JPH06271068A - Thin plate material soaking device - Google Patents

Thin plate material soaking device

Info

Publication number
JPH06271068A
JPH06271068A JP5815193A JP5815193A JPH06271068A JP H06271068 A JPH06271068 A JP H06271068A JP 5815193 A JP5815193 A JP 5815193A JP 5815193 A JP5815193 A JP 5815193A JP H06271068 A JPH06271068 A JP H06271068A
Authority
JP
Japan
Prior art keywords
thin plate
cassette
plate material
liquid
wafer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5815193A
Other languages
Japanese (ja)
Other versions
JP2675734B2 (en
Inventor
Kaoru Niihara
薫 新原
Yasuhiro Kurata
康弘 倉田
Masashi Sawamura
雅視 澤村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dainippon Screen Manufacturing Co Ltd
Original Assignee
Dainippon Screen Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dainippon Screen Manufacturing Co Ltd filed Critical Dainippon Screen Manufacturing Co Ltd
Priority to JP5815193A priority Critical patent/JP2675734B2/en
Priority to US08/210,177 priority patent/US5485644A/en
Publication of JPH06271068A publication Critical patent/JPH06271068A/en
Application granted granted Critical
Publication of JP2675734B2 publication Critical patent/JP2675734B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Abstract

PURPOSE:To prevent a thin plate material from springing out from a thin plate material housing part by arranging a housing part moving means to move a thin plate material housing part vertically in a liquid tank and a liquid flow forming means to form a liquid flow to the inmost side from an opening of the thin plate material housing part at least in the vicinity of a liquid level in the liquid tank. CONSTITUTION:When a cassette C housing vertically a large number of wafers W is positioned and loaded on a cassette stand 32 of a submerged loader 1 by a positioning member 33, a raising and lowering frame 19 is lowered, and soaks the cassette C in a water tank. At this time, pure water supplied from a pure water supply port 15 overflows from a dam 14. As a result, a water flow running toward the inmost side from an opening 13 of the cassette C is formed in the vicinity of a liquid level of the water tank. Thereby, when the raising and lowering frame 19 is lowered, the respective wafers W receive energizing force by the water flow, so that the wafers W do not slide out from the cassette C. Even when the wafers W are supplied to the reverse cleaning device 2 side, a pure water flow running toward the inmost side from the opening is formed in the vicinity of the liquid level.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、薄板材浸漬装置、特
に、多数の薄板材を上下多段に収納する薄板材収納部を
液体中に浸漬する薄板材浸漬装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a thin plate material immersing device, and more particularly to a thin plate material immersing device for immersing a thin plate material storing part for storing a large number of thin plate materials in a vertical manner in a liquid.

【0002】[0002]

【従来の技術】ウエハ(薄板材の一例)は、清浄なクリ
ーンルーム内において汚染されないように自動的に搬送
され処理される。この種のウエハでは、搬送中に空気に
触れると空気中に浮遊する僅かな埃が付着したり、表面
が酸化されたりして不良品になるおそれがある。また、
ポリッシング後のウエハを洗浄する場合には、ウエハ表
面に残ったポリッシング剤が乾燥してしまうとポリッシ
ング剤の洗浄除去が非常に困難になる。このため、ウエ
ハを処理装置へ供給するまで、カセットに収容したウエ
ハをたとえば純水等の液中に浸漬する薄板材浸漬装置が
用いられる(実公平3−6581号)。
2. Description of the Related Art A wafer (an example of a thin plate material) is automatically transported and processed in a clean clean room so as not to be contaminated. When a wafer of this type is exposed to air during transportation, a small amount of dust floating in the air may be attached or the surface may be oxidized, resulting in a defective product. Also,
When cleaning the wafer after polishing, it becomes very difficult to clean and remove the polishing agent if the polishing agent remaining on the wafer surface is dried. For this reason, a thin plate material immersing device is used in which the wafers housed in the cassette are immersed in a liquid such as pure water until the wafers are supplied to the processing device (Jpn.

【0003】この種の薄板材浸漬装置は、多数のウエハ
を上下多段に収納可能なカセットを液中に浸漬させるた
めの液槽と、このカセットを液槽内で上下動させるため
のローダとを備えている。カセットの一側面には開口が
形成されており、この開口からウエハが1枚ずつ取り出
される。この薄板材浸漬装置では、ローダにカセットを
取り付けた状態で液槽中にカセットを浸漬させ、ウエハ
と空気との接触やウエハ表面の乾燥を防止する。また、
ウエハを取り出す都度ローダを上下させて開口側からウ
エハを1枚ずつ取り出する。
This type of thin plate material immersing device has a liquid tank for immersing a cassette capable of accommodating a large number of wafers vertically and in multiple stages in a liquid, and a loader for vertically moving the cassette in the liquid tank. I have it. An opening is formed on one side surface of the cassette, and wafers are taken out one by one from this opening. In this thin plate material immersing device, the cassette is immersed in the liquid tank with the cassette attached to the loader to prevent contact between the wafer and air and drying of the wafer surface. Also,
Each time the wafer is taken out, the loader is moved up and down to take out the wafers one by one from the opening side.

【0004】[0004]

【発明が解決しようとする課題】この種の装置において
は、ウエハをローダにより液中から取り出す際や液中に
浸漬する際に、液流又は気泡等の影響により、ウエハが
カセットの開口から滑り出してしまう可能性がある。カ
セットからウエハが飛び出すと、ウエハが液槽の壁面等
に衝突して損傷する。
In this type of apparatus, when the wafer is taken out of the liquid by the loader or immersed in the liquid, the wafer slides out from the opening of the cassette due to the influence of the liquid flow or bubbles. There is a possibility that it will end up. When the wafer jumps out of the cassette, the wafer collides with the wall surface of the liquid tank and is damaged.

【0005】本発明の目的は、薄板材収納部からの薄板
材の飛び出しを防止することにある。
An object of the present invention is to prevent the thin plate material from protruding from the thin plate material storage portion.

【0006】[0006]

【課題を解決するための手段】本発明に係る薄板材浸漬
装置は、多数の薄板材を上下多段に収納し、かつ側面に
薄板材を出し入れするための開口を有する薄板材収納部
を液中に浸漬する装置である。この装置は液槽と収納部
移動手段と液流形成手段とを備えている。液槽は、内部
に液体を貯溜し、薄板材収納部を液体中に浸漬するため
のものである。収納部移動手段は、薄板材収納部を液槽
内で上下動させるためのものである。液流形成手段は、
液槽内の少なくとも液面付近で、薄板材収納部の開口か
ら奥側へと液流を形成するものである。
A thin plate material immersing device according to the present invention has a thin plate material storage section for storing a large number of thin plate materials in a multi-tiered manner and having a side surface with an opening for inserting and removing the thin plate material. It is a device to be immersed in. This device includes a liquid tank, a storage unit moving unit, and a liquid flow forming unit. The liquid tank is for storing a liquid inside and immersing the thin plate material storage portion in the liquid. The storage unit moving means is for moving the thin plate storage unit up and down in the liquid tank. The liquid flow forming means is
A liquid flow is formed at least in the vicinity of the liquid surface in the liquid tank from the opening of the thin plate material storage portion to the inner side.

【0007】[0007]

【作用】本発明に係る薄板材浸漬装置では、多数の薄板
材を上下多段に収納した薄板材収納部が、収納部移動手
段により液槽内に浸漬される。この収納部移動手段によ
る上下動の際に、液流形成手段が、液槽内の少なくとも
液面付近で、開口から奥側へと液流を形成する。この結
果、薄板材収納部に収納された薄板材が、開口から奥側
へと形成された液流によって奥側に付勢され、薄板材収
納部からの飛び出しが防止される。
In the thin plate material immersing device according to the present invention, the thin plate material housing part, which houses a large number of thin plate materials vertically and in multiple stages, is immersed in the liquid tank by the housing part moving means. When the container moving means moves up and down, the liquid flow forming means forms a liquid flow from the opening to the inner side at least near the liquid surface in the liquid tank. As a result, the thin plate material stored in the thin plate material storage portion is biased to the back side by the liquid flow formed from the opening to the back side, and is prevented from jumping out of the thin plate material storage portion.

【0008】[0008]

【実施例】図1及び図2は、本発明の一実施例を採用し
た基板処理装置を示している。この基板処理装置は、半
導体ウエハに対する洗浄及び乾燥処理を行う。これらの
図において、基板処理装置は、カセットCに収納された
多数のウエハWを純水中に浸漬する水中ローダ1と、カ
セットCから取り出されたウエハWの裏面(下面)をブ
ラシ洗浄する裏面洗浄装置2と、ウエハWの表面(上
面)をブラシ洗浄する表面洗浄装置3と、ウエハWの水
洗及び乾燥処理を行う水洗乾燥装置4と、処理されたウ
エハWをカセットCに収容して排出するためのアンロー
ダ5とがこの順に配置された構成となっている。
1 and 2 show a substrate processing apparatus adopting an embodiment of the present invention. This substrate processing apparatus performs cleaning and drying processing on a semiconductor wafer. In these figures, the substrate processing apparatus includes an underwater loader 1 for immersing a large number of wafers W stored in a cassette C in pure water, and a back surface for brush cleaning the back surface (lower surface) of the wafer W taken out from the cassette C. Cleaning device 2, surface cleaning device 3 for brush-cleaning the surface (upper surface) of wafer W, rinsing / drying device 4 for rinsing and drying wafer W, and treated wafer W stored in cassette C and discharged. The unloader 5 for doing so is arranged in this order.

【0009】各装置1〜5の間には、多関節ロボット7
を有する搬送装置6が配置されている。この搬送装置6
と各装置1〜5との間は、図示しないシャッタにより遮
断され得る。なお、上流側の3つの搬送装置6には、多
関節ロボット7の上方にウエハWの乾燥を防止するため
の純水噴射用ノズル34が設けられている。また、各装
置1〜6には、純水供給装置8から制御弁9を介して純
水が供給される。各装置1〜6からの排水は、排液回収
装置10により回収される。
An articulated robot 7 is provided between the devices 1 to 5.
The carrier device 6 having the is arranged. This transport device 6
And each of the devices 1 to 5 can be blocked by a shutter (not shown). It should be noted that the three transfer devices 6 on the upstream side are provided with pure water spray nozzles 34 above the articulated robot 7 for preventing the wafer W from drying. Pure water is supplied to each of the devices 1 to 6 from a pure water supply device 8 through a control valve 9. Wastewater from each of the devices 1 to 6 is collected by the drainage recovery device 10.

【0010】水中ローダ1は、図3に示すように、内部
に純水を貯溜し、カセットCを純水中に浸漬させるため
の水槽11と、カセットCを水槽11内で上下動させる
ためのカセット昇降装置12とを有している。このカセ
ット昇降装置12は、少なくとも、カセットCを、カセ
ットC内に収納された最上段のウエハWが完全に純水中
に浸漬する位置と、カセットC内に収納された最下段の
ウエハWが純水中より浮上する位置との間で上下動させ
る。カセットCは、中空状であり、その図3右手前側に
は、収納されたウエハWを出し入れするための開口13
が形成されている。
As shown in FIG. 3, the submersible loader 1 stores therein pure water and a water tank 11 for immersing the cassette C in the pure water, and a vertically moving cassette C in the water tank 11. It has a cassette lifting device 12. The cassette lifting device 12 has at least a position where the uppermost wafer W stored in the cassette C is completely immersed in pure water and a lowermost wafer W stored in the cassette C. It is moved up and down between the position where it floats above pure water. The cassette C has a hollow shape, and an opening 13 for loading and unloading the stored wafer W is provided on the right front side in FIG.
Are formed.

【0011】水槽11は、合成樹脂製であり、図4に示
すように、カセットCの開口13が対向配置される側面
と逆側の側面には、上下位置を調節可能な堰14が設け
られている。この堰14により、水槽11内の液面の高
さが決定される。また、水槽11の底面においてカセッ
トCの開口13に近い部分には純水供給口15が形成さ
れており、この供給口15から純水が水槽11に供給さ
れる。また、供給された純水は堰14から溢れて排出さ
れる。このため、純水供給中においては、水槽11内の
少なくとも液面付近でカセットCの開口13から奥側へ
の水流が形成される。また水槽11の一側面には、静電
容量センサ18を用いた液面計17が配置されている。
The water tank 11 is made of synthetic resin, and as shown in FIG. 4, a weir 14 whose vertical position can be adjusted is provided on the side surface opposite to the side surface on which the opening 13 of the cassette C faces. ing. The height of the liquid surface in the water tank 11 is determined by the weir 14. Further, a pure water supply port 15 is formed on the bottom surface of the water tank 11 near the opening 13 of the cassette C, and pure water is supplied to the water tank 11 from the supply port 15. Further, the supplied pure water overflows from the weir 14 and is discharged. Therefore, during the supply of pure water, a water flow from the opening 13 of the cassette C to the inner side is formed at least near the liquid surface in the water tank 11. A liquid level gauge 17 using a capacitance sensor 18 is arranged on one side surface of the water tank 11.

【0012】カセット昇降装置12は、図3,図5,図
6に示す昇降フレーム19を備えている。昇降フレーム
19は、上下に配置された2本のガイド軸20により上
下移動自在に支持されている。昇降フレーム19の中央
には、ボールナット21が配置されている。ボールナッ
ト21は、上下に延びるボールスクリュー22に螺合し
ている。ボールスクリュー22は、ガイド軸20を支持
するガイドフレーム23により回転自在に支持されてい
る。ボールスクリュー22は、下端に配置された歯付プ
ーリ24及び歯付ベルト25を介してモータ26により
回転駆動される。これにより昇降フレーム19が昇降駆
動される。
The cassette lifting device 12 is equipped with a lifting frame 19 shown in FIGS. The elevating frame 19 is supported by two guide shafts 20 arranged vertically so as to be vertically movable. A ball nut 21 is arranged at the center of the elevating frame 19. The ball nut 21 is screwed onto a ball screw 22 extending vertically. The ball screw 22 is rotatably supported by a guide frame 23 that supports the guide shaft 20. The ball screw 22 is rotationally driven by a motor 26 via a toothed pulley 24 and a toothed belt 25 arranged at the lower end. As a result, the lifting frame 19 is driven up and down.

【0013】昇降フレーム19の両側端には、ステンレ
ス製薄板部材からなる1対の昇降部材27と、これに連
結する垂直部材31が配設されている。各垂直部材31
の下端には合成樹脂製平板部材からなるカセット台32
が取り付けられている。カセット台32上には、カセッ
トCの四隅を位置決めするための位置決め部材33が取
り付けられている。
At both ends of the elevating frame 19, a pair of elevating members 27 made of thin stainless steel plates and a vertical member 31 connected to the elevating members 27 are provided. Each vertical member 31
At the lower end of the cassette is a cassette stand 32 made of a synthetic resin flat plate member.
Is attached. Positioning members 33 for positioning the four corners of the cassette C are mounted on the cassette table 32.

【0014】また、各昇降部材27の上端は、繋ぎ部材
30により連結されており、この繋ぎ部材30の中央部
には、カセットCを水槽11に浸漬する際に、カセット
Cの浮き上がりを防止するための浮き上がり防止部材4
4が配設されている。この浮き上がり防止部材44は、
繋ぎ部材30に固定された軸受部45と、軸46を介し
て軸受部45に回動自在に連結されたストッパー47と
により構成される。
The upper end of each elevating member 27 is connected by a connecting member 30, and the central portion of the connecting member 30 prevents the cassette C from rising when the cassette C is immersed in the water tank 11. Lifting prevention member 4 for
4 are provided. The lifting prevention member 44 is
The bearing portion 45 is fixed to the connecting member 30, and the stopper 47 is rotatably connected to the bearing portion 45 via a shaft 46.

【0015】図3に示すように、多関節ロボット7は、
図示しない装置フレームに固定された垂直コラム41
と、垂直コラム41の先端で水平に揺動するベース42
と、ベース42の先端で水平に揺動する搬送アーム43
とを有している。多関節ロボット7は、水中ローダ1の
カセットC内のウエハWを搬送アーム43で1枚ずつ吸
着搬送可能な位置に配置されている。この多関節ロボッ
ト7は、耐水性を有しており、純水により濡れた状態の
カセットCを吸着しても搬送機能を果たせる構成となっ
ている。
As shown in FIG. 3, the articulated robot 7 has
Vertical column 41 fixed to a device frame (not shown)
And a base 42 that horizontally swings at the tip of the vertical column 41.
And a transfer arm 43 that horizontally swings at the tip of the base 42.
And have. The articulated robot 7 is arranged at a position where the wafers W in the cassette C of the underwater loader 1 can be sucked and transferred by the transfer arm 43 one by one. The articulated robot 7 has water resistance and is configured to perform a transport function even if the cassette C wet with pure water is adsorbed.

【0016】次に、基板処理装置の動作について説明す
る。多数のウエハWを上下に収納したカセットCが位置
決め部材33により水中ローダ1のカセット台32に位
置決めされて載置されると、昇降フレーム19が下降し
て水槽11内にカセットCを浸漬する。このとき、純水
供給口15から純水が供給されている。供給された純水
は、堰14から溢れ出す。この結果、水槽11の液面近
くでは、カセットCの開口13から奥側に向かう水流が
形成される。したがって、昇降フレーム19が下降する
際に、各ウエハWが水流による付勢力を受け、カセット
CからウエハWが滑り出さない。
Next, the operation of the substrate processing apparatus will be described. When the cassette C that houses a large number of wafers W in the vertical direction is positioned and placed on the cassette table 32 of the underwater loader 1 by the positioning member 33, the elevating frame 19 descends and the cassette C is immersed in the water tank 11. At this time, pure water is being supplied from the pure water supply port 15. The supplied pure water overflows from the weir 14. As a result, near the liquid surface of the water tank 11, a water flow is formed from the opening 13 of the cassette C toward the inner side. Therefore, when the elevating frame 19 descends, each wafer W receives the urging force of the water flow, and the wafer W does not slip out of the cassette C.

【0017】裏面洗浄装置2側にウエハWを供給する際
には、浸漬されていたカセットCがカセット昇降装置1
2により上昇する。そして、搬出すべきウエハWを取り
出し位置よりやや上方に位置させた状態でカセット昇降
装置12が停止する。このときも、液面付近には開口か
ら奥側に向かう純水の流れが形成されているので、カセ
ットC内からウエハWが滑り出さない。
When the wafer W is supplied to the back surface cleaning device 2 side, the cassette C that has been immersed is moved to the cassette lifting device 1.
Increases by 2. Then, the cassette lifting device 12 is stopped in a state in which the wafer W to be carried out is positioned slightly above the take-out position. Also at this time, since the pure water flows from the opening to the inner side near the liquid surface, the wafer W does not slip out of the cassette C.

【0018】続いて、多関節ロボット7の搬送アーム4
3が図6に二点鎖線で示すように伸び、取り出すべきウ
エハWの裏面下に位置する。そして、僅かにカセット昇
降装置12が下降することにより、多関節ロボット7の
搬送アーム43上にウエハWを預ける。すると多関節ロ
ボット7は、搬送アーム43上でウエハWを吸着保持す
る。ウエハWを吸着保持した搬送アーム43は図6に実
線で示す位置まで縮み、ウエハWをカセットCから取り
出す。
Next, the transfer arm 4 of the articulated robot 7
3 extends as shown by the chain double-dashed line in FIG. 6 and is located below the back surface of the wafer W to be taken out. Then, the cassette elevating device 12 is slightly lowered to deposit the wafer W on the transfer arm 43 of the articulated robot 7. Then, the articulated robot 7 sucks and holds the wafer W on the transfer arm 43. The transfer arm 43 holding the wafer W by suction contracts to the position shown by the solid line in FIG. 6, and takes out the wafer W from the cassette C.

【0019】そして、次工程である裏面洗浄装置2から
の搬送要求により、裏面洗浄装置2へウエハWを送る。
裏面洗浄装置2で裏面が洗浄されると、ウエハWはさら
に表面洗浄装置3、水洗乾燥装置4へと順次多関節ロボ
ット7により搬送される。そして、それらでの処理が順
次行なわれた後に、ウエハWは最後にアンローダ5に送
られる。ここでウエハWは別のカセットC内に収納され
る。
Then, in the next step, the wafer W is sent to the back surface cleaning device 2 in response to a transfer request from the back surface cleaning device 2.
When the back surface is cleaned by the back surface cleaning device 2, the wafer W is further transferred to the front surface cleaning device 3 and the water cleaning / drying device 4 by the articulated robot 7 in order. Then, the wafer W is finally sent to the unloader 5 after the processes are sequentially performed. Here, the wafer W is stored in another cassette C.

【0020】なお、水洗乾燥装置4までの搬送工程にお
いては、多関節ロボット7上のウエハWは、純水噴出用
のノズル34から供給される純水により常に濡れた状態
となっている。このため、搬送中においてもウエハWは
乾燥しない。 〔他の実施例〕 (a) 水槽11の開口13に面する側壁の液面付近
に、純水供給口15とは別に純水を噴出するノズルまた
はスリットを設け、開口13から奥側へ水流を形成する
ようにしてもよい。また、純水供給口15自体を水槽1
1の側壁に設けて水流を形成するようにしてもよい。さ
らに、堰14側の側面に、堰14の代わりに強制排水孔
を設けることにより、水流を形成するようにしてもよ
い。 (b) 水槽11に、純水の代わりにイソプロピルアル
コール等の他の液体を貯溜してもよい。
In the transfer process to the water washing / drying device 4, the wafer W on the articulated robot 7 is always wet with pure water supplied from the nozzle 34 for spraying pure water. Therefore, the wafer W is not dried even during the transportation. [Other Embodiments] (a) A nozzle or a slit for ejecting pure water is provided in the vicinity of the liquid surface of the side wall facing the opening 13 of the water tank 11 in addition to the pure water supply port 15, and the water flow from the opening 13 to the back side. May be formed. In addition, the pure water supply port 15 itself is connected to the water tank 1.
It may be provided on the side wall of No. 1 to form a water stream. Further, a water flow may be formed by providing a forced drainage hole instead of the weir 14 on the side surface on the weir 14 side. (B) Instead of pure water, another liquid such as isopropyl alcohol may be stored in the water tank 11.

【0021】[0021]

【発明の効果】本発明に係る薄板材浸漬装置では、液槽
内の少なくとも液面付近で、液流形成手段が薄板材収納
部の開口から奥側へと液流を形成するので、薄板材収納
部からの薄板材の飛び出しを防止できる。
In the thin plate material dipping device according to the present invention, the liquid flow forming means forms a liquid flow from the opening of the thin plate material accommodating portion to the inner side at least in the vicinity of the liquid surface in the liquid tank. It is possible to prevent the thin plate material from jumping out of the storage section.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例を採用した基板処理装置の斜
視図。
FIG. 1 is a perspective view of a substrate processing apparatus adopting an embodiment of the present invention.

【図2】その縦断面模式図。FIG. 2 is a vertical cross-sectional schematic diagram thereof.

【図3】水中ローダの斜視図。FIG. 3 is a perspective view of an underwater loader.

【図4】水槽の斜視図。FIG. 4 is a perspective view of a water tank.

【図5】水中ローダの側断面図。FIG. 5 is a side sectional view of the underwater loader.

【図6】水中ローダの平面図。FIG. 6 is a plan view of the underwater loader.

【符号の説明】[Explanation of symbols]

1 水中ローダ 11 水槽 12 カセット昇降装置 13 開口 14 堰 15 純水供給口 C カセット W ウエハ 1 Underwater Loader 11 Water Tank 12 Cassette Lifting Device 13 Opening 14 Weir 15 Pure Water Supply Port C Cassette W Wafer

フロントページの続き (72)発明者 澤村 雅視 滋賀県野洲郡野洲町大字三上字口ノ川原 2426番1 大日本スクリーン製造株式会社 野洲事業所内Front page continuation (72) Inventor Masami Sawamura 2426-1, Kuchinogawara, Mikami, Yasu-machi, Yasu-gun, Shiga Prefecture Dainippon Screen Mfg. Co., Ltd. Yasu Plant

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】多数の薄板材を上下多段に収納し、かつ側
面に前記薄板材を出し入れするための開口を有する薄板
材収納部を液体中に浸漬する薄板材浸漬装置であって、 内部に液体を貯溜し、前記薄板材収納部を前記液体中に
浸漬するための液槽と、 前記薄板材収納部を前記液槽内で上下動させるための収
納部移動手段と、 前記液槽内の少なくとも液面付近で、前記薄板材収納部
の前記開口から奥側へと液流を形成する液流形成手段
と、を備えた薄板材浸漬装置。
1. A thin plate material immersing device for immersing a large number of thin plate materials in a multi-tiered manner, and immersing in a liquid a thin plate material storage portion having an opening for taking in and out the thin plate material on a side surface. A liquid tank for storing a liquid and immersing the thin plate material storage portion in the liquid; a storage portion moving means for vertically moving the thin plate material storage portion in the liquid tank; A thin plate material dipping device comprising: a liquid flow forming unit that forms a liquid flow from the opening of the thin plate material storage portion to the inner side at least near the liquid surface.
JP5815193A 1993-03-18 1993-03-18 Thin plate dipping device Expired - Fee Related JP2675734B2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP5815193A JP2675734B2 (en) 1993-03-18 1993-03-18 Thin plate dipping device
US08/210,177 US5485644A (en) 1993-03-18 1994-03-17 Substrate treating apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5815193A JP2675734B2 (en) 1993-03-18 1993-03-18 Thin plate dipping device

Publications (2)

Publication Number Publication Date
JPH06271068A true JPH06271068A (en) 1994-09-27
JP2675734B2 JP2675734B2 (en) 1997-11-12

Family

ID=13075996

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5815193A Expired - Fee Related JP2675734B2 (en) 1993-03-18 1993-03-18 Thin plate dipping device

Country Status (1)

Country Link
JP (1) JP2675734B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6637444B1 (en) * 2000-02-15 2003-10-28 Quantum Global Technologies, Llc Volume efficient cleaning methods
US6926016B1 (en) 2001-02-15 2005-08-09 Quantum Global Technologies, Llc System for removing contaminants from semiconductor process equipment
US7328712B1 (en) 2000-02-15 2008-02-12 Quantum Global Technologies Cleaning bench for removing contaminants from semiconductor process equipment

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6637444B1 (en) * 2000-02-15 2003-10-28 Quantum Global Technologies, Llc Volume efficient cleaning methods
US7328712B1 (en) 2000-02-15 2008-02-12 Quantum Global Technologies Cleaning bench for removing contaminants from semiconductor process equipment
US7427330B1 (en) 2000-02-15 2008-09-23 Quantum Global Technologies, Llc Cleaning bench for removing contaminants from semiconductor process equipment
US6926016B1 (en) 2001-02-15 2005-08-09 Quantum Global Technologies, Llc System for removing contaminants from semiconductor process equipment

Also Published As

Publication number Publication date
JP2675734B2 (en) 1997-11-12

Similar Documents

Publication Publication Date Title
US6374837B2 (en) Single semiconductor wafer processor
US5887604A (en) Washing apparatus, and washing method
US20090038641A1 (en) Substrate Cleaning Apparatus, Substrate Cleaning Method, Substrate Processing System, and Storage Medium
KR102541489B1 (en) Apparatus for cleaning substrate and facility for cleaning substrate using the same
US6199564B1 (en) Substrate processing method and apparatus
US10290518B2 (en) Substrate liquid processing apparatus
KR20120083840A (en) Liquid processing apparatus
JP3321725B2 (en) Cleaning equipment
JPH07111963B2 (en) Substrate cleaning / drying device
JP6961362B2 (en) Board processing equipment
JP2675734B2 (en) Thin plate dipping device
JP2004507102A (en) Semiconductor wafer container cleaning equipment
KR20020093837A (en) Elevation type substrate processing apparatus and substrate processing system thereof
JPH0774133A (en) Substrate treatment apparatus
JPH07297155A (en) Substrate processing system
JP3069243B2 (en) Thin plate immersion equipment
JP3464353B2 (en) Sheet material supply device
JP2971725B2 (en) Substrate immersion equipment
JP3092888B2 (en) Thin plate immersion equipment
JP3118443B2 (en) Wafer cleaning equipment
JP3219284B2 (en) Cleaning equipment
JP3712552B2 (en) Substrate processing equipment
JP3455722B2 (en) Brush, substrate processing apparatus and substrate processing method
JP2767165B2 (en) Wafer cleaning tank
JPH06275585A (en) Substrate treatment device

Legal Events

Date Code Title Description
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 19970624

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20080718

Year of fee payment: 11

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20080718

Year of fee payment: 11

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20090718

Year of fee payment: 12

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20090718

Year of fee payment: 12

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20090718

Year of fee payment: 12

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20100718

Year of fee payment: 13

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20100718

Year of fee payment: 13

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20110718

Year of fee payment: 14

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20110718

Year of fee payment: 14

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120718

Year of fee payment: 15

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120718

Year of fee payment: 15

LAPS Cancellation because of no payment of annual fees