JPH06223936A - Ic socket - Google Patents

Ic socket

Info

Publication number
JPH06223936A
JPH06223936A JP5012977A JP1297793A JPH06223936A JP H06223936 A JPH06223936 A JP H06223936A JP 5012977 A JP5012977 A JP 5012977A JP 1297793 A JP1297793 A JP 1297793A JP H06223936 A JPH06223936 A JP H06223936A
Authority
JP
Japan
Prior art keywords
socket
insulator
terminal
lsi
contact
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5012977A
Other languages
Japanese (ja)
Other versions
JP3077436B2 (en
Inventor
Takeshi Okuyama
毅 奥山
Koji Watanabe
弘二 渡辺
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP05012977A priority Critical patent/JP3077436B2/en
Publication of JPH06223936A publication Critical patent/JPH06223936A/en
Application granted granted Critical
Publication of JP3077436B2 publication Critical patent/JP3077436B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Connecting Device With Holders (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)

Abstract

PURPOSE:To improve the productivity and characteristic by securing the reliable connection between socket terminals and pads regardless of the number of the pads in the structure of an IC socket. CONSTITUTION:An IC socket fitted or removed with ICs having pads arranged into a matrix is constituted of socket terminals 41 each formed into a terminal for a board at one end, offset-bent in the direction of the thickness exceeding the plate thickness at the other end after passing through a fixed section to an insulator, extended in the width direction on the same plane, formed into a contact extended diagonally upward in an acute angle, and planted in nearly the diagonal direction of the pad matrix so that the junctions at contact tips correspond to the pads, an insulator 51 having the peripheral wall inner face surrounding the contact existence area as the outer shape guide face at the time of plantation, an IC pressing plate 52 having the shape pressing the surface peripheral area of an IC positioned by the insulator 51, and a means pressing or releasing the IC pressing plate 52 in the insulator 51 in the IC direction.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は複数の外部接続電極(以
下パッドとする)が微細ピッチのマトリックス状に配置
形成されているLSI等ICを着脱するIC用ソケット
の構成に係り、特にパッド数が増加したときでもソケッ
ト端子とパッド間の確実な電気的接続を確保して生産性
と特性の向上を図ったIC用ソケット(以下単にソケッ
トとする)に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a structure of an IC socket for attaching and detaching an IC such as an LSI in which a plurality of external connection electrodes (hereinafter referred to as pads) are arranged and formed in a matrix of fine pitch, and particularly, the number of pads. The present invention relates to an IC socket (hereinafter simply referred to as a socket) for ensuring a reliable electrical connection between a socket terminal and a pad to improve productivity and characteristics even when the number increases.

【0002】各種ICの内最近のLSI等では数10から
数100 におよぶパッドが例えば 1.27mm ピッチの如き微
細間隔のマトリックスに配置されて構成されているもの
がある。
Among various ICs, there is a recent LSI or the like in which several tens to several hundreds of pads are arranged in a matrix with a fine interval such as a pitch of 1.27 mm.

【0003】かかるICを個々に試験したり回路基板等
に実装するときには着脱を容易ならしめるために専用の
ソケットを使用することが多いが、集積度の向上に伴う
パッド数の更なる増加やパッド・ソケット端子等の寸法
バラツキによってソケット端子とパッドとの間の確実な
電気的接続を確保することが困難になりつつあることか
らその対応が望まれている。
When such ICs are individually tested or mounted on a circuit board or the like, a dedicated socket is often used to facilitate the attachment / detachment. However, the number of pads is further increased or the pads are increased as the degree of integration is improved. -Since it is becoming difficult to secure a reliable electrical connection between the socket terminal and the pad due to dimensional variation of the socket terminal and the like, it is desired to cope with it.

【0004】[0004]

【従来の技術】披検ICがLSIである場合を例とする
図5は従来のソケットの構成例を説明する概略図であ
り、(5-1) は構成を示しまた (5-2)はソケットに組み立
てたときの状態を表わしている。
2. Description of the Related Art FIG. 5 exemplifies a case where a test IC is an LSI. FIG. 5 is a schematic view for explaining an example of the configuration of a conventional socket. (5-1) shows the configuration and (5-2) shows It shows the state when assembled in the socket.

【0005】図(5-1) で披検ICとしてのLSI1は、
基板11のLSIチップ12形成面側の該チップ周囲に該チ
ップ12の各パターン素子に繋がる複数のパッド13がピッ
チp(例えばp= 1.27mm )のマトリックス状に配置形
成されて構成されているものである。
As shown in Fig. (5-1), the LSI1 as a test IC is
A plurality of pads 13 connected to each pattern element of the chip 12 are arranged and formed in a matrix pattern of a pitch p (for example, p = 1.27 mm) around the chip on the surface of the substrate 11 on which the LSI chip 12 is formed. Is.

【0006】一方該LSI1の試験器を構成する(また
は該LSI1を実装する)回路基板2の所定位置に搭載
固定されて該LSI用のソケット3は、回路基板2にパ
ターン形成されている複数の図示されない接続電極と上
記パッド13との間の接続を実現する接続板31と,上記L
SI1を該接続板31に対して位置決め固定するための筐
体基板32, および該LSI1を接続板31に位置決め押圧
してセッティングする筐体蓋板33とで構成されている。
On the other hand, a plurality of LSI sockets 3 are mounted and fixed at predetermined positions on a circuit board 2 which constitutes a tester for the LSI 1 (or where the LSI 1 is mounted), and which are patterned on the circuit board 2. A connection plate 31 for realizing a connection between a connection electrode (not shown) and the pad 13;
It comprises a housing substrate 32 for positioning and fixing the SI 1 with respect to the connection plate 31, and a housing lid plate 33 for positioning and pressing the LSI 1 on the connection plate 31 for setting.

【0007】この内、平面視が上記LSI1 のパッド形
成域とほぼ等しい“ロ”字形をなす接続板31は、例えば
シリコンゴム等からなる絶縁弾性板311 の上記各パッド
13と対応するそれぞれの位置に“く”字形をなす接触ピ
ン312 をそれぞれの両端が該弾性板311 の両面に露出す
るように埋め込んで形成されているものであり、該接触
ピン312 は拡大した抽出図(a) に示す如く該弾性板311
がその両面からの押圧で薄くなったときにはその厚さ変
動に対応してその湾曲部312aで湾曲し得るようになって
いる。
Among these, the connecting plate 31 having a "B" shape in plan view which is almost equal to the pad forming area of the LSI 1 is formed by the insulating elastic plate 311 made of silicon rubber or the like.
The contact pins 312 are formed in a "V" shape at positions corresponding to 13 so that both ends of the contact pins 312 are exposed on both sides of the elastic plate 311. The contact pins 312 are enlarged. As shown in the extraction diagram (a), the elastic plate 311
When is thinned by pressing from both sides thereof, it can be curved at the curved portion 312a according to the thickness variation.

【0008】従って、該弾性板311 をそれぞれの接触ピ
ン312 の一端が上記パッド13と対応する各位置に図示さ
れない接続電極としてパターニング形成されている回路
基板2上の該各接続電極と合致するように搭載した後、
該弾性板311 の他面側に上記LSI1 をその各パッドと
接触ピン312 の他端とが合致するように載置すること
で、該弾性板311 の厚さに関係なくLSI1 の各パッド
と回路基板2の各接続電極とを接触ピン312 を介して導
通させることができる。
Therefore, one end of each contact pin 312 of the elastic plate 311 is aligned with each connection electrode on the circuit board 2 formed as a connection electrode (not shown) at each position corresponding to the pad 13. After mounting on
By placing the LSI 1 on the other surface of the elastic plate 311 so that the pads of the elastic plate 311 and the other ends of the contact pins 312 are aligned with each other, the pads and the circuit of the LSI 1 are irrespective of the thickness of the elastic plate 311. The connection electrodes of the substrate 2 can be electrically connected via the contact pins 312.

【0009】また、中央部に設けられている角孔32a の
領域で該弾性板311 が位置決めし得る平面視“ロ”字形
をなす筐体基板32はその厚さが該弾性板311 の自然態時
の厚さよりも薄く形成されているものであり、該筐体基
板32を回路基板2の所定位置に図示されない治具等で位
置決めし更に捻子止め等の手段で両者を固定した後その
角孔32a の領域に上記弾性板311 を落とし込むことで該
弾性板311 の基板2に対する位置決めが実現し得るよう
になっている。
Further, the housing substrate 32, which has a "B" shape in plan view, in which the elastic plate 311 can be positioned in the region of the square hole 32a provided in the central portion, has a thickness that is a natural state of the elastic plate 311. The case substrate 32 is formed thinner than the original thickness, and the housing substrate 32 is positioned at a predetermined position of the circuit substrate 2 by a jig or the like (not shown), and the both are fixed by means such as screwing, and then the square hole is formed. By positioning the elastic plate 311 in the region 32a, the elastic plate 311 can be positioned with respect to the substrate 2.

【0010】更に該筐体基板32と同じ大きさで中央部に
例えば上記角孔32a とほぼ同じ大きさの角孔33a が設け
られている筐体蓋板33は、その裏面(図では下面)側の
中央に上記LSI1の上述した基板11がその周辺で位置
決めし得るような凹の段差面33b が該基板11の厚さより
も僅かに浅い深さで形成されているものであり、該筐体
基板32とはその周壁上面に突出して設けられている複数
(図では周辺4箇所)のガイドピン32b との嵌合で位置
決めし得るようになっている。
Further, the case lid plate 33 having the same size as the case substrate 32 and having a square hole 33a having substantially the same size as the square hole 32a at the center is provided on the back surface (lower surface in the figure) of the case lid plate 33. In the center of the side, a concave step surface 33b is formed at a depth slightly shallower than the thickness of the substrate 11 so that the substrate 11 of the LSI 1 described above can be positioned in the periphery thereof. The board 32 can be positioned by fitting with a plurality of (four peripheral points in the figure) guide pins 32b provided so as to project on the upper surface of the peripheral wall.

【0011】そこで回路基板2上の接続板31に矢印Aの
如く表裏反転させたLSI1を載置した後、筐体蓋板33
を上記ガイドピン32b によるガイドで筐体基板32に被せ
ながら該LSI1をその基板周辺で位置決めし、そのま
ま押下すると該筐体蓋板33で位置決めされたLSI1を
弾性板311 に押圧することができるので、図4の(4-2)
に示す如く該LSI1の各パッド13と回路基板2の図示
されない各接続電極とを接触ピン312 を介して導通させ
ることができる。
Therefore, after mounting the inverted LSI 1 on the connection plate 31 on the circuit board 2 as shown by the arrow A, the housing cover plate 33
While the LSI 1 is positioned on the periphery of the substrate while covering the casing substrate 32 with the guide of the guide pins 32b and pressed down, the LSI 1 positioned by the casing cover plate 33 can be pressed against the elastic plate 311. , (4-2) of Figure 4
As shown in FIG. 7, each pad 13 of the LSI 1 and each connection electrode (not shown) of the circuit board 2 can be electrically connected via the contact pin 312.

【0012】かかるソケット2では筐体蓋板33を取り外
すだけでLSI1が着脱できるので、LSI1としての
試験・検査工程ではそれが効率よく進められると共に回
路基板への実装工程では不良品との交換作業等が容易に
行なえるメリットがある。
In the socket 2, the LSI 1 can be attached / detached by simply removing the housing cover plate 33. Therefore, in the test / inspection process of the LSI 1, the process can be efficiently performed, and in the mounting process on the circuit board, replacement work with a defective product is performed. Etc. has the advantage that it can be done easily.

【0013】なお例えば破線で示す如き放熱フィン14が
付加されているLSIの場合でも同等の効果を得ること
ができる。
It should be noted that the same effect can be obtained even in the case of an LSI having a radiation fin 14 as shown by a broken line.

【0014】[0014]

【発明が解決しようとする課題】しかし従来の構成にな
るソケットでは、LSIとしての集積度向上に伴うパッ
ド数の増加やその増加に起因するパッド形成域の拡大に
つれて絶縁弾性板を接触ピンを含めて全面に亙って一様
に構成することが困難になるので例えば全パッドの回路
基板接続電極に対する確実な導通の確保が得難くなり易
いと言う問題があり、またパッドの接触ピンとの接触位
置が不変なるため該接触領域に微細な異物等が介在して
いると両者間の接続が不安定になって接続信頼性が低下
することがあると言う問題があった。
However, in the socket having the conventional structure, the insulating elastic plate and the contact pin are included as the number of pads increases as the integration degree of the LSI increases and the pad formation area increases due to the increase. Since it is difficult to form a uniform structure over the entire surface, it is difficult to secure reliable conduction with respect to the circuit board connection electrodes of all pads. Since there is no change, there is a problem that if a minute foreign substance or the like is present in the contact area, the connection between the two becomes unstable and the connection reliability may be reduced.

【0015】[0015]

【課題を解決するための手段】上記課題は、チップ搭載
基板の裏面側に外部接続電極がマトリックス状に配置さ
れて構成されているICを回路基板に実装しまたは該実
装を解除するIC用ソケットであって、一端が上記回路
基板の対応する接続電極に繋がる外部接続端子に形成さ
れ絶縁体への固定部を経た後の他端が、該固定部の幅方
向片側に板厚を超える分だけ厚さ方向にオフセット曲げ
された後の同一面上に該幅方向に伸びた後鋭角の斜め上
方に伸びる舌片状コンタクトに形成されているソケット
端子と、複数の該ソケット端子を、その舌片状コンタク
トの先端に位置する接続部が前記ICの各外部接続電極
と対応するように該外部接続電極のマトリックスのほぼ
対角線方向に植設固定し得ると共に、その植設固定時に
は該各ソケット端子の舌片状コンタクト存在域を囲む周
壁内面が上記ICの外形ガイド面となるように形成され
ている絶縁体と、該絶縁体に位置決めされるICの表面
周辺域のみを押圧し得る形状を持つIC抑え板と、該I
C抑え板を上記絶縁体でガイドされたICの方向へ押圧
しまたはその押圧を解除し得る手段、とを少なくとも具
えて構成されているIC用ソケットによって達成され
る。
The above object is to mount an IC having external connection electrodes arranged in a matrix on the back surface side of a chip mounting board on a circuit board, or to release the mounting. The one end is formed on the external connection terminal connected to the corresponding connection electrode of the circuit board, and the other end after passing through the fixing part to the insulator is larger than the plate thickness on one side in the width direction of the fixing part. A socket terminal formed in a tongue-shaped contact extending in the width direction and obliquely upward at an acute angle on the same surface after being offset-bent in the thickness direction, and a plurality of the socket terminals The contact portion located at the tip of the contact can be implanted and fixed substantially in the diagonal direction of the matrix of the external connection electrodes so that they correspond to the external connection electrodes of the IC. Has a shape that can press only the insulator formed so that the inner surface of the peripheral wall surrounding the tongue-shaped contact existence area serves as the outer shape guide surface of the IC, and the peripheral area of the surface of the IC positioned by the insulator. IC holding plate and the I
And a means capable of releasing the C-pressing plate toward or away from the IC guided by the insulator.

【0016】[0016]

【作用】LSIの各パッドと接触するソケット端子(以
下単に端子とする)を、パッドで押圧されたときにその
押圧移動量に対応してパッドとの接触位置を変えながら
移動し得るような舌片状コンタクトを具えて構成する
と、パッドとコンタクト間を摺動接触にすることができ
るので異物介在等による接触不良を抑制することができ
ると共に個々の各コンタクトが接触するパッドに合わせ
て摺動するのでパッド数や寸法等に関係なく両者間の確
実な導通を確保することができる。
[Function] A tongue capable of moving a socket terminal (hereinafter, simply referred to as a terminal) in contact with each pad of an LSI while changing the contact position with the pad according to the pressing movement amount when the pad is pressed. If the pad-shaped contact is provided, it is possible to make a sliding contact between the pad and the contact, so that it is possible to suppress the contact failure due to the inclusion of foreign matter and to slide according to the pad to which each individual contact comes in contact. Therefore, it is possible to secure reliable conduction between the two regardless of the number of pads and the size.

【0017】また、等ピッチのマトリックス状に位置す
るパッドと対応して配置する端子を該マトリックスの対
角線方向に整列配置し且つその上述した舌片状コンタク
トが上記列間に位置するように構成すると、上記ピッチ
に関係なく舌片状コンタクトの長さを設定することがで
きる。
Further, when terminals arranged corresponding to pads arranged in a matrix of equal pitch are arranged in a diagonal direction of the matrix and the tongue-shaped contacts described above are arranged between the rows. The length of the tongue-shaped contact can be set regardless of the pitch.

【0018】そこで本発明では、板材からなる端子を絶
縁体への固定部からその板厚を超える分だけ厚さ方向に
オフセット曲げした領域に自由端先端部をパッドへの接
触部とするカンチレバー状舌片を具えて構成すると共
に、該端子をその各パッドへの接触部が上記パッドと対
応する位置で各舌片状コンタクトが平行するように該パ
ッドのマトリックス対角線方向に絶縁体に植設してソケ
ットを構成するようにしている。
Therefore, according to the present invention, a cantilever shape having a free end tip portion as a contact portion with a pad is formed in a region in which a terminal made of a plate material is offset and bent in a thickness direction from a fixed portion to an insulator by an amount exceeding the plate thickness. The pad is constructed with a tongue piece, and the terminal is planted in an insulator in a matrix diagonal direction of the pad so that the tongue-shaped contacts are parallel to each other at a position where a contact portion to the pad corresponds to the pad. To configure the socket.

【0019】従って各パッドとそれに対応する舌片状コ
ンタクト間を摺動接触させることができて、パッド数や
各部の寸法バラツキ等に関係なく確実な接続が実現でき
るソケットを構成することができる。
Therefore, a sliding contact can be made between each pad and the corresponding tongue-shaped contact, so that a socket can be constructed which can realize a reliable connection regardless of the number of pads and the dimensional variation of each part.

【0020】[0020]

【実施例】図1は本発明に係わる端子を絶縁体への植設
方法と共に説明する図であり、(1-1) は端子植設前の状
態を示し (1-2)は端子植設時の状態を示した図である。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS FIG. 1 is a diagram for explaining a terminal according to the present invention together with a method of implanting it in an insulator. (1-1) shows a state before implanting the terminal, and (1-2) shows implanting of the terminal. It is the figure which showed the state at the time.

【0021】また、図2は本発明に係わる端子の変位お
よび作用を示す図,図3は本発明になるソケットの構成
例を示す図,図4はソケットとしての完成状態を説明す
る図である。
FIG. 2 is a diagram showing the displacement and action of the terminal according to the present invention, FIG. 3 is a diagram showing an example of the structure of the socket according to the present invention, and FIG. 4 is a diagram illustrating the completed state of the socket. .

【0022】なお図ではいずれもICが図5で説明した
LSIである場合を例としているので、図5と同じ対象
部材・部位には同一の記号を付して表すと共に重複する
説明についてはそれを省略する。
In each of the figures, the case where the IC is the LSI described in FIG. 5 is taken as an example. Therefore, the same target members and parts as those in FIG. Is omitted.

【0023】図1の(1-1) で例えば燐青銅の如きばね用
金属板からなる端子41は、幅方向両側に突出するバルジ
41a を具えた絶縁体42への固定部41b の長手方向片側に
は図示されない回路基板等に接続される外部接続端子41
c が形成されていると共に、他方には該絶縁体42への位
置決め部となる幅広部41d の幅方向片側から少なくとも
板厚を超える段差量でオフセット曲げされた後の同一面
上に鋭角の斜め上方に伸びる舌片状コンタクト41e が打
抜き形成されて構成されているものであり、該コンタク
ト41e の自由端側先端には例えば半円状の接触部41f が
上方に突出した状態で形成されている。
In FIG. 1 (1-1), a terminal 41 made of a metal plate for spring such as phosphor bronze has a bulge protruding on both sides in the width direction.
An external connection terminal 41 to be connected to a circuit board or the like (not shown) is provided on one side in the longitudinal direction of the fixing portion 41b to the insulator 42 including the 41a.
c is formed, and on the other side, an acute-angled slant is formed on the same surface after offset bending from one side in the width direction of the wide portion 41d serving as a positioning portion for the insulator 42 by a step amount that exceeds at least the plate thickness. A tongue-shaped contact 41e extending upward is formed by punching, and a semicircular contact portion 41f is formed at the tip of the free end side of the contact 41e so as to project upward. .

【0024】一方、該端子41を位置決めして植設する上
記絶縁体42は該端子41の固定部長さ程度の厚さを持つ端
子植設域42a に、上記端子41をその固定部41b で固定し
得る角孔42b が図5で説明したLSI1の各パッド13と
等しいピッチPのマトリックス交点と対応する各位置で
該マトリックスの対角線方向に整列して穿孔されて形成
されているものである。
On the other hand, the insulator 42 for locating and implanting the terminal 41 fixes the terminal 41 to the terminal implantation area 42a having a thickness about the length of the fixing portion of the terminal 41 by the fixing portion 41b. The possible square holes 42b are formed by being aligned in the diagonal direction of the matrix at the respective positions corresponding to the matrix intersections of the same pitch P as the pads 13 of the LSI 1 described with reference to FIG.

【0025】そこで、矢印Bのように上記端子41をその
外部接続端子41c 側から該絶縁体42の上述した各角孔42
b に挿入し更に圧入することで各舌片状コンタクト41e
が平行に配置された (1-2)に示すように該端子41を絶縁
体42に植設固定することができる。
Therefore, as shown by the arrow B, the terminal 41 is connected from the external connection terminal 41c side to the above-mentioned square holes 42 of the insulator 42.
Tongue-shaped contact 41e
The terminals 41 can be implanted and fixed to the insulator 42 as shown in (1-2) in which the terminals are arranged in parallel.

【0026】この場合、各端子41の接続部41f は図5で
説明したLSI1の各パッド13と等しいピッチPのマト
リック状に位置するので、該絶縁体42に形成する角孔42
b の配置域を該舌片状コンタクト41e の長さや形状に合
わせて適当に設定することで、該コンタクト41e の接続
部41f を上記LSI1の各パッド13に完全に合致させる
ことができる。
In this case, since the connecting portion 41f of each terminal 41 is located in a matrix shape having the same pitch P as each pad 13 of the LSI 1 described with reference to FIG. 5, the square hole 42 formed in the insulator 42 is formed.
By appropriately setting the arrangement area of b according to the length and shape of the tongue-shaped contact 41e, the connecting portion 41f of the contact 41e can be perfectly matched with each pad 13 of the LSI 1.

【0027】上記端子の変位とその作用とを説明する図
2で (2-1)はLSI装着前の状態を示し (2-2)はLSI
装着時の状態を示した図である。図の(2-1) で、図5で
説明したLSI1の基板11の片面(図では下面)には複
数のパッド13が形成されている。
2A and 2B for explaining the displacement of the terminals and the action thereof, (2-1) shows a state before the LSI is mounted, and (2-2) shows the LSI.
It is a figure showing the state at the time of wearing. In (2-1) of the drawing, a plurality of pads 13 are formed on one surface (lower surface in the drawing) of the substrate 11 of the LSI 1 described in FIG.

【0028】一方図1で説明した絶縁体42には、該各パ
ッド13と対応するそれぞれの位置に図1で説明した端子
41の接続部41f が位置するように植設されて固定されて
いるが、この場合の各端子41は該LSI1の中央に位置
する図示されないチップ(図5における12) に対して左
右対称になるような配置で該絶縁体42に植設固定されて
いる。
On the other hand, in the insulator 42 described in FIG. 1, the terminals described in FIG. 1 are provided at respective positions corresponding to the pads 13.
The connection portion 41f of 41 is planted and fixed so as to be positioned, but in this case, each terminal 41 is left-right symmetric with respect to a chip (12 in FIG. 5) not shown in the center of the LSI1. It is planted and fixed to the insulator 42 in such an arrangement.

【0029】そこで該端子41の上方に位置する上述した
LSI1を矢印Cの如く降下せしめると、一点鎖線C1
示す位置まで降下したときに端子41の接続部41f とLS
I1のパッド13とが点P1で接触する。
Therefore, if the above-mentioned LSI 1 located above the terminal 41 is lowered as indicated by the arrow C, when it is lowered to the position indicated by the alternate long and short dash line C 1 , the connecting portion 41f of the terminal 41 and the LS are connected.
The pad 13 of I1 contacts at point P 1 .

【0030】次いで該LSI1をそのまま降下せしめる
と、端子41の接続部41f が押圧されて舌片状コンタクト
41e の領域が矢印D方向に変位するのでパッド13上の接
続部41f との接触位置が移動する。
Then, when the LSI 1 is lowered as it is, the connecting portion 41f of the terminal 41 is pressed and the tongue-like contact is formed.
Since the region 41e is displaced in the direction of arrow D, the contact position with the connecting portion 41f on the pad 13 moves.

【0031】そして該LSI1を所定位置すなわち (2-
2)で示す位置まで降下させたときには端子41の接続部41
f とLSI1のパッド13とが点P2で接触することになる
ので、結果的に (2-1)の接触初期時における接触点P1
(2-2)の降下終了時における接触点P2との間の隔たりδ
だけ接続部41f とLSI1のパッド13とが摺動すること
となる。
Then, place the LSI 1 at a predetermined position, that is, (2-
When lowered to the position shown in 2), the connection part 41 of the terminal 41
Since f and the pad 13 of the LSI 1 are in contact with each other at the point P 2 , as a result, the contact point P 1 at the initial contact of (2-1)
Distance between contact point P 2 at the end of descent in (2-2) δ
Only the connecting portion 41f and the pad 13 of the LSI 1 slide.

【0032】従って該パッド面と接続部41f との間に異
物等が介在していてもその異物が自動的に除去されるこ
とになって確実な接続を確保することができる。なおL
SI1の押圧が解除されると、変位した上記各端子41が
そのスプリングバックによって該LSI1が押上げられ
て初期状態に戻すことができる。
Therefore, even if a foreign matter or the like is present between the pad surface and the connecting portion 41f, the foreign matter is automatically removed and a reliable connection can be secured. L
When the pressing of SI1 is released, the displaced terminals 41 can be pushed back to the initial state by pushing up the LSI1 by the springback.

【0033】従って、上記各端子41を図示の如く整列し
て植設したソケット上にLSI1を載置押圧しまたはそ
れを取り外すことで、如何なるパッド数を持つLSI1
でも確実な接続を確保することができる。
Therefore, the LSI 1 having any number of pads can be obtained by placing or pressing the LSI 1 on a socket in which the terminals 41 are aligned and planted as shown in the drawing or by removing the LSI 1.
However, a reliable connection can be secured.

【0034】特に図示の如くLSIチップに対して左右
対称になるように端子41を植設固定すると、LSI1の
パッド13にかかる端子41からの摺動力が左右均等になる
ためLSI1のソケットに対する位置決めの容易化を図
ることができる。
Particularly, when the terminals 41 are implanted and fixed so as to be symmetrical with respect to the LSI chip as shown in the drawing, the sliding force from the terminals 41 applied to the pads 13 of the LSI 1 becomes equal to the left and right, so that the LSI 1 is positioned with respect to the socket. It can be facilitated.

【0035】ソケットとしての構成例を示す図3で、披
検ICとしてのLSI1は図5で説明したものである。
そして該LSI1を着脱する本発明になるソケット5
は、図5で説明した回路基板2に搭載固定される絶縁体
51と不錆鋼等からなるIC抑え板52および同様の材料か
らなる2個のロケータ53とで構成されている。
In FIG. 3 showing a configuration example as a socket, the LSI 1 as a test IC is the one described in FIG.
Then, the socket 5 according to the present invention for attaching and detaching the LSI 1
Is an insulator mounted and fixed on the circuit board 2 described in FIG.
It is composed of an IC holding plate 52 made of non-rust steel and the like and two locators 53 made of the same material.

【0036】この内絶縁体51は、平面視が例えば角形で
その中央部に上記LSI1 をその基板11の外形でガイド
して落とし込める凹の段差面51a とその中央部にLSI
1のLSIチップ12が余裕を持って落とし込める大きさ
の角孔51b とが同芯に形成されているものであり、該凹
の段差面51a 領域の厚さは図1における絶縁体42の厚さ
と等しく形成されている。
The inner insulator 51 has, for example, a rectangular shape in plan view, and a concave step surface 51a into which the LSI 1 can be guided and dropped by the outer shape of the substrate 11 in the central portion and the LSI in the central portion.
The LSI chip 12 of No. 1 is formed concentrically with the square hole 51b of a size capable of being dropped in, and the thickness of the concave step surface 51a region is the thickness of the insulator 42 in FIG. Is formed equal to.

【0037】更に該凹の段差面51a 領域の上記LSI1
のピッチpのマトリックス状に配置された各パッド13と
対応するそれぞれの位置には、抽出拡大図(b) で示す如
く該マトリックスの対角線方向に整列するように図1で
説明した端子41が図1と等しい角孔42b によって植設固
定されて構成されている。
Further, the LSI 1 in the area of the concave step surface 51a
At the respective positions corresponding to the pads 13 arranged in the matrix of the pitch p, the terminals 41 described in FIG. 1 are arranged so as to be aligned in the diagonal direction of the matrix as shown in the enlarged view of extraction (b). It is constructed by being planted and fixed by a square hole 42b equal to 1.

【0038】なお上記凹の段差面51a の上面からの深さ
dは、該段差面51a に上記端子41を植設したときの該面
51a から端子41の接続部上端までの高さ(図3における
基板面から一点鎖線C1までの高さ)hと上記LSI1の
基板11の厚さt1および上記IC抑え板52の厚さt2とを加
算した“h+t1+t2”より僅かに小さくなるように設定
されている。
It should be noted that the depth d from the upper surface of the concave step surface 51a is the same as when the terminal 41 is implanted in the step surface 51a.
The height from the 51a to the upper end of the connection portion of the terminal 41 (the height from the board surface to the alternate long and short dash line C 1 in FIG. 3) h, the thickness t 1 of the substrate 11 of the LSI 1 and the thickness t of the IC suppressing plate 52 and 2 obtained by adding "h + t 1 + t 2 " is set to be slightly smaller than the.

【0039】またIC抑え板52は、絶縁体51の凹の段差
面51a を形成する側壁をガイドとして落とし込める外形
を持つ平面視“ロ”字形をなすものであり、その中央部
の角孔52a は絶縁体51の角孔51b よりも大きく形成され
ている。
The IC restraining plate 52 has a "B" shape in plan view having an outer shape that allows the side wall forming the concave step surface 51a of the insulator 51 to be dropped as a guide, and the square hole 52a in the center thereof. Are formed to be larger than the square holes 51b of the insulator 51.

【0040】更に上記絶縁体51の周壁上面の隣接する二
面とほぼ同じ大きさの平面視“L”字形をなす2個のロ
ケータ53は、その各内側辺53a,53b が厚さ方向斜めに切
除された斜面53c に形成されていると共にその両片上の
複数箇所(図では4箇所)には絶縁体51の周壁上面に載
置したときの各端子配列方向を長径とする楕円孔53dが
穿孔されている。
Further, the two locators 53, which are "L" -shaped in plan view and have substantially the same size as the two adjacent surfaces of the upper surface of the peripheral wall of the insulator 51, have inner sides 53a and 53b slanted in the thickness direction. Elliptical holes 53d, which are formed on the cut slope 53c and have a major axis in the terminal arrangement direction when placed on the upper surface of the peripheral wall of the insulator 51, are formed at a plurality of locations (four locations in the figure) on both pieces. Has been done.

【0041】そして各ロケータ53は、楕円孔53d を通る
捻子54を上記絶縁体周壁上面の対応する位置に設けられ
ているねじ孔51c にねじ込むことで該周壁上面と接触し
ながら楕円孔長径方向すなわち図示矢印E方向に摺動し
得るようになっている。
In each locator 53, a screw 54 passing through the elliptical hole 53d is screwed into a screw hole 51c provided at a corresponding position on the upper surface of the insulating peripheral wall to contact the upper surface of the peripheral wall. It can slide in the direction of arrow E in the drawing.

【0042】そこで、図1で説明したように端子41が植
設されている上記絶縁体51を該端子41の外部接続端子41
c 部分で回路基板2に接続固定した後、LSI1を図5
の矢印Aの如く表裏逆にして端子41上に載置し更にIC
抑え板52を該LSI1の裏面側に搭載してから上記2個
のロケータ53を捻子54で絶縁体51の周壁上面に装着する
ことで、LSI1が載置された所要のソケット5を図4
の(4-1) のように構成することができる。
Therefore, as described with reference to FIG. 1, the insulator 51 in which the terminal 41 is implanted is connected to the external connection terminal 41 of the terminal 41.
After connecting and fixing to the circuit board 2 at the c part, the LSI 1 is shown in FIG.
As shown by arrow A, turn the inside out and place it on the terminal 41.
The mounting plate 52 is mounted on the back surface side of the LSI 1 and then the two locators 53 are mounted on the upper surface of the peripheral wall of the insulator 51 with the screws 54, so that the required socket 5 on which the LSI 1 is mounted can be mounted.
It can be configured as in (4-1).

【0043】この時点でLSI1は、図2の (2-1)にお
ける一点鎖線C1の位置すなわち各端子41の接続部41f 上
に載置されているため、該LSI1上に搭載したIC抑
え板52の上面52b は絶縁体51の周壁上面から飛び出した
状態にある。
At this point, the LSI 1 is mounted on the position of the alternate long and short dash line C 1 in (2-1) of FIG. 2, that is, on the connecting portion 41f of each terminal 41. The upper surface 52b of 52 is in a state of protruding from the upper surface of the peripheral wall of the insulator 51.

【0044】そこで2個のロケータ53を図示されない治
具等によって矢印E1,E2の如く接近する方向に等しく移
動させると、その斜面53c によってIC抑え板52が押下
させられてLSI1が降下するので(4-2) で示す状態換
言すれば図2の (2-2)で示す状態にすることができる。
Then, when the two locators 53 are equally moved in the approaching directions as indicated by arrows E 1 and E 2 by a jig or the like (not shown), the IC restraint plate 52 is pushed down by the slope 53c and the LSI 1 descends. Therefore, the state shown in (4-2), in other words, the state shown in (2-2) in FIG. 2 can be obtained.

【0045】従って、該LSI1の各パッド13と端子41
ひいては回路基板2の図示されない接続電極とを確実に
接続させることができる。かかる構成になるソケット5
では、各端子41が個々に独立して動作するためLSI1
の各パッド13や該端子41自体の寸法的バラツキを該端子
41の舌片状コンタクト41e の領域で吸収させることがで
きると共に該端子41とパッド13との間が摺動接触するの
で、如何なる数のパッドを具えたICでも該各パッドと
接続端子ひいては回路基板の接続電極とを確実に接続し
得るソケットを実現させることができる。
Therefore, each pad 13 and terminal 41 of the LSI 1
As a result, the connection electrode (not shown) of the circuit board 2 can be surely connected. Socket 5 having such a configuration
Then, since each terminal 41 operates independently, the LSI 1
The dimensional variation of each pad 13 of the
Since it can be absorbed in the region of the tongue-like contact 41e of 41, and the terminal 41 and the pad 13 are in sliding contact with each other, even in an IC having any number of pads, each pad and the connection terminal, and thus the circuit board. It is possible to realize a socket that can be reliably connected to the connection electrode.

【0046】なお上記ロケータ53を逆方向に移動させる
と、図2で説明したように端子41自身のスプリングバッ
クでLSI1が押し上げられるので、図4の (4-1)で示
す初期状態に戻すことができる。
When the locator 53 is moved in the reverse direction, the LSI 1 is pushed up by the spring back of the terminal 41 itself as described with reference to FIG. 2, so the initial state shown in (4-1) of FIG. 4 should be restored. You can

【0047】また上述した端子41の舌片状コンタクト部
分の自然態における立ち上がり角度α(図2)は、例え
ば該コンタクト領域の断面が 0.25mm ×0.4mm, 長さが
3.5mm, その湾曲部の半径が 1.5mm程度のときに約30度
前後に設定することで良好な結果が得られることを実験
的に確認している。
Further, the rising angle α (FIG. 2) in the natural state of the tongue-shaped contact portion of the terminal 41 described above is, for example, 0.25 mm × 0.4 mm in cross section of the contact region,
It has been experimentally confirmed that a good result can be obtained by setting it to about 30 degrees when the radius of the curved portion is 3.5 mm and the radius is about 1.5 mm.

【0048】[0048]

【発明の効果】上述の如く本発明により、パッド数が増
加したときでもソケット端子に対する全パッドの確実な
電気的接続を確保して生産性と特性の向上を図ったIC
用ソケットを提供することができる。
As described above, according to the present invention, even when the number of pads is increased, an IC which secures a reliable electrical connection of all pads to the socket terminals and improves the productivity and characteristics.
Can provide a socket for use.

【0049】なお本発明の説明ではLSIの場合を例と
しているが、例えば片面に複数の回路チップ等が実装さ
れ他面にそれらに繋がる複数のパッドが形成されている
回路基板等でも同等の効果が得られることは明らかであ
る。
In the description of the present invention, the case of an LSI is taken as an example, but a circuit board or the like having a plurality of circuit chips or the like mounted on one surface and a plurality of pads connected to them on the other surface has the same effect. It is clear that

【図面の簡単な説明】[Brief description of drawings]

【図1】 本発明に係わる端子を絶縁体への植設方法と
共に説明する図。
FIG. 1 is a diagram for explaining a terminal according to the present invention together with a method of implanting it in an insulator.

【図2】 本発明に係わる端子の変位および作用を示す
図。
FIG. 2 is a diagram showing the displacement and action of the terminal according to the present invention.

【図3】 本発明になるソケットの構成例を示す図。FIG. 3 is a diagram showing a configuration example of a socket according to the present invention.

【図4】 ソケットとしての完成状態を説明する図。FIG. 4 is a diagram illustrating a completed state as a socket.

【図5】 従来のソケットの構成例を説明する概略図。FIG. 5 is a schematic diagram illustrating a configuration example of a conventional socket.

【符号の説明】[Explanation of symbols]

1 LSI(IC) 2 回路基板 5 IC用ソケット 11 基板 12 LSIチップ 13 外部接続電極( パッド) 41 ソケット端子 41a バルジ 41b 固
定部 41c 外部接続端子 41d 幅
広部 41e 舌片状コンタクト 41f 接
触部 42 絶縁体 42a 端子植設域 42b 角
孔 51 絶縁体 51a 凹の段差面 51b 角
孔 51c ねじ孔 52 IC抑え板 52a 角孔 52b 上
面 53 ロケータ 53a,53b 内側編 53c 斜
面 53d 楕円孔 54 捻子
1 LSI (IC) 2 Circuit board 5 IC socket 11 Board 12 LSI chip 13 External connection electrode (pad) 41 Socket terminal 41a Bulge 41b Fixed part 41c External connection terminal 41d Wide part 41e Tongue-shaped contact 41f Contact part 42 Insulator 42a Terminal installation area 42b Square hole 51 Insulator 51a Concave step surface 51b Square hole 51c Screw hole 52 IC restraint plate 52a Square hole 52b Top surface 53 Locator 53a, 53b Inner part 53c Slope surface 53d Elliptical hole 54 Screw

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 チップ搭載基板の裏面側に外部接続電極
がマトリックス状に配置されて構成されているICを回
路基板に実装しまたは該実装を解除するIC用ソケット
であって、 一端が上記回路基板の対応する接続電極に繋がる外部接
続端子(41c) に形成され絶縁体(42)への固定部(41b) を
経た後の他端が、該固定部(41b) の幅方向片側に板厚を
超える分だけ厚さ方向にオフセット曲げされた後の同一
面上に該幅方向に伸びた後鋭角の斜め上方に伸びる舌片
状コンタクト(41e) に形成されているソケット端子(41)
と、 複数の該ソケット端子(41)を、その舌片状コンタクト(4
1e) の先端に位置する接続部(41f) が前記ICの各外部
接続電極と対応するように該外部接続電極のマトリック
スのほぼ対角線方向に植設固定し得ると共に、その植設
固定時には該各ソケット端子(41)の舌片状コンタクト存
在域を囲む周壁内面が上記ICの外形ガイド面となるよ
うに形成されている絶縁体(51)と、 該絶縁体(51)に位置決めされるICの表面周辺域のみを
押圧し得る形状を持つIC抑え板(52)と、 該IC抑え板(52)を上記絶縁体(51)でガイドされたIC
の方向へ押圧しまたはその押圧を解除し得る手段(53)、
とを少なくとも具えて構成されていることを特徴とした
IC用ソケット。
1. An IC socket for mounting or unmounting an IC having external connection electrodes arranged in a matrix on a back surface side of a chip mounting board on a circuit board, wherein one end of the circuit is the circuit. The other end after passing through the fixed part (41b) to the insulator (42) formed on the external connection terminal (41c) connected to the corresponding connection electrode of the board has a plate thickness on one side in the width direction of the fixed part (41b). Socket terminal (41) formed on the tongue-shaped contact (41e) that extends obliquely upward at an acute angle after extending in the width direction on the same surface after being offset-bent in the thickness direction
And a plurality of the socket terminals (41) with their tongue-shaped contacts (4
The connecting portion (41f) located at the tip of 1e) can be implanted and fixed substantially in the diagonal direction of the matrix of the external connection electrodes so as to correspond to the external connection electrodes of the IC, and at the time of the implantation and fixing, An insulator (51) formed so that the inner surface of the peripheral wall surrounding the tongue-shaped contact existence area of the socket terminal (41) serves as the outer shape guide surface of the IC; and an IC positioned on the insulator (51). An IC holding plate (52) having a shape capable of pressing only the peripheral area of the surface, and an IC in which the IC holding plate (52) is guided by the insulator (51).
Means (53) capable of pressing in the direction of or releasing the pressing,
An IC socket characterized by comprising at least and.
【請求項2】 請求項1記載のソケット端子(41)が、そ
の各舌片状コンタクト(41e) がICの中心対象となるよ
うに絶縁体(51)に配置植設されて構成されていることを
特徴としたIC用ソケット。
2. The socket terminal (41) according to claim 1, wherein the tongue-shaped contacts (41e) are arranged and planted in an insulator (51) so that the tongue-shaped contacts (41e) of the socket terminals are the center of the IC. An IC socket characterized by that.
JP05012977A 1993-01-29 1993-01-29 Socket for IC Expired - Fee Related JP3077436B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP05012977A JP3077436B2 (en) 1993-01-29 1993-01-29 Socket for IC

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP05012977A JP3077436B2 (en) 1993-01-29 1993-01-29 Socket for IC

Publications (2)

Publication Number Publication Date
JPH06223936A true JPH06223936A (en) 1994-08-12
JP3077436B2 JP3077436B2 (en) 2000-08-14

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Link
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Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1998033248A1 (en) * 1997-01-29 1998-07-30 The Furukawa Electric Co., Ltd. Ic socket
JP2001091537A (en) * 1999-09-24 2001-04-06 Isao Kimoto Contact and contact assembly using it
EP1496574A2 (en) * 2003-06-27 2005-01-12 Tyco Electronics AMP K.K. IC socket
JP2005044545A (en) * 2003-07-23 2005-02-17 Otax Co Ltd Socket for electronic component
WO2008015817A1 (en) * 2006-07-31 2008-02-07 Mitsumi Electric Co., Ltd. Connector for connecting electronic component
WO2008015862A1 (en) * 2006-07-31 2008-02-07 Mitsumi Electric Co., Ltd. Connector for connecting electronic component
WO2008035570A1 (en) * 2006-09-20 2008-03-27 Ngk Insulators, Ltd. Electric connector
WO2009090907A1 (en) * 2008-01-17 2009-07-23 Alps Electric Co., Ltd. Probe card and method for manufacturing the same

Cited By (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1998033248A1 (en) * 1997-01-29 1998-07-30 The Furukawa Electric Co., Ltd. Ic socket
US6123552A (en) * 1997-01-29 2000-09-26 Furukawa Electric Co., Ltd. IC socket
JP2001091537A (en) * 1999-09-24 2001-04-06 Isao Kimoto Contact and contact assembly using it
JP4579361B2 (en) * 1999-09-24 2010-11-10 軍生 木本 Contact assembly
CN100459321C (en) * 2003-06-27 2009-02-04 安普泰科电子有限公司 IC socket
EP1496574A3 (en) * 2003-06-27 2006-10-04 Tyco Electronics AMP K.K. IC socket
EP1496574A2 (en) * 2003-06-27 2005-01-12 Tyco Electronics AMP K.K. IC socket
JP2005044545A (en) * 2003-07-23 2005-02-17 Otax Co Ltd Socket for electronic component
JP4602649B2 (en) * 2003-07-23 2010-12-22 ティーエヌジー コーポレーション リミテッド Socket for electronic parts
WO2008015817A1 (en) * 2006-07-31 2008-02-07 Mitsumi Electric Co., Ltd. Connector for connecting electronic component
WO2008015862A1 (en) * 2006-07-31 2008-02-07 Mitsumi Electric Co., Ltd. Connector for connecting electronic component
JP4766113B2 (en) * 2006-07-31 2011-09-07 ミツミ電機株式会社 Module connector with optical waveguide
JPWO2008015862A1 (en) * 2006-07-31 2009-12-17 ミツミ電機株式会社 Connector for connecting electronic components
US7833042B2 (en) 2006-07-31 2010-11-16 Mitsumi Electric Co., Ltd. Connector for connecting electronic component
WO2008035570A1 (en) * 2006-09-20 2008-03-27 Ngk Insulators, Ltd. Electric connector
US7658618B2 (en) 2006-09-20 2010-02-09 Ngk Insulators, Ltd. Electric connector
JPWO2008035570A1 (en) * 2006-09-20 2010-01-28 日本碍子株式会社 Electrical connection
JP4884475B2 (en) * 2006-09-20 2012-02-29 日本碍子株式会社 Electrical connection
WO2009090907A1 (en) * 2008-01-17 2009-07-23 Alps Electric Co., Ltd. Probe card and method for manufacturing the same

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