JPH06330398A - Method for plating and device therefor - Google Patents

Method for plating and device therefor

Info

Publication number
JPH06330398A
JPH06330398A JP12580193A JP12580193A JPH06330398A JP H06330398 A JPH06330398 A JP H06330398A JP 12580193 A JP12580193 A JP 12580193A JP 12580193 A JP12580193 A JP 12580193A JP H06330398 A JPH06330398 A JP H06330398A
Authority
JP
Japan
Prior art keywords
plating
plating bath
inert gas
tin
plated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12580193A
Other languages
Japanese (ja)
Inventor
Shigeyuki Horie
重之 堀江
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Murata Manufacturing Co Ltd
Original Assignee
Murata Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Murata Manufacturing Co Ltd filed Critical Murata Manufacturing Co Ltd
Priority to JP12580193A priority Critical patent/JPH06330398A/en
Publication of JPH06330398A publication Critical patent/JPH06330398A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To provide a method and device for plating capable of suppressing the oxidation of a metallic ion in a plating bath and prolonging the life of the plating bath. CONSTITUTION:At the time of electroplating by dipping electronic parts 13 as a member to be plated in the plating bath 11, an inert gas is supplied from an inert gas introducing pipe 17 and a plating metal aq. solution 12 is bubbled by inert gas bubbles 18. Thus, products are plated in the same plating bath over a long time.

Description

【発明の詳細な説明】Detailed Description of the Invention

【産業上の利用分野】本発明は、めっき浴中に被めっき
部材を浸漬して電気めっきする方法及びそのための装置
に関し、特に、めっき浴の経時による劣化を防止し得る
工程及び構造が備えられためっき方法及びめっき装置に
関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for dipping a member to be plated in a plating bath for electroplating and an apparatus therefor, and in particular, it is provided with a process and a structure capable of preventing deterioration of the plating bath over time. And a plating apparatus.

【従来の技術】従来より、電子部品の外部電極の形成方
法の一つとして、めっき法が採用されている。図2は、
電子部品の一例としての積層コンデンサを示す断面図で
ある。積層コンデンサ1では、セラミック焼結体2内に
複数の内部電極3〜6がセラミック層を介して重なり合
うように配置されている。セラミック焼結体2の両端面
には、それぞれ、外部電極7,8が形成されている。外
部電極7,8は、それぞれ、Agよりなる第1の外部電
極層7a,8a、Niよりなる第2の外部電極層7b,
8b及び最外層に形成されている錫もしくは半田よりな
る第3の外部電極層7c,8cを有する。上記のように
3層構造の外部電極7,8を形成しているのは、実装に
際して半田によるAgの半田喰われをNiよりなる第2
の外部電極層7b,8bにより防止し、さらに最外層に
錫または半田よりなる第3の外部電極層7c,8cを形
成することにより半田付け性を高めるためである。とこ
ろで、最外層の外部電極層7c,8cは、錫あるいは半
田を電気めっきすることにより形成されているが、錫を
めっきする場合を例にとり以下に説明するように、めっ
き浴が経時により劣化するという問題があった。すなわ
ち、電子部品の外部電極を形成する際に用いられる錫め
っき浴としては、電子部品の性能劣化を防止するため
に、一般に中性浴が用いられている。しかしながら、錫
イオンは、中性水溶液中では、2価のイオンから4価の
イオンに容易に酸化され、沈澱を生じる。従って、めっ
き浴中に有機酸などを混入し、2価の錫イオンを錯イオ
ン化し、めっき浴中において安定化させる方法が採用さ
れている。しかしながら、上記のように錫イオンを錯イ
オン化し安定させたとしても、錫めっき浴を長期間使用
しているうちに、2価の錫イオンが徐々に酸化され、4
価の錫イオンが増加することは避けられない。この4価
の錫イオンは、めっきのための電気化学反応には関与せ
ず、4価の錫イオンが増加すると2価の錫イオンのめっ
き反応を妨害し、水素ガスが発生し易くなる。その結
果、電子部品の品質不良やめっき不良が生じるという問
題があった。よって、従来、4価の錫イオン濃度が経時
により増加してきた場合、めっき浴を全て交換しなけれ
ばならなかった。上述した説明は錫めっき浴を例にとり
行ったが、半田めっき浴の場合においても同様に4価の
錫イオンの増加により、めっき浴の煩雑な交換作業が強
いられていた。本発明の目的は、めっき浴中のめっきに
関与する金属イオンが酸化されることによりめっき浴が
劣化することを防止することができ、めっき浴の寿命を
延長し得る、めっき方法及びめっき装置を提供すること
にある。
2. Description of the Related Art Conventionally, a plating method has been adopted as one of methods for forming external electrodes of electronic parts. Figure 2
It is sectional drawing which shows the multilayer capacitor as an example of an electronic component. In the multilayer capacitor 1, a plurality of internal electrodes 3 to 6 are arranged in a ceramic sintered body 2 so as to overlap with each other with a ceramic layer interposed therebetween. External electrodes 7 and 8 are formed on both end surfaces of the ceramic sintered body 2, respectively. The external electrodes 7 and 8 are respectively composed of first external electrode layers 7a and 8a made of Ag, second external electrode layers 7b made of Ni, and
8b and the third outer electrode layers 7c and 8c made of tin or solder formed on the outermost layer. As described above, the external electrodes 7 and 8 having the three-layer structure are formed because the solder is eroded by Ag during the mounting process by the second Ni electrode.
This is to prevent the external electrode layers 7b and 8b and to form the third external electrode layers 7c and 8c made of tin or solder on the outermost layer to improve the solderability. By the way, the outermost external electrode layers 7c and 8c are formed by electroplating tin or solder, but the plating bath deteriorates with time as will be described below by taking tin plating as an example. There was a problem. That is, as a tin plating bath used when forming an external electrode of an electronic component, a neutral bath is generally used in order to prevent performance deterioration of the electronic component. However, tin ions are easily oxidized from divalent ions to tetravalent ions in a neutral aqueous solution to cause precipitation. Therefore, a method has been adopted in which an organic acid or the like is mixed in the plating bath to complex-ionize the divalent tin ions to stabilize the divalent tin ions in the plating bath. However, even if the tin ions are complex-ionized and stabilized as described above, the divalent tin ions are gradually oxidized while the tin plating bath is used for a long period of time.
It is inevitable that the number of tin ions will increase. This tetravalent tin ion does not participate in the electrochemical reaction for plating, and when the tetravalent tin ion increases, it interferes with the plating reaction of the divalent tin ion and hydrogen gas is easily generated. As a result, there has been a problem that poor quality of electronic components and poor plating occur. Therefore, conventionally, when the tetravalent tin ion concentration increased with time, it was necessary to replace the entire plating bath. Although the above description has been made by taking the tin plating bath as an example, in the case of the solder plating bath as well, the increase of tetravalent tin ions similarly compels the complicated replacement work of the plating bath. An object of the present invention is to provide a plating method and a plating apparatus capable of preventing the plating bath from deteriorating due to the oxidation of metal ions involved in plating in the plating bath and extending the life of the plating bath. To provide.

【課題を解決するための手段】請求項1に記載の発明
は、被めっき部材をめっき浴中に浸漬して電気めっきす
るに際し、前記めっき浴を不活性ガスによりバブリング
することを特徴とする、めっき方法である。また、請求
項2に記載の発明は、上記めっき方法に用いられる装置
であり、被めっき部材を浸漬し、電気めっきするための
めっき浴と、前記めっき浴中に不活性ガスをバブリング
するための不活性ガス導入手段とを備えることを特徴と
する、めっき装置である。本発明のめっき方法及びめっ
き装置は、上記のようにめっき浴中に不活性ガスをバブ
リングすることに特徴を有することで共通し、この不活
性ガスによるバブリングは、めっきされる金属イオンと
酸素との接触を抑制するために行われる。上記不活性ガ
スとしては、例えば窒素、ヘリウム、ネオン、アルゴン
等を用いることができる。バブリングの条件は、めっき
浴の寸法、及びめっき浴の種類等によっても異なるため
一義的には定め得ないが、不活性ガスをめっき浴中に十
分に分散させることが可能であれば、特に問わない。ま
た、本発明のめっき装置における上記不活性ガス導入手
段としては、例えば不活性ガス導入管をめっき浴中に浸
漬した構造、あるいはめっき浴の壁面に開いた孔から不
活性ガスを導入する構造等、不活性ガスをめっき浴中で
バブリングし得る適宜の構造を採用することができる。
また、本発明のめっき方法及びめっき装置は、電子部品
の外部電極として錫や半田をめっきする場合に好適に用
いられるが、被めっき部材は電子部品に特に限定される
ものではなく、一般の要めっき部材へのめっきに利用す
ることができ、かつめっきされる金属についても錫や半
田に限定されるものではなく、例えば錫−ビスマスなど
の錫合金や鉄などをめっきする際にも用いることができ
る。
The invention according to claim 1 is characterized in that when the member to be plated is immersed in a plating bath for electroplating, the plating bath is bubbled with an inert gas. It is a plating method. Further, the invention according to claim 2 is an apparatus used in the above plating method, which comprises a plating bath for dipping and electroplating a member to be plated, and a bubbling of an inert gas in the plating bath. A plating apparatus comprising an inert gas introducing unit. The plating method and the plating apparatus of the present invention are common in that they have the characteristic of bubbling an inert gas in the plating bath as described above, and the bubbling by the inert gas is performed with the metal ions and oxygen to be plated. This is done to suppress the contact of As the inert gas, for example, nitrogen, helium, neon, argon or the like can be used. The bubbling condition cannot be uniquely determined because it varies depending on the size of the plating bath, the type of plating bath, etc., but is not particularly limited as long as the inert gas can be sufficiently dispersed in the plating bath. Absent. Further, as the above-mentioned inert gas introducing means in the plating apparatus of the present invention, for example, a structure in which an inert gas introducing pipe is immersed in a plating bath, or a structure for introducing an inert gas from a hole opened in the wall surface of the plating bath, etc. It is possible to adopt an appropriate structure capable of bubbling an inert gas in the plating bath.
Further, the plating method and the plating apparatus of the present invention are preferably used when tin or solder is plated as an external electrode of an electronic component, but the member to be plated is not particularly limited to the electronic component, and a general component is required. It can be used for plating on plated members, and the metal to be plated is not limited to tin or solder, but can also be used for plating tin alloy such as tin-bismuth or iron. it can.

【作用】本発明のめっき方法及びめっき装置では、めっ
き浴中に不活性ガスがバブリングされるため、めっき浴
中の溶存酸素が窒素置換のように不活性ガスにより追い
出され、あるいは不活性ガスがめっき浴表面にバブルと
なって漂うためか、めっき浴中の金属イオンの酸化が抑
制される。従って、めっき浴中の金属イオンの経時によ
り酸化が抑制されるため、めっき浴の劣化を防止するこ
とができ、めっき浴寿命を延長することができる。
In the plating method and the plating apparatus of the present invention, since the inert gas is bubbled in the plating bath, the dissolved oxygen in the plating bath is expelled by the inert gas like nitrogen substitution, or the inert gas is removed. Oxidation of metal ions in the plating bath is suppressed, probably because the bubbles float on the surface of the plating bath. Therefore, since the oxidation of the metal ions in the plating bath is suppressed over time, deterioration of the plating bath can be prevented and the life of the plating bath can be extended.

【実施例の説明】以下、本発明の非限定的な実施例を説
明することにより、本発明を明らかにする。図1は、本
発明のめっき装置を説明するための概略構成図である。
めっき浴11内には、めっきすべき金属イオン、例えば
2価の錫イオンが溶解された水溶液12が貯留されてい
る。この水溶液12中に被めっき部材として電子部品1
3が浸漬されている。電子部品13は、外部電極14,
15を有し、この外部電極14,15の外表面に後述の
ようにして本めっき装置におけるめっきが行われ、最外
層の外部電極層が形成される。16は、陽極を示し、外
部電極14,15との間に電圧が印加される。本実施例
のめっき装置では、上記めっき装置において水溶液12
中に不活性ガス導入管17が挿入されており、該不活性
ガス導入管17には図示しない不活性ガス供給手段から
図示の矢印A方向に不活性ガスが供給される。従って、
不活性ガス導入管17の先端17aから、不活性ガスが
水溶液12中にバブリングされ、不活性ガスのバブル1
8が水溶液12中に分散される。上記不活性ガスのバブ
ル18が水溶液12中に分散されることにより、水溶液
12中の溶存酸素が追い出され、金属イオンの酸化が抑
制される。また、バブル18が水溶液12の表面に漂っ
た状態が連続するため、空気中の酸素の水溶液12中へ
の溶解も抑制されると考えられる。従って、後述の実験
例から明らかなように、めっき浴中の金属イオンの経時
による酸化を抑制することができるため、めっき浴の寿
命の延長を図り得る。次に、具体的の実験例につき説明
する。上記実施例の効果を確認するために、2価の錫イ
オン含有水溶液を貯留した中性の錫めっき浴を用意し
た。用意した錫めっき浴中の錫イオン水溶液の量は1リ
ットルであり、窒素ガスを流速50ml/分で先端の孔
径が5mmの不活性ガス導入管を用いて供給し、バブリ
ングを行った。なお、めっき浴の浴温は40℃とした。
1か月後の該めっき浴中における4価の錫イオン濃度を
測定した。結果を下記の表1に示す。また、比較のため
に、窒素ガスのバブリングを行わないことを除いては、
同様にして用意された、めっき浴の浴温が25℃、40
℃及び50℃の各めっき浴を用意し、上記浴温を維持す
るようにして1か月間放置した。放置後の各浴温のめっ
き浴について、4価の錫イオンの濃度を測定した。結果
を、下記の表1に合わせて示す。
DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be clarified by describing non-limiting examples of the present invention. FIG. 1 is a schematic configuration diagram for explaining the plating apparatus of the present invention.
An aqueous solution 12 in which metal ions to be plated, for example, divalent tin ions are dissolved is stored in the plating bath 11. In this aqueous solution 12, an electronic component 1 as a member to be plated
3 is immersed. The electronic component 13 includes an external electrode 14,
The outer surface of each of the external electrodes 14 and 15 is plated with the present plating apparatus as described below to form the outermost external electrode layer. Reference numeral 16 denotes an anode, to which a voltage is applied between the external electrodes 14 and 15. In the plating apparatus of this embodiment, the aqueous solution 12 is used in the above plating apparatus.
An inert gas introducing pipe 17 is inserted therein, and the inert gas introducing pipe 17 is supplied with an inert gas in the direction of arrow A shown by an inert gas supplying means (not shown). Therefore,
An inert gas is bubbled through the aqueous solution 12 from the tip 17a of the inert gas introduction pipe 17, and the inert gas bubble 1
8 is dispersed in the aqueous solution 12. By dispersing the bubbles 18 of the inert gas in the aqueous solution 12, the dissolved oxygen in the aqueous solution 12 is expelled and the oxidation of metal ions is suppressed. Further, it is considered that since the bubbles 18 continuously float on the surface of the aqueous solution 12, the dissolution of oxygen in the air into the aqueous solution 12 is suppressed. Therefore, as is clear from the experimental examples described below, the oxidation of metal ions in the plating bath over time can be suppressed, and the life of the plating bath can be extended. Next, a specific experimental example will be described. In order to confirm the effect of the above example, a neutral tin plating bath storing a divalent tin ion-containing aqueous solution was prepared. The amount of the tin ion aqueous solution in the prepared tin plating bath was 1 liter, and nitrogen gas was supplied at a flow rate of 50 ml / min using an inert gas introduction tube having a tip hole diameter of 5 mm to perform bubbling. The bath temperature of the plating bath was 40 ° C.
The tetravalent tin ion concentration in the plating bath after one month was measured. The results are shown in Table 1 below. For comparison, except that nitrogen gas is not bubbled,
Similarly prepared, the bath temperature of the plating bath was 25 ° C, 40
Each of the plating baths of 50 ° C. and 50 ° C. was prepared and left for one month while maintaining the bath temperature. The concentration of tetravalent tin ions was measured for the plating baths at each bath temperature after standing. The results are also shown in Table 1 below.

【表1】 表1から明らかなように、窒素ガスをバブリングしてい
ない場合、めっき浴の浴温が高くなるに連れて、4価の
錫イオンの生成速度が大きくなっていた。これは、浴温
が高くなるに連れて、2価の錫イオンから4価の錫イオ
ンへの酸化反応が速く進行するためと考えられる。他
方、浴温が40℃であっても、窒素ガスをバブリングし
た場合には、4価の錫イオンの生成速度が窒素ガスをバ
ブリングしていない場合に比べて約1/10となってい
た。すなわち、窒素ガスをバブリングすることにより2
価の錫イオンから4価の錫イオンへの酸化反応を著しく
抑制し得ることが分かる。次に、被めっき部材の品質を
安定化させるために、上記錫めっき浴中の4価の錫イオ
ン濃度を、例えば30g/l以下で管理した。すなわ
ち、4価の錫イオン濃度が30g/lを超えた場合に、
めっき浴の寿命が尽きたとして、上記各めっき浴の寿命
を測定した。結果を、下記の表2に示す。
[Table 1] As is clear from Table 1, when nitrogen gas was not bubbled, the generation rate of tetravalent tin ions increased as the bath temperature of the plating bath increased. This is presumably because the oxidation reaction from divalent tin ions to tetravalent tin ions progresses faster as the bath temperature increases. On the other hand, even when the bath temperature was 40 ° C., when nitrogen gas was bubbled, the generation rate of tetravalent tin ions was about 1/10 of that when nitrogen gas was not bubbled. That is, by bubbling nitrogen gas, 2
It can be seen that the oxidation reaction from tetravalent tin ions to tetravalent tin ions can be significantly suppressed. Next, in order to stabilize the quality of the member to be plated, the concentration of tetravalent tin ions in the tin plating bath was controlled to, for example, 30 g / l or less. That is, when the tetravalent tin ion concentration exceeds 30 g / l,
Assuming that the life of the plating bath was exhausted, the life of each plating bath was measured. The results are shown in Table 2 below.

【表2】 表2から明らかなように、中性の錫めっき浴の場合に、
窒素ガスを上記の条件でバブリングすることにより、め
っき浴寿命を従来の約10倍に延長し得ることがわか
る。
[Table 2] As is clear from Table 2, in the case of a neutral tin plating bath,
By bubbling nitrogen gas under the above conditions, it can be seen that the plating bath life can be extended to about 10 times that of the conventional one.

【発明の効果】本発明のめっき方法およびめっき装置に
よれば、不活性ガスがめっき浴中にバブリングされるこ
とにより、めっき浴中の金属イオンの酸化が抑制され
る。従って、めっき浴の経時による劣化が防止され、め
っき浴を長寿命化することができる。よって、めっき浴
の交換頻度を低減することができ、めっきコストを著し
く低減することができる。加えて、同一のめっき浴によ
り製品のめっきを長期間に渡って行うことができるた
め、めっきされる製品の品質を安定化させることが可能
となる。
According to the plating method and the plating apparatus of the present invention, bubbling of the inert gas in the plating bath suppresses the oxidation of metal ions in the plating bath. Therefore, deterioration of the plating bath over time is prevented, and the life of the plating bath can be extended. Therefore, the frequency of exchanging the plating bath can be reduced, and the plating cost can be significantly reduced. In addition, since the product can be plated for a long period of time using the same plating bath, the quality of the product to be plated can be stabilized.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例に係るめっき装置を説明する
ための概略構成図。
FIG. 1 is a schematic configuration diagram for explaining a plating apparatus according to an embodiment of the present invention.

【図2】積層コンデンサを示す断面図。FIG. 2 is a sectional view showing a multilayer capacitor.

【符号の説明】[Explanation of symbols]

11…めっき浴 12…めっき金属水溶液 13…被めっき部材としての電子部品 17…不活性ガス導入管 18…バブル DESCRIPTION OF SYMBOLS 11 ... Plating bath 12 ... Plating metal aqueous solution 13 ... Electronic component as a member to be plated 17 ... Inert gas introduction pipe 18 ... Bubble

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 被めっき部材をめっき浴中に浸漬して電
気めっきするに際し、前記めっき浴を不活性ガスにより
バブリングすることを特徴とする、めっき方法。
1. A plating method which comprises bubbling the plating bath with an inert gas when the member to be plated is immersed in the plating bath for electroplating.
【請求項2】 被めっき部材を浸漬し、電気めっきする
ためのめっき浴と、 前記めっき浴中に不活性ガスをバブリングするための不
活性ガス導入手段とを備えることを特徴とする、めっき
装置。
2. A plating apparatus comprising a plating bath for immersing and electroplating a member to be plated, and an inert gas introducing means for bubbling an inert gas in the plating bath. .
JP12580193A 1993-05-27 1993-05-27 Method for plating and device therefor Pending JPH06330398A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12580193A JPH06330398A (en) 1993-05-27 1993-05-27 Method for plating and device therefor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12580193A JPH06330398A (en) 1993-05-27 1993-05-27 Method for plating and device therefor

Publications (1)

Publication Number Publication Date
JPH06330398A true JPH06330398A (en) 1994-11-29

Family

ID=14919243

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12580193A Pending JPH06330398A (en) 1993-05-27 1993-05-27 Method for plating and device therefor

Country Status (1)

Country Link
JP (1) JPH06330398A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002252141A (en) * 2001-02-26 2002-09-06 Hitachi Metals Ltd Electronic component
JP2009149979A (en) * 2007-11-30 2009-07-09 Mitsubishi Materials Corp METHOD FOR REPLENISHING Sn-ALLOY PLATING SOLUTION WITH Sn-COMPONENT AND Sn-ALLOY PLATING TREATMENT APPARATUS

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002252141A (en) * 2001-02-26 2002-09-06 Hitachi Metals Ltd Electronic component
JP4534183B2 (en) * 2001-02-26 2010-09-01 日立金属株式会社 Electronic components
JP2009149979A (en) * 2007-11-30 2009-07-09 Mitsubishi Materials Corp METHOD FOR REPLENISHING Sn-ALLOY PLATING SOLUTION WITH Sn-COMPONENT AND Sn-ALLOY PLATING TREATMENT APPARATUS

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