JPH06236937A - Package for microwave semiconductor device - Google Patents

Package for microwave semiconductor device

Info

Publication number
JPH06236937A
JPH06236937A JP2282393A JP2282393A JPH06236937A JP H06236937 A JPH06236937 A JP H06236937A JP 2282393 A JP2282393 A JP 2282393A JP 2282393 A JP2282393 A JP 2282393A JP H06236937 A JPH06236937 A JP H06236937A
Authority
JP
Japan
Prior art keywords
microwave
chip
semiconductor device
package
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2282393A
Other languages
Japanese (ja)
Inventor
Takeshi Sekiguchi
剛 関口
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Electric Industries Ltd
Original Assignee
Sumitomo Electric Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Electric Industries Ltd filed Critical Sumitomo Electric Industries Ltd
Priority to JP2282393A priority Critical patent/JPH06236937A/en
Publication of JPH06236937A publication Critical patent/JPH06236937A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48225Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/48227Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/161Cap
    • H01L2924/1615Shape
    • H01L2924/16152Cap comprising a cavity for hosting the device, e.g. U-shaped cap

Landscapes

  • Waveguide Connection Structure (AREA)

Abstract

PURPOSE:To transmit a microwave signal without its loss and to attenuate an inessential signal by a method wherein short stubs in the specific length of respective microwave-signal wavelengths are installed at individual end parts of input/output terminals. CONSTITUTION:A die area 7 on which a chip 4 is mounted is formed in nearly the central part of a ceramic substrate 2, and a grounding pare 8 which comes into continuity with the die area 7 is installed on its rear part. Lead frames 9 are connected to the grounding plate 8 via short stubs 1 whose length is nearly (2n+1)/4 times as long as a microwave-signal wavelength to be used, and static electricity or the like which is input from outer lead wires 10 is discharged by the grounding plate 8 via the short stubs 1. Thereby, it is possible to prevent the semiconductor chip 4 at the inside from being destroyed, and it is possible to reduce the noise of a microwave semiconductor device after the chip 4 has been mounted.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、モノリシックマイクロ
波集積回路(monolitic microwave intergrated circui
t 、以下、MMICと略称する)等、マイクロ波半導体
装置を実装するためのパッケージの構造に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a monolithic microwave integrated circuit.
t, hereinafter abbreviated as MMIC), etc., for the structure of a package for mounting a microwave semiconductor device.

【0002】[0002]

【従来の技術】近年、マイクロ波帯の半導体装置チップ
(以下、単にチップと称する)の実装を目的としたパッ
ケージは、チップの高集積・多機能・高速化に対応し
て、材料・構造面で大きく変革している。
2. Description of the Related Art In recent years, packages intended for mounting semiconductor device chips in the microwave band (hereinafter simply referred to as "chips") have been developed in terms of material and structure in view of high integration, multi-functionality and high speed of chips. Is undergoing a major transformation.

【0003】例えば、材料面では、チップの発熱を考慮
して、熱放散性、熱伝導度に優れ、且つチップ材料とほ
ぼ同一の熱膨張率を有するSiC、AlN等のセラミッ
ク材料が用いられ、その構造も、例えばフラットパッケ
ージ(flat package)のように、略正方形状の小形薄板
の周辺にろう付けされた高電導薄膜から成る複数のリー
ド線が、中央部のチップに対してほぼ均等の長さで夫々
配され、インピーダンス整合の容易化と伝送損失の低減
化が図られているものもある。
In terms of materials, for example, in consideration of heat generation of the chip, a ceramic material such as SiC or AlN having excellent heat dissipation and thermal conductivity and a coefficient of thermal expansion almost the same as that of the chip material is used. The structure is also such that, for example, in the case of a flat package, a plurality of lead wires made of a high-conductivity thin film brazed around a small thin plate having a substantially square shape have a substantially uniform length with respect to the central chip. In some cases, the impedance matching is facilitated and the transmission loss is reduced.

【0004】より一般的な構造としては、直流から高周
波まで広帯域でインピーダンス整合がとれ、且つ、伝送
損失が小さくなるように設計された入出力端子がセラミ
ック面上に形成されている。そして、これら入出力端子
とチップ各部、あるいは外部端子との間を配線すること
でマイクロ波信号がチップを含んで構成される電子回路
内を伝播するようになっている。
As a more general structure, input / output terminals designed to have impedance matching in a wide band from direct current to high frequency and to reduce transmission loss are formed on a ceramic surface. Then, wiring between these input / output terminals and each part of the chip or external terminals allows the microwave signal to propagate through an electronic circuit including the chip.

【0005】[0005]

【発明が解決しようとする課題】このように、従来のパ
ッケージは、広帯域で使用可能な構造に設計されてお
り、そのため、チップが実装されたマイクロ波半導体装
置を他のマザーボード等にマウントしたり、他の電子部
品と接続する際に、マザーボードの配線部材あるいは電
気的接続を行う他の電子部品に静電気が蓄積されている
と、その静電気がリード線を介してパッケージ内に導か
れ、当該パッケージ内のチップが静電破壊されるという
問題があった。
As described above, the conventional package is designed to have a structure that can be used in a wide band, and therefore, the microwave semiconductor device having the chip mounted thereon cannot be mounted on another mother board or the like. When static electricity is accumulated in the wiring members of the motherboard or other electronic components that make electrical connection when connecting with other electronic components, the static electricity is introduced into the package through the lead wires, and the package concerned There was a problem that the chip inside was electrostatically destroyed.

【0006】本発明は、かかる問題点に鑑みてなされた
もので、その目的とするところは、内部チップを静電破
壊から保護する構造のマイクロ波半導体装置用パッケー
ジを提供することにある。
The present invention has been made in view of the above problems, and an object thereof is to provide a microwave semiconductor device package having a structure for protecting an internal chip from electrostatic breakdown.

【0007】[0007]

【課題を解決するための手段】上記目的を達成する本発
明の構成は、マイクロ波信号が伝播する入出力端子を有
するマイクロ波半導体装置用パッケージにおいて、前記
入出力端子の各端部に、夫々前記マイクロ波信号波長の
略(2n+1)/4倍(nは整数)の長さのショートス
タブを設けたことを特徴としている。
The structure of the present invention for achieving the above object is a microwave semiconductor device package having an input / output terminal through which a microwave signal propagates. It is characterized in that a short stub having a length of approximately (2n + 1) / 4 times (n is an integer) the microwave signal wavelength is provided.

【0008】本発明の他の構成は、その略中央部にマイ
クロ波半導体装置チップが実装される平板状をなし、裏
面部には前記チップと外部リード線との導通をとるリー
ドフレームが形成されたマイクロ波半導体装置用パッケ
ージにおいて、前記リードフレームの先端に、使用する
マイクロ波信号波長の略(2n+1)/4倍(nは整
数)の長さのショートスタブを設けたことを特徴として
いる。
According to another structure of the present invention, a microwave semiconductor device chip is formed in a flat plate shape in a substantially central portion thereof, and a lead frame for electrically connecting the chip and an external lead wire is formed on a back surface portion thereof. In the microwave semiconductor device package, a short stub having a length of approximately (2n + 1) / 4 times (n is an integer) the microwave signal wavelength to be used is provided at the tip of the lead frame.

【0009】上記各構成において、ショートスタブの接
地先は、接地電位であり、且つ、前記チップをマウント
するダイエリア又はこのダイエリアと電気的に接続され
た所定の金属パターンとする。
In each of the above structures, the grounding destination of the short stub is the ground potential, and is the die area for mounting the chip or a predetermined metal pattern electrically connected to the die area.

【0010】[0010]

【作用】ショートスタブは、一の伝送線路の途中に接続
された他の伝送線路のうち、その負荷端が短絡されたも
のをいい、負荷端までの長さが使用マイクロ波信号の波
長の(2n+1)/4倍(nは整数)のときは、接続点
からみたインピーダンスが無限大、即ち、開放された状
態となる(日本包装出版協会、「高周波回路の設計と実
装」、p43〜p47参照)。従って、ほぼこのような
長さのショートスタブを入出力端子に設けると、当該周
波数のマイクロ波信号はショートスタブの方に伝送しに
くくなるので、伝送損失が殆ど無く、且つ、インピーダ
ンス整合も容易となる。他方、当該周波数以外の成分の
信号に対しては、接続点からみたインピーダンスが所定
値となる。従って、不要周波数の信号はこのショートス
タブにより減衰され、伝送信号のフィルタがかかる。
[Function] The short stub is one of the transmission lines connected in the middle of one transmission line whose load end is short-circuited, and the length to the load end is the wavelength of the used microwave signal ( When it is 2n + 1) / 4 times (n is an integer), the impedance seen from the connection point is infinite, that is, it is in an open state (see Japan Packaging and Publishing Association, "Design and Implementation of High Frequency Circuits", p43-p47). ). Therefore, if a short stub having such a length is provided at the input / output terminals, it becomes difficult for the microwave signal of the frequency to be transmitted to the short stub, so that there is almost no transmission loss and impedance matching is easy. Become. On the other hand, for a signal of a component other than the frequency, the impedance seen from the connection point has a predetermined value. Therefore, the signal of the unnecessary frequency is attenuated by this short stub and the transmission signal is filtered.

【0011】また、パッケージが平板状のものでは、使
用周波数にも依存するが、上記ショートスタブのための
特別なスペースを用意する必要がなく、また、性能的に
も、ダイエリアの接地電位が極めて安定なものに設計さ
れるため、フィルタとしての性能も安定したものが得ら
れる。
Further, if the package has a flat plate shape, it is not necessary to prepare a special space for the short stub, although it depends on the operating frequency, and in terms of performance, the ground potential of the die area is small. Since the filter is designed to be extremely stable, stable filter performance can be obtained.

【0012】なお、ショートスタブの接地先が、接地電
位のダイエリア又は所定の金属パターンであるときは、
静電気の蓄積が無く、パッケージ内部のチップに影響を
及ぼさない。
When the grounding destination of the short stub is a die area of ground potential or a predetermined metal pattern,
There is no accumulation of static electricity and it does not affect the chips inside the package.

【0013】[0013]

【実施例】次に、図面を参照して本発明の実施例を詳細
に説明する。
Embodiments of the present invention will now be described in detail with reference to the drawings.

【0014】図1(a)は本発明の一実施例に係るフラ
ットパッケージの側断面図、(b)は裏面図である。図
中、1はショートスタブ、2はセラミック基板、3はキ
ャップ、4はチップ、5は内部リード線、6はリード端
子、7はダイエリア、8は接地板、9はリードフレー
ム、10は外部リード線を表す。
FIG. 1A is a side sectional view of a flat package according to an embodiment of the present invention, and FIG. 1B is a rear view. In the figure, 1 is a short stub, 2 is a ceramic substrate, 3 is a cap, 4 is a chip, 5 is an internal lead wire, 6 is a lead terminal, 7 is a die area, 8 is a ground plate, 9 is a lead frame, and 10 is an outside. Represents a lead wire.

【0015】ショートスタブ1は使用するマイクロ波信
号の1/4倍の波長の長さを有しており、夫々その一端
が接地板8、他端がリードフレーム9と電気的に接続さ
れている。また、リードフレーム9には、外部リード線
10と、リード端子6及び導電部材を経由した内部リー
ド線5とが夫々導通している。
The short stub 1 has a length of a wavelength which is ¼ times that of the microwave signal used, and one end thereof is electrically connected to the ground plate 8 and the other end thereof is electrically connected to the lead frame 9. . Further, the lead frame 9 is electrically connected to the external lead wire 10 and the internal lead wire 5 via the lead terminal 6 and the conductive member.

【0016】セラミック基板2は、400[μm]の厚
みを有するアルミナ平板を用い、ダイエリア7及びリー
ド端子6の形成箇所に導電部材を貫通させるための孔部
(バイアホール)が形成されている。
As the ceramic substrate 2, an alumina flat plate having a thickness of 400 μm is used, and holes (via holes) for penetrating a conductive member are formed at the locations where the die area 7 and the lead terminals 6 are formed. .

【0017】ダイエリア7は実装時にチップ4をマウン
トするもので、導電部材を介して接地板8と電気的に接
続されている。接地板8は図示のような矩形状の外、ダ
イエリア7をシールドする格子状あるいは他の金属パタ
ーンであっても良い。
The die area 7 mounts the chip 4 at the time of mounting and is electrically connected to the ground plate 8 via a conductive member. The ground plate 8 may have a rectangular shape as shown, a grid pattern for shielding the die area 7, or another metal pattern.

【0018】この構成のフラットパッケージにおいて、
図1(a)のA点から接地板8をみたインピーダンス
は、使用周波数成分については無限大、その他の信号成
分については、当該信号の周波数で定まる所定値を呈す
る。即ち外部リード線10から導かれたマイクロ波信号
のうち、使用周波数成分については、ショートスタブ1
の方に伝播しないので、伝送損失が殆ど無く、且つ、イ
ンピーダンス整合も確実にとられる。他方、当該周波数
以外の成分の信号、例えば、雑音成分や静電気は、ショ
ートスタブ1により減衰されるので、伝送信号のフィル
タがかかる。同時にこの信号は接地板8にて放電され
る。従って、静電気や雑音等の成分が内部リード線5の
方に伝播しないので、チップ4に影響を及ぼさず、静電
破壊が防止される。
In the flat package having this structure,
The impedance when the ground plate 8 is viewed from the point A in FIG. 1A exhibits infinity for the used frequency component and a predetermined value for the other signal components determined by the frequency of the signal. That is, regarding the used frequency component of the microwave signal guided from the external lead wire 10, the short stub 1
Since it is not propagated toward, there is almost no transmission loss and impedance matching is ensured. On the other hand, a signal having a component other than the frequency, for example, a noise component or static electricity is attenuated by the short stub 1, so that the transmission signal is filtered. At the same time, this signal is discharged at the ground plate 8. Therefore, components such as static electricity and noise do not propagate to the internal lead wires 5, so that the chips 4 are not affected and electrostatic breakdown is prevented.

【0019】図2は本実施例によるマイクロ波半導体装
置用パッケージの特性試験等価回路図であり、50Ωの
純抵抗信号源20の負端子を接地ラインAGROUND に接続
すると共に、その正端子から12[GHZ ]のマイクロ
波信号をマイクロストリップ線路21の入力端子に導い
ている。マイクロストリップ線路21の出力はA点を介
して二分岐され、一方は測定器22の正端子、他方はシ
ョートスタブ23の入力端子に夫々導かれる。測定器2
2は50Ω系の純抵抗測定器であり、その負端子及びシ
ョートスタブ23の出力端子は夫々接地ラインAGROUND
に接続されている。
FIG. 2 is a characteristic test equivalent circuit diagram of the microwave semiconductor device package according to the present embodiment. The negative terminal of the 50 Ω pure resistance signal source 20 is connected to the ground line AGROUND, and 12 [V] from the positive terminal. GHZ] microwave signal to the input terminal of the microstrip line 21. The output of the microstrip line 21 is branched into two via a point A, one of which is guided to the positive terminal of the measuring instrument 22 and the other of which is guided to the input terminal of the short stub 23. Measuring instrument 2
Reference numeral 2 is a 50Ω pure resistance measuring instrument, and its negative terminal and the output terminal of the short stub 23 are ground line AGROUND, respectively.
It is connected to the.

【0020】マイクロストリップ線路21及びショート
スタブ23は、厚さ40[μm]のアルミナ基板上に形
成された比誘電率εr 9.6、コンダクタンス4.1E
7の誘電体薄膜から成り、前者は長さ1000[μm]
で幅が400[μm]、後者は長さが2500[μm]
で幅が400[μm]のものとする。また、各誘電体膜
の厚みは8[μm]とする。
The microstrip line 21 and the short stub 23 are formed on an alumina substrate having a thickness of 40 μm and have a relative permittivity εr 9.6 and a conductance 4.1E.
It consists of a dielectric thin film of 7 and the former is 1000 [μm] long
And the width is 400 [μm] and the latter is 2500 [μm]
And the width is 400 [μm]. The thickness of each dielectric film is 8 [μm].

【0021】この構成にてSパラメータ特性とVSWR
(定在波比)遷移を測定したところ、図3(a)(b)
のようなフィルタ特性図が得られた。図3(a)の縦軸
はS21(出力側インピーダンス)であり、最大値を0と
したときのdB値で示してある。また、図3(b)の縦
軸は図2の信号源21側における電圧定在波比VSWR
1である。
With this configuration, S-parameter characteristics and VSWR
When the (standing wave ratio) transition was measured, the results are shown in FIGS.
A filter characteristic diagram such as is obtained. The vertical axis of FIG. 3A is S21 (output side impedance), which is shown as a dB value when the maximum value is 0. The vertical axis of FIG. 3B indicates the voltage standing wave ratio VSWR on the signal source 21 side of FIG.
It is 1.

【0022】これらの図を参照すると、S21は、使用周
波数12[GHZ ]のときに最大であり、その値は−
0.018dBであった。また、このときのVSWR1
は最小であり、その値は1.033であった。なお、V
SWR1の値は入力側インピーダンスをS11とすると次
式により求めることができる。
Referring to these figures, S21 is the maximum at the use frequency 12 [GHZ], and its value is-.
It was 0.018 dB. Also, VSWR1 at this time
Was the minimum and its value was 1.033. In addition, V
The value of SWR1 can be obtained by the following equation when the input impedance is S11.

【0023】[0023]

【数1】 [Equation 1]

【0024】このように、使用周波数(12[GHZ
])については、ショートスタブ23の存在を無視す
ることができるので、使用周波数については殆ど損失な
くマイクロ波信号を伝送でき、しかも、インピーダンス
整合も実現することができる。他方、それ以外の周波数
の信号についてはフィルタがかかるので、チップ実装後
のマイクロ波半導体装置の低雑音化が図れる。
Thus, the operating frequency (12 [GHZ
]), Since the presence of the short stub 23 can be ignored, the microwave signal can be transmitted with almost no loss in the used frequency, and the impedance matching can be realized. On the other hand, since signals of frequencies other than that are filtered, noise reduction of the microwave semiconductor device after chip mounting can be achieved.

【0025】また、図1のような構成のパッケージで
は、ショートスタブ1のための特別なスペースを用意す
る必要がないので、既存のパッケージの僅かな設計変更
により本発明を実施することができる。しかも、この種
のパッケージでは、通常、ダイエリア7の接地電位は極
めて安定なものに設計されるので、フィルタとしての性
能も安定したものが得られる。
Further, in the package having the structure shown in FIG. 1, it is not necessary to prepare a special space for the short stub 1, so that the present invention can be implemented by a slight design change of the existing package. Moreover, in this type of package, the ground potential of the die area 7 is usually designed to be extremely stable, so that a stable filter performance can be obtained.

【0026】なお、本実施例では、フラットパッケージ
の例について説明したが、ピングリッドアレーパッケー
ジやチップキャリアのような、他の平板状パッケージに
ついても同様に適用することができ、上記効果が得られ
る。また、ショートスタブ1(23)の長さは、図2の
A点からみたインピーダンスが極めて大きくなれば良い
ので、使用するマイクロ波信号の波長の略(2n+1)
/4倍(nは整数)であっても良い。
In this embodiment, the example of the flat package has been described, but the present invention can be similarly applied to other flat-plate packages such as a pin grid array package and a chip carrier, and the above effects can be obtained. . Further, the length of the short stub 1 (23) may be substantially the impedance (2n + 1) of the wavelength of the microwave signal to be used because the impedance viewed from the point A in FIG.
/ 4 times (n is an integer).

【0027】更に、この発明は、広帯域での使用を前提
とした入出力端子を有するパッケージについても適用す
ることができる。この場合は、各端部に上記ショートス
タブ1(23)を設けることで、上記フィルタ効果が得
られ、インピーダンス整合も容易となる。
Further, the present invention can be applied to a package having an input / output terminal which is intended for wide band use. In this case, by providing the short stub 1 (23) at each end, the filter effect is obtained and impedance matching is facilitated.

【0028】[0028]

【発明の効果】以上詳細に説明したように、本発明で
は、マイクロ波信号が伝播する入出力端子の各端部に、
夫々マイクロ波信号波長の略(2n+1)/4倍(nは
整数)の長さのショートスタブを設けたので、使用する
マイクロ波信号の周波数については殆ど損失なく伝送し
得る一方、静電気等の不要信号についてはショートスタ
ブにより減衰ないし放電され、パッケージ内部に伝送さ
れにくくなる効果がある。これにより、内部半導体チッ
プの破壊が防止され、従来の問題点が解消される。
As described in detail above, according to the present invention, at each end of the input / output terminal through which the microwave signal propagates,
Since short stubs each having a length of approximately (2n + 1) / 4 times the microwave signal wavelength (n is an integer) are provided, the frequency of the microwave signal to be used can be transmitted with almost no loss, but static electricity or the like is unnecessary. The signal is attenuated or discharged by the short stub, and it is difficult to transmit the signal inside the package. As a result, destruction of the internal semiconductor chip is prevented, and the conventional problems are solved.

【0029】本発明では、また、その略中央部にマイク
ロ波半導体装置チップが実装される平板状をなし、裏面
部にはこのチップと外部リード線との導通をとるリード
フレームが形成されたマイクロ波半導体装置用パッケー
ジにおいて、リードフレームの先端に前述のショートス
タブを設けるようにしたので、上記効果がより顕著にな
ると共に、従来構造の設計変更量が上記構成の場合より
も少なくなる。
According to the present invention, the microwave semiconductor device chip is mounted in a substantially flat shape in the central portion thereof, and a lead frame for conducting the chip and the external lead wire is formed on the back surface portion of the microwave. In the package for the wave semiconductor device, the above-mentioned short stub is provided at the tip of the lead frame, so that the above-mentioned effect becomes more remarkable and the amount of design change of the conventional structure becomes smaller than that in the case of the above-mentioned structure.

【0030】なお、上記ショートスタブの接地先を接地
電位のダイエリア又はこのダイエリアと電気的に接続さ
れた所定の金属パターンとすることで、不要信号が直ち
に放電され、フィルタしての特性が安定すると共に、チ
ップ実装後のマイクロ波半導体装置の雑音が低減する効
果がある。
By setting the grounding destination of the short stub to a die area having a ground potential or a predetermined metal pattern electrically connected to the die area, an unnecessary signal is immediately discharged, and the characteristics of the filter are improved. In addition to being stable, there is an effect that noise of the microwave semiconductor device after chip mounting is reduced.

【図面の簡単な説明】[Brief description of drawings]

【図1】(a)は本発明の一実施例に係るフラットパッ
ケージの側断面図、(b)はその裏面図。
1A is a side sectional view of a flat package according to an embodiment of the present invention, and FIG. 1B is a rear view thereof.

【図2】本実施例のフラットパッケージの特性試験の等
価回路を示す図。
FIG. 2 is a diagram showing an equivalent circuit of a characteristic test of the flat package of the present embodiment.

【図3】(a)は上記試験により得られたSパラメータ
特性、(b)はVSWR遷移を示す図。
FIG. 3A is a S-parameter characteristic obtained by the above test, and FIG. 3B is a diagram showing VSWR transition.

【符号の説明】[Explanation of symbols]

1…ショートスタブ、2…セラミック基板、3…キャッ
プ、4…チップ(マイクロ波半導体装置チップ)、5…
内部リード線、6…リード端子、7…ダイエリア、8…
接地板(所定の金属パターン)、9…リードフレーム、
10…外部リード線。
1 ... Short stub, 2 ... Ceramic substrate, 3 ... Cap, 4 ... Chip (microwave semiconductor device chip), 5 ...
Internal lead wire, 6 ... Lead terminal, 7 ... Die area, 8 ...
Ground plate (predetermined metal pattern), 9 ... Lead frame,
10 ... External lead wire.

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 マイクロ波信号が伝播する入出力端子を
有するマイクロ波半導体装置用パッケージにおいて、前
記入出力端子の各端部に、夫々前記マイクロ波信号波長
の略(2n+1)/4倍(nは整数)の長さのショート
スタブを設けたことを特徴とするマイクロ波半導体装置
用パッケージ。
1. A package for a microwave semiconductor device having an input / output terminal through which a microwave signal propagates, wherein each end of the input / output terminal has approximately (2n + 1) / 4 times (n) the wavelength of the microwave signal. Is a short stub whose length is an integer).
【請求項2】 その略中央部にマイクロ波半導体装置チ
ップが実装される平板状をなし、裏面部には前記チップ
と外部リード線との導通をとるリードフレームが形成さ
れたマイクロ波半導体装置用パッケージにおいて、前記
リードフレームの先端に、使用するマイクロ波信号波長
の略(2n+1)/4倍(nは整数)の長さのショート
スタブを設けたことを特徴とするマイクロ波半導体装置
用パッケージ。
2. A microwave semiconductor device having a flat plate-like shape on which a microwave semiconductor device chip is mounted, and a lead frame for electrically connecting the chip and an external lead wire is formed on a back surface of the plate. A package for a microwave semiconductor device, wherein a short stub having a length of approximately (2n + 1) / 4 times (n is an integer) the wavelength of the microwave signal used is provided at the tip of the lead frame.
【請求項3】 前記ショートスタブの接地先が、接地電
位であり、且つ、前記チップをマウントするダイエリア
又はこのダイエリアと電気的に接続された所定の金属パ
ターンであることを特徴とする請求項1又は2記載のマ
イクロ波半導体装置用パッケージ。
3. The grounding destination of the short stub is a ground potential and is a die area for mounting the chip or a predetermined metal pattern electrically connected to the die area. Item 3. The microwave semiconductor device package according to Item 1 or 2.
JP2282393A 1993-02-10 1993-02-10 Package for microwave semiconductor device Pending JPH06236937A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2282393A JPH06236937A (en) 1993-02-10 1993-02-10 Package for microwave semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2282393A JPH06236937A (en) 1993-02-10 1993-02-10 Package for microwave semiconductor device

Publications (1)

Publication Number Publication Date
JPH06236937A true JPH06236937A (en) 1994-08-23

Family

ID=12093417

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2282393A Pending JPH06236937A (en) 1993-02-10 1993-02-10 Package for microwave semiconductor device

Country Status (1)

Country Link
JP (1) JPH06236937A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6847275B2 (en) 2000-10-24 2005-01-25 Murata Manufacturing Co., Ltd. High-frequency circuit board unit, high frequency module using the same unit, electronic apparatus using the same module, and manufacturing method for the high-frequency circuit board unit

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6847275B2 (en) 2000-10-24 2005-01-25 Murata Manufacturing Co., Ltd. High-frequency circuit board unit, high frequency module using the same unit, electronic apparatus using the same module, and manufacturing method for the high-frequency circuit board unit

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