進む反射光は、反射位置の傾斜角に応
じた輝度になっている。従って、反射光の輝度情報が傾
斜角情報になっている。このような反射光をカメラ5で
取り込むことにより、半田接合部11の立体形状が検出
される。
The operation of the present invention to which such a detection principle is applied will be described with reference to FIGS. 2 and 3. The light emitted from the optical fiber 412 in the ring light guide 411 enters the diffusion plate 42 inscribed therein and is further irradiated on the primary diffusion surface 421. The light reflected by the diffusing surface is diffused and reflected by the secondary diffusing surface 422 using the diffusing plate 42 as a medium, and part of the light is emitted from the boundary surface between the inner surface and the outer surface of the diffusing plate 42 to the outer world. Here, the light that has not been emitted to the outside world is totally reflected inside the diffusion plate 42, diffused and reflected again on the secondary diffusion surface 422, and a part thereof is emitted to the outside world. By repeating this, the brightness of the light emitted to the outside world is continuously attenuated as the distance from the light incident position of the diffusion plate 42 increases. Thereby, from the inner peripheral surface of the diffusion plate 42, light having different irradiation angles and intensities is emitted along the length direction of the diffusion plate 42. In FIG. 2, the light emitted from the optical path A to the solder joint portion 11 has an inclination angle α.
The light reflected from the optical path B is reflected vertically upward on the slope of the above, and the light emitted from the optical path B is reflected vertically upward on the slope of the inclination angle β. Since the reflection position of each light is different, the optical path of each reflected light is different. That is, the reflected light traveling vertically upward has a brightness corresponding to the inclination angle of the reflection position. Therefore, the brightness information of the reflected light is the tilt angle information. By capturing such reflected light with the camera 5, the three-dimensional shape of the solder joint portion 11 is detected.

【0012】なお、実施例では主として表面実装部品を
リフローにより半田付けした後に検査を行う場合を対象
に説明したが、同一のハードウェア構成を用いて、撮像
判定のソフトウェアのみ専用に用意することによって、
クリーム半田の塗布状態の検査、ディスクリート部品等
を対象にしたフロー半田の外観検査等にも適用できる。
クリーム半田の塗布状態の検査では、球状の半田粒を対
象にして、フロー半田の外観検査では、フロー半田のフ
ィレット部分を対象にして、立体形状を表す濃淡画像か
ら、特徴認識を効率的に行うことができる。また、立体
形状に対応してコントラストがつけられた撮像画像は、
人の視覚にとっても特徴抽出が容易であるため、半田接
合部等の目視検査用の照明撮像手段として用いることも
有効である。
Although the embodiments have been described mainly for the case where the inspection is performed after soldering the surface mount components by reflow, the same hardware configuration is used and only the software for the image pickup determination is prepared exclusively. ,
It can also be applied to inspection of the application state of cream solder, visual inspection of flow solder for discrete parts, etc.
In the inspection of the application state of the cream solder, spherical solder particles are targeted, and in the visual inspection of the flow solder, the fillet portion of the flow solder is targeted, and the feature recognition is efficiently performed from the grayscale image showing the three-dimensional shape. be able to. Also, the captured image with contrast corresponding to the three-dimensional shape,
Since feature extraction is easy for human vision, it is also effective to use it as an illumination image pickup means for visual inspection of solder joints and the like.

【0013】[0013]

【発明の効果】本発明によれば次の効果が得られる。 リング形光源と円筒形の拡散板を組み合わせた照明手
段により、検査対象とする立体形状の傾斜面の角度に応
じて、連続的に輝度が変化する反射光が得られる。この
反射光を取り込んで得た撮像画像は、濃淡情報が傾斜面
の角度情報になる。従って、濃淡情報と角度情報の対応
付けを行うことによって、2次元情報であっても3次元
の立体形状の認識が可能になる。 反射位置の傾斜角に対する反射光の輝度の変化は、連
続的であるため、あらゆる形状の半田接合部に対しても
検査を行うことができる。 従来例では複数の照明を時分割で点灯させていたが、
本発明では時分割な点灯が不要で1回の撮像で済む。こ
れによって、本発明は従来例に比して検査速度が速くな
る。また、本発明の照明の点灯状態は1形態であり、従
来例のような点灯の組み合わせの制御が不要である。 プリント基板の表面には、光沢をもったフラックスが
存在していることがある。フラックスが存在しているプ
リント基板に基板面に直交する方向の照射光を当てる
と、照射光はフラックスによって反射され、照射光と逆
方向の経路をたどって戻ってくる。本発明では、撮像面
に対しては、全て斜めに照射された光の反射光を撮像す
るため、フラックスの反射成分が撮像用の反射光に混入
することが少ない。従って、撮像を認識する上で、フラ
ックスによる外乱の影響を受けにくくなる。
According to the present invention, the following effects can be obtained. By the illumination means which is a combination of a ring-shaped light source and a cylindrical diffusion plate, reflected light whose brightness continuously changes according to the angle of the three-dimensional inclined surface to be inspected can be obtained. In the captured image obtained by capturing this reflected light, the grayscale information becomes the angle information of the inclined surface. Therefore, by associating the grayscale information with the angle information, it becomes possible to recognize a three-dimensional solid shape even with two-dimensional information. Since the change in the brightness of the reflected light with respect to the inclination angle of the reflection position is continuous, it is possible to inspect solder joints of any shape. In the conventional example, multiple lights were turned on in a time-sharing manner,
In the present invention, time-divisional lighting is not required and one image capturing is sufficient. As a result, the present invention has a higher inspection speed than the conventional example. Further, the lighting state of the illumination of the present invention is one form, and control of the combination of lighting as in the conventional example is unnecessary. A glossy flux may be present on the surface of the printed circuit board. When irradiation light in a direction orthogonal to the substrate surface is applied to a printed circuit board having flux, the irradiation light is reflected by the flux and returns along a path in the direction opposite to the irradiation light. In the present invention, since the reflected light of the light that is obliquely applied to the image pickup surface is imaged, the reflected component of the flux is rarely mixed in the reflected light for image pickup. Therefore, when recognizing an image, it becomes difficult to be influenced by the disturbance due to the flux.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例の概略構成図である。FIG. 1 is a schematic configuration diagram of an embodiment of the present invention.

【図2】図1の装置の具体的構成例を示した図である。FIG. 2 is a diagram showing a specific configuration example of the device of FIG.

【図3】図1の装置の具体的構成例を示した図である。FIG. 3 is a diagram showing a specific configuration example of the apparatus of FIG.

【図4】検出原理の説明図である。FIG. 4 is an explanatory diagram of a detection principle.

【図5】検出原理の説明図である。FIG. 5 is an explanatory diagram of a detection principle.

【図6】検出原理の説明図である。FIG. 6 is an explanatory diagram of a detection principle.

【符号の説明】[Explanation of symbols]

1 プリント基板 11 半田接合部 2 実装部品 4 照明手段 41 リング形光源 42 拡散板 5 カメラ 6 検査処理系コントロール部 DESCRIPTION OF SYMBOLS 1 Printed circuit board 11 Solder joint part 2 Mounting component 4 Illumination means 41 Ring type light source 42 Diffusion plate 5 Camera 6 Inspection processing system control part

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 プリント基板上に形成された半田接合部
の欠陥の有無を外観上から検査する半田接合部の検査装
置において、 リング形光源と拡散板を有し、前記拡散板は円筒形を成
し前記リング形光源の内側に配置されていて、リング形
光源の照射光を拡散板の端面より入光し、入光した光に
拡散板の内面を全反射及び拡散反射させ、拡散板から外
界に出射する光の輝度を拡散板の長さ方向に沿って減衰
させていき、拡散板の内周面から出射した光を前記半田
接合部に照射し、半田接合部で反射されて拡散板の長さ
方向に進む反射光の輝度を反射位置の傾斜角に応じて連
続的に変化させる照明手段と、 拡散板の長さ方向に進む反射光を受けて半田接合部の反
射光像を撮像する撮像手段と、 この撮像手段の撮像画像から半田接合部の立体形状を検
出し、検出した形状から半田接合部の欠陥の有無を判定
する判定部と、を具備したことを特徴とする半田接合部
の検査装置。
1. A solder joint inspection device for visually inspecting a solder joint formed on a printed circuit board for defects, comprising a ring-shaped light source and a diffusion plate, wherein the diffusion plate has a cylindrical shape. It is arranged inside the ring-shaped light source, receives the light emitted from the ring-shaped light source from the end surface of the diffuser, and totally reflects and diffuse-reflects the light incident on the inner surface of the diffuser from the diffuser. The brightness of the light emitted to the outside is attenuated along the length direction of the diffusion plate, the light emitted from the inner peripheral surface of the diffusion plate is applied to the solder joint, and is reflected by the solder joint to be diffused. An illumination unit that continuously changes the brightness of the reflected light traveling in the length direction of the solder according to the tilt angle of the reflection position, and an image of the reflected light of the solder joint is received by receiving the reflected light traveling in the length direction of the diffuser plate. And the three-dimensional shape of the solder joint from the image captured by this imaging means. An apparatus for inspecting a solder joint, comprising: a determination unit that detects and detects the presence or absence of a defect in the solder joint based on the detected shape.
JP12399293A 1993-05-26 1993-05-26 Inspection device for solder joints Expired - Fee Related JP3156442B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12399293A JP3156442B2 (en) 1993-05-26 1993-05-26 Inspection device for solder joints

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12399293A JP3156442B2 (en) 1993-05-26 1993-05-26 Inspection device for solder joints

Publications (2)

Publication Number Publication Date
JPH06331564A true JPH06331564A (en) 1994-12-02
JP3156442B2 JP3156442B2 (en) 2001-04-16

Family

ID=14874365

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12399293A Expired - Fee Related JP3156442B2 (en) 1993-05-26 1993-05-26 Inspection device for solder joints

Country Status (1)

Country Link
JP (1) JP3156442B2 (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006194872A (en) * 2005-01-10 2006-07-27 Ajuhitek Inc Automatic optical inspection device
JP2006208187A (en) * 2005-01-27 2006-08-10 Nagoya Electric Works Co Ltd Shape quality decision device and method
JP2006324424A (en) * 2005-05-18 2006-11-30 Omron Corp Main cause of failure analyzing system
JP2009276208A (en) * 2008-05-15 2009-11-26 Shindenshi Corp Visual inspection method for mounting substrate
JP2021050925A (en) * 2019-09-20 2021-04-01 矢崎総業株式会社 Appearance inspection device of crimp terminal
WO2021095785A1 (en) * 2019-11-15 2021-05-20 東洋製罐株式会社 Imaging device, inspection device, and inspection method

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006194872A (en) * 2005-01-10 2006-07-27 Ajuhitek Inc Automatic optical inspection device
JP2006208187A (en) * 2005-01-27 2006-08-10 Nagoya Electric Works Co Ltd Shape quality decision device and method
JP2006324424A (en) * 2005-05-18 2006-11-30 Omron Corp Main cause of failure analyzing system
JP2009276208A (en) * 2008-05-15 2009-11-26 Shindenshi Corp Visual inspection method for mounting substrate
JP2021050925A (en) * 2019-09-20 2021-04-01 矢崎総業株式会社 Appearance inspection device of crimp terminal
WO2021095785A1 (en) * 2019-11-15 2021-05-20 東洋製罐株式会社 Imaging device, inspection device, and inspection method

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