JPH06216168A - Manufacturing apparatus for semiconductor device - Google Patents

Manufacturing apparatus for semiconductor device

Info

Publication number
JPH06216168A
JPH06216168A JP583493A JP583493A JPH06216168A JP H06216168 A JPH06216168 A JP H06216168A JP 583493 A JP583493 A JP 583493A JP 583493 A JP583493 A JP 583493A JP H06216168 A JPH06216168 A JP H06216168A
Authority
JP
Japan
Prior art keywords
chip
collet
semiconductor device
manufacturing apparatus
semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP583493A
Other languages
Japanese (ja)
Inventor
Tsutomu Kisa
勉 木佐
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP583493A priority Critical patent/JPH06216168A/en
Publication of JPH06216168A publication Critical patent/JPH06216168A/en
Pending legal-status Critical Current

Links

Landscapes

  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Manipulator (AREA)
  • Die Bonding (AREA)

Abstract

PURPOSE:To suck and move an IC chip with a collet without causing damages or cracks in the surface protective film of the IC chip by providing an air inlet port at the side surface of the collet. CONSTITUTION:When a collet 2 is driven with a driving device and a protruding part 4b of the side surface having an air inlet port 4a comes into contact with the side surface of an IC chip 3, a side surface 3a of the IC chip 3 is sucked with a sucking device through the air inlet port 4a and attracted to the air inlet port 4a. When the side surface 3a of the IC chip 3 is attracted to the collet 2, the driving device drives the collet 2 again, and the IC chip 3 is moved to a semiconductor-chip attaching part such as a die pad of a lead frame. Thus, the occurrences of damages or cracks on the protective film of the semiconductor chip during the movement of the semiconductor chip caused by the collet can be prevented.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】この発明は、吸気口に半導体チッ
プを吸着し半導体チップ取付部へ移送するコレットを備
えた半導体装置の製造装置に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an apparatus for manufacturing a semiconductor device having a collet for adsorbing a semiconductor chip at an inlet and transferring it to a semiconductor chip mounting portion.

【0002】[0002]

【従来の技術】図4は従来の半導体装置の製造装置の要
部を示し、(a)図はその斜視図、(b)図はその側面
図であり、図において、1は吸気装置(図示せず)に連
通する吸気口2aを下面2bに有する円筒形状のコレッ
ト2を備えた半導体装置の製造装置、3はダイシング後
のICチップである。
2. Description of the Related Art FIG. 4 shows a main part of a conventional semiconductor device manufacturing apparatus. FIG. 4 (a) is a perspective view thereof, and FIG. 4 (b) is a side view thereof. In FIG. A semiconductor device manufacturing apparatus 3 provided with a cylindrical collet 2 having an intake port 2a communicating with (not shown) on the lower surface 2b is an IC chip after dicing.

【0003】次に動作について説明する。先ず、コレッ
ト2が駆動装置(図示せず)によって駆動され吸気口2
aを有する下面2bがICチップ3の表面に接すると、
図4bに示されるようにICチップ3は吸気装置(図示
せず)により吸引され吸気口2aに吸着される。ICチ
ップ3がコレット2に吸着されると上記駆動装置はコレ
ット2を再び駆動し、ICチップ3はリードフレームの
ダイパッド等の半導体チップ取付部(図示せず)へ移送
される。
Next, the operation will be described. First, the collet 2 is driven by a driving device (not shown) and the intake port 2
When the lower surface 2b having a contacts the surface of the IC chip 3,
As shown in FIG. 4b, the IC chip 3 is sucked by the suction device (not shown) and sucked in the suction port 2a. When the IC chip 3 is attracted to the collet 2, the driving device drives the collet 2 again, and the IC chip 3 is transferred to a semiconductor chip mounting portion (not shown) such as a die pad of a lead frame.

【0004】[0004]

【発明が解決しようとする課題】従来の半導体装置の製
造装置は以上のように構成されているので、コレットで
ICチップを吸着した場合、ICチップと接触するコレ
ットの下面に塵埃等が付着した状態で吸着すると、IC
チップ表面の保護膜に傷、またはICチップの表面に上
記塵埃等に基ずく応力の発生によってクラックが入るな
どの問題点があった。
Since the conventional semiconductor device manufacturing apparatus is configured as described above, when an IC chip is adsorbed by the collet, dust or the like adheres to the lower surface of the collet in contact with the IC chip. When adsorbing in the state, IC
There is a problem that the protective film on the chip surface is scratched or cracks are generated on the surface of the IC chip due to the generation of stress due to the dust and the like.

【0005】この発明は上記のような問題点を解消する
ためになされたもので、ICチップ表面の保護膜に傷、
または、クラックを生じることなく、コレットでICチ
ップを吸着し移動することができる半導体装置の製造装
置を提供することを目的とする。
The present invention has been made to solve the above problems, and scratches the protective film on the surface of the IC chip.
Alternatively, it is another object of the present invention to provide a semiconductor device manufacturing apparatus capable of adsorbing and moving an IC chip with a collet without causing a crack.

【0006】[0006]

【課題を解決するための手段】この発明に係る半導体装
置の製造装置は、コレットの側面に吸気口を設け、上記
半導体チップの側面を吸着し移動するようにしたもので
ある。
In the semiconductor device manufacturing apparatus according to the present invention, an inlet is provided on the side surface of the collet so that the side surface of the semiconductor chip is sucked and moved.

【0007】[0007]

【作用】この発明における半導体装置の製造装置では、
コレットによりICチップの側面が吸着されるので、I
Cチップの保護膜に傷、またはクラックが生じない。
In the semiconductor device manufacturing apparatus according to the present invention,
Since the side surface of the IC chip is attracted by the collet, I
The protective film of the C chip is not scratched or cracked.

【0008】[0008]

【実施例】実施例1.図1はこの発明の一実施例による
半導体装置の製造装置の要部を示し、(a)図はその斜
視図、(b)図はその側面図であり、これらの図におい
て、1は側面の突出部4bに吸気装置(図示せず)に連
通する吸気口4aを有する直方体状のコレット4を備え
た半導体装置の製造装置、3はダイシング後のICチッ
プである。
EXAMPLES Example 1. 1A and 1B show a main part of a semiconductor device manufacturing apparatus according to an embodiment of the present invention. FIG. 1A is a perspective view thereof and FIG. 1B is a side view thereof. A semiconductor device manufacturing apparatus 3 having a rectangular parallelepiped collet 4 having an intake port 4a communicating with an intake device (not shown) on the protrusion 4b is an IC chip after dicing.

【0009】次に動作について説明する。先ず、コレッ
ト2が駆動装置(図示せず)によって駆動され吸気口4
aを有する側面の突出部4bがICチップ3の側面に接
すると、図1a、bに示されるようにICチップ3の側
面3aは吸気口4aを介して吸気装置(図示せず)によ
り吸引され吸気口4aに吸着される。ICチップ3の側
面3aがコレット2に吸着されると上記駆動装置はコレ
ット2を再び駆動し、ICチップ3はリードフレームの
ダイパッド等の半導体チップ取付部(図示せず)へ移送
される。
Next, the operation will be described. First, the collet 2 is driven by a driving device (not shown) and the intake port 4
When the protrusion 4b on the side surface having a contacts the side surface of the IC chip 3, the side surface 3a of the IC chip 3 is sucked by an intake device (not shown) via the intake port 4a as shown in FIGS. Adsorbed to the intake port 4a. When the side surface 3a of the IC chip 3 is adsorbed by the collet 2, the driving device drives the collet 2 again, and the IC chip 3 is transferred to a semiconductor chip mounting portion (not shown) such as a die pad of a lead frame.

【0010】実施例2.図2はこの発明の他の実施例に
よる半導体装置の製造装置を示し、(a)図はその正面
図、(b)図はその側面図であり、これらの図におい
て、図1と異なるところは、方形状のコレット4の側面
に突出部を形成することなく側面に直接に吸気装置(図
示せず)に連通する吸気口4aを形成した点であり、上
記実施例と同様の効果を奏する。なお、動作は上記実施
例と同様であるのでその説明を省略する。
Embodiment 2. 2 shows a semiconductor device manufacturing apparatus according to another embodiment of the present invention. FIG. 2 (a) is a front view thereof, and FIG. 2 (b) is a side view thereof. The point is that an intake port 4a communicating with an intake device (not shown) is formed directly on the side surface of the rectangular collet 4 without forming a projecting portion on the side surface, and the same effect as the above-described embodiment is obtained. Since the operation is the same as that of the above embodiment, its explanation is omitted.

【0011】実施例3.以上の実施例においてはコレッ
ト4の形状を直方体としたものについて述べたが、これ
に限らず、図3に示されるようにコレット4の形状を円
筒形状とすると共に、その側面に吸気装置(図示せず)
に連通し半導体チップの側面を吸着するする吸気口5a
を有する方形状の突部5を形成した点であり、上記実施
例と同様の効果を奏する。なお、動作は上記実施例と同
様であるのでその説明を省略する。
Embodiment 3. Although the collet 4 has a rectangular parallelepiped shape in the above embodiments, the shape of the collet 4 is not limited to this, and as shown in FIG. (Not shown)
Inlet 5a that communicates with the side and adsorbs the side surface of the semiconductor chip
This is a point that the square-shaped protrusion 5 having the shape is formed, and the same effect as that of the above-described embodiment is obtained. Since the operation is the same as that of the above embodiment, its explanation is omitted.

【0012】[0012]

【発明の効果】以上のように、この発明によれば、コレ
ットにより半導体チップの側面を吸着して移動するよう
に構成したので、コレットによる半導体チップの移動時
に半導体チップの保護膜に傷またはクラックの発生が防
止され、信頼性の高い半導体装置の製造が容易となり、
かつ、製造の歩留まりが向上する等の効果がある。
As described above, according to the present invention, since the side surface of the semiconductor chip is sucked and moved by the collet, the protective film of the semiconductor chip is scratched or cracked when the semiconductor chip is moved by the collet. Is prevented, which makes it easier to manufacture highly reliable semiconductor devices.
In addition, there are effects such as an increase in manufacturing yield.

【図面の簡単な説明】[Brief description of drawings]

【図1】この発明の一実施例による半導体装置の製造装
置を示す図である。
FIG. 1 is a diagram showing a semiconductor device manufacturing apparatus according to an embodiment of the present invention.

【図2】この発明の他の実施例による半導体装置の製造
装置を示す図である。
FIG. 2 is a diagram showing a semiconductor device manufacturing apparatus according to another embodiment of the present invention.

【図3】この発明のその他の実施例による半導体装置の
製造装置を示す図である。
FIG. 3 is a diagram showing a semiconductor device manufacturing apparatus according to another embodiment of the present invention.

【図4】従来の半導体装置の製造装置を示す図である。FIG. 4 is a diagram showing a conventional semiconductor device manufacturing apparatus.

【符号の説明】 1 半導体装置の製造装置 3 半導体チップ 4 コレット 4a 吸気口[Explanation of reference numerals] 1 semiconductor device manufacturing apparatus 3 semiconductor chip 4 collet 4a intake port

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 吸気装置に連通する吸気口を有し上記吸
気口に半導体チップを吸着して半導体チップ取付部へ移
送するコレットを備えた半導体装置の製造装置におい
て、上記吸気口を上記コレットの側面に設け、上記半導
体チップの側面を吸着するようにしたことを特徴とする
半導体装置の製造装置。
1. An apparatus for manufacturing a semiconductor device, comprising: an intake port communicating with an intake device; and a collet for adsorbing a semiconductor chip to the intake port and transferring the semiconductor chip to a semiconductor chip mounting portion. An apparatus for manufacturing a semiconductor device, which is provided on a side surface and is adapted to adsorb the side surface of the semiconductor chip.
JP583493A 1993-01-18 1993-01-18 Manufacturing apparatus for semiconductor device Pending JPH06216168A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP583493A JPH06216168A (en) 1993-01-18 1993-01-18 Manufacturing apparatus for semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP583493A JPH06216168A (en) 1993-01-18 1993-01-18 Manufacturing apparatus for semiconductor device

Publications (1)

Publication Number Publication Date
JPH06216168A true JPH06216168A (en) 1994-08-05

Family

ID=11622073

Family Applications (1)

Application Number Title Priority Date Filing Date
JP583493A Pending JPH06216168A (en) 1993-01-18 1993-01-18 Manufacturing apparatus for semiconductor device

Country Status (1)

Country Link
JP (1) JPH06216168A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101394387B1 (en) * 2007-06-25 2014-05-14 세메스 주식회사 Unit for loading a substrate and apparatus for bonding dies having the unit
JP7276623B1 (en) * 2022-05-26 2023-05-18 三菱電機株式会社 Foreign matter adhesion inspection substrate, foreign matter adhesion inspection apparatus, and foreign matter adhesion inspection method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101394387B1 (en) * 2007-06-25 2014-05-14 세메스 주식회사 Unit for loading a substrate and apparatus for bonding dies having the unit
JP7276623B1 (en) * 2022-05-26 2023-05-18 三菱電機株式会社 Foreign matter adhesion inspection substrate, foreign matter adhesion inspection apparatus, and foreign matter adhesion inspection method
WO2023228366A1 (en) * 2022-05-26 2023-11-30 三菱電機株式会社 Substrate for foreign material adhesion inspection, foreign material adhesion inspection device, and foreign material adhesion inspection method

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