JPH06244361A - Plastic sealed type semiconductor device - Google Patents

Plastic sealed type semiconductor device

Info

Publication number
JPH06244361A
JPH06244361A JP5028309A JP2830993A JPH06244361A JP H06244361 A JPH06244361 A JP H06244361A JP 5028309 A JP5028309 A JP 5028309A JP 2830993 A JP2830993 A JP 2830993A JP H06244361 A JPH06244361 A JP H06244361A
Authority
JP
Japan
Prior art keywords
semiconductor device
resin
scale
wiring board
small
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5028309A
Other languages
Japanese (ja)
Inventor
Masaji Takenaka
正司 竹中
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP5028309A priority Critical patent/JPH06244361A/en
Publication of JPH06244361A publication Critical patent/JPH06244361A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L25/00Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
    • H01L25/03Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
    • H01L25/10Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices having separate containers
    • H01L25/105Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices having separate containers the devices being of a type provided for in group H01L27/00
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Lead Frames For Integrated Circuits (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)

Abstract

PURPOSE:To increase the productivity of a plastic sealed type semiconductor device having a multi-structure. CONSTITUTION:In a sealed semiconductor device, a number of small scale sealed semiconductor devices 10A and 10B are stacked and connected with each other so as to constitute a large scale semiconductor device. The small scale sealed semiconductor device has openings 5A and 5B which are formed in both upper and lower surfaces or either surface of the sealed portion. Parts of external leads 2A and 2B, which are embedded in the sealed portion, are exposed from these openings. Connection pins 11A and 11B are provided at the end of the lower semiconductor device 10A and the upper semiconductor device 10B. The connection pins 11A and 11B are inserted into the openings formed in the surfaces of the upper and lower semiconductor devices which are opposed to each other, and come into contact with the external leads 2A and 2B. The connection pins 11A and 11B are joined to the external leads 2A and 2B, so that a metal wiring body 12 has a predetermined wiring route. Thus, the upper semiconductor device 10B and the lower semiconductor device 10B are stacked one on top of the other via the metal wiring body 12. The semiconductor devices 10A and 10B are electrically connected and fixed to each other.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は樹脂封止型半導体装置、
特に複数の小規模樹脂封止型半導体装置が積み重ねられ
電気的に接続されて大規模に一体化された多重構造の樹
脂封止型半導体装置に関する。
BACKGROUND OF THE INVENTION The present invention relates to a resin-sealed semiconductor device,
In particular, the present invention relates to a resin-encapsulated semiconductor device having a multiple structure in which a plurality of small-scale resin-encapsulated semiconductor devices are stacked, electrically connected to each other, and integrated on a large scale.

【0002】近年、電子機器の小型化により、半導体装
置等の電子部品の高密度実装が強く望まれている。この
要望に答えるために、プラスチックパッケージに封入さ
れたIC等の樹脂封止型半導体装置においては、小機能
小規模の樹脂封止型半導体装置を複数個積み重ね互いに
電気的に接続することによって、専有面積を増やさずに
多機能大規模の半導体装置化することが有効な手段とし
て提案されている。
With the recent miniaturization of electronic equipment, high-density mounting of electronic components such as semiconductor devices has been strongly desired. In order to meet this demand, in resin-sealed semiconductor devices such as ICs enclosed in plastic packages, a plurality of small-function small-scale resin-sealed semiconductor devices are stacked and electrically connected to each other. It has been proposed as an effective means to make a multi-functional large-scale semiconductor device without increasing the area.

【0003】[0003]

【従来の技術】図6は積み重ね構造即ち多重構造を有す
る樹脂封止型半導体装置の従来例を模式的に示した長辺
方向側面図(a) 及び短辺方向側面図(b) である。
2. Description of the Related Art FIG. 6 is a long side direction side view (a) and a short side direction side view (b) schematically showing a conventional example of a resin-encapsulated semiconductor device having a stacked structure, that is, a multiple structure.

【0004】この図に示されたように従来の上記半導体
装置は、同様の外形構造を有する複数の小機能小規模の
挿入型樹脂封止半導体装置51A 、51B 、51C 、51D 等
が、対応するそれぞれの外部リード52A 、52B 、52C 、
52D 等を接して積み重ねられ、それぞれの外部リードの
接触部が例えば半田等の溶融金属53によって電気的且つ
機械的に接合固着された構造を有していた。
As shown in this figure, the conventional semiconductor device described above corresponds to a plurality of small-function small-scale insertion-type resin-sealed semiconductor devices 51A, 51B, 51C, 51D having the same outer structure. Each external lead 52A, 52B, 52C,
52D and the like are stacked in contact with each other, and the contact portion of each external lead is electrically and mechanically bonded and fixed by a molten metal 53 such as solder.

【0005】[0005]

【発明が解決しようとする課題】上記のように従来の多
重構造を有する樹脂封止型半導体装置においては、積み
重ねられる小機能小規模の樹脂封止型半導体装置51A 、
51B 、51C 、51D 等の同一位置にある外部リード同士が
接続されて多機能大規模の樹脂封止型半導体装置が構成
されるので、多機能大規模化するために積み重ねられる
小機能小規模の樹脂封止型半導体装置のそれぞれの機能
の種類を変える必要があり、そのために同一形状を有し
且つ機能の異なる多くの種類の小規模樹脂封止型半導体
装置を製造しなければならず、製造工程や製造手番の増
大により、生産性が非常に悪くなるという問題があっ
た。
As described above, in the conventional resin-encapsulated semiconductor device having the multiple structure, the small-capacity resin-encapsulated semiconductor device 51A having a small function can be stacked.
51B, 51C, 51D and other external leads located at the same position are connected to each other to form a multi-functional large-scale resin-encapsulated semiconductor device. Since it is necessary to change each kind of function of the resin-encapsulated semiconductor device, many kinds of small-scale resin-encapsulated semiconductor devices having the same shape and different functions must be manufactured. There has been a problem that productivity is extremely deteriorated due to an increase in processes and manufacturing steps.

【0006】そこで本発明は、同一機能を有する小規模
樹脂封止型半導体装置を用いて多機能大規模の樹脂封止
型半導体装置を形成することが可能な多重構造を提供
し、多重構造を有する多機能大規模樹脂封止型半導体装
置の生産性を向上することを目的とする。
Therefore, the present invention provides a multiple structure capable of forming a multi-functional large-scale resin-encapsulated semiconductor device by using a small-scale resin-encapsulated semiconductor device having the same function. It is an object of the present invention to improve the productivity of the multi-functional large-scale resin-encapsulated semiconductor device that it has.

【0007】[0007]

【課題を解決するための手段】上記課題の解決は、複数
の小規模樹脂封止型半導体装置が積み重ねられ且つ相互
に接続されて大規模に構成される樹脂封止型半導体装置
であって、該小規模樹脂封止型半導体装置が、樹脂封止
部の上下両面若しくはいずれか一方の面に外部リードの
該樹脂封止部内に埋め込まれた部分を表出する開孔を有
し、下段の該半導体装置と上段の該半導体装置とが、端
部に接続ピンを備え、該接続ピンが該上下段の半導体装
置の対向する面の該開孔内に挿入され当接する該外部リ
ードに接合された所定の配線経路を有する金属配線体を
介して積み重ねられ、電気的に接続固着されてなる本発
明による樹脂封止型半導体装置、または、複数の小規模
樹脂封止型半導体装置が積み重ねられ且つ相互に接続さ
れて大規模に構成される樹脂封止型半導体装置であっ
て、該小規模樹脂封止型半導体装置が、樹脂封止部の上
下両面若しくはいずれか一方の面に外部リードの該樹脂
封止部内に埋め込まれた部分を表出する開孔を有し、下
段の該半導体装置と上段の該半導体装置とが、該上下段
の半導体装置の対向する面の該開孔内に挿入され当接す
る該内部リードに接合された接続ピンを具備し所定の配
線経路を有する配線基板を介して積み重ねられ、電気的
に接続固着されてなる本発明による樹脂封止型半導体装
置によって達成される。
A solution to the above-mentioned problems is a resin-sealed semiconductor device which is constructed in a large scale by stacking a plurality of small-scale resin-sealed semiconductor devices and connecting them to each other. The small-scale resin-encapsulated semiconductor device has openings on the upper and lower surfaces of the resin-encapsulated portion or on one of the surfaces to expose the portion of the external lead embedded in the resin-encapsulated portion. The semiconductor device and the upper semiconductor device are provided with connecting pins at their ends, and the connecting pins are joined to the external leads that are inserted into and abut against the facing surfaces of the upper and lower semiconductor devices. The resin-sealed semiconductor device according to the present invention or the plurality of small-scale resin-sealed semiconductor devices that are stacked and electrically connected and fixed via the metal wiring body having the predetermined wiring path are stacked and Connected to each other and configured at scale In the resin-sealed semiconductor device according to claim 1, the small-scale resin-sealed semiconductor device has a portion embedded in the resin-sealed portion of the external lead on the upper and lower surfaces of the resin-sealed portion or on one of the surfaces. The semiconductor device in the lower stage and the semiconductor device in the upper stage, which have exposed holes, are joined to the internal lead that is inserted into and abuts the holes in the facing surfaces of the upper and lower semiconductor devices. The present invention is achieved by the resin-sealed semiconductor device according to the present invention, which is stacked and electrically connected and fixed via wiring boards having connection pins and having a predetermined wiring path.

【0008】[0008]

【作用】即ち本発明においては、小機能小規模の樹脂封
止型半導体装置の樹脂封止部に樹脂内に埋め込まれた外
部リードを底部に表出する小開孔を設け、下段の上記半
導体装置とその上部に重ねられる上段の上記半導体装置
とを、該上下段の半導体装置の間に挟み込んだ、前記小
開孔内に挿入可能な接続ピンを有し、所望の配線経路を
有する金属配線体あるいは配線基板によって所望の回路
構成に接続固着して多機能若しくは大規模の樹脂封止型
半導体装置を構成する。従って、前記金属配線体あるい
は配線基板の配線経路即ち回路パターンを変えることに
より、同一の機能を有する小規模樹脂封止型半導体装置
を用いて、より複雑な回路構成を有する種々の多機能若
しくは大規模の樹脂封止型半導体装置が容易に形成で
き、多重構造の多機能大規模樹脂封止型半導体装置を製
造する際の生産性が大幅に向上する。
That is, in the present invention, a small opening for exposing the external lead embedded in the resin to the bottom is provided in the resin encapsulation portion of a small-function small-scale resin encapsulation type semiconductor device, and the semiconductor of the lower stage is formed. A metal wiring having a desired wiring path, which has a connection pin that can be inserted into the small opening, in which the device and the upper semiconductor device to be overlaid on the device are sandwiched between the upper and lower semiconductor devices. A multifunctional or large-scale resin-sealed semiconductor device is configured by connecting and fixing to a desired circuit configuration by a body or a wiring board. Therefore, by changing the wiring path, that is, the circuit pattern of the metal wiring body or the wiring board, a small-scale resin-sealed semiconductor device having the same function is used, and various multi-functional or large-scale circuits having a more complicated circuit configuration are used. A large-scale resin-encapsulated semiconductor device can be easily formed, and productivity in manufacturing a multi-functional multi-functional large-scale resin-encapsulated semiconductor device is significantly improved.

【0009】[0009]

【実施例】以下本発明を、図示実施例により具体的に説
明する。図1は本発明に用いる小規模樹脂封止型半導体
装置の一実施例の模式図で、(a) は平面図、(b) は断面
図、図2は本発明の多重構造樹脂封止型半導体装置の第
1の実施例の模式図で、(a) は断面図、(b) は側面図、
図3は本発明の多重構造樹脂封止型半導体装置の第2の
実施例を示す図で、(a) は配線基板の模式側面図、(b)
は完成体の模式側面図、図4は本発明の多重構造樹脂封
止型半導体装置の第3の実施例の模式側面図、図5は本
発明の多重構造樹脂封止型半導体装置の第4の実施例の
模式側面図である。全図を通じ同一対象物は同一符合で
示す。
EXAMPLES The present invention will be described in detail below with reference to illustrated examples. FIG. 1 is a schematic view of an embodiment of a small-scale resin-sealed semiconductor device used in the present invention. (A) is a plan view, (b) is a cross-sectional view, and FIG. 2 is a multiple structure resin-sealed type of the present invention. 1A and 1B are schematic views of a first embodiment of a semiconductor device, (a) is a sectional view, (b) is a side view,
3A and 3B are views showing a second embodiment of a multi-structure resin-encapsulated semiconductor device of the present invention, wherein FIG. 3A is a schematic side view of a wiring board, and FIG.
Is a schematic side view of the completed product, FIG. 4 is a schematic side view of a third embodiment of the multiple structure resin-encapsulated semiconductor device of the present invention, and FIG. 5 is a fourth view of the multiple structure resin-encapsulated semiconductor device of the present invention. It is a schematic side view of the Example of. The same object is denoted by the same reference numeral throughout the drawings.

【0010】本発明に係る多重構造の大機能大規模樹脂
封止型半導体装置を構成する際には、積み重ねられる単
位半導体装置として、例えば図1に示すような、モール
ド成形により形成されたフラット構造の樹脂パッケージ
4に封入され、その樹脂パッケージ4の両面の周辺部に
各外部リード2のパッケージ4内埋込み部を表出する例
えば 0.2mmφ程度の小開孔5A、5Bが、樹脂パッケージ4
をモールド成形する際に同時に形成配設されてなるフラ
ット構造の表面実装型樹脂モールド半導体装置1が用い
られる。パッケージ4の内部では、通常通りチップステ
ージ6上にろう材または導電性樹脂樹脂等からなるチッ
プ固着材8により半導体チップ7が固着され、半導体チ
ップ7の図示しないボンディングパッドと外部リード2
の内側端部とがボンディングワイヤ9により接続されて
いる。なお、前記小開孔は、接続される何れか一方の面
のみに設けてもよい。
When constructing a large-scale and large-scale resin-encapsulated semiconductor device having a multiple structure according to the present invention, as a unit semiconductor device to be stacked, for example, a flat structure formed by molding as shown in FIG. The resin package 4 has small openings 5A, 5B of, for example, about 0.2 mmφ, which are embedded in the resin package 4 and expose the embedded portions of the external leads 2 in the package 4 on the periphery of both sides of the resin package 4.
A surface-mounting resin-molded semiconductor device 1 having a flat structure, which is formed and arranged at the same time when molding is performed, is used. Inside the package 4, the semiconductor chip 7 is fixed on the chip stage 6 by a chip fixing material 8 made of a brazing material, a conductive resin resin or the like as usual, and a bonding pad (not shown) of the semiconductor chip 7 and the external lead 2 are attached.
Is connected to the inner end portion of by a bonding wire 9. The small holes may be provided on only one of the surfaces to be connected.

【0011】本発明に係る多重構造の樹脂封止型半導体
装置の第1の実施例においては、図2(a) の模式断面図
に示すように、例えば、図1に示したフラット構造の2
個の樹脂モールド半導体装置10A と10B とを、それらの
間に、端部に半導体装置10A及び10B に形成された小開
孔5A、5Bに挿入可能な接続ピン11A 及び11B を有する例
えば銅(Cu)合金等の金属配線体12を、接続ピン11A 及び
11B を対向する半導体装置の小開孔5B及び5Aに差し込ん
だ状態で挟みこみ、差し込まれたそれぞれのピンの先端
部を例えば導電性樹脂或いは半田等の導電性接合材13に
よって当接する外部リード2A及び2Bと、電気的且つ機械
的に接合固着することによって構成される。
In the first embodiment of the multiple structure resin-sealed semiconductor device according to the present invention, as shown in the schematic sectional view of FIG. 2 (a), for example, the flat structure shown in FIG.
Each of the resin-molded semiconductor devices 10A and 10B is provided with connection pins 11A and 11B which can be inserted into the small openings 5A and 5B formed in the semiconductor devices 10A and 10B between the ends, for example, copper (Cu). ) Connect the metal wiring body 12, such as an alloy, to the connection pins 11A and
External lead 2A that sandwiches 11B with small holes 5B and 5A of the semiconductor device facing each other and sandwiches the tip of each inserted pin with conductive bonding material 13 such as conductive resin or solder. And 2B, and is electrically and mechanically bonded and fixed.

【0012】なお、図2(a) においては、理解を容易に
するために、下段の半導体装置10Aと上段の半導体装置1
0B の接続されるリード2Aと2Bとを同一断面に図示して
いるが、実際には金属配線体12が所望配線経路になるよ
うに屈曲して形成されることが多く、上下半導体装置の
接続リードは必ずしも同じ位置にはならない。
In FIG. 2 (a), in order to facilitate understanding, the lower semiconductor device 10A and the upper semiconductor device 1 are shown.
Although the leads 2A and 2B to which 0B is connected are shown in the same cross section, in practice, the metal wiring body 12 is often formed by bending so as to form a desired wiring path. The leads are not always in the same position.

【0013】その状態を示したのが図2(b) の模式側面
図で、この図では、下段の樹脂モールド半導体装置10A
の外部リード2A2 は上段の樹脂モールド半導体装置10B
の同一位置の外部リード2B2 に金属配線体12A によって
接続されているが、下段の樹脂モールド半導体装置10A
の外部リード2A8 は上段の樹脂モールド半導体装置の外
部リード2B9 に屈曲した金属配線体12B によって接続さ
れている。なおこの図において、図示されない金属配線
体12A 、12B 等の接続ピンと外部リード2A2 、2B2 、2A
8 、2B9 等との接合構造は、図2(a) に示した接合構造
と同様であり、図示を省略してある。
The state is shown in the schematic side view of FIG. 2 (b). In this figure, the lower resin-molded semiconductor device 10A is shown.
External lead 2A 2 is the upper resin-molded semiconductor device 10B
Although it is connected to the external lead 2B 2 in the same position by the metal wiring body 12A, the lower resin-molded semiconductor device 10A
The external leads 2A 8 are connected by the metal wiring body 12B that is bent to the external lead 2B 9 of the upper resin molding semiconductor device. Note in this figure, not shown metal wiring body 12A, the connection pins and the external lead 2A 2 of 12B such, 2B 2, 2A
The joint structure with 8 , 2B 9 and the like is similar to the joint structure shown in FIG. 2 (a), and is not shown.

【0014】以上は、何れも同一の外形寸法及び外部リ
ード配置を有する半導体装置について説明したが、上記
金属配線体による接続構造が、外形寸法及び外部リード
配置の異なる半導体装置についても適用されることは勿
論である。
Although the semiconductor devices having the same external dimensions and external lead arrangement have been described above, the connection structure by the metal wiring body can be applied to semiconductor devices having different external dimensions and external lead arrangement. Of course.

【0015】図3は配線基板を介して樹脂封止型半導体
装置積み重ねる本発明の第2の実施例を示した図で、
(a) は配線基板の模式側面図、(b) は完成体の模式側面
図である。
FIG. 3 is a view showing a second embodiment of the present invention in which resin-sealed semiconductor devices are stacked via a wiring board.
(a) is a schematic side view of a wiring board, and (b) is a schematic side view of a completed product.

【0016】この実施例においては、半導体装置を多重
化するのに、前記金属配線体に代わって図3(a) に示す
ような、所望の配線経路の回路形成がなされた配線層13
A を有する配線基板14A が用いられ、この配線基板14A
を半導体装置の間に挟み込んだ形で多重構造が形成され
る。そのために、配線基板14A の両面には重ねる半導体
装置の接続しようとする外部リードを表出する小開孔の
位置に、接続ピン例えば15A 、15B 、15C 、15D 等が設
けられる。ここで、例えば、接続ピン15A と15C はスル
ーホール16A によって接続され、接続ピン15B と15D と
は配線層13A とスルーホール16B によって接続される。
In this embodiment, in order to multiplex the semiconductor device, the wiring layer 13 in which a circuit of a desired wiring route is formed as shown in FIG. 3A instead of the metal wiring body.
A wiring board 14A having A is used.
Is sandwiched between semiconductor devices to form a multiple structure. Therefore, connection pins, such as 15A, 15B, 15C, and 15D, are provided on both surfaces of the wiring board 14A at the positions of the small holes that expose the external leads to be connected to the semiconductor devices to be stacked. Here, for example, the connection pins 15A and 15C are connected by the through hole 16A, and the connection pins 15B and 15D are connected by the wiring layer 13A and the through hole 16B.

【0017】また、多重化する半導体装置には前記実施
例に示したのと同様に、樹脂パッケージに外部リードの
埋没部を表出する小開孔(図示せず)を有する例えば同
一の外形形状及び外部リード配置を有するフラット構造
の樹脂モールド半導体装置が用いられ、半導体装置と上
記配線基板との接続は、前述の図2の場合と同様に半導
体装置の樹脂パッケージの小開孔内に接続ピンを挿入
し、当接する外部リードとを導電性接合材により接合固
着することによってなされる。
In addition, the semiconductor device to be multiplexed has a small opening (not shown) for exposing the buried portion of the external lead in the resin package, for example, the same outer shape as in the above embodiment. Also, a resin-molded semiconductor device having a flat structure having an external lead arrangement is used, and the semiconductor device and the wiring board are connected to each other in the small opening of the resin package of the semiconductor device as in the case of FIG. Is inserted, and the external lead that abuts is joined and fixed by a conductive joining material.

【0018】図3(b) は上記配線基板14A を間に挟んで
上記樹脂モールド半導体装置10A と10B とを積み重ね構
成した多重構造の樹脂モールド半導体装置の完成体を示
す。この半導体装置においては、下段の樹脂モールド半
導体装置10A の外部リード2A 2 と上段の樹脂モールド半
導体装置10B の外部リード2B2 とが配線基板14A の接続
ピン15C 、15A 及びスルーホール16A を介して接続さ
れ、下段の樹脂モールド半導体装置10A の外部リード2A
7 と上段の樹脂モールド半導体装置10B の外部リード2B
9 とが配線基板14A の接続ピン15D 、スルーホール16B
、配線層13A 及び接続ピン15B を介して接続されてよ
り多機能大規模な多重構造の樹脂モールド型半導体装置
が形成されている。なおこの図では、樹脂パッケージに
設けられた外部リードを表出する小開孔及び接続ピンの
前記小開孔内に挿入された部分及び接合部の構造は、図
2に示したのと同様なので省略する。
FIG. 3B shows the above wiring board 14A with the wiring board 14A interposed therebetween.
The above resin-molded semiconductor devices 10A and 10B are stacked.
The completed structure of the resin-molded semiconductor device with the multiple structure is shown.
You In this semiconductor device, the lower resin mold half
External lead 2A of conductor device 10A 2And the upper half of the resin mold
External lead 2B of conductor device 10B2And are connected to the wiring board 14A
Connected via pins 15C, 15A and through hole 16A.
The external lead 2A of the lower resin-molded semiconductor device 10A
7And the external lead 2B of the resin-molded semiconductor device 10B on the upper side
9And are the connection pins 15D and the through holes 16B on the wiring board 14A.
 , Be connected via the wiring layer 13A and the connection pin 15B.
Multi-functional large-scale multi-structure resin-molded semiconductor device
Are formed. In this figure, the resin package
Of small openings and connecting pins that expose the external leads provided
The structure of the part and the joint part inserted in the small hole is shown in the figure.
Since it is the same as that shown in FIG.

【0019】また図4に模式側面図を示したのは、大型
の樹脂封止型半導体装置上に配線基板を介して外形形状
の異なる半導体装置を積み重ねて一体の半導体装置を形
成した例である。
The schematic side view shown in FIG. 4 is an example in which semiconductor devices having different outer shapes are stacked on a large resin-sealed semiconductor device via a wiring board to form an integrated semiconductor device. .

【0020】即ちこの例においては、フラット構造の大
型樹脂モールド半導体装置10C 上に、大型の配線基板14
B を介して小型のフラット構造の樹脂モールド半導体装
置10D が積み重ねられており、更に同配線基板14B 上に
他の構造を有する半導体装置21A 、21B が搭載されてい
る。そして、半導体装置10D の積み重ね方法は前記実施
例と同様であり、配線基板14B の接続ピン15E 、スルー
ホール16E 及び接続ピン15F を介して半導体装置10C の
外部リード2A18と半導体装置10D の外部リード2B2 が、
また配線基板14B の接続ピン15G 、スルーホール16G 、
配線層13B 及び接続ピン15H を介して半導体装置10C の
外部リード2A22と半導体装置10D の外部リード2B9 とが
それぞれ接続されている。また、配線基板14B の下段の
半導体装置10C の少なくとも外部リード2A9 に接続する
接続ピン15I の上部にはスルーホール16Iを介し少なく
とも外部リード22A を例えば半田づけすることにより他
の構造の半導体装置21A が直立した状態で直に接合固着
され、更に下段の半導体装置10C の外部リード2A3 と2A
5 に接続する接続ピン15J と15K の上部には、スルーホ
ール16J 、16K をそれぞれ介し外部リード22B1と22B2
それぞれ半田づけ等により接合することによって他の構
造の半導体装置21B が直立した状態で接続固着され、こ
れら全体によって多機能大規模の半導体装置が構成され
る。なお、配線基板の接続ピンと半導体装置の外部リー
ドとの接続構造は前記実施例と同様であり、この図では
省略されている。
That is, in this example, a large-sized wiring board 14 is provided on a large-sized resin-molded semiconductor device 10C having a flat structure.
Small resin-molded semiconductor devices 10D having a flat structure are stacked via B, and semiconductor devices 21A, 21B having other structures are mounted on the same wiring board 14B. The stacking method of the semiconductor device 10D is the same as that of the above embodiment, and the external leads 2A 18 of the semiconductor device 10C and the external leads of the semiconductor device 10D are connected through the connection pins 15E, the through holes 16E and the connection pins 15F of the wiring board 14B. 2B 2
The wiring board 14B connection pins 15G, through holes 16G,
The external lead 2A 22 of the semiconductor device 10C and the external lead 2B 9 of the semiconductor device 10D are connected to each other via the wiring layer 13B and the connection pin 15H. Further, another structure of the semiconductor device 21A by soldering at least the outer lead 22A for example via a through hole 16I to the top of the connection pin 15I connecting at least the external leads 2A 9 of the lower semiconductor device 10C of the wiring board 14B Are directly joined and fixed in an upright state, and the external leads 2A 3 and 2A of the semiconductor device 10C in the lower stage are further fixed.
The state where the semiconductor device 21B of other structure is upright by connecting the external leads 22B 1 and 22B 2 to the upper part of the connection pins 15J and 15K to be connected to 5 via the through holes 16J and 16K, respectively. Are connected and fixed together, and a multifunctional and large-scale semiconductor device is constituted by the whole of them. The connection structure between the connection pins of the wiring board and the external leads of the semiconductor device is the same as that of the above-mentioned embodiment and is omitted in this figure.

【0021】また図5に模式側面図を示したのは、フラ
ット構造の大型樹脂モールド半導体装置上に、大型の配
線基板及び金属配線体を介してフラット構造の小型樹脂
モールド半導体装置が多段に積み重ねられ、且つ同配線
基板上に前記実施例同様の手段により他の構造の半導体
装置が直立搭載され、更に同配線基板が下部の樹脂モー
ルド半導体装置に接する金属放熱体を有し、その放熱体
上に放熱フィンが固着されて、一体の多機能第規模の半
導体装置が構成された例を示している。
FIG. 5 is a schematic side view showing that small resin mold semiconductor devices having a flat structure are stacked in multiple stages on a large resin mold semiconductor device having a flat structure via a large wiring board and a metal wiring body. A semiconductor device having another structure is vertically mounted on the same wiring board by the same means as in the above-mentioned embodiment, and further, the wiring board has a metal heat radiator in contact with the lower resin-molded semiconductor device. 1 shows an example in which a radiation fin is fixedly attached to a multi-functional first-scale semiconductor device.

【0022】即ちこの例においては、下段のフラット構
造の大型樹脂モールド半導体装置15C 上に接続ピン15L
〜15R により半導体装置15C の外部リード2A1 〜2A7
それぞれ接続し、接続ピン15S 〜15Y で半導体装置15C
の外部リード2A19〜2A25に接続する大型の配線基板14C
が固着される。この配線基板14C にはそのほぼ中心部に
下部の半導体装置15C に底面が接するCu若しくAl等の金
属放熱体17が固着されており、更にこの放熱体17上にC
u、Al等からなる放熱フィン18が固着されている。また
配線基板14C の一方の領域上には、前述したような配線
体12を用いて4段に積み上げられた小型のフラット型樹
脂モールド半導体装置10D 、10E 、10F 、10G の多重体
が同じく配線体12、配線基板14C の図示しない配線層及
びスルーホール等及び接続ピンの例えば15T 、15W をそ
れぞれ介して下部の大型樹脂モールド半導体装置15C の
外部リード2A20及び2A23にそれぞれ接続され、配線基板
14Cの他方の領域の図示しない配線パターン上には、接
続ピン15L 〜15R の何れかを介して下部の大型樹脂モー
ルド半導体装置15C の外部リード2A1 〜2A7 の何れかに
接続する異なる構造の半導体装置21C 、21D 、21E 等が
例えば直立状態で、回路配線上に半田接合等により直に
搭載され、これら全体によって多機能大規模の半導体装
置が構成される。なお、配線基板及び金属配線体の接続
ピンと半導体装置の外部リードとの接続構造は前記実施
例と同様に省略されている。
That is, in this example, the connection pin 15L is provided on the large-sized resin-molded semiconductor device 15C having a flat structure in the lower stage.
~ 15R to connect to the external leads 2A 1 to 2A 7 of the semiconductor device 15C, and connect the semiconductor device 15C to the connection pins 15S to 15Y.
Large wiring board 14C to connect to external leads 2A 19 to 2A 25
Is fixed. On this wiring board 14C, a metal radiator 17 such as Cu or Al whose bottom surface is in contact with the lower semiconductor device 15C is fixed to the center of the wiring board 14C.
A radiation fin 18 made of u, Al or the like is fixed. In addition, on one area of the wiring board 14C, the small flat type resin-molded semiconductor devices 10D, 10E, 10F, and 10G, which are stacked in four stages by using the wiring body 12 as described above, also have the same wiring body. 12. Wiring board 14C is connected to the external leads 2A 20 and 2A 23 of the large-sized resin-molded semiconductor device 15C below through the wiring layer, through holes, etc. (not shown) of the wiring board 14C and connection pins, for example, 15T and 15W, respectively.
The other regions of 14C On the wiring pattern (not shown), connecting pins 15L of different structures to be connected to either the external lead 2A 1 to 2A region 7 of the lower large resin molded semiconductor device 15C through either ~15R The semiconductor devices 21C, 21D, 21E, etc. are mounted upright, for example, directly on the circuit wiring by soldering or the like, and the whole of them constitutes a multifunctional large-scale semiconductor device. The connection structure between the connection pins of the wiring board and the metal wiring body and the external leads of the semiconductor device is omitted as in the above embodiment.

【0023】上記実施例に示したように本発明において
は、樹脂封止型半導体装置の樹脂封止部に樹脂内に埋め
込まれた外部リードを底部に表出する小開孔を設けてお
き、下段の上記半導体装置とその上部に重ねられる上段
の上記半導体装置とを、前記小開孔内に挿入可能な接続
ピンを有し、所望の配線経路を有する金属配線体あるい
は配線基板によって接続して一体のより多機能大規模の
樹脂封止型半導体装置が形成される。従って上記金属配
線体或いは配線基板の配線経路を所望に応じて種々に変
更することによって同一機能を有する小規模な樹脂半導
体装置を用い種々の異なる機能を有する多機能大規模な
樹脂封止半導体装置を容易に形成することが可能にな
る。
As shown in the above embodiment, in the present invention, a small opening for exposing the external lead embedded in the resin to the bottom is provided in the resin-sealed portion of the resin-sealed semiconductor device, The semiconductor device of the lower stage and the semiconductor device of the upper stage which is stacked on the upper stage are connected by a metal wiring body or a wiring board having a connection pin that can be inserted into the small opening and having a desired wiring path. An integrated, multi-functional and large-scale resin-encapsulated semiconductor device is formed. Therefore, a small-scale resin semiconductor device having the same function is used by variously changing the wiring route of the metal wiring body or the wiring board as desired, and a multi-function large-scale resin-sealed semiconductor device having various different functions is used. Can be easily formed.

【0024】なお、多重化される樹脂封止型半導体装置
は上記実施例に示したフラット構造の表面実装型に限ら
れるものではない。また、前記接続ピンと外部リードと
の接合は、レーザ溶接により行うこともできる。
The resin-encapsulated semiconductor device to be multiplexed is not limited to the flat surface-mounted semiconductor device shown in the above embodiment. Also, the connection between the connection pin and the external lead can be performed by laser welding.

【0025】[0025]

【発明の効果】以上説明のように本発明によれば、同一
の機能を有する小規模樹脂封止型半導体装置を多重化す
ることによって、より複雑な回路構成を有する種々の多
機能若しくは大規模の樹脂封止型半導体装置が容易に形
成できるので、多重構造の多機能大規模樹脂封止型半導
体装置の生産性が大幅に向上する。
As described above, according to the present invention, by multiplexing small-scale resin-sealed semiconductor devices having the same function, various multi-functions or large-scales having a more complicated circuit configuration can be obtained. Since the resin-encapsulated semiconductor device can be easily formed, the productivity of the multi-functional multi-functional large-scale resin-encapsulated semiconductor device is significantly improved.

【図面の簡単な説明】[Brief description of drawings]

【図1】 本発明に用いる小規模樹脂封止型半導体装置
の一実施例の模式図
FIG. 1 is a schematic view of an embodiment of a small-scale resin-sealed semiconductor device used in the present invention.

【図2】 本発明の多重構造樹脂封止型半導体装置の第
1の実施例の模式図
FIG. 2 is a schematic diagram of a first embodiment of a multiple structure resin-encapsulated semiconductor device of the present invention.

【図3】 本発明の多重構造樹脂封止型半導体装置の第
2の実施例を示す図
FIG. 3 is a diagram showing a second embodiment of a multi-structure resin-encapsulated semiconductor device of the present invention.

【図4】 本発明の多重構造樹脂封止型半導体装置の第
3の実施例の模式側面図
FIG. 4 is a schematic side view of a third embodiment of a multiple structure resin-sealed semiconductor device of the present invention.

【図5】 本発明の多重構造樹脂封止型半導体装置の第
4の実施例の模式側面図
FIG. 5 is a schematic side view of a fourth embodiment of a multiple structure resin-sealed semiconductor device of the present invention.

【図6】 多重構造樹脂封止型半導体装置の従来例の模
式図
FIG. 6 is a schematic view of a conventional example of a multi-structure resin-encapsulated semiconductor device.

【符号の説明】[Explanation of symbols]

1、10A 、10B 表面実装型樹脂モールド半導体装置 2、2A、2B、2A2 、2A8 、2B2 、2B9 外部リード 4 樹脂パッケージ 5A、5B 小開孔 6 チップステージ 7 半導体チップ 8 チップ固着材 9 ボンディングワイヤ 11A 、11B 接続ピン 12、12A 、12B 金属配線体 13 導電性接合材1, 10A, 10B Surface mount type resin mold semiconductor device 2, 2A, 2B, 2A 2 , 2A 8 , 2B 2 , 2B 9 External lead 4 Resin package 5A, 5B Small opening 6 Chip stage 7 Semiconductor chip 8 Chip fixing material 9 Bonding wire 11A, 11B Connection pin 12, 12A, 12B Metal wiring body 13 Conductive bonding material

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】 複数の小規模樹脂封止型半導体装置が積
み重ねられ且つ相互に接続されて大規模に構成される樹
脂封止型半導体装置であって、該小規模樹脂封止型半導
体装置が、樹脂封止部の上下両面若しくはいずれか一方
の面に外部リードの該樹脂封止部内に埋め込まれた部分
を表出する開孔を有し、下段の該半導体装置と上段の該
半導体装置とが、端部に接続ピンを備え、該接続ピンが
該上下段の半導体装置の対向する面の該開孔内に挿入さ
れ当接する該外部リードに接合された所定の配線経路を
有する金属配線体を介して積み重ねられ、電気的に接続
固着されてなることを特徴とする樹脂封止型半導体装
置。
1. A resin-encapsulated semiconductor device in which a plurality of small-scale resin-encapsulated semiconductor devices are stacked and connected to each other to form a large scale, wherein the small-scale resin-encapsulated semiconductor device is A lower semiconductor device and an upper semiconductor device, each of which has an opening for exposing a portion of the external lead embedded in the resin encapsulation part on the upper and lower surfaces of the resin encapsulation part or on one of the surfaces. A metal wiring body having a connecting pin at an end thereof and having a predetermined wiring path joined to the external lead that is inserted into and abuts the opening of the facing surface of the upper and lower semiconductor devices. A resin-encapsulated semiconductor device, wherein the resin-encapsulated semiconductor device is stacked by means of, and electrically connected and fixed.
【請求項2】 複数の小規模樹脂封止型半導体装置が積
み重ねられ且つ相互に接続されて大規模に構成される樹
脂封止型半導体装置であって、該小規模樹脂封止型半導
体装置が、樹脂封止部の上下両面若しくはいずれか一方
の面に外部リードの該樹脂封止部内に埋め込まれた部分
を表出する開孔を有し、下段の該半導体装置と上段の該
半導体装置とが、該上下段の半導体装置の対向する面の
該開孔内に挿入され当接する該内部リードに接合された
接続ピンを具備し所定の配線経路を有する配線基板を介
して積み重ねられ、電気的に接続固着されてなることを
特徴とする樹脂封止型半導体装置。
2. A resin-encapsulated semiconductor device in which a plurality of small-scale resin-encapsulated semiconductor devices are stacked and connected to each other to form a large scale, wherein the small-scale resin-encapsulated semiconductor device is A lower semiconductor device and an upper semiconductor device, each of which has an opening for exposing a portion of the external lead embedded in the resin encapsulation part on the upper and lower surfaces of the resin encapsulation part or on one of the surfaces. Are stacked via a wiring board having a predetermined wiring path, which has connection pins joined to the internal leads that are inserted into and abut against the facing surfaces of the upper and lower semiconductor devices, and are electrically connected. A resin-encapsulated semiconductor device, characterized in that it is connected and fixed to.
【請求項3】 前記配線体若しくは前記配線基板の接続
ピンと当接する前記外部リードとの接合が、溶融金属、
導電性樹脂、或いは溶接によってなされていることを特
徴とする請求項1または2記載の樹脂封止型半導体装
置。
3. The connection with the external lead, which abuts the connection pin of the wiring body or the wiring board, is made of molten metal,
The resin-encapsulated semiconductor device according to claim 1 or 2, which is made of a conductive resin or welded.
【請求項4】 前記配線基板が、該配線基板上に直に固
着接続された別の半導体装置を有してなることを特徴と
する請求項2または3記載の樹脂封止型半導体装置。
4. The resin-sealed semiconductor device according to claim 2, wherein the wiring board has another semiconductor device directly fixedly connected to the wiring board.
【請求項5】 前記配線基板が、少なくとも前記下段の
半導体装置に接する金属放熱体を有してなることを特徴
とする請求項2または3または4記載の樹脂封止型半導
体装置。
5. The resin-encapsulated semiconductor device according to claim 2, wherein the wiring board has a metal heat radiator that is in contact with at least the lower semiconductor device.
JP5028309A 1993-02-18 1993-02-18 Plastic sealed type semiconductor device Pending JPH06244361A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5028309A JPH06244361A (en) 1993-02-18 1993-02-18 Plastic sealed type semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5028309A JPH06244361A (en) 1993-02-18 1993-02-18 Plastic sealed type semiconductor device

Publications (1)

Publication Number Publication Date
JPH06244361A true JPH06244361A (en) 1994-09-02

Family

ID=12245024

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5028309A Pending JPH06244361A (en) 1993-02-18 1993-02-18 Plastic sealed type semiconductor device

Country Status (1)

Country Link
JP (1) JPH06244361A (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5944857A (en) * 1982-09-07 1984-03-13 Toshiba Corp Electronic circuit device
JPS6450551A (en) * 1987-08-21 1989-02-27 Nec Corp Ic package structure
JPH04364794A (en) * 1991-06-11 1992-12-17 Mitsubishi Electric Corp Semiconductor module

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5944857A (en) * 1982-09-07 1984-03-13 Toshiba Corp Electronic circuit device
JPS6450551A (en) * 1987-08-21 1989-02-27 Nec Corp Ic package structure
JPH04364794A (en) * 1991-06-11 1992-12-17 Mitsubishi Electric Corp Semiconductor module

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