JPH0623251U - IC tester with power connection display circuit - Google Patents

Abstract

(57) [Abstract] [Purpose] To provide an IC test apparatus equipped with a power supply connection display circuit that enables visual confirmation that power is being supplied from a power supply to an IC element under test. [Structure] A power supply connection control unit 3 for connecting an output from the power supply 1 to an IC device under test 5, and a power supply for displaying that power is supplied from the power supply 1 to the IC device under test 5 by the power supply connection control unit 3. The IC test apparatus is provided with a power supply connection display circuit 2 which is composed of a connection display unit 4 and whose power supply connection control unit 3 and power supply connection display unit 4 are driven by the same control signal.

Description

[Detailed description of the device]

[0001]

[Industrial applications]

 The present invention relates to an IC test apparatus, and more particularly to an IC test apparatus including a power supply connection display circuit for visually displaying a power supply state to an IC element under test.

[0002]

[Prior art]

 FIG. 3 is a functional block diagram showing the outline of a conventional IC test apparatus. Reference numeral 11 is a sample power supply, 12 is a power supply connection control circuit, and 13 is an IC element under test. As shown in this figure, the power supply from the sample power source 11 to the IC element under test 13 is controlled by the power source connection control circuit 12. At present, as this type of test apparatus, a performance board, which is a measurement board with a printed wiring of the power supply connection control circuit 12, is used.

[0003]

[Problems to be solved by the device]

 However, in the above-mentioned conventional IC test device, it was not possible to confirm on the performance board whether or not power was supplied to the IC element under test. In particular, if the test result is bad, it is not possible to immediately determine whether the reason is due to a defect in the circuit in the IC or because the IC element is not supplied with power due to a bad connection in the test equipment. I had a problem. Therefore, in order to check whether or not power is being supplied to the IC element, it is necessary to measure the voltage of the power supply terminal of the IC element under test using another circuit meter. For that purpose, the IC device under test is taken out so as to be connected to another circuit meter while being connected to the power supply on the performance board. For this reason, the IC element under test has a risk of being mechanically or electrically damaged such as broken.

In order to solve the above problems, the present invention provides an IC test apparatus including a power supply connection display circuit that enables visual confirmation that power is being supplied to an IC element under test. To aim.

[0005]

[Means for Solving the Problems]

 The IC testing device of the present invention has a power supply connection display circuit 2, and the power supply connection display circuit 2 includes a power supply connection control unit 3 for connecting the output from the power supply 1 to the IC device under test 5 and a power supply connection control unit 3. A power supply connection display section 4 for displaying that power is supplied from the power supply 1 to the IC device under test 5, and the power supply connection control section 3 and the power supply connection display section 4 are driven by the same control signal. It was done.

[0006]

[Action]

 According to this invention, the output of the power supply 1 is connected to the IC device under test 5 via the power supply connection control section 3. At that time, the power supply connection control section 3 is configured to connect the output of the power supply 1 to the IC element under test 5 when a control signal is input. Further, since the control signal output to the power supply connection control unit 3 is also output to the power supply connection display unit 4 at the same time, the power supply connection display unit 4 displays that power is supplied to the IC element under test 5.

[0007]

【Example】

 An embodiment of an IC test device having a power supply connection display circuit according to the present invention will be described in detail with reference to the accompanying drawings. FIG. 1 is a functional block diagram showing an embodiment of an IC test device having a power supply connection display circuit according to the present invention, and FIG. 2 is a circuit diagram showing an embodiment of an IC test device having a power supply connection display circuit. Is.

As shown in FIG. 1, the power supply connection control section 3 provided inside the power supply connection display circuit 2 connects the output from the sample power supply 1 to the IC element 5 under test. That is, the power supplied from the sample power supply 1 to the IC device under test 5 is controlled by the power supply controller 3. Further, the power supply connection control section 3 connects the output from the sample power supply 1 to the IC element under test 5 and at the same time operates the power supply connection display section 4.

FIG. 2 shows a circuit configuration of the power supply connection display circuit 2 including the power supply connection control unit 3 and the power supply connection display unit 4. Here, 31 is an LED (light emitting diode) driving buffer, 32 is a relay driving buffer, 33 is a power supply connecting relay, and 41 is an LED.

The output of the sample power source 1 is first connected to the IC element under test 5 via the power source connecting relay 33. One of the control signals of the power supply connection control unit 3 is connected to the relay coil of the power supply connection relay 33 via the relay drive buffer 32, and the other is connected to the LED 41 of the power supply connection display unit 4 via the LED drive buffer 31. It is connected. Here, a control circuit is configured so that the output of the power source 1 to the IC device under test 5 is connected when a control signal is input. Therefore, when a control signal is input to the buffer in order to supply power to the IC device under test 5 from the power source 1, the relay operates according to the output signal of the relay driving buffer 32, and the output of the sample power source 1 is output. It is connected to the test IC element 5. At the same time, the display LED 4 is turned on by the output signal of the LED driving buffer 31.

As described above, according to this embodiment, since the power supply to the IC element under test and the display thereof are linked, it is possible to always perform highly reliable visual display.

It should be noted that the embodiment described here is for explaining the present invention, and the present invention is not necessarily limited to this, and a person skilled in the art can do without departing from the spirit of the present invention. Such variations and modifications are included in the scope of this invention.

[0013]

[Effect of device]

 According to this invention, it is possible to proceed with the test while visually confirming that the power is supplied from the power supply 1 to the IC element 5 to be tested. Therefore, the test result can be immediately determined, and the test efficiency can be improved.

Further, according to the present invention, it is not necessary to check whether or not the power is supplied from the power source 1 to the IC element under test 5 as in the conventional IC test apparatus. There is no need to move the IC device under test 5 while it is connected. Therefore, it is possible to prevent the risk of mechanical or electrical damage such as destruction of the IC element under test.

[Brief description of drawings]

FIG. 1 is an IC having a power supply connection display circuit according to the present invention.
It is a functional block diagram which shows one Example of a test apparatus.

FIG. 2 is an IC having a power supply connection display circuit according to the present invention.
It is a circuit diagram which shows one Example of a test apparatus.

FIG. 3 is a functional block diagram showing an outline of a conventional IC test apparatus.

[Explanation of symbols]

 1 power supply for sample 2 power supply connection display circuit 3 power supply connection control unit 4 power supply connection display unit 5 IC element under test

Claims (1)

[Scope of utility model registration request] 1. The IC device under test outputs from the power supply (1).
In an IC test apparatus having a power supply connection control unit (3) connected to (5), it is indicated that power is supplied from the power supply (1) to the IC element under test (5) by the power supply connection control unit (3). An IC having a power connection display circuit, characterized in that a power connection display section (4) is provided, and the power connection control section (3) and the power connection display section (4) are driven by the same control signal. Test equipment.