JPH0587857A - Two-terminal circuit element measuring device equipped with contact check function - Google Patents

Two-terminal circuit element measuring device equipped with contact check function

Info

Publication number
JPH0587857A
JPH0587857A JP3274817A JP27481791A JPH0587857A JP H0587857 A JPH0587857 A JP H0587857A JP 3274817 A JP3274817 A JP 3274817A JP 27481791 A JP27481791 A JP 27481791A JP H0587857 A JPH0587857 A JP H0587857A
Authority
JP
Japan
Prior art keywords
conductor
measuring device
voltage
ammeter
dut
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3274817A
Other languages
Japanese (ja)
Other versions
JP3155310B2 (en
Inventor
Hideki Wakamatsu
秀樹 若松
Nobuo Nakada
信夫 中田
Yoichi Kuboyama
洋一 久保山
Hideji Tanaka
秀司 田中
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hewlett Packard Japan Inc
Original Assignee
Yokogawa Hewlett Packard Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Hewlett Packard Ltd filed Critical Yokogawa Hewlett Packard Ltd
Priority to JP27481791A priority Critical patent/JP3155310B2/en
Priority to GB9220267A priority patent/GB2259992B/en
Priority to US08/001,851 priority patent/US5321363A/en
Publication of JPH0587857A publication Critical patent/JPH0587857A/en
Application granted granted Critical
Publication of JP3155310B2 publication Critical patent/JP3155310B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/66Testing of connections, e.g. of plugs or non-disconnectable joints

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

PURPOSE:To detect the connection disorder at the measurement terminal of a DUT with high precision and measure the DUT impedance with high precision. CONSTITUTION:A dc current flows into a DUT 6 from a dc voltage source 3, and the dc current is detected by an ammeter 12. Further, an ac current flows into the DUT 6 from an ac voltage source 23, and the ac current is measured by an ammeter 22, and the response voltage of the DUT 6 is measured by a voltmeter 24. An ideal opened state can be obtained, and the measurement value of the ac ammeter 22 can be reduced to zero. When each measurement value of the dc ammeter 12 and the ac ammeter 22 is substantially zero, the connection trouble of the DUT 6 is detected surely, and when the measurement value of the dc ammeter 12 is substantially zero, and the measurement value of the ac ammeter 22 is not substantially zero, it is judged that the connection of the DUT 6 is normal, and the impedance of the DUT 6 is measured from the measurement value of the ac ammeter 22 and the measurement value of the ac voltmeter 23.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、コンタクトチェック機
能付二端子回路素子測定装置に関し、コンタクトチェッ
クと同時に試料(被測定対象)の絶縁抵抗を検査すると
共に、該試料の静電容量をケーブルの接続変更なしに測
定できる上記測定装置に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a two-terminal circuit element measuring device with a contact check function, which simultaneously inspects the insulation resistance of a sample (object to be measured) at the same time as the contact check and determines the electrostatic capacitance of the sample of the cable. The present invention relates to the above-mentioned measuring device capable of measuring without changing the connection.

【0002】[0002]

【技術背景】絶縁抵抗計の代表的用途にコンデンサの絶
縁抵抗の検査がある。この検査においては、試料の絶縁
抵抗が高い程良品とされる。したがって、試料が計器と
の接続部分で接触不良を起こしている場合、該試料が絶
縁不良品であっても良品と判断されてしまう。すなわ
ち、従来、試料が正常に計器に接続されているか否か
を、測定値から認識(コンタクトチェック)することが
できないという不都合があり、特に自動検査工程におい
て特に問題となる。ところで、試料がコンデンサである
場合には、交流的には低いインピーダンスを示すので、
直流を用いて該コンデンサの絶縁抵抗を測定すると共
に、交流を用いて該コンデンサの高周波インピーダンス
を測定すれば、接触状態の良否、すなわち、絶縁抵抗の
測定が有効であるか否かが判断できる。
BACKGROUND OF THE INVENTION A typical application of an insulation resistance tester is to inspect the insulation resistance of a capacitor. In this inspection, the higher the insulation resistance of the sample, the better. Therefore, when the sample has a contact failure at the connection portion with the instrument, it is judged as a non-defective product even if the sample is a defective insulation product. That is, conventionally, there is a disadvantage that it is not possible to recognize (contact check) from the measured value whether or not the sample is normally connected to the instrument, which is a problem particularly in the automatic inspection process. By the way, when the sample is a capacitor, it exhibits a low impedance in terms of alternating current,
If the insulation resistance of the capacitor is measured using direct current and the high frequency impedance of the capacitor is measured using alternating current, it is possible to determine whether the contact state is good or bad, that is, whether the measurement of the insulation resistance is effective.

【0003】絶縁抵抗計は、一般に図3に示すように、
計器本体1と延長ケーブル5とから構成されている。計
器本体1はシールドした外被11に一方の入力端子が接
続された直流電流計12と、該シールド外被11,大地
間に直流高電圧を印加する直流電圧源13とから構成さ
れている。また、延長ケーブル5は、中心導体を構成す
る第1導体,該第1導体を被覆する第2導体,該第2導
体を更に被覆する第3導体により構成されている。上記
ケーブル5の一端側において、第1導体は前記直流電流
計12の他方の入力端子に、第2導体は外被11にそれ
ぞれ接続され、第3導体は接地され、上記ケーブル5の
他端側の第1,第3導体の試料接続用端子a,bには、
試料6(容量Cと抵抗RDCの並列回路)が接続されてい
る。
An insulation resistance meter generally has a structure as shown in FIG.
It is composed of an instrument body 1 and an extension cable 5. The instrument main body 1 is composed of a DC ammeter 12 in which one input terminal is connected to a shielded jacket 11, and a DC voltage source 13 for applying a DC high voltage between the shield jacket 11 and the ground. The extension cable 5 is composed of a first conductor that constitutes the central conductor, a second conductor that covers the first conductor, and a third conductor that further covers the second conductor. On one end side of the cable 5, the first conductor is connected to the other input terminal of the DC ammeter 12, the second conductor is connected to the jacket 11, the third conductor is grounded, and the other end side of the cable 5 is connected. The sample connection terminals a and b of the first and third conductors of
Sample 6 (parallel circuit of capacitance C and resistance R DC ) is connected.

【0004】ところで、自動検査工程においては、通
常、試料が所定の特性を有するか否かをも検査するため
に、インピーダンス測定が上記検査と併せて行われる。
インピーダンス測定では、試料(すなわち被測定対象、
以下試料及び被測定対象をDUTと言う)と測定装置と
の間に距離があるときには、測定端子のケーブルの延長
(1〜2〔m〕)が必要とされるし、またDUTを片線
接地した状態で測定しなければならない場合も生ずる。
このため、該測定に際しては以下の要件を具備する必要
がある。 (1)ケーブルの延長にかかわらず、DUTの接続によ
って生ずる静電容量の増加を安定に判別できること。 (2)交流的に片線接地のDUTを測定できること。 (3)直流抵抗を測定するための電流パスが外部電磁界
等から影響を受けないこと、またこれと逆に該電流パス
が外部に電磁的な影響を与えないこと。 (4)インピーダンス測定用に新たにケーブルを増設す
る必要がないこと。 しかし、従来のインピーダンス測定装置(図5にその一
例を示す)では、(1)の条件は満たすものの、以下の
問題がある。すなわち、高インピーダンスDUT用の測
定回路では、片線接地DUTを接続することが回路的に
不可能であり、上記(2)の条件を満たさない。また、
片線接地されるべきDUTの接地側端子を大地から浮か
して測定すると外部電磁界からの影響が顕著となり大幅
な精度劣化が生じ、上記(3)の条件を満たさない。更
に、2本の同軸ケーブルを使用した一端子トリオ測定装
置を使用しているのでケーブルを別途増設する必要あ
り、上記(4)の条件を満たさない。
By the way, in the automatic inspection process, impedance measurement is usually performed together with the above-described inspection in order to inspect whether or not the sample has a predetermined characteristic.
In impedance measurement, the sample (that is, the measured object,
When the distance between the sample and the object to be measured is called DUT) and the measuring device is long, the cable of the measuring terminal needs to be extended (1 to 2 [m]), and the DUT is grounded by one wire. There are also cases where the measurement must be performed in the above condition.
Therefore, it is necessary to meet the following requirements for the measurement. (1) The increase in capacitance caused by the connection of the DUT can be stably determined regardless of the extension of the cable. (2) Being able to measure a one-wire grounded DUT AC. (3) The current path for measuring the DC resistance is not affected by an external electromagnetic field or the like, and conversely, the current path does not have an external electromagnetic effect. (4) There is no need to add a new cable for impedance measurement. However, the conventional impedance measuring device (one example of which is shown in FIG. 5) satisfies the condition (1) but has the following problems. That is, in the measurement circuit for the high impedance DUT, it is impossible to connect the one-wire grounded DUT in terms of the circuit, and the condition (2) is not satisfied. Also,
When the ground side terminal of the DUT, which should be grounded with one wire, is floated from the ground and measured, the influence from the external electromagnetic field becomes remarkable and the accuracy is greatly deteriorated, and the condition (3) is not satisfied. Further, since the one-terminal trio measuring device using two coaxial cables is used, it is necessary to add another cable, and the condition (4) above is not satisfied.

【0005】[0005]

【発明の目的】本発明は、上記のような問題を解決する
ために提案されたものあって、部品自動送り装置を用い
て検査をする場合等において、一の装置により、DUT
の測定端子における接続不良を高精度で検知すると共
に、DUTのインピーダンス測定を同じく高精度で行う
ことができるコンタクトチェック機能付二端子回路素子
測定装置を提供することを目的とする。
SUMMARY OF THE INVENTION The present invention has been proposed in order to solve the above problems, and in the case of inspecting using an automatic component feeder, the DUT can be used by one device.
It is an object of the present invention to provide a two-terminal circuit element measuring device with a contact check function, which can detect a connection failure at the measuring terminal with high accuracy and can also perform impedance measurement of the DUT with high accuracy.

【0006】[0006]

【発明の概要】発明者等は、別途提案の「一端子トリ
オ,二端子トリオ測定装置」における一端子トリオ測定
装置の構成が、上記図3に示した絶縁抵抗計の構成と極
めて類似しており、この測定装置が、上記(1)〜
(4)の条件を全て満足していることに着目した。そし
て、以下のように構成することで、上記したコンタクト
チェック機能を無理なく付加できるとの結論を得た。す
なわち、本発明の装置は、測定装置本体内に、第1,第
2導体と、接地状態の第3導体との間に交流信号を印加
する交流電圧信号源と、同じく第1,第2導体と前記第
3導体との間に直流信号を印加する直流電圧信号源と、
上記交流電圧信号源がDUTに印加する交流電圧値を測
定する交流電圧測定器と、上記直流電圧信号源がDUT
に注入する直流電流値を測定する直流電流測定器と、上
記交流電圧信号源がDUTに注入する交流電流を測定す
る交流電流測定器とを有してなることを特徴とする。ま
た、前記交流電圧信号源が、交流電圧源と3線同軸ケー
ブルの第1,第2導体に挿着されたフェライトコアトラ
ンスとにより構成されて成り、該交流電圧源の一端が3
線同軸ケーブルの第3導体に接続され、該フェライトコ
アトランスの駆動巻線の一方端が前記交流電圧源の他端
に、他方端が前記第3導体にそれぞれ接続され、前記直
流電圧測定器がインダクタと直流電流計との直列接続に
より、前記交流電圧測定器がコンデンサと交流電流計と
の直列接続によりそれぞれ構成され、これらが第1,第
2導体間に並列接続されて成ることをも特徴とする。
SUMMARY OF THE INVENTION The inventors have found that the configuration of the one-terminal trio measuring device in the separately proposed “one-terminal trio, two-terminal trio measuring device” is very similar to that of the insulation resistance meter shown in FIG. This measuring device is based on the above (1)-
We paid attention to the fact that all the conditions of (4) are satisfied. Then, it was concluded that the above-mentioned contact check function can be reasonably added by configuring as follows. That is, the device of the present invention includes an AC voltage signal source for applying an AC signal between the first and second conductors and the grounded third conductor in the measuring device body, and also the first and second conductors. And a DC voltage signal source for applying a DC signal between the third conductor and the third conductor,
An AC voltage measuring device for measuring an AC voltage value applied to the DUT by the AC voltage signal source, and the DC voltage signal source being a DUT.
And a direct current measuring device for measuring a direct current value injected into the DUT, and an alternating current measuring device for measuring an alternating current injected into the DUT by the alternating voltage signal source. The AC voltage signal source is composed of an AC voltage source and a ferrite core transformer inserted in the first and second conductors of a three-wire coaxial cable, and one end of the AC voltage source is 3
The DC voltage measuring device is connected to the third conductor of the wire coaxial cable, one end of the drive winding of the ferrite core transformer is connected to the other end of the AC voltage source, and the other end is connected to the third conductor. It is also characterized in that the inductor and the DC ammeter are connected in series, and the AC voltage measuring device is configured by connecting the capacitor and the AC ammeter in series, respectively, and these are connected in parallel between the first and second conductors. And

【0007】以下、前記した図3の絶縁抵抗計及び図4
に示す別途提案の一端子トリオ測定装置を参照しつつ、
本発明の理論及び作用を説明する。上記別途提案に係る
一端子トリオ測定装置は高インピーダンスDUT測定用
であり、図4に示すように測定装置本体2と3線同軸ケ
ーブル5とから構成されている。そして、測定装置本体
2は、上記絶縁抵抗計の場合と概ね同様、図3の直流電
流計12に対応する交流電流計22、図3の直流電圧源
13に対応する交流電圧源23,交流電圧計24の並列
接続から成る回路により構成されている。同図において
は、図3の試料に代えてインピーダンスZxが接続され
ている。従って、図3の絶縁抵抗計と図4の一端子トリ
オ測定装置を干渉を生じさせることなく組み合わせれ
ば、上記目的は達成できることになる。
Hereinafter, the insulation resistance meter of FIG. 3 and FIG.
While referring to the separately proposed one-terminal trio measurement device shown in
The theory and operation of the present invention will be described. The separately proposed one-terminal trio measuring device is for measuring a high impedance DUT, and is composed of a measuring device main body 2 and a three-wire coaxial cable 5 as shown in FIG. The measuring device main body 2 is similar to the case of the insulation resistance meter, and the AC ammeter 22 corresponding to the DC ammeter 12 in FIG. 3, the AC voltage source 23 corresponding to the DC voltage source 13 in FIG. The circuit is composed of a total of 24 parallel connections. In the figure, an impedance Zx is connected instead of the sample of FIG. Therefore, the above object can be achieved by combining the insulation resistance meter of FIG. 3 and the one-terminal trio measuring device of FIG. 4 without causing interference.

【0008】図1は上記組合せの一例(すなわち、本発
明装置の一態様)を示しており、図3,図4の場合と同
様、測定装置本体3には3線同軸ケーブル5の一端が接
続され、他端の第1,第3導体間には容量Cと抵抗RDC
との並列接続で示されるDUT6が接続されている。ま
た、図3,図4の電流計12,22の接続部位にこれら
の直列接続が、同じく直流電圧源13の接続部位、交流
電圧源23と交流電圧計24との並列回路の接続部位
に、該直流電圧源13と該並列回路が直列接続がそれぞ
れ配置されている。図1において、直流,交流電流計1
2,22、交流電圧計24及び直流,交流電圧源13,
23は、本発明の直流,交流電流測定器、交流電圧測定
手器及び直流,交流電圧信号源に対応している。なお、
本発明は、図1に示した回路接続に限定されるものでは
なく、例えば、直流電流測定器として直流電流計とイン
ダクタの直列接続回路を、交流電流測定器としてコンデ
ンサと交流電流計との直列接続回路をそれぞれ用い、こ
れらの回路を並列接続して第1,第2導体間に接続して
直流,交流電流を測定するようにしてもよい。また、交
流電圧信号源として、第1,第2導体に挿通したフェラ
イトコアトランスを用い、該フェライトコアトランスを
介して交流電圧を第1,第2導体と第3導体との間に印
加することにしてもよい。図1の回路においては、直流
電圧源13から直流電流がDUT6に注入され、この直
流電流は電流計12により検出される。また、交流電圧
源23から交流電流がDUT6に注入され、この交流電
流が電流計22により、DUT6の応答電圧が電圧計2
4により測定される。
FIG. 1 shows an example of the above combination (that is, one aspect of the device of the present invention). As in the case of FIGS. 3 and 4, one end of a three-wire coaxial cable 5 is connected to the measuring device main body 3. The capacitance C and the resistance R DC are provided between the first and third conductors at the other end.
The DUT 6 shown in parallel connection with is connected. In addition, these series connections are connected to the connection parts of the ammeters 12 and 22 of FIGS. 3 and 4 similarly to the connection part of the DC voltage source 13 and the connection part of the parallel circuit of the AC voltage source 23 and the AC voltmeter 24. The DC voltage source 13 and the parallel circuit are connected in series. In FIG. 1, a DC / AC ammeter 1
2, 22, AC voltmeter 24 and DC, AC voltage source 13,
Reference numeral 23 corresponds to the DC / AC current measuring device, AC voltage measuring hand device and DC / AC voltage signal source of the present invention. In addition,
The present invention is not limited to the circuit connection shown in FIG. 1. For example, a series connection circuit of a direct current ammeter and an inductor is used as a direct current measuring instrument, and a series connection of a capacitor and an alternating current ammeter is used as an alternating current measuring instrument. You may make it measure a direct current and an alternating current by connecting these circuits in parallel and connecting between the 1st, 2nd conductors, respectively using a connection circuit. Further, a ferrite core transformer inserted through the first and second conductors is used as an AC voltage signal source, and an AC voltage is applied between the first, second conductor and third conductor via the ferrite core transformer. You can In the circuit of FIG. 1, a DC current is injected from the DC voltage source 13 into the DUT 6, and this DC current is detected by the ammeter 12. An alternating current is injected from the alternating voltage source 23 into the DUT 6, and the alternating current is measured by the ammeter 22 so that the response voltage of the DUT 6 is measured by the voltmeter 2.
4 is measured.

【0009】また、本発明の装置では、理想開放状態を
得ることができ、非接地の第1導体は、同電位の第2導
体によりリークガードされているので、交流電流計22
の計量値を0にすることができる。そして、直流電流計
12,交流電流計22の計量値が共に実質上0である場
合には、確実にDUT6の接続が不良であることが検知
され、直流電流計12の計量値が実質上0で、交流電流
計22の計量値が実質上0でない場合にはDUT6の接
続は正常であるので、該交流電流計22の計量値と交流
電圧計23の計量値とからDUT6のインピーダンス
(実質上、コンデンサCのキャパシタンス)が測定され
る。なお、上記理想開放状態を得ることができない従来
の測定装置では、DUT6の接続不良が生じ該DUT6
に電流が流れない場合には、直流電流計12の計量値が
0となるが、交流電流計22の計量値は必ずしも0にな
るとは限らない。したがって、真に接続不良が生じてい
るのか、DUT6が高インピーダンスとなっているか否
かの判別をすることができない。
Further, in the device of the present invention, the ideal open state can be obtained, and the ungrounded first conductor is leak-guarded by the second conductor having the same potential.
Can be set to 0. When the measured values of the DC ammeter 12 and the AC ammeter 22 are both substantially 0, it is surely detected that the connection of the DUT 6 is defective, and the measured value of the DC ammeter 12 is substantially 0. When the measured value of the AC ammeter 22 is not substantially 0, the connection of the DUT 6 is normal. Therefore, from the measured value of the AC ammeter 22 and the measured value of the AC voltmeter 23, the impedance of the DUT 6 (substantially , The capacitance of the capacitor C) is measured. It should be noted that in the conventional measuring device that cannot obtain the ideal open state, a connection failure of the DUT 6 occurs and the DUT 6 is not connected.
When no current flows, the DC ampere meter 12 has a measured value of 0, but the AC ammeter 22 does not necessarily have a measured value of 0. Therefore, it is not possible to determine whether the connection is truly bad or whether the DUT 6 has a high impedance.

【0010】[0010]

【実施例】以下、本発明の測定装置の一実施例を図2
(A),(B)により説明する。同図(A)において、
測定装置本体4には、3線同軸ケーブル5の一端が接続
され、このケーブル5の他端の第1及び接地された第3
導体はDUT測定端子a,bを有しており、これらの端
子a,b間にDUT(コンデンサCと絶縁抵抗RDCとの
並列回路で示す)6が接続されている。そして、3線同
軸ケーブルの第1,第2導体にフェライトコアトランス
41が挿着されており、このトランス41に巻回された
駆動巻線の一方端は交流電圧源23に、他方端はケーブ
ル5の第3導体にそれぞれ大地を介して接続されてい
る。なお、本実施例では、このトランス41と交流電圧
源23が本発明における交流電圧信号源を構成してい
る。上記交流電圧源23には、交流電圧測定器(図2
(A)では交流電圧計24)が並列接続されており、こ
れが交流電圧源23がトランス41を介してDUT6に
印加する交流電圧を測定する。図2(B)は上記トラン
ス41の等価回路を示しており、第1導体,第2導体,
駆動巻線が3巻線トランスを形成している様子を示して
いる。本実施例では、第1,第2導体をトランス41に
より同時駆動することで、グランド浮上のための回路を
別途設ける必要がない。
EXAMPLE An example of the measuring apparatus of the present invention is shown in FIG.
This will be described with reference to (A) and (B). In FIG.
One end of a three-wire coaxial cable 5 is connected to the measuring device main body 4, and the first end of the other end of the cable 5 and the grounded third
The conductor has DUT measurement terminals a and b, and a DUT (shown by a parallel circuit of a capacitor C and an insulation resistance R DC ) 6 is connected between these terminals a and b. A ferrite core transformer 41 is attached to the first and second conductors of the three-wire coaxial cable. One end of the drive winding wound around the transformer 41 is the AC voltage source 23 and the other end is the cable. The third conductor 5 is connected to the third conductor via the ground. In this embodiment, the transformer 41 and the AC voltage source 23 form the AC voltage signal source of the present invention. The AC voltage source 23 includes an AC voltage measuring device (see FIG. 2).
In (A), an AC voltmeter 24) is connected in parallel, which measures the AC voltage applied to the DUT 6 by the AC voltage source 23 via the transformer 41. FIG. 2B shows an equivalent circuit of the transformer 41, which includes a first conductor, a second conductor,
It shows that the drive winding forms a three-winding transformer. In this embodiment, the first and second conductors are simultaneously driven by the transformer 41, so that it is not necessary to separately provide a circuit for floating the ground.

【0011】また、交流電圧源23の周波数を数百kH
z以上にすれば、フェライトコアに1〜3ターンの同軸
線を巻回するだけで、数十Ωの励磁インピーダンスを持
つ小型トランスを容易に構成できる。そして、ケーブル
5の第1,第2導体と前記第3導体との間には、直流電
圧信号源(同図では直流電圧源13)が接続され、同じ
く第1,第2導体間には、インダクタ7と微小電流用直
流電流計12との直列接続により構成される直流電流測
定器と、コンデンサ8と交流電流計22との直列接続に
より構成される交流電流測定器との並列回路が接続され
ている。ここで、インダクタ7のインダクタンスは測定
周波数における測定回路のインピーダンスよりもインピ
ーダンスが十分大きくなるように設定してあり、またコ
ンデンサ8のキャパシタンスは測定回路のインピーダン
スよりもインピーダンスが十分小さくなるように設定し
てある。
Further, the frequency of the AC voltage source 23 is set to several hundreds kH.
With z or more, a small transformer having an exciting impedance of several tens of Ω can be easily constructed by winding a coaxial wire of 1 to 3 turns around a ferrite core. A DC voltage signal source (DC voltage source 13 in the figure) is connected between the first and second conductors of the cable 5 and the third conductor, and between the first and second conductors, A parallel circuit of a direct current measuring device formed by connecting the inductor 7 and the direct current ammeter 12 for small current in series and an alternating current measuring device formed by connecting a capacitor 8 and an alternating current ammeter 22 in series is connected. ing. Here, the inductance of the inductor 7 is set to be sufficiently larger than the impedance of the measuring circuit at the measuring frequency, and the capacitance of the capacitor 8 is set to be sufficiently smaller than the impedance of the measuring circuit. There is.

【0012】以下、図2(A)の測定装置の動作を説明
する。測定端子a,bには直流電圧が直流電圧源13に
より、所定周波数の交流電圧がフェライトコアトランス
41を介して交流電圧源23によりそれぞれ印加され、
端子a,b間には直流電圧と交流電圧との重畳電圧が印
加される。交流電流計22に、実質0以外の計量値が現
れている場合には、端子a,bとDUT6との接続は正
常であると判断される。そして、直流電流計12の計量
値に応じてDUT6の良否等が判断(すなわち、該計量
値が小さい程良品と判断)されると共に、交流電圧計2
4と交流電流計22との計量値からDUT6のインピー
ダンスが測定される。一方、直流電流計12,交流電流
計22の計量値が共に実質0である場合には、端子a,
bの接触が異常であると判断され、該DUT6には再度
の検査,測定が行われる。
The operation of the measuring apparatus of FIG. 2A will be described below. A DC voltage is applied to the measurement terminals a and b by the DC voltage source 13, and an AC voltage of a predetermined frequency is applied by the AC voltage source 23 via the ferrite core transformer 41.
A superimposed voltage of a DC voltage and an AC voltage is applied between the terminals a and b. When a measured value other than substantially 0 appears on the AC ammeter 22, it is determined that the connection between the terminals a and b and the DUT 6 is normal. Then, the quality of the DUT 6 is judged according to the measured value of the DC ammeter 12 (that is, the smaller the measured value, the better the product), and the AC voltmeter 2
The impedance of the DUT 6 is measured from the measured values of 4 and the AC ammeter 22. On the other hand, when the measured values of the DC ammeter 12 and the AC ammeter 22 are both substantially 0, the terminal a,
It is determined that the contact of b is abnormal, and the DUT 6 is again inspected and measured.

【0013】[0013]

【発明の効果】以上述べたように、本発明によれば、以
下の効果を奏することができる。 (1)特に、自動検査工程において、コンタクトチェッ
クを確実に行うことができるとともに、ケーブルを別途
増設することなしに、DUTの絶縁抵抗検査,インピー
ダンス測定を行うことができる。 (2)3線同軸ケーブルの第3導体は接地されているの
で、絶縁検査,インピーダンス測定の際に外部電磁界の
影響を受けない。したがって、ケーブルの延長によるイ
ンピーダンス測定の精度低下を招来しない。また、DU
Tが片線接地状態にある場合でも、絶縁抵抗検査,イン
ピーダンス測定を高精度で行うことができる。 (3)また、理想開放状態が可能であるので、ケーブル
延長にかかわらずDUTの接続によって生ずる静電容量
の増加を安定に判別できる。 (4)フェライトコアトランスを第1,第2導体に挿通
した装置では、低周波ノイズが直流電流計に注入されな
い(すなわち、直流電流測定のための電流パスに影響を
受けない)ので、絶縁抵抗検査の精度,コンタクトチェ
ックの精度が向上する。また、直流電流測定系の共通接
地点を浮上させるための回路を別途設けるという不都合
もない。 逆に、この装置では直流電流測定のための電流パスによ
り、インピーダンス測定系が影響を受けることもないの
で、インピーダンス測定の精度劣化も生じない。
As described above, according to the present invention, the following effects can be obtained. (1) In particular, in the automatic inspection process, the contact check can be reliably performed, and the insulation resistance test and impedance measurement of the DUT can be performed without separately adding a cable. (2) Since the third conductor of the three-wire coaxial cable is grounded, it is not affected by the external electromagnetic field during insulation inspection and impedance measurement. Therefore, the accuracy of impedance measurement does not deteriorate due to the extension of the cable. Also, DU
Even when T is in the one-wire grounded state, the insulation resistance test and the impedance measurement can be performed with high accuracy. (3) Further, since the ideal open state is possible, it is possible to stably determine the increase in electrostatic capacitance caused by the connection of the DUT regardless of the cable extension. (4) In the device in which the ferrite core transformer is inserted through the first and second conductors, low frequency noise is not injected into the DC ammeter (that is, the current path for measuring the DC current is not affected), so the insulation resistance Inspection accuracy and contact check accuracy are improved. Further, there is no inconvenience of separately providing a circuit for levitating the common ground point of the DC current measuring system. On the contrary, in this device, the impedance measurement system is not affected by the current path for measuring the direct current, so that the accuracy of impedance measurement does not deteriorate.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明装置の測定原理を例示する回路図であ
る。
FIG. 1 is a circuit diagram illustrating the measurement principle of the device of the present invention.

【図2】(A)は図1の回路に基づく一実施例を示す回
路図、(B)は(A)におけるフェライトコアトランス
の等価回路図である。
2A is a circuit diagram showing an embodiment based on the circuit of FIG. 1, and FIG. 2B is an equivalent circuit diagram of the ferrite core transformer in FIG.

【図3】従来の絶縁抵抗計を示す回路図である。FIG. 3 is a circuit diagram showing a conventional insulation resistance meter.

【図4】別途出願にかかる高インピーダンス用の一端子
トリオ測定装置を示す回路図である。
FIG. 4 is a circuit diagram showing a high-impedance one-terminal trio measurement device according to another application.

【符号の説明】[Explanation of symbols]

3,4 測定装置本体 5 3線同軸ケーブル 6 DUT 7 インダクタ 8 コンデンサ 12 直流電流計 13 直流電圧源 22 交流電流計 23 交流電圧源 24 交流電圧計 41 フェライトコアトランス 3, 4 Measuring device body 5 3-wire coaxial cable 6 DUT 7 Inductor 8 Capacitor 12 DC ammeter 13 DC voltage source 22 AC ammeter 23 AC voltage source 24 AC voltmeter 41 Ferrite core transformer

フロントページの続き (72)発明者 田中 秀司 東京都八王子市高倉町9番1号 横河・ヒ ユーレツト・パツカード株式会社内Front page continuation (72) Inventor Shuji Tanaka 9-1 Takakura-cho, Hachioji-shi, Tokyo Yokogawa / Hi-Yuret / Patsu Card Co., Ltd.

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 測定装置本体に、中心導体である第1導
体と、該第1導体を被覆する第2導体と、該第2導体を
更に被覆する第3導体とから成る3線同軸ケーブルの一
端が接続され、該ケーブル他端の第1及び第3導体に被
測定対象接続端子を有する測定装置であって、 前記測定装置本体内に、第1,第2導体と、接地状態の
第3導体との間に交流信号を印加する交流電圧信号源
と、同じく第1,第2導体と前記第3導体との間に直流
信号を印加する直流電圧信号源と、上記交流電圧信号源
が被測定対象に印加する交流電圧値を測定する交流電圧
測定器と、上記直流電圧信号源が被測定対象に注入する
直流電流値を測定する直流電流測定器と、上記交流電圧
信号源が被測定対象に注入する交流電流を測定する交流
電流測定器とを有して成ることを特徴とするコンタクト
チェック機能付二端子回路素子測定装置。
1. A three-wire coaxial cable comprising a first conductor, which is a central conductor, a second conductor that covers the first conductor, and a third conductor that further covers the second conductor, in a measuring device body. A measuring device having one end connected and first and third conductors at the other end of the cable having connection terminals to be measured, wherein a first and a second conductor and a third grounded state are provided in the measuring device body. The AC voltage signal source for applying an AC signal to the conductor, the DC voltage signal source for applying a DC signal between the first and second conductors and the third conductor, and the AC voltage signal source are An AC voltage measuring device that measures the AC voltage value applied to the measurement target, a DC current measuring device that measures the DC current value that the DC voltage signal source injects into the measurement target, and the AC voltage signal source is the measurement target AC current measuring device for measuring the AC current injected into the Contact check function with two-terminal circuit element measuring apparatus according to claim.
【請求項2】 前記交流電圧信号源が、交流電圧源と3
線同軸ケーブルの第1,第2導体に挿着されたフェライ
トコアトランスとにより構成されて成り、該交流電圧源
の一端が3線同軸ケーブルの第3導体に接続され、該フ
ェライトコアトランスの駆動巻線の一方端が前記交流電
圧源の他端に、他方端が前記第3導体にそれぞれ接続さ
れ、 前記直流電圧測定器がインダクタと直流電流計との直列
接続により、前記交流電圧測定器がコンデンサと交流電
流計との直列接続によりそれぞれ構成され、これらが第
1,第2導体間に並列接続されて成ることを特徴とする
請求項1記載のコンタクトチェック機能付二端子回路素
子測定装置。
2. The AC voltage signal source comprises an AC voltage source and an AC voltage source.
And a ferrite core transformer inserted in the first and second conductors of the wire coaxial cable, one end of the AC voltage source is connected to the third conductor of the three wire coaxial cable, and the ferrite core transformer is driven. One end of the winding is connected to the other end of the AC voltage source, and the other end is connected to the third conductor, and the DC voltage measuring device is a series connection of an inductor and a DC ammeter. 2. The two-terminal circuit element measuring device with a contact check function according to claim 1, wherein the capacitor and the AC ammeter are respectively connected in series, and these are connected in parallel between the first and second conductors.
JP27481791A 1991-09-26 1991-09-26 Two-terminal circuit element measuring device with contact check function and contact check method for measured object Expired - Fee Related JP3155310B2 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP27481791A JP3155310B2 (en) 1991-09-26 1991-09-26 Two-terminal circuit element measuring device with contact check function and contact check method for measured object
GB9220267A GB2259992B (en) 1991-09-26 1992-09-25 Circuit element measuring apparatus for performing contact checks
US08/001,851 US5321363A (en) 1991-09-26 1993-01-08 Two-terminal circuit element measuring apparatus for performing contact checks

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP27481791A JP3155310B2 (en) 1991-09-26 1991-09-26 Two-terminal circuit element measuring device with contact check function and contact check method for measured object

Publications (2)

Publication Number Publication Date
JPH0587857A true JPH0587857A (en) 1993-04-06
JP3155310B2 JP3155310B2 (en) 2001-04-09

Family

ID=17546983

Family Applications (1)

Application Number Title Priority Date Filing Date
JP27481791A Expired - Fee Related JP3155310B2 (en) 1991-09-26 1991-09-26 Two-terminal circuit element measuring device with contact check function and contact check method for measured object

Country Status (2)

Country Link
JP (1) JP3155310B2 (en)
GB (1) GB2259992B (en)

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JP2018112566A (en) * 2018-04-26 2018-07-19 株式会社アドバンテスト Measuring apparatus

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SG125977A1 (en) * 2005-03-11 2006-10-30 Rohde & Schwarz Systems & Comm Solid state absorbing clamp
JP4508080B2 (en) * 2005-10-26 2010-07-21 ソニー株式会社 Electronic device, transmission system, and connection state determination method
RU2503020C9 (en) * 2012-06-13 2015-01-20 Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования Ижевский государственный технический университет имени М.Т. Калашникова Meter of parameters of rc-dipoles
RU2536333C1 (en) * 2013-07-11 2014-12-20 Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования "Ижевский государственный технический университет имени М.Т. Калашникова" Tester with storage of dissipative cg two-terminal networks

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Publication number Priority date Publication date Assignee Title
JP2018112566A (en) * 2018-04-26 2018-07-19 株式会社アドバンテスト Measuring apparatus

Also Published As

Publication number Publication date
GB9220267D0 (en) 1992-11-11
GB2259992A (en) 1993-03-31
GB2259992B (en) 1995-06-21
JP3155310B2 (en) 2001-04-09

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