JPH06306619A - Coating film forming device - Google Patents
Coating film forming deviceInfo
- Publication number
- JPH06306619A JPH06306619A JP11777893A JP11777893A JPH06306619A JP H06306619 A JPH06306619 A JP H06306619A JP 11777893 A JP11777893 A JP 11777893A JP 11777893 A JP11777893 A JP 11777893A JP H06306619 A JPH06306619 A JP H06306619A
- Authority
- JP
- Japan
- Prior art keywords
- plasma
- grid electrodes
- hole
- film
- film forming
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
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- Physical Vapour Deposition (AREA)
- Chemical Vapour Deposition (AREA)
- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は、密着性の優れた皮膜を
形成するための皮膜形成装置に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a film forming apparatus for forming a film having excellent adhesion.
【0002】[0002]
【従来の技術】一般に皮膜による表面の被覆によって部
材の高機能化を行う際には、下地となる被処理材と皮膜
との密着性が優れていることが求められる。そのために
工業利用を図る際に、めっき等の湿式プロセス、或いは
蒸着等の乾式プロセスをもって被処理材の前処理やプロ
セス条件等に数々の工夫が従来から施されている。2. Description of the Related Art Generally, when a member is made highly functional by coating the surface with a film, it is required that the material to be treated as an underlayer and the film have excellent adhesion. Therefore, in industrial use, various methods have been conventionally applied to the pretreatment of the material to be treated, the process conditions and the like by a wet process such as plating or a dry process such as vapor deposition.
【0003】この被処理材と皮膜との密着性の問題は、
両者の組合せによっても大きく影響される。例えば炭素
皮膜、特にダイヤモンド及びダイヤモンドライクカーボ
ンの構造を持つ皮膜を例に挙げると、被処理材がシリコ
ン系材料である場合にはある程度の密着性が得られる技
術がCVD等に於て実現されているが、被処理材が炭化
タングステン等の超硬合金であるとその密着性は劣り、
更に鉄系材に関しては殆ど実用的な密着性が得られてい
ない。The problem of the adhesion between the material to be treated and the film is
It is also greatly affected by the combination of both. For example, taking a carbon film, particularly a film having a structure of diamond and diamond-like carbon as an example, a technique capable of obtaining a certain degree of adhesion when the material to be treated is a silicon-based material has been realized in CVD or the like. However, if the material to be treated is a cemented carbide such as tungsten carbide, its adhesion is poor,
Furthermore, practically good adhesion has not been obtained for iron-based materials.
【0004】このような被処理材の種類により密着性が
劣るという問題を解決する方法として、被処理材の表面
を、形成しようとする皮膜と密着性の良い材質に改質す
ることが考えられる。ダイヤモンド及びダイヤモンドラ
イクカーボン皮膜を再び例に挙げると、このような考え
に基づき種々の被処理材で高密着性を得るための提案が
なされている。例えば、特開昭62−10300号公報
には、被処理材と炭素皮膜との間に金属及びその炭化物
や窒化物等の中間層を挟み込むことにより密着性を向上
させた部材が提案されているが、上記の方法では中間層
と皮膜との密着性に更に改善の余地があることや、中間
層を作るために工程数が増加してしまう等のデメリット
が多かった。As a method for solving the problem that the adhesion is poor depending on the type of the material to be treated, it is conceivable to modify the surface of the material to be treated to a material having good adhesion to the film to be formed. . Taking diamonds and diamond-like carbon coatings as examples again, proposals have been made to obtain high adhesion with various materials to be treated based on this idea. For example, Japanese Patent Application Laid-Open No. 62-10300 proposes a member having an improved adhesion by sandwiching an intermediate layer of a metal and its carbide or nitride between a material to be treated and a carbon film. However, the above-mentioned method has many demerits such that there is room for further improvement in the adhesion between the intermediate layer and the film, and the number of steps for forming the intermediate layer increases.
【0005】一方、特開昭58−153774号公報に
は、成膜とイオン注入を同時に併用する方法が、特開昭
59−93348号公報には成膜を行うのにイオンビー
ム蒸着法とイオン注入法とを併用する方法が、特開平2
−250967号公報には被処理材に周期律表IVa
族、Va族またはVIa族元素を注入してさらに皮膜を
被覆する方法が開示されている。On the other hand, Japanese Unexamined Patent Publication (Kokai) No. 58-153774 discloses a method of simultaneously using film formation and ion implantation, and Japanese Unexamined Patent Publication (Kokai) No. 59-93348 discloses a method of ion beam evaporation and ion implantation. A method that uses the injection method in combination is disclosed in Japanese Patent Application Laid-Open No. Hei 2
No. 250967 discloses a material of the periodic table IVa.
Methods of implanting Group III, Va or VIa elements to further coat the film are disclosed.
【0006】しかしながら、これらイオンビームを併用
する方法はいずれも成膜装置とイオンビーム発生装置と
が互いに異なる独立の装置であり、そのために装置全体
が大型化し、初期設備投資及びランニングコストが増大
し、結果としてある程度の密着性の向上は得られるもの
の、製造コストが増大する結果を招く。However, in all of these methods using ion beams, the film forming apparatus and the ion beam generating apparatus are different from each other, so that the apparatus as a whole becomes large and the initial capital investment and running cost increase. As a result, although some improvement in adhesion can be obtained, the manufacturing cost is increased.
【0007】[0007]
【発明が解決しようとする課題】本発明は上記したよう
な従来技術の問題点に鑑みなされたものであり、その主
な目的は、成膜とイオンビームの発生とを1つの装置で
行うことにより、製造コストが高騰化することなく幅広
い種類の被処理材に対して密着性の高い皮膜を形成する
ことが可能な皮膜形成装置を提供することにある。SUMMARY OF THE INVENTION The present invention has been made in view of the above-mentioned problems of the prior art, and its main purpose is to perform film formation and ion beam generation by one apparatus. Accordingly, it is an object of the present invention to provide a film forming apparatus capable of forming a film having high adhesion to a wide variety of materials to be processed without increasing the manufacturing cost.
【0008】[0008]
【課題を解決するための手段】上記した目的は、本発明
によれば、処理室内に保持された基板表面に皮膜を形成
するべく、成膜材料を溶融、蒸発させるための真空アー
ク放電電極と、前記放電により生じたプラズマを閉じ込
めるための真空プラズマ室と、前記真空プラズマ室と前
記処理室との間に重畳するように設けられ、かつ前記プ
ラズマを前記処理室に取り出すための孔が設けられた複
数のグリッド電極からなるグリッド電極の組と、前記各
電極に電圧を印加するための電源とを有する皮膜形成装
置に於て、前記グリッド電極の組が、孔の径pと各グリ
ッド電極間の距離dとの比p/dが1を超える第1の孔
と、前記比p/dが1以下の第2の孔とを有することを
特徴とする皮膜形成装置を提供することにより達成され
る。According to the present invention, the above object is to provide a vacuum arc discharge electrode for melting and evaporating a film forming material so as to form a film on the surface of a substrate held in a processing chamber. A vacuum plasma chamber for confining the plasma generated by the discharge, a hole provided so as to overlap between the vacuum plasma chamber and the processing chamber, and a hole for taking out the plasma into the processing chamber. In a film forming apparatus having a set of grid electrodes composed of a plurality of grid electrodes and a power supply for applying a voltage to each of the electrodes, the set of grid electrodes includes a hole diameter p and a space between the grid electrodes. It is achieved by providing a film forming apparatus characterized by having a first hole having a ratio p / d with respect to the distance d of more than 1 and a second hole having the ratio p / d of not more than 1. It
【0009】尚、ここで述べているプラズマにはイオ
ン、電子、中性原子に加えて真空アーク放電では通常発
生することが知られている陰極材料の溶融パーティクル
を含んでも良いことは云うまでもない。It is needless to say that the plasma described here may contain, in addition to ions, electrons, and neutral atoms, molten particles of a cathode material which is generally known to be generated in a vacuum arc discharge. Absent.
【0010】[0010]
【作用】真空アーク放電は、陰極近傍のカソードスポッ
トと呼ばれる部分に於て蒸発した陰極材料の構成原子を
イオン化してプラズマを形成する。被処理材を直接この
プラズマに曝すことにより皮膜形成の媒質としたり、プ
ラズマに対して負電圧に印加したグリッド電極の組をプ
ラズマに密着して設置する構成を取ることによりイオン
ビーム発生を行うイオン源プラズマとして用いられてき
た。The vacuum arc discharge ionizes the constituent atoms of the cathode material evaporated in a portion called a cathode spot near the cathode to form plasma. Ions that generate an ion beam by exposing the material to be treated directly to this plasma as a medium for film formation or by arranging a set of grid electrodes applied with a negative voltage to the plasma in close contact with the plasma It has been used as a source plasma.
【0011】しかし、これら真空アークイオン源技術と
アーク成膜技術とは真空アーク放電という同じ方式のプ
ラズマ発生法を用いてはいるが、互いに異なる技術とし
て発達してきた。即ち、図3に示される真空アーク成膜
装置では発生したプラズマ自体を被処理材11の表面に
作用させるために処理室21内部で電極22をもってプ
ラズマを発生させてその中に被処理材を曝す構成を取る
ことから、真空蒸着やイオンプレーティングの範中に含
まれる成膜技術である。また、図4に示されるように、
真空アークイオン源装置は、被処理材11の処理室31
と、真空アークプラズマを発生するべく真空アーク放電
電極33が設けられた真空プラズマ室32とを有し、処
理室31と真空プラズマ室32との間には互いに重畳す
るように設けられた複数のグリッド電極からなるグリッ
ド電極の組34が配され、電源38、39によりビーム
引出し電圧及びサプレッサ電圧が印加されるようになっ
ている。このような真空アークイオン源装置では発生し
たプラズマをイオン源内空間に閉じ込めて動作させるた
めに、処理室とプラズマ反応室とを分離させた状態で被
処理材の処理を行うようになっている。これらの技術は
相互に発想が異なるものであった。However, although the vacuum arc ion source technique and the arc film forming technique use the same plasma generation method called vacuum arc discharge, they have been developed as mutually different techniques. That is, in the vacuum arc film forming apparatus shown in FIG. 3, in order to cause the generated plasma itself to act on the surface of the material 11 to be processed, plasma is generated with the electrode 22 inside the processing chamber 21 and the material to be processed is exposed therein. This is a film forming technology that is included in the range of vacuum vapor deposition and ion plating because of its structure. Also, as shown in FIG.
The vacuum arc ion source device includes a processing chamber 31 for the material 11 to be processed.
And a vacuum plasma chamber 32 in which a vacuum arc discharge electrode 33 is provided to generate vacuum arc plasma, and a plurality of vacuum plasma chambers 32 are provided between the processing chamber 31 and the vacuum plasma chamber 32 so as to overlap each other. A grid electrode set 34 composed of grid electrodes is arranged, and a beam extraction voltage and a suppressor voltage are applied by power sources 38 and 39. In such a vacuum arc ion source device, in order to confine the generated plasma in the space inside the ion source to operate, the material to be processed is processed in a state in which the processing chamber and the plasma reaction chamber are separated. These technologies had different ideas.
【0012】本発明による皮膜形成装置は、真空アーク
プラズマに接してプラズマを取り出せる孔をイオンビー
ム引出しグリッド電極の組に設け、内部のプラズマ等真
空アーク媒質をこの孔を通して噴出させて処理室内に導
入し、被処理材に照射するものである。ここで、プラズ
マに接するグリッド電極にアスペクト比が1以下のイオ
ンビーム引出し孔とアスペクト比が1を越えるプラズマ
取り出し孔とを併存させることにより、被処理材には該
装置より発生したプラズマとイオンビームとを同時に照
射して、皮膜形成を行うようにしている。ただし、プラ
ズマを取り出す孔からも最適条件ではないもののある程
度のイオンビーム引出しは行われることから、プラズマ
噴出孔はイオンビーム引出し孔の機能を兼ねていても構
わない。In the film forming apparatus according to the present invention, a hole for contacting vacuum arc plasma to take out plasma is provided in a set of ion beam extraction grid electrodes, and a vacuum arc medium such as internal plasma is ejected through this hole and introduced into the processing chamber. Then, the material to be treated is irradiated. Here, the ion beam extraction hole having an aspect ratio of 1 or less and the plasma extraction hole having an aspect ratio of more than 1 coexist in the grid electrode in contact with the plasma, so that the plasma generated by the apparatus and the ion beam are generated in the material to be treated. And are simultaneously irradiated to form a film. However, although the ion beam extraction is performed to some extent from the hole for taking out the plasma, the plasma ejection hole may also have the function of the ion beam extraction hole.
【0013】通常、プラズマからイオンビームを取り出
すイオン源の動作時に、イオンビーム引出し孔の直径を
p、引出しグリッド電極の間隔をdとすると、p/dを
アスペクト比と呼ぶ。このイオンビーム引出し孔から取
り出せるイオンビーム電流はアスペクト比の二乗に比例
して増加するため、良好なプラズマの状態を保ちながら
できるだけアスペクト比の大きなイオンビーム引出し構
造を設計することが望ましい。しかし、アスペクト比を
大きく取ることは即ち孔径が電極間隔に対して大きくな
ることであり、アスペクト比が大きすぎると孔の淵と中
心部との電位差が増大して良好なイオンビームの引出し
が行えなくなるために、通常はアスペクト比は1以下で
設計される。それに対して本発明装置ではプラズマを取
り出すためにアスペクト比が1を越えた孔を設けてこの
孔からプラズマを噴出させるようにし、構成を簡単化し
て装置コストを低減し、信頼性を向上しながら、更に密
着性の高い皮膜を得ることができるようにしている。Usually, when operating an ion source for extracting an ion beam from plasma, p / d is called an aspect ratio, where p is the diameter of the ion beam extraction hole and d is the distance between the extraction grid electrodes. Since the ion beam current that can be extracted from this ion beam extraction hole increases in proportion to the square of the aspect ratio, it is desirable to design an ion beam extraction structure having a maximum aspect ratio while maintaining a good plasma state. However, taking a large aspect ratio means that the hole diameter becomes large with respect to the electrode interval.If the aspect ratio is too large, the potential difference between the edge of the hole and the central portion increases, and good ion beam extraction can be performed. In order to eliminate it, the aspect ratio is usually designed to be 1 or less. On the other hand, in the device of the present invention, in order to take out plasma, a hole having an aspect ratio of more than 1 is provided so that the plasma is ejected from this hole, the structure is simplified, the device cost is reduced, and the reliability is improved. In addition, it is possible to obtain a film with higher adhesion.
【0014】[0014]
【実施例】以下に、本発明の一実施例について添付の図
面を参照して詳細に説明する。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described in detail below with reference to the accompanying drawings.
【0015】本発明の真空アーク皮膜形成装置は、被処
理材としての基板11の表面に炭素皮膜12を形成する
ための処理室1と、真空アークプラズマを発生するため
の真空プラズマ室2とを有している。真空プラズマ室2
には真空アーク放電電極3が設けられている。また、処
理室1と真空プラズマ室2との間には互いに重畳するよ
うに設けられた複数のグリッド電極5〜7からなるグリ
ッド電極の組4が設けられている。このグリッド電極5
とグリッド電極7との間には電源8によりビーム引出し
電圧が印加されるようになっており、グリッド電極6と
グリッド電極7との間には電源9によりサプレッサ電圧
が印加されるようになっている。The vacuum arc film forming apparatus of the present invention comprises a processing chamber 1 for forming a carbon film 12 on the surface of a substrate 11 as a material to be processed, and a vacuum plasma chamber 2 for generating a vacuum arc plasma. Have Vacuum plasma chamber 2
Is provided with a vacuum arc discharge electrode 3. Further, between the processing chamber 1 and the vacuum plasma chamber 2, a grid electrode set 4 including a plurality of grid electrodes 5 to 7 provided so as to overlap each other is provided. This grid electrode 5
The beam extraction voltage is applied between the grid electrode 7 and the grid electrode 7 by the power supply 8, and the suppressor voltage is applied between the grid electrode 6 and the grid electrode 7 by the power supply 9. There is.
【0016】グリッド電極の組4の各グリッド電極5〜
7には、図2(a)に示されるように、中心に1個の第
1の孔4aと、中心より15mmの円周上に6個、更に
中心より25mmの円周上に12個の第2の孔4bとが
開設されている。ここで、図2(b)に示されるよう
に、各グリッド電極5〜7の間隔dは10mm、第1の
孔4aの径pは20mmとなっており、図2(c)に示
されるように、第2の孔4bの径pは6mmとなってい
る。即ち、第1の孔4aの径pと各グリッド電極間の距
離dとの比(アスペクト比)p/dは1以下(0.
6)、第2の孔4bの径pと各グリッド電極間の距離d
との比(アスペクト比)p/dは1を超える(2.0)
ようになっている。Each grid electrode 5 of the grid electrode set 4
In FIG. 7, as shown in FIG. 2 (a), one first hole 4 a is provided at the center, six holes are provided on the circumference of 15 mm from the center, and 12 holes are provided on the circumference of 25 mm from the center. A second hole 4b is opened. Here, as shown in FIG. 2B, the distance d between the grid electrodes 5 to 7 is 10 mm, and the diameter p of the first holes 4a is 20 mm, as shown in FIG. In addition, the diameter p of the second hole 4b is 6 mm. That is, the ratio (aspect ratio) p / d of the diameter p of the first hole 4a and the distance d between the grid electrodes is 1 or less (0.
6), the diameter p of the second hole 4b and the distance d between each grid electrode
The ratio (aspect ratio) p / d exceeds 1 (2.0)
It is like this.
【0017】成膜条件としては、基板11に炭素鋼試料
(炭素濃度=1重量%)を用い、真空度を10-3Pa以
下とし、真空アーク電流を100A〜200Aの範囲と
した。また、イオンビーム引出しグリッド電極の組4に
は加速電圧として40kVを印加した。更に、真空アー
クプラズマ発生部としての真空プラズマ室2から基板1
1までの距離は約30cmとした。As film forming conditions, a carbon steel sample (carbon concentration = 1% by weight) was used for the substrate 11, the degree of vacuum was 10 −3 Pa or less, and the vacuum arc current was in the range of 100 A to 200 A. Moreover, 40 kV was applied as an accelerating voltage to the ion beam extraction grid electrode set 4. In addition, the vacuum plasma chamber 2 as the vacuum arc plasma generation unit is connected to the substrate 1
The distance to 1 was about 30 cm.
【0018】上記した条件で25分処理したところ80
0オングストロームの炭素皮膜12が得られた。一方、
比較材として、真空蒸着装置でほぼ同一の膜厚の炭素皮
膜を約4分で成膜時間で形成した。そして、これらの方
法、即ち本発明による炭素皮膜形成と炭素イオンビーム
照射とを同時に行った場合と、蒸着のみにより皮膜を形
成した場合の炭素鋼球によるスクラッチ試験の結果を表
1に示す。When treated for 25 minutes under the above conditions, 80
A carbon film 12 of 0 angstrom was obtained. on the other hand,
As a comparative material, a carbon film having almost the same film thickness was formed in a film forming time in about 4 minutes using a vacuum vapor deposition apparatus. Table 1 shows the results of the scratch test using carbon steel balls by these methods, that is, the case where the carbon film formation according to the present invention and the carbon ion beam irradiation are simultaneously performed, and the case where the film is formed only by vapor deposition.
【0019】[0019]
【表1】 [Table 1]
【0020】形成した皮膜を評価した結果では、従来装
置により形成した皮膜は最も軽荷重である0.2Nに於
ても1回の摺動で即座に剥離が生じたのに対して、本発
明装置により形成した皮膜は1Nの高荷重での10往復
の摺動の後にも全く剥離が生じなかった。As a result of evaluating the formed film, the film formed by the conventional apparatus was immediately peeled off by one sliding even at the lightest load of 0.2 N. The film formed by the device did not peel at all even after sliding 10 times under a high load of 1N.
【0021】[0021]
【発明の効果】以上の説明により明らかなように、本発
明によれば、真空アークプラズマに接してプラズマを取
り出せる孔をイオンビーム引出しグリッド電極の組に設
け、内部のプラズマ等真空アーク媒質をこの孔を通して
噴出させて処理室内に導入し、被処理材に照射するよう
にし、プラズマに接するグリッド電極にアスペクト比が
1以下のイオンビーム引出し孔とアスペクト比が1を越
えるプラズマ取り出し孔とを併存させることにより、被
処理材には該装置より発生したプラズマとイオンビーム
とを同時に照射して、皮膜形成を行うようにすること
で、構成を著しく簡単化して装置コストを低減し、信頼
性を向上しながら、更に密着性の高い皮膜を得ることが
できるものであり、処理速度の低下のデメリットを補っ
て余りあるものである。As is apparent from the above description, according to the present invention, a hole for contacting the vacuum arc plasma to take out plasma is provided in the set of ion beam extraction grid electrodes, and the vacuum arc medium such as plasma inside is provided. The particles are ejected through the holes to be introduced into the processing chamber to irradiate the material to be processed, and the ion beam extraction holes having an aspect ratio of 1 or less and the plasma extraction holes having an aspect ratio of more than 1 coexist on the grid electrode in contact with the plasma. By simultaneously irradiating the material to be treated with the plasma and the ion beam generated by the device to form a film, the structure is significantly simplified, the device cost is reduced, and the reliability is improved. However, it is possible to obtain a film with higher adhesiveness, which is more than enough to compensate for the demerit of lowering the processing speed. .
【図1】本発明の一実施例を示す装置の構成を示す模式
図である。FIG. 1 is a schematic diagram showing a configuration of an apparatus showing one embodiment of the present invention.
【図2】グリッド電極の拡大図であり、(a)は正面
図、アスペクト比が1以下の場合の断面図、(b)はア
スペクト比が1を越える場合の断面図を示す。2A and 2B are enlarged views of a grid electrode, in which FIG. 2A is a front view, a cross-sectional view when the aspect ratio is 1 or less, and FIG. 2B is a cross-sectional view when the aspect ratio exceeds 1.
【図3】従来の真空アーク成膜装置の構成を示す模式図
である。FIG. 3 is a schematic diagram showing a configuration of a conventional vacuum arc film forming apparatus.
【図4】従来の真空アークイオンビーム照射装置の構成
を示す模式図である。FIG. 4 is a schematic diagram showing a configuration of a conventional vacuum arc ion beam irradiation device.
1 処理室 2 真空プラズマ室 3 真空アーク放電電極 4 グリッド電極の組 4a 第1の孔 4b 第2の孔 5〜7 グリッド電極 8、9 電源 11 基板 12 皮膜炭素 21 処理室 22 電極 31 処理室 32 真空プラズマ室 33 真空アーク放電電極 34 グリッド電極の組 38、39 電源 DESCRIPTION OF SYMBOLS 1 processing chamber 2 vacuum plasma chamber 3 vacuum arc discharge electrode 4 grid electrode set 4a 1st hole 4b 2nd hole 5-7 grid electrode 8, 9 power supply 11 substrate 12 coating carbon 21 processing chamber 22 electrode 31 processing chamber 32 Vacuum plasma chamber 33 Vacuum arc discharge electrode 34 Grid electrode set 38, 39 Power supply
─────────────────────────────────────────────────────
─────────────────────────────────────────────────── ───
【手続補正書】[Procedure amendment]
【提出日】平成5年10月12日[Submission date] October 12, 1993
【手続補正1】[Procedure Amendment 1]
【補正対象書類名】明細書[Document name to be amended] Statement
【補正対象項目名】図面の簡単な説明[Name of item to be corrected] Brief description of the drawing
【補正方法】変更[Correction method] Change
【補正内容】[Correction content]
【図面の簡単な説明】[Brief description of drawings]
【図1】本発明の一実施例を示す装置の構成を示す模式
図である。 FIG. 1 is a schematic diagram showing a configuration of an apparatus showing one embodiment of the present invention.
【図2】グリッド電極の拡大図であり、(a)は正面FIG. 2 is an enlarged view of a grid electrode, (a) is a front view.
図、(b)はアスペクト比が1以下の場合の断面図、Figure, (b) is a sectional view when the aspect ratio is 1 or less,
(c)はアスペクト比が1を越える場合の断面図を示(C) shows a cross-sectional view when the aspect ratio exceeds 1.
す。You
【図3】従来の真空アーク成膜装置の構成を示す模式図
である。FIG. 3 is a schematic diagram showing a configuration of a conventional vacuum arc film forming apparatus.
【図4】従来の真空アークイオンビーム照射装置の構成
を示す模式図である。FIG. 4 is a schematic diagram showing a configuration of a conventional vacuum arc ion beam irradiation device.
【符号の説明】 1 処理室 2 真空プラズマ室 3 真空アーク放電電極 4 グリッド電極の組 4a 第1の孔 4b 第2の孔 5〜7 グリッド電極 8、9 電源 11 基板 12 皮膜炭素 21 処理室 22 電極 31 処理室 32 真空プラズマ室 33 真空アーク放電電極 34 グリッド電極の組 38、39 電源[Explanation of Codes] 1 processing chamber 2 vacuum plasma chamber 3 vacuum arc discharge electrode 4 grid electrode set 4a first hole 4b second hole 5-7 grid electrode 8, 9 power supply 11 substrate 12 coating carbon 21 processing chamber 22 Electrode 31 Processing chamber 32 Vacuum plasma chamber 33 Vacuum arc discharge electrode 34 Grid electrode set 38, 39 Power supply
Claims (1)
を形成するべく、成膜材料を溶融、蒸発させるための真
空アーク放電電極と、前記放電により生じたプラズマを
閉じ込めるための真空プラズマ室と、前記真空プラズマ
室と前記処理室との間に重畳するように設けられ、かつ
前記プラズマを前記処理室に取り出すための孔が設けら
れた複数のグリッド電極からなるグリッド電極の組と、
前記各電極に電圧を印加するための電源とを有する皮膜
形成装置に於て、 前記グリッド電極の組が、孔の径pと各グリッド電極間
の距離dとの比p/dが1を超える第1の孔と、前記比
p/dが1以下の第2の孔とを有することを特徴とする
皮膜形成装置。1. A vacuum arc discharge electrode for melting and evaporating a film forming material to form a film on the surface of a substrate held in a processing chamber, and a vacuum plasma chamber for confining plasma generated by the discharge. A set of grid electrodes that are provided so as to overlap between the vacuum plasma chamber and the processing chamber and that are provided with holes for taking out the plasma into the processing chamber;
In a film forming apparatus having a power source for applying a voltage to each of the electrodes, the set of grid electrodes has a ratio p / d of a hole diameter p and a distance d between the grid electrodes of more than 1. A film forming apparatus having a first hole and a second hole having the ratio p / d of 1 or less.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11777893A JP3260905B2 (en) | 1993-04-20 | 1993-04-20 | Film forming equipment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11777893A JP3260905B2 (en) | 1993-04-20 | 1993-04-20 | Film forming equipment |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH06306619A true JPH06306619A (en) | 1994-11-01 |
JP3260905B2 JP3260905B2 (en) | 2002-02-25 |
Family
ID=14720094
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11777893A Expired - Lifetime JP3260905B2 (en) | 1993-04-20 | 1993-04-20 | Film forming equipment |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP3260905B2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100530735B1 (en) * | 2002-09-12 | 2005-11-28 | 송석균 | High pressure plasma shower discharge device |
KR100706809B1 (en) * | 2006-02-07 | 2007-04-12 | 삼성전자주식회사 | Apparatus for controlling ion beam and method of the same |
-
1993
- 1993-04-20 JP JP11777893A patent/JP3260905B2/en not_active Expired - Lifetime
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100530735B1 (en) * | 2002-09-12 | 2005-11-28 | 송석균 | High pressure plasma shower discharge device |
KR100706809B1 (en) * | 2006-02-07 | 2007-04-12 | 삼성전자주식회사 | Apparatus for controlling ion beam and method of the same |
US7629589B2 (en) | 2006-02-07 | 2009-12-08 | Samsung Electronics Co., Ltd. | Apparatus and method for controlling ion beam |
Also Published As
Publication number | Publication date |
---|---|
JP3260905B2 (en) | 2002-02-25 |
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