JPH06310432A - Seal structure for opening part of manifold in semiconductor manufacturing equipment - Google Patents

Seal structure for opening part of manifold in semiconductor manufacturing equipment

Info

Publication number
JPH06310432A
JPH06310432A JP11764693A JP11764693A JPH06310432A JP H06310432 A JPH06310432 A JP H06310432A JP 11764693 A JP11764693 A JP 11764693A JP 11764693 A JP11764693 A JP 11764693A JP H06310432 A JPH06310432 A JP H06310432A
Authority
JP
Japan
Prior art keywords
manifold
seal
seal plate
opening part
semiconductor manufacturing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11764693A
Other languages
Japanese (ja)
Other versions
JP3067467B2 (en
Inventor
Hiroshi Nagashima
洋 永島
Hitoshi Kono
等 河野
Yasuhiro Nakai
泰弘 中井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shinko Electric Co Ltd
Original Assignee
Shinko Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shinko Electric Co Ltd filed Critical Shinko Electric Co Ltd
Priority to JP5117646A priority Critical patent/JP3067467B2/en
Publication of JPH06310432A publication Critical patent/JPH06310432A/en
Application granted granted Critical
Publication of JP3067467B2 publication Critical patent/JP3067467B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Abstract

PURPOSE:To so improve a seal structure for the opening part of a manifold which serves as the gas feeding means for a reactive furnace in a semiconductor manufacturing equipment that the alignment required in case of mounting and demounting the seal structure is made easy. CONSTITUTION:A seal structure for the opening part of a manifold 11 comprises a seal plate 22 provided horizontally on the outside of the outer peripheral surface of the opening part. The seal plate 22 has in its inner peripheral part a seal member for sealing the clearance between the outer peripheral surface of the opening part of the manifold 11 and itself, and it is so configured that an intermediate room 24 which is isolated in a sealing way from a heater part 3 including a reactive furnace and from a processing room 2 is formed. In this case, the seal plate 22 is formed in an annular shape, and is so configured desirably that as a seal member an O-ring 23 is mounted in the groove provided in its inner periphral part.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は半導体の単結晶を材料で
あるウエハ−上に形成するCVD装置等の半導体製造装
置に関し,更に,詳しくは同装置の反応炉にガスを供給
するマニホ−ルドの口部のシ−ル構造の改良に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor manufacturing apparatus such as a CVD apparatus for forming a semiconductor single crystal on a wafer made of a material, and more specifically, a manifold for supplying a gas to a reaction furnace of the apparatus. Of the seal structure of the mouth of

【0002】[0002]

【従来の技術】図5は従来のCVD装置の構造を示す縦
断正面図で,フレ−ム1で囲まれた内側のプロセス室2
は図で右方上部にヒ−タ部3,左方上部にクリ−ンユニ
ット部4が区画されている。5は反応炉,7はクリ−ン
ユニット,8はウエハ−が収納される石英ボ−ド,9は
石英ボ−ド8を操作するハンドラ−で,昇降装置10が
石英ボ−ド8を反応炉5の中へ上昇して挿入,処理後下
降して取り出し,反応炉5の下部にあるマニホ−ルド1
1の底部開放口18をシ−ルシャッタ装置12が開閉作
用を行うようになっている。また,ハンドラ−9の図で
左方にはロボット13,キャリアステ−ジ14が設けら
れている。
2. Description of the Related Art FIG. 5 is a vertical sectional front view showing the structure of a conventional CVD apparatus, which shows an inner process chamber 2 surrounded by a frame 1.
In the figure, a heater portion 3 is provided on the upper right side and a cleaner unit portion 4 is provided on the upper left side. Reference numeral 5 is a reaction furnace, 7 is a cleaning unit, 8 is a quartz board in which wafers are housed, 9 is a handler for operating the quartz board 8, and an elevating device 10 reacts the quartz board 8. The furnace is inserted into the furnace 5 by ascending, and after being processed, it is descended and taken out.
The seal shutter device 12 is adapted to open and close the bottom opening port 18 of No. 1. A robot 13 and a carrier stage 14 are provided on the left side of the handler 9 in the figure.

【0003】[0003]

【発明が解決しようとする課題】上記構造のCVD装置
が使用される場合は,フレ−ム内は無塵とし,反応炉5
内にはマニホ−ルド11の継手25を介してH2等の所
要のガスが供給されるようになっている。ところで,マ
ニホ−ルド11の周囲に備えられた反応炉5への真空ポ
ンプ,またはウエハ−処理に使用される上記のガス供給
口としての継手25や温度制御の熱電対の継手25’は
作業の前後に切換,清掃又は補修のために人の手で操作
され,その度にプロセス室のガス排出,真空化,再充填
作業や,塵を持ち込まぬよう細心の注意を払うなど管理
に多大の努力を要していた。このため,マニホ−ルド1
1の口部のシ−ルドを反応炉と昇降装置10で上下動す
る石英ボ−ト8との芯合わせも容易に行えるマニホ−ル
ド11の口部のシ−ルド構造が要望されていた。本発明
はこのような課題(要望)を解決するようにした半導体
製造装置におけるマニホ−ルドの口部のシ−ル構造を提
供することを目的とする。
When the CVD apparatus having the above structure is used, the inside of the frame is made dust-free and the reactor 5
A required gas such as H 2 is supplied into the interior of the manifold 25 through the joint 25 of the manifold 11. By the way, the vacuum pump to the reaction furnace 5 provided around the manifold 11 or the joint 25 as the above-mentioned gas supply port used for wafer processing or the joint 25 'of the thermocouple for temperature control is used for the work. It is operated by hand for switching back and forth, cleaning or repair, and each time it is exhausted from the process chamber, evacuated, refilled work, and paying great attention not to bring dust Was needed. Therefore, Manifold 1
There has been a demand for a shield structure at the mouth of the manifold 11 which can easily perform centering of the shield at the mouth of No. 1 with the quartz boat 8 which moves up and down by the elevating device 10. SUMMARY OF THE INVENTION It is an object of the present invention to provide a seal structure for a mouth of a manifold in a semiconductor manufacturing apparatus which solves the above problems (desiries).

【0004】[0004]

【課題を解決するための手段】本発明は上記課題を解決
するために,半導体製造装置における反応炉に対するガ
ス供給手段として設けられるマニホ−ルドの口部の外周
表面の外側に水平に配置されるシ−ルプレ−トであっ
て,このシ−ルプレ−トはその内周部に前記マニホ−ル
ドの口部の外周表面との間を密封するシ−ル材を備えて
おり,このシ−ルプレ−ト,フレ−ム及びマニホ−ルド
A部,マニホ−ルドB部,フレ−ムからシ−ルされた中
間室を形成するように構成した。この場合,前記シ−ル
プレ−トは環状の形状に形成され,その内周部に設けた
溝内にシ−ル材としてOリングを装着するように構成す
ることが望ましい。
In order to solve the above-mentioned problems, the present invention is arranged horizontally outside the outer peripheral surface of the mouth of a manifold provided as a gas supply means for a reaction furnace in a semiconductor manufacturing apparatus. A seal plate, the seal plate having an inner peripheral portion provided with a seal material for sealing between the seal plate and the outer peripheral surface of the mouth portion of the manifold. It is constructed so as to form an intermediate chamber sealed from the frame, the frame and the manifold A portion, the manifold B portion and the frame. In this case, it is preferable that the seal plate is formed in an annular shape, and an O-ring is mounted as a seal material in a groove provided in the inner peripheral portion of the seal plate.

【0005】[0005]

【作用】本発明によるシ−ルプレ−トをフレ−ムに取り
付けてマニホ−ルドの口部との間がシ−ルされた中間室
内で前記の継手類が取り扱われ,プロセス室はそのまま
なので管理が容易であり,また,シ−ルプレ−トに設け
られるシ−ル材としてのOリングが水平に位置している
ので,フレ−ムの板金工作から来る製作誤差によるマニ
ホ−ルドの多少の傾き及び上下ズレは容易に吸収され
る。
The above-mentioned joints are handled in the intermediate chamber where the seal plate according to the present invention is attached to the frame and sealed between the mouth of the manifold and the process chamber is kept as it is. In addition, since the O-ring as the seal material provided on the seal plate is positioned horizontally, the manifold may be slightly inclined due to a manufacturing error caused by the frame sheet metal working. And the vertical shift is easily absorbed.

【0006】[0006]

【実施例】以下図1〜図4に示す一実施例により本発明
を具体的に説明する。図1は本発明によるマニホ−ルド
の口部のシ−ル構造を有するCVD装置の一実施例の縦
断正面図,図2は図1のA部の拡大断面図で,従来例と
同等の構成については図5と同一符号を付して示してあ
る。図1及び図2において,反応炉5の炉壁5aはほぼ
水平なフレ−ム1aに固定され,アウタチュ−ブ15は
リング16とマニホ−ルドA部11aに保持され,イン
ナチュ−ブ17はマニホ−ルドA部11aとマニホ−ル
ドB部11bに保持され(マニホ−ルド11はA部11
aとB部11bがボルト結合されて構成される),マニ
ホ−ルドB部11bの開放口18はシ−ルシャッタ装置
12で操作されるマニホ−ルドキャップ19によって開
閉される。22はシ−ルプレ−ト,23はこのシ−ルプ
レ−ト22の装着部である内周部に配置されたシ−ル材
としてのOリングで,マニホ−ルド11の口部20のマ
ニホ−ルドB部11bの外周表面21に,ほぼ水平なフ
レ−ム1bに図示しないパッキンを介してボルト止めさ
れたシ−ルプレ−ト22がOリング23を介して係合さ
れ,シ−ルプレ−ト22,フレ−ム1a,1b及びマニ
ホ−ルドA部11a,マニホ−ルドB部11bによりシ
−ルされた中間室24を形成するように構成されてい
る。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described in detail with reference to an embodiment shown in FIGS. FIG. 1 is a vertical sectional front view of an embodiment of a CVD apparatus having a seal structure for a mouth of a manifold according to the present invention, and FIG. 2 is an enlarged sectional view of a portion A of FIG. Are denoted by the same reference numerals as in FIG. 1 and 2, the furnace wall 5a of the reaction furnace 5 is fixed to a substantially horizontal frame 1a, the outer tube 15 is held by a ring 16 and a manifold A portion 11a, and the inner tube 17 is a manifold. It is held by the fold A section 11a and the manifold B section 11b.
The opening 18 of the manifold B portion 11b is opened and closed by a manifold holder 19 operated by the seal shutter device 12. Reference numeral 22 is a seal plate, and 23 is an O-ring as a seal material arranged on an inner peripheral portion which is a mounting portion of the seal plate 22, and is a manifold of the mouth portion 20 of the manifold 11. A seal plate 22, which is bolted to a substantially horizontal frame 1b through a packing (not shown), is engaged with an outer peripheral surface 21 of the sleeve B portion 11b through an O-ring 23 to form a seal plate. 22, the frames 1a and 1b, the manifold A portion 11a, and the manifold B portion 11b form a sealed intermediate chamber 24.

【0007】ここで,本発明の要部であるシ−ルプレ−
ト22の構造について詳述する。図3はシ−ルプレ−ト
22の平面図,図4は図3のB−B断面図である。即
ち,シ−ルプレ−ト22は図3,図4に示すように,た
とえば,環状の外形の外周に沿って複数個のボルト通し
穴22aが設けられ,中央部の内径Dはマニホ−ルドB
部11bの外周表面21の直径より少し大きく,内径部
分は厚く形成さればち形断面を有する溝22bが形成さ
れ,この溝22bにシ−ル材としてのOリング23が装
着されるようになっている。
Here, a seal plate, which is a main part of the present invention,
The structure of the gate 22 will be described in detail. 3 is a plan view of the seal plate 22 and FIG. 4 is a sectional view taken along line BB of FIG. That is, as shown in FIGS. 3 and 4, the seal plate 22 is provided with a plurality of bolt through holes 22a along the outer circumference of an annular outer shape, and the inner diameter D of the central portion is the manifold B.
A groove 22b having a dovetail-shaped cross section is formed with a diameter slightly larger than the diameter of the outer peripheral surface 21 of the portion 11b and a thick inner diameter portion, and an O-ring 23 as a seal material is mounted in the groove 22b. ing.

【0008】上記構成において,マニホ−ルド11に取
り付けられた各種継手25,25’は図2に示すように
プロセス室2とは無関係に,人の手で操作でき,管理上
極めて都合がよく,又板金工作のフレ−ム1a,1bの
製作誤差による多少のマニホ−ルド11の傾き,フレ−
ム1a,1b間の垂直方向の寸法誤差はOリング23で
吸収できる。
In the above structure, the various joints 25, 25 'attached to the manifold 11 can be operated by human hands independently of the process chamber 2 as shown in FIG. Also, due to the manufacturing error of the frame 1a, 1b for sheet metal working, the inclination and frame of the manifold 11 may be slightly different.
The dimensional error in the vertical direction between the frames 1a and 1b can be absorbed by the O-ring 23.

【0009】[0009]

【発明の効果】本発明は上記のように構成されるから次
のような優れた効果を有する。 ヒ−タ部とプロセス室との間にシ−ルされた中間室が
構成されるので,反応炉への各種継手類の人手による操
作が外気を通ずる中間室内で自由に実施できるようにな
った。 シ−ルプレ−トは着脱自在で,マニホ−ルドの多少の
傾き,上下の位置誤差はその内周部に装着されたOリン
グ等のシ−ル材の存在によって吸収されるので,反応炉
と上下動する石英ボ−トとの芯合わせも容易に行え,マ
ニホ−ルド自体の分解,手入れは容易となり,半導体製
造装置の管理が極めて容易になった。
Since the present invention is constructed as described above, it has the following excellent effects. Since a sealed intermediate chamber is configured between the heater and the process chamber, it is now possible to manually operate the various joints to the reactor in the intermediate chamber where the outside air communicates. . The seal plate is removable, and some inclination of the manifold and vertical position error are absorbed by the presence of a seal material such as an O-ring mounted on the inner periphery of the seal plate, so Centering with a vertically moving quartz boat was also easy, and the manifold itself could be disassembled and maintained easily, and management of semiconductor manufacturing equipment became extremely easy.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明によるマニホ−ルドの口部のシ−ル構造
を有する半導体製造装置の一実施例を示す縦断正面図で
ある。
FIG. 1 is a vertical sectional front view showing an embodiment of a semiconductor manufacturing apparatus having a seal structure of a mouth of a manifold according to the present invention.

【図2】図1のA部の拡大断面図である。FIG. 2 is an enlarged cross-sectional view of a portion A of FIG.

【図3】本発明によるシ−ルプレ−トの平面図である。FIG. 3 is a plan view of a seal plate according to the present invention.

【図4】図3のB−B断面図である。FIG. 4 is a sectional view taken along line BB of FIG.

【図5】従来のCVD装置の主要構成を示す縦断正面図
である。
FIG. 5 is a vertical sectional front view showing the main configuration of a conventional CVD apparatus.

【符号の説明】[Explanation of symbols]

2:プロセス室 3:ヒ−タ部 5:反応炉 11:マニホ−ルド 20:口部 21:外周表面 22:シ−ルプレ−ト 23:Oリング 24:中間室 2: Process chamber 3: Heater part 5: Reactor 11: Manifold 20: Mouth part 21: Outer peripheral surface 22: Seal plate 23: O-ring 24: Intermediate chamber

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 半導体製造装置における反応炉に対する
ガス供給手段として設けられるマニホ−ルド(11)の
口部の外周表面の外側に水平に配置されるシ−ルプレ−
ト(22)であって,このシ−ルプレ−ト(22)はそ
の内周部に前記マニホ−ルド(11)の口部の外周表面
との間を密封するシ−ル材を備えており,このシ−ルプ
レ−ト(22),フレ−ム(1b)及びマニホ−ルドA
部(11a),マニホ−ルドB部(11b),フレ−ム
(1a)によりシ−ルされた中間室を形成するようにし
たことを特徴とする半導体製造装置におけるマニホ−ル
ドの口部のシ−ル構造。
1. A seal plate horizontally arranged outside the outer peripheral surface of the mouth of a manifold (11) provided as a gas supply means for a reaction furnace in a semiconductor manufacturing apparatus.
The seal plate (22) is provided with a seal material on the inner peripheral portion thereof for sealing between the outer peripheral surface of the mouth portion of the manifold (11). , The seal plate (22), the frame (1b) and the manifold A
(11a), the manifold section B section (11b), and the frame (1a) to form an intermediate chamber sealed by the frame (1a). Seal structure.
【請求項2】 前記シ−ルプレ−ト(22)は環状の形
状に形成され,その内周部に設けた溝内にシ−ル材とし
てOリング(23)を装着するようにした請求項1記載
の半導体製造装置におけるマニホ−ルドの口部のシ−ル
構造。
2. The seal plate (22) is formed in an annular shape, and an O-ring (23) is mounted as a seal material in a groove provided in an inner peripheral portion of the seal plate. 2. A seal structure at the mouth of a manifold in the semiconductor manufacturing apparatus described in 1.
JP5117646A 1993-04-22 1993-04-22 Seal structure at the mouth of manifold in semiconductor manufacturing equipment Expired - Lifetime JP3067467B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5117646A JP3067467B2 (en) 1993-04-22 1993-04-22 Seal structure at the mouth of manifold in semiconductor manufacturing equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5117646A JP3067467B2 (en) 1993-04-22 1993-04-22 Seal structure at the mouth of manifold in semiconductor manufacturing equipment

Publications (2)

Publication Number Publication Date
JPH06310432A true JPH06310432A (en) 1994-11-04
JP3067467B2 JP3067467B2 (en) 2000-07-17

Family

ID=14716840

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5117646A Expired - Lifetime JP3067467B2 (en) 1993-04-22 1993-04-22 Seal structure at the mouth of manifold in semiconductor manufacturing equipment

Country Status (1)

Country Link
JP (1) JP3067467B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1998019335A1 (en) * 1996-10-31 1998-05-07 Tokyo Electron Limited Vertical type heat treatment apparatus

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1998019335A1 (en) * 1996-10-31 1998-05-07 Tokyo Electron Limited Vertical type heat treatment apparatus
US5951282A (en) * 1996-10-31 1999-09-14 Tokyo Electron Limited Vertical heat treatment apparatus

Also Published As

Publication number Publication date
JP3067467B2 (en) 2000-07-17

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