JPH0622965U - Contact probe - Google Patents

Abstract

(57) [Abstract] [Purpose] To improve the vertical accuracy of the plunger top of a contact probe for circuit inspection, reduce detection errors, and simplify handling. A contact probe in which a conductive barrel (3) is fitted and held in a hollow cylindrical socket (4) has an outer diameter at the tip or intermediate position of the conductive barrel (3) that abuts the inner circumference of the socket (4). was that provided with the ring-shaped projection, can steadying of the barrel 3 at the time of pressing operation, the vertical accuracy of the plunger top 1 ₁ greatly to improved, smaller pressure resistance of the probe 3, a higher performance It is possible to easily obtain fine pitches and finer patterns.

Description

[Detailed description of the device]

[0001]

[Industrial applications]

 The present invention obtains an electrical connection by press-contacting an IC chip or the like to measure the disconnection of the circuit network, the resistance value of a short circuit or a specific portion of the integrated circuit network, the presence or absence of other devices, and the mounting direction. The present invention relates to a contact probe suitable for inspecting the like.

[0002]

[Prior art]

 As a conventional contact probe, as shown in FIG. 7, a coil spring a and a plunger b pressed by the spring a are housed in a barrel c, and the barrel c is fitted in a socket d. . The barrel is fitted and held by a dowel e formed by caulking on the inner peripheral portion of the socket d, but the inner diameter of the socket d and the outer portion of the barrel c are set so that the barrel c can be easily incorporated into the socket d. Clearance is provided in the diameter.

[0003]

[Problems to be solved by the device]

 However, in this type of probe, if there is a slight gap between the barrel outer diameter and the socket inner diameter, even if the barrel is inserted into the socket and held by the dowel, a slight tilt is created and the plunger moves vertically. The plunger top at the tip of the plunger disengages from the point to be inspected on the substrate without shaking, and there is a problem in accuracy, and it is possible to inspect only patterns with a large pitch and it is suitable for miniaturized patterns. There was a flaw that I could not do. The present invention is intended to properly eliminate these conventional drawbacks, it is possible to steady the barrel during press contact operation, greatly improve the vertical accuracy of the plunger top, and reduce the press contact resistance of the probe. The aim is to provide a contact probe with a simple structure and at a low cost, which can obtain higher performance and can easily cope with finer pitches and finer patterns.

[0004]

According to the present invention, a conductive barrel 1 in which a conductive plunger 1 is biased in one direction by a pulling 2 and is slidably installed is inserted into a hollow cylindrical socket. The contact probe which is held is characterized in that a ring-shaped protrusion 5 having an outer diameter that abuts on the inner periphery of the socket 4 is provided on the outer periphery of the tip or intermediate position of the conductive barrel 3. is there.

[0005]

[Action]

Conductive plunger 1 is telescopically retained by the spring 2 of the conductive barrel 3, performs the exposure to the inspection points in the plunger top 1 _1, the pressure and stroke be by springs 2, Moreover, the barrel 3 is supported by the ring-shaped protrusion 5 in contact with the inner peripheral wall of the socket 4 without being misaligned, and the plunger top 1 can be accurately touched without coming off from the inspection point, improving vertical accuracy. Therefore, even low resistance values can be measured accurately, circuit breaks and shorts in the circuit network can be easily inspected, and the spring load of the springs can be greatly reduced, which reduces circuit board deflection and multi-pins. Can be easily adapted to.

[0006]

【Example】

To describe an embodiment of the present invention in the example of FIGS. 1 and 2, conductive plunger top 1 ₁ Noah Ru conductive plunger 1 is slidably decorated is biased in one direction by a spring 2 A contact probe in which a flexible barrel 3 is fitted and held in a hollow cylindrical socket 4 and has an outer diameter that abuts the outer circumference of the tip or intermediate position of the conductive barrel 3 with the inner circumference of the socket 4. The contact probe is provided with a ring-shaped protrusion 5 having

In this case, the ring-shaped projecting portion 5 is projected on the outer periphery of the pipe-shaped barrel 3 in the shape of an arc or a triangular mountain in cross section, or the tip ring portion, for example, the rim 3 of the pipe-shaped barrel 3 is formed. It is designed to be used in pipe processing by expanding ₁ to form it, or by further raising it to the outer periphery and forming it at the rim of the aperture.

The socket 4 is provided with a dowel 6 or a ring-shaped projection on the inner peripheral wall thereof and a stopper 7 for holding the rear end of the barrel 3, and the ring-shaped projection of the barrel 3 is formed. One or two or more are provided at positions corresponding to the protrusions 5 to minimize the number of barrels 3 to improve vertical accuracy, and a flange 8 is provided on the outer circumference of the socket 4 to provide a contact probe. It is convenient to install it on the board.

In the embodiment shown in FIG. 3, the barrel 3 has a ring-shaped projection 5 formed on the opening edge 3 ₁ of the barrel 3 by pipe processing. The ring-shaped projection 5 is balanced with the dowel 6 provided in the socket 4, 1 and spring seat provided piston unit 1 ₂ at the end on the slides as a plunger top 1 ₁ of the plunger 1 tip not mad core, to allow precisely the contact points on the circuit board Is being considered.

In the embodiment of FIG. 4, the ring-shaped protrusion 5 is formed by expanding the mouth edge 3 ₁ by opening the pipe-shaped barrel 3, and the dowel protruding from the inner peripheral wall of the socket 4 is formed. With 6, the barrel 3 can maintain vertical accuracy.

In the example of FIG. 5, the barrel 3 is bulged to form the ring-shaped protrusion 5 by bulging. The barrel 3 bulges from the inner periphery or the outer periphery of the barrel 3 is machined as shown in FIG. It is also possible to use _one in which a grooved line 5 ₁ is formed by pushing with a roller or by hitting with a piece, and the ring-shaped projection 5 protruding continuously to the outer periphery is provided.

[0012]

[Effect of device]

The sockets 4 into which the barrels 3 are fitted can be easily caulked with rollers or the like so that the dowels 6 project from the inner peripheral wall at one to three locations. When it is desired to change the contact pressure or stroke of the conductive barrel 3, the barrel can be pulled out from the socket and replaced with another barrel having a desired pressure. Also, replacement of the plunger 1 which is different of plunge Yatoppu 1 _1, after taking out the barrel of the socket may be replaced by extracting the plunger 1.

[0013]

[Effect of device]

 The present invention relates to a contact probe in which a conductive barrel 3 is fitted and held in a hollow cylindrical socket 4, and has an outer diameter that abuts the inner circumference of the socket 4 at the outer circumference of the tip or intermediate position of the conductive barrel 3. By providing the ring-shaped protrusion 5 with a handle, it is possible to prevent the barrel from swaying during the pressure contact operation of the contact, greatly improving the vertical accuracy of the plunger top, and reducing the probe pressure contact resistance. High performance is obtained, and it is possible to easily deal with fine pitches and finer patterns.

[Brief description of drawings]

FIG. 1 is a vertical sectional view showing an embodiment of the present invention.

FIG. 2 is an enlarged vertical cross-sectional view of a contact according to an embodiment.

FIG. 3 is an enlarged vertical sectional view of another embodiment.

FIG. 4 is an enlarged vertical sectional view of still another embodiment of the present invention.

FIG. 5 is an enlarged vertical sectional view of another example of the barrel used in the present invention.

FIG. 6 is an enlarged vertical sectional view of still another example of the barrel used in the present invention.

FIG. 7 is a vertical sectional view of a conventional example.

[Explanation of symbols]

 1 Plunger 2 Spring 3 Barrel 4 Socket 5 Ring-shaped protrusion

 ─────────────────────────────────────────────────── ─── Continuation of front page (72) Inventor Hiroshi Maruta Organ Needle Co., Ltd. 1 Maeyama, Ueda City, Nagano Prefecture

Claims (2)

[Scope of utility model registration request] 1. A contact probe in which a conductive barrel, in which a conductive plunger is biased in one direction by a spring so as to be slidably mounted, is fitted and held in a hollow cylindrical socket. A contact probe, comprising a ring-shaped protrusion having an outer diameter that comes into contact with the inner periphery of the socket, on the outer periphery of the tip or intermediate position. 2. The contact probe according to claim 1, wherein the ring-shaped protrusion is formed by expanding a pipe-shaped rim in the shape of a mountain having a circular arc shape or a triangular shape in cross section.