JPH06237026A - Forming method of thick-film electrode - Google Patents

Forming method of thick-film electrode

Info

Publication number
JPH06237026A
JPH06237026A JP5045797A JP4579793A JPH06237026A JP H06237026 A JPH06237026 A JP H06237026A JP 5045797 A JP5045797 A JP 5045797A JP 4579793 A JP4579793 A JP 4579793A JP H06237026 A JPH06237026 A JP H06237026A
Authority
JP
Japan
Prior art keywords
glass
ceramic substrate
electrode
thick film
forming
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5045797A
Other languages
Japanese (ja)
Inventor
Soushi Saoshita
宗士 竿下
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Murata Manufacturing Co Ltd
Original Assignee
Murata Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Murata Manufacturing Co Ltd filed Critical Murata Manufacturing Co Ltd
Priority to JP5045797A priority Critical patent/JPH06237026A/en
Publication of JPH06237026A publication Critical patent/JPH06237026A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To improve the stability of electrode characteristics by previously forming the thin-films of glass for joining on approximately the whole surfaces of the surface and rear of a ceramic board and forming a conductive film. CONSTITUTION:A ceramic board is prepared by molding and baking a piezoelectric ceramic material using a PZT as a base, and the ceramic board in specified thickness is acquired by lapping. Borosilicate glass is used as glass for jointing, the raw material powder of the borosilicate glass is laminated on the ceramic board 1 in thickness of 800Angstrom through sputtering to form the thin-films 3 of glass for jointing, and the surfaces of the ceramic board 1 are improved. The thin-films of glass are homogenized through annealing at 700 deg.C. The surfaces of the thin-films 3 of glass for jointing are coated with silver paste, dried and baked to shape conductive films 4, thus forming a thick-film electrode. Accordingly, the stability of electrode characteristics can be improved.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、圧電性のセラミック基
板に厚膜電極を形成する方法に関し、例えば、エネルギ
ー閉じ込め型の広がり振動モードを利用する圧電基板を
形成する電極を、銀ペーストを使用して形成する厚膜電
極の形成方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method of forming a thick film electrode on a piezoelectric ceramic substrate. For example, a silver paste is used as an electrode for forming a piezoelectric substrate utilizing an energy trapping spread vibration mode. The present invention relates to a method for forming a thick film electrode formed by the above method.

【0002】[0002]

【従来の技術】従来、圧電性のセラミック基板を、圧電
性のセラミックス材料を成形・焼成して作成する。この
セラミック基板は、エネルギー閉じ込め型の広がり振動
モードに使用するとき、セラミック基板の所要面を平滑
にし、セラミック基板を挟んで厚膜電極を形成した後、
絶縁油中で高電圧、例えば2〜5KV/mmをセラミック
基板を挟んで厚膜電極に印加することにより分極し、圧
電基板を形成している。ところで、上記の従来のセラミ
ック基板に厚膜電極を形成する方法は、図3に示すよう
に、セラミック基板1の電極を形成する面をラップによ
り平滑にする工程と(図3(a))、銀ペーストにガラ
スフリット成分を混合した電極材を塗布し、焼付けて厚
膜電極2を形成する工程(図3(b))からなってい
る。
2. Description of the Related Art Conventionally, a piezoelectric ceramic substrate is formed by molding and firing a piezoelectric ceramic material. When this ceramic substrate is used in the energy confinement type spreading vibration mode, after smoothing the required surface of the ceramic substrate and forming a thick film electrode across the ceramic substrate,
A high voltage, for example, 2 to 5 KV / mm, is applied in a thick film electrode in insulating oil across a ceramic substrate to polarize it and form a piezoelectric substrate. By the way, the method of forming a thick film electrode on the conventional ceramic substrate described above includes a step of smoothing the surface of the ceramic substrate 1 on which the electrode is formed by lapping as shown in FIG. 3 (FIG. 3A). This is a step (FIG. 3B) of applying an electrode material in which a glass frit component is mixed to silver paste and baking it to form the thick film electrode 2.

【0003】[0003]

【発明が解決しようとする課題】上記のように、従来の
セラミック基板に厚膜電極を形成する方法は、セラミッ
ク基板の電極を形成する面をラップすることにより平滑
にした後、厚膜電極を形成している。しかし、セラミッ
ク基板は、圧電性のセラミックス材料を成形・焼成して
得ているので、表面はどうしてもポーラスになってお
り、このポーラスな面に厚膜電極を形成すると、厚膜電
極の密着性が悪く、電極の電気特性が悪い。そこで、厚
膜電極の密着性を改善するため、銀ペーストにガラスフ
リット成分を混合した電極材を塗布し、焼き付けて厚膜
電極を形成している。しかしながら、銀ペーストにガラ
スフリット成分を混合した電極材を用いる場合でも、ガ
ラスフリット中のガラス粒径及び濃度分布にばらつきが
あるため、ガラスフリットのセラミック基板への拡散量
が不安定であり、厚膜電極の密着性が悪く、圧電体セラ
ミックスの諸特性に影響を及ぼし、電極の電気特性の品
質が低下するという問題点があった。
As described above, in the conventional method for forming a thick film electrode on a ceramic substrate, the surface of the ceramic substrate on which the electrode is formed is smoothed by lapping the thick film electrode. Is forming. However, since the ceramic substrate is obtained by molding and firing a piezoelectric ceramic material, the surface is inevitably porous, and if a thick film electrode is formed on this porous surface, the adhesion of the thick film electrode will be improved. Poor, the electrical characteristics of the electrode are poor. Therefore, in order to improve the adhesion of the thick film electrode, an electrode material in which a glass frit component is mixed with silver paste is applied and baked to form the thick film electrode. However, even when the electrode material in which the glass frit component is mixed with the silver paste is used, the amount of diffusion of the glass frit into the ceramic substrate is unstable because the glass particle size and concentration distribution in the glass frit vary. There is a problem in that the adhesion of the membrane electrode is poor, the characteristics of the piezoelectric ceramics are affected, and the quality of the electrical characteristics of the electrode deteriorates.

【0004】本発明は上記従来技術の有する問題点を解
決するためになされたもので、圧電性のセラミック基板
に安定した厚膜電極を形成でき、厚膜電極の品質を向上
できる厚膜電極の形成方法を提供することを目的として
いる。
The present invention has been made to solve the above-mentioned problems of the prior art. A thick film electrode capable of forming a stable thick film electrode on a piezoelectric ceramic substrate and improving the quality of the thick film electrode is provided. It is intended to provide a forming method.

【0005】[0005]

【課題を解決するための手段】上記問題点を解決するた
めの本発明に係る厚膜電極の形成方法は、圧電性のセラ
ミック基板の表裏の両主面に接合用のガラスの薄膜を形
成し、基板の表面を改質した後、銀ペーストを塗布して
厚膜電極を形成することを特徴とする。接合用のガラス
の薄膜を形成するガラス原料として、シリカガラス、鉛
ガラス、バリウムガラス、その他酸化物ガラスであると
ハロゲン化物ガラスとは問わず各種のものが使用でき
る。又はそれらのガラスにチタン酸ジルコン酸鉛等の圧
電性のセラミックスの材料成分等を混合したものを用い
てもよい。ガラスの薄膜を形成するガラスは、セラミッ
ク基板との密着性がよく、基板の特性に重大な影響を与
えないものであればよい。
A method of forming a thick film electrode according to the present invention for solving the above problems is to form glass thin films for bonding on both main surfaces of the front and back of a piezoelectric ceramic substrate. After modifying the surface of the substrate, a silver paste is applied to form a thick film electrode. As a glass raw material for forming a thin film of glass for bonding, various materials such as silica glass, lead glass, barium glass, and other oxide glass can be used regardless of halide glass. Alternatively, a mixture of such glass with material components of piezoelectric ceramics such as lead zirconate titanate may be used. The glass forming the glass thin film may be one that has good adhesion to the ceramic substrate and does not significantly affect the characteristics of the substrate.

【0006】[0006]

【作用】本発明に係る厚膜電極の形成方法によれば、圧
電性のセラミックス材料を成形・燒成し、ラップ加工し
て所要面を平滑にし、所定の厚みのセラミック基板とす
る。このセラミック基板の厚みは、圧電基板の必要とす
る仕様により決まるが、200〜1200μm程度の厚
みが用いられる。セラミック基板の所要面に接合用のガ
ラスの薄膜を、スパッタリング、蒸着のように原料粉末
を気化してセラミック基板の面に凍結するか、又は液体
原料を作成し、ゾル−ゲル法により形成し、セラミック
基板の表面を改質する。このガラスの薄膜の厚みとして
は、セラミック基板の表面の状態にもよるが、100〜
9000Å程度にする。薄すぎるとガラスの膜の形成の
効果が少なく、厚すぎると圧電基板の特性が変わる。次
いで、600〜800℃でアニーリングを行い、ガラス
の薄膜を均質化する。その後、セラミック基板を挟んで
対向する薄いガラスの膜の面に銀ペーストを塗布し、こ
の銀ペーストを焼付けることにより厚膜電極を形成す
る。そして、高電圧を印加して圧電基板を形成する。
According to the method of forming a thick film electrode according to the present invention, a piezoelectric ceramic material is molded and fired, and a lapping process is performed to smooth a required surface to obtain a ceramic substrate having a predetermined thickness. The thickness of this ceramic substrate is determined by the specifications required for the piezoelectric substrate, but a thickness of about 200 to 1200 μm is used. A thin film of glass for bonding to the required surface of the ceramic substrate, sputtering, vaporization of the raw material powder as in vapor deposition to freeze the surface of the ceramic substrate, or to create a liquid raw material, formed by the sol-gel method, Modify the surface of the ceramic substrate. The thickness of this glass thin film depends on the state of the surface of the ceramic substrate, but is 100-
Set to about 9000Å. If it is too thin, the effect of forming a glass film is small, and if it is too thick, the characteristics of the piezoelectric substrate change. Next, annealing is performed at 600 to 800 ° C. to homogenize the glass thin film. Then, a silver paste is applied to the surfaces of the thin glass films facing each other with the ceramic substrate sandwiched therebetween, and the silver paste is baked to form a thick film electrode. Then, a high voltage is applied to form the piezoelectric substrate.

【0007】[0007]

【実施例】以下、本発明の厚膜電極の形成方法の一実施
例を図面に基づいて説明する。図1は本発明の一実施例
による厚膜電極の形成方法を説明するための膜の形成状
態を示す図である。圧電性のセラミックス材料を用いて
成形・燒成してセラミック基板1を作成する。このセラ
ミック基板1の表裏の両主面のほぼ全面にガラス層を形
成し、改質した後、アニーリングを行い、ガラス層を均
質化することにより接合用のガラスの薄膜3を形成する
(図1(a))。次いで、銀ペースト4を塗布して乾燥
させた後、焼き付けることにより厚膜電極を形成する
(図1(b))。上記の接合用のガラスの薄膜の組成や
形成厚みは、アニーリングの条件、圧電性のセラミック
ス材料の組成や板厚及びセラミック基板の要求される特
性によって変える。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the method for forming a thick film electrode of the present invention will be described below with reference to the drawings. FIG. 1 is a diagram showing a film formation state for explaining a method of forming a thick film electrode according to an embodiment of the present invention. A ceramic substrate 1 is formed by molding and firing using a piezoelectric ceramic material. A glass layer is formed on substantially the entire front and back main surfaces of the ceramic substrate 1, modified, and then annealed to homogenize the glass layer to form a glass thin film 3 for bonding (FIG. 1). (A)). Next, the silver paste 4 is applied, dried, and then baked to form a thick film electrode (FIG. 1B). The composition and thickness of the glass thin film for bonding described above vary depending on the annealing conditions, the composition and thickness of the piezoelectric ceramic material, and the required characteristics of the ceramic substrate.

【0008】本実施例において、PZTをベースとした
圧電性のセラミックス材料を成形・燒成してセラミック
基板を作成し、ラップにより所定の厚みのセラミック基
板1を得た。接合用のガラスにホウケイ酸ガラスを用
い、このホウケイ酸ガラスの原料粉末をスパッタリング
により、セラミック基板1に厚み約800Åに積層して
接合用のガラスの薄膜3を形成し、セラミック基板1の
表面を改質した。その後、700℃でアニーリングを行
い、ガラスの薄膜を均質化した。次いで、図1(b)に
示すように、接合用のガラスの薄膜3の表面に銀ペース
トを塗布し乾燥した後、焼付けて導電性の膜4を形成す
ることにより厚膜電極を形成した。このように厚膜電極
4を形成したセラミック基板1の表裏の対向する厚膜電
極4に、図2に示すように、高圧電源5を接続し、2〜
5KV/mmを厚膜電極4に印加してセラミック基板1を
分極した。その後、所定の寸法に切断して素子用の圧電
基板を切り出した。本実施例によれば、セラミック基板
1の面に形成する接合用のガラスの量をコントロールで
き、ガラスの薄膜3のガラス拡散によるセラミック基板
1への影響をコントロールできる。その結果、厚膜電極
とセラミック基板1との密着が良好に均一に形成でき、
電極の品質を向上でき、電極特性の安定性を向上でき
た。
In this example, a piezoelectric ceramic material based on PZT was molded and fired to form a ceramic substrate, and a ceramic substrate 1 having a predetermined thickness was obtained by lapping. Borosilicate glass is used as the bonding glass, and the raw material powder of the borosilicate glass is sputtered to form a thin glass film 3 for bonding on the ceramic substrate 1 with a thickness of about 800 Å. Modified. Then, annealing was performed at 700 ° C. to homogenize the glass thin film. Next, as shown in FIG. 1B, a silver paste was applied to the surface of the thin glass film 3 for bonding, dried, and then baked to form a conductive film 4, thereby forming a thick film electrode. As shown in FIG. 2, a high voltage power source 5 is connected to the thick film electrodes 4 facing each other on the front and back of the ceramic substrate 1 on which the thick film electrodes 4 are thus formed,
The ceramic substrate 1 was polarized by applying 5 KV / mm to the thick film electrode 4. Then, the piezoelectric substrate for an element was cut out by cutting it into a predetermined size. According to this embodiment, the amount of the bonding glass formed on the surface of the ceramic substrate 1 can be controlled, and the influence of the glass diffusion of the glass thin film 3 on the ceramic substrate 1 can be controlled. As a result, the adhesion between the thick film electrode and the ceramic substrate 1 can be formed favorably and uniformly,
The quality of the electrode could be improved and the stability of the electrode characteristics could be improved.

【0009】本発明によれば、セラミック基板の表裏の
両主面のほぼ全面に接合用のガラスの膜を薄く形成した
後、銀ペーストを塗布して厚膜電極を形成しているの
で、セラミック基板の面に形成する接合用のガラスの量
をコントロールでき、ガラスの薄膜のガラス拡散による
セラミック基板への影響をコントロールできる。その結
果、厚膜電極とセラミック基板との密着が良好に均一に
形成でき、電極の品質を向上でき、電極特性の安定性を
向上できる。なお、上記実施例では広がり振動モード用
のセラミック基板で説明したが、他の厚み縦又は広がり
振動モード用のセラミック基板又は他の電子部品の厚膜
電極の場合にも同様に適用できる。
According to the present invention, since a glass film for bonding is thinly formed on substantially the entire front and back main surfaces of the ceramic substrate, a silver paste is applied to form a thick film electrode. It is possible to control the amount of glass for bonding formed on the surface of the substrate and to control the influence of the glass diffusion of the glass thin film on the ceramic substrate. As a result, the adhesion between the thick film electrode and the ceramic substrate can be formed favorably and uniformly, the quality of the electrode can be improved, and the stability of the electrode characteristics can be improved. Although the ceramic substrate for the spreading vibration mode has been described in the above embodiment, the invention can be similarly applied to the ceramic substrate for other thickness longitudinal or spreading vibration mode or the thick film electrode of another electronic component.

【0010】[0010]

【発明の効果】上記のように本発明に係る厚膜電極の形
成方法によれば、予めセラミック基板の表裏の両主面の
ほぼ全面に接合用のガラスの薄膜を形成した後、導電膜
を形成するので、厚膜電極とセラミック基板との密着が
良好に均一にでき、電極の品質を向上でき、電極特性の
安定性を向上できる。
As described above, according to the method for forming a thick film electrode of the present invention, a thin film of glass for bonding is formed in advance on substantially the entire both main surfaces of the front and back surfaces of the ceramic substrate, and then the conductive film is formed. Since it is formed, the adhesion between the thick film electrode and the ceramic substrate can be favorably and uniformly made, the quality of the electrode can be improved, and the stability of the electrode characteristics can be improved.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例による厚膜電極の形成方法を
説明するための膜の形成状態を示す図である。
FIG. 1 is a diagram showing a film formation state for explaining a method of forming a thick film electrode according to an embodiment of the present invention.

【図2】上記実施例の厚膜電極を形成したセラミック基
板の分極方法を説明する図である。
FIG. 2 is a diagram illustrating a polarization method of a ceramic substrate on which a thick film electrode of the above-mentioned embodiment is formed.

【図3】従来の厚膜電極の形成方法を説明するための斜
視図である。
FIG. 3 is a perspective view for explaining a conventional method of forming a thick film electrode.

【符号の説明】[Explanation of symbols]

1 セラミック基板 3 ガラスの薄膜 4 厚膜電極 1 Ceramic substrate 3 Glass thin film 4 Thick film electrode

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.5 識別記号 庁内整理番号 FI 技術表示箇所 H03H 3/02 B 7719−5J ─────────────────────────────────────────────────── ─── Continuation of the front page (51) Int.Cl. 5 Identification code Office reference number FI technical display location H03H 3/02 B 7719-5J

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 圧電性のセラミック基板の表裏の両主面
に接合用のガラスの薄膜を形成し、前記セラミック基板
の表面を改質した後、銀ペーストを塗布して厚膜電極を
形成することを特徴とする厚膜電極の形成方法。
1. A thick film electrode is formed by forming thin films of glass for bonding on both front and back main surfaces of a piezoelectric ceramic substrate, modifying the surface of the ceramic substrate, and then applying a silver paste. A method of forming a thick film electrode, comprising:
JP5045797A 1993-02-09 1993-02-09 Forming method of thick-film electrode Pending JPH06237026A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5045797A JPH06237026A (en) 1993-02-09 1993-02-09 Forming method of thick-film electrode

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5045797A JPH06237026A (en) 1993-02-09 1993-02-09 Forming method of thick-film electrode

Publications (1)

Publication Number Publication Date
JPH06237026A true JPH06237026A (en) 1994-08-23

Family

ID=12729271

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5045797A Pending JPH06237026A (en) 1993-02-09 1993-02-09 Forming method of thick-film electrode

Country Status (1)

Country Link
JP (1) JPH06237026A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011254569A (en) * 2010-05-31 2011-12-15 Canon Inc Vibrator, method for manufacturing the same, and vibration wave actuator
US9484519B2 (en) 2013-03-29 2016-11-01 Ngk Insulators, Ltd. Piezoelectric/electrostrictive element
JP2016535924A (en) * 2013-07-29 2016-11-17 フエロ コーポレーション Method for forming conductive traces
CN109608194A (en) * 2018-12-13 2019-04-12 广东工业大学 A kind of lead zirconate titanate thick film ceramics and its preparation method and application

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011254569A (en) * 2010-05-31 2011-12-15 Canon Inc Vibrator, method for manufacturing the same, and vibration wave actuator
US9484519B2 (en) 2013-03-29 2016-11-01 Ngk Insulators, Ltd. Piezoelectric/electrostrictive element
JP2016535924A (en) * 2013-07-29 2016-11-17 フエロ コーポレーション Method for forming conductive traces
CN109608194A (en) * 2018-12-13 2019-04-12 广东工业大学 A kind of lead zirconate titanate thick film ceramics and its preparation method and application
CN109608194B (en) * 2018-12-13 2022-06-03 广东工业大学 Lead zirconate titanate thick film ceramic and preparation method and application thereof

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