JPH06105693B2 - Silicon Carbide Jig for Wafer Heat Treatment - Google Patents

Silicon Carbide Jig for Wafer Heat Treatment

Info

Publication number
JPH06105693B2
JPH06105693B2 JP62051725A JP5172587A JPH06105693B2 JP H06105693 B2 JPH06105693 B2 JP H06105693B2 JP 62051725 A JP62051725 A JP 62051725A JP 5172587 A JP5172587 A JP 5172587A JP H06105693 B2 JPH06105693 B2 JP H06105693B2
Authority
JP
Japan
Prior art keywords
jig
heat treatment
silicon carbide
wafer
core tube
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP62051725A
Other languages
Japanese (ja)
Other versions
JPS63217622A (en
Inventor
隆 田中
俊吉 佐藤
良信 棚田
茂 安部
Original Assignee
東芝セラミックス株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 東芝セラミックス株式会社 filed Critical 東芝セラミックス株式会社
Priority to JP62051725A priority Critical patent/JPH06105693B2/en
Publication of JPS63217622A publication Critical patent/JPS63217622A/en
Publication of JPH06105693B2 publication Critical patent/JPH06105693B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は、ウェーハ熱処理用炭化珪素質治具に関し、特
に縦型熱処理炉における半導体ウェーハの熱処理に供さ
れるウェーハ熱処理用炭化珪素質治具に関するものであ
る。
Description: TECHNICAL FIELD The present invention relates to a silicon carbide jig for wafer heat treatment, and particularly to a silicon carbide jig for wafer heat treatment used for heat treatment of a semiconductor wafer in a vertical heat treatment furnace. It is about.

[従来の技術] 従来この種のウェーハ熱処理用炭化珪素質治具は、ウェ
ーハ熱処理用治具が縦型熱処理炉の炉芯管内ではその材
料たる石英ガラスの軟化に伴う変形により外周を炉芯管
の内周面面に接触し特に回転処理する場合に炉芯管の内
周面面を損傷する事故ないしは横方向に載置された半導
体ウェーハが落下する事故を防止するために提案されて
おり、具体的には第4図に示すように半導体ウェーハを
支持するための複数の突条部がほぼ半筒条の側壁の内周
面に対し縦方向に延長して形成されており炭化珪素で作
成された治具本体20′の下端部および上端部に対し接合
あるいは嵌合などの適宜の手段によって下部板状体30′
および上部板状体40′がそれぞれ連結された構造を有し
ていた。
[Prior Art] Conventionally, in this type of silicon carbide jig for wafer heat treatment, the jig for wafer heat treatment has a furnace core tube whose outer periphery is deformed by the softening of quartz glass which is the material in the furnace core tube of a vertical heat treatment furnace. It is proposed to prevent an accident that damages the inner peripheral surface of the furnace core tube when contacting the inner peripheral surface of the inner peripheral surface of the furnace or a semiconductor wafer that is laterally mounted falls. Specifically, as shown in FIG. 4, a plurality of ridges for supporting a semiconductor wafer are formed extending in the vertical direction with respect to the inner peripheral surface of the side wall of the semi-cylindrical line and made of silicon carbide. The lower plate-shaped body 30 'is joined to the lower and upper ends of the jig main body 20' by means of joining or fitting.
And the upper plate-shaped body 40 ' had a structure in which they were connected to each other.

[解決すべき問題点] しかしながら第4図に示した従来のウェーハ熱処理用炭
化珪素質治具では、縦型熱処理炉の炉芯管の長さが小さ
く、一般に輻射熱の大きい石英ガラスによって炉芯管が
作成されるようになったことに起因してその上部および
下部における温度勾配が大きくなっていたので、下部開
口部からの挿入取出に際して治具本体20′,下部板状体
30′および上部板状体40′(特に下部板状体30′)に対
し内部熱応力が蓄積され熱衝撃すなわち熱膨張あるいは
熱収縮に伴って比較的に短期間で破壊されてしまう欠点
があった。
[Problems to be Solved] However, in the conventional silicon carbide jig for wafer heat treatment shown in FIG. 4, the length of the furnace core tube of the vertical heat treatment furnace is short, and the furnace core tube is generally made of quartz glass with large radiant heat. Since the temperature gradient in the upper and lower parts of the jig was increased due to the creation of the jig, the jig body 20 ' and the lower plate-shaped body were inserted and removed from the lower opening.
There is a drawback that internal thermal stress is accumulated in 30 ' and upper plate 40' (especially lower plate 30 ' ) and they are destroyed in a relatively short period of time due to thermal shock, that is, thermal expansion or contraction. It was

そこで本発明は、この欠点を解決し、縦型熱処理炉の炉
芯管の下部開口部近傍の大きな温度勾配に起因する破壊
を防止してなるウェーハ熱処理用炭化珪素質治具を提供
せんとするものである。
Therefore, the present invention solves this drawback and provides a silicon carbide jig for wafer heat treatment which prevents damage due to a large temperature gradient near the lower opening of the furnace core tube of a vertical heat treatment furnace. It is a thing.

[問題点の解決手段] 本発明は、複数枚の半導体ウェーハを支持する治具本体
の上端部および下端部に対してそれぞれ連絡された上部
板状体および下部板状体からなる半導体ウェーハ熱処理
用炭化珪素質治具において、上記上部板状体および下部
板状体のうち少なくとも下部板状体にスリット部が穿設
されていることを特徴とする半導体ウェーハ熱処理用炭
化珪素質治具を要旨としている。
[Means for Solving Problems] The present invention is for heat treatment of a semiconductor wafer including an upper plate-shaped body and a lower plate-shaped body which are respectively connected to the upper end portion and the lower end portion of a jig body supporting a plurality of semiconductor wafers. In a silicon carbide jig, a silicon carbide jig for heat treatment of a semiconductor wafer, characterized in that at least a lower plate of the upper plate and the lower plate is provided with a slit portion. There is.

[作用] 本発明にかかるウェーハ熱処理用炭化珪素質治具は、半
導体ウェーハを支持する治具本体の上端部および下端部
に対してそれぞれ連結された上部板状体および下部板状
体のうち少なくとも下部板状体に対して、スリット部が
穿設されてなるので、内部熱応力を吸収緩和し、熱膨張
あるいは熱収縮に伴う破壊を防止する作用をなしてお
り、ひいては長寿命化する作用をなしている。
[Operation] A silicon carbide jig for wafer heat treatment according to the present invention is provided with at least an upper plate-shaped body and a lower plate-shaped body connected to an upper end portion and a lower end portion of a jig body supporting a semiconductor wafer, respectively. Since the lower plate-like body is provided with slits, it absorbs and relaxes internal thermal stress and prevents damage due to thermal expansion or contraction, which in turn increases the life. I am doing it.

[実施例] 次に本発明についても添付図面を参照しつつ具体的に説
明する。
EXAMPLES Next, the present invention will be specifically described with reference to the accompanying drawings.

第1図は、本発明のウェーハ熱処理用炭化珪素質治具の
一実施例を示す斜視図である。
FIG. 1 is a perspective view showing an embodiment of a silicon carbide jig for wafer heat treatment of the present invention.

第2図は、同部分斜視図であって、特に下部板状体を示
している。
FIG. 2 is a partial perspective view of the same and particularly shows the lower plate-shaped body.

第3図は、同使用状態を示す斜視図である。FIG. 3 is a perspective view showing the same usage state.

まず本発明のウェーハ熱処理用炭化珪素質治具の構成に
ついて詳細に説明する。10 は本発明のウェーハ熱処理用炭化珪素質治具であっ
て、炭化珪素でできた治具本体20と、炭化珪素でできて
おり治具本体20の下端部に対して接合あるいは嵌合など
の適宜の手段により連結された下部板状体30と、炭化珪
素でできており治具本体20の上端部に対して接合あるい
は嵌合などの適宜の手段により連結された上部板状体40
とを包有している。
First, the structure of the silicon carbide jig for wafer heat treatment of the present invention will be described in detail. Reference numeral 10 denotes a silicon carbide jig for wafer heat treatment of the present invention, which includes a jig body 20 made of silicon carbide and a jig body 20 made of silicon carbide for joining or fitting to the lower end portion of the jig body 20 . The lower plate-like body 30 connected by an appropriate means and the upper plate-like body 40 made of silicon carbide and connected by an appropriate means such as joining or fitting to the upper end of the jig body 20.
And has a package.

治具本体20は、ほぼ半筒状に形成されており、その側壁
の内周面に対して熱処理すべき半導体ウエーハを支持す
るための複数(たとえば4つ)の突条部21a,〜,21dが縦
方向に延長して形成されている。突条部21a,〜,21d間に
は、治具本体20の熱衝撃による破壊を防止すると共に治
具本体20を軽量化しかつ熱容量を削減して熱分布を良好
とするためにその側壁に対して適宜の数の窓部22a,〜22
cが形成されている。突条部21a,〜,21dには、それぞれ
複数のウェーハ支持溝23a,〜,23dが穿設されている。ウ
ェーハ支持溝23a,〜,23dは、突条部21a,〜,21dの内周面
に対して同一の高さ位置に一つずつ穿設されており、熱
処理すべき半導体ウェーハ(図示せず)が横方向に挿入
載置される。
The jig body 20 is formed in a substantially semi-cylindrical shape, and has a plurality of (for example, four) ridges 21a, ..., 21d for supporting the semiconductor wafer to be heat-treated on the inner peripheral surface of the side wall thereof. Are formed to extend in the vertical direction. Between the ridges 21a, ~, 21d, to prevent damage to the jig body 20 due to thermal shock, reduce the weight of the jig body 20 , reduce the heat capacity, and improve the heat distribution, the side walls are formed. An appropriate number of windows 22a, ~ 22
c is formed. Plural wafer support grooves 23a, ..., 23d are bored in the protrusions 21a, ..., 21d, respectively. The wafer supporting grooves 23a, ~, 23d are formed one by one at the same height position with respect to the inner peripheral surfaces of the protrusions 21a, ~, 21d, and semiconductor wafers to be heat-treated (not shown). Is inserted and placed in the lateral direction.

また治具本体20の下部には、窓部22a,〜,22cのいずれか
(ここでは窓部22b)に対し連通されたスリット部24を
形成してもよく、これにより縦型熱処理炉50の炉芯管52
に対する挿入取出時もしくはその炉芯管52内での加熱ヒ
ータ53による加熱時に生じる内部熱応力を吸収緩和で
き、治具本体20の熱衝撃すなわち熱膨張あるいは熱収縮
に伴う破壊を防止できる。
Further, in the lower portion of the jig main body 20 , a slit portion 24 that communicates with any of the window portions 22a, to 22c (here, the window portion 22b) may be formed, whereby the vertical heat treatment furnace 50 Furnace core tube 52
It is possible to absorb and relieve internal thermal stress that occurs during insertion and removal or heating by the heater 53 in the furnace core tube 52, and it is possible to prevent the jig body 20 from being damaged by thermal shock, that is, thermal expansion or thermal contraction.

下部板状体30は、治具本体20の下部に対し接着あるいは
嵌合などの適宜の手段により直接により連結された第1
の板状体31と、本発明のウェーハ熱処理用炭化珪素質治
10を縦型熱処理炉50の炉芯管52に対して挿入取出しも
しくはその炉芯管52に対して支持回転する治具載置台51
に載置するための第2の板状体32と、第1,第2の板状体
31,32を互いに連結するための連結中空筒体33とを包有
している。第1,第2の板状体31,32には、それぞれ連結
中空筒体33の内部中空33aの両端開口部に連結された開
口部31a,32aが穿設されている。また第1,第2の板状体3
1,32および連結中空筒体33には、それぞれ外周面から開
口部31a,32aおよび内部中空33aに達し、かつ互いに連通
されたスリット部31b,32b,33bが穿設されており、縦型
熱処理炉50の炉芯管52に対する挿入取出時もしくはその
炉芯管52における加熱時に生じる内部熱応力を吸収緩和
でき、下部板状体30の熱衝撃すなわち熱膨張あるいは熱
収縮に伴う破壊を十分に防止できる。
The lower plate-shaped body 30 is directly connected to the lower portion of the jig body 20 by an appropriate means such as adhesion or fitting.
The plate-like body 31 and the silicon carbide jig 10 for wafer heat treatment of the present invention are inserted into and taken out from the furnace core tube 52 of the vertical heat treatment furnace 50 , or a jig is mounted and rotated to support the furnace core tube 52. Stand 51
A second plate-shaped body 32 for mounting on the table, and first and second plate-shaped bodies
It includes a connecting hollow cylindrical body 33 for connecting 31, 32 to each other. The first and second plate-like bodies 31 and 32 are provided with openings 31a and 32a, respectively, which are connected to the openings at both ends of the internal hollow 33a of the connection hollow cylindrical body 33. Also, the first and second plate-like bodies 3
1, 32 and the connecting hollow cylindrical body 33 are respectively provided with slit portions 31b, 32b, 33b reaching the openings 31a, 32a and the inner hollow 33a from the outer peripheral surface and communicating with each other, and the vertical heat treatment is performed. Internal thermal stress generated when the furnace 50 is inserted into and taken out of the furnace core tube 52 or when the furnace core tube 52 is heated can be absorbed and relaxed, and the lower plate-like body 30 is sufficiently prevented from being damaged by thermal shock, that is, thermal expansion or contraction. it can.

上部板状体40に対し、第1図実施例では開口部およびス
リット部が形成されていないが、本発明はこれに限定さ
れるものではなく、所望により下部板状体30と同様にこ
れらを形成してもよい。これにより上部板状体40の熱衝
撃すなわち熱膨張あるいは熱収縮に伴う破壊をさらに防
止でき、併せて本発明のウェーハ熱処理用炭化珪素質治
10を全体として軽量化することができるので、有益で
ある。
The upper plate 40 is not formed with the openings and slits in the embodiment shown in FIG. 1, but the present invention is not limited to this, and if desired, these can be formed in the same manner as the lower plate 30. You may form. This makes it possible to further prevent the thermal shock of the upper plate-like body 40 , that is, the destruction due to the thermal expansion or the thermal contraction, and at the same time, it is possible to reduce the weight of the silicon carbide jig 10 for wafer heat treatment of the present invention, which is beneficial. Is.

更に本発明のウェーハ熱処理用炭化珪素質治具の作用に
ついて詳細に説明する。
Further, the operation of the silicon carbide jig for wafer heat treatment of the present invention will be described in detail.

治具本体20のウェーハ支持溝23a,〜,23dに対して熱処理
すべき半導体ウェーハ(図示せず)を横方向に所望枚数
だけ載置したのち、治具載置台51に対して下部板状体30
を載置する。
After mounting a desired number of semiconductor wafers (not shown) to be heat-treated in the wafer supporting grooves 23a to 23d of the jig body 20 in the lateral direction, the lower plate-shaped member is placed on the jig mounting table 51. 30
To place.

次いで治具載置台51が上昇し、縦型熱処理炉50の炉芯管
52に対しその下部開口部52aより本発明のウェーハ熱処
理用炭化珪素質治具10を挿入する。このときスリット部
31b,32b,33bが形成されているので、下部板状体30は縦
型熱処理炉50の炉芯管52内部の大きな温度勾配に伴って
急速に加熱されても内部熱応力を吸収緩和でき、熱衝撃
ひいては熱膨張に伴う破壊を回避できる。また治具本体
20に対し窓部22a,〜,22cとスリット部24が形成されてお
れば、治具本体20の熱衝撃ひいては熱膨張に伴う破壊も
併せて回避でき、好適である。加えて上部板状体40に対
して開口部およびスリット部(特にスリット部)が形成
されておれば、上部板状体40の熱衝撃ひいては熱膨張に
伴う破壊も防止でき、一層好適である。
Next, the jig mounting table 51 rises, and the furnace core tube of the vertical heat treatment furnace 50
The silicon carbide jig 10 for wafer heat treatment of the present invention is inserted into the lower portion 52 through the lower opening 52a. At this time the slit part
Since 31b, 32b, 33b are formed, the lower plate-shaped body 30 can absorb and relax internal thermal stress even if it is rapidly heated due to a large temperature gradient inside the furnace core tube 52 of the vertical heat treatment furnace 50 , It is possible to avoid thermal shock and eventually destruction due to thermal expansion. Also the jig body
If the window portions 22a, 22c, and 22c and the slit portion 24 are formed for 20 , it is possible to avoid the thermal shock of the jig body 20 and the destruction due to the thermal expansion, which is preferable. If I is opening and the slit portion (particularly the slit portion) formed with respect to the upper plate body 40 in addition, breakage due to thermal shock and thus thermal expansion of the upper plate body 40 can be prevented, it is more preferred.

炉芯管52内部での半導体ウェーハの熱処理時にも、本発
明のウェーハ熱処理用炭化珪素質治具10では下部板状体
30にスリット部31b,32b,33bが形成されているので、炉
芯管52の下端部における大きな温度勾配に伴う下部板状
30の熱破壊を防止できる。また治具本体20に対してス
リット部24が形成されておれば、炉芯管52の下端部にお
ける大きな温度勾配に伴う治具本体20の熱破壊も防止で
き、好適である。加えて上部板状体40に対して開口部お
よびスリット部(特にスリット部)が形成されておれ
ば、炉芯管52の上端部における大きな温度勾配に伴う上
部板状体40の熱破壊も併せて防止でき、一層好適であ
る。
Even during the heat treatment of the semiconductor wafer inside the furnace core tube 52, the lower plate-shaped body is formed in the silicon carbide jig 10 for wafer heat treatment of the present invention.
Since the slit portions 31b, 32b, 33b are formed in the 30 , it is possible to prevent thermal destruction of the lower plate-shaped body 30 due to a large temperature gradient at the lower end of the furnace core tube 52. Also, I is the slit portion 24 is formed for the jig body 20, it can be prevented thermal destruction of the jig body 20 due to the large temperature gradient at the lower end of the core tube 52, which is preferable. In addition if I by opening and a slit portion (particularly the slit portion) is formed with respect to the upper plate-like body 40, also to thermal destruction of the upper plate-like body 40 due to the large temperature gradient in the upper portion of the furnace core tube 52 Can be prevented and is more preferable.

縦型熱処理炉50の炉芯管52内部での半導体ウェーハの熱
処理が終了すると、治具載置台51が降下し、縦型熱処理
50の炉芯管52の下部開口部52aから本発明のウェーハ
熱処理用炭化珪素質治具10を取出す。このときも挿入時
と同様に本発明のウェーハ熱処理用炭化珪素質治具10
は、炉芯管52の下端部における大きな温度勾配に伴う内
部熱応力を吸収緩和でき、その熱破壊を防止できる。
Vertical heat treatment furnace50Of the semiconductor wafer inside the furnace core tube 52 of
When the processing is completed, the jig mounting table 51 descends and vertical heat treatment is performed.
Furnace50The wafer of the present invention from the lower opening 52a of the furnace core tube 52 of
Silicon carbide jig for heat treatmentTenTake out. Also when inserting
Similarly to the present invention, the silicon carbide jig for wafer heat treatment of the present inventionTen
Is due to the large temperature gradient at the lower end of the furnace core tube 52.
Partial thermal stress can be absorbed and relaxed, and its thermal destruction can be prevented.

なお上述においては、下部板状体30が、第1,第2の板状
体31,32と連通中空筒体33とを包有しているが、所望に
よってはこれを第1の板状体31のみで形成しても差支え
ない。
In the above description, the lower plate-shaped body 30 includes the first and second plate-shaped bodies 31 and 32 and the communicating hollow cylindrical body 33, but if desired, this may be the first plate-shaped body. It can be formed with only 31.

また下部板状体30の形状は、円環状とされているが、所
望によっては外形および開口部の少なくとも一方を多角
形状としてもよい。
Further, the shape of the lower plate-shaped body 30 is annular, but at least one of the outer shape and the opening may be polygonal if desired.

更に上部板状体40の形状は、円板状とされているが、所
望によっては多角形状としてもよく、併せて開口部を形
成する場合にあってはそれを多角形状としてもよい。
Further, the shape of the upper plate-shaped body 40 is a disk shape, but may be a polygonal shape if desired, and may be a polygonal shape when an opening is also formed.

加えて治具本体20が半筒状に形成されているが、これを
単に複数(たとえば4本)の棒体によって形成し、かつ
その内側にそれぞれウェーハ支持溝を穿設してもよい。
In addition, although the jig main body 20 is formed in a semi-cylindrical shape, it may be formed simply by a plurality of (for example, four) rods, and a wafer supporting groove may be formed inside each of them.

[発明の効果] 上述より明らかなように本発明にかかるウェーハ熱処理
用炭化珪素質治具は、半導体ウェーハを支持する治具本
体の上端部および下端部に対してそれぞれ連結された上
部板状体および下部板状体のうち少なくとも下部板状体
に対して、スリット部が穿設されてなるので、 (i)縦型熱処理炉の炉芯管に対する挿入取出に際して
炉芯管の大きな熱勾配により印加される内部熱応力を十
分に吸収緩和できる効果 を有し、ひいては (ii)熱破壊を防止し、長寿命とできる効果 を有しており、併せて (iii)輻射熱が大きく治具に対する熱的影響が大きな
石英ガラスでできた炉芯管内での長期間の使用にも十分
に耐える効果 有する。
[Advantages of the Invention] As is apparent from the above, the silicon carbide jig for wafer heat treatment according to the present invention is an upper plate-shaped body connected to the upper end and the lower end of a jig body supporting a semiconductor wafer. Since a slit is formed in at least the lower plate-shaped body of the lower plate-shaped body, (i) application by a large thermal gradient of the furnace core-tube during insertion / extraction to / from the furnace core-tube of the vertical heat treatment furnace. It has the effect of sufficiently absorbing and relaxing the internal thermal stress that is generated, which in turn has the effect of (ii) preventing thermal damage and extending the life of the jig. It has the effect of withstanding long-term use in a furnace core tube made of quartz glass, which has a great influence.

【図面の簡単な説明】[Brief description of drawings]

第1図は本発明の一実施例を示す斜視図、第2図は同部
分斜視図、第3図は同使用状態を示す斜視図、第4図は
従来例を示す斜視図である。10 ……ウェーハ熱処理用炭化珪素質治具20 ……治具本体 21a,〜,21d……突条部 22a,〜,22c……窓部 23a,〜,23d……ウェーハ支持溝 24……スリット部30 ……下部板状体 31,32……板状体 31a,32a……開口部 31b,32b,33b……スリット部 33……連結中空筒体 33a……内部中空40 ……上部板状体50 ……縦型熱処理炉 51……治具載置台 52……炉芯管 52a……下部開口部
FIG. 1 is a perspective view showing an embodiment of the present invention, FIG. 2 is a partial perspective view of the same, FIG. 3 is a perspective view showing the same usage state, and FIG. 4 is a perspective view showing a conventional example. 10 …… Silicon carbide jig for wafer heat treatment 20 …… Jig body 21a, 〜, 21d …… Protrusions 22a, 〜, 22c …… Window 23a, 〜, 23d …… Wafer support groove 24 …… Slit Part 30 ...... Lower plate-like body 31,32 …… Plate-like body 31a, 32a …… Opening 31b, 32b, 33b …… Slit part 33 …… Coupling hollow cylinder 33a …… Inner hollow 40 …… Upper plate-like body Body 50 …… Vertical heat treatment furnace 51 …… Jig stand 52 …… Furnace core tube 52a …… Lower opening

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】複数枚の半導体ウェーハを支持する治具本
体の上端部および下端部に対してそれぞれ連絡された上
部板状体および下部板状体からなる半導体ウェーハ熱処
理用炭化珪素質治具において、上記上部板状体および下
部板状体のうち少なくとも下部板状体にスリット部が穿
設されていることを特徴とする半導体ウェーハ熱処理用
炭化珪素質治具。
1. A silicon carbide jig for heat treatment of a semiconductor wafer, which comprises an upper plate and a lower plate which are respectively connected to the upper end and the lower end of a jig body for supporting a plurality of semiconductor wafers. A silicon carbide jig for heat treatment of a semiconductor wafer, wherein at least a lower plate-shaped member of the upper plate-shaped member and the lower plate-shaped member is provided with a slit portion.
JP62051725A 1987-03-06 1987-03-06 Silicon Carbide Jig for Wafer Heat Treatment Expired - Fee Related JPH06105693B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62051725A JPH06105693B2 (en) 1987-03-06 1987-03-06 Silicon Carbide Jig for Wafer Heat Treatment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62051725A JPH06105693B2 (en) 1987-03-06 1987-03-06 Silicon Carbide Jig for Wafer Heat Treatment

Related Child Applications (2)

Application Number Title Priority Date Filing Date
JP7347101A Division JPH08236469A (en) 1995-12-15 1995-12-15 Sic boat for heat-treating wafer
JP34710495A Division JP2799695B2 (en) 1995-12-15 1995-12-15 Silicon carbide boat for wafer heat treatment

Publications (2)

Publication Number Publication Date
JPS63217622A JPS63217622A (en) 1988-09-09
JPH06105693B2 true JPH06105693B2 (en) 1994-12-21

Family

ID=12894861

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62051725A Expired - Fee Related JPH06105693B2 (en) 1987-03-06 1987-03-06 Silicon Carbide Jig for Wafer Heat Treatment

Country Status (1)

Country Link
JP (1) JPH06105693B2 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6074442A (en) * 1994-10-28 2000-06-13 Shin-Etsu Handotai Co., Ltd. Method of separating slice base mounting member from wafer and jig adapted therefor
TW325588B (en) * 1996-02-28 1998-01-21 Asahi Glass Co Ltd Vertical wafer boat
JP6190156B2 (en) * 2013-05-15 2017-08-30 株式会社ブリヂストン Ceramic plate and heater unit
US10861727B2 (en) 2018-03-13 2020-12-08 Samsung Electronics Co., Ltd. Segmented vertical wafer boat

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52143760A (en) * 1976-05-26 1977-11-30 Hitachi Ltd Quartz tube in heat treatment furnace
JPS5642333A (en) * 1979-09-14 1981-04-20 Toshiba Ceramics Co Ltd Mother boat for semiconductor diffusing furnace
JPS5916800U (en) * 1982-07-20 1984-02-01 株式会社小松製作所 press machine
JPS60213022A (en) * 1984-04-09 1985-10-25 Tekunisuko:Kk Vertical supporting tool
JPS6219732B2 (en) * 1978-08-14 1987-04-30 Fuji Photo Film Co Ltd

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6219732U (en) * 1985-07-22 1987-02-05

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52143760A (en) * 1976-05-26 1977-11-30 Hitachi Ltd Quartz tube in heat treatment furnace
JPS6219732B2 (en) * 1978-08-14 1987-04-30 Fuji Photo Film Co Ltd
JPS5642333A (en) * 1979-09-14 1981-04-20 Toshiba Ceramics Co Ltd Mother boat for semiconductor diffusing furnace
JPS5916800U (en) * 1982-07-20 1984-02-01 株式会社小松製作所 press machine
JPS60213022A (en) * 1984-04-09 1985-10-25 Tekunisuko:Kk Vertical supporting tool

Also Published As

Publication number Publication date
JPS63217622A (en) 1988-09-09

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