JPH0627200A - Semiconductor integrated circuit device - Google Patents

Abstract

PURPOSE:To provide a semiconductor IC unit which allows a scan circuit generated for diagnosing LSI single unit to be utilized with a scan interface mounted on a base board as a different interface. CONSTITUTION:A semiconductor IC unit 1 integrated of transistor circuits for configuring a flip flop on a semiconductor base board consists of an interface conversion circuit 2 (conversion means), selector 3, a normal operation circuit 4, an LSI single unit diagnosis scan control circuit 5 (scan control means), a flip flap 6, etc. An normal operation mode or LSI single unit diagnosis operation mode is selected by an normal operation/LSI single unit diagnosis common pin 8 (scan means) and a mode signal pin 9, and at the time of on-board scan in normal operation, the signal inputted from an on-board scan signal interface 7 is converted into the data for the LSI single unit diagnosis scan control circuit 5 by the inter-face conversion circuit 2.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor integrated circuit device, and more particularly, in a scan system in a semiconductor integrated circuit,
The present invention relates to a technique effectively applied to a semiconductor integrated circuit device which can be used as a scan interface in a board-mounted state with a scan circuit generated for diagnosing a single LSI.

[0002]

2. Description of the Related Art Conventionally, as a scan method in a semiconductor integrated circuit, for example, as disclosed in Japanese Patent Laid-Open No. 2-150930, the value of a flip-flop is input to an external specification of a scan circuit for reading and writing. There is a method of automatically generating scan circuits by generating scan logic from external specifications.

[0003]

However, in the prior art as described above, when scanning is performed by an interface different from the interface of the automatically generated scan circuit, the scan circuit must be created for each interface. There is.

That is, a scan circuit for diagnosing a single LSI has an interface adapted to an LSI tester, and in many cases, this scan circuit cannot be used for scanning in a board mounted state due to a difference in interface. There's a problem.

Therefore, an object of the present invention is to provide a semiconductor integrated circuit device in which a scan circuit generated for diagnosing a single LSI can be used in a scan interface in a board mounting state which is a different interface. It is in.

The above and other objects and novel features of the present invention will be apparent from the description of this specification and the accompanying drawings.

[0007]

Among the inventions disclosed in the present application, a brief description will be given to the outline of typical ones.
It is as follows.

That is, the semiconductor integrated circuit device of the present invention is a semiconductor integrated circuit device in which at least a transistor circuit forming a flip-flop is integrated on one semiconductor substrate, and an arbitrary flip-flop is input from the outside. A single failure diagnosis means having a scanning means for setting and / or resetting by signal control, and using the scanning means for diagnosing the failure of the semiconductor integrated circuit device by itself, and the scanning operation is controlled separately from the single failure diagnosis means. And a scan control means for controlling the scan.

In this case, the unit failure diagnosis means is
A single failure diagnosis is performed in order to operate the scanning means with an interface different from the interface used for single failure diagnosis, using a circuit created by the method of creating a semiconductor integrated circuit that automatically generates a circuit from the information of the normal operation circuit. A conversion means for converting an input / output signal of the means into an input / output signal of another interface is incorporated.

[0010]

According to the semiconductor integrated circuit device described above, the scan circuit, the single unit failure diagnosis unit and the scan control unit are provided, so that the scan circuit generated for the single unit diagnosis of the LSI can be used in different interfaces. it can.

That is, the conversion means for converting the interface of the scan circuit from the single LSI diagnosis to the scan in the board-mounted state is built into the LSI, so that the LS
The interface for I-unit diagnosis can be used for the scanning operation in the board mounted state. This allows the LSI
As the functions become more complicated, it is possible to realize a simple LSI internal operation monitor request.
I can be simplified and the cost can be reduced.

[0012]

1 is a block diagram showing the internal structure of a semiconductor integrated circuit device according to an embodiment of the present invention and its input / output signals.
3 is a configuration diagram showing a case where the semiconductor integrated circuit device of this embodiment is connected to an LSI tester, and FIG. 3 is a configuration diagram showing a case where the semiconductor integrated circuit device is mounted on a substrate.

First, the configuration of the semiconductor integrated circuit device of this embodiment will be described with reference to FIG.

The semiconductor integrated circuit device of this embodiment is, for example, a semiconductor integrated circuit device 1 in which at least a transistor circuit forming a flip-flop is integrated on a semiconductor substrate.
And an interface conversion circuit (conversion means) 2, a selector (SEL) 3, a normal operation circuit 4, an LSI single unit diagnosis scan control circuit (scan control means) 5, a flip-flop (FF) 6, and the like. The single failure diagnosis means having the circuit configuration of (2) has two operation modes, that is, a normal operation and a single LSI diagnosis operation.

The interface conversion circuit 2 includes:
The board mounting scan signal interface 7 is connected, and the selector 3 is connected to the normal operation / LSI single unit diagnostic common pin (scan means) 8 and the mode signal pin 9.

The interface conversion circuit 2 is an interface different from the interface used for diagnosing a single unit failure, and operates the common operation / LSI single unit diagnosing shared pin 8 so as to operate at L level.
It is a conversion means for converting the input / output signal of the scan control circuit 5 at the time of SI unit diagnosis into the input / output signal of another interface.

That is, the board mounting scan signal input from the board mounting scan signal interface 7 is converted into a signal for the LSI single unit diagnosis scan control circuit 5 and output to the selector 3. Further, the signal for the LSI single unit diagnosis scan control circuit 5 inputted from the selector 3 is converted into a board mounting scan signal and output to the board mounting scan signal interface 7.

The selector 3 switches between two modes, a normal operation and a single LSI diagnostic operation, in response to an input from the mode signal pin 9. For example, in the LSI single unit diagnosis operation mode, the normal operation / LSI single unit diagnosis common pin 8 and the LSI single unit diagnosis time scan control circuit 5 are connected, and in the normal operation mode, the normal operation / LSI single unit diagnosis common pin 8 and the normal operation Time circuit 4, interface conversion circuit 2 and L
The scan control circuit 5 is connected at the time of SI unit diagnosis.

The normal operation circuit 4 includes a flip-flop 6
Is used for normal operation.

The scan control circuit 5 for diagnosing the LSI alone is
The semiconductor integrated circuit device 1 is provided with a control unit for controlling the scan operation separately from the failure diagnosis of the single unit, and the scan control is performed according to the output signal of the selector 3. The scan control circuit 5 at the time of diagnosing the single LSI and its connection are automatically generated.

The flip-flop 6 indicates n flip-flops corresponding to the scan.

The board mounting scan signal interface 7 inputs and outputs a scan signal in the normal operation mode.

The normal operation / single LSI diagnostic shared pin 8 is
Scanning means for setting and / or resetting an arbitrary flip-flop 6 under external control. Input / output of the normal operation circuit 4 during normal operation, and scan control during LSI single diagnosis during the LSI single diagnosis operation mode. The input / output of the circuit 5 is performed.

The mode signal pin 9 is an input pin for a signal indicating whether the operation mode of the semiconductor integrated circuit device 1 is a normal operation or a single LSI diagnostic operation.

Next, the operation of this embodiment will be described with reference to FIG. 2 for the individual LSI diagnosis and FIG. 3 for the board mounting scan operation.

First, the LSI single unit diagnosis is for diagnosing the single semiconductor integrated circuit device 1, and the normal operation is not performed at this time.

First, the LSI tester 10 shown in FIG. 2 specifies the LSI single-diagnosis operation mode for the mode signal pin 9, and the scan control and input data signals input from the normal operation / LSI single-diagnosis shared pin 8 are shown in FIG. It is input to the scan control circuit 5 at the time of LSI single unit diagnosis through the selector 3 of 1.

Further, the scan control circuit 5 for diagnosing the LSI alone sets a value in the flip-flop 6 according to the scan control and input data signal, and the value set in the flip-flop 6 from the flip-flop 6 through the normal operation circuit 4 is set. The read value is output to the common operation / LSI single-unit diagnosis common pin 8 through the selector 3 and the value is transmitted to the LSI tester 10.

As a result, the LSI tester 10 can collate the input value with the expected value and diagnose the normal operation circuit 4 and the flip-flop 6.

Subsequently, in the board mounting scan, setting and reading of a value to the flip-flop 6 are performed from the outside of the semiconductor integrated circuit device 1 during normal operation.

First, when the semiconductor integrated circuit device 1 is mounted on the substrate 11 shown in FIG. 3, the mode signal pin 9 is set to the normal operation mode by the scan control device 12, and the board mounting scan signal interface 7 is used. The input scan control and input data signals are sent to the interface conversion circuit 2 of FIG.
Scan control for input, converted into an input data signal, and input to the scan control circuit 5 during LSI single unit diagnosis through the selector 3.

Then, the scan control circuit 5 for diagnosing the LSI alone performs L control by performing scan control and setting and reading of the value of the flip-flop 6 in accordance with the input data signal.
The interface generated for the SI single diagnosis can be used for the board mounting scan which is a different interface.

Therefore, the semiconductor integrated circuit device 1 of this embodiment
According to this, the interface conversion circuit 2, the selector 3 and the L 3 are used as the single failure diagnosis means of the semiconductor integrated circuit device 1.
Since the SI single unit diagnosis scan control circuit 5 and the like are provided, two operation modes of normal operation and LSI single unit diagnosis operation can be selected by the normal operation / LSI single unit diagnosis common pin 8 and the mode signal pin 9. It is possible to use the interface for single diagnosis as the scan interface in the board mounted state.

Although the invention made by the present inventor has been specifically described based on the embodiments, the present invention is not limited to the embodiments and various modifications can be made without departing from the scope of the invention. Needless to say.

For example, the semiconductor integrated circuit device 1 of the present embodiment has been described as being used for the scanning operation in the board mounted state, but the present invention is not limited to the above embodiment, and a single failure diagnosis. It goes without saying that other interfaces different from the one used for mounting on the board can also be used.

[0036]

The effects obtained by the typical ones of the inventions disclosed in the present application will be briefly described as follows.
It is as follows.

That is, a single unit failure diagnosis having a scanning unit for setting and / or resetting any of the flip-flops by controlling an input signal from the outside, and using the scanning unit for diagnosing the failure of the semiconductor integrated circuit device as a single unit. Means and a scan control means for controlling the scan operation separately from the single failure diagnosis means, and further, an input / output signal of the single failure diagnosis means is provided to the single failure diagnosis means, which is an interface different from the interface for the single failure diagnosis. By incorporating the conversion means for converting the input / output signals into the input / output signals, the scan circuit generated for diagnosing the single LSI can be used in different interfaces.

As a result, since the interface for diagnosing the LSI alone can be used for the scanning operation in the board mounted state, the L function is simplified as the LSI function becomes complicated.
It is possible to obtain a semiconductor integrated circuit device which can meet the demands of the SI internal operation monitor, and can be used as a single LSI failure diagnosis means to simplify the LSI and reduce the cost.

[Brief description of drawings]

FIG. 1 is a configuration diagram showing an internal configuration of a semiconductor integrated circuit device which is an embodiment of the present invention and its input / output signals.

FIG. 2 is a configuration diagram showing a case where the semiconductor integrated circuit device of this embodiment is connected to an LSI tester.

FIG. 3 is a configuration diagram showing a case where the semiconductor integrated circuit device of this embodiment is mounted on a substrate.

[Explanation of symbols]

DESCRIPTION OF SYMBOLS 1 semiconductor integrated circuit device 2 interface conversion circuit (conversion means) 3 selector 4 normal operation circuit 5 LSI single unit diagnostic scan control circuit (scan control unit) 6 flip-flop 7 board mounting scan signal interface 8 normal operation / LSI single unit Diagnostic common pin (scan means) 9 mode signal pin 10 LSI tester 11 substrate 12 scan control device

 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Sataka Ishikawa 1 Horiyamashita, Hadano City, Kanagawa Prefecture Hitate Manufacturing Co., Ltd. Kanagawa Plant

Claims (2)

[Claims] 1. A semiconductor integrated circuit device in which at least a transistor circuit forming a flip-flop is integrated on one semiconductor substrate, wherein any of the flip-flops is set and / or set by controlling an input signal from the outside.
Alternatively, a single unit failure diagnosis unit having a resetting unit and using the scanning unit for single unit failure diagnosis of the semiconductor integrated circuit device, and a scan control unit for controlling a scan operation separately from the single unit failure diagnosis unit. A semiconductor integrated circuit device having a built-in device. 2. The unit failure diagnosing means uses a circuit created by a method of creating a semiconductor integrated circuit that automatically creates a circuit from information on a normal operation circuit, and is different from the interface at the time of the unit failure diagnosis. 2. The semiconductor device according to claim 1, further comprising a converting unit for converting an input / output signal of the single unit failure diagnosing unit into an input / output signal of the another interface in order to operate the scanning unit with the interface. Integrated circuit device.