JPH06177944A - Test equipment controller - Google Patents

Abstract

PURPOSE:To obtain a test equipment controller able to stop a test equipment by stopping the execution of a test program surely at a preceding fault occurrence point when an equipment to be tested is tested again through the re- execution of the test program. CONSTITUTION:A mode setting means 6 sets a fault analysis mode 8 and a stop point setting means 17 reads a test item number for stop from a 1st storage means 15, stores it in a 3rd storage means 20 and an execution means 11 executes a test program 2 in the fault analysis mode 8. Thus, when the equipment 4 to be tested is started through the control of the test equipment 3, a transfer means 21 transfers information in the 1st storage means 15 to a 2nd storage means 22. Then a coincidence discrimination means 23 compares a test item number executed at present represented by a count by a count means 12 with a test item number stored in the 3rd storage means 20 and a tentative stop means 33 tentatively stops the execution of the test program 2 when they are coincident.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a tester control device for testing the function of a device under test such as a communication device according to a test program.

[0002] As devices such as communication devices have become more sophisticated, there are more and more cases in which failure factors are intricately intertwined.
Therefore, after the functional test of the device under test is completed, when a failure occurs, a retest is performed, the test machine is stopped at the point where the failure occurred last time, and failure analysis is performed.

However, in the case of an intermittent failure with extremely low reproducibility, it is difficult to stop the tester at the previous failure occurrence point unless the failure occurs in the retest.
Therefore, it is required to surely stop the testing machine at the previous failure occurrence point when performing failure analysis.

[0004]

2. Description of the Related Art Conventionally, in order to confirm whether or not the function of a device under test is normal, the test device is controlled according to a test program to perform a function test.

By the control of the test program, logging is performed to store and print out the failure information when the failure of the device under test is detected. However, the failure information includes an error number, correct answer data, response data from the device under test, mask data, and the like.

When performing failure analysis, usually, failure information is collated with a failure dictionary created in advance. For example, the failure is analyzed by comparing the error number with the error list.

In addition, when a failure is analyzed by providing a test suspension function when an error is detected, it is possible to reproduce the failure state and analyze the failure in order to search the cause of the failure from the result of the failure analysis. Many.

That is, the test program is re-executed to perform a re-test, and the test machine is temporarily stopped by temporarily stopping the operation of the test program at the point at which the previous failure has occurred, thereby performing failure analysis.

[0009]

By the way, as described above, when retesting is performed for failure analysis, the failure that occurred in the previous test is an intermittent failure with extremely low reproducibility. If the failure is not reproduced, there is a problem that the test program must be executed many times to reproduce it, which is troublesome.

If the failure is not reproduced, there is a problem that the test program cannot be stopped at the previous failure occurrence point, that is, the confirmation point. The present invention has been made in view of such a point, and when retesting the device under test by rerunning the test program, surely stops the execution of the test program at the previous failure occurrence point, An object of the present invention is to provide a tester control device capable of stopping the tester by this.

[0011]

FIG. 1 shows the principle of the present invention. In the figure, 6 is a mode setting means for setting whether to execute the test program 2 in the failure detection mode 7 or the failure analysis mode 8 according to an external instruction.

Reference numeral 11 is an execution means, and a mode setting means 6
Execute test program 2 in the mode set in
The tester 3 tests the device under test 4 in accordance with this execution.

Reference numeral 13 is a failure determination means, which determines the presence or absence of a failure from the test result sent from the tester 3. Reference numeral 14 is a logging control means, which is a failure determination means 1
When No. 3 determines that there is a failure, the test result is stored in the first storage means and is output to the external output device 50.

Reference numeral 21 is a transfer means, which is a failure analysis mode 8
The information stored in the first storage means 15 is transferred to the second storage means 22 when the test program 2 is executed. Reference numeral 17 denotes a stop point setting means, which sets a setting for stopping the test program 2 at an arbitrary test item when the mode setting means 6 sets the failure analysis mode 8 according to an external instruction. It is carried out by transferring the test item number in the information stored in the third storage means 20.

Reference numeral 12 is counting means, and execution means 11
The test item number of the execution of the test program 2 is counted. Reference numeral 23 is a coincidence determining means, which is used to compare the count value of the counting means 12 with the third
The test item numbers stored in the storage means 20 are compared to determine whether they match.

Reference numeral 33 is a temporary stop means for stopping the execution of the test program 2 by the executing means 11 and canceling the stop in response to an external instruction when the judgment by the coincidence judging means 23 is coincident.

Reference numeral 35 denotes an information output control means, which is provided to the count value of the counting means 12 when the test program 2 is stopped by the temporary stop means 33 and when the failure determination means 13 determines that there is a failure. The information of the corresponding test item number is read from the first storage means 15 and the external output device 5
It outputs to 0.

In addition, when the information output control means 35 is stopping the test program 2 by the temporary stopping means 33 and the failure judging means 13 judges that there is no failure, the count value of the counting means 12 is set. The information of the corresponding test item number is read from the second storage means 22 and the external output device 5 is read.
It is preferable to provide a function of outputting to 0, and further, when the test program 2 is stopped by the temporary stop means 33, arbitrary information is read from the first storage means 15 and the second storage means 22 according to an external instruction and externally output. It is preferable to provide a function of outputting to the output device 50.

[0019]

In the present invention described above, when an external instruction is given to perform a retest in the failure analysis mode, the failure setting mode 8 is set by the mode setting means 6 which has received the instruction.

Next, another external instruction is used to instruct at which point the test should be stopped. Upon receiving this instruction, the stop point setting means 17 reads the test item number corresponding to the instruction from the first storage means 15 and stores it in the third storage means 20.

The executing means 11 controls the tester 2 by executing the test program 2 in the failure analysis mode 8 to start the test of the device under test 4. At this time, the transferring means 21 makes the first storage. The information of the means 15 is transferred to the second storage means 22.

Then, the failure determination means 13 takes in the test result sent from the tester 3 and determines whether or not there is a failure. If it is determined that there is a failure, the logging control means 14 stores the test result information in the first storage means 15, and the external output device 5 such as a display and a printer.
Output to 0.

Further, the coincidence judging means 23 includes the test program 2 currently being executed which is indicated by the count value by the counting means 12.
And the test item number stored in the third storage means 20 are compared, and when the numbers match, the temporary stop means 33 stops the execution of the test program 2 of the execution means 11. Control to do. by this,
The test will be suspended.

Since this stop is always performed in the test item in which the failure has occurred in the past test, the failure can be pursued even if the failure does not occur in this test. In this pursuit, if a failure occurs as in the previous case, the information output control means 35
Recognizes the test item number currently being executed from the count value of the count means 12, reads the information of the test item number corresponding to the count value from the first storage means 15, and outputs it to the external output device 50. Become.

On the other hand, if no failure occurs in this test, it becomes possible by outputting the information of the test item number corresponding to the count value from the second storage means 22 to the external output device 50.

Further, by issuing an external instruction to the information output control means 35, arbitrary information can be stored in the first and second storage means 15,
The failure analysis may be performed by reading from 22. After the failure analysis, the suspension of the suspension means 33 is released by an external instruction, and the test of the next test item is executed.

[0027]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to the drawings. FIG. 2 is a block diagram of a testing machine control apparatus according to an embodiment of the present invention.

The test machine control apparatus 1 shown in FIG. 2 has a device under test 4 which the test machine 3 executes in accordance with a test program (TP) 2.
It controls the functional test of. In the tester control device 1, reference numeral 5 denotes a test program selection control unit (TP selection control unit), which selects a desired function test of the device under test 4 from a plurality of TPs 2 in response to a key input from a keyboard performed by an operator. To select TP2 for performing.

A test program execution mode setting control unit (TP execution mode setting control unit) 6 sets whether to execute TP2 in the failure detection mode 7 or the failure analysis mode 8 in response to a key input. It is a thing.

The failure analysis mode 7 is for performing a normal function test of the device under test 4, and the failure analysis mode 8 is for retesting to analyze the cause of failure when a failure occurs in a past test. It is a thing.

The selection setting by key input of TP2 and each mode 7 and 8 is performed by, for example, displaying a plurality of TP names and TP execution modes on the display 9 as shown in FIG. Cursor 10
Is moved to selectively set the desired TP name and the failure detection mode or failure analysis mode.

Reference numeral 11 shown in FIG. 2 is a test program execution control unit (TP execution control unit), which executes TP2 in accordance with the failure detection mode 7 or the failure analysis mode 8. In response to this execution, the tester 3 tests the function of the device under test 4.

Reference numeral 12 is a test item number counter, which is a TP
A count value indicates which test item number in TP2 the execution control unit 11 executes. A test result determination unit 13 determines whether the test result of the device under test 4 performed by the tester 3 is normal or abnormal.

Reference numeral 14 is a logging control unit, and when the judgment result of the test result judging unit 13 is abnormal, that is, when a failure of the device under test 4 is detected, an error number is provided as failure detection information for each test item number. The correct answer data, the result data, and the mask data are stored in the first memory unit 15 and the printout to the printer 16 is controlled.

Reference numeral 17 denotes a test program break point setting control unit (TP break point setting control unit),
In the failure analysis mode 8, control is performed to set a point at which the TP2 is stopped according to a key input.

In this control, the previous failure information stored in the first memory unit 15 is displayed on the display 18 as shown in FIG. 4 for each test item number, and then the cursor 19 is moved by a predetermined function key. By doing so, a desired test item number is selected and stored in the third memory section 20. Further, all test item numbers are selectively set by a specific function key.

Reference numeral 21 shown in FIG. 2 is a transfer controller.
T by the TP execution control unit 11 in the failure analysis mode 8
At the time of executing P2, control is performed to transfer all the previous failure information stored in the first memory unit 15 to the second memory unit 22.

Reference numeral 23 is a test item number comparison unit, which compares the count value of the test item number counter 12 with the test item number stored in the third memory unit 20 to determine whether or not they match. is there. That is, it is determined whether or not the test item number of the currently executed TP2 is stored in the third memory unit 20.

A failure detection flag ON / OFF control unit 24 controls ON / OFF of the failure detection flag 25. This control is performed by TP2 by the TP execution control unit 11.
The fault detection flag 25 is turned off during the execution of the above step, and is turned on when the judgment result of the test result judgment section 13 is abnormal. Also,
When the failure detection flag 25 is on, it indicates that a failure has been detected.

Reference numeral 26 is a failure analysis flag ON / OFF control section, which controls ON / OFF of the failure analysis flag 27. This control is performed by TP2 by the TP execution control unit 11.
The failure analysis flag 27 is turned off at the time of execution of, and turned on when the comparison result of the test item number comparison unit 23 is coincident. When the failure analysis flag 27 is on, it indicates that the test currently being executed is in the failure analysis mode.

Reference numeral 28 denotes a temporary stop flag ON / OFF control section for controlling ON / OFF of a temporary stop flag 29 which indicates that the test is temporarily stopped in an ON state. A failure detection flag state determination unit 30 determines the on / off state of the failure detection flag 25.

Reference numeral 31 is a failure analysis flag state judgment unit,
The on / off state of the failure analysis flag 27 is determined. Reference numeral 32 denotes a temporary stop flag state determination unit that determines the on / off state of the temporary stop flag 29.

Reference numeral 33 denotes a temporary stop control section which, when the temporary stop flag state judging section 32 judges that the temporary stop flag 29 is ON, temporarily suspends the test being executed under the control of the TP execution control section 11. Also, the control for canceling the temporary suspension is performed in response to a key input for issuing a temporary suspension cancellation command.

Reference numeral 34 is a test item number update control unit, which is used by the temporary stop flag state judging unit 32 to determine the temporary stop flag 29.
When it is determined that the test item number is off, or when a key input for issuing a pause cancel command is performed, the test item number is changed by up-counting the count value of the test item number counter 12 by "1". It is a thing.

Reference numeral 35 denotes a display control unit, which displays a screen for performing a failure analysis on the display 36 when, for example, the executed test item number and the designated TP breakpoint coincide with each other and a temporary stop is shown in FIG. Display as indicated by 38.

This display is made by the failure analysis flag state judging section 3
1 and the determination result of the suspension flag state determination unit 32 is detected to be ON, and at this time, the count value of the test item number counter 12 and the information of the same test item number are stored in the first memory. As shown in FIG. 5, whether or not the failure is reproduced by being read from the unit 15 and detecting whether the judgment result of the failure detection flag state judging unit 30 is ON or not is detected. Displayed without.

The display control unit 35 also controls the output of the information of the arbitrary test item number stored in the first and second memory units 15 and 22 to the display 36 or the printer 37 by a predetermined key input. .

Next, with reference to the flow charts shown in FIGS. 6 to 9, the test operation under the control of the tester controller 1 having the configuration shown in FIG. 2 will be described. However, FIG. 6 is a flowchart for explaining the test operation executed according to the test program, FIG. 7 is a flowchart for explaining the operation in the failure detection mode in the CHECK item shown in FIG. 6, and FIG. 9 is a flowchart for explaining the operation in the failure analysis mode in the CHECK item shown in FIG.
FIG. 9 is a flowchart for explaining the operation of the pause item shown in FIG. 7 or FIG.

First, in step S1 shown in FIG. 6, TP is selected. The operator specifies the TP to be executed by key input, and the TP selection control unit 5 selects and sets the specified TP2.

In step S2, the TP execution mode is set. This is set by the TP execution mode setting control unit 6 to the failure detection mode 7 or the failure analysis mode 8 when the operator designates the failure detection mode or the failure analysis mode by key input. Here, it is assumed that the failure detection mode 7 is set.

Next, the setting of the TP break point in step S3 is performed only in the failure analysis mode. Therefore, in the failure detection mode, step S4 is set.
Proceeding to step TP2 is executed.

That is, the TP execution controller 11 executes TP2 in the failure detection mode 7, and the tester 3 tests the function of the device under test 4 in response to this execution. Further, when executing TP2, it is determined in step S5 whether or not the failure analysis mode is set.

In this case, since TP2 is being executed in the failure detection mode, the process proceeds to NO. That is, the process proceeds to step S7. Then, in the test procedures A and B of steps S7 and S8, the test results of the device under test 4 are loaded from the tester 3 into the tester controller 1, and the check (CHECK) is performed in step S9.

A flow chart of this check is shown in FIG. In step S10 shown in FIG. 7, the fault detection flag on / off control unit 24 turns off the fault detection flag 25, and in step S11, the fault analysis flag on / off control unit 26 turns off the fault analysis flag 27.

Next, in step S12, it is determined whether the test result is normal. This is the test result judgment unit 1
3 judges from the test result. If this result is normal, the process proceeds to step S15.

This step S15 is an item for temporarily stopping, and its flowchart is shown in FIG. In step S16 shown in FIG. 9, the failure detection flag state determination unit 3
Based on 0, it is determined whether the failure detection flag 25 is on.

Since the fault detection flag 25 is turned off here, the routine proceeds to step S18. Then, the failure analysis flag state determination unit 31 determines whether the failure analysis flag 27 is on.

Since the failure analysis flag 27 is also off, the process proceeds to step S20. Then, the pause flag state determination unit 32
Determines whether the pause flag 29 is on.

Since the temporary stop flag 29 is also off, the process proceeds to step S21 in FIG. Then, the test item number is updated. This is executed by the test item number update control unit 34 counting up the count value of the test item number counter 12 by "1" when the temporary stop flag state determining unit 32 determines that the temporary stop flag 29 is off. To be done.

When this execution is completed, the check in step S9 shown in FIG. 6 is completed, and the device under test 4 is tested with the updated test items. Similarly, the following steps S2
2, in S23, the test result is fetched from the tester 3, and the check is performed as described above in step S24. When the check is completed, the step S2 is similarly performed.
5, S26, S27, and complete all tests.

On the other hand, in step S12 shown in FIG. 7 in the failure detection mode, if the test result is judged to be abnormal, the process proceeds to step S13. Here, all the test information including the failure information of the test item determined to be abnormal by the logging control unit 14 is stored in the first memory unit 15 and printed out to the printer 16.

Then, in step S14, the failure detection flag 2 is detected by the failure detection flag on / off control unit 24.
5 is turned on, and the process advances to the temporary stop item in step S15. That is, in step S16 of FIG. 9, it is determined whether the failure detection flag 25 is on.

Here, since the flag 25 is on, the routine proceeds to step S17, where the temporary stop flag on / off control unit 28 turns on the temporary stop flag 29. Then, in step S18, it is determined whether the failure analysis flag 27 is on. Failure analysis flag 27
Is off, the routine proceeds to step S20, where it is determined whether or not the temporary stop flag 29 is on.

Since the temporary stop flag 29 is on, the process proceeds to step S28. In step S28, the suspension control unit 33 suspends the execution control of TP2 of the TP execution control unit 11 based on the result of the determination that the suspension flag 29 is on.

In this case, since the present test is the failure detection mode, the temporary stop is released by key input in step S29, the temporary stop flag 29 is turned off in step S30, and the temporary stop operation ends.

After completion of this, step S21 shown in FIG.
At, the test item number is updated, and the check operation ends. After that, other check items S24 and S shown in FIG.
Also in 27, when the test result is determined to be abnormal, the same operation is executed.

Next, the operation in the failure analysis mode will be described. This failure analysis mode is a mode for analyzing a failure factor when a failure occurs in the failure detection mode described above.

First, TP is selected in step S1 shown in FIG. 6, and TP execution mode is set in step S2. This is done by the operator specifying the failure analysis mode 8 by key input.

When the failure analysis mode 8 is designated, a screen for selecting which test item is used to temporarily stop the test is displayed on the display. In step S3, the operator looks at the screen. Set TP breakpoints by key operation.

The test item number corresponding to this setting is selected from the first memory section 15 and stored in the third memory section 20. Next, in step S4, TP2 is executed,
In step S5, it is determined whether the failure analysis mode is set.

In this case, since TP2 is being executed in the failure analysis mode, the process proceeds to YES. That is, step S6
Proceed to. In this step S6, the failure information logging data is transferred to the failure analysis storage area.

That is, under the control of the transfer control unit 21, all the information stored in the first memory unit 15 is stored in the second memory unit 2.
2 is transferred. Then, in the test procedures A and B of steps S7 and S8, the test results of the device under test 4 are loaded from the tester 3 into the tester controller 1, and the check (CHECK) is performed in step S9.

A flowchart of this check is shown in FIG. The fault detection flag 25 is turned off in step S31 shown in FIG. 8, and the fault analysis flag 27 is turned off in step S32.

Next, in step S33, it is judged whether or not the test result is normal, and if the result is normal, the process proceeds to step S36. In step S36, it is determined whether the TP breakpoint specified in step S3 matches the test item number currently being executed.

This is because the test item number comparison unit 23 uses the count value of the test item number counter 12 and the third memory unit 20.
It is performed by comparing with the test item number stored in.

If the comparison results do not match,
Proceed to step S38 for the item to pause. Here, as in the case described above, first, in step S shown in FIG.
At 16, it is determined whether the fault detection flag 25 is on.

Since the failure detection flag 25 is off, the routine proceeds to step S18, where it is determined whether the failure analysis flag 27 is on. Since the failure analysis flag 27 is also off, the process proceeds to step S20 and the pause flag 29
Is determined to be on.

Since the temporary stop flag 29 is also off, the process proceeds to step S38 in FIG. Then, the test item number is updated, and then the test is executed with the updated test item. Also in this test, as described above, in step S
Through the operations of S31 and S32, it is determined in step S33 whether the test result is normal.

If it is determined that the test result is abnormal, the process proceeds to step S34, and under the control of the logging control unit 14, all information including fault information of this test item is stored in the first memory unit 15. At the same time, it is printed out on the printer 16.

Then, in step S35, the failure detection flag 25 is turned on. Next, in step S36, it is determined whether the TP breakpoint and the test item number currently being executed match.

Here, if both numbers match,
The failure analysis flag 27 is turned on by the control of the failure analysis flag on / off control unit 26, and the process proceeds to step S38. Then, in step S16 shown in FIG. 9, it is determined whether or not the failure detection flag 25 is turned on.

Here, since the failure detection flag 25 is turned on, the temporary stop flag 29 is turned on in step S17, and the process proceeds to step S18 to determine whether the failure analysis flag 27 is turned on. The failure analysis flag 27 is also on, and the pause flag 29 should be turned on in step S19, but since it has already been turned on in step S17, the process proceeds to step S20 and the pause flag 29 is turned on. It is determined whether or not it is on.

Since the temporary stop flag 29 is on, the test is temporarily stopped in step S28.
At this time, since it is detected that the determination results of the failure analysis flag state determination unit 31 and the suspension flag state determination unit 32 are both turned on, the display control unit 35 causes the count value of the test item number counter 12 to change. And the information of the same test item number is read from the first memory unit 15 and displayed on the display 36, and since the judgment result of the failure detection flag state judging unit 30 is ON, the display 36 indicates that a failure has occurred. To do.

At this time, in order to perform the analysis, the information of the arbitrary test item number stored in the first and second memory units 15 and 22 is output to the display 36 or the printer 37 by the key operation.

When the desired failure analysis is completed, the temporary stop is released by key input in step S29. After this cancellation, in step S30, the temporary stop flag 29 is turned off, and the operation of the temporary stop item ends.

Further, even when it is judged as normal in the judgment of the test in step S33 shown in FIG. 8, if the judgments in step S36 match, the failure analysis flag 27 is turned on. Step S1 shown
In the determination in 8, the flag is turned on, and the pause flag 29 is turned on.

In this case, in the test suspension of step S28, the display 36 displays a display with no fault information. However, even in this case, the information of an arbitrary test item number transferred and stored in the second memory unit 22 can be output to the display 36 or the printer 37 by key input, so that the failure analysis can be performed. It has become.

Further, in this embodiment, only one memory unit for transferring the previous test result information is provided,
You may make it provide two or more and memorize | store the test result after the last time.

According to the testing machine control apparatus 1 described above,
When a retest is performed for failure analysis, the test can be reliably stopped at the point where the previous failure occurred, so as in the past, the failure that occurred in the previous test has extremely low reproducibility. Therefore, if the failure is not reproduced in the retest, the test program has to be executed many times to reproduce the failure, and it does not take time and effort.

Further, in this embodiment, the previous information is stored in the second memory unit 22 even when the failure is not reproduced,
Since the information can be arbitrarily taken out and displayed on the display 36 or printed out on the printer 37, the failure analysis can be surely performed.

[0091]

As described above, according to the present invention,
When the device under test is retested by re-executing the test program, it is possible to reliably stop the execution of the test program at the previous fault occurrence point and thereby stop the tester.

Further, since past fault information is stored and can be arbitrarily retrieved, it is possible to perform a reliable fault analysis even when the fault is not reproduced.

[Brief description of drawings]

FIG. 1 is a principle diagram of the present invention.

FIG. 2 is a block diagram of a testing machine control apparatus according to an embodiment of the present invention.

FIG. 3 is an example of a screen for selecting a test program (TP).

FIG. 4 is an example of a screen for setting a test program breakpoint.

FIG. 5 is a diagram showing an example of a screen for failure analysis during suspension.

FIG. 6 is a flowchart for explaining a test operation executed according to a test program.

FIG. 7 is a flowchart for explaining the operation in the failure detection mode for the CHECK item shown in FIG.

8 is a flow chart for explaining the operation in the failure analysis mode in the CHECK item shown in FIG.

9 is a flow chart for explaining the operation of the pause item shown in FIG. 7 or FIG.

[Explanation of symbols]

 2 test program 3 test machine 4 device under test 6 mode setting means 7 failure detection mode 8 failure analysis mode 11 execution means 12 counting means 13 failure determination means 14 logging control means 15 first storage means 17 stop point setting means 20 third storage Means 21 Transfer means 22 Second storage means 23 Match determination means 33 Temporary stop means 35 Information output control means 50 External output device

─────────────────────────────────────────────────── ─── Continuation of the front page (51) Int.Cl. ⁵ Identification code Internal reference number FI Technical indication H04M 3/22 Z 8426-5K

Claims (4)

[Claims] 1. A testing machine (3) according to a testing program (2)
In the test machine control device that controls the test of the device under test (4), the test program (2) is executed in the failure detection mode (7) or in the failure analysis mode (8) according to the external instruction. Mode setting means (6) for setting whether or not to execute, and the test program (2) is executed in the mode set by the mode setting means (6), and in response to this execution, the test machine
Execution means (11) for causing (3) to perform the test of the device under test (4), and failure determination means (13) for determining the presence / absence of a failure from the test result sent from the testing machine (3). ) And the failure determination means (13) determines that there is a failure, the test result is stored in the first storage means and the external output device (5
Logging control means (14) for outputting to (0) and information stored in the first storage means (15) at the time of execution of the test program (2) in the failure analysis mode (8), second storage means (22) The transfer means (21) for transferring to and the setting for stopping the test program (2) at an arbitrary test item when the mode setting means (6) sets the failure analysis mode (8) The first storage means (15) according to the instruction
The test item number in the information stored in the third storage means (20)
Stop point setting means (1
7), a counting means (12) for counting the test item number of the execution of the test program (2) performed by the executing means (11), a count value of the counting means (12) when the failure analysis mode is executed, 3 Matching means (23) for comparing the test item number stored in the memory means (20) and judging whether or not there is a match, and when the judgment of the match judging means (23) is a match, the executing means
Temporary stop means (33) for stopping the execution of the test program (2) by (11) and canceling the stop in response to an external instruction.
A testing machine control device comprising: 2. When the test program (2) is stopped by the temporary stop means (33) and the failure determination means
When (13) determines that there is a fault, the counting means
The information of the test item number corresponding to the count value of (12) is read from the first storage means (15) to output the external output device (50).
2. The testing machine control device according to claim 1, further comprising an information output control means (35) for outputting the information to the testing machine control device. 3. The information output control means (35) judges that the test program (2) is stopped by the temporary stop means (33) and the failure judging means (13) judges that there is no failure. A function of reading the information of the test item number corresponding to the count value of the counting means (12) from the second storage means (22) and outputting it to the external output device (50) The test machine control device according to claim 1 or 2. 4. The information output control means (35) provides the first storage means (15) and the second storage means (15) according to an external instruction when the test program (2) is stopped by the temporary stop means (33). 4. The test machine control device according to claim 1, further comprising a function of reading arbitrary information from the storage means (22) and outputting it to the external output device (50).