JPH0595249A - Surface acoustic wave element - Google Patents

Surface acoustic wave element

Info

Publication number
JPH0595249A
JPH0595249A JP28033591A JP28033591A JPH0595249A JP H0595249 A JPH0595249 A JP H0595249A JP 28033591 A JP28033591 A JP 28033591A JP 28033591 A JP28033591 A JP 28033591A JP H0595249 A JPH0595249 A JP H0595249A
Authority
JP
Japan
Prior art keywords
film
electrode
sound velocity
high sound
piezoelectric
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP28033591A
Other languages
Japanese (ja)
Inventor
Katsuo Sato
勝男 佐藤
Masatoshi Nakayama
正俊 中山
Masanori Shibahara
正典 柴原
Yoshikazu Narumiya
義和 成宮
Terufumi Kamijo
輝文 上條
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TDK Corp
Original Assignee
TDK Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by TDK Corp filed Critical TDK Corp
Priority to JP28033591A priority Critical patent/JPH0595249A/en
Publication of JPH0595249A publication Critical patent/JPH0595249A/en
Withdrawn legal-status Critical Current

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  • Surface Acoustic Wave Elements And Circuit Networks Thereof (AREA)

Abstract

PURPOSE:To eliminate the need for a package by forming sequentially a 1st high sound velocity film, a piezoelectric film and a 2nd high sound velocity film onto a substrate and providing an electrode to a border between the piezoelectric film and the 1st high sound velocity film and/or between the piezoelectric film and the 2nd high sound velocity film, thereby protecting the vicinity of the electrode. CONSTITUTION:A 1st high sound velocity film 1 is formed on a silicon substrate 4 by forming a diamond carbon film whose film thickness is 1-10mum by the ion vapor-deposit method or the like. An AIN piezoelectric film 3 is formed on the film 1 by the sputter method or the like and an aluminum electrode whose film thickness is nearly 200nm is formed on the film 3 by the vacuum vapor-deposition method. The electrode is processed into a fine interdigital electrode 5 by the photo lithography method to form both the input and output electrodes to be of the same shape as a pattern whose line and space are both 1.2mum. Moreover, a 2nd high sound velocity film 2 is formed onto the film 3 and the electrode 5 similarly to the case with the film 1. Thus, the vicinity of the electrode is protected and no package is required and the cost is reduced.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】圧電体層を高音速材料でサンドウ
ィッチ状に挟むことによって、弾性波波動を固体層内部
に閉じ込めることができる構造を有する弾性表面波素子
に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a surface acoustic wave device having a structure in which a piezoelectric layer is sandwiched between high-sonic materials in a sandwich shape so that acoustic waves can be confined inside a solid layer.

【0002】[0002]

【従来の技術及び発明が解決しようとする課題】従来、
弾性波を利用したデバイスとして弾性表面波素子が知ら
れており、フィルタ、共振子、遅延線等に利用されてい
る。特に、この弾性表面波フィルタを自動車電話/携帯
電話といった移動体通信端末装置に適用することが検討
されており、かかる素子の高周波化技術の開発が盛んに
行なわれている。ところで、この素子の弾性波の伝搬方
式は、レイリーモードと呼ばれ、基板表面近傍にエネル
ギーが集中して伝搬する。このレイリーモードは基板表
面の任意の位置で信号を送受できるという特徴がある。
しかしながら、素子の基板表面が振動するために基板表
面は空気又は真空と接してなければならず、中空パッケ
ージ構造を必要としていた。また、かかるパッケージに
不良があると、長期使用中に水分等が侵入し、電極等の
表面が汚染され該素子の特性劣化を招くという欠点があ
った。さらに、パッケージングコストが高価であるとい
う問題もあった。
2. Description of the Related Art Conventionally, the problems to be solved by the invention
A surface acoustic wave element is known as a device using an acoustic wave, and is used for a filter, a resonator, a delay line, and the like. In particular, application of this surface acoustic wave filter to a mobile communication terminal device such as an automobile phone / mobile phone has been studied, and a technique for increasing the frequency of such an element has been actively developed. By the way, the elastic wave propagation method of this element is called Rayleigh mode, and energy is concentrated and propagates near the substrate surface. This Rayleigh mode is characterized in that it can send and receive signals at any position on the substrate surface.
However, in order for the substrate surface of the device to vibrate, the substrate surface must be in contact with air or vacuum, which requires a hollow package structure. Further, if such a package is defective, there is a drawback that moisture or the like penetrates during long-term use and the surfaces of electrodes and the like are contaminated, resulting in deterioration of the characteristics of the device. Further, there is a problem that the packaging cost is high.

【0003】従って、本発明の目的は、パッケージング
により生じる種々の欠点を解消する弾性表面波素子を提
供することにある。
Accordingly, it is an object of the present invention to provide a surface acoustic wave device which eliminates various drawbacks caused by packaging.

【0004】[0004]

【課題を解決するための手段】本発明者らは、上記課題
を解決するために鋭意検討、研究を重ねた結果、圧電体
層を第1及び第2の高音速材料層でサンドイッチ状に挟
んで弾性波波動を固体層中に閉じ込めることによって、
エネルギーが集中する電極近傍を保護して且つ中空パッ
ケージを不要とする弾性表面波素子を開発することに成
功した。
The inventors of the present invention have conducted extensive studies and research to solve the above-mentioned problems, and as a result, sandwiched the piezoelectric layer between the first and second high acoustic velocity material layers in a sandwich shape. By confining the elastic wave in the solid layer at
We have succeeded in developing a surface acoustic wave device that protects the vicinity of the electrode where energy is concentrated and does not require a hollow package.

【0005】すなわち、本発明は、少なくとも、基板上
に第1高音速膜、圧電膜及び第2高音速膜を順次備え、
該圧電膜と第1高音速膜との界面及び/または圧電膜と
第2高音速膜との界面に電極を備える弾性表面波素子を
提供することにある。
That is, according to the present invention, at least a first high acoustic velocity film, a piezoelectric film and a second high acoustic velocity film are sequentially provided on a substrate,
An object of the present invention is to provide a surface acoustic wave device including electrodes at the interface between the piezoelectric film and the first high acoustic velocity film and / or the interface between the piezoelectric film and the second high acoustic velocity film.

【0006】本発明の弾性表面波素子の一具体例を図1
(a)に示す。図中、素子は基板上4に、第1高音速膜
1、圧電膜3及び第2高音速膜2を順次堆積してなり、
圧電膜3と第2高音速膜2との界面にすだれ状電極5が
一定の電極指間隔で形成されている。かかる構成を採用
することにより、素子を伝搬する弾性波のエネルギー、
すなわち振動強度は、同図(b)に示すように、上記界
面に沿う軸を中心に分布して、弾性波波動は固体層中に
閉じ込められることになる。
One specific example of the surface acoustic wave device of the present invention is shown in FIG.
It shows in (a). In the figure, the element is formed by sequentially depositing a first high acoustic velocity film 1, a piezoelectric film 3 and a second high acoustic velocity film 2 on a substrate 4,
Interdigital electrodes 5 are formed at the interface between the piezoelectric film 3 and the second high acoustic velocity film 2 at a constant electrode finger interval. By adopting such a configuration, the energy of the elastic wave propagating through the element,
That is, the vibration intensity is distributed around the axis along the interface as shown in FIG. 7B, and the elastic wave is confined in the solid layer.

【0007】本発明に用いる第1及び第2高音速膜材料
としては、SiC,c−BN、ダイヤモンド状炭素膜、
単結晶ダイヤモンド膜等を利用することができるが、他
の材料より高音速が得られるという点でダイヤモンド状
炭素膜または単結晶ダイヤモンド膜が好ましい。特に、
弾性表面波素子の高周波化のために有利なAlNを圧電
体膜として用いた場合、弾性波を高音速層内に閉じ込め
るにはAlNよりさらに高音速な材料であるダイヤモン
ド状炭素及び単結晶ダイヤモンド等を用いることが要求
される。かかる高音速膜は、種々の方法で形成できる
が、ダイヤモンド状炭素膜または単結晶ダイヤモンドを
成膜する場合には、特に、平滑度の高い膜が得られると
いう理由でイオン化蒸着法が好ましい。第1及び第2の
膜の膜厚としては、それぞれ、1〜10μm程度が適当
である。
As the first and second high sound velocity film materials used in the present invention, SiC, c-BN, diamond-like carbon film,
Although a single crystal diamond film or the like can be used, a diamond-like carbon film or a single crystal diamond film is preferable in that a higher acoustic velocity can be obtained than other materials. In particular,
When AlN, which is advantageous for increasing the frequency of a surface acoustic wave device, is used as a piezoelectric film, diamond-like carbon and single crystal diamond, which are materials having a higher acoustic velocity than AlN, can be used to confine the acoustic waves in the high acoustic velocity layer Is required to be used. Such a high sonic velocity film can be formed by various methods, but when forming a diamond-like carbon film or a single crystal diamond, the ionization vapor deposition method is particularly preferable because a film having high smoothness can be obtained. About 1 to 10 μm is suitable as the thickness of each of the first and second films.

【0008】本発明で用いる圧電体材料としては、Zn
O、AlN,ZnS,LiNbO3、Pb(Zr,T
i)O3 、LiTaO3、SiO2 、Ta25 等が挙
げられるが、特にそれらに限定されない。AlNはZn
Oよりも音速を向上出来るため有利である。これらの圧
電材料は、スパッタリング、真空蒸着、CVD等の種々
の方法により形成できる。
The piezoelectric material used in the present invention is Zn
O, AlN, ZnS, LiNbO 3 , Pb (Zr, T
i) O 3 , LiTaO 3 , SiO 2 , Ta 2 O 5 and the like can be mentioned, but not limited thereto. AlN is Zn
This is advantageous because the sound velocity can be improved over O. These piezoelectric materials can be formed by various methods such as sputtering, vacuum deposition, and CVD.

【0009】本発明の素子において、図1に示したよう
に、高音速膜と圧電膜との界面に、電極を備える。界面
は基板上に形成した第1高音速膜と圧電膜との界面ある
いは圧電膜上に形成した第2の高音速膜と圧電膜との界
面のいずれでもよく両方の界面に形成することも可能で
ある。また、図2に示すように、すだれ状電極5を形成
した界面と異なる界面に、電界短絡用ベタ電極6を形成
する構成も可能である。本発明の素子に用いる電極とし
ては、アルミニウム、金等の金属を用いることができる
が、特にそれらに限定されず、本発明の目的を達成する
ことができる種々の電極材料を用いることができる。電
極層の形成には、一般に、フォトリソグラフィーやエッ
チングを用いることができ、電極の形状がすだれ状が一
般的である。
In the device of the present invention, as shown in FIG. 1, an electrode is provided at the interface between the high acoustic velocity film and the piezoelectric film. The interface may be either the interface between the first high acoustic velocity film and the piezoelectric film formed on the substrate or the interface between the second high acoustic velocity film and the piezoelectric film formed on the piezoelectric film, or both interfaces may be formed. Is. In addition, as shown in FIG. 2, it is also possible to form a solid electrode 6 for electric field short circuit at an interface different from the interface at which the interdigital electrode 5 is formed. As the electrode used in the element of the present invention, a metal such as aluminum or gold can be used, but it is not particularly limited thereto, and various electrode materials capable of achieving the object of the present invention can be used. Generally, photolithography or etching can be used to form the electrode layer, and the shape of the electrode is generally a comb shape.

【0010】本発明の弾性表面波素子に用いる基板とし
ては、アルミナ、SiC、Si34 等のセラミック
ス、Mo、W等の金属、Co、Ni、Feの少なくとも
一種を含む合金及びガラス、Si、サファイヤ、GGG
等の種々の材料を用いることができる。
The substrate used for the surface acoustic wave device of the present invention includes ceramics such as alumina, SiC and Si 3 N 4 , metals such as Mo and W, alloys and glass containing at least one of Co, Ni and Fe, and Si. , Sapphire, GGG
Various materials such as can be used.

【0011】本発明の弾性表面波素子を製造するには上
記のような基板上に、第1の高音速膜をイオンプレーテ
ィング等の方法で成膜し、次いで前記のような圧電体膜
を成膜する。この際、すだれ状電極を第1の高音速膜及
び/または圧電体膜上に適宜形成する。次いで、圧電体
膜上に、第2の高音速材料を前記のような方法で成膜し
て、電極が形成された圧電体膜を高音速材料でサンドイ
ッチ状に挟む構造を達成する。
In order to manufacture the surface acoustic wave element of the present invention, the first high acoustic velocity film is formed on the above substrate by a method such as ion plating, and then the above piezoelectric film is formed. Form a film. At this time, the interdigital transducer is appropriately formed on the first high acoustic velocity film and / or the piezoelectric film. Then, the second high acoustic velocity material is formed on the piezoelectric film by the method as described above to achieve a structure in which the piezoelectric film having electrodes is sandwiched between the high acoustic speed materials.

【0012】上記のような本発明の弾性表面波素子にお
いて、上記高音速膜及び圧電膜以外に、保護層等の任意
の層を基板上の任意の層間に挿入しまたは層上に形成す
ることも可能であり、また、上記のような第1及び第2
高音速膜と圧電膜の組み合わせを、それらが形成された
基板上に更に積層することも本発明の範囲に包含され
る。
In the surface acoustic wave device of the present invention as described above, in addition to the high acoustic velocity film and the piezoelectric film, an arbitrary layer such as a protective layer is inserted between arbitrary layers on the substrate or formed on the layer. Is also possible, and the first and second as described above are also possible.
It is also within the scope of the present invention to further laminate the combination of the high acoustic velocity film and the piezoelectric film on the substrate on which they are formed.

【0013】以下に、本発明の実施例を例示するが、本
発明はこれらに限定されるものではない。
Examples of the present invention will be illustrated below, but the present invention is not limited thereto.

【0014】[0014]

【実施例】イオン化蒸着装置を用いて、シリコン基板上
に第1のダイヤモンド状炭素皮膜を形成させた。形成条
件は以下の通りである。
Example A first diamond-like carbon film was formed on a silicon substrate by using an ionization vapor deposition device. The formation conditions are as follows.

【0015】イオン化蒸着装置にメタンガスを導入し、
ガス圧を0.1Torrとして熱陰極フィラメントに放
電を起こさせた。磁束密度400ガウス、基体電圧Va
=−300V、基体温度200℃とした。またフィラメ
ントには電流If=25Aを流した。フィラメントはコ
イル状としその幅3mm、その回りを取り囲む電極との
間隔を8mmとした。グリッドは5mm/分の速度で振
動させた。
Introducing methane gas into the ionization deposition apparatus,
A gas pressure was set to 0.1 Torr to cause discharge in the hot cathode filament. Magnetic flux density 400 gauss, substrate voltage Va
= -300V, and the substrate temperature was 200 ° C. Further, a current If = 25 A was applied to the filament. The filament was formed into a coil and had a width of 3 mm and an interval between the filament and the surrounding electrodes was 8 mm. The grid was vibrated at a speed of 5 mm / min.

【0016】次に、このダイヤモンド状炭素皮膜が形成
された基板上に、スパッタ法によりAlN圧電薄膜を形
成した。スパッタリングは、アルミニウムをターゲット
として窒素雰囲気中で行った。基板温度250℃、ガス
圧0.01Torrとした。
Next, an AlN piezoelectric thin film was formed on the substrate having the diamond-like carbon film formed thereon by a sputtering method. Sputtering was performed in a nitrogen atmosphere with aluminum as a target. The substrate temperature was 250 ° C. and the gas pressure was 0.01 Torr.

【0017】このAlN圧電薄膜上に、真空蒸着法によ
りアルミニウム電極を形成した。この際、基板温度25
0℃、到達圧力1.2×10- 6 Torrとし、形成膜
厚を200nmとした。このアルミニウム電極をフォト
リソグラフィ法により、微細すだれ状電極に加工した。
すだれ状電極は入出力電極とも同一形状にした。ライン
・スペースは、ともに1.2μmのパターンを、密着露
光技術を用いて形成した。
An aluminum electrode was formed on this AlN piezoelectric thin film by a vacuum deposition method. At this time, the substrate temperature 25
0 ° C., ultimate pressure 1.2 × 10 - and 6 Torr, the formed film thickness was 200 nm. This aluminum electrode was processed into a fine interdigital electrode by photolithography.
The interdigital electrodes have the same shape as the input / output electrodes. The line and space were formed in a pattern of 1.2 μm using a contact exposure technique.

【0018】ここで、シリコン基板を二つに分割して、
一方はそのまま評価し、もう一方にはさらに上記イオン
化蒸着法を用いて、第2のダイヤモンド状炭素皮膜を形
成した。さらに、この第2のダイヤモンド状炭素皮膜の
すだれ状電極の外部への引き出し電極パッドに相当する
位置部分をドライエッチングにより削除して接続可能と
した。
Here, the silicon substrate is divided into two,
One was evaluated as it was, and the other was further subjected to the ionization vapor deposition method to form a second diamond-like carbon film. Furthermore, the second diamond-like carbon film was removed by dry etching at the position corresponding to the lead-out electrode pad to the outside of the interdigital electrode so that connection was possible.

【0019】以上、高音速膜として第1のダイヤモンド
状炭素皮膜のみを形成した素子と、第1・第2のダイヤ
モンド状炭素皮膜で圧電膜をサンドウィッチとした素子
とを比較したところ、第1・第2のダイヤモンド状炭素
皮膜を形成した素子は、第1のダイヤモンド状炭素皮膜
のみを有する素子に較べて高い周波数で動作した。さら
に両者の表面に粘着テープを接着したところ、高音速膜
として第1のダイヤモンド状炭素皮膜のみを有する素子
は信号が大きく減衰したが、第1・第2のダイヤモンド
状炭素皮膜を形成したものは信号の減衰がなかった。
As described above, when the element in which only the first diamond-like carbon film was formed as the high acoustic velocity film and the element in which the piezoelectric film was sandwiched by the first and second diamond-like carbon films were compared, The element having the second diamond-like carbon coating formed operated at a higher frequency than the element having only the first diamond-like carbon coating. Furthermore, when an adhesive tape was adhered to both surfaces, the signal was greatly attenuated in the device having only the first diamond-like carbon film as the high acoustic velocity film, but the one having the first and second diamond-like carbon films was formed. There was no signal attenuation.

【0020】従って、本発明の素子は直接回路基板上に
接着して使用したり、あるいは中空を設けず直接樹脂等
でモールドして使用してもなんら問題なく、パッケージ
の簡素化、低コスト化が達成される。
Therefore, the device of the present invention can be used by directly adhering it to a circuit board, or by directly molding it with resin or the like without forming a hollow, and simplifying the package and reducing the cost. Is achieved.

【0021】[0021]

【発明の効果】本発明の弾性表面波素子は、弾性波振動
が固体内部に閉じ込められるので、エネルギーが集中す
る電極近傍が保護される。また、パッケージが不要とな
り、パッケージ不良に起因する欠点がなく、コスト面で
も有利である。
In the surface acoustic wave device of the present invention, since the elastic wave vibration is confined inside the solid, the vicinity of the electrode where the energy is concentrated is protected. Further, the package is not required, there is no defect caused by defective packaging, and it is advantageous in terms of cost.

【図面の簡単な説明】[Brief description of drawings]

【図1】図1(a)は本発明の弾性表面波素子の一例を
示す図である。同図(b)は、同図(a)の素子を伝搬
する弾性波の縦方向座標に関する振動強度分布を示すグ
ラフである。
FIG. 1A is a diagram showing an example of a surface acoustic wave device of the present invention. FIG. 2B is a graph showing the vibration intensity distribution regarding the longitudinal coordinate of the elastic wave propagating through the element of FIG.

【図2】図2は、すだれ状電極を形成した界面とは異な
る界面に電極短絡用ベタ電極を形成した本発明の弾性表
面波素子の一具体例を示す図である。
FIG. 2 is a diagram showing a specific example of the surface acoustic wave device of the present invention in which a solid electrode for electrode short circuit is formed on an interface different from the interface on which the interdigital electrode is formed.

【符号の説明】[Explanation of symbols]

1 第1高音速膜 2 第2高音速膜 3 圧電膜 4 基板 5 すだれ状電極 6 ベタ電極 1 1st high sonic velocity film 2 2nd high sonic velocity film 3 Piezoelectric film 4 Substrate 5 Interdigital electrode 6 Solid electrode

───────────────────────────────────────────────────── フロントページの続き (72)発明者 成宮 義和 東京都中央区日本橋一丁目13番1号テイー デイーケイ株式会社内 (72)発明者 上條 輝文 東京都中央区日本橋一丁目13番1号テイー デイーケイ株式会社内 ─────────────────────────────────────────────────── ─── Continued Front Page (72) Inventor Yoshikazu Narimiya 1-13-1 Nihonbashi, Chuo-ku, Tokyo TDK Corporation (72) Terufumi Kamijo 1-13-11-1 Nihonbashi, Chuo-ku, Tokyo TDK Within the corporation

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 基板上に、少なくとも、第1高音速膜、
圧電膜及び第2高音速膜を順次備え、該圧電膜と第1高
音速膜との界面及び/または圧電膜と第2高音速膜との
界面に電極を備える弾性表面波素子。
1. A substrate having at least a first high acoustic velocity film,
A surface acoustic wave device comprising a piezoelectric film and a second high acoustic velocity film sequentially, and electrodes provided at the interface between the piezoelectric film and the first high acoustic velocity film and / or at the interface between the piezoelectric film and the second high acoustic velocity film.
【請求項2】 上記高音速膜の少なくとも一つがダイヤ
モンド状炭素膜または単結晶ダイヤモンド膜である請求
項1の弾性表面波素子。
2. The surface acoustic wave device according to claim 1, wherein at least one of the high acoustic velocity films is a diamond-like carbon film or a single crystal diamond film.
JP28033591A 1991-10-02 1991-10-02 Surface acoustic wave element Withdrawn JPH0595249A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP28033591A JPH0595249A (en) 1991-10-02 1991-10-02 Surface acoustic wave element

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Application Number Priority Date Filing Date Title
JP28033591A JPH0595249A (en) 1991-10-02 1991-10-02 Surface acoustic wave element

Publications (1)

Publication Number Publication Date
JPH0595249A true JPH0595249A (en) 1993-04-16

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Family Applications (1)

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Country Link
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Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08130439A (en) * 1994-11-01 1996-05-21 Agency Of Ind Science & Technol High-speed surface acoustic wave element
US5838089A (en) * 1997-02-18 1998-11-17 Kobe Steel Usa Inc. Acoustic wave devices on diamond with an interlayer
US6222299B1 (en) * 1998-02-09 2001-04-24 Lucent Technologies Inc. Surface acoustic wave devices comprising large-grained diamonds and methods for making
US7522020B2 (en) 2005-07-14 2009-04-21 Murata Manufacturing Co., Ltd. Boundary acoustic wave device and method for manufacturing boundary acoustic wave device
US8049395B2 (en) 2006-12-25 2011-11-01 Murata Manufacturing Co., Ltd. Boundary acoustic wave device
US20120038244A1 (en) * 2010-08-16 2012-02-16 Seiko Epson Corporation Piezoelectric vibration device, method of manufacturing the same, and method of adjusting resonant frequency
GB2576391A (en) * 2018-04-18 2020-02-19 Skyworks Solutions Inc Acoustic wave device with multi-layer piezoelectric substrate

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08130439A (en) * 1994-11-01 1996-05-21 Agency Of Ind Science & Technol High-speed surface acoustic wave element
US5838089A (en) * 1997-02-18 1998-11-17 Kobe Steel Usa Inc. Acoustic wave devices on diamond with an interlayer
US6222299B1 (en) * 1998-02-09 2001-04-24 Lucent Technologies Inc. Surface acoustic wave devices comprising large-grained diamonds and methods for making
US7522020B2 (en) 2005-07-14 2009-04-21 Murata Manufacturing Co., Ltd. Boundary acoustic wave device and method for manufacturing boundary acoustic wave device
US8049395B2 (en) 2006-12-25 2011-11-01 Murata Manufacturing Co., Ltd. Boundary acoustic wave device
US20120038244A1 (en) * 2010-08-16 2012-02-16 Seiko Epson Corporation Piezoelectric vibration device, method of manufacturing the same, and method of adjusting resonant frequency
GB2576391A (en) * 2018-04-18 2020-02-19 Skyworks Solutions Inc Acoustic wave device with multi-layer piezoelectric substrate
US11616487B2 (en) 2018-04-18 2023-03-28 Skyworks Solutions, Inc. Acoustic wave devices on stacked die
GB2576391B (en) * 2018-04-18 2023-04-05 Skyworks Solutions Inc Acoustic wave device with multi-layer piezoelectric substrate
US11689178B2 (en) 2018-04-18 2023-06-27 Skyworks Solutions, Inc. Acoustic wave device with multi-layer piezoelectric substrate
US11894828B2 (en) 2018-04-18 2024-02-06 Skyworks Solutions, Inc. Boundary acoustic wave device

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